Requirements for Industrial Cabling Supporting
Gigabit Applications for Control
A Study of Noise

Bob Lounsbury
Principal Engineer
Rockwell Automation
October 14, 2015

Abstract
This paper is the result of over 700 man hours of cable measurements, noise testing and analysis
resulting in defining cabling parameters supporting 1Gig cabling requirements for harsh industrialenvironments.
In the early 2000 a study was performed by several ODVA member companies. The goal of this study
was to define the requirements for 10/100mb/s twisted pair cabling for industrial environments. This
eventually resulted in the creation of national and international standards defining parameters forcabling used on the factory floor and industrial machine areas. Once again with the need foradditional bandwidth we find the need to define the parameters required to support of 1gig data rates
on 4 pair industrial cabling.
This paper will discuss the approach used, the testing, analysis and the results of the study. The
testing, is based on standardized transmission line testing techniques and environmental noise
testing as defined by ISO/IEC and IEC 61000 standards. In addition this paper will discuss the impactof the new limits to the parameters from a technical perspective. Since industrial cabling is thesubject to national and international standards this paper will briefly cover the approach tostandardization, including the EtherNet/IP Specification. The paper will conclude with a complete setof cabling component specifications defining the communications channel supporting robust data
communications for control applications.

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Purpose
The purpose of this project is to determine the required cable performance needed to support
1000 Base-TX for industrial control applications. This study and white paper does not consider
applications using office grade cabling in office (MICE 1) environments. This report documents
the tests, test results and conclusions of cable transmission and EMC testing. Bothunshielded and shielded cables were considered and evaluated. In the case of shielded cables
additional testing is performed to determine the shielding effectiveness since it is expectedthat shielding has a positive impact on cable’s noise rejection.
The foundation of this project is based on examining the performance of off-the-shelf cables
and engineering samples designed for both office and industrial applications. The design ofthe cabling targeted for Industrial applications must be carefully considered where theenvironments are MICE - E 2 and MICE - E3.

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Background•

Ethernet and Fast Ethernet (10/100Mb/s) cabling study 1999/2000– RL and TCL/ELTCTL was the focus– 2006 Industrial Focused Standards recognized the need and applied specs tocabling– Driven by ODVA• ISO/IEC 24702 and• ANSI/TIA 1005 Was Created– ISO/IEC specified TCL and ELTCTL in terms of MICE Classifications under “E”
Electromagnetic Noise.
– The TCL and ELTCTL values were not optimal for industrial cabling based on IEC
61000 Testing and limits.

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4ISO/IEC 24702 -- ANSI TIA 1005 – IEC 61918

TCL for Class D andClass E Channels

ELTCTL for Class Dand Class E Channels

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5•

A presentation describing the test methods and results has been circulated
to the EtherNet/IP Physical Layer SIG, TIA TR42.9, ISO/IEC and IEC.
– Described what was tested (30 cables 12 UTP and 18 Screened)– Mixture of solid and stranded designs UTP(4 stranded/8 solid), Screened (13Stranded/5 Solid).
– Tests Performed– Methods for how the cables were tested– Results of the Tests– Results, Channel Recommendations for TCL and ELTCTL

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6StartTest Plan andCable Data Sheets
Collected

Data
Collected
S4p andCSV

Transmission Line
Testing
UTP and Shielded

Conducted
Immunity Testing
UTP/Shielded
IEC 61000-4-6

EFT/B Testing
UTP/Shielded
IEC 61000-4-4

CA Testing
Shielded
Cables Only

Data
Collected
XLSX

Differential
Noise Voltage

Data
Collected
XLSX

IXIA BER

Data
Collected
XLSX

CommonMode
Impedance
Testing
UTP/Shielded

Data
Collected
XLSX

Differential
Noise Voltage

Data
Collected
XLSX

IXIA BER

Data
Collected
XLSX

Data Compiled
andCalculations
Performed

ReportEnd

1Gigabite Industrial Project Work Flow
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Automation•All Cable Tests were Automated using HP VEE– Data Collection was saved in S4P, CSV and XLSX formats•••

