SANKO Coating Thickness Meter
ＳＷＴ－７２００Ⅳ
Instruction Manual

Caution● Read the manual thoroughly and use the meter correctly.
● Keep the manual with care and refer to it when necessary.

SANKO ELECTRONIC LABORATORY CO., LTD.
Tokyo･Osaka・Sendai・Nagoya・Fukuoka・Kawasaki
August 2023

Contents

Pages

Attention for safety ･･･････････････････････････････････････････････････････････････････････････

１

Notes

･･･････････････････････････････････････････････････････････････････････････････････････

３

Get started ･･･････････････････････････････････････････････････････････････････････････････････

４・

Contents in a package ････････････････････････････････････････････････････････････

４・

Names of part ････････････････････････････････････････････････････････････････････

５

・

Items displayed on LCD ･･･････････････････････････････････････････････････････････

７

・How to fit batteries ･･･････････････････････････････････････････････････････････････

９・

How to connect, disconnect probes ････････････････････････････････････････････････

１０・

How to hold probes ･･･････････････････････････････････････････････････････････････

１１

・

How to press a probe to an object ･････････････････････････････････････････････････

１１

How to operate ･･･････････････････････････････････････････････････････････････････････････････

１２（１） How to switch power source ･･････････････････････････････････････････････････････

１２（２） How to switch off ････････････････････････････････････････････････････････････････

１２（３） How to select 「Cal. No. 」 (Calibration curve) ･･････････････････････････････････････

１３（４） Zeroing ･･････････････････････････････････････････････････････････････････････････

１４（５） Calibration standard (CAL) ････････････････････････････････････････････････････････

１６（６） Zeroing － in special cases － ･･･････････････････････････････････････････････････

１８（７） 2-point calibration in case it is difficult to perform ｢Zeroing｣ ･････････････････････････

２１（８） How to delete calibration ･････････････････････････････････････････････････････････

２５《Collective deletion》 ･････････････････････････････････････････････････････････････

２５《Selective deletion》 ･･････････････････････････････････････････････････････････････

２６

Measuring ････････････････････････････････････････････････････････････････････････････････････

２７

Function setting ･･････････････････････････････････････････････････････････････････････････････

２８（１） Setting of Non-Intrrupt Measeuremnt Mode ････････････････････････････････････････

２８（２） Setting of resolutions ･････････････････････････････････････････････････････････････

３０（３） Setting of units ･･････････････････････････････････････････････････････････････････

３１（４） Setting of Auto-Power-OFF function ･･････････････････････････････････････････････

３２（５） Setting of corresponding mode to substrate with SFN-325 probe ････････････････････

３４（６） Setting of Backlight ･･････････････････････････････････････････････････････････････

３５

Setting of High/Low limt values ････････････････････････････････････････････････････････････････

３６（１） Setting of High limit value ･････････････････････････････････････････････････････････

３６

（２） Setting of Low limit value ･････････････････････････････････････････････････････････

３７（３） Deletion of set High/Low limit values ･･････････････････････････････････････････････

３８

Measurements with High/Low limit values ･･････････････････････････････････････････････････････

３９（１） When measured value within a range of limit value ･･････････････････････････････････

３９（２） When measured value over a High limit value ････････････････････････････････････････

３９（３） When measured value below a Low limit value ･･･････････････････････････････････････

３９

Storing of measured data ･･････････････････････････････････････････････････････････････････････

４０（１） Select a Data storing place ････････････････････････････････････････････････････････

４２（２） Keep data from being stored ･･････････････････････････････････････････････････････

４６

Measurements in storing data ･･････････････････････････････････････････････････････････････････

４７

Storing of measured data at Non-Interrupt Measurement Mode ･･････････････････････････････････

５１

Three kinds of measuring methods in case of 「No memory space」 ････････････････････････････････

５２（１） Keep on measuring ･･･････････････････････････････････････････････････････････････

５２（２） Look for an empty storing space ･･･････････････････････････････････････････････････

５２（３） Deletion of unnecessary data ･････････････････････････････････････････････････････

５３

Deletion of data ･･･････････････････････････････････････････････････････････････････････････････

５３（１） Deletion of one data ･･････････････････････････････････････････････････････････････

５３（２） Deletion of all data ･･･････････････････････････････････････････････････････････････

５４（３） Deletion of group data ････････････････････････････････････････････････････････････

５５（４） Deletion of block data ････････････････････････････････････････････････････････････

５７（５） Deletion of section data ･･････････････････････････････････････････････････････････

６０

Statistics ･････････････････････････････････････････････････････････････････････････････････････

６３（１） Statistics of all data ･･･････････････････････････････････････････････････････････････

６３（２） Statistics of group data ････････････････････････････････････････････････････････････

６４（３） Statistics of block data ････････････････････････････････････････････････････････････

６６（４） Statistics of section data ･･････････････････････････････････････････････････････････

６９

Transferring data － USB － ･････････････････････････････････････････････････････････････････

７２（１） Outright transferring measured data （Real time transfer） ･･･････････････････････････

７２（２） Interrupt transferring data ････････････････････････････････････････････････････････

７３

Transferring stored data － USB － ･･･････････････････････････････････････････････････････････

７４（１） Transfer of alll data ･･･････････････････････････････････････････････････････････････

７４（２） Transfer of group data ････････････････････････････････････････････････････････････

７５

（３） Transfer of block data ････････････････････････････････････････････････････････････

７８（４） Transfer of section data ･･････････････････････････････････････････････････････････

８１

Note to improve measuring accuracy ･･･････････････････････････････････････････････････････････

８４

Trouble shooting ･･････････････････････････････････････････････････････････････････････････････

８５Disclaimer ････････････････････････････････････････････････････････････････････････････････････

８６

Specifications ◆ main unit ･･･････････････････････････････････････････････････････････････････

８７◆ probe (option） ･･････････････････････････････････････････････････････････････

８８

References （measurement principles） ･････････････････････････････････････････････････････････

９１

Attention for safety （to use safely and correctly）
To prevent you and your properties from damaging please take some time toread thoroughly this “Attention for Safety” and use this main unit correctly.
And keep these instructions attentive to read when necessary.

Warning● Do not dump nor wet the main unit in water, otherwise it may cause malfunctions.
Prohibition
Please contact our distributor or sales office should submerged water into the main unit.
● Do not insert metals or foreign substances into the main unit, otherwise it may cause malfunctions.
Prohibition
Please contact our distributor or sales office should put any metals or foreign substancesin the main unit.
● Do not insert a screwdriver into the connector, otherwise that it may cause malfunctions.
Prohibition● Do not throw, smash, drop the main unit, otherwise it may cause injuries, damages, malfunctions.
Prohibition● Never dismantle or modify the main unit by yourself, otherwise it may cause errors reactions
Prohibition
or damages.
● Do not use AC adaptors other than an exclusive adaptor for this main unit.
Prohibition※ And do not use volatage other than the specified voltage, otherwise it may cause damages,
electric shocks, fires.
● Keep the terminal of AC adaptor from conductive substances or dirt, otherwise it may cause
Prohibition
short circuits, electric shocks, ignitions and fires.
● Do not handle the AC adaptor with wet hands, otherwise it may cause electric shocks.
Prohibition● Do not damage, brake, modify, forcefully bend or twist the cord of the AC adaptor. Or, do not load it
Prohibition
with heavy staff or pinch it forcefully, otherwise it may cause damages, breaking wires, short circuits,
electric shocks, fires.

-1-

Attention for safety （to use safely and correctly）
Warning！ ● Never fail to remove batteries from the main unit when not in use for a long time.
Must
Leakages occurred from deterioration of batteries may cause erroneous reactions or damages.
！ ● Be sure to read this book on the item of 「How to fit batteries」 to replace batteries.
Must！ ● Store batteries in a place where pets and children are incapable of handling them.
Must
Please call a doctor like in a case that a battery is swallowed.
！ ● Do not put batteries into fire or water. Store them in a cool, dry and dark place avoiding flames, highMusttemperature and moisture.
！ ● Do not get batteries shocked and dismantled, and soldered for processingMust！ ● Do not short or recharge batteries and handle with metallic tools like pliers.
Must

！
Must

● Replace with specified, new batterie (watch: battery life).
Some special dry batteries (nickel batteries) may not work properly.

！

● Be sure of paying attention on battery polarity marks, （＋、－） to place the batteries.

Must

！
Must

● In case a battery has leakage please clean up the place with cloths to replace batteries.
And do not touch the leaked liquid and wash skins or clothes in case they are contaminated.

！

● Comply to regulations and laws in your neighbors when disposing of them.

Must！ ● Insert a plug of the ＡＣ adaptor to the full end.
And do not use faulty or loose receptacles, otherwise it may cause electric shocks and fires.

Must！ ● Switch to OFF and unplug the AC adaptor from the receptacle to avoid electric shocks andinjuries when inspecting or cleaning the main unit.

Must

-2-

Attention for safety （to use safely and correctly）
Attention● Do not use Benzene or Thinner for cleaning and spray pesticides on the meter, otherwise it may
Prohibition
cause cracks or malfunctions.
● Do not store the meter in places getting high in temperatures such as in a car in strong sunlight or near
Prohibition
heaters, otherwise it will be hazardous to the meter and may cause malfunctions.
● Do not step, trample down nor put anything on the meter, otherwise it may cause malfunctions
Prohibition
or injuries.
● Keep the meter away off rubber-made articles or vinyl articles. A lengthy contact between
Prohibition
the meter and them may cause stickiness and it may be difficult to get rid of them.

Notes● Please read this manual thoroughly for correct operations before getting started.
● This meter is a precision gauge. Please handle with care.
● Do not tug, bend, fold or curl up forcefully the cables of probes.
● Do not knock or scratch objects with the tip of a probe.
● Keep the tip of a probe clean. A slight amount of dust may cause errors in measurements.
● Clean the meter and store it in free from dust and moisture after operation.
● To keep precision with a gauge please contact us for a periodical inspection.
● Keep the meter away off electric noises, shocks or magnetic fields when in a use, otherwise it may
cause malfunctions.

-3-Get started◆ Contents in a package

Please make sure if the following items sre included.

・ Main unit
SWT-7200Ⅳ
・ Dry batteries LR6 (2 pieces)・ SWT／SAMAC series CD◆ SWT-7200Ⅳ Instruction Manual (this manual)◆ USB driver◆ Instllation of USB transfer driver・ Inspection certificate (warranty)-cum-user registration sheet(This warranty is valid only in Japan)
・ Hand strap cord (attach directly to main unit)
・ Carrying case for main unit
・ AC adaptor
・ USB cable-4-◆ Names of part
Probe connector
Display

Battery lid
KeysBattery compartment
Hand strap
Tilt standAC adaptor connector
USB cable connector● Probe connector
Connect an optional-exclusive SWT probe to the probe connector.
（1） To measure a film thickness of coated, plated, lining layer on substrates made of ferrous material
please use a probe of 「SFe」 series for the connection.
（2） To measure a film thickness of coated, lining layer on substrates made of non-ferrous materials
such as Aluminum, etc. please use a probe of 「SNFe」 series for the connection.
（3） To measure a film thickness on a coated metal substrate made of either ferrous or non-ferrous
please use a Dual type probe 「SFN-325」.
● Display
It indicates measurement results, operation guides, or malfunction status. With a backlight.
● Keys（1） 「 」 (Power source ) key
It switches ON or OFF.
（2） 「ZERO」key
To set a ZERO point of substrate before measuring.
（3） 「▲ 」key、「▼」key
They area Backlight key / an adjusting key to set a neumericall value for standard adjustments.
（4） 「CAL」 key
This is to start up and finish the Calibration standard, and delete an abnormal value taken during
adjustment process.
(activates only when 「Zeroing」, 「Calibration standard」 is processed with combination with 「▼」 key)
※ Power source key /operation keys activate setting of various kinds of functions in combination
with other keys.

-5-（５） 「CAL No.」 key
It is a key to select a Calibration curves.
（６） 「H/L」 key
It is a key to set High/Low limit values.
（７） 「STATISTICS」 key
It is a key to process statistics of data stored in memory.
（８） 「MEM. SEL.」 key
It is a key to select memory area to store memory.
（９） 「COM. ENABLE」 key
It is a key to select a method for data transfe.r.
（１０） 「TRANSMIT」 key
It is a key to activate transferring process of data process.
（1１） 「MEM. CLEAR」 key
It is a key to delete data stored in memory.
（1２） 「DATA ERASE」 key
It is a key to erase one of data displayed on the screen.
（1３） 「CANCEL」 key
It is a key to interrupt the operation in progress and take an immediate step back to measuring process.
● Hand strap
Hang the meter through a strap over your wrist never to drop it.
● AC adaptor connctor
A conector to connect the exclusive AC adaptor (accessory).
● USB cable connctor
A conector to connect the USB cable for data transfer.
● Battery compartment
It contains 2 pieces of dry battery (LR6).
● Tilt standSet up the tilt stand to use this meter in a raised position.
about 30°

Pull upCaution● The tilt stand does not come off. Do not remove it forcibly.
● The tilt stand cannot be used when AC adaptor or USB cable are connected.

