E300 Series Industrial eUSB Module401-0451-00 Rev. D

E300 Series
Industrial eUSB Module
Engineering Specification
Document Number: 401-0451-00
Revision: D© 2020 | Delkin Devices Inc.

E300 Series Industrial eUSB Module401-0451-00 Rev. D

Product Overview⚫

Capacity￭ 1GB – 32GB⚫

MTBF
￭ More than 2,000,000 hours at 0°C⚫

USB Interface￭ USB 3.1 Compliant⚫

⚫

Flash Interface￭ Flash type: SLC

Features￭ Static and Dynamic Wear Leveling￭ Bad Block Management￭ SMART￭ Firmware Update Capability⚫

Performance￭ Read: up to 75 MB/s
￭ Write: up to 29 MB/s⚫

Temperature Range￭ Operation: -40°C ~ 85°C
￭ Storage: -50°C ~ +100°C⚫

Power ConsumptionNote1￭ Active mode: < 125mA￭ Idle mode: < 45mA⚫

RoHS compliant

Notes:
1. Please see “5.2 Power Consumption” for details.

© 2020 | Delkin Devices Inc.

E300 Series Industrial eUSB Module401-0451-00 Rev. D

TABLE OF CONTENTS
1.

INTRODUCTION....................................................................................................... 6
1.1.

General Description ............................................................................................. 6

1.2.

Flash Management .............................................................................................. 6
1.2.1. Error Correction Code (ECC) .......................................................................... 6
1.2.2. Wear Leveling ................................................................................................. 6
1.2.3. Bad Block Management.................................................................................. 7
1.2.4. SMART ........................................................................................................... 7
1.2.5. Read Disturb Management ............................................................................. 7
1.2.6. Firmware Redundancy.................................................................................... 7
1.2.7.
1.2.8.
1.2.9.

2.

3.

Dynamic Data Refresh.................................................................................... 8
Power Fail Robustness ................................................................................... 8
Page-based Mapping ..................................................................................... 8

PRODUCT SPECIFICATIONS ................................................................................. 9
2.1.

Overview ............................................................................................................. 9

2.2.

Sequential and Random Performance .............................................................. 10

2.3.

Part Numbers .................................................................................................... 10

2.4.

Connector & Configuration Options ................................................................... 11

ENVIRONMENTAL SPECIFICATIONS .................................................................. 12
3.1.

Environmental Conditions.................................................................................. 12
3.1.1. Temperature and Humidity ........................................................................... 12
3.1.2. Shock & Vibration ......................................................................................... 123.2.

MTBF................................................................................................................. 12

3.3.

Certification & Compliance ................................................................................ 12

4.

ENDURANCE & DATA RETENTION ..................................................................... 135.

ELECTRICAL SPECIFICATIONS .......................................................................... 13

6.

5.1.

Supply Voltage .................................................................................................. 13

5.2.

Power Consumption .......................................................................................... 13

INTERFACE ........................................................................................................... 14
6.1.

7.

Pin Assignment and Descriptions ...................................................................... 14

PHYSICAL ATTRIBUTES ...................................................................................... 15© 2019 | Delkin Devices Inc.

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E300 Series Industrial eUSB Module8.

401-0451-00 Rev. D

7.1.

Mechanical Form Factor .................................................................................... 15

7.2.

Mechanical Dimensions..................................................................................... 15

ATA PASS THROUGH, IDENTIFY DEVICE & SMART ......................................... 16
8.1.

Supported Commands in ATA Pass Through..................................................... 16

8.2.

ATA Identify Device Information ......................................................................... 16

8.3.

ATA SMART Functionality .................................................................................. 18
8.3.1. SMART Enable Operations .......................................................................... 18
8.3.2. SMART Disable Operations .......................................................................... 19
8.3.3. SMART Read Data ....................................................................................... 19
8.3.4. SMART Data Structure ................................................................................. 20
8.3.5. Spare Block Count Attribute.......................................................................... 21
8.3.6.
8.3.7.
8.3.8.
8.3.9.
8.3.10.
8.3.11.
8.3.12.
8.3.13.
8.3.14.

Spare Block Count Worst Chip Attribute Threshold ...................................... 21
Erase Count Attribute ................................................................................... 21
Total ECC Errors Attribute ............................................................................ 22
Correctable ECC Errors Attribute.................................................................. 22
Total Number of Reads Attribute ................................................................... 22Power On Count Attribute ............................................................................. 23
Total LBAs Written Attribute .......................................................................... 23
Total LBAs Read Attribute ............................................................................. 23
Anchor Block Status Attribute ....................................................................... 23

8.3.15.
8.3.16.
8.3.17.
8.3.18.
8.3.19.
8.3.20.
8.3.21.
8.3.22.
8.3.23.
8.3.24.
8.3.25.
8.3.26.
8.3.27.
8.3.28.
8.3.29.

