S330 Series SATA III Industrial 2.5” SSD

401-0236-00 Rev. A

S330 Series
SATA III Industrial 2.5”
Solid State Drive
Engineering Specification
Document Number: 401-0236-00
Revision: A

128GB 2.5” SATA SSD
Industrial Temperature

DE1HTNJA2-35000-D

1058994-1217© 2017 | Delkin Devices Inc.

S330 Series SATA III Industrial 2.5” SSD

401-0236-00 Rev. A

Product Overview








Capacity￭ 16GB up to 256GB
SATA Interface￭ SATA Revision 3.2￭ SATA 1.5Gbps, 3Gbps, and 6Gbps
interfaceFlash Interface￭
Flash type: SLC
Performance￭
Read: up to 330 MB/s￭
Write: up to 310 MB/sPower ConsumptionNote1

Write: < 3,750mW￭
Read: < 3,000mW￭
Idle: < 250mW
TBW (Terabytes Written) Note2

￭
￭
￭
￭
￭

14,600 for 256GB

NCQ
SMART
Over-Provisioning (Option)
Firmware Update Capability
Temperature Sensor



Low Power Management￭
DIPM/HIPM Mode
Temperature Range￭
Operation: -40°C ~ 85°C￭
Storage: -50°C ~ 100°C



RoHS compliant



￭

￭

MTBF
￭
More than 2,000,000 hours
Features￭
Static and Dynamic Wear Leveling￭
Bad Block Management￭
TRIM

Notes:
1. Please see “4.2 Power Consumption” for details.
2. Please see “TBW (Terabytes Written)” in Chapter 2” for details.

© 2017 | Delkin Devices Inc.

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TABLE OF CONTENTS
1.

INTRODUCTION....................................................................................................... 6
1.1.

General Description ........................................................................................ 6

1.2.

Product Block Diagram ................................................................................... 6

1.3.

Flash Management ......................................................................................... 6
1.3.1. Error Correction Code (ECC) .................................................................. 6
1.3.2. Wear Leveling ......................................................................................... 7
1.3.3.
1.3.4.
1.3.5.
1.3.6.
1.3.7.

Bad Block Management .......................................................................... 7
TRIM ....................................................................................................... 7
SMART .................................................................................................... 7
Over-Provisioning .................................................................................... 8
Firmware Upgrades ................................................................................. 8

1.4.

Low Power Management ................................................................................ 8
1.4.1. DIPM/HIPM Mode ................................................................................... 8

1.5.

Power Loss Protection: Flushing Mechanism ................................................. 8

1.6.

Advanced Device Security Features .............................................................. 9
1.6.1. Secure Erase .......................................................................................... 9
1.6.2. Write Protect ........................................................................................... 9

1.7.

SSD Lifetime Management............................................................................. 9
1.7.1. Terabytes Written (TBW) ......................................................................... 9
1.7.2. Thermal Monitor .................................................................................... 10

1.8.

An Adaptive Approach to Performance Tuning ............................................. 10
1.8.1. Throughput ............................................................................................ 10
1.8.2. Predict & Fetch ...................................................................................... 10

2.

PRODUCT SPECIFICATIONS ............................................................................... 11

3.

ENVIRONMENTAL SPECIFICATIONS .................................................................. 13

4.

3.1.

Environmental Conditions............................................................................. 13
3.1.1. Temperature and Humidity .................................................................... 13
3.1.2. Shock & Vibration .................................................................................. 13
3.1.3. Electrostatic Discharge (ESD) ............................................................... 13

3.2.

MTBF............................................................................................................ 13

3.3.

Certification & Compliance ........................................................................... 13

ELECTRICAL SPECIFICATIONS .......................................................................... 14
4.1.

Supply Voltage ............................................................................................. 14© 2017 | Delkin Devices Inc.

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S330 Series SATA III Industrial 2.5” SSD

4.2.
5.

Power Consumption ..................................................................................... 14

INTERFACE............................................................................................................ 15
5.1.

6.

401-0236-00 Rev. A

Pin Assignment and Descriptions ................................................................. 15

SUPPORTED COMMANDS ................................................................................... 16
6.1.

ATA Command List ....................................................................................... 16

6.2.

Identify Device Data ..................................................................................... 17

6.3.

SMART ......................................................................................................... 21
6.3.1. Command Description ........................................................................... 21
6.3.1.1. I/O Registers ......................................................................................... 21
6.3.1.2. SMART Command Table....................................................................... 22
6.3.1.3. SMART Read Attribute .......................................................................... 23
6.3.1.4. SMART Read Attribute Thresholds ....................................................... 25
6.3.1.5. SMART Enable Attribute Auto Save ...................................................... 25
6.3.1.6. SMART Disable Attribute Auto Save ..................................................... 26
6.3.1.7. SMART Execute Off-Line Immediate .................................................... 28
6.3.1.8. SMART Read Log ................................................................................. 29
6.3.1.9. SMART Write Log ................................................................................. 30
6.3.1.10. SMART Enable Operations ................................................................... 31
6.3.1.11. SMART Disable Operations .................................................................. 33
6.3.1.12. SMART Return Status ........................................................................... 34

7.

PHYSICAL DIMENSIONS ...................................................................................... 35© 2017 | Delkin Devices Inc.

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LIST OF TABLES
Table 4-1 Supply Voltage................................................................................... 14
Table 4-2 Power Consumption ......................................................................... 14
Table 5-1 Signal Segment Pin Assignment and Descriptions........................ 15
Table 6-1 ATA Command List ............................................................................ 16
Table 6-2 List of Device Identification .............................................................. 17
Table 6-3 List of Device Identification for Each Capacity............................... 20
Table 6-4 Command Block Registers Addressing .......................................... 21© 2017 | Delkin Devices Inc.

