http://support.spring8.or.jp/Report_JSR/PDF_JSR_31A/2019A1779.pdf

2019A1779

BL46XUࢥࣥࢱࢡࢺࣞࣥࢬ⏝ࢤࣝ⣲ᮦ࡟࠾ࡅࡿ⾲㠃ᵓ㐀ࡢゎᯒ
Analysis of Surface Structure on the Gel Material for Contact Lensesఀ⸨ ᜨ฼ a,b, ᒣᮏ ຾ᏹ b
Eri Ito a,b, Katsuhiro Yamamoto baa䠄ᰴ䠅࣓ࢽࢥࣥ, b ᅜ❧኱Ꮫἲேྡྂᒇᕤᴗ኱Ꮫ
Menicon Co., Ltd., b NAGOYA Institute of Technology⌧ᅾࡢࢯࣇࢺࢥࣥࢱࢡࢺࣞࣥࢬࡢ୺ὶ⣲ᮦ࡛࠶ࡿࢩࣜࢥ࣮ࣥࣁ࢖ࢻࣟࢤࣝ࡟㛵ࡋࠊỈ୰ᾐₕࡋࡓࢤࣝ࡟࠾࠸࡚ࠊ100 nm ⛬ᗘࡲ࡛ࡢ⾲ᒙྵỈ⋡ࡢୖ᪼ࠊ᭱⾲ᒙᩘ nm ࡟࠾࠸࡚㢧ⴭ࡞ୖ᪼ࠊぶỈ໬ฎ⌮ࢆ⾜࠺ࡇ࡜࡛ࠊྵỈ⋡ୖ᪼ຠᯝࡀࡼࡾ኱ࡁࡃ࡞ࡿࡇ࡜ࡀ☜ㄆ࡛ࡁ࡚࠸ࡿࠋࡇࢀࡲ࡛ᮏࢤࣝ⣲ᮦࡢ⾲㠃ࡢ໬Ꮫ≧ែࢆゎ᫂ࡍࡿࡓࡵࠊAl KĮ ⥺ࡢග㟁Ꮚศග䠄SX-PES䠅ἲ࡟ࡼࡿゎᯒࢆ㔜ࡡ࡚࠸ࡿࡀࠊ᭦࡟ヲࡋ࠸᝟ሗࢆᚓࡿࡓࡵࠊ◳ X ⥺ග㟁Ꮚศග䠄HAXPES䠅ࢆᐇ᪋ࡋࠊࢩࣜࢥ࣮ࣥࣁ࢖ࢻࣟࢤࣝࡢ⾲㠃≉ᛶࡢᨭ㓄ⓗせᅉ࡛࠶ࡿ࡜᥎ ࡉࢀࡿ⌛⣲ඖ⣲ࡢᣲືࢆ☜ㄆࡋࡓࠋHAXPES ࡣࠊSXPES ࡟࠾࠸࡚ᣦᶆ࡜ࡋ࡚ࡁࡓ Si 2p ㌶㐨࠿ࡽࡢග㟁Ꮚࡼࡾࡶศ⿣ࡀ࡞ࡃࠊ᫂░࡞ࣆ࣮ࢡࡀ㧗ឤᗘ࡟ᚓࡽࢀࡿ Si 1s ㌶㐨࠿ࡽࡢග㟁Ꮚࡢ ᐃࡀྍ⬟࡛࠶ࡿࠋ≉࡟ࡑࡢࢣ࣑࢝ࣝࢩࣇࢺ࡟╔┠ࡍࡿࡇ࡜࡛ࠊࡑࡢ⾲㠃≉ᛶࡢᶵᗎゎ᫂ࡀᮇᚅ࡛ࡁࡿࡇ࡜ࡀࢃ࠿ࡗࡓࠋ࣮࣮࢟࣡ࢻ㸸 Silicone HydrogelࠊHAXPESࠊNRࠊBiocompatibilityࠊSurface structure⫼ᬒ࡜◊✲┠ⓗ㸸⌧ᅾࠊ║⏝ࣞࣥࢬࡢ୰࡛ࡶࠊ≉࡟ᕷሙࡢ኱ࡁ࠸ࢯࣇࢺࢥࣥࢱࢡࢺࣞࣥࢬࡣࠊࢩࣜࢥ࣮ࣥᡂศ࡜ぶỈᛶᡂศ࠿ࡽ࡞ࡿࢩࣜࢥ࣮ࣥࣁ࢖ࢻࣟࢤࣝ㸦SiHy㸧࡜ศ㢮ࡉࢀࡿ୧ぶ፹ᛶࢤࣝ⣲ᮦࡀ୺ὶ࡜࡞
ࡗ࡚࠸ࡿ[1]ࠋSiHy ⣲ᮦࡣࠊඃࢀࡓ≀㉁㍺㏦⬟ࢆᣢࡕࠊ࠿ࡘᰂ㌾ᛶ࡟ᐩࡴ⣲ᮦ࡜ࡋ࡚ࠊࣞࣥࢬࡢࡳ࡞ࡽࡎ௚⏝㏵࡬ࡢᛂ⏝ࡶᮇᚅࡉࢀࡿࡀࠊ⏕య⤌⧊࡜᥋ゐࡍࡿ࣓ࢹ࢕࢝ࣝࢹࣂ࢖ࢫ࡜ࡋ࡚ࡣࠊࢩࣜࢥ࣮ࣥ⊂≉ࡢ⏕య㐺ྜᛶࡢపࡉࡀࠊࡋࡤࡋࡤㄢ㢟࡜࡞ࡿࠋࡑࡢࡓࡵࠊࣂࣝࢡᶵ⬟ࡢྥୖ࡜࡜ࡶ࡟ࠊ⾲㠃≉ᛶࡢᨵ㉁ࡀ⏘ᴗ⌧ሙ࡟࠾ࡅࡿㄢ㢟࡛࠶ࡿࠋ㐣ཤࠊX ⥺ࡸ୰ᛶᏊ➼ࡢ㔞Ꮚࣅ࣮࣒᪋タ࡟࠾ࡅࡿᩓ஘ ᐃ࡟ࡼࡾࠊSiHy ࡢࣂࣝࢡᵓ㐀ࡢゎ᫂ࡀྍ⬟࡜࡞ࡾࠊࡑࡢᶵ⬟ᛶ࡜ྜࢃࡏ࡚㆟ㄽࡍࡿ஦࡛ࠊᶵ⬟ྥୖࢆྍ⬟࡟ࡍࡿᵓ㐀ࠊ୪ࡧ࡟ࡑࡢᵓ㐀ࢆᐇ⌧ࡍࡿ㔜ྜ᪉ἲࢆゎ᫂ࡋࠊศᏊタィᣦ㔪ࢆぢฟࡋ࡚ࡁࡓ[2]ࠋࡋ࠿ࡋ࡞ࡀࡽࠊ⣲ᮦ⮬యࡢᶵ⬟ྥୖࢆࡣ࠿ࢁ࠺࡜ࠊ〇ရࡢ౑⏝ᙧែࢆ㚷ࡳࡓ᫬ࠊࡑࡢ⾲㠃≉ᛶࠊ≉࡟ࢃࡎ࠿ᩘ nm ࡢ⾲㠃ᵓ㐀࡟ࡼࡾࠊࡑࡢ〇ရࡢឤぬⓗホ౯ࡀỴࡲࡿ࡜ࡉࢀࡿࢥࣥࢱࢡࢺࣞࣥࢬ࡟࠾࠸࡚ࡣࠊ⾲㠃ࡢไᚚࡇࡑࡀࠊࡑࡢ〇ရࡢඃຎࢆỴᐃ࡙ࡅࡿࠋ≉࡟ࠊࢩࣜࢥ࣮ࣥᡂศࢆ౑⏝ࡋࡓࣞࣥࢬࡣࠊ⾲㠃ࡀ᧕Ỉᛶࢆ࿊ࡍࡿ☜⋡ࡀ㧗ࡃࠊ⏕య㐺ྜᛶࢆୗࡆࡿせᅉ࡜ࡶࡉࢀ࡚࠸ࡿࠋࡇࡢࡼ࠺࡞ឤぬⓗ࡞ㄢ㢟࡟ᑐࡋࠊṇ☜࡞⾲㠃≧ែࢆྍど໬ࡍࡿࡇ࡜ࡀᛴົ࡛࠶ࡿࠋࡑࡇ࡛ࠊ㝧Ꮚຍ㏿ჾ᪋タ࡟࠾ࡅࡿ୰ᛶᏊ཯ᑕ⋡ࢆά⏝ࡋࡓࢤࣝ⾲ᒙࡢỈศᕸ[3]࡜ࠊࢩࣥࢡࣟࢺࣟࣥ࡟࠾ࡅࡿග㟁Ꮚศග࡟ࡼࡿ⾲ᒙࡢ໬Ꮫ᝟ሗࢆ┦஫࡟⌮ゎࡍࡿ஦࡛ࠊ⾲㠃ᵓ㐀ࡢゎᯒ᪉ἲࢆ☜❧ࡍࡿ࡜࡜ࡶ࡟ࠊⰋዲ࡞⾲㠃ᵓ㐀ࢆᙧᡂࡍࡿᣦ㔪ࢆぢฟࡍྍ⬟ᛶࡀ࠶ࡿ࡜⪃࠼࡚࠸ࡿࠋᐇ㦂㸸ヨᩱ୍⯡ⓗ࡞ SiHy䠄USAN; midafilcon A䠅Lens ࢆヨᩱ࡜ࡋ࡚‽ഛࡋࡓࠋᨺ㟁ฎ⌮࡟ࡼࡿぶỈ໬ฎ⌮ࢆ᪋ࡋࠊSilicone Hydrogel Lens ࡑࡢࡶࡢࢆ mi-nonࠊ⾲㠃ᨵ㉁ヨᩱࢆ mi-tre ࡜ࡋ࡚‽ഛࡋࡓࠋホ౯㻝㻕 ◳ X ⥺ග㟁Ꮚศග䠄HAXPES䠅 ᐃ SPring-8 BL46XU஝⇱≧ែࡢぶỈ㐣ฎ⌮࡞ࡋࡢ SiHy ࡛࠶ࡿ mi-non ཬࡧぶỈ㐣ฎ⌮ࢆ᪋ࡋࡓ SiHy ࡛࠶ࡿmi-tre ࢆࠊ኱ᆺᨺᑕග᪋タ SPring-8 BL46 XU ࡟࠾࠸࡚ࠊศග⿦⨨ R-4000ࠊບ㉳ X ⥺ࡣ 8 keV䠉㻝㻝㻞䠉࡟༢Ⰽ໬ࡉࢀࡓࡶࡢࢆ⏝࠸ HAXPES ᐃ࡟౪ࡋࡓࠋ ᐃ᮲௳ࡣࠊࣃࢫ࢚ࢿࣝࢠ࣮200 eVࠊࢫࣜࢵࢺࢧ࢖ࢬ curved 0.5 mmࠊග㟁Ꮚࡢྲྀࡾฟࡋゅ㸦TOA㸧ࡣ 80°ཬࡧ 15°࡜ࡋࡓ[4]ࠋ
ᐃ࡟࠶ࡓࡗ࡚ࡣࠊヨᩱ⾲㠃ࡢᖏ㟁㝖ཤ࡟⣙ 2 nm ࢜ࢫ࣑࣒࢘ࢥ࣮ࢺࢆ᪋ࡋࡓࠋ㻞㻕 ◳ X ⥺ග㟁Ꮚศග䠄HAXPES䠅 ᐃ AichiSR BL6N1஝⇱≧ែࡢ mi-non ࢆࠊ࠶࠸ࡕࢩࣥࢡࢺࣟࢺࣥගࢭࣥࢱ࣮Aichi