Trim Status Attribute ..................................................................................... 24
SMART Read Attribute Thresholds............................................................... 24
Spare Block Count Attribute Threshold......................................................... 24
Spare Block Count Worst Channel Attribute Threshold ................................ 25
Erase Count Attribute Threshold .................................................................. 25
Total ECC Errors Attribute Threshold............................................................ 25
Correctable ECC Errors Attribute Threshold ................................................. 25
UDMA CRC Errors Attribute Threshold ........................................................ 25
Total Number of Reads Attribute Threshold .................................................. 25
Power On Count Attribute Threshold ............................................................ 25
Total LBAs Written Attribute Threshold ......................................................... 26
Total LBAs Read Attribute Threshold ............................................................ 26
Anchor Block Status Attribute Threshold ...................................................... 26
Trim Status Attribute Threshold .................................................................... 26
SMART Return Status .................................................................................. 26© 2019 | Delkin Devices Inc.

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E300 Series Industrial eUSB Module401-0451-00 Rev. D

LIST OF TABLES
Table 2-1 Performance by Capacity & Firmware Type ................................................ 10
Table 2-2 Part Numbers by Capacity & Firmware Type .............................................. 10
Table 2-3 Connector & Fixed/Removable Options ...................................................... 11
Table 5-1 Supply Voltage ............................................................................................ 13
Table 5-2 Power Consumption .................................................................................... 13
Table 6-1 Pin Assignment and Description for eUSB .................................................. 14
Table 7-1 eUSB Mechanical Form Factor Attributes ................................................... 15© 2019 | Delkin Devices Inc.

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E300 Series Industrial eUSB Module401-0451-00 Rev. D

1.Introduction
1.1. General Description
Delkin’s E300 Series Embedded USB (eUSB) is designed as a compact, non-removablestorage module to be used as a boot device or for storage of critical data. The industrialgrade eUSB is fully compliant with USB 3.1 specifications, and is built with industrial temp
SLC NAND flash.

1.2. Flash Management
1.2.1.

Error Correction Code (ECC)

Flash memory cells will deteriorate with use, which might generate random bit errors in thestored data. Thus, the controller in Delkin’s Industrial eUSB drive applies an advanced BCH
ECC algorithm, which can detect and correct errors occur during read processes, ensuring
data been read correctly, as well as protecting data from corruption. The Delkin Industrial
eUSB also employs “near-miss” ECC, such that all blocks which reach a certain error
threshold are automatically refreshed immediately upon detection.

The threshold isdetermined by the specific flash and ECC configuration in the card.

1.2.2.

Wear Leveling

NAND Flash devices can only undergo a limited number of program/erase cycles, and in
most cases, the flash media are not used evenly. If some blocks are updated more frequently
than others, the lifetime of the device would be reduced significantly. Thus, Wear Levelingtechniques are applied to extend the lifespan of NAND Flash by evenly distributing write anderase cycles across the media.
The controller in Delkin’s newest Industrial eUSB drive utilizes an advanced Wear Levelingalgorithm, which optimizes life and performance, through a combination of static and global
wear leveling. Static wear leveling is utilized until one flash reaches 90% of the rated P/E
cycles, which is more efficient from a performance standpoint. Once a flash reaches 90%,
wear leveling switches to a global scheme, and all flash blocks participate in wear leveling as
one large pool, which enables the card to maximize lifetime.

© 2019 | Delkin Devices Inc.

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E300 Series Industrial eUSB Module

1.2.3.

401-0451-00 Rev. D

Bad Block Management

Bad blocks are blocks that include one or more invalid bits and therefore, their reliability is
not guaranteed. Blocks that are identified and marked as bad by the manufacturer arereferred to as “Initial Bad Blocks”. Blocks that develop invalid bits during the lifespan of the
flash are named “Later Bad Blocks”.

The controller in Delkin’s Industrial eUSB drive

implements an efficient bad block management algorithm to detect the factory-produced badblocks and manage any bad blocks that appear with use. This practice further prevents data
being stored into bad blocks and improves data reliability.

1.2.4.

SMART

SMART, an acronym for Self-Monitoring, Analysis and Reporting Technology, is a special
function that allows a memory device to automatically monitor its health. While there is not an
industry standard for USB drive SMART functionality, as there is for SATA & PATA devices,
the Delkin eUSB supports ATA pass through commands to collect data from the card. Refer
to Section 7 for the command details and the information that can be extracted from the card.

1.2.5.

Read Disturb Management

Delkin’s Industrial eUSB drives have advanced Read Disturb Management to prevent
uncorrectable errors in heavy read applications. As flash geometries shrink, the likelihood of
disturbances when adjacent pages are frequently read is increased, and typically wear
leveling is triggered by writing and erasing.

However, the advanced read disturb

management system actually counts all reads on a block level, and compares them to aconfigurable threshold. Once the threshold has been reached, a read wear level is triggered
and the block is refreshed, sending it to the back of the line. This ensures that errors will notaccumulate to the point that they will be uncorrectable.

1.2.6.

Firmware Redundancy

Since flash storage is often used in applications with unstable sources of power, protecting
the firmware is critical. Delkin’s Industrial eUSB drives maintain two copies of firmware within
the flash, so that if the primary copy of the firmware is damaged, the back-up copy can beused, the back-up copy is used, and then the original copy is repaired.

© 2019 | Delkin Devices Inc.