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1. INTRODUCTION
1.1. General Description
Delkin’s S330 Series Industrial 2.5” Solid State Drive (SSD) delivers all the advantages of flash disk
technology with the performance of the Serial ATA III interface and is fully compliant with thestandard 2.5” form factor.

Delkin’s SSD draws significantly less power compared to traditional

hard drives and is also hot swappable. The drive is available in high endurance SLC capacities from
16GB to 256GB and can reach speeds up to 330MB/s read as well as 310MB/s write (measured by
CrystalDiskMark v3.0).

Flash

Flash

Flash

Flash

Flash

Flash

Flash

Flash

Power

Flash

Flash

SATA

Flash

Flash

SATA Signal

Flash

SATA Signal

Flash

SATA Power

Flash

Flash
Controller

Flash

DDR3

1.2. Product Block Diagram

Figure 1-1 SSD Product Block Diagram

1.3. Flash Management
1.3.1. Error Correction Code (ECC)
Flash memory cells will deteriorate with use, which might generate random bit errors in thestored data. Thus, Delkin’s Industrial 2.5” SSD applies the BCH ECC algorithm, which candetect and correct errors occur during read process, ensure data been read correctly, as wellas protect data from corruption.

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1.3.2. Wear Leveling
NAND flash devices can only undergo a limited number of program/erase cycles, and in mostcases, the flash media are not used evenly. If some areas are updated more frequently thanothers, the lifetime of the device would be reduced significantly. Thus, Wear Leveling is applied
to extend the lifespan of NAND flash by evenly distributing write and erase cycles across themedia.
Delkin utilizes advanced Wear Leveling algorithms, which can efficiently distribute flash usage
through the whole flash media area. Moreover, by implementing both dynamic and static Wear
Leveling algorithms, the life expectancy of the NAND flash is greatly improved.

1.3.3. Bad Block Management
Bad blocks are blocks that include one or more invalid bits, and their reliability is not guaranteed.
Blocks that are identified and marked as bad by the manufacturer are referred to as “Initial Bad
Blocks”. Bad blocks that are developed during usage of the flash are named “Later Bad Blocks”.
Delkin implements an efficient bad block management algorithm to detect the factory-produced
bad blocks and manages any bad blocks that appear with use. This practice further prevents
data being stored into bad blocks and improves data reliability.

1.3.4. TRIM
TRIM is a feature which helps improve the read/write performance and speed of solid-statedrives (SSD). Unlike hard disk drives (HDD), SSDs are not able to overwrite existing data, so
the available space gradually becomes smaller with each use. With the TRIM command, theoperating system can inform the SSD which blocks of data are no longer in use and can beremoved permanently. Thus, the SSD will perform an erase action, which prevents unused
data from occupying blocks.

1.3.5. SMART
SMART, an acronym for Self-Monitoring, Analysis and Reporting Technology, is an open
standard that allows a drive to automatically detect its health and report potential failures. Whena failure is recorded by SMART, users can choose to replace the drive to prevent unexpected
outage or data loss. Moreover, SMART can inform users of impending failures while there is
still time to perform proactive actions, such as copy data to another device.

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1.3.6. Over-Provisioning
Over Provisioning refers to the inclusion of extra NAND capacity in a SSD, which is not visibleor usable by users. With Over Provisioning, the performance and IOPS (Input/Output
Operations per Second) are improved by providing the controller additional space to manage
P/E cycles, which enhances the reliability and endurance as well. Moreover, the write
amplification of the SSD becomes lower when the controller writes data to the flash.

Contact

Delkin regarding this customization option.

1.3.7. Firmware Upgrades
Firmware can be considered as a set of instructions on how the device communicates with thehost. Firmware can be upgraded when new features are added, compatibility issues are fixed,
or read/write performance gets improved, as controlled by the user.

Contact Delkin for details.

1.4. Low Power Management
1.4.1. DIPM/HIPM Mode
SATA interfaces contain two low power management states for power saving: Partial andSlumber modes. In Partial mode, the device must resume full operation within 10 microseconds,
whereas in Slumber mode, the device has 10 milliseconds to become fully operational. SATA
interfaces allow low power modes to be initiated by Host (HIPM, Host Initiated PowerManagement) or Device (DIPM, Device Initiated Power Management). As for HIPM, Partial or
Slumber mode can be invoked directly by the software. For DIPM, the device will send requests
to enter Partial or Slumber mode.

1.5. Power Loss Protection: Flushing Mechanism
Power Loss Protection is a mechanism to prevent data loss during unexpected power failures.
DRAM is volatile memory and frequently used as temporary cache or buffer between thecontroller and the NAND flash to improve SSD performance. However, one major concern of
the DRAM is that data could be lost in the event of a power failure. Accordingly, the Delkin
SATA controller applies the GuaranteedFlush technology, which requests the controller totransfer data to the cache. Only when the data is fully committed to the NAND flash will thecontroller send acknowledgement (ACK) to the host. Such implementation can prevent falsepositive performance and the risk of power cycling issues.
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Additionally, it is critical for a controller to shorten the time the in-flight data stays in the cache.
Thus, Delkin’s controller applies an algorithm to reduce the amount of data residing in thecache to provide better performance. This SmartCacheFlush technology allows incoming datato have only a brief “pit stop” in the cache and then move straight to the NAND flash. If the
flash is jammed due to particular file sizes (such as random 4KB data), the cache will be treatedas an “organizer”, consolidating incoming data into groups before written into the flash to
improve write amplification.
In summary, with this advanced Flush Mechanism, Delkin’s controller provides the reliability
and data protection required by today’s applications and hosts.