Visual Basic was used for Data Import, Graphing
Excel was Used for Trending
Mathcad and Excel was Used for Calculations

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8Insertion Loss of Samples Stranded and Solid
Sdd21Cable(PR1, PR2, PR3, PR4)-‘Sdd21(Fixture)
The maximum IL for any of the 4 pairs was used. The fixture IL was removed
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9Return Loss
Worst Case RL was Graphed for any Given Pair

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TCL Maximum UTP and Screened
SCD21Max(PR1, PR2, PR3, PR4)

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11Measured Balance TCL
SCD21max(PR1, PR2, PR3, PR4)-[Sdd21max(PR1, PR2, PR3, PR4)-Sdd21(fixture)]
The balance was graphed from the data and equations above. Trend lines createdand equations extracted.
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12Close Look at Measured TCL and Differential Noise••

The Measured Sdc21 was converted to a ratio of polynomial equivalent
The measured Vn-Differential and trended to a equivalent equation– Graphed for comparison and analysis

 Scd21( f ) 20

Scd21_Ratio 10

Vn_DiffAs a function of frequency

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Vn_CM Scd21_Ratio

As a function of frequency andbalancewww.odva.org

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Balance and Differential Noise Conversion
Sdc21 performance is seen in the cable’s mode conversion
When the cable has poor balance the CM→Diff noise conversion is highTechnical Track© 2015 ODVA, Inc.

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Conducted Immunity•In accordance with IEC 61000-4-6– Cable Test Fixture• Controlled impedance to the GRP• Low cross coupling• PVC Cones Protect Bend Radius
Capacitive Coupling
Clamp or Injection Clamp

GRP

PVC Cones
10 CM

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Conducted Immunity Cable Termination•copper divider•

Cables Terminated into Industrial
Rated Plug at NE for BER Testing
Cables Terminated into BALUNs
for Vn Diff measurements.
4X BALUNs BH 040-229

copper divider
copper divider

copper divider

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BALUNs directly
connected to GRP via
Copper Tape

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CUT

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Cable Termination FE•

Cables Terminated at CM and Diff
Impedance

25 Ohm25 Ohm25 Ohm25 Ohm50 Ohm X 250 Ohm X 250 Ohm X 250 Ohm X 2

CUTT Terminator
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IEC Bench Setup, Differential Noise Testing•

OUT

RF Power Amp
3dB Attenuator
Coupling Clamp

REVGPIBRF METER (Dual Channel)

CUT 100M

co pper
divid er•

12G scope was used to collect
Vn_diff
Bench Control and DataCollection was fully AutomatedVn Applied was Closed Loop
Controlled

copperdividercopperdivider

co pper
divid er•

FWD
Directional Coupler

RF Generator

4X Baluns
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T-Terminator
18

IEC Bench Setup, BER Testing••

Ixia was Used for BER Statistics
Bench Control and Data Collection
was Fully AutomatedVn Applied was Closed Loop
Controlled

FWD

Directional Coupler

RF Generator•OUT

RF Power Amp
3dB Attenuator
Coupling Clamp
REVGPIBRF METER (Dual Channel)

Port 1 PBRS Bit Errors
Port 2 PBRS Bit Errors
Port 1 Error Ratio
Port 2 Error Ratio
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Industrial
Switchwww.odva.org

IXIA

Industrial
SwitchBATT 24V

19

Re  magnitude cos (phase )Constant ImpedanceCommon Mode Term

Im  magnitude sin(phase )250 Ohm X 22Zcmm  Re  Im

25 Ohm25 Ohm50 Ohm X 2SMA
25 Ohm25 Ohm50 Ohm X 250 Ohm X 2NWA

The Common Mode Impedance was Measured
The common Mode Impedance was used to determine themagnitude of the common mode noise applied.
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Vn_CM Applied•

The Applied CM Noise Voltage is a function of the Probe CFs and theCommon Mode Impedance Between the GRP and the Cable 10CM off theBench.