-6-◆ Items displayed on LCD（Main）⑩①「ZERO cal.」 or「Cal. w. foil.」②（AUTO）, （Fe）,
（NFe）

③

④

Measured data⑤
Unit[μm (mm) or mil]

「BAT」

⑥

Transferring marks

Calibration No.

⑦

High, low, setting values
Memory, selections, operational states⑧⑨① Indicates 「ZERO cal.」 (Zeroing) or 「Cal. w. foil」 (Calibration Standard), 「2-foil’s cal」 when in process.
It never appears on the reading except when in process of these adjustments.
② At Auto Selection mode, one of the three (AUTO), (Fe), and (NFe) is displayed.
Fe
At Corresponding mode to substrate,is displayed when being setting for exclusively Ferrous substrate,
NFe for exclusively Non-ferrous substrste.
③ Measured data is displayed.
④ BAT mark is displayed with 2 steps when battery has runn out for replacement.
⑤ Setted unit is displayed.
“μm” display automatically switches to “mm” display when it exceeds 999μm.
⑥ USB mark is displayed when data is transferred by USB to PC.
⑦ Ajusted values stored in the calibration number and calibration are displayed.
「Cal. No. X *」*When mark is 【Blank】,
Calibration data is not entered (as calibrated at Ex-factory).
* When mark is 【F___】
Zero adjustment value, Calibration standard value of Ferrous are stored.
* When mark is 【___N】
Zero adjustment value, Calibraton standard value of Non-ferrous are stored.
* when mark is 【F N】
Zero adjustment value, Calibration standard value of both Ferrous and Non-ferrous
are storded.
※ Either case indicates Zero adjustment value or Calibration standard only as wel.
⑧ ｢High limit film thickness value｣, ｢Low limit film thickness value｣ is displayed when the High/Low limit values
is set. It flashes when a reading value goes beyond a setting limited value.
⑨ It displays various items of information in memory storing measuring data.
When measuring while storing data into memory, the number of a storing place is displayed.
⑩ Backlight: The light goes on when Backlight is set to ON.

-7-（Sub）
When measuring and watching 「Calibration」, 「High/Low limit values」, 「Memory information ofmeasuring data」,
it is possible to enlarge these items on display.
②③
AUTO
Measured data

Unit
[μm (mm) or mil]Calibration No.

⑤⑦

Memory,Operation states⑨

High, low, setting
values⑧Note: 1. Each number is the same as the forementioed ones of (Main) in its explanation.
2. Items in the ② indicates AUTO, Fe, NFe, Fe , NFe in English letters.

（Switching of Display Type)● When outgoing from the factory, the (Main screen) is set in the unit.
● Switching from (Main) to (Sub) screen.
Press CAL No. key and H/L key together and hold them for 3 seconds or over.
The buzzer beeps 「Beep」, 「Beep」 two times and the (Main) changes to (Sub) screen.
● Switching from (Sub) to (Main) screen.
Press CAL No. key and H/L key together and hold them for 3 seconds or over.
The buzzer beeps 「Beep」, 「Beep」 two times and the (Sub) changes to (Main).

-8-◆ How to fit batteries① Raise the tilt stand.
② Open the battery lid on the rear of the main unit.
Press 「▽」 mark on the top of the lid and slide it down.
③ Insert batteries.
＋, ○－ for placement.
Ensure correct battery polarity ○④ Close the battery lid and put the tilt stand back.
※ When changing batteries and inadvently switch ing ON, but that is not defective at all.
Caution● Use specified and new (check battery-life) batrries or ones supplied in this package.
● An incorrect use of batteries may cause leakages, bursts. Do not intermingle new ones
with different tyepss of batteries.
● Take out batteries to store when not in use for a long absence, or that may cause
Leakages to breakdown.
● Keep batteries away off pets and children.
● Comply to the regulations and laws in your Local Authorities when disposing of batteries.

◎ About reading display
When placing batteries in the main unit, the messages and warning below on the screen may be displayed.
And these are not breakdowns, wait until the reading disappears with a beeping sound.
※ When connecting or disconnecting probe please switch Power source to OFF.

ＳＴＡＲＴ ＵＰＰＨＡＳＥＥＲＲＯＲ！

Hold probe
in the air.
Don’t touch iton anymetallic object．

Connect a probe
beforeswitched on.

Batteries have run out when the display on the main unit indicates the mark BAT listed below.
Replace with new batteries.

(AUTO)BAT【In case of SFN-325 probe connected】
After Power source switched to ON at Auto mode,(AUTO) is displayed on the screen and when setting
exculively for Fe substrate, or NFe substrate,
for a ferrous substrate, NFe for aFe
non-ferrous substrate is displayed.

－μm

Ｃａｌ．Ｎｏ． 1

Also, displayed ( Fe ) when SFe-probe is connected,
and ( NFe ) when SNFe-probe is connected.

-9-◆ How to connect, disconnect probes◆ Connect an optional, exclusive SWT probe to the main unit
Select one of the probes suited for your application.
◇ If the substrates made of ferrous material, please use a probe of ｢SFe｣ series
or a Dual type probe ｢SFN-325｣.
◇ If the substrates made of non-ferrous materials such as Aluminum,
please use a probe of ｢SNFe｣ series or a Dual type probe ｢SFN-325｣.
Insert a probe plug into the probe connector of the main unit.
Make sure of aligning the keyway, push the connector into place until the claps are locked.
※ If the direction is reversed, it will not enter.

Clasp

Probe body

Probe plug
Probe connector◆ Remove the exclusive probe from the main unit.
Pull off the probe carefully by bending inward clasps at the both ends of the probe bodyto release the clasps.
※ Do not pull off by force or it may cause damages.

CautionMake sure that Power switches to off when connecting or disconnecting the exclusive
SWT probes.
Or else, it may cause damages to connect or disconnect while Power is on.

- 10 -

◆ How to hold probes
Cable

Pinch and hold this part using fingers(thumb and forefinger)
Black resinous ring

Tip to press against a measurement object
Quickly and calmly press perpendiculary against the object by grabing the probe as illustrated.
It beeps and the reading screen shows the measuring result.
When it does not beep, lift it 5～7 cm above the object and try again to take measurements.

◆ How to press a probe to an object
・ Keep the probe 5 cm or over away off metallic objects when not in use of measuring.
・ Press the tip of the probe perpendicularly against a measurement object.
※ Tilting may cause large errors.
・ Press the probe quickly and smoothly to objects.
※ A slow-acting press may cause large errors.

○

×
Probe

Measurement object

Measurement object

Caution● Do not smash or hit the probe against objects, or it may cause damages to probes and to objects.
● Do not scrape, scrub objects with the probe except in a special measurement.
Or it may break the tip of the probe and cause damages to the tip and surface of objects.

- 11 -

How to operate（１） How to switch power source
Press

key.
This message lasts for about 3 seconds.

ＳＴＡＲＴ ＵＰ
ＰＨＡＳＥ

Caution

Hold probe
in the air.
Don’t touch iton anymetallic object．

Hold the probe in air without operation when
the reading is on display. Or it may indicate「ERROR」 and automatically switch off Power.

The buzzer beeps.
The Backlighｔ mark is displayed when ON.
【In case of SFN-325 probe connected】
After Power source switched to ON at Auto mode,(AUTO) is displayed on the screen and when setting
exculively for Fe substrate, or NFe substrate,Fefor a ferrous substrate, NFe for a
non-ferrous substrate is displayed.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

Also, displayed ( Fe ) when SFe-probe is connected,
and ( NFe ) when SNFe-probe is connected.
Note： 「Cal. No.

」 ← A number 「１」 is displayed at the firstly switched ON.
From the 2nd on, the last set entry is displayed.
And when 「High limit value」, 「Low limit value」 is set, or when memory is used,
the setting values and Nos. are displayed on each colum (chained line section).

（２） How to switch off
Press
key.
The buzzer beeps.

The message lasts for about 2 seconds.

POWER
OFF

Caution
Never remove a probe from a main unit
when Power is ON. Or the electric shocks
may damage the probe and the main unit

Terminating
phase

The buzzer beeps and this main unit is switched to OFF.

- 12 -

（３） How to select 「Cal. Ｎｏ. 」 (Calibration curve)
After switching ON, it is capable of getting started on measurements and adjutments when the reading「START UP PHASE …」 disapeared.
※ Generally, thickness meters make errors depending on material formation and shapes to be measured.
To minimize measurement errors and obtain as accurate resutls, 【Zeroing】 and 【Calibration standard】
are imeratively adujusted before measuring operation.
Those adjustment is called 「Calibration curve」.
SWT－7200Ⅳ is capable of storing up to 10 sets of calibration data and these data can be called and used
when necessary. (the storing place is displayed by a calibration No.)

(AUTO)－

Cal. No.
1μm
Ｃａｌ．Ｎｏ． 1*

Indicating positions of （Sub）
Press CAL No. Key.
The buzzer beeps.

(AUTO)

A number on the display flashes.

－μm
Ｃａｌ．Ｎｏ． 1

Caution*

F, N, FN displayed on the ｢*｣ marked place
indicates state of adjusted value stored in the
Calibration curve (refer to page 7).
When that value is no more necessary,take「Zeroing」, 「Calibration Standard」.
Stored data can be erased and new data is stored.

Press ▲ key or ▼ key to select yourcalibration number to use.

(AUTO)－

A selectd number flashes.

μm
Ｃａｌ．Ｎｏ． 8- 13 -

Press CAL No. key.
The buzzer beeps.

(AUTO)－
μm

The flashing of the selected number stops「Cal. No. 8」 is settled.

Ｃａｌ．Ｎｏ． 8

After settling 「Cal. No. X 」, it becomes possible to take measurements and adjustments.

（４） Zeroing
After switching ON, it is capable of getting started on measurements and adjutments when the reading「START UP PHASE…」 disapeared.
※ Generally, the meter makes errors depending on material formation and shapes to be measured.
To minimize measurement errors and obtain as accurate results as possible please be sure of carryingout 2 kinds of adjustments of 【Zeroing】 and 【Calibration standard】 before measuring process.
※ Prepare the identical material and shape to a measuring object.
（This is designated as a 「Zero plate」.）
Press ZERO key.
The buzzer beeps.

CAL key changes to one data “deletion” function.

【ZERO Cal.】
1. Measure subst-rate several
times.
2. press ZERO key.
Press the probe to the Zero plate.
The buzzer beeps.

- 14 -

Zeroing is in process.

ZERO cal.

（Fe）

１
μm

Ｃａｌ．Ｎｏ． 8

Remove the probe from 「Zero plate」.

After pressing certain times or 20 times,
press ZERO key.

The measuring object is set for ferrous metal substrate.
Measured a mean value
When the measured value results in largely off
the “0”, press CAL + ▼ key todelete the latest data out of measured values.
It indicates “—” to delete all data.
Calibration No. storing 「Zeroing」 and「Calibration srandard」.
● Repeat a measuring processes, 1～20 times by pressing
the probe to the 「Zero plate」.
（A mean value is displayed whenever a probe is pressed）◆ When a measuring process reaches the 20th time,
the buzzer beeps, beeps 2 times and afterward newentry is no more accepted.

The buzzer beeps.

It stops the “deletion” function of CAL key.

（Fe）

０
Ｃａｌ．Ｎｏ． 8

F

The reading 【ZERO cal.】 in the upper left disappears.
Zeroing completed and the main unit becomes possible
to take measuring and adjusting operations.

μm
Data is stored in 「Cal. No. 8」 and 「F」 is displayed.
(refer to page 7)● Press the probe to the 「Zero plate」 several times and make sure the measuring result indicatesin the neighborhood of “0”.
When the measured value results in largely off “0”, please try again zeroing from the beginning.
There is a case when calibration is not correctly made.
● “ＬＬＬＬ” displayed on the screen during a time of zeroing means that the calibration point heavily deviatesfrom the standard.
Please make sure that the metal substrate is not processed with other materials such as plating andrepeat the zeroing until a stable in the neighborhood of “0” is obtained.
※ After performing Zeroing, the previous 「Zeroing value」 is deleted, and the last entry of 「Zeroing value」
is stored.

