Solar Absorptance andTotal Hemispherical Emittance
Measurement System
・Portable Solar Absorptance
Measurement System PM-A2
・Total Hemispherical Emittance
Measurement System PM-E2

Portable Solar Absorptance
Measurement System PM-A2
Potable visible spectroscopy with direct driven grating

Transmittanc port
Lamp house
Reflectance port

Integrating spherewith multi detectors
PC based spectroscopic controller
Data processing system2

Measurement Principle

R

Spectral reflectanceλWavelength 250～2500nm

θIncident angle@7°3

Characteristics
・ Shortening of the measurement time.
・ Measurable from small size sample to large sizepanel.
・ Simple operation, small size, light weight, and cheap.
・ High accuracy measurement.
・ High-integrity data acquisition system.
・ Evaluation data by optical constant method.

4

Main Specification
SystemWavelength range

250～2500nm with ozone lamp

Light source

75W Xenon lamp
・ Reflection measurement
・ Transmission measurement
・ Solar absorptance

Measuring methods
Measurement
accuracy

・・Within ±2%, ・Repeatability: Within ±1%
Solar absorptance ±0.02

Measuring time

Around 2 minutes/1 scanStandard sample

・・Power source

AC100V±10% 50/60Hz 250VA

Diffuseness evaluation sample（SRS99/Labsphere）
Specular evaluation sample（TFA-25C05-4 Al Deposited mirror/Sigma Koki）

External dimensions W335×D375×H195mm（Excluding outshoot such as integrating sphere）
WeightApprox. 15kg

Usage environment

・・

Temperature：15～40℃
Humidity：10～45%RH

Storageenvironment

・・

Temperature：10～45℃
Humidity：10～50%RH

Accessories &attachments

・・

Instruction manual, ・ CD for measuring applications and driver installation
USB cable 1m, ・ Power cable

5Spectroscope
OpticalCrossed Czerny-Turner arrangement
arrangement
Focalpoint
134mm
distance
Open area ratio
F/3.4

Diffraction grating

3 kinds included①250nm-1200 number/mm②800nm-600 numbe/mm③1500nm-300 numbe/mm

Resolution①②③Dispersion

Maximum 15nm/mm

Wavelength drive

Direct driven system

Slit size

φ2mm（Common in both incoming and outgoing）< 11.2nm（50-600nm）< 22nm（600-1050nm）< 44.5nm（1050-2500nm）

Integrating spehere・Data acquisition system with PC
Internal diameter
φ100mmMaterial
SpectralonⓇ
Detectors used

① Si photodiode ×2② InGaAs photodiode ×1③ InGaAsPIN photodiode (one step cooling) ×1

Data acquisitionsystem・・・

Data table of spectral reflectance and transmittance
Graphical representation of spectral reflectance and transmittanceCalculation of solar absorptance6

Measurement Method
Small size sample

Large size sample
Sample7

Uncertainty αｓStandard sample (SRS99)
Influence by the multiple reflectionof the sample±1.0 ~±2.0%0.01~0.04

0.06
黒色塗料

多重反射率
Multiplereflectance

0.05

白色塗料

0.04
0.03
0.02
0.01
0.00
00.05

0.1

0.15

0.2

0.25

0.3

試料表面積/積分球表面積（％）
Samplesurface / Integrating surface (%)

0.35

Measurement Example-1
Spectral Transmittance
Upilex25S Film transmittance
1008025S Film reference
25S Film

6040200500

1000

1500
Wavelength nm

2000

2500

Measurement Example-2
Spectral ReflectanceStandard Sample

Polyimide Film with Thin Film

11
SRS99 α= 0.01
SRS50 α = 0.54
SRS10 α = 0.92
SRS99 Standard
SRS50 Standard
SRS10 Standard

0.8

0.8

0.6

0.6

0.4

0.4
Aluminizedα=0.34
Si coating (100μm) α =0.150.2

00.2

500

1000

1500

Wavelength nm

2000

2500

0

Si coating (300μm) α =0.17

500

1000

1500

Wavelength nm

2000

2500

Measurement Example-3
Solar AbsorptanceSampleSRS10
SRS99
Black Kapton
Deposited Al
Upilex25R
Deposited Al
Upilex25Rnew
CSi100

PM-A2

Publication data*

0.90
0.01
0.93

0.89 (0.89)－0.93 ~ 0.94 (0.94)

0.39

0.29 ~ 0.33 (0.30)

0.40－0.19(Al)

0.17(Al) ~* JAXA Tukuba, JAXA isas, Kyushu Int.(data)

Delivery Performances
12
3
4

JAXA isas
JAXA Mitaka
Hokkaido University
Nagoya University20112013
2014