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E300 Series Industrial eUSB Module

1.2.7.

401-0451-00 Rev. D

Dynamic Data Refresh

Typically, when a drive is new and less than 10% of the program/erase cycles have been
consumed, the data retention time of the flash is 5 or 10 years, depending on the type of
flash. At end of life, however, when 100% of the program/erase cycles have been consumed,
typically, the retention time is 1 year. To extend long term data retention over the life of acard, Delkin’s Industrial eUSB will automatically refresh data that is not accessed for a longtime, which can be triggered based on a configurable power-on count threshold and operate
in the background.

1.2.8.

Power Fail Robustness

With the goal of preventing data corruption and card failure, Delkin’s Industrial eUSB drives
have been developed to survive unscheduled power interruptions with minimal effect. In theevent of a power loss, the controller will reset and flash is immediately write-protected. A log
is kept of recent flash transactions, and if the last data in the log is corrupt, then the controller
will recover the latest valid entry. If a write operation was in process at the time of the power
loss, but not committed to flash, or the tables had not yet been updated, then this data might
be lost. Since the original data is always kept in a “twin” of the active block, we can always
revert back to the last known valid state of the card.

1.2.9.

Page-based Mapping

The E300 eUSB utilizes page-based mapping, which has the advantages of improved random
performance, and reduced write amplification, which improves device overall life.

© 2019 | Delkin Devices Inc.

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E300 Series Industrial eUSB Module401-0451-00 Rev. D

2.Product Specifications
2.1. Overview⚫

Capacity / Flash Type
￭ 1GB to 32GB Industrial Temperature SLC⚫

Electrical/Physical Interface￭ Compliant with USB 3.1 Gen 1 Specification, which includes backward compatibility to
USB 2.0 and 1.1⚫

ECC Scheme￭ Capable of correcting up to 96 bits per 1K Byte – BCH engine⚫

Supports SMART commands⚫

Supports Secure Erase and Sanitize via ATA pass throughcommands⚫

AES encryption engine 128 and 256-bit⚫

OS Compatibility￭ All USB 2.0 Compatible Operating Systems supported, including:-Windows 7 (32 & 64bit), Windows 8, Windows 10, Windows XP-

Linux Kernel 4.2.0-27 (Ubuntu 15.10)-

Mac OS X 10.8.4, 10.11.2© 2019 | Delkin Devices Inc.

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E300 Series Industrial eUSB Module401-0451-00 Rev. D

2.2. Sequential and Random Performance
Table 2-1 Performance by Capacity & Firmware Type
Sequential

Capacity

RandomRead (MB/s)

Write (MB/s)

Read (MB/s)

Write (MB/s)

1GB SLC

TBD

TBD

5.0

3.5

2GB SLC

TBD

TBD

5.0

3.5

4GB SLC

35

25

6.0

2.5

8GB SLC

75

35

7.0

3.5

16GB SLC

75

60

7.0

3.8

32GB SLC

75

60

7.0

3.7

Measured with CrystalDiskMark 3.0.3 64 bit in USB 3.0 mode, Random performance for 4K blocks.

2.3. Part Numbers
Industrial SLC eUSB (-40 to 85°C Operating Temperature)
Table 2-2 Part Numbers by Capacity
Capacity

Part Number

1GB

M40GTQHFL-xx000-D

2GB

M402TQHFL-xx000-D

4GB

M404TQJGR-xx000-D

8GB

M408TQJGR-xx000-D

16GB

M416TNKGR-xx000-D

32GB

M432TNJGR-xx000-D

NOTES:
1. “xx” in part number is determined by connector selection and fixed vs. removableconfiguration. See Section 2.4 for available options.
2. For optional Acrylic conformal coating (contact Delkin for additional cost and MOQ) to
protect the devices from moisture and contaminants, replace the 000 in the part number
with 050.
3. Customized parts will have a special code in place of the 000 to indicate the customerspecific features or attributes of the part.
4. Contact Delkin for information on a Security version of this product, with zone locking &encryption capabilities via an API or direct commands. NDA required.

© 2019 | Delkin Devices Inc.

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E300 Series Industrial eUSB Module401-0451-00 Rev. D

2.4. Connector & Configuration Options
Table 2-3 Connector & Fixed/Removable Options
Code

Pitch

Total Height*

Orientation

Fixed / RemovableRA

0.100”

9.77mmRight Angle

Removable

Sullins NPPC052KFMS-RC

R1

0.100”

5.93mmRight Angle

Removable

Samtec HLE-105-02-G-DV

R2

2mm

6.97mmRight Angle

Removable

Samtec MMS-105-02-L-DV

R3

2mm

4.53mmRight Angle

Removable

Samtec CLT-105-02-G-D

R4

0.100”

5.93mmRight Angle

Fixed Disk

Samtec HLE-105-02-G-DV

R5

2mm

6.97mmRight Angle

Fixed Disk

Samtec MMS-105-02-L-DV

R6

2mm

4.53mmRight Angle

Fixed Disk

Samtec CLT-105-02-G-D

R7

0.100”

9.77mmRight Angle

Fixed Disk

Sullins NPPC052KFMS-RC

R8

0.100”

9.77mmRight Angle

RL

0.100”

5.93mmRight Angle

ST

2mm

6.46mmStraight

Removable

Samtec MMS-105-02-L-DH

SF

2mm

6.46mmStraight

Fixed Disk

Samtec MMS-105-02-L-DH

Removable
No keying plug at Pin 9
Removable
External LED
configuration

Connector Mfr / Part #Sullins NPPC052KFMS-RC
Samtec HLE-105-02-G-DV*Total Height is referenced as Dimension X on the mechanical drawing in Section 7.2
Note: All connectors have keying plug at Pin 9, except R8 as noted.