- 15 -

（５） Calibration standard (CAL)● Prepare the 「Zero Plate」 used for 「Zeroing」.
● Prepare the 「Thickness standard」 that are the same thick as the measuring film or thicker than that.
● Place the 「Thickness standard」 on the 「Zero Plate」．
● Press CAL key.
The buzzer beeps.

CAL key changes to one data “deletion” function.

【Cal. w. foil】
1. Measure thick-ness of foil
several times.
2. With ▼ or ▲ . Ad
-just to thick-ness of foil
3. press CAL key.

Press again CANCEL key to interrupt Calibration
standard (CAL).

Press the probe to the Thikness standard on the Zero plate.
It beeps whenever pressing.
Calibration standard is in process.

cal. w. foil

（Fe）

１０２
Ｃａｌ．Ｎｏ． 8

Fμm

The measuring object is set for ferrous metal substrate.
Measured a mean value
When the measured value results in largely off the“Thickness standard”, press CAL + ▼ key
to delete the latest data out of measured values.
It indicates “—” to delete all data.
● Repeat a measuring processes, 1～20 times by pressing
the probe to the 「Thickness standard」 on the 「Zero plate」.
（A mean value is displayed whenever a probe is pressed）◆ When a measuring process reaches the 20th time,
the buzzer beeps, beeps 2 times and afterward newentry is no more accepted.

Adjust the reading value to the Thickness
standard (in this case, 100μm) by pressing▲ or ▼ key.

cal. w. foil

（Fe）

１００
Ｃａｌ．Ｎｏ． 8

Fμm

Pressing ▲ or ▼ key interrupt the “deletion”
function of CAL ｋｅｙ．

Pressing ▲ key increases the reading value.
Pressing ▼ key decreases the reading value.
（Press and holding key turns to fast forwarding.）
Adjust the reading value to the Thickness standard.

- 16 -

After adjusting the reading value to the Thickness standard,press CAL key.
The buzzer beeps, 【cal. w. foil】 on the upper left disappears
and it returns to a measuring mode.

（Fe）

１００
Ｃａｌ．Ｎｏ． 8

FThis is a measusring mode.

μm● It is correct that numerical values measured by pressing the probe a few times to the 「Thickness standard」
on the 「Zero plate」 indicates the thickness in the neighborhood of the 「Thickness standard」.
● When the measured value results in largely off the 「Thickness standard」 please try again「Calibration standard」 from the beginning.
※ After performing Calibration standard , the previous 「Calibration standard value」 is deleted, and the lastentry of 「Calibration standard value」 is stored.

- 17 -

（６） Zeroing － in special cases －◎ In case of being painted as shown with multi-layers on the substrate there may be needs to measure
thicknesses of each layer. For example, measuring only the thickness of the 4th layer please zero as
an assumed 「Zero point」 at the surface of the 3rd layer stacked on the substrate and take 「Zeroing」,「Calibration standard」 as the aforementioned (3), (4).

Measuring the thickness of the 4th layer by「Zero point」 at the surface of the 3rd layer.

（4th layer）（3rd layer）（2nd layer）（1st layer）

Coating films

Substrate material◆ Releasing of special-case zeroing
When zeroing again on the substrate after having finished the above measurements and if the combined thicknessof 3 coating layers from 1st to 3rd exceeds 50μm, please zero the meter on the following procedures.
If the thickness of 3 combined layers is bellow 50μm, take the same procedure as usual zeroing to release.
● Prepare the identical material and shape to a measuring object.
（This is designated as a 「Zero plate」.）
Press ZERO key.
The buzzer beeps.

CAL key changes to one data “deletion” function.

【ZERO Cal.】
1. Measure subst-rate several
times.
2. press ZERO key.
Press the probe to the Zero plate.
The buzzer beeps, beeps, beeps 3 times.

- 18 -OFFSET.
To continue,press ZREO twice.

Press ZERO key.
The buzzer beeps.

Press ZERO key again.
The buzzer beeps.

【ZERO Cal.】
1. Measure subst-rate several
times.
2. press ZERO key.
Press the probe to the Zero plate.
The buzzer beeps.
Zeroing is in process.

ZERO cal.

（Fe）

１
Ｃａｌ．Ｎｏ． 1

μm

The measuring object is set for ferrous metal substrate.

Measured a mean value
When the measured value results in largely off
the “0”, press CAL + ▼ key todelete the latest data out of measured values.
It indicates “—” to delete all data.

Remove the probe from 「Zero plate」.
● Repeat a measuring processes, 1～20 times by pressing
the probe to the 「Zero plate」.
（A mean value is displayed whenever a probe is pressed）
After pressing certain times or 20 times,
press ZERO key.

◆ When a measuring process reaches the 20th time,
the buzzer beeps, beeps 2 times and afterward newentry is no more accepted.

- 19 -

The buzzer beeps.

It stops the “deletion” function of CAL key.

（Fe）

０
Ｃａｌ．Ｎｏ． 1

F

The reading 【ZERO cal.】 in the upper left disappears.
Zeroing completed and the main unit becomes possible
to take measuring and adjusting operations.

μm
Data is stored in 「Cal. No. 1」 and 「F」 is displayed.
(refer to page 7)● Press the probe to the 「Zero plate」 several times and make sure the measuring result indicatesin the neighborhood of “0”.
When the measured value results in largely off “0”, please try again zeroing from the beginning.
There is a case when calibration is not correctly made.
● “ＬＬＬＬ” displayed on the screen during a time of zeroing means that the calibration point heavily deviatesfrom the standard.
Please make sure that the metal substrate is not processed with other materials such as plating andrepeat the zeroing until a stable in the neighborhood of “0” is obtained.
※ After performing Zeroing, the previous 「Zeroing value」 is deleted, and the last entry of 「Zeroing value」
is stored.

- 20 -

（７） 2-point calibration in case it is difficult to perform ｢Zeroing｣
When it is difficult to adjust「Zeroing」in a usual method on a rough surface such as the Blast steel plate,
it is effective also to adjust by using 『two pieces of different thickness of the Thicknesses standard』.

Caution
It is not possible to use both this calibration method and other calibration ones together,or mixing them together.
Should were the methods taken, measuring results could be the wrong values.
● Prepare the same blast-steel-plate in material as the objective base and two pieces of different
thicknesses of the Thickness standards.
Please choose the suitable difference of thickness standards from the list below.
Predicting film thickness

Difference of thickness standard～49.9 μm50.0～99.9 μm
100.0～499.9 μm
500～999 μm
1.0～2.5 mm

10 μm or over
25 μm or over
50 μm or over
199 μm or over
0.5 mm or overPress and hold the ZERO key for 3 seconds.
The buzzer beeps.
CAL key changes to one data “deletion” function.

【2-foil’s cal】
Measure thinner
foil on metal
several times.
Afterward,
press

Stack the thinner 「Thickness standard」 on thesubstrate and press the probe on it.

ZERO key.

The buzzer beeps whenever pressing the probe.
2-foil calibration in process.

【 2-f. c. 】

（Fe）

２７
Ｃａｌ．Ｎｏ． 1

μm

The measuring object is set for ferrous metal substrate.
Measured a mean value
When the measured value results in largely off the“Thickness standard”, press CAL + ▼ key
to delete the latest data out of measured values.
It indicates “—” to delete all data.

- 21 -

After pressing certain times or 20 times,
press ZERO key.

● Repeat a measuring processes, 1～20 times by pressing
the probe to the thinner 「Thickness standard」.
（A mean value is displayed whenever a probe is pressed）

The buzzer beeps, beeps 2 times.
◆ When a measuring process reaches the 20th time,
the buzzer beeps, beeps 2 times and afterward newentry is no more accepted.

【2-foil’s cal】
Use ▲ or ▲ ,ｔo set foil
thickness.
Afterward,
pressZERO key.

A press of ▲ or ▼ key makes the buzzer beep anda mean value to the last measurement appears on the reading.

【 2-f. c. 】

（Fe）

２７
Ｃａｌ．Ｎｏ． 1

Mean value

μm

Adjust the reading value to the Thickness standard (in this case, 25μm)
by pressing ▲ or ▼ key.

【 2-f. c. 】

（Fe）

２５
Ｃａｌ．Ｎｏ． 1

μm

Pressing ▲ key increases the reading value.
Pressing ▼ key decreases the reading value.
（Press and holding key turns to fast forwarding.）
Adjust the reading value to the Thickness standard.

After adjusting the reading value to the Thickness standard,press ZERO key.
The buzzer beeps.

- 22 -

【2-foil’s cal】
Measure thicker
foil on metal
several times.
Afterward,
press

Stack the thicker 「Thickness standard」 on thesubstrate and press the probe on it.

ZERO key.

The buzzer beeps whenever pressing the probe.

【 2-f. c. 】

（Fe）

１９８
μm

Ｃａｌ．Ｎｏ． 1

After pressing certain times or 20 times,
press ZERO key.
The buzzer beeps, beeps 2 times.

Measured a mean value
When the measured value results in largely off the“Thickness standard”, press CAL + ▼ key
to delete the latest data out of measured values.
It indicates “—” to delete all data.
● Repeat a measuring processes, 1～20 times by pressing
the probe to the thicker 「Thickness standard」.
（A mean value is displayed whenever a probe is pressed）◆ When a measuring process reaches the 20th time,
the buzzer beeps, beeps 2 times and afterward newentry is no more accepted.

【2-foil’s cal】
Use ▲ or ▲ ,ｔo set foil
thickness.
Then, ready formeasure.
A press of ▲ or ▼ key makes the buzzer beep anda mean value to the last measurement appears on the reading.

【 2-f. c. 】

（Fe）

１９８
Ｃａｌ．Ｎｏ． 1

Mean value

μm- 23 -

Adjust the reading value to the Thickness standard (in this case, 200μm)
by pressing ▲ or ▼ key.

【 2-f. c. 】

（Fe）

２００
μm

Ｃａｌ．Ｎｏ． 1

Pressing ▲ key increases the reading value.
Pressing ▼ key decreases the reading value.
（Press and holding key turns to fast forwarding.）
Adjust the reading value to the Thickness standard.

After adjusting the reading value to the Thickness standard,press ZERO key.
Then the buzzer beeps, beeps, beeps 3 times.

【2-foil’s cal】
This is on display for about 0.5 seconds.

Ready formeasure.

The buzzer beeps.

（Fe）

２００
Ｃａｌ．Ｎｏ． 1

FThis is a measusring mode.

μm
Data is stored in 「Cal. No. 1」 and 「F」 is displayed.
(refer to page 7)● It is correct that numerical values measured by pressing the probe a few times to the 「Thickness standard」
on the 「Zero plate」 indicates the thickness in the neighborhood of the 「Thickness standard」.
Take the procedure with each 2 sheets of the「Thickness standard」.
● When the measured value results in largely off the 「Thickness standard」 please try again「2-foils calibration」 from the beginning.
※ After performing 2-foils calibration, the previous 「Calibration value」 is deleted, and the lastentry of「2-foils calibration value」 is stored.

- 24 -

（８） How to delete calibration
Take the following procedures to delete calibration when the reading on the screen is locked or after
batteries replaced or when it becomes impossible to process 「Zeroing」、「Calibration Standard」（CAL）.
※ This operation procedures are taken when SWT-7200Ⅳ is faulty.
If “All cal. → ▲” is mistakenly selected, be careful that adjusted values of all calibration data are deleted.
※ When a store place is full , adjust a new data with the old data kept in th e place.
Automatically the old data is deleted and the new data is stored.

《Collective deletion》● Delete collectively all adjustec values of all calibration data.
Hold ZERO key and press ▼ key.
The buzzer beeps, beeps 2 times.

ERASE？

※ When interrupting deletion, press CANCEL key.

All cal. → ▲orReading cal. → ▼Press ▲ key.
The buzzer beeps, beeps 2 times.

ERASE(cal. data)

Deletion of calibration data is over andthe buzzer beeps, beeps 2 times.

（Fe）

１００
Ｃａｌ．Ｎｏ． 1

The last measured substrate and value are displayed.
It becomes possible to take measurements andadjustment procedures of this main unit.

μm
After deleting, take 「Zeroing」, 「Calibration standard」
procedures proceeding to measuring.

