Enabling AI-based
Reconstruction forYour ZEISS X-ray
Microscope

ZEISS AI Supercharger
ZEISS DeepRecon Pro + ZEISS DeepScout
zeiss.com/art

ZEISS AI Supercharger for Your X-ray Microscope

Expand Your Horizons and Accelerate Your Productivity
ZEISS Advanced Reconstruction Toolbox (ART) for ZEISS X-ray
microscopes (XRM) enables you to accelerate productivity inways never before possible. ART is an innovative platform on
which you can continuously access state-of-the-art reconstruction
technologies from ZEISS to enrich your research and increase
the return on investment of your ZEISS Versa 3D XRM.

At its core, DeepScout relies on theability of your XRM to generate
multiscale, spatially registered datasets,and uses that ability to train neuralnetworks to improve the reconstruction.
Because DeepScout provides you withhigh resolution over the field of view,
you can upscale full FOV scans to much

DeepScout is an advanced reconstruction technology based on
the latest algorithmic developments in AI, aimed at upscalinglarge volumes, leveraging the powerful Scout-and-Zoom capabilityof ZEISS XRM. DeepRecon Pro is a deep learning-based
technology that enables you to optimize for image qualityor throughput gains.

1 mm

1 mm

“Scout” scan, digitally zoomed to the region wherehigh resolution data is acquired.

High resolution scan

1 mm
Zoomed-in region of DeepScout recovered imagefor comparison

higher resolutions that are typically
restricted to smaller fields of view using
data uniquely accessible with ZEISS
Versa XRM.
ZEISS DeepRecon Pro – Improveimage quality, increase throughput
DeepRecon Pro uniquely harvests

Full extent of DeepScout recovered image.
ZEISS DeepScout enables high resolution everywhere in a large FOV volume. Capture a large field of view at low resolution and target a small region.
Scan target at high resolution. Use DeepScout to recover full volume at high resolution. You can now inspect the entire sample at the required resolution to identify,quantify, and even segment the defects across multiple regions of the sample.

DeepScout and DeepRecon ProThe unique AI offerings from ZEISS

the hidden opportunities in big data

form the AI Supercharger package

leverage deep understanding of bothgenerated by your XRM. This deepfor the Advanced Reconstruction

X-ray physics and customer applications

learning reconstruction technology

Toolbox.

to solve some of the hardest imaging

enables you to improve image quality or

challenges in new and innovative

increase throughput up to 10× without

ZEISS DeepScout

ways. These optional modules are

sacrificing image quality by reducing• High resolution with a larger fieldworkstation-based solutions thatthe amount of data required for highprovide easy access and usability.

quality 3D reconstructions.

of view (FOV)• Upscale interior tomographies at
speed to full FOV scans

DeepScout – Recover your fullZEISS DeepRecon Pro is applicable• Upscale volume scout scans using

field of view at high resolution

to both unique samples as well as

information uniquely possible

Developed through continued

semi-repetitive and repetitivealgorithmic innovation enabled byworkflows. Users can self-train new

the ZEISS AI infrastructure, DeepScoutmachine learning network models

capability to acquire richer information

employs familiar ZEISS Versa Scout-on-site with an extremely easy-to-use

at higher resolution

and-Zoom capability to acquire richer

interface. The one-click workflow ofinformation at higher resolution,ZEISS DeepRecon Pro eliminates theincluding for interior tomographiesneed for a machine learning expert

for large samples.

and can be seamlessly operated by0.7 mm

with ZEISS Versa XRM• Employs the familiar Scout-and-Zoom

even a novice user.
Now you can take your large
overview Scout scan, feed it through

0.7 mmthe ZEISS DeepScout reconstruction
algorithm, and get resolution upscaled
over a much larger field of view.

2Above: Polymer electrolyte fuel cell (PEFC) membrane electrode assembly imaged without ZEISS DeepScout.
Below: ZEISS DeepScout: Generate high resolution data across entire sample image for a clear view ofcritical microstructural features that influence water formation and fuel cell performance.

3ZEISS DeepRecon Pro

100 µmStandard reconstruction (FDK): Scan time 9 hrs (3001 projections)

1 mmStandard Reconstruction (FDK)

50 µm

Mouse lung imaged with standard FDK reconstruction

50 µm

Mouse lung imaged with DeepRecon Pro. Improved image quality on
same number of projections (3001 each)

DeepRecon Pro

Other Advanced Reconstruction Toolbox Packages• Up to 10X throughput​• Artifact Reduction Package• Superior image quality• Repetitive and non-repetitive applications• Seamless one-click workflow​• Now included with every VersaXRM 730 andVersaXRM 615 with a two-year licensed and the ART
high-performance secondary workstation

phase fringes– Materials Aware Reconstruction Solution (MARS)
to enhance image quality by reducing beamhardening artifacts• Recon Package– OptiRecon, iterative reconstruction for enhanced

100 µmStandard reconstruction (FDK): Scan time 53 mins (301 projections)– PhaseEvolve to enhance image quality by removing1 mm
DeepRecon Pro

throughput (up to 4X) or image quality– DeepRecon Pro

DeepRecon Pro used for image quality improvement for a smartwatch
battery. DeepRecon Pro both improves the clarity of cathode grains andpolymer separator. It also allows for the recovery of features otherwise
obscured by image noise, such as the electrolyte saturated anode.

100 µmDeepRecon Pro: Scan time 53 mins (301 projections)
DeepRecon Pro used for throughput improvement for Ceramic Matrix
Composite (CMC) sample, achieving 10× throughput improvement without
sacrificing image quality. This would allow for much higher temporal
resolution for in situ studies.

45

Carl Zeiss Microscopy GmbH07745 Jena, Germany
microscopy@zeiss.com
www.zeiss.com/art

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Not for therapeutic use, treatment or medical diagnostic evidence. Not all products are available in every country. Contact your local ZEISS representative for more information.
EN_44_012_104 | Rel. 1.1 | CZ 08-2024 | Design, scope of delivery and technical progress subject to change without notice. | © Carl Zeiss Microscopy GmbH