© 2019 | Delkin Devices Inc.

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E300 Series Industrial eUSB Module401-0451-00 Rev. D

3. Environmental Specifications
3.1. Environmental Conditions
3.1.1.
⚫

⚫

Temperature and Humidity

Temperature:▪

Storage:-50°C to +100°C▪

Operational:-40°C to +85°C

Humidity:▪

RH 10 - 95% under 55°C

3.1.2.

Shock & Vibration⚫

Shock Specification▪

⚫

12G Sawtooth pulse, 11 ms duration, 3 axes

Vibration Specification▪

Sine Vibration: 10Hz ~2000Hz, 16.3 G peak to peak, 3 axes▪

Random Vibration: 10Hz ~2000Hz, 1.49 GRMS, 3 axes

3.2. MTBF
MTBF, an acronym for Mean Time Between Failures, is a measure of a device’s reliability. Its value
represents the average time between a repair and the next failure. The measure is typically in units ofhours. The higher the MTBF value, the higher the reliability of the device. The predicted result of
Delkin’s eUSB SSD is more than 2,000,000 hours for 0°C to 25°C operation.

3.3. Certification & Compliance
⚫

RoHS

⚫

USB 3.1© 2019 | Delkin Devices Inc.

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E300 Series Industrial eUSB Module401-0451-00 Rev. D

4.Endurance & Data Retention
Attribute

Value

Raw Flash Program/Erase Rating

60,000 cycles

TBW

Contact Delkin for TBW and life estimate based onyour specific application / workload

Data Retention

10 years when P/E cycles < 10% of rated cycling
1 year when P/E cycles at 100% of rated cycling

5. Electrical Specifications
5.1. Supply Voltage
Table 5-1 Supply Voltage
Parameter

RatingOperating Voltage

5V ± 10%5.2. Power Consumption
Table 5-2 Power Consumption
Capacity

Read (max)Write (max)Idle (max)

1GB

TBD

TBD

TBD

2GB

TBD

TBD

TBD

4GB

75

75

35

8GB

125

120

45

16GB

130

155

45

32GB

145

175

45

Unit: mANOTES:
1. The measured input power voltage is 5V.
2. Power Consumption may vary according to flash configuration, host platform and other factors.

© 2019 | Delkin Devices Inc.

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E300 Series Industrial eUSB Module401-0451-00 Rev. D

6.Interface
6.1. Pin Assignment and Descriptions
Table 6-1 Pin Assignment and Description for eUSB
Pin Number

eUSB Pin

1

VCC

5.0V USB Bus Power Input

2

SSRX+

Superspeed Receiver

3

DM

4

SSRX-

5

DP

6

SSTX+

Superspeed Transmitter

7

GND

0V regulator ground reference input

8

SSTX-

Superspeed Transmitter

9

NC

10

OptionDelkin Devices, Inc. 2020

Description

USB 2.0 data in negative pin terminal
Superspeed ReceiverUSB 2.0 data in positive pin terminal

Not Connected – Keying Plug (except R8 connector option)
Optional External LED Connection (contact Delkin)14E300 Series Industrial eUSB Module401-0451-00 Rev. D

7. Physical Attributes
7.1. Mechanical Form Factor
Table 7-1 eUSB Mechanical Form Factor Attributes
Dimension

Value

Length36.9mm ± 0.5mm

Width

26.6mm ± 0.5mm

Thickness

Varies with Connector

Center of Mounting Hole toCenterline of Connector
Mass

27.5mm ± 0.5mm
10 g (0.35 oz) maximum

7.2. Mechanical Dimensions

All dimensions in mm. Tolerance on all dimensions ± 0.5mm.

Delkin Devices, Inc. 2020

Connector CodeRA, R7, R8

Total Height (Dimension X)
9.77mmR1, R4, RL

5.93mm

R2, R56.97mm

R3, R64.53mmST, SF6.46mm15

E300 Series Industrial eUSB Module401-0451-00 Rev. D

8. ATA Pass Through, IDENTIFY DEVICE & SMART
8.1. Supported Commands in ATA Pass ThroughThe following table lists the ATA commands that are supported by the eUSB firmware in the ATA
Pass-Through(12) and ATA Pass-Through(16) commands.
No.
1
2

Comand Name
Identify Device
SMART

Notes:

FR:
SC:
SN:
CY:
DR:
HD:
Y:
-- :