- 25 -

《Selective deletion》● Delete adjusted value of calibration data being selected now.
Dislay calibration data to be deleted. (refer to page 12)

（Fe）

１００
Ｃａｌ．Ｎｏ． 3

μm

FHold ZERO key and press ▼ key.
The buzzer beeps, beeps 2 times.

ERASE？

※ When interrupting deletion, press CANCEL key.

All cal. → ▲orReading cal. → ▼Press ▼ key.
The buzzer beeps, beeps 2 times.

ERASE(Cal. data)

Deletion of calibration data is over andthe buzzer beeps, beeps 2 times.

（Fe）

１００
Ｃａｌ．Ｎｏ． 3

The last measured substrate and value are displayed.
It becomes possible to take measurements andadjustment procedures of this main unit.

μm
After deleting, take 「Zeroing」, 「Calibration standard」
procedures proceeding to measuring.

- 26 -

Measuring
Hang the meter through a strap over your wrist never to drop it.
When pressing the probe against the object with Power ON,
the buzzer beeps.

The measuring object is set for ferrous metal substrate.

（Fe）

１２５
Ｃａｌ．Ｎｏ． 1FA measured result is displayed.

μm

Each time a probe is pressed to an object the buzzer beeps and the measuring result is displayed.
◆ Measuring of Auto-selection by 「SFN-325」(1) Ferrous substarate ・・・・・・・・・・・・・・・・・・・・・・・・・・・・ measuring of film thickness at Fe mode.
(2) Non-ferrrous substarate ・・・・・・・・・・・・・・・・・・・・・・・ measuring of film thickness at NFe mode.
(3) Ferrous on Non-ferrous layered substarate ・・・・・・ measuring at Fe mode regadress of Fe thickness.
（1）

（2）

（3）

Film

Film

Film
FerrousFerrous

Non-Ferrous

Non-Ferrous(4) Non-ferrous on ferrous layered substrate(4-1) Layered thickness Non-Ferrous and Film, 3.0 mm or less※ ・・・・ measure thickness of layered Non-Ferrous
and Film in Fe mode.
※(4-2) Layered thickness Non-Ferrous and Film, 3.5 mm or over ・・・・ measure Film thickness in NFe mode.
（4-2）

（4-1）
Film
Non-Ferrous

About 3.0 mm or lessFilm

About 3.5 mm or over

Non-Ferrous
FerrousFerrousNote:● “HHHH” is displayed in a between area of 2 different layers and when special metals unidentified by Auto-selection.
● In case of adjusting by 「Calibration standard」 on Fe-substrate, 「Calibration standard」foils made of Non-Ferrous
metals such as BeCu can be used.
● In case substrates are not identified by Auto-selection mode, change to exclusive mode by 『corresponding mode
to a metal substrate』.
In case of an example of (4-1）, thickness of Film only can be measured at 「Non-Ferrous」 exclusive mode.
※ They may vary in compositions, characteristics, thicknesses of materials.

- 27 -

Function setting（１） Setting of Non-Interrupt Measurement mode
As illustrated on the right figure, this mode is used when taking
non-interrupt measurements for painting surfaces etc.
Film thickness values are taken/displayed while press/holding
probe on the object.

Substrate（Fe）
A measured value is held (displayed) when pressing aprobe at standard mode, but in Non-Interrupt Measurementmode measured values are taken/displayed about every
0.5 seconds interval while pressing a probe.

１２５
Ｃａｌ．Ｎｏ． 1

Hold

μm

F

ZERO key and press ▲ key.

The buzzer beeps, beeps 2 times.

This main unit has turned into 「Non-Interrupt Measurement mode」.
Data can be successively measured about 0.5 second intervals and the data is displayed with a beeping sound.

↓↑Trace of probe

↓
→

↑
→

→
→
Substrate

→

→

－

751
－

751
837

125

124

126

123

124

751

↑
Reaching to a measurable distance, the probe indicates the distance/thickness at the spot.
Display of measured values （displayed successively each 0.5 second interval）.
※ The Non-Interrupt function is stored when switching Power to OFF.
To return to the beginning, take the procedure of “Returning to the beginning” listed on the following page.

- 28 -

Caution
The moving measuring method at “Non-Interrupt Measuring Mode” may damage the measuring
surface or the probe tip because of frictions made by sliding the probe on the surface.
Please try fewer to take this method to minimize the frictions.

《Returning to the beginning》
To return 「Non-Interrupt Measurement mode」 to the beginning take the same procedures asat the initial setting.
HoldZERO key and press ▲ key.

The buzzer beeps, beeps 2 times.

「Non-Interrupt Measurement mode」 has been released and returned to the beginning.

↓↑
Trace of probe

↓
→

↑
→

→
→
Substrate

→

→

－

125
－

125
－

125

125

125

125

125

125

↑
Measured values are stored until a next measurement is taken.

- 29 -

（２） Setting of resolutions
The reading values up to 500μm can be switched in resolutions as below.
It is possible to read resolution measurement results by the 0.1μm unit in the thickness of （0～400μm）,
and by the 0.5μm unit in the thickness of （400～500μm）.
● Switch Power to OFF when Power is ON.
Hold CAL key and press
The buzzer beeps, beeps 2 times.

key for 3 seconds or over.

（Fe）

１２５．２
Ｃａｌ．Ｎｏ． 1μm

FDisplayed :0～400μm by the 0.1μm unit,
400～500μm by the 0.5μm unit.

※ This function is not released even if the Power source is switched to OFF.
When returning, take the operation procedures of “Returning to the beginning” as below.

《Returning to the beginning》
To return 「0.1μm, 0.5μm」 displayed resolutions to the beginning, take the same procedures as the above.
● Switch Power to OFF when Power is ON.
Hold CAL key and press
The buzzer beeps, beeps 2 times.

key for 3 seconds or over.

（Fe）

１２５
Ｃａｌ．Ｎｏ． 1

F

No display under a decimal place.
(The data is rounded off to nearest whole digit.)μm- 30 -

（３） Setting of units
This main unit is equipped with a function converting the unit to ｢mil｣.
● Switch Power to OFF when Power is ON.
● Press and hold
key for 10 seconds or over until the buzzer beeps, beeps 2 times.

（Fe）

４．９２
Ｃａｌ．Ｎｏ． 1

ｍｉｌ

F

Displayed at the second decimal point.

Converted to the 「mil」 unit.

※ This function is not released even if the Power source is switched to OFF.
When returning, take the operation procedures of “Returning to the beginning” as below.

《Returning to the beginning》
To return 「mil」 unit to the beginning, take the same procedures as the above.
● Switch Power to OFF when Power is ON.
● Press and hold
key for 10 seconds or over until the buzzer beeps, beeps 2 times.

（Fe）

１２５
Ｃａｌ．Ｎｏ． 1

Fμm

Converted to the 「μm」 or ｢mm｣ unit.

- 31 -

（４） Setting of Auto-Power-OFF function
When no entry of key operations and measuring procedures for 3 minutes, the main unit switcehes automaticallyto OFF to save battery. This function can be released by yhe following operations.
No entry for 3 minutes lasts, and then the buzzer beeps.

POWER
OFF

The message is displayed for about 5 seconds.

Terminating
phase
The buzzer beeps, and the main unit is switched to OFF.

《To Disable Auto-Power-OFF function》● Switch Power to OFF when Power is ON.
Hold ▲ key and press
key for 5 seconds or over.
The buzzer beeps., beeps 2 times.

Automatic
Switch OFF
It indicates 5 seconds.

【DISABLE】(AUTO)－

It returns to a measurable mode.
Power switches to OFF whenμm
Ｃａｌ．Ｎｏ． 1

F※ This function is not released even if the Power source is switched to OFF.
To enable it, take the operation procedures of “To Enable Auto-Power-OFF function”.

- 32 -

key is pressed.

《To Enable Auto-Power-OFF function》● Switch Power to OFF when Power is ON.
Hold ▼ key and press
key for 5 seconds or over.
The buzzer beeps., beeps 2 times.

Automatic
Switch OFF
It indicates 5 seconds.

【ENABLE】(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

It returns to a measurable mode.
Auto-Power-OFF function can be functioned.

F

When no entry of key operations and measuring procedures lasts about for 3 minutes,
the buzzer beeps and the power is switched to OFF.

※ This function is not released even if the Power source is switched to OFF.
To disable it, take the operation procedures of “To Disable Auto-Power-OFF function”.

- 33 -

（５） Setting of corresponding mode to substrate with SFN-325 probe
When the SFN-325 probe is connected, the main unit automatically select a substrate for measuring objects,
but in addition to the Auto-selection mode 『Fe substrate exclusive mode』, 『NFe substrate exclusive mode』
are ready to use.
In case it is not possible to identify the substrate by Auto-selection mode, change the mode on the following
steps to take measurements with procedure as shown below.
※ When on Ex-factory, the unit is set to 「AUTO mode」.
※ This function is effective only when 「SFN-325」 probe is connected.
※ This finction is kept live even if the Power is switched to OFF.
【EX-factory setting】(AUTO)

Displays of Ferrous/Nonferrous Auto-selection modeare displayed by one of (AUTO), (Fe), (NFe) respectively.

－
μm
Ｃａｌ．Ｎｏ． 1

F

Press and hold CAL key for 3 seconds or over.
The buzzer beeps, beeps 2 times.

Fe

When moving to a Fe substrate exclusive mode,
is displayed.
Fe－
μm
Ｃａｌ．Ｎｏ． 1

F

Press and hold CAL key for 3 seconds or over.
The buzzer beeps, beeps 2 times.

NFe－

When moving to a NFe substrate exclusive mode,
NFe is displayed.

μm
Ｃａｌ．Ｎｏ． 1F

By press and holding CAL key for 3 seconds or over,it switches: AUTO → Fe ➝ NFe ➝ AUTO ➝ Fe ・・・・・- 34 -

（６） Setting of Backlight
The LCD of this unit has a backlight function.
The bcklight can be used at the place which is dark and difficult to read messages on display.

《Lighting the Backlight》
Press and hold ▲key for 3 seconds or over.

The buzzer beeps, beeps 2 times
and the backlight goes on.

It is shown when the backlight is ON.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F《Lighting out the Backlight》
Press and hold ▲key for 3 seconds or over.

The buzzer beeps, beeps 2 times
and the backlight goes off.

The mark and the backlight go off.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F※ This function is kept even if Power source switched to OFF.

- 35 -

Setting of High/Low limit values
To judge quickly if the coated film thickness of a product stays within a range of thicknesses corresponding tomanagement standards and controls, it is necessary to set high/low limits beforehand and if the numerical value on
display exceeds the limits, the number flashes and emits a warning sound.
※ A set of both limit values can be set to a 「Cal. No. 」 (Calibration curve).

（１） Setting of High limit value（Indicatipns of Sub-sceen）

（Fe）

１２５
μm
Ｃａｌ．Ｎｏ． 1

F

LIMIT
H： - - - -μm
L： - - - -μm

Press H/L key.
The buzzer beeps.

A High limit value flashes.

Data for setting High/Low limit values is displayed.

（Fe）

１２５
μm
Ｃａｌ．Ｎｏ． 1
Lmt.

F

H : - - - μm

L : - - - μm

A High limit value flashes.
Press ▲ or ▼ key to enter a High limt value
into the flashing colum 「－－－」.
Note： When no High limit value setting is needed,
press H/L key without pressing ▲ ,▼ key. Flashing 「H： - - - μm」 stops
and it moves a next to set Low limit value.

Press H/L key.
The buzzer beeps to set the High limit value.

Then setting of a Low limit value follows.

- 36 -

（２） Setting of Low limit value（following a High limit value setting without interruption）

（Fe）

１２５

A Low limit value flashes.

μm
Ｃａｌ．Ｎｏ． 1

Lmt.

F

H : 1 5 0 μm

L : - - - μm

Press ▲ or ▼ key to enter a Low limet value
to the flashing colum 「- - -」.

Note： When no Low limit value setting is needed,
press H/L key without pressing ▲ ,▼ key. Flashing 「L： - - - μm」 stops
and a High limit value only is set, and it
becomes possible to take measurements
and adjustments.

（Fe）

１２５
μm
Ｃａｌ．Ｎｏ． 1
Lmt.

A Low limit value flashes.

F

H : 1 5 0 μm

L : 1 0 0 μm

Press H/L key.
The buzzer beeps.

（Fe）

１２５
μm
Ｃａｌ．Ｎｏ． 1
Lmt.

F

H : 1 5 0 μm

L : 1 0 0 μm

The flashing Low limit value stops and the High/Low
limit values are set. It becomes possible to takemeasurements and adjustments.