1.6. Advanced Device Security Features
1.6.1. Secure Erase
Secure Erase is a standard ATA command and will write “0xFF” to all cells, to fully wipe all thedata on hard drives and SSDs. When this command is issued, the SSD controller will erase its
storage blocks and return to its factory default settings.

1.6.2. Write Protect
When a SSD contains too many bad blocks and data is continuously written in, then the SSD
may no longer be usable. Thus, Write Protect is a mechanism to prevent data from being written
in and protect the accuracy of data that are already stored in the SSD.

1.7. SSD Lifetime Management
1.7.1. Terabytes Written (TBW)
TBW (Terabytes Written) is a measurement of SSDs’ expected lifespan, which represents theamount of data written to the device. To calculate the TBW of a SSD, the following equation isapplied:TBW = [(NAND Endurance) x (SSD Capacity) x (WLE)] / WAF
NAND Endurance: NAND endurance refers to the P/E (Program/Erase) cycle rating of NAND
flash, per the manufacturer’s specification.
SSD Capacity: The SSD capacity is the specific capacity in total of a SSD.
WLE: Wear Leveling Efficiency (WLE) represents the ratio of the average amount of erases
on all the blocks to the erases on any block at maximum.
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WAF: Write Amplification Factor (WAF) is a numerical value representing the ratio between
the amount of data that a SSD controller writes to the flash and the amount of data thatthe host’s flash controller writes. A better WAF, which is near 1, guarantees better
endurance and lower frequency of data written to flash memory.

1.7.2. Thermal Monitor
Thermal monitors are devices for measuring temperature, and can be found in SSDs in order
to issue warnings when SSDs go beyond a certain temperature. The higher temperature thethermal monitor detects, the more power the SSD consumes, causing the SSD to age quickly.
Hence, the processing speed of a SSD should be under control to prevent temperature fromexceeding a certain range.

Temperature can be monitored via SMART, as referenced in

Section 6.3.

1.8. An Adaptive Approach to Performance Tuning
1.8.1. Throughput
Based on the available space of the disk, Delkin SSD controller will regulate the read/write
speed and manage the throughput performance. When significant free space remains, thefirmware will continuously perform read/write activity. At this stage, there is still no need to
implement garbage collection to allocate and release memory, which will accelerate read/write
processing to improve the performance. However, when free space is used up, the controller
will slow down the read/write processing, and implement garbage collection to release memory
blocks. Hence, read/write performance will become slower.

1.8.2. Predict & Fetch
Normally, when the host tries to read data from the SSD, the SSD will only perform one readaction after receiving one command. However, Delkin’s controller applies Predict & Fetch to
improve the read speed. When the host issues sequential read commands to the SSD, theSSD will automatically expect that the following will also be read commands. Thus, before
receiving the next command, flash has already prepared the data. Accordingly, this accelerates
the data processing time, and the host does not need to wait as long to receive data.

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2. PRODUCT SPECIFICATIONSCapacity￭

From 16GB up to 256GB

Electrical/Physical Interface

￭

SATA InterfaceCompliant with SATA Revision 3.2

Compatible with SATA 1.5Gbps, 3Gbps and 6Gbps interface

NCQ support up to queue depth = 32

Supports power management

Supports expanded register for SATA protocol 48 bit addressing mode

ECC Scheme￭Capable of correcting up to 120 bits per 2K Bytes of dataSupports SMART and TRIM commands



Performance and Power Consumption
Performance
Capacity

CrystalDiskMark

Power Consumption
Read
(mW)

Write
(mW)

140

1575

1850

250

230

2000

2500

64GB

330

310

2250

3000

128GB

330

310

2500

3250

256GB

330

310

3000

3750

Read
(MB/s)

Write(MB/s)

16GB

145

32GB

NOTE:
For more details on Power Consumption, please refer to Chapter 4.2.

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S330 Series SATA III Industrial 2.5” SSD

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Endurance - TBW (Terabytes Written)

Capacity

TBW

16GB

912

32GB

1,825

64GB

3,650

128GB

7,300

256GB

14,600NOTES:
1. Many factors affect drive endurance / TBW, including flash configuration, SDR configuration, host platform,
usage model, write amplification factor, etc.



The figures above are estimates and are not guarantees.

Part Numbers

Industrial 2.5” SSD (-40 to 85°C Operating Temperature)

Capacity© 2017 | Delkin Devices Inc.

Part Number

16GB

DE16TQJA2-35000-D

32GB

DE32TQJA2-35000-D

64GB

DE64TNKA2-35000-D

128GB

DE1HTNJA2-35000-D

256GB

DE2HTNJA2-35000-D

12S330 Series SATA III Industrial 2.5” SSD

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3. ENVIRONMENTAL SPECIFICATIONS
3.1. Environmental Conditions
3.1.1. Temperature and HumidityTemperature:

Storage: -40°C to 85°C

Operational: -50°C to 100°C

Humidity:

RH 95% under 55°C (operational)

3.1.2. Shock & Vibration


Shock Specification


1500G, 0.5ms duration, 3 axes

Vibration Specification

20Hz ~80Hz/1.52mm displacement, 80Hz~2000Hz / 20G Acceleration, 3 axes

3.1.3. Electrostatic Discharge (ESD)+/- 4KV

3.2. MTBF
MTBF, an acronym for Mean Time Between Failures, is a measure of a device’s reliability. Its value
represents the average time between a repair and the next failure. The measure is typically in unitsof hours. The higher the MTBF value, the higher the reliability of the device. The predicted result of
Delkin’s Industrial 2.5” SSD is more than 2,000,000 hours at 0°C.