Code
ECh
B0h

FR
-Y

SC
---

SN
---

CY
-Y

DR
Y
Y

HD
---

LBA
---

Feature Register
Sector Count register
Sector Number register
Cylinder Low/High register
Drive bit of Drive/Head Register
Head No. (0 to 15) of Drive/Head Register
Used for the commandNot used for the command

8.2. ATA Identify Device Information
The following table lists the information returned by the Identify Device ATA Passthrough command.
Word
Address
0
1-4
5
6-9
10-19
20
21
22
23-26
27-46
47
48
49
50
51
52
53
54 - 58
59
60-61
62
63

Default
Value
0040h
0000h
0200h
0000h
XXXXh
0002h
0001h
0004h
XXXXh
XXXXh
8001h
0000h
0F00h
4001h
0200h
0000h
0007h
0000h
0101h
XXXXh
0000h
0007h

Delkin Devices, Inc. 2020

Total
Bytes
2
8
2
8
20
2
2
2
8
40
2
2
2
2
2
2
2
10
2
4
2
2

Data Field Type Information
General configuration bit significant information
Reserved
Number of unformatted bytes per sector
Reserved
Serial number (20 ASCII characters)
Buffer type (dual-ported multi-sector)
Buffer size in 512 byte increments
Number of ECC bytes passed on Read/Write Long Commands
Firmware revision (8 ASCII characters)
Model number (40 ASCII characters)
Maximum 1 sector on Read/Write Multiple command
Double Word not Supported
Capabilities: DMA, LBA, IORDY supported
Capabilities: device specific standby timer minimum
PIO data transfer cycle timing mode 2
DMA data transfer cycle timing mode not supported
Data Fields 64 to 70 and 88 are valid
Reserved
Multiple sector setting is valid
Total number of sectors addressable in LBA Mode
Single Word DMA transfer not implemented
Multiword DMA transfer mode, modes 0 to 2 supported
16

E300 Series Industrial eUSB Module
Word
Address
64
65
66
67
68
69-79
80
81
82
83
84
85
86
87

Default
Value
0003h
0078h
0078h
0078h
0078h
0000h
01E0h
FFFFh
0001h
4000h
4000h
00Xh
0000h
4000h

Total
Bytes
2
2
2
2
2
22
2
2
2
2
2
2
2
2

88

043Fh

2

89 – 118
119
120
121-129130-133
134-135
136-141
142-147
148-153154-155
156-221222
223
224-254
255

0000h
4000h
4000h
0000h
XXXXh
0000h
XXXXh
XXXXh
XXXXh
XXXXh
0000h
1001h
FFFFh
0000h
XXA5h

60
2
2
18
8
4
12
12
12
4
132
2
2
62
2

401-0451-00 Rev. D

Data Field Type Information
Advanced PIO modes: modes 3 and 4 supported
Minimum Multiword DMA cycle time.
Recommended Multiword DMA cycle time.
Minimum PIO transfer cycle time without flow control
Minimum PIO transfer cycle time with flow control
Reserved
Major version number, ATA-5 to ATA-8 support
Minor version number, not reported
Command set: SMART features set
Command set: none
Command set/feature supported extension: none
Command set enabled: SMART feature set enabled/disabled
Command set enabled: none
Command set/feature default
UDMA modes 0 to 6 supported
Selected UDMA speed depends on USB speed:
SuperSpeed = UDMA6HighSpeed = UDMA4
FullSpeed = UDMA1
Reserved
Command set/feature set supported extension: none
Command set/feature set enabled extension: none
Reserved
Firmware date string
Reserved
Firmware file name
Preformat file nameAnchor program file nameFirmware minor revision number
Reserved
Transport major version: Serial transport
Transport minor version: not reported
Reserved
Integrity Word

Words 60, 61, 85, 88 first byte, 130 – 135, 154, 155 and 255 are determined by the running firmware, all otherwords are configured in the preformat by the preformat host tool (hsfmt.)

Delkin Devices, Inc. 202017

E300 Series Industrial eUSB Module401-0451-00 Rev. D

8.3. ATA SMART Functionality
The ATA Pass Through module of the Delkin eUSB firmware supports the following ATA
SMART commands, determined by the Feature Register value.
Value
D0h
D1h
D8h
D9h
DAh

Command
Read Data
Read Attribute Thresholds
Enable SMART Operations
Disable SMART Operations
Return Status

SMART commands with Feature Register values not mentioned in the above table are not supported and will be aborted.

8.3.1.

SMART Enable Operations

COMMAND CODE:

B0h with a Feature Register value of D8h

PROTOCOL:

Non-data

INPUTS:
Register
Features
Sector Count
Sector Number
Cylinder Low
Cylinder HighDevice/HeadCommand

7

6

5

4

3

2

1

0

D8h

4Fh
C2h
1

1

1

0
B0h

NORMAL OUTPUTS: None required.
ERROR OUTPUTS:

Aborted if the signature in the Cylinder registers is invalid.

DESCRIPTION:

This command enables access to the SMART capabilities of theeUSB controller firmware. The state of SMART (enabled or disabled)is preserved across power cycles.

Delkin Devices, Inc. 202018

E300 Series Industrial eUSB Module

8.3.2.