- 37 -

（３） Delection of set High/Low limit values.
Select a 「Cal. No. 」 (Calibration curve) storing limit values to be deleted.

（Fe）

１２５
μm
Ｃａｌ．Ｎｏ． 8
Lmt.

F

H : 1 5 0 μm

L : 1 0 0 μm

Hold H/L key and press DATA ERASE key.
The buzzer beeps, beeps 2 times.

ＥＲＡＳＥ？
HI & LO Limits.

Press DATA ERASE key.
The buzzer beeps, beeps 2 times.

（Fe）

１２５

A set limited value is deleted and at the same timea displayed column of the limit value also disappears.

μm
Ｃａｌ．Ｎｏ． 8

F- 38 -

Measurements with High/Low limit values（１） When measured value within a range of limit value (including a setting value)
The buzzer beeps and indicates the measured value.

（Fe）

１３７
μm
Ｃａｌ．Ｎｏ． 8
Lmt.

F

H : 1 5 0 μm

L : 1 0 0 μm

（２） When measured value over a High limit value
The buzzer 「beeps」「beep」「beep」, 「beep」「beep」「beep」 2 times with 3 sucessive sounds.
「OVER」 is displayed.

（Fe）

OVER

１６３
μm
Ｃａｌ．Ｎｏ． 8
Lmt.

A High limit value flashes.

F

H : 1 5 0 μm

L : 1 0 0 μm

Flashes.

（３） When measured value below a Low limit value
The buzzer 「beeps」「beep」「beep」, 「beep」「beep」「beep」 2 times with 3 sucessive sounds.
「UNDER」 is displayed.

（Fe）

UNDER

９６
μm
Ｃａｌ．Ｎｏ． 8
Lmt.

A Low limit value flashes.

F

H : 1 5 0 μm

L : 1 0 0 μm

Flashes.

- 39 -

Storing of measured data
SWT-7200Ⅳ can store Max. 20,000 data.
Places to store are listed as below.
Sections： A section stores 10 data. Each ｢Data storing position」 within a section has each independent number.
Blocks：A block contains 10 「Sections」. Each ｢Section｣ within a block has each independent number.

Groups： A group contains 20 「Blocks」. Each 「Block」 within a group has each independent number.
SWT-7200Ⅳ has 10 groups.

■ Data-Memory information displayed. on LCD

（Fe）

１３７

(A place where the High/Low limit values is displayed.)μm
Ｃａｌ．Ｎｏ． 1

F

memNo. G G B B

The Data storing infomation is displayed.
SS

S: Y Y : Z Z

A Data storing position within a section is displayed. （1～10）
The number of data stored in a section is displayed. （1～10）
A Section No. is displayed. （1～10）
10 data×10 section＝100 data
A Block No. is displayed. （1～20）
100 data×20 block＝2000 data
A Group No. is displayed. （1～10）
2000 data×10 group＝20000 data

※ When delivered at EX-Factory. The indictions are as follows.

memＮｏ．

１

１

１- 40 -

ｓ： １０ ：

１

The displays of memory position of (Sub-screen)

A Group No. is displayed.
MEMORYG ：B ：S ：Size ：
C.P. ：

1
1
1
10
1

A Block No. is displayed.
A Section No. is displayed.
The number of data stored in a section is displayed.
A Data storing position within a section is displayed.

- 41 -

（１） Select a Data storing place● For operation example, settings are made as follows:
Group No. 「3」, Block No. 「12」, Section No. 「1」, Data storing number per section 「8」.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F

Press MEM．SEL． key.
The buzzer beeps.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

1

1

A Group No. flashes.
1

S: 1 0 :1

Press ▲ or ▼ key.
Select a Group No. 「3」.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

1

3

A Group No. flashes.
1

S: 1 0 :1

Press MEM．SEL． key.
The buzzer beeps.

- 42 -

※ A Group No. 「3」 is set.
Then moving on to setting a Block No.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

1

3

1

S: 1 0 :A Block No. flashes.

1

Press ▲ or ▼ key to select a Block No. 「12」.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

12

3

1

S: 1 0 :A Block No. flashes.

1

Press MEM. SEL. key.
The buzzer beeps.

※ A Block No. 「12」 is set.
Then moving on to setting a Section No.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

12

3

1

S: 1 0 :A Section No. flashes.

1

Press ▲ or ▼ key to select a Section No. 「1」.
（In this example, as Section No. is 「1」 So it moves on to the next as it is）- 43 -

(AUTO)－μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

12

3

1

S: 1 0 :A Section No. flashes.

1

Press MEM. SEL. key.
The buzzer beeps.

※ A Section No. 「1」 is set.
Then moving on to setting a Data storing number per section.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

12

3

1

S: 1 0 :A Data storing number flashes.

1

Press ▲ or ▼ key to select a Data storing number 「8」.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

12

3

1

S:

8:

A Data storing number flashes.

1

Press MEM. SEL. key.
The buzzer beeps.

- 44 -

※ A Data storing number 「8」 is set.
Lastly, specify a Data storing position within a Section.

(AUTO)In this example, start storing froma Data storing position ｢1｣ within a Section.

－
μm
Ｃａｌ．Ｎｏ． 1

F

A Data storing position flashes.
memNo.

3

12

1

S:

8:

1

Press ▲ or ▼ key to select a Data storing position 「1」.
(In this example, as Data storing position is 「1」. So it moves on to next as it is)(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

12

3

1

S:

8:

A Data storing position flshes.

1

Press MEM. SEL. key.※
The buzzer beeps.

(AUTO)※ Note：Pressing twice MEM. SEL. key turns the screen
to a state of 「Data is not stored」 and then 「Datastoring place」 disappears on the screen.
To store measured data press MEM. SEL. key 6
times successively so that it turn to a state of「Data storing place is displayed and all setting data
do not flash」.

－
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

12

3

1

S:

8:

1

Flashing of all numbers stopped and setting of 「Data storing place」has completed.
It becomes possible to take measurements and adjustments.

- 45 -

（２） Keep data from being stored※ It is in a state of 「Storing data」.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

12

3

1

S:

8:

1

A state of Non-Flashing of all items.

Press MEM. SEL. key.
The buzzer beeps.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F

The screen disappeares and turns
to a state of 「Data is not stored」.

- 46 -

Measurements in storing data
※ Select a place to store data as described in 「(1) Select a Data storing place」 at page 42.
● For operation example, store 8 pcs of measuring data in order from a Data Stroing position ｢1｣ in a Group No. ｢3｣,a Block No. ｢12｣, a Section No. ｢1｣.

(AUTO)－
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

12

3

1

S:

8:

1

※ According to explanations on page 11, quickly press a probe to a measuring object.
A measurement is taken.
The buzzer beeps.

（Fe）
A measured result is displayed.

１０５μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

12

3

1

S:

8:

1

A data measured now is stored in a Data storing position 「1」.
(a number advances by one each time measured)・・・● When the measurement progresses and the data is stored in the last end of a Section No. ｢1｣ in the 8th
measurement, the buzzer beeps, beeps 2 times and warnig that it advances to 「New Section」 in thefollowing measurement.

（Fe）

１０８

A screen when the 8th measurement was finished.

μm
Ｃａｌ．Ｎｏ． 1
memNo.

3

F
12

1

S:

8:

8

A number in a storing place advances to 「8」.
8 pieces of data measured are stored in the placesfrom the numbers of 「1」 to 「8」.

- 47 -

A measurement is taken.
The buzzer beeps.

（Fe）

１０６
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

12

3

2

S:

8:

1

The 9th measured result is displayed.
The 9th measured data is stored in a Data storing position 「1」in a Section No. ｢2」.

A Data storing position returns to 「1」.
A Section No. advances by one to 「2」.

・・・● When the measurement progresses and the data is stored in the last end of a Block No. ｢12｣, a Section No. ｢10｣,the buzzer beeps, beeps 2 times and warnig that it advances to 「New Block」 in the following measurement.

（Fe）

１０４
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

12

3

10

S:

8:

8

This is a scrren when the data is stored in the last end of
a Block No. ｢12｣, a Section No. ｢10｣.

A Data storing position 「8」 is displayed.

A measurement is taken.
The buzzer beeps.

（Fe）

μm

A measured result is displayed.
This measuring data is stored in a Data storing position ｢1｣of a Block No. ｢13｣, a Section No. ｢1｣.

8:A Data storing position returns to 「1」.

１０４
Ｃａｌ．Ｎｏ． 1

F

memNo.

13

3

1

S:

1

A Section No. returns to 「1」.
A Block No. advances by one to 「13」.
※ In a Block No. ｢12｣, 8 data/section × 10 section, total 80 of measuring data are stored.
・・・- 48 -

● When the measurement progresses and the data is stored in the last end of a Block No. ｢20｣, a Section No. ｢10｣,the buzzer beeps, beeps 2 times and warnig that it advances to 「New Group」 in the following measurement.

（Fe）
This is a scrren when the data is stored in the last end of
a Block No. ｢20｣, a Section No. ｢10｣.

１０４μmＣａｌ．Ｎｏ． 1

F

memNo.

20

3

10

S:

8:

A Data storing position 「8」 is displayed.

8

A measurement is taken.
The buzzer beeps.

（Fe）

１０７
Ｃａｌ．Ｎｏ． 1

memNo.

μm

A measured result is displayed.
This measuring data is stored in a Data storing position ｢1｣of a Group No. ｢4｣, a Block No. ｢1｣, a Section No. ｢1｣.

8:A Data storing position returns to 「1」.

F

4

1

1

S:

1

A Section No. returns to 「1」.
A Block No. returns to 「1」.
A Group No. advances by one to 「4」.
※ In a Group No. ｢3｣, 8 data/section × 10 section/block × 9 block, total 720 of measuring data are stored.
※ It becomes 9 block as started storing from 12 block.
・・・● When the measurement progresses and the data is stored in the last end of a Group No. ｢10｣, a Block No. ｢20｣,a Section No. ｢10｣, the buzzer beeps, beeps 2 times and warnig that no more data can be stored.

（Fe）

１０１

This is a scrren when the data is stored in the last end of
a Group No. ｢10｣, a Block No. ｢20｣, a Section No. ｢10｣.

μmＣａｌ．Ｎｏ． 1

F

memNo. 1 0

20

10

S:

8:

8

A Data storing position 「8」 is displayed.

- 49 -

A measurement is taken.
The buzzer beeps.

※ This time the mesurering data is not displayed.

The buzzer beep, beeps.

（Fe）

All the memory
is filled up.
μm
Ｃａｌ．Ｎｏ． 1

Storing data has been completed.

F● It is possible to continue measurements , but measuring data only is displayed.
A measurement is taken.
The buzzer beeps.

（Fe）

１０２

A measured result is displayed.

μm
Ｃａｌ．Ｎｏ． 1

F

The screen disappeares and turns
to a state of 「Data is not stored」.

- 50 -

Storing of measured data at Non-Inturrupt Measurement Mode
When this unit is set at 「Storing of measured data」 and mesurements are taken at「Non-Intrrupt Measurement Mode」, it is capable of storing data on the following procedures.
● Select a place to store data as described in 「(1) Select a Data storing place」 at page 42.
● Start Non-Interrupt measuring.

↓↑
Trace of probe

↓
→

↑
→

→
→
Substrate

→

→

－

751
－

751
837

125

124

123

126

124

751

② Data is stored when key is released.
① Press

TRANSMIT key.

※ Only ｢1 data｣ is stored when the transfer key is released.

- 51 -

Three kinds of measuring methods in case of 「No memory space」（１） Keep on measuring● Measuring.
The buzzer beeps.

（Fe）

A measured result is displayed.

１０３

Cautionμm
Ｃａｌ．Ｎｏ． 1

Measuring can be continued but
data can not be stored.

F（２） Looking for an empty storing place● Interrupt measuring.
● Select a place to store data as described in 「(1) Select a Data storing place」 at page 42.

（Fe）

１０１

In case data is stored in a selected place,the value is displayed.

μm
Ｃａｌ．Ｎｏ． 1
memNo.

F

3

5

1

S: 1 0 :

1

（Fe）

－

In case a selected place is unoccupied,「－」 mark is displayed.

μm
Ｃａｌ．Ｎｏ． 1
memNo.

F

2

Caution1

1

S: 1 0 :Depending on measurement quantities,
5～6 blocks (500～600 : storing quantity)
recommended for selecting as empty
places to store successively.

1

Measuring is resumed.
The buzzer beeps.