VappliedTechnical Track© 2015 ODVA, Inc.

 20 log P robeVmv  1000 CF 120 20 Zcm10

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Cable 2Cable 1
0.08
0.07
0.06
0.050.04
0.03
0.02
0.01
0.00
-0.01
1000001400000
1200000
1000000
800000600000400000200000y = -3E-11x2 + 2E-06x + 0.0137

0100

1000
CH1 P1 PRBS F RX

10000
Sum0.08

1400000

0.07

1200000

0.06

1000000

Poly. (Sum)

0.05

8000000.04

6000000.03

4000000.02

2000000.01

y = -2E-11x2 + 2E-06x + 0.0185

0100

1000
CH1 P1 PRBS F RX

10000
Sum0.00
100000Poly. (Sum)BER Vs Differential Voltage (UTP)
Two graphs show that when the mode conversion increases the error
rates follow. Noise above 40mV causes a sharp increase in errors.
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22Cable 4

Cable 30.08
1400000

0.07

1200000

0.06

1000000

0.05

8000000.04

0.08
1400000

0.07

1200000

0.06

1000000

0.05

8000000.04

6000000.03

6000000.03

4000000.02

4000000.02

0.01

2000000.01

0.00
1000000200000

y = -1E-11x2 + 8E-07x + 0.0214

0100

1000
CH1 P1 PRBS F RX

10000
Sum

Poly. (Sum)

100

1000
CH1 P1 PRBS F RX

10000
Sum0.00
100000Poly. (Sum)BER and Mode Conversion Correlation
The UTP Cable Samples show a direct correlation between BERand Vn Diff
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Graph of Vdiff VS EXP(EL Mode Conv) out layers removed
0.05

0.05

y = 0.011e0.169x

0.045

Exp( Balance)

 BalancedB 

0.04

200.035
10

Balance asMeasured Scd21




0.045

0.04
0.035

y = 0.0171e0.1658x

0.03

0.03

0.025

0.025

0.02

0.02

0.015

0.015

0.01

0.01

0.005

0.005

0001Vdiff (mV)

234Exp (balance)

5Expon. (Vdiff (mV))

67Expon. (Exp (balance))

Analysis of Vn Diff and EL Mode Conversion (UTP)
Blue Trace Vn Differential
Red Trace TCL Conversion Ratio According to the Equation above
Traces show that there is a correlation between Cable balance and mode conversion in the cable.
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TCL = -59.8+5.9393*log(f)00.035

-10

0.03

-20

0.025
-30
0.02
-40
0.015
-50

0.01

-60

0.005
0-700.1110100Frequency (KHz)

Channel TCL

Calc Vdiff (@10V)

EL_TCTL

Limit line for Channel TCL and Calculated Vn Diff at 10V RMS applied
Note over 40 MV we see a sharp increase in BER
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TCL (dB)

VDiff (V)

Vn_Diff

 ELTCTL dB 20VnApplied  100.04

 12.4410  20
TCL_Chan_24702E2 f.TCL
TCL_Chan_24702E3 f.TCL 40
Indust_TCL_E3 f.TCL
TCL_Chan_24702E1 f.TCL 60

 77
 80
110100

1f.TCL3110250

Industrial Channel TCL E3 Comparison to ISO/IEC 24702
Indust_TCL_E3( fChan ) Technical Track© 2015 ODVA, Inc.