401-0451-00 Rev. D

SMART Disable Operations

COMMAND CODE:

B0h with a Feature Register value of D9h

PROTOCOL:

5Ah

INPUTS:
Register
Features
Sector Count
Sector Number
Cylinder Low
Cylinder HighDevice/HeadCommand

7

6

5

4

3

2

1

0

D9h

4Fh
C2h
1

1

1

0
B0h

NORMAL OUTPUTS: None required.
ERROR OUTPUTS:

Aborted if either the signature in the Cylinder registers is invalid or if
SMART is not enabled.

DESCRIPTION:

This command disables access to the SMART capabilities of theeUSB controller firmware. The state of SMART (enabled or disabled)is preserved across power cycles.

8.3.3.

SMART Read Data

COMMAND CODE:

B0h with a Feature Register value of D0h

PROTOCOL:

PIO data in.

INPUTS:
Register
Features
Sector Count
Sector Number
Cylinder Low
Cylinder HighDevice/HeadCommand

7

6

5

4

3

2

1

0

D0h

4Fh
C2h
1

1

1

0
B0h

NORMAL OUTPUTS: None required.
ERROR OUTPUTS:

Aborted if the signature in the Cylinder registers is invalid or if SMART
is not enabled.

DESCRIPTION:

This command returns one sector of SMART data. The data structure
returned is shown in Section 3.4.

Delkin Devices, Inc. 202019

E300 Series Industrial eUSB Module

8.3.4.

401-0451-00 Rev. D

SMART Data Structure

The following 512 bytes make up the device SMART data structure. Users can obtain the datausing the “SMART Read Data” command (D0h.)
Byte
0–1
2 – 361362
363
364 – 365366
367
368 – 369
370
371
372
373
374 – 385
386 – 387
388 – 391
392 - 395
396
397
398 – 401
402 – 405
406 – 409
410 – 413
414 - 510
511

F/V
0010h
00h
00h
0000h
00h
00h
0003h
00h
00h
00h
00h
00h
0042h

01h
01h

00h

Description
SMART structure version
Attribute entries 1 to 30 (12 bytes each)
Off-line data collection status (no off-line data collection)
Self-test execution status byte (self-test completed)
Total time in seconds to complete off-line data collection activity-Off-line data collection capability (no off-line data collection)
SMART capability
Error logging capability (no error logging)-Short self-test routine recommended polling time (in minutes)
Extended self-test routine recommended polling time (in minutes)
Reserved
SMART Structure Version
Firmware “Commit” Counter
Firmware Wear Level Threshold
Global Wear Leveling Active
Global Bad Block Management active
Average Flash Block Erase Count
Number of Flash Blocks involved in Wear LevelingNumber of total ECC errors during firmware initialization
Number of correctable ECC errors during firmware initialization
Data structure checksum

The attributes that are defined for the eUSB firmware return their data in the attribute section of
the SMART data, using a 12 byte data field.
The field at offset 386 gives a version number for the contents of the SMART data structure.
For the controller in the Delkin eUSB, only version 4 is defined.
The byte at offset 396 is fixed to 1 for page-based firmware. All chips within an interleaved
channel are used for wear leveling.
The byte at offset 397 is fixed to 1 for page-based firmware. Bad block management is always
done within all chips of an interleaved channel.

Delkin Devices, Inc. 202020

E300 Series Industrial eUSB Module

8.3.5.

401-0451-00 Rev. D

Spare Block Count Attribute
This attribute gives information about the amount of available spare blocks.
Offset
0
1–2
3

4
5–7
8 – 10
11

Value
196
0003h

00h

Description
Attribute ID – Reallocation Count
Flags – Pre-fail type, attribute value is updated during normal operation
Attribute value. The value returned here is the percentage of remaining
spare blocks summed over all flash chips, i.e. (100 x current spare
blocks / initial spare blocks)
Attribute value (worst value)
Sum of the initial number of spare blocks for all flash chips
Sum of the current number of spare blocks for all flash chips
Reserved

This attribute is used for the SMART Return Status command. If the attribute value field
is less than the spare block threshold (currently fixed at 10), the SMART Return Statuscommand will indicate a threshold exceeded condition.

8.3.6.

Spare Block Count Worst Chip Attribute Threshold
This attribute gives information about the amount of available spare blocks on theinterleave channel that has the lowest current number of spare blocks.
Offset
0
1–2
3

Value
213
0003h

4
5–7
8 – 1011

8.3.7.