（Fe）

１５２
μm
Ｃａｌ．Ｎｏ． 1
memNo.

2

F
1

1

S: 1 0 :A measured value is displayed.

A measured value is stored and advances the numberof a Data storing position by one.

2

- 52 -

（３） Deletion of unnecessary data
● Delete an unnecessary data in a storing place and store there new data which is to be taken.
● Delete all of unnecdcesary data afterward, referring to each knid of deletion methods.
● Resume 「Measurements while storing data」 after deleting data.

Deletion of data
（１） Deletion of one data
※ Data inadvertently by pressing a probe against objectives、poor and unstable pressing on objects anderroneous data which are stored can be deleted.
Erroneous value is displayed.

（Fe）

８５３
μm
Ｃａｌ．Ｎｏ． 1
memNo.

F

2

1

1

S: 1 0 :5

Press DATA ERASE key.
The buzzer beeps.

（Fe）

８５３

ERASE？

「ERASE？」 appears on the screen and flashes.
The measured value flashes.

μm
Ｃａｌ．Ｎｏ． 1
memNo.

F

2

1

1

S: 1 0 :5

Press DATA ERASE key.
The buzzer beeps.

（Fe）

１０７

The measured value is deleted.
The previous stored data is displayed.

μm
Ｃａｌ．Ｎｏ． 1

F

A Data storing position returns by one.
memNo.

2

1

1

S: 1 0 :4

When data storing places are running short and sotred data is no more necessary, it is possible todellete all data collectively and delete data of each storing place.

- 53 -

（２） Deletion of all data※ 『all data』 stored are collectively deleted.
（Fe）

３０２
μm
CautionＣａｌ．Ｎｏ． 1

F

memNo.

1 2

3

6

S: 1 0 :This operation can not be activated when data
colum of data storing place is not displayed.
When it is not displayed, press MEM. SEL.
key 6 times to activate the colum with all thenumbers displayed.

3

Press MEM. CLEAR key.
The buzzer beeps, beeps 2 times.

ERASE？
all data in;all memory.

Press MEM. CLEAR key.
The buzzer beeps, beeps 2 times.

ERASE
All stored data are deleted.

all data in;all memory.

The buzzer beeps.

（Fe）「－」 mark is displayed.

－μm
Ｃａｌ．Ｎｏ． 1
memNo.

1

F
1

1

S: 1 0 :1

In the Data storing infomation, a Data storing number
per section ｢10｣ and all others are 「1」.

- 54 -

（３） Deletion of group data
※ Data stored in arbitrary group with Group No. 1～10 is deleted.
● For operation example, data stored in a Group No. 「5」 is deleted.

（Fe）

３０２
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

1 2

3

Caution6

S: 1 0 :This operation can not be activated when data
colum of data storing place is not displayed.
When it is not displayed, press MEM. SEL.
key 6 times to activate the colum with all thenumbers displayed.

3

Press MEM. CLEAR key.
The buzzer beeps, beeps 2 times.

ERASE？
all data in;all memory.

Press MEM. SEL. key.
The buzzer beeps.

（Fe）

３０２
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

1 2

3

The Data storing infomation is displayed.
6

S: 1 0 :3

A Group No. flashes.

Press ▲ or ▼ key to adjust to a Group No. in which to delete data.

- 55 -

（Fe）

３０２
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

1 2

5

6

S: 1 0 :3

Adjust to a Group No. 「5」.
Press MEM. CLEAR key.
The buzzer beeps, beeps 2 times.

ERASE？
all data in;
G = 5.

Press MEM. CLEAR key.
The buzzer beeps.

ERASE
all data in;
G = 5.

（Fe）「－」 mark is displayed.

－μm
Ｃａｌ．Ｎｏ． 1
memNo.

5

F
1

1

S: 1 0 :1

The Data storing infomation turn as follows:
Group No. 「5」Block No. 「1」Section No. 「1」Data storing number per section 「10」Data storing position 「1」.

- 56 -

（４） Deletion of block data
※ Data stored in arbitrary block with Block No. 1～20 is deleted.
● For operation example, data stored in a Group No. 「1」, a Block No. 「12」 is deleted.

（Fe）

４０３
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

6

2

Caution3

S: 1 0 :This operation can not be activated when data
colum of data storing place is not displayed.
When it is not displayed, press MEM. SEL.
key 6 times to activate the colum with all thenumbers displayed.

5

Press MEM. CLEAR key.
The buzzer beeps, beeps 2 times.

ERASE？
all data in;all memory.

Press MEM. SEL. key.
The buzzer beeps.

（Fe）

４０３
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

6

2

3

S: 1 0 :5

A Group No. flashes.
Press ▲ or ▼ key to adjust to a Group No. where there is a block to be aimed at.

- 57 -

（Fe）

２５６
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

6

1

3

S: 1 0 :5

Adjust to a Group No. 「1」．
Press MEM. SEL. key.
The buzzer beeps.

（Fe）

２５６
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

6

1

3

S: 1 0 :5

A Group No. is set at 「1」, anda Block No. flashes.

Press ▲ or ▼ key to adjust to a Block No. to be aimed at.

（Fe）

２５６
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

12

1

3

S: 1 0 :5

Adjust to a Block No. 「12」.
Press MEM. CLEAR key.
The buzzer beeps, beeps 2 times.

ERASE？
all data in;
B = 12.
【 in G = 1 】- 58 -

Press MEM. CLEAR key.
The buzzer beeps.

ERASE
all data in;
B = 12.
【 in G = 1 】（Fe）「－」 mark is displayed.

－μm
Ｃａｌ．Ｎｏ． 1
memNo.

1

F
12

1

S: 1 0 :1

The Data storing infomation turn as follows:
Group No. 「1」Block No. 「12」Section No. 「1」Data storing number per section 「10」Data storing position 「1」.

- 59 -

（５） Deletion of section data
※ Data stored in arbitrary section with Section No. 1～10 is deleted.
● For operation example, data stored in a Group No. 「3」, a Block No. 「7」, a Section No. 「5」 is deleted.

（Fe）

４０３
Cautionμm
Ｃａｌ．Ｎｏ． 1

F

memNo.

6

2

3

S: 1 0 :This operation can not be activated when data
colum of data storing place is not displayed.
When it is not displayed, press MEM. SEL.
key 6 times to activate the colum with all thenumbers displayed.

5

Press MEM. CLEAR key.
The buzzer beeps, beeps 2 times.

ERASE？
all data in;all memory.

Press MEM. SEL. key.
The buzzer beeps.

（Fe）

４０３
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

6

2

3

S: 1 0 :5

A Group No. flashes.
Press ▲ or ▼ key to adjust to a Group No. where there is a block to be aimed at.

（Fe）

５００
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

6

3

3

S: 1 0 :5

Adjust to a Group No. 「3」.

- 60 -

Press MEM. SEL. key.
The buzzer beeps.

（Fe）

５００
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

6

3

3

S: 1 0 :5

A Group No. is set at 「3」, anda Block No. flashes.

Press ▲ or ▼ key to adjust to a Block No. where there is a section to be aimed at.

（Fe）

５００
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

7

3

3

S: 1 0 :5

Adjust to a Block No. 「7」.
Press MEM. SEL. key.
The buzzer beeps.

（Fe）

５００
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

7

3

3

S: 1 0 :5

A Block No. is set at 「7」, anda Section No. flashes.

Press ▲ or ▼ key to adjust to a Section No. to be aimed at.

- 61 -

（Fe）

５００
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

7

3

5

S: 1 0 :5

Adjust to a Section No. 「5」.
Press MEM. CLEAR key.
The buzzer beeps, beeps 2 times.

ERASE？
all data in;
S = 5.
【 in B = 7 < G = 3 】
Press MEM. CLEAR key.
The buzzer beeps.

ERASE
all data in;
S = 5.
【 in B = 7 < G = 3 】（Fe）「－」 mark is displayed.

－μm
Ｃａｌ．Ｎｏ． 1
memNo.

3

F
7

5

S: 1 0 :1

The Data storing infomation turn as follows:
Group No. 「3」Block No. 「7」Section No. 「5」Data storing number per section 「10」Data storing position 「1」.

- 62 -

Statistics (statistical calculation value of chosen data is displayed)（１） Statistics of all data
（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

The Data storing infomation is displayed.
5

S: 1 0 : 1 0

Press STATISTICS key.
The buzzer beeps, beeps 2 times.

Statistics
Calculation
all data in;all memory.
START ？
Press STATISTICS key.
The buzzer beeps, beeps 2 times.
（displayed as being under process of calculating）
The buzzer beeps.

VALUE ： 【 ALL mem. 】#-dateMeanMedian
Max.
Min.
S. D.

：
：
：
：
：
：

１ ５ ０
１ ０ ６ ． ５
１ ０ ６ ． ４
１ ０ ８ ． １
１ ０ ４ ． ６
０ ． ８

Press STATISTICS key.
The buzzer beeps.

Note:
If STATISTICS key is not pressed, this screen
remains unchanged until Power switches off.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

The screen returns to the state before statistical calculation.

S: 1 0 : 1 0- 63 -

（２） Statistics of group data
※ Statistical calculation is performed on the data stored in arbitrary group with Group No. 1～10.
● For operation example, Statistical calculation is performed on the data stored in a Group No. 「3」.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

The Data storing infomation is displayed.
5

S: 1 0 : 1 0

Press STATISTICS key.
The buzzer beeps, beeps 2 times.

Statistics
Calculation
all data in;all memory.
START ？
Press MEM. SEL. key.
The buzzer beeps.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

S: 1 0 : 1 0

A Group No. flashes.
Press ▲ or ▼ key to adjust to a Group No. in which to calculate statistics.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

3

5

S: 1 0 : 1 0

Adjust to a Group No. 「3」.

- 64 -

Press STATISTICS key while a Group No. is flashing.
The buzzer beeps, beeps 2 times.

Statistics
Calculation
all data in;
G = 3.
START ？
Press STATISTICS key.
The buzzer beeps, beeps 2 times.
（displayed as being under process of calculating）
The buzzer beeps.

VALUE ： 【 G = 3 】#-dateMeanMedian
Max.
Min.
S. D.

：
：
：
：
：
：

１ ５ ０
１ ０ ６ ． ５
１ ０ ６ ． ４
１ ０ ８ ． １
１ ０ ４ ． ６
０ ． ８

Press STATISTICS key.
The buzzer beeps.

Note:
If STATISTICS key is not pressed, this screen
remains unchanged until Power switches off.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

The screen returns to the state before statistical calculation.

S: 1 0 : 1 0- 65 -

（３） Statistics of block data
※ Statistical calculation is performed on the data stored in arbitrary block with Block No. 1～20.
● For operation example, Statistical calculation is performed on the data stored in a Group No. 「1」, a Block No. 「14」.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

The Data storing infomation is displayed.
5

S: 1 0 : 1 0

Press STATISTICS key.
The buzzer beeps, beeps 2 times.

Statistics
Calculation
all data in;all memory.
START ？
Press MEM. SEL. key.
The buzzer beeps.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

S: 1 0 : 1 0

A Group No. flashes.
Press ▲ or ▼ key to adjust to a Group No. where there is a block to calculate statistics.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

S: 1 0 : 1 0

Adjust to a Group No. 「1」.

- 66 -

Press MEM. SEL. key.
The buzzer beeps.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

S: 1 0 : 1 0

A Group No. is set at 「1」, anda Block No. flashes.

Press ▲ or ▼ key to adjust to a Block No. in which to calculate statistics.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

14

1

5

S: 1 0 : 1 0

Adjust to a Block No. 「14」.
Press STATISTICS key while a Block No. is flashing.
The buzzer beeps, beeps 2 times.

Statistics
Calculation
all data in;
B = 14.
【 in G = 1 】
START ？
Press STATISTICS key.
The buzzer beeps, beeps 2 times.
（displayed as being under process of calculating）
The buzzer beeps.

- 67 -

VALUE ： 【 B = 14 】
【 in G = 1 】#-date ：Mean ：Median ：
Max.
：
Min.
：
S. D.
：

５ ０
１ ０ ６ ． ２
１ ０ ６ ． １
１ ０ ７ ． ５
１ ０ ４ ． ６
０ ． ７

Press STATISTICS key.
The buzzer beeps.

Note:
If STATISTICS key is not pressed, this screen
remains unchanged until Power switches off.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

The screen returns to the state before statistical calculation.

