LCR Meters
SR715 and SR720 — LCR meters with test frequencies to 100 kHz

SR715 & SR720 LCR Meters· 0.05 % basic accuracy (SR720),0.2 % (SR715)· 5-digit display of L, C, R and Q or D
· Test frequencies to 100 kHz (SR720)· Up to 20 measurements per second

The SR715 and SR720 LCR Meters measure passive
components with as little as 0.05 % error. These easy-touse instruments are quick to setup, adjust and calibrate.
The SR715 and SR720 are ideal for applications such as
incoming inspection, quality control, automated test, andgeneral benchtop use.
Front-Panel Display· External capacitor bias up to 40 V

A 5-digit LED display shows measured values, enteredparameters, instrument status, and user messages. Whenmaking measurements, the major parameter (L, C or R) isshown on the left display and the appropriate minor parameter(Q, D or R) is shown on the right display.

· RS-232 computer interface

Making Measurements· GPIB & Parts Handler interfaces(SR720)Measurements can be performed at test frequencies of 100 Hz,
120 Hz, 1 kHz, 10 kHz and 100 kHz (SR720 only). A built-indrive voltage can be set to preset values (0.1, 0.25 and 1.0 V)
or adjusted from 0.1 to 1.0 V in 50 mV increments.

· Binning and limits for parts sorting

Measurements are taken at rates of 2, 10 or 20 samples per
second. Consecutive readings can be averaged between two
and ten times for increased accuracy. Both series or parallel
equivalent circuit models of a component are supported.
Capacitor measurements use either the internal 2.0 VDC bias
or an external source of up to 40 VDC.

Stanford Research Systems

phone: (408)744-9040
www.thinkSRS.com

SR715 and SR720 LCR Meters

Simple to Operate
The power and flexibility of the SR715/720 does not come at
the expense of ease-of-use. A convenient AUTO measurementmode automates the selection of setup parameters and quickly
determines the appropriate device model for whatevercomponent is being measured. Up to nine instrument setups
can be stored in non-volatile memory for quick recall at alater time.

SR728 BNC Adapter

progressively larger bins (e.g., ±1 %, ±2 %, ±3 %). Sequential
bins can have different nominal values, each separated bya percentage or a nominal value and asymmetrical limits.
Binning parameters are also easily stored in non-volatile
RAM for quick setup in production environments.
Test Fixtures
The SR715 and SR720 have a kelvin fixture which uses two
wires to carry the test current and two independent wires tosense the voltage across the device under test. This prevents
the voltage drop in the current carrying wires from affecting
the voltage measurement. Radial components are simply
inserted into the test fixture, one lead in each side. Axial
devices require the use of the axial fixture adapters (provided).
Surface-mount devices, or components with large or unusuallyshaped leads, can be measured with optional SMD Tweezers(SR727) or Kelvin Clips (SR726). The tweezers and clips
attach directly to the LCR meter’s front-panel test fixture. An
optional BNC Fixture Adapter (SR728) allows you to connect
a remote fixture or other equipment through one meter of
coaxial cable.
Rear Panel

Convenient Calibration
The SR715 and SR720 make it simple to compensate for lead
impedance and stray fixture and cable capacitance. The nullcalibration procedure automatically corrects both open andshort circuit parameters at all frequencies and all ranges.
Binning
The SR715 and SR720 have built-in features to aid incomponent sorting. This is especially useful for production
testing, incoming inspection, device matching, or when you
need to test multiple devices of similar value. The meters allow
you to sort components into as many as ten different bins.
The SR715 and SR720 support three types of binningschemes: pass/fail, overlapping and sequential. Pass/fail has
only two bins: good parts and everything else. Overlapping(or nested) bins have one nominal value and are sorted into

SR727 Surface Mount Tweezers

Two rear-panel input connections are provided for an externalbias voltage. Voltages as high as 40 VDC can be used.
An optional handler interface provides control lines to acomponent handler for sorting. A standard RS-232 interface
allows complete control of all instrument functions by aremote computer. A GPIB interface is included with thehandler option.

SR726 Kelvin Clips
SR720 rear panel

Stanford Research Systems

phone: (408)744-9040
www.thinkSRS.com

SR715 and SR720 SpecificationsMeasurement modes
Equivalent circuit
Parameters displayed

Basic accuracy

Auto, R+Q, L+Q, C+D, C+R
Series or parallel
Value, Deviation, % Deviation or
Bin Number (Deviation and% Deviation are calculated relative
to a stored value.)
SR715: 0.2 %, SR720: 0.05 %FixtureFixtureFixture protection

Measurement Range(R + Q mode)
RQ(L + Q mode)
LQ(C + D mode)CD(C + R mode)CR

0.0001 Ω to 2000 MΩ
0.00001 to 50

Frequency accuracy
Drive voltage

Drive-level accuracy
Bias voltage

Calibration
Zeroing
Compensation limits

0.0001 µH to 99999 H0.00001 to 50

Open and short circuit compensation
Short: R < 20 Ω, Z < 50 Ω,
Open: Z > 10 kΩ

General0.0001 pF to 99999 µF
0.00001 to 100.0001 pF to 99999 µF
0.00001 Ω to 99999 kΩ

Electrical
Test frequency

4-wire kelvin fixture for radial
leaded parts with adapters for axial
leaded parts.
Protected up to 1 Joule of stored
energy and 200 VDC (for chargedcapacitors). Fused at 0.25 A output
current for biased measurement.

Fixed frequencies at 100 Hz,
120 Hz, 1 kHz, 10 kHz (SR715 andSR720), 100 kHz (SR720 only)±100 ppm
Preset levels: 0.10, 0.25, 1.0 Vrms
Vernier: 0.1 to 1.0 Vrms with
50 mV resolution±2 %Internal: 2.0 VDC ± 2 %External: 0 to +40 VDC, fused
at 250 mA

Store and recall

Store/recall up to nine complete
instrument setups.
RS-232Standard interface. All instrument
functions can be controlled or readover the interface.
GPIB and Handler
IEEE-488.2 and Handler interface.
(SR720)Handler interface uses a DB25
connector, positive logic forbinning and control.
Operating temperature 0 °C to 35 °C
Relative humidity<85 %Power20 W, 100/120/220/240 VAC,
50 Hz or 60 Hz
Dimensions
13.5" × 4" × 14" (WHD)
Weight10 lbs.
Warranty
One year parts and labor on defects
in materials and workmanshipFeaturesAveraging
Measurement rate

Ranging
Triggering
Binning

2 to 10 measurements
Slow, Medium, Fast: 2, 10 or 20
measurements per second at test
frequencies of 1 kHz and above,
and about 0.6, 2, 4 or 6 measurements
per second at 100 Hz and 120 Hz
Auto or Manual
Continuous, manual or remote over
RS-232, GPIB or Handler interface
Up to 8 pass bins, QDR and general
fail bins, defined from the front
panel or over the computerinterfaces. Binning setup may be
stored in non-volatile memory.

Stanford Research Systems

Ordering Information
SR715
SR720
SR726
SR727
SR728

10 kHz LCR meter w/ RS-232
100 kHz LCR meter w/ RS-232,
GPIB and parts handler interface
Kelvin clips
Surface mount tweezers
4-wire BNC adapter

phone: (408)744-9040
www.thinkSRS.com