00h

Description
Attribute ID – Spare Block Count Worst Channel (vendor specific)
Flags – Pre-fail type, attribute value is updated during normal operation
Attribute value. The value returned here is from all interleaved channels
the worst percentage of remaining spare blocks i.e. (100 * current spare
blocks / initial spare blocks).
Attribute value (worst value)
Initial number of spare blocks of the interleave channel with the lowest
current number of spare blocks
Current number of spare blocks of the interleave channel with the lowest
current number of spare blocks
Reserved

Erase Count Attribute
This attribute gives information about the amount of flash block erases that have been
performed.
Offset
0
1–2

Value
229
000Xh

3

4
5 – 10
11

Delkin Devices, Inc. 202000h

Description
Attribute ID – Erase Count Usage (vendor specific)
Flags – Pre-fail or Advisory type, attribute value is updated during normal
operation
Attribute value. The value returned here is an estimation of theremaining card life, in percent, based on the number of flash blockerases compared to the target number of erase cycles per block.
Attribute value (worst value)
Estimated total number of block erases.
Reserved

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E300 Series Industrial eUSB Module401-0451-00 Rev. D

This attribute is used for the SMART Return Status command. If the attribute value field
is less than the erase count threshold (currently fixed at 10), the SMART Return Statuscommand will indicate a threshold exceeded condition.
The target number of erase cycles per flash block is taken from the
MaxBlockEraseCount column in the Device Description file.

8.3.8.

Total ECC Errors Attribute
This attribute gives information about the total number of ECC errors that have occurred
on flash read commands during firmware runtime. This attribute is not used for the
SMART Return Status command.
Offset
0
1–2
3
4
5–8
9 – 1011

8.3.9.

Value
203
0002h
64h
64h

00h

Description
Attribute ID – Number of ECC Errors
Flags – Advisory type, attribute value is updated during normal operation
Attribute value. This value is fixed at 100.
Attribute value (worst value)
Total number of ECC errors (correctable and uncorrectable)--Reserved

Correctable ECC Errors Attribute
This attribute gives information about the total number of correctable ECC errors thathave occurred on flash read commands during firmware runtime. This attribute is not
used for the SMART Return Status command.
Offset
0
1–2
3
4
5–8
9 – 1011

8.3.10.

Value
204
0002h
64h
64h

00h

Description
Attribute ID – Number of corrected ECC Errors
Flags – Advisory type, attribute value is updated during normal operation
Attribute value. This value is fixed at 100.
Attribute value (worst value)
Total number of correctable ECC errors--Reserved

Total Number of Reads Attribute
This attribute gives information about the total number of flash read commands. This canbe useful for interpretation of the number of correctable or total ECC errors. This
attribute is not used for the SMART Return Status command.
Offset0
1–2
3
4
5 - 10
11

Delkin Devices, Inc. 2020

Value
232
0002h
64h
64h
00h

Description
Attribute ID – Number of Reads (vendor specific)
Flags – Advisory type, attribute value is updated during normal operation
Attribute value. This value is fixed at 100.
Attribute value (worst value)
Total number of flash read commands
Reserved

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E300 Series Industrial eUSB Module

8.3.11.

Power On Count Attribute
Offset
0
1–2
3
4
5-8
9 – 1011

8.3.12.

401-0451-00 Rev. D

Value
12
0002h
64h
64h

00h

Description
Attribute ID – Power On Count (vendor specific)
Flags – Advisory type, attribute value is updated during normal operation
Attribute value. This value is fixed at 100.
Attribute value (worst value)
Number of Power On cycles--Reserved

Total LBAs Written Attribute
This attribute gives the total amount of data written to the disk, in units of 32MB (65536
sectors.) This number can be converted to Terabytes Written (TBW) by dividing the raw
attribute value by 215.
Offset0
1–2
3
4
5 - 1011

8.3.13.

Value
241
0002h
64h
64h
00h

Description
Attribute ID – Total LBAs Written (vendor specific)
Flags – Advisory type, attribute value is updated during normal operation
Attribute value. This value is fixed at 100.
Attribute value (worst value)
Total number of LBAs written to the disk, divided by 65536
Reserved

Total LBAs Read Attribute
This attribute gives the total amount of data read from the disk, in units of 32MB (65536
sectors.) This number can be converted to Terabytes read by dividing the raw attributevalue by 215.
Offset0
1–2
3
4
5 - 1011

8.3.14.

Value
241
0002h
64h
64h
00h

Description
Attribute ID – Total LBAs Read (vendor specific)
Flags – Advisory type, attribute value is updated during normal operation
Attribute value. This value is fixed at 100.
Attribute value (worst value)
Total number of LBAs read from the disk, divided by 65536
Reserved

Anchor Block Status Attribute
This attribute reports how many times the Anchor block of the card has been re-written,
either by the Anchor block repair routine, or by a firmware update.
Offset
0
1–2
3
4
5–8
9 – 10
11

Delkin Devices, Inc. 2020

Value
214
0002h
64h
64h

00h

Description
Attribute ID – Anchor Block Status (vendor specific)
Flags – Advisory type, attribute value is updated during normal operation
Attribute value. This value is fixed at 100.
Attribute value (worst value)
Anchor Block Write Count--Reserved

23E300 Series Industrial eUSB Module

8.3.15.

401-0451-00 Rev. D

Trim Status Attribute
This attribute gives percent ratio for the disk space that is currently in the trimmed state.
Offset0
1–2
3
4
5 - 1011

8.3.16.

Value
215
0002h

Description
Attribute ID – Trim Status (vendor specific)
Flags – Advisory type, attribute value is updated during normal operation
Attribute value.
Attribute value (worst value)--Reserved

00h

SMART Read Attribute Thresholds

COMMAND CODE:

B0h with a Feature Register value of D1h

PROTOCOL:

PIO data in.

INPUTS:
Register
Features
Sector Count
Sector Number
Cylinder Low
Cylinder HighDevice/HeadCommand

7

6

5

4

3

2

1

0

D1h

4Fh
C2h
1

1

1

0
B0h

NORMAL OUTPUTS: None required.
ERROR OUTPUTS:

Aborted if the signature in the Cylinder registers is invalid or if SMART
is not enabled.

DESCRIPTION:

This command returns one sector of SMART attribute thresholds.
The data structure returned is:Offset0-1
2 – 361
362 – 379
380 – 510
511

Description
SMART structure version
Attribute threshold entries 1 to 30 (12 bytes each)Reserved--Data structure checksum

8.3.17.

Value
001h
00h
00h

Spare Block Count Attribute Threshold
Offset0
1
2 - 11

Delkin Devices, Inc. 2020

Value
196
0Ah
00h

Description
Attribute ID – Reallocation Count
Spare Block Count Threshold, fixed at 10
Reserved
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E300 Series Industrial eUSB Module

8.3.18.

Spare Block Count Worst Channel Attribute Threshold
Offset0
1
2 - 11

8.3.19.

Value
203
00h
00h

Description
Attribute ID – Number of ECC errors
No threshold for the Total ECC Errors Attribute
Reserved

Value
204
00h
00h

Description
Attribute ID – Number of corrected ECC errors
No threshold for the Correctable ECC Errors Attribute
Reserved

Value
199
00h
00h

Description
Attribute ID –UDMA CRC error rate
No threshold for the UDMA CRC Errors Attribute
Reserved

Total Number of Reads Attribute Threshold
Offset0
1
2 - 11

8.3.24.

Description
Attribute ID – Erase Count Usage (vendor specific)
Erase Count Threshold, fixed at 10
Reserved

UDMA CRC Errors Attribute Threshold
Offset0
1
2 - 11

8.3.23.

Value
229
0Ah
00h

Correctable ECC Errors Attribute Threshold
Offset0
1
2 - 11

8.3.22.

Description
Attribute ID – Spare Block Count Worst Channel (vendor specific)
Spare Block Count Worst Channel Threshold, fixed at 10
Reserved

Total ECC Errors Attribute Threshold
Offset0
1
2 - 11

8.3.21.

Value
213
0Ah
00h

Erase Count Attribute Threshold
Offset0
1
2 - 11

8.3.20.

401-0451-00 Rev. D

Value
232
00h
00h

Description
Attribute ID – Number of Reads (vendor specific)
No threshold for the Total Number of Reads Attribute
Reserved

Power On Count Attribute Threshold
Offset0
1
2 - 11

Delkin Devices, Inc. 2020

Value
12
00h
00h

Description
Attribute ID – Power On CountNo threshold for the Power On Count Attribute
Reserved
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E300 Series Industrial eUSB Module

8.3.25.

Total LBAs Written Attribute Threshold
Offset0
1
2 - 11

8.3.26.

Value
242
00h
00h

Description
Attribute ID – Total LBAs Read (vendor specific)
No threshold for the Total LBAs Read Attribute
Reserved

Value
214
00h
00h

Description
Attribute ID – Anchor Block Status (vendor specific)
No threshold for the Anchor Block Status Attribute
Reserved

Trim Status Attribute Threshold
Offset0
1
2 - 11

8.3.29.

Description
Attribute ID –Total LBAs Written (vendor specific)
No threshold for the Total LBAs Written Attribute
Reserved

Anchor Block Status Attribute Threshold
Offset0
1
2 - 11

8.3.28.

Value
241
00h
00h

Total LBAs Read Attribute Threshold
Offset0
1
2 - 11

8.3.27.

401-0451-00 Rev. D

Value
215
00h
00h

Description
Attribute ID – Trim Status (vendor specific)
No threshold for the Trim Status Attribute
Reserved

SMART Return Status

COMMAND CODE:

B0h with a Feature Register value of DAh

PROTOCOL:

Non-data

INPUTS:
Register
Features
Sector Count
Sector Number
Cylinder Low
Cylinder HighDevice/HeadCommand

7

6

5

4

3

2

1

0

DAh

4Fh
C2h
1

1

1

0
B0h

NORMAL OUTPUTS: Returns a status indication as described below.
ERROR OUTPUTS:

Delkin Devices, Inc. 2020

Aborted if the signature in the Cylinder registers is invalid or if SMART
is not enabled.

26

E300 Series Industrial eUSB Module

DESCRIPTION:

401-0451-00 Rev. D

This command checks the device reliability status. If a thresholdexceeded condition exists for either the Spare Block Count Worst
Channel attribute or the Erase Count attribute, the device will set the
Cylinder Low register to F4h and the Cylinder High register to 2Ch. If
no threshold exceeded condition exists, the device will set the
Cylinder Low register to 4Fh and the Cylinder High register to C2h.

WARNING: This product may contain chemicals known to the State of California to cause cancer, birthdefects, or other reproductive harm. For more information go to www.p65warnings.ca.gov.

Delkin Devices, Inc. 202027