S: 1 0 : 1 0- 68 -

（４） Statistics of section data
※ Statistical calculation is performed on the data stored in arbitrary section with Section No. 1～10.
● For operation example, Statistical calculation is performed on the data stored in a Group No. 「5」, a Block No. 「2」,a Section No. 「1」.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

The Data storing infomation is displayed.
5

S: 1 0 : 1 0

Press STATISTICS key.
The buzzer beeps, beeps 2 times.

Statistics
Calculation
all data in;all memory.
START ？
Press MEM. SEL. key.
The buzzer beeps.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

S: 1 0 : 1 0

A Group No. flashes.
Press ▲ or ▼ key to adjust to a Group No. where there is a block to calculate statistics.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

5

5

S: 1 0 : 1 0

Adjust to a Group No. 「5」.

- 69 -

Press MEM. SEL. key.
The buzzer beeps.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

5

5

S: 1 0 : 1 0

A Group No. is set at 「5」, anda Block No. flashes.

Press ▲ or ▼ key to adjust to a Block No. where there is a section to calculate statistics.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

5

5

S: 1 0 : 1 0

Adjust to a Block No. 「2」.
Press MEM. SEL. key.
The buzzer beeps.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

5

5

S: 1 0 : 1 0

A Block No. is set at 「2」, anda Section No. flashes.

Press ▲ or ▼ key to adjust to a Section No. in which to calculate statistics.

- 70 -

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

5

1

S: 1 0 : 1 0

Adjust to a Section No. 「1」.
Press STATISTICS key while a Section No. is flashing.
The buzzer beeps, beeps 2 times.

Statistics
Calculation
all data in;
S = 1.
【 in B = 2 < G = 5 】
START ？
Press STATISTICS key.
The buzzer beeps.

VALUE ： 【 S = 1 】【 in B = 2 < G = 5 】#-date ：Mean ：Median ：
Max.
：
Min.
：
S. D.
：

１ ０
１ ０ ５ ． ９
１ ０ ６ ． １
１ ０ ６ ． ８
１ ０ ４ ． ６
０ ． ７

Press STATISTICS key.
The buzzer beeps.

Note:
If STATISTICS key is not pressed, this screen
remains unchanged until Power switches off.

（Fe）

１０７
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

The screen returns to the state before statistical calculation.

S: 1 0 : 1 0- 71 -

Transferring data – USB –Transfer data to a PC (personal computer) by using a USB cable.
Download the USB transfer driver from the included CD or our website.
※ Data is not transferred when the main unit is set to 「Non-Intrerrupt Measuring mode」.
Make sure beforehand that this main unit is set to 「is set to Normal (hold) Measuring mode」.
※ Even when the unit of this instrument is set to the 「mil」, the data transferred to the Transfer
software is displayed with the 「μm」 unit.

（１） Outright transferring measured data （Real time transfer）● Prepare for a PC side.
● Connect a USB cable to a PC.

This is a USB cable connector.
Hook up a UBS cable to USB cable connector and the other sode to PC.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

S: 1 0 : 1 0

Press COM. ENABLE key.
The buzzer beeps.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

ＵＳＢ

ＵＳＢ
5

S: 1 0 : 1 0

Press TRANSMIT key.
The buzzer beeps.
Data is sent out each time a measurement is taken.

- 72 -

mark is displayed.

（Fe）

CautionPressing COM. ENABLE key without
connecting USB cable, a warning 「USBcable un-connected」 is displayed.
Press again COM. ENABLE key todelete the letters and connect USB cable.

USB cable
un-connectedμm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

ＵＳＢ
5

S: 1 0 : 1 0（２） Interrupt transferring data
（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

ＵＳＢ
5

S: 1 0 : 1 0

Press COM. ENABLE key.
The buzzer beeps.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

ＵＳＢ

S: 1 0 : 1 0

Data stops being transferred.

- 73 -

mark disappears on the screen.

Transferring stored data – USB –（１） Transfer of all data
※ Transferring all stored data.
● Prepare for a PC side.
● Connect a USB cable to a PC.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

S: 1 0 : 1 0

Press COM. ENABLE key.
The buzzer beeps.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

ＵＳＢ
5

ＵＳＢ

S: 1 0 : 1 0

Press MEM. SEL. key.
The buzzer beeps, beeps 2 times.

mark is displayed.

CautionPressing COM. ENABLE key without
connecting USB cable, a warning 「USBcable un-connected」 is displayed.
Press again COM. ENABLE key todelete the letters and connect USB cable.

TRANSMIT ？
all data in;all memory.

Press TRANSMIT key.
The buzzer beeps, beeps 2 times.

- 74 -

TRANSMITTING.
all data in;all memory.

The buzzer beeps.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

Transferring is completed, returning ns to the beginning.

S: 1 0 : 1 0（２） Transfer of group data
※ Data stored in arbitrary group with Group No. 1～10 is transferred.
● Prepare for a PC side.
● Connect a USB cable to a PC.
● For operation example, data stored in a Group No. 「3」 is transferred.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

S: 1 0 : 1 0

Press COM. ENABLE key.
The buzzer beeps.

- 75 -

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

ＵＳＢ

mark is displayed.

ＵＳＢ
5

S: 1 0 : 1 0

Press MEM. SEL. key.
The buzzer beeps, beeps 2 times.

CautionPressing COM. ENABLE key without
connecting USB cable, a warning 「USBcable un-connected」 is displayed.
Press again COM. ENABLE key todelete the letters and connect USB cable.

TRANSMIT ？
all data in;all memory.

Press MEM. SEL. key.
The buzzer beeps.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

ＵＳＢ
5

S: 1 0 : 1 0

A Group No. flashes.
Press ▲ or ▼ key to adjust to a Group No. in which to transfer data.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

3

ＵＳＢ
5

S: 1 0 : 1 0

Adjust to a Group No. 「3」.

- 76 -

Press TRANSMIT key while a Group No. is flashing.
The buzzer beeps, beeps 2 times.

TRANSMIT ？
all data in;
G = 3.

Press TRANSMIT key.
The buzzer beeps.

TRANSMITTING.
all data in;
G = 3.

The buzzer beeps.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

Transferring is completed, returning ns to the beginning.

S: 1 0 : 1 0- 77 -

（３） Transfer of block data
※ Data stored in arbitrary block with Block No. 1～20 is transferred.
● Prepare for a PC side.
● Connect a USB cable to a PC.
● For operation example, data stored in a Group No. 「4」, a Block No. 「7」 is transferred.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

S: 1 0 : 1 0

Press COM. ENABLE key.
The buzzer beeps.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

ＵＳＢ

mark is displayed.

ＵＳＢ
5

S: 1 0 : 1 0

Press MEM. SEL. key.
The buzzer beeps, beeps 2 times.

CautionPressing COM. ENABLE key without
connecting USB cable, a warning 「USBcable un-connected」 is displayed.
Press again COM. ENABLE key todelete the letters and connect USB cable.

TRANSMIT ？
all data in;all memory.

Press MEM. SEL. key.
The buzzer beeps.

- 78 -

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

ＵＳＢ
5

S: 1 0 : 1 0

A Group No. flashes.
Press ▲ or ▼ key to adjust to a Group No. where there is a block to transfer data.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

4

ＵＳＢ
5

S: 1 0 : 1 0

Adjust to a Group No. 「4」.
Press MEM. SEL. key.
The buzzer beeps.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

4

ＵＳＢ
5

S: 1 0 : 1 0

A Group No. is set at 「4」, anda Block No. flashes.

Press ▲ or ▼ key to adjust to a Block No. in which to transfer data.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

7

4

ＵＳＢ
5

S: 1 0 : 1 0

Adjust to a Block No. 「7」.

- 79 -

Press TRANSMIT key while a Block No. is flashing.
The buzzer beeps, beeps 2 times.

TRANSMIT ？
all data in;
B = 7.
【 in G = 4 】

Press TRANSMIT key.
The buzzer beeps.

TRANSMITTING.
all data in;
B = 7.
【 in G = 4 】

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

Transferring is completed, returning ns to the beginning.

S: 1 0 : 1 0- 80 -

（４） Transfer of section data
※ Data stored in arbitrary section with Section No. 1～10 is transferred.
● Prepare for a PC side.
● Connect a USB cable to a PC.
● For operation example, data stored in a Group No. 「5」, a Block No. 「8」, Section No. 「1」 is transferred.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

S: 1 0 : 1 0

Press COM. ENABLE key.
The buzzer beeps.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

ＵＳＢ
5

ＵＳＢ

S: 1 0 : 1 0

Press MEM. SEL. key.
The buzzer beeps, beeps 2 times.

mark is displayed.

CautionPressing COM. ENABLE key without
connecting USB cable, a warning 「USBcable un-connected」 is displayed.
Press again COM. ENABLE key todelete the letters and connect USB cable.

TRANSMIT ？
all data in;all memory.

Press MEM. SEL. key.
The buzzer beeps.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

ＵＳＢ
5

S: 1 0 : 1 0

A Group No. flashes.

- 81 -

Press ▲ or ▼ key to adjust to a Group No. where there is a block to transfer data.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

5

ＵＳＢ
5

S: 1 0 : 1 0

Adjust to a Group No. 「5」.
Press MEM. SEL. key.
The buzzer beeps.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

5

ＵＳＢ
5

S: 1 0 : 1 0

A Group No. is set at 「5」, anda Block No. flashes.

Press ▲ or ▼ key to adjust to a Block No. where there is a section to transfer data.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

8

5

ＵＳＢ
5

S: 1 0 : 1 0

Adjust to a Block No. 「8」.
Press MEM. SEL. key.
The buzzer beeps.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

8

5

ＵＳＢ
5

S: 1 0 : 1 0

A Block No. is set at 「8」, anda Section No. flashes.

- 82 -

Press ▲ or ▼ key to adjust to a Section No. in which to transfer data.

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

8

5

ＵＳＢ
1

S: 1 0 : 1 0

Adjust to a Section No. 「1」.
Press TRANSMIT key while a Section No. is flashing.
The buzzer beeps, beeps 2 times.

TRANSMIT ？
all data in;
S = 1.
【 in B = 8 < G = 5 】

Press TRANSMIT key.
The buzzer beeps.

TRANSMITTING.
all data in;
S = 1.
【 in B = 8 < G = 5 】

（Fe）

１０１
μm
Ｃａｌ．Ｎｏ． 1

F

memNo.

2

1

5

Transferring is completed, returning ns to the beginning.

S: 1 0 : 1 0- 83 -

Note to improve measuring accuracy① Zero platePrepare the same material, thick and shape plate as the measuring object for Zeroing and Calibration
standard (CAL). Different materials may not bring about correct measuring results.
※ As accessories to probe (option), “Zero plates” are for testing purpose only.
Select a most optimal zero plate to meet actually measuring objects. (Please refer to page 14)② Thickness standard (foils)
Take Calibration standard (CAL) using a Thickness standard which is thicker or as thick as
the measuring films.
※ Use of a Thickness standard with a deviant thickness may cause errors.
Replace worn-out or bent plates with new ones. In case non-accessorized plates are necessary(over 16μm), contact a local sales office.
③ Quality of films to be measured
Magnetic metal contained in the films can correctly not be measured. In case of measuring elastic films,
place aThickness standard of 30～50μm thick on the object and subtract the thickness from the measuring
value to avoid errors to becaused by elastic dents.
④ Measurements of edges or angles
Magnetic fields in the neighborhood of the edges/the angles of a measuring object become uneven.
15～20mm closer part to the center of the object shall generally be measured.
Pay attention to protruded part, curved part or unexpectedly deformed part.
⑤ Measurements of rough faces
Roughness of a substrate, a measuring face affects measuring results.
Take a mean value by measuring several places at a time.
⑥ Measurements of stretched part on faces
In some case stretched, rolled part occurred on a substrate, which may cause measuring errors.
Take a mean value by measuring several places at a time.
⑦ Temperature
Operating temperature range is 0～40℃.
Especially, large temperature differences between a main unit and a probe causes measuring error.
⑧ Residual magnetism, stray magnetic fields
Pay attention to transportation method of electromagnets, residual magnetism on substrates or arc welding,those of which emit strong magnetic fields to cause measuring errors.

- 84 -

Trouble Shooting
Before contacting us please check with the following points.
Symptoms

Points to check

Measures to be taken

No response upon press of「」 key.

Are batteries worn out?

Replace them with new ones (2 ea.).

No response after replacing
batteries and pressing a「」 key.

Something wrong inside a mainunit.

Contact us for repair.

Batteries is shorting.

They can be used for a while.
Prepare for new batteries.

Batteries have worn out.

Replace them with new ones.

Out of batteries.

Replace them with new ones.

Possibly pressing probe to
object too soon after pressing「」 key.

Hold probe in air, keeping it away
off measuring objects, metals
during a time of “START UP ・・・”
on screen.

Press 「」 key without
connecting probe.

Press 「」 key after being
sure of connecting probe.

BAT

BAT
BATTERY
is dead!
Replace all of them with
NEW BATTERY.

《Power ＯＦＦ》

ERROR！
Hold the probe
in the air.

《Power ＯＦＦ》
ERROR！
Connect a probe
beforeswitched on.

《Power ＯＦＦ》

- 85 -

Symptoms
TROUBLE！
The probe may
have trouble.
Change it tothe other one.

Points to check

Measures to be taken

Something wrong with probe.

Contact us for repair.

Something wrong with probe/
main unit.

Contact us for repair.

Is data stored in all memory?

Delete unnecessary data to makevacancies in memory.

Is Measurement mode set to『Non-Interrupt Measurementmode』？

Press 「TRANSMIT」 key andrelease it.
Data is stored when releasing.

Is USB cable connected
correctly ?

Connect USB cable correctly.

① Is USB cable connected
correctly ?
② Is PC side ready to operate ?

① Connect USB cable correctly.

① Does PC operate normally?

① Check if something wrong
with PC side.
② Contact us for repair.

《Power ＯＦＦ》
TROUBLE！
The probe and the
交換して下さい。
main unit may havetrouble.
Repairing needed.

《Power ＯＦＦ》
Data can not be stored inmemory.

USB cable
un-connected

Unable to transfer data.

Sudden interruption of datatransfer.

② PC side is not faulty.
→ Something wrong withmain unit.

② (1) Install driver by our home
page correctly.
(2) Set Comport No.correctly.

Disclaimer
We are not liable for any damage to customers caused by the use or inability to use of this product (including built-in
software and data).

- 86 -

Specifications◆ Main unit
Items

Applications

Model name

Dual (Electromagnetic/Eddy current) type coating thickness meter
SWT-7200Ⅳ

Display method

Graphic LCD （data/message）, Backlight

RangesDepending on optional probes

Calibrations （CAL）

2-point calibration
Zero: metal substrate calibration
Calibration standard: metal substrate and thickness standard calibration

Additional functions① Switching measuring modes （hold/non-interrupt）② Switching display resolutions (depending on a connecting probe)③ Switching of units④ Auto Power Off （about 3 min.）, releasing and reactivating⑤ Setting for exclusive substrate mode
(only when SFN-325 probe is connected)⑥ Backlight⑦ Setting/storing of calibration curves: Max. 10 pcs⑧ Upper/lower limt setting, alarm (setting by each calibration)⑨ Collective/selective deletions of calibration values⑩ Measuring data memory: 20,000 data
⑪ Statistics process, displays⑫ Data output to PC (USB terminals)⑬ Screen switching function (Main/Sub), ZERO ,Keys

Operating Temperature
Accessories

OptionDimensions
Weight,▼, CAL ,CAL No. , Ｈ/Ｌ , STATISTICS , MEM. SEL. , COM. ENABLE ,TRANSMIT ,

Power

▲

MEM. CLEAR , DATA ERASE , CANCEＬ

3Ｖ ＤＣ Dry Battery （LR6×2）, Continuous operation hours about 25 hours※
AC adaptor※ Maximum (may vary depending on usage conditions)0 ～ 40℃ （Non-condensing）
Dry battery, Carrying case, Hand strap cord, Inspection certificate,AC adaptor, USB cable, CD (Instruction manual, USB driver, etc.)
For ferrous substrate probe （SFe）, For nonferrous substrate probe （SNFe）,
Dual ferrous/nonferrus substrate probe （SFN-325）,
72（Ｗ） × 30（Ｈ） × 156（Ｄ）mm
About 200g

- 87 -

◆ Probe (option)
Model

SFN－325

SFe-0．6Pen

SFe-0．6L

Measuring method

Dual (Electromagnetic/Eddy current) type（auto-selection for Fe/NFe）

Electromagnetic typeMeasuring range

Fe： 0～3．00mm, NFe： 0～2．50mm

0～600μm

1μm： 0～999μm
0．01mm： 1．00～3．00mm （Fe）
： 1．00～2．50mm （NFe）
Resolutions

by switching
0．1μm： 0～400μm
0．5μm： 400～500μm

by switching
0．1μm： 0～400μm
0．5μm： 400～500μm
Accuracies(to flat, smooth face)

1μm： 0～600μm

0～100μm： ±1μm or ±2％ of reading
101μm～3．00mm： ±2％ （Fe）
101μm～2．50mm： ±2％ （NFe）

0～100μm： ±1μm
or ±2％ of reading
101～600μm： ±2％

Probes

One point contact constant pressure typ
V-cut
about φ15×51mm

One point contact
One point contact
constant pressure typconstant pressure typ
about 8×13.5×119mm
V-cut（Minimum measuring
about φ5.5×92.5mm
Diameter φ16）

Options

V type probe adaptors※－

Thickness standards,
Zero plates for testing（Fe/NFe）

Thickness standards,
Zero plates for testing（Fe）

Fe： coating, lining, thermal spray film, plating(except electrolyte nickel plating）, etc.
on magnetic metal substrate like iron, steel.
NFe： relatively general use objects like insulated
films on non-magnetic metal substrate
like aluminum, cupper, etc.

Coating, lining, thermal spray film, plating(except electrolyte nickel plating）, etc.
on magnetic metal substrate like iron, steel.

Accessaries

Measuring objects※ 3 kinds of V type probe adaptors （less φ5、φ5～10、φ10～20）- 88 -

Small parts, narrowplaces, and so on.

Inside of a small
diameter tubes, narrowplaces, and so on.

◆ Probe （option）
Model

SFe-2．5※1/SFe-2．5L

SFe-2．5LwA

Measuring method
Measuring range

SFe-10Electromagnetic type0～2．50mm

0～10mm1μm： 0～999μm
0．01mm： 1．00～2．50mm
Resolutions

Accuracies(to flat, smooth face)SFe-201μm： 0～999μm
0．01mm： 1～10mmby switching
0．1μm： 0～400μm
0．5μm： 400～500μm
0～100μm： ±1μm or ±2％ of reading
101μm～2．50mm： ±2％

Probes

One point contact
One point contact
constant pressure type
constant pressure type
V-cut
Measuring part：SFe-2．5：
about 24×27×56mm
about φ15×47mm
Full length （flexible）：
SFe-2．5L：
about 546～1530mm
about 18×22×67mm

Options

V type probe adaptors※2／－－

Accessaries

Thickness standards,
Zero plates for testing（Fe）

Thickness standards,
Zero plates for testing（Fe）,
Carring case

Measuring objects

Coating, lining, thermal
spray film, plating(except electrolyte
nickel plating）, etc.
on magnetic metal
substrate like iron, steel.

For coating thickness
on remote, unreachable
place of coating, lining
on magnetic metal
substrate like iron, steel.

※1： Heat-resistant （about 200℃） for probe Ｆｅ-2.5※2： 3 kinds of V type probe adaptors （less φ5、φ5～10、φ10～20）- 89 -

0～20mm1μm： 0～999μm
0．01mm： 1～5mm
0．1mm： 5～20mm

0～3mm： ±（5μm＋3％ of reading）
3．01mm or over： ±3％

One point contact
constant pressure type
V-cut
about φ21×47mm

One point contact
constant pressure type
V-cut
about φ35×55mm－－

Thickness standards,
Zero plates for testing（Fe）
On magnetic metal substrate like iron, steel

For relatively thicker
objects

For thick objects

◆ Probe （option）
Model

SNFe-2．0/SNFe-2．0L

Measuring method
Measuring range

SNFe-0．6

SNFe-5

SNFe-80～5．00mm

0～8．00mm

Eddy current type0～2．00mm

0～600μm

1μm： 0～999μm
1μm： 0～600μm
0．01mm： 1．00～2．00mm
Resolutions

by switching
0．1μm： 0～400μm
0．5μm： 400～500μm

1μm： 0～999μmby switching
0．01mm： 1～5mm
0．1μm： 0～400μm
0．5μm： 400～500μm

0～100μm： ±1μm
0～100μm： ±1μm
or ±2％ of readingor ±2％ of reading(to flat, smooth face)
101μm～2．00mm： ±2％ 101～600μm： ±2％
Accuracies

Probes

One point contact
constant pressure type
V-cut
SNFe-2．0：
about φ15×47mm
SNFe-2．0L：
about 18×22×67mm

Options

V type probe adaptors※／－

Accessaries

1μm： 0～999μm
0．01mm： 1～8mm

0～3mm： ±（5μm＋3％ of reading）
3．01mm or over： ±3％

One point contact
One point contact
One point contact
constant pressure type constant pressure type constant pressure type
V-cut
V-cut
V-cut
about φ13×45.5mm about φ20.5×47mm about φ35×59mm

―

―

―

Thickness standards, Zero plate for testing （NFe）
Insulated films on non-magnetic substarate metal like aluminum, cupper, etc.

Measuring objects

Relatively general use
objects

For high stability withnarrow bars, small
tubes, minute pieces※ 3 kinds of V type probe adaptors （less φ5、φ5～10、φ10～20）- 90 -For relativfely thicker objects

Reference (measurement principles)● Electromagnetic type
When metals approach to AC- magnetic fields emitted from probe, the metal and the magnet pull each other.
It makes the pulling force stronger as they come closer.
In other words, it makes the magnetic density higher as theycome closer. On the contrary, it weakens the magnetic
density as they move away from each other.
This symptom means that magnetism emitted from probe has
Higher Transferability when they come closer, and lower
Transferability when they move away from each other.
These levels of transferability of the magnetism co-relatewith thicknesses of films coated on substrates.
By analyzing correlations of transferability/less transferability(Reluctance), and thicknesses of the films on the substrates,
the correlated values can be converted to the thickness,
actually by measuring the Reluctance to be processed.
Because it is difficult to observe and measure magnetic volumes,
it is necessary that the Reluctance volumes be converted
to electric volumes using coils and methods of the Principle ofElectromagnetic Induction so that the measured values canbe processed and converted to the thickness values.
● Eddy Current TypeThe eddy current is induced on the surface of metals when metals approach to alternating current fields emitted from probe.
As the metal comes closer to the probe, the eddy current increases and the magnetic field density becomes high.
On the contrary, as the metal move away from the probe, the eddy current decreases and the magnetic density becomes
low: Correlations of between density of magnetic field and film thicknesses on the substrate are analyzed beforehand.
It measure the thicknesses by converting to the thickness value from themagnetic density measured through the above correlations.
Because it is difficult to observe and measure the density of a magnetic
field, it is necessary that a coil be put in magnetic fields
and converted to electric volumes for measurements
using the Principle of Electromagnetic Induction
so that the measured value can be processed andconverted to the thickness value. Generally in the eddy
current type, it varies in measurement range on nonmagnetic substrate by dividing substrates by a high-wave
transferable like Alumi and Copper and non-transferable
like irons to optimize the measurement methods.

- 91 -

◆ Products sold ◆Coating thickness meter, Pinhole detector,
Moisture meter, Concrete covermeter, Condensator,
Needle detector, Iron piece detector, Viscosity cup

SANKO ELECTRONIC LABORATORY CO.,LTD.
Head office: 1677 Hisasue, Takatsu-ku, Kawasaki 213-0026, JapanTokyo branch: Shibata Bldg., 2-6-4, Uchikanda, Chiyoda-ku, Tokyo 101-0047, Japan
TEL: 81-3-3254-5031 FAX: 81-3-3254-5038
Osaka branch: Wake Bldg., 1-11-9, Higashitenma, Kita-ku, Osaka 530-0044, Japan
TEL: 81-6-6881-1230 FAX: 81-6-6881-1232
Sendai branch: Bonheur Est, 2-5, Teppomachinaka, Miyagino-ku, Sendai 983-0868, Japan
TEL: 81-22-292-7030 FAX: 81-22-292-7033
Nagoya branch: Meihoku Bldg., 3-11-27, Kinjo, Kita-ku, Nagoya 462-0847, Japan
TEL: 81-52-915-2650 FAX: 81-52-915-7238
Fukuoka branch: 11-11, Naraya-cho, Hakata-ku, Fukuoka 812-0023, Japan
TEL: 81-92-282-6801 FAX: 81-92-282-6803
URL https://www.sanko-denshi.co.jp

E-mail info@sanko-denshi.co.jp