3.3. Certification & Compliance


RoHS



SATA III (SATA Rev. 3.2)

Up to ATA/ATAPI-8 (Including S.M.A.R.T)© 2017 | Delkin Devices Inc.

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4. ELECTRICAL SPECIFICATIONS
4.1. Supply Voltage
Table 4-1 Supply Voltage
Parameter

RatingOperating Voltage

5V ± 5% (Option)

Maximum Ripple

100mV, 0 ~ 30MHz

4.2. Power Consumption
Table 4-2 Power Consumption
Capacity

Read

Write

Idle

16GB

1575

1850

450

32GB

2000

2500

450

64GB

2250

3000

450

128GB

2500

3250

450

256GB

3000

3750

450
Unit: mWNOTES:
1.

The average value of power consumption is achieved based on 100% conversion efficiency.

2.

The measured power voltage is 5V.

3.

Power Consumption may differ according to flash configuration, SDR configuration, and hostplatform.

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5. INTERFACE
5.1. Pin Assignment and Descriptions

Table 5-1 Signal Segment Pin Assignment and Descriptions
PIN NUMBER

FUNCTION

S1

GND

S2

A+ (DIFFERENTIAL SIGNAL PAIR A)

S3

A- (DIFFERENTIAL SIGNAL PAIR A)

S4

GND

S5

B- (DIFFERENTIAL SIGNAL PAIR B)

S6

B+ (DIFFERENTIAL SIGNAL PAIR B)

S7

GND

Table 0-2 Power Segment Pin Assignment and Descriptions
PIN NUMBER
FUNCTION© 2017 | Delkin Devices Inc.

P1

NOT USED (3.3V)

P2

NOT USED (3.3V)

P3

DEVSLP

P4

GND

P5

GND

P6
P7

GND
5V PRE-CHARGE

P8

5V

P9

5V

P10

GND

P11

RESERVED

P12

GND

P13

NOT USED (12V PRE-CHARGE)P14

NOT USED (12V)P15

NOT USED (12V)

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6. SUPPORTED COMMANDS
6.1. ATA Command List
Table 6-1 ATA Command List
Op CodeDescription

Op CodeDescription

00h

NOP

97h

IDLE

06h

Data Set Management

98h

CHECK POWER MODE

10h-1Fh

Recalibrate

99h

SLEEP

20h

Read Sectors

B0h

SMART

21h

Read Sectors without Retry

B1h

DEVICE CONFIGURATION

24h

Read Sectors EXT

C4h

Read Multiple

25h

Read DMA EXT

C5hWrite Multiple

27h

Read Native Max Address EXT

C6h

Set Multiple Mode

29h

Read Multiple EXT

C8h

Read DMA

2Fh

Read Log EXT

C9h

Read DMA without Retry

30h

Write Sectors

CAh

Write DMA

31h

Write Sectors without Retry

CBh

Write DMA without Retry

34h

Write Sectors EXT

CEhWrite Multiple FUA EXT

35h

Write DMA EXT

E0h

Standby Immediate

37h

Set Native Max Address EXT

E1hIdle Immediate

38h

CFA WRITE SECTORS WITHOUT ERASE

E2hStandby39h

Write Multiple EXT

E3h

Idle

3Dh

Write DMA FUA EXT

E4h

Read Buffer

3Fh

Write Long EXT

E5h

Check Power Mode

40h

Read Verify Sectors

E6h

Sleep

41h

Read Verify Sectors without Retry

E7h

Flush Cache

42h

Read Verify Sectors EXT

E8hWrite Buffer

45h

WRITE UNCORRECTABLE EXT

EAh

Flush Cache EXT

60h

Read FPDMA Queued

ECh

Identify Device

61h

Write FPDMA Queued

EFh

Set Features

Seek

F1h

Security Set Password

90h

Execute Device Diagnostic

F2h

Security Unlock

91h

Initialize Device Parameters

F3h

Security Erase Prepare

92h

Download Microcode

F4h

Security Erase Unit

93h

DOWNLOAD MICROCODE DMA

F5hSecurity Freeze Lock

94h

STANDBY IMMEDIATE

F6h

Security Disable Password

95h

IDLE IMMEDIATE

F8h

Read Native Max Address

96h

STANDBY

F9h

Set Max Address

70h-7Fh© 2017 | Delkin Devices Inc.

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6.2. Identify Device Data
The following table details the sector data returned by the IDENTIFY DEVICE command.

Table 6-2 List of Device Identification
F: Fixed
Word

V: Variable

Default Value

Description

X: Both
0

F

0040h

General configuration bit-significant information

1

X

*1

2

V

C837h

Specific configuration

3

X

0010h

Obsolete – Number of logical heads (16)4-5X00000000h

6

X

003Fh

Obsolete – Number of logical sectors per logical track (63)7-8V00000000h

Reserved for assignment by the Compact Flash Association

9

X

0000h

Retired

10-19

F

VariesSerial number (20 ASCII characters)

20-21

X

0000h

Retired

22

X

0000h

Obsolete

23-26

F

VariesFirmware revision (8 ASCII characters)

27-46

F

VariesModel number

47

F

8010h

7:0- Maximum number of sectors transferred per interrupt on

Obsolete – Number of logical cylinders

Retired

MULTIPLE commands
48

F

4000h

Trusted Computing feature set options(not support)

49

F

2F00h

Capabilities

50

F

4000h

Capabilities

51-52

X

000000000h

Obsolete

53

F

0007h

54

X

*1

Obsolete – Number of logical cylinders

55

X

0010h

Obsolete – Number of logical heads (16)

56

X

003Fh

Obsolete – Number of logical sectors per track (63)

57-58

X

*2

59

F

0110h

Words 88 and 70:64 valid

Obsolete – Current capacity in sectors
Number of sectors transferred per interrupt on MULTIPLE
commands

60-61

F

*3

62

X

0000h

Obsolete

63

F

0407h

Multi-word DMA modes supported/selected

64

F

0003h

PIO modes supported

65

F

0078h

Minimum Multiword DMA transfer cycle time per word

© 2017 | Delkin Devices Inc.