 6 0  15log(fChan) if fChan  80y    MICE
 20 log ( fChan )   otherwise
6 1y   MICE

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fChan  12 250
MICE

 77MICE

 86.6

6 06 1

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10.239Indust_VnE3 f.TCL

0.1

VnE3 f.TCL0.01

31.41310110311013110100f.TCL

250

Comparison of Vn Diff Comparison between ISO/IEC
24702 E3 TCL and Recommended Industrial E3 TCL
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Analysis of Channel Element Contributions to Channel TCL
 20

 35.54

Combined TCL
Cable TCL
Connector TCL
Industrial E3 TCL

TCL_Chan_Combined f.TCL  40



TCL_Cable f.TCL



 60

TCL.Conn_sim f.TCLIndust_TCL_E3 f.TCL

 80
 94
 1001101  TCL_Cable fTCL    TCL Conn_sim fTCL  2020

TCL_Chan_Combined fTCL  20log10 n_conn  10


100f.TCL

1000
250

Individual Contribution of Connectors, Cables to the Total TCLConnector and Cable TCL’s adjusted to meet the Industrial E3 TCL
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Differential Noise•

Predicted Channel Differential Noise 2 Connectors 10V CM
Differential Noise (Mode Conversion)
0.2Vn DifferentialVnRX Sens0.15TCL_Ratio fTCL
RX_Limit

 0.1
0.05

01

101001

310fTCL

Frequency (MHz)Technical Track© 2015 ODVA, Inc.

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TCL Equations of Limit Lines•

Component and Channel Equations
TCL_CablefTCL y  if fTCL  30 

 TCL_Ancor  15 log fTCL

( TCL_Ancor  7.4)  20 log fTCL otherwise



if

 if fTCL  30 

 TCL_Ancor  15 log fTCL

( TCL_Ancor  7.4)  20 log fTCL otherwise TCL_Limit

New Values for Cable TCLy  TCL_Limit otherwise

New Values for Connector TCL  TCL_Cable fTCL    TCL Conn_sim fTCL  2020
TCL_Chan_Combined fTCL  20log10 n_conn  10Calculated Combined TCL for 2 Connectors

Since a RJ45 connector is inherently unbalanced and there are 4 connections, they are the highest
contributor to the poor TCL. Reducing the number of connectors and increasing the anchor helps toequal out the contribution between the cable and the connectors in the channel
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ELTCTL•

Proposed Channel ELTCTL for UTP and Screened are the Same

ISO 11801 and 24702 TCTL
0

TCTL (dB)

ISO_TCTLE1( fTCTL ) 20

ISO_TCTLE2( fTCTL )ISO_TCTLE3( fTCTL )Indust_ScreenedTCTL_IndustE3( fTCTL )Indust_UTPTDCTL_IndustE3 ( fTCTL )

 40

 60

ISO E1ISO E2
ISO_E3
Industrial Screened E3
Industrial UTP E3110100

fTCTLFreq (Hz)Technical Track© 2015 ODVA, Inc.

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Limits for E3 Channel and Components•Cable ELTCTL is the limiting Factor

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Component/Channel Disparity•

The mathematical model of the components falls in between E1 and E2 ofthe Channel ELTCTL TCTL Conn( fTCTL )   Cab_ELTCTL_IECfTCTL()

2020


Chan_TotalE1( fTCT L)  20 log10 10

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Proposed Component Limits for ELTCTL•The New Component Values Combined Meet the targeted Channel
ELCTCL for E3 as Modified

Indust_TCTLConn( fTCT L) ( 68  20 log( fTCT L) ) if ( 68  20 log( fTCT L) )  TCTL_Limit
conn
TCTL_Limit
conn otherwise

Indust_TCTL Cab ( fTCTL )  ( 53.5  20 log( fTCTL ) ) Indust_TCTLConn( fTCTL )   Indust_TCTLCab( fTCTL ) 
2020  10
Calc_TCT L_IndustChan ( fTCT L)  20 log10Technical Track© 2015 ODVA, Inc.

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Differential Noise Analysis for 10VCM•

Note Analysis still shows Differential Noise above 0.04V below 10MHz

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THANK YOU