SR BL06N ࡟࠾࠸࡚ࠊศග⿦⨨ PHOIBOS140 CCD ࢆ⏝࠸ࠊບ㉳࢚ࢿࣝࢠ࣮ࡣ 2 keV ཬࡧ 3 keV ࡜ࡋ࡚ HAXPES ᐃ࡟౪ࡋࡓࠋ ᐃ᮲௳ࡣࠊࣃࢫ࢚ࢿࣝࢠ࣮20 eVࠊࢫࣜࢵࢺࢧ࢖ࢬ curved 7 mmࠊTOA ࡣ 90°࡜ࡋࡓࠋ ᐃ࡟࠶ࡓࡗ࡚ࡣࠊヨᩱ⾲㠃ࡢᖏ㟁㝖ཤ࡟୰࿴㖠ࢆ౑⏝ࡋࡓࠋ㻟㻕 ㌾ X ⥺ග㟁Ꮚศග䠄SX-PES䠅 ᐃ஝⇱≧ែࡢ mi-non ཬࡧ mi-tre ࢆࠊࣛ࣎ࡢ㌾ X ⥺ග㟁Ꮚศග ᐃჾ䠄Thermo Fisher Scientific♫〇䠅ࢆ౑⏝ࡋࠊ≉ᛶ X ⥺㸦AlKĮ㸧ࢆ⏝࠸࢚ࢿࣝࢠ࣮1.5 keVࠊࣃࢫ࢚ࢿࣝࢠ࣮50 eV ࡟ࡼࡾ SX-PES ᐃ࡟౪ࡋࡓࠋ ᐃ࡟࠾࠸࡚ࡣࠊୖグྠᵝ࡟୰࿴㖠ࢆ౑⏝ࡋࡓࠋ⤖ᯝ࠾ࡼࡧ⪃ᐹ㸸ࢥࣥࢱࢡࢺࣞࣥ⣲ᮦ SiHy ࡟ᑐࡋࠊSX-PESᐃཬࡧHAXPES ᐃ࡟ࡼࡾヨᩱ⾲㠃ࢆホ౯ࡋࡓࠋSX-PES ࡟࠾࠸࡚ᚓࡽࢀࡓ Si 2p ࢫ࣌ࢡࢺࣝࢆ Fig.1 ࡟ࠊඖ⣲⤌ᡂࢆ
Fig.2 ࡟♧ࡋࡓࠋ
AichiSR BL6N1 ࡟࠾࠸࡚ࠊບ㉳࢚ࢿࣝࢠ࣮2 keV ࠾ࡼࡧ 3 keV ࡛ ᐃࡋࡓ Si 1s ࡢࢫ࣌ࢡࢺࣝࢆ Fig.3 ࡟♧ࡋࡓࠋᑐ⛠ⓗ࡞ࣆ࣮ࢡ࡜ࡋ࡚ほᐹࡉࢀࡿ Fig.2 ࡢ Si 2p ࢫ࡮Fig.1 XPS Si 2p spectrum of mi-non㻌ࢡࢺࣝ࡜ẚ㍑ࡋࠊFig.3 ࡢ Si 1s ࡢࢫ࣌ࢡࢺࣝࡣࠊࣆ࣮ࢡ
sample obtained with a SX-PES.