Maximum number of sector ( 28bit LBA mode)

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F: Fixed
Word

V: Variable

Default Value

Description

0078h

Manufacturer’s recommended Multiword DMA transfer cycle

X: Both
66

F

time
67

F

0078h

Minimum PIO transfer cycle time without flow control

68

F

0078h

Minimum PIO transfer cycle time with IORDY flow control

69

F

0100h

Additional Supported (support download microcode DMA)

70

F

0000h

Reserved

71-74

F

0000000000000000h

75

F

001Fh

Queue depth

76

F

670eh

Serial SATA capabilities

77

F

0084h

Serial ATA Additional Capabilities

78

F

014Ch

Serial ATA features supported

79

V

0040h

Serial ATA features enabled

80

F

07F8h

Major Version Number

81

F

0000h

Minor Version Number

82

F

346bh

Command set supported

83

F

7d09h

Command set supported

84

F

6063h

Command set/feature supported extension

85

V

3469h

Command set/feature enabled

86

V

bc01h

Command set/feature enabled

87

V

6063h

Command set/feature default

88

V

003Fh

Ultra DMA Modes

89

F

0001h

Time required for security erase unit completion

90

F

001Eh

Time required for Enhanced security erase completion

91

V

0000h

Current advanced power management value

92

V

FFFEh

Master Password Revision Code

93

F

0000h

Hardware reset result. The contents of the bits (12:0) of thisReserved for the IDENTIFY PACKET DEVICE command

word can be changed only during the execution of hardware
reset.
94

V

0000h

Vendor’s recommended and actual acoustic management
value

95

F

0000h

Stream Minimum Request Size

96

V

0000h

Streaming Transfer Time – DMA

97

V

0000h

Streaming Access Latency – DMA and PIO

98-99

F

0000h

Streaming Performance Granularity

100-103V*4© 2017 | Delkin Devices Inc.

Maximum user LBA for 48 bit Address feature set

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F: Fixed
Word

V: Variable

Default Value

Description

X: Both
104

V

0000h

Streaming Transfer Time – PIO

105

F

0008h

Maximum number of 512-byte blocks per DATA SETMANAGEMENT command

106

F

4000h

Physical sector size/Logical sector size

107

F

0000h

Inter-seek delay for ISO-7779 acoustic testing in
microseconds

108-111

F

0000000000000000h

Unique ID

112-115F0000000000000000h

Reserved

116

V

0000h

Reserved

117-118F00000000h

119

F

4014h

Supported settings

120

F

4014h

Command set/Feature Enabled/Supported

121-126

F

0h

Reserved

127

F

0h

Removable Media Status Notification feature set support

128

V

0021h

Security status

129-140X

0h

Vendor specific

141

X

0001h

Vendor specific142-159

X

0h

Vendor specific

160

F

0h

Compact Flash Association (CFA) power mode 1

161-167

X

0h

Reserved for assignment by the CFA

168

F
5h

3h

2.5”

4h

1.8”

Words per logical Sector

Device Nominal Form Factor

Less than 1.8”

169

F

0001h

170-173F0h

Additional Product Identifier

0hReserve174-175DATA SET MANAGEMENT command is supported

176-205V

0h

Current media serial number

206

F

0h

SCT Command Transport

207-208

F

0h

Reserved

209

F

4000h

Alignment of logical blocks within a physical block210-211

V

0000h

Write-Read-Verify Sector Count Mode 3 (not supported)

212-213

F

0000h

Write-Read-Verify Sector Count Mode 2 (not supported)

0000h

NV Cache relate (not supported)
Non-rotating media device

214-216
217

F

0001h

218

F

0h

© 2017 | Delkin Devices Inc.

Reserved

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F: Fixed
Word

V: Variable

Default Value

Description

X: Both219

F0h

NV Cache relate (not supported)

220

V

0h

Write read verify feature set current mode

0h

Reserved

221
222

F

107Fh

Transport major version number

223

F

0h

Transport minor version number

224-2290h

reserved

230-2330h

Extend number of user addressable sectors

234

0001h

Minimum number of 512-byte data blocks per DOWNLOADMICROCODE command for mode 03h

235

0080h

Maximum number of 512-byte data blocks per DOWNLOADMICROCODE command for mode 03h

236-254

F

0h

255

X

XXA5h

Reserved
Integrity word (Checksum and Signature)

XX is variable

Table 6-3 List of Device Identification for Each Capacity
Capacity

*1

*2

*3

*4

(GB)

(Word 1/Word 54)(Word 57 - 58)(Word 60 - 61)(Word 100 - 103)

64

3FFFh

FBFC10h

7740AB0h

7740AB0h

128

3FFFh

FBFC10h

EE7C2B0h

EE7C2B0h

256

3FFFh

FBFC10h

FFFFFFFh

1DCF32B0h

1632© 2017 | Delkin Devices Inc.

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6.3. SMART
6.3.1. Command Description
6.3.1.1. I/O Registers

Communication to or from device through Data register and 7 Command Block registers(28bits command format), include Feature register, Error register, Sector Count register,
Sector Number register, Cylinder Low register, Cylinder High register, Drive Head register,Status register, Command register.
Table 6-4 Command Block Registers Addressing
Offset address

Read

Write

Value Type

0x00

Data

Data

WORD

0x01

Error

Feature

BYTE

0x02

Sector Count

Sector Count

BYTE

0x03

Sector Number

Sector Number

BYTE(LBA low current)(LBA low current)

Cylinder Low

Cylinder Low(LBA Mid current)(LBA Mid current)

Cylinder High

Cylinder High(LBA High current)(LBA High current)

0x06

Drive Head

Drive Head

BYTE

0x07

StatusCommand

BYTE

0x04
0x05

BYTE
BYTE

Direction: Input means from Host to Device, Output means from Device to Host

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6.3.1.2. SMART Command Table
Vender Command
Smart Read Attribute
Smart Read Attribute
Thresholds
Smart Enable
Attribute Auto Save
Smart Disable
Attribute Auto Save
SMART SAVEATTRIBUTE VALUES

FeatureSector

Sector

Cylinder Cylinder

Drive

CommandCount

Number

Low

High

Head

0xD0

0x01

XX

0x4F

0xC2

0xA0

0xB0

0xD1

0x01

XX

0x4F

0xC2

0xA0

0xB0

0xD2

0xF1

XX

0x4F

0xC2

0xA0

0xB0

0xD2

0x00

XX

0x4F

0xC2

0xA0

0xB0

0xD3

XX

XX

0x4F

0xC2

0xA0

0xB0

0xD4

XX

XX

0x4F

0xC2

0xA0

0xB0

XX

0x4F

0xC2

0xA0

0xB0

XX

0x4F

0xC2

0xA0

0xB0

SMART EXECUTE
OFF-LINE
IMMEDIATE
SMART READ LOG
SMART WRITE LOG
Smart Enable
Operations
Smart Disable
Operation
Smart Return Status

0xD5
0xD6

Depends on
Log Address
Depends on
Log Address

0xD8

XX

XX

0x4F

0xC2

0xA0

0xB0

0xD9

XX

XX

0x4F

0xC2

0xA0

0xB0

0xDA

XX

XX

0x4F

0xC2

0xA0

0xB0

0xDB

XX

XX

0x4F

0xC2

0xA0

0xB0

0xDB

XX

XX

0x4F

0xC2

0xA0

0xB0

SMART ENABLE
AUTOMATIC OFFLINE
SMART DISABLE
AUTOMATIC OFFLINE© 2017 | Delkin Devices Inc.

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6.3.1.3. SMART Read Attribute[Protocol]

PIO Data In[Input]Register

7

6

5

4

3

Feature0xD0

Sector Count

0x01

Sector Number

N/A

2

1

0

(LBA LOW current)
Cylinder Low

0x4F(LBA MID current)
Cylinder High

0xC2

(LBA HIGH current)
Drive Head

1

0

1

0

Command

0

0

0

0

3

2

1

0

0xB0

[Normal Output]
Register

7

6

5

4

Error

N/A

Sector Count

N/A

Sector Number

N/A(LBA LOW current)
Cylinder Low

N/A(LBA MID current)
Cylinder High

N/A

(LBA HIGH current)
Drive Head

0xE0

Status0x50[Description]
This command will return 1 sector of SMART Read Attribute information.

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Attribute Table
Attribute

Description

ID
01h

Number of accumulation of uncorrectable error. (Range 0~255)

09h

Power on hours count. (Range 0-4294967295)

0Ch

Drive power cycle count (Number of accumulation of power on/off cycles)

A8h

Sata PHY error count (since last power cycle) this value include all PHY error count,
ex data FIS CRC code error, disparity error ,command FIS crc…..)

AAh

Bad block count.

ADh

Erase count

C0h

Number of unexpected power loss countC2hTemperature

DAh

Number of accumulation CRC error (read/write data FIS CRC error)

E7h

SSD life remaining

F1h

Lifetime write from host(See Note 1 for interpretation of temperature data)

Smart attribute actual data
0

1

2

3

4

ID

Flag

flag

value

worse

01h

0Bh

00h

64h

64h

09h

12h

00h

64h

64h

0Ch

12h

00h

64h

64h

A8h

12h

00h

64h

64h

AAh

03h

00h

Note 2

note 2

ADh

12h

00h

64h

64h

C0h

12h

00h

64h

64h

100-

100-

Current

Highest

Temp

value

C2h

23h

00h

DAh

0Bh

00h

64h

64h

E7h

13h

00h

64h

64h

F1h

32h

00h

0h

0h

5

6

7

8

9

10

11

DATA
0

0

threshold

ECC error

0

0

0

0

32h

0

0

0

0

0

00h

power on/off cycles

0

0

0

00h

SATA PHY error count

0

0

0

00h

0

0ah

power on hour

early bad block
NO

0

0

max erase count average erase countlater bad block NO

0

0

0

00h

number of accidental power loss count

0

0

0

00h

Current Temp

Lowest Temp

Highest Temp

(see Note 1)(see Note 1)(see Note 1)0

1Eh(MAX 65535)(MAX 65535)

number of CRC Error
Note 300Host write 1GB count

0

0

0

0

32h

0

0

0

00h

0

0

0

0

Note 1:Raw data from the drive is a signed 8 bit integer, interpret as follows:
Value 0 – 127:Interpret directly as temperature data, 0 to 127 Degrees C
Value 128 – 255:
Interpret by subtracting 256, to produce -128 to -1 Degrees C

Note 2:(100*(A-B))/A, Max = 100, Min = 1, where:
A: Maximum Acceptable Number of Bad Block (Plane)
B: Current Number of Maximum Bad Block (Plane)

Note 3:100 - (average erase count /MAX erase count)*100, where MAX erase count = 60K for SLC, 3K for MLC© 2017 | Delkin Devices Inc.

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6.3.1.4. SMART Read Attribute Thresholds
6.3.1.5. SMART Enable Attribute Auto Save
[Protocol] PIO Non-data[Input]Register

7

6

5

4

3

Feature0xD2

Sector Count

0XF1

Sector Number

N/A

2

1

0

(LBA LOW current)
Cylinder Low

0x4F(LBA MID current)
Cylinder High

0xC2

(LBA HIGH current)
Drive Head

1

0

1

0

Command

0

0

0

0

0xB0

[Normal Output]
Register

7

6

5

4

3

Error

N/A

Sector Count

N/A

Sector Number

N/A

2

1

0

(LBA LOW current)
Cylinder Low

N/A(LBA MID current)
Cylinder High

N/A

(LBA HIGH
current)
Drive Head

0xE0

Status0x50[Description]
The SMART ENABLE ATTRIBUTE AUTOSAVE command enables the attributeautosave feature of the device. This command may either allow the device, after some vendor
specified event, to save the device updated attributes to non-volatile memory or this command
may cause the autosave feature to be disabled. The state of the attribute autosave feature,© 2017 | Delkin Devices Inc.

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either enabled or disabled, shall be preserved by the device during all power and reset events.
The COUNT field cleared to zero shall cause the device to disable the attribute autosave
feature. Disabling this feature does not preclude the device from saving SMART data to nonvolatile memory during some other normal operation (e.g., during a power-on or power-off
sequence or during an error recovery sequence).
The COUNT field set to F1h shall cause the device to enable the attribute autosave feature. If
the COUNT field is not set to 00h or F1h, then the actions taken by a device are vendor specific.
If the device receives a command while processing the autosave routine the device shall begin
processing the command within 2 s.

6.3.1.6. SMART Disable Attribute Auto Save
[Protocol]

PIO Non-data[Input]Register

7

6

5

4

3

Feature0xD2

Sector Count

0x00

Sector Number

N/A

2

1

0

(LBA LOW
current)
Cylinder Low

0x4F(LBA MIDcurrent)
Cylinder High

0xC2

(LBA HIGH
current)
Drive HeadCommand© 2017 | Delkin Devices Inc.

1

0

1

0

0

0

0

0

0xB0

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S330 Series SATA III Industrial 2.5” SSD

401-0236-00 Rev. A[Normal Output]
Register

7

6

5

4

3

Error

N/A

Sector Count

N/A

Sector Number

N/A

2

1

0

(LBA LOW current)
Cylinder Low

N/A(LBA MID current)
Cylinder High

N/A

(LBA HIGH current)
Drive Head

0xE0

Status0x50[Description]
The SMART DISABLE ATTRIBUTE AUTOSAVE command disables the attribute autosave
feature of the device. This command may either allow the device, after some vendor specified
event, to save the device updated attributes to non-volatile memory or this command may
cause the autosave feature to be disabled. The state of the attribute autosave feature, either
enabled or disabled, shall be preserved by the device during all power and reset events.
The COUNT field cleared to zero shall cause the device to disable the attribute autosave
feature. Disabling this feature does not preclude the device from saving SMART data to nonvolatile memory during some other normal operation (e.g., during a power-on or power-off
sequence or during an error recovery sequence).
The COUNT field set to F1h shall cause the device to enable the attribute autosave feature. If
the COUNT field is not set to 00h or F1h, then the actions taken by a device are vendor
specific.
If the device receives a command while processing the autosave routine the device shallbegin processing the command within 2 s.

© 2017 | Delkin Devices Inc.

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6.3.1.7. SMART Execute Off-Line Immediate[Protocol]

PIO Non-data[Input]Register

7

6

5

4

3

2

Feature0xD4

Sector Count

0x00

Sector Number

subcommand

1

0(LBA LOW current)
Cylinder Low

0x4F(LBA MID current)
Cylinder High

0xC2

(LBA HIGH current)
Drive Head

1

0

1

0

Command

0

0

0

0

0xB0

[Normal Output]
Register

7

6

5

4

3

Error

N/A

Sector Count

N/A

Sector Number

N/A

2

1

0

(LBA LOW current)
Cylinder Low

N/A(LBA MID current)
Cylinder High

N/A

(LBA HIGH current)
Drive Head

0xE0

Status0x50[Description]
The SMART EXECUTE OFF-LINE IMMEDIATE command causes the device to initiate theoptional set of activities that collect SMART data in an off-line mode and then preserve this data
across power and reset events, or process a vendor specific self-diagnostic test routine in either
captive or off-line mode.

© 2017 | Delkin Devices Inc.

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Value

Description of subcommand to be processed

00h

Execute SMART off-line routine in off-line mode

01h

Execute SMART Short self-test routine in off-line mode

02h

Execute SMART Extended self-test routine in off-line mode

03h (not supported)

Execute SMART Conveyance self-test routine in off-line mode

04h

Execute SMART Selective self-test routine in off-line mode05h-3Fh

Reserved

40h-7Eh

Vendor specific

7Fh

Abort off-line mode self-test routine

80h

Reserved

81hExecute SMART Short self-test routine in captive mode

82hExecute SMART Extended self-test routine in captive mode

83h (not supported)

Execute SMART Conveyance self-test routine in captive mode

84hExecute SMART Selective self-test routine in captive mode

85h-8Fh

Reserved

90h-FFh

Vendor specific6.3.1.8. SMART Read Log[Protocol]

PO Data-In[Input]Register

7

6

5

4

3

Feature

2

1

0

0xD5

Sector Count

Depend on Log Address

Sector Number

Log Address(LBA LOW current)
Cylinder Low

0x4F(LBA MID current)
Cylinder High

0xC2

(LBA HIGH current)
Drive HeadCommand© 2017 | Delkin Devices Inc.

1

0

1

0

0

0

0

0

0xB0

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S330 Series SATA III Industrial 2.5” SSD

401-0236-00 Rev. A[Normal Output]
Register

7

6

5

4

3

Error

N/A

Sector Count

N/A

Sector Number

N/A

2

1

0

(LBA LOW current)
Cylinder Low

N/A(LBA MID current)
Cylinder High

N/A

(LBA HIGH current)
Drive Head

0xE0

Status0x50[Description]
The SMART READ LOG command returns the specified log to the host.

6.3.1.9. SMART Write Log[Protocol]

PO Data-Out[Input]Register

7

6

5

4

3

Feature

2

1

0

0xD6

Sector Count

Depend on Log Address

Sector Number

Log Address(LBA LOW current)
Cylinder Low

0x4F(LBA MID current)
Cylinder High

0xC2

(LBA HIGH current)
Drive HeadCommand© 2017 | Delkin Devices Inc.

1

0

1

0

0

0

0

0

0xB0

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S330 Series SATA III Industrial 2.5” SSD

401-0236-00 Rev. A[Normal Output]
Register

7

6

5

4

3

Error

N/A

Sector Count

N/A

Sector Number

N/A

2

1

0

1

0

(LBA LOW current)
Cylinder Low

N/A(LBA MID current)
Cylinder High

N/A

(LBA HIGH current)
Drive Head

0xE0

Status0x50[Description]
The SMART WRITE LOG command returns the specified log to the host.

6.3.1.10. SMART Enable Operations[Protocol]

PIO Non-data[Input]Register

7

6

5

4

3

Feature0xD8

Sector Count

N/A

Sector Number

N/A

2(LBA LOW current)
Cylinder Low

0x4F(LBA MID current)
Cylinder High

0xC2

(LBA HIGH current)
Drive HeadCommand© 2017 | Delkin Devices Inc.

1

0

1

0

0

0

0

0

0xB0

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S330 Series SATA III Industrial 2.5” SSD

401-0236-00 Rev. A[Normal Output]
Register

7

6

5

4

3

Error

N/A

Sector Count

N/A

Sector Number

N/A

2

1

0

(LBA LOW current)
Cylinder Low

N/A(LBA MID current)
Cylinder High

N/A

(LBA HIGH current)
Drive Head

0xE0

Status0x50[Description]
The SMART ENABLE OPERATIONS command enables access to all available SMART
capabilities within the device. The state of SMART, either enabled or disabled, shall bepreserved by the device during all power and reset events. Once enabled, the receipt ofsubsequent SMART ENABLE OPERATIONS commands shall not affect any SMART
data or functions.

© 2017 | Delkin Devices Inc.

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6.3.1.11. SMART Disable Operations[Protocol]

PIO Non-data[Input]Register

7

6

5

4

3

Feature0xD9

Sector Count

N/A

Sector Number

N/A

2

1

0

(LBA LOW current)
Cylinder Low

0x4F(LBA MID current)
Cylinder High

0xC2

(LBA HIGH current)
Drive Head

1

0

1

0

Command

0

0

0

0

0xB0

[Normal Output]
Register

7

6

5

4

3

Error

N/A

Sector Count

N/A

Sector Number

N/A

2

1

0

(LBA LOW current)
Cylinder Low

N/A(LBA MID current)
Cylinder High

N/A

(LBA HIGH current)
Drive Head

0xE0

Status0x50[Description]
The SMART DISABLE OPERATIONS command shall disable all SMART operations. Aftercompletion of this command without error the device shall report command aborted for allother SMART commands (e.g., SMART DISABLE OPERATIONS commands), except for
the SMART ENABLE OPERATIONS command and the SCT Command Transportcommands, which shall be processed as defined. The state of SMART (i.e., enabled or
disabled) shall be preserved by the device during all power-on reset events.

© 2017 | Delkin Devices Inc.

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6.3.1.12. SMART Return Status[Protocol]

PIO Non-data[Input]Register

7

6

5

4

3

Feature0xDA

Sector Count

N/A

Sector Number

N/A

2

1

0

(LBA LOW current)
Cylinder Low

0x4F(LBA MID current)
Cylinder High

0xC2

(LBA HIGH current)
Drive Head

1

0

1

0

Command

0

0

0

0

0xB0

[Normal Output]
Register

7

6

5

4

3

Error

N/A

Sector Count

N/A

Sector Number

N/A

2

1

0

(LBA LOW current)
Cylinder Low

N/A(LBA MID current)
Cylinder High

N/A

(LBA HIGH current)
Drive Head

0xE0

Status0x50[Description]
The SMART RETURN STATUS command causes the device to communicate thereliability status of the device to the host.
Status Return:If Current Reserved Block > 3, return 0x4F, 0xC2
If Current Reserved Block <= 3, detected a threshold exceeded condition, return 0xF4,
0x2C© 2017 | Delkin Devices Inc.

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7. PHYSICAL DIMENSIONS
Dimension

Measurement

Height9.20 mm ±0.15

Width69.75 mm +0.25/-0.15

Length

99.70 mm ±0.25© 2017 | Delkin Devices Inc.

(0.36”)(2.75”)(3.93”)

35