࡟㠀ᑐ⛠ᛶࡀ࠶ࡾࠊ1838 eV ࡟␗࡞ࡿࣆ࣮ࢡࡀほᐹࡉࢀࡿࡇ࡜࠿ࡽࠊSi ࡟㛵ࡍࡿࢣ࣑࢝ࣝࢩࣇࢺࡢゎᯒࡀᮇᚅ࡛
ࡁࡓࠋ6;3(6᭦࡟ࠊ1䠅㠀◚ቯ࡟ࡼࡿ῝ࡉศᯒࠊ2䠅ឤᗘಀᩘࡀᩚഛࡉ
&&ࢀࡓඖ⣲ẚ⋡⟬ฟࢆᮇᚅࡋࠊSPring-8 BL46XU ࡟࠾ࡅࡿ
HAXPES ᐃࢆᐇ᪋ࡋࡓࠋ
SX-PES ࡟ࡼࡿ⾲ᒙඖ⣲⤌ᡂ࡟㛵ࡋ࡚ࡣࠊSX-PES䠄Si
12p䠅ཬࡧ HAXPES䠄Si 1s and Si 2p䠅ࡢ࠸ࡎࢀࡢ⌛⣲ ᐃ⤖ᯝࢆ⏝࠸࡚ࡶࠊ㢮ఝഴྥࢆ♧ࡍࡇ࡜ࡀ☜ㄆ࡛ࡁࡓࠋᚑ

12ࡗ࡚ࠊឤᗘಀᩘࡀᑟฟࡉࢀ࡚࠸ࡿඖ⣲࡟㛵ࡋࠊᮏࢤࣝ⣲2ᮦ࡟㛵ࡋࠊHAXPES ࡢ Si 1s ࡣࠊ⌛⣲ẚ⋡ࡢᣦᶆ࡜ࡋ࡚ࠊ
6LS6LSSi 2p ࡢ௦᭰࡜࡞ࡾ࠺ࡿࡇ࡜ࡀ☜ㄆ࡛ࡁࡓࠋ
୍᪉ࠊࡇࢀࡲ࡛ SX-PES ᐃࢆ⾜࠺୰࡛ࠊSX-PES ࡢྂ
PLWUHPLQRQ࠸ᶵ✀ࢆ⏝࠸ࡓ ᐃ࡟࠾࠸࡚ㄆࡵࡓ Si 2p ࣆ࣮ࢡࡢศ⿣ࡸࣆ࣮ࢡࡢᙅࡉࡣࠊ᭱᪂ࡢᶵ✀࡟࡞ࡾᨵၿࡉࢀࠊFig.1 Fig.2 Atomic composition obtained by SXPES measurement for mi-tre and miࡢࡼ࠺࡞ S/N ẚࡢ㧗࠸ࢫ࣌ࢡࢺࣝࡀᚓࡽࢀࡿࡼ࠺࡟࡞
non samples.
ࡗࡓࠋࡋ࠿ࡋ࡞ࡀࡽࠊ⌛⣲ᡂศࡢẚ⋡ࡣẚ㍑ⓗᏳᐃࡋ࡚࠾ࡾࠊኚ໬ࡀᑠࡉ࠸࡜᥎ᐹࡉࢀࡓࡀࠊࡇࢀࡣྛ✀ฎ⌮ࢆ᪋ࡋࡓሙྜࡢឤゐヨ㦂ࡢ⤖ᯝ࡜ࡢ▩┪ࡀࡋࡤࡋࡤぢࡽࢀࡿࡶࡢ࡛࠶ࡾࠊ⌛⣲࡟㛵ࡍࡿ⛉Ꮫⓗኚ໬ࡀ᏶඲࡟࡜
ࡽ࠼ࡁࢀ࡚࠸࡞࠸࡜ண᝿ࡉࢀࡓࠋ
ࡑࡇ࡛ࠊྛࠎ⣙ 10 nm ཬࡧ 50 nm ࡲ࡛ࡢ῝ࡉ࡟࠾ࡅࡿඖ⣲᝟ሗࡀᚓࡽࢀࡿ࡜ࡉࢀࡿ Take Off Angle䠄TOA䠅
15°ཬࡧ 80°࡟࠾࠸࡚ HAXPES ᐃࢆᐇ᪋ࡋࡓࠋᚓࡽࢀࡓ TOA 15°࡟࠾ࡅࡿ mi-non㸦ぶỈ໬ฎ⌮࡞ࡋ㸧ཬࡧ mi-tre䠄ぶỈ໬ฎ⌮࠶ࡾ䠅ࡢ Si 1s ࢫ࣌ࢡࢺࣝ
ࢆ Fig.4 ࡟♧ࡋࡓࠋSi 1s ࡢ S/N ẚࡢ㧗࠸ࢫ࣌ࢡࢺࣝࡀᚓࡽࢀࠊ୧ヨᩱ㛫ࡢࣆ࣮ࢡࢩࣇࢺ࠿ࡽࠊ⾲㠃ฎ⌮࡟ࡼࡿ໬
䠉㻝㻝㻟䠉

Fig.3 HAXPES Si 1s spectrum of m-nonsample observed using X-ray of 2and 3 keV.

Ꮫ≧ែࡢኚ໬ࡀ☜ㄆ࡛ࡁࡓࠋࡉࡽ࡟ᮏࢩࣇࢺࢆヲ⣽࡟ゎᯒࡍࡿࡓࡵἼᙧศ㞳ࢆ⾜ࡗࡓࠋ㠀ᑐ⛠࡞ࣆ࣮ࢡ࡛࠶ࡿࡇ࡜࠿ࡽᑡ࡞ࡃ࡜ࡶ 2 ᡂศ࠿ࡽ࡞ࡿ࡜ࡋࡓࠋ୍౛ࢆ Fig.5 ࡟♧ࡍࠋゎᯒ⤖ᯝࡼࡾࠊ⟬ฟࡋࡓప⤖ྜ࢚ࢿࣝࢠ࣮ᡂศ࡜㧗⤖ྜ࢚ࢿࣝࢠ࣮ᡂศࡢ๭ྜࢆ Fig.6 ࡟♧ࡋࡓࠋ

Fig.5 Waveform separation of mi-tre on Si 1sspectrum

Fig.4 HAXPES Si 1s spectrum of mi-non and mitre samplea observed using X-ray of 8 keV.

3HDNUDWLRFig.4 ࡼࡾࠊぶỈ໬ฎ⌮ࢆ⾜࠺ࡇ࡜࡛ࠊ⾲㠃ࡢ Si 1s ࡟㛵ࡍࡿ⤖ྜ࢚ࢿࣝࢠ࣮ࡣ⣙ 2 eV 㧗࢚ࢿࣝࢠ࣮ഃ࡬ࢩࣇࢺࡋ࡚࠸ࡿࡇ
࡜ࡀ☜ㄆ࡛ࡁࡓࠋ᭦࡟ Fig.5 ࡢゎᯒࢆಶࠎࡢࣆ࣮ࢡ࡟⾜࠺ࡇ࡜࡛ࠊヲࡋࡃ᳨ドࡋࡓ࡜ࡇࢁࠊ1842 eV ࡜ 1844 eV ࡢࣆ࣮ࢡࡀΰᅾࡋ࡚࠾ࡾࠊᮍฎ⌮ࡢ mi-non ⾲㠃ࡣࠊ1842 eV ࡢẚ⋡ࡀ㧗ࡃࠊฎ⌮ࢆ⾜ࡗࡓ mi-tre ࡣ 1844 eV ࡢẚ⋡ࡀ㧗ࡃ࡞ࡿኚ໬ࡀ㉳ࡇࡗ࡚࠸ࡿࡇ࡜ࡀ☜ㄆ࡛ࡁࡓࠋࡇࡢࢩࣇࢺࡣṇ☜࡞ᣦᶆࢆ⏝࠸ࡓ⿵ṇࢆᐇ᪋ࡋ໬Ꮫ≧ែࢆྠᐃࡍࡿᚲせࡀ࠶ࡿࡶࡢࡢࠊᡂศࡢ໬Ꮫᵓ㐀ࡼࡾ᥎ᐹࡋࠊSi-C ⤖ྜࡀ Si-O ⤖ྜ࡬ኚ໬ࡋࡓ࡜ண᝿࡛ࡁࡿࠋ࡞࠾ࠊࡇࡢኚ໬ࡣࠊᐇ㝿ࡢヨᩱ⾲㠃ࡢぶỈᛶኚ໬࡜ࡶ┦㛵ࡍࡿࠋ
HAXPES ᐃࡣࠊࡇࢀࡲ࡛ࢹ࣮ࢱࢆ⵳✚ࡋ࡚ࡁࡓ SX-PESPLWUHPLQRQᐃ࡛ᚓࡽࢀࡓඖ⣲⤌ᡂࡢࢹ࣮ࢱ࡜┦㛵ࡀ࠶ࡾࠊࡑࡢୖࠊSX-PES࡛ࡣᅔ㞴࡛࠶ࡗࡓࠊ⌛⣲ඖ⣲ࡢ໬Ꮫ⤖ྜ≧ែ࡟㛵ࡍࡿゎᯒࡀྍ
Fig.6 Peak ratio depending on Si 1s⬟࡛࠶ࡿࡇ࡜ࡀ☜ㄆ࡛ࡁࡓࠋ≉࡟ SiHy ࡟࠾ࡅࡿ⌛⣲ᡂศࡢゎChemical shift obtained by
HAXPES measurement for miᯒ࡟࠶ࡓࡗ࡚ࡣࠊࡇࡢ໬Ꮫ≧ែࡀឤゐヨ㦂࡜୍⮴ࡍࡿࡇ࡜࠿ࡽࠊ
tre and mi-non samples.
HAXPES ࡟࠾ࡅࡿ Si1s ග㟁Ꮚࡢホ౯ࡀࠊSiHy ࡢ⾲㠃≉ᛶࡢ໬Ꮫ≧ែࢆ⌮ゎࡋࠊ᭦࡟⾲㠃ࡢỈ⃿ࢀᛶࢆྥୖࡉࡏࡿ➼ࡢኚ໬ࢆ୚࠼ࡓሙྜࡢኚ໬ᶵᗎࡢゎ᫂࡟࠾࠸࡚ࠊ᭷⏝࡞᪉ἲ࡛࠶ࡿ࡜⪃࠼ࡽࢀࡿࠋᮏゎᯒࢆ⥅⥆ࡍࡿࡇ࡜࡛ࠊࢤࣝ⾲㠃ࡢタィᣦ㔪ࡀᚓࡽࢀࡿࡶࡢ࡜ᮇᚅࡍࡿࠋ௒ᚋࡢㄢ㢟㸸◳ X ⥺ග㟁Ꮚศගࢆ⏝࠸ࡿ஦࡛ࠊ㌾ X ⥺ග㟁Ꮚศග࡛ࡣᚓࡽࢀ࡞࠿ࡗࡓ࢚ࢿࣝࢠ࣮‽఩ࡢ㧗࠸ග㟁Ꮚ᝟ሗࡀ ᐃྍ⬟࡜࡞ࡾࠊࡑࡢ⤖ᯝࠊ≉࡟⾲㠃ᛶ㉁ࢆỴᐃ࡙ࡅࡿ Si ඖ⣲࡟㛵ࡋࠊࣆ࣮ࢡศ⿣ࡀ࡞ࡃࠊṇ☜࡞ Si 1s ᝟ሗࢆᚓࡿࡇ࡜ࡀ࡛ࡁࠊ᭦࡟ࡣࢣ࣑࢝ࣝࢩࣇࢺ࡟╔┠ࡍࡿࡇ࡜࡛ࠊ໬Ꮫ≧ែࡢゎᯒࢆ⾜࠼ࡿྍ⬟ᛶࡀ♧၀ࡉࢀࡓࠋࡋ࠿ࡋ࡞ࡀࡽࠊHAXPES ࡢࡳ࡛ ᐃྍ⬟࡞ Si 1s ࡢග㟁Ꮚࡣࠊឤᗘಀᩘ࣭ࢣ࣑࢝ࣝࢩࣇࢺ➼ࡢ᝟ሗ࡟ஈࡋࡃࠊゎᯒࡲ࡛࡟᳨ウ᫬㛫ࢆせࡍࡿࠋᨺᑕගᶓ᩿ⓗ࡟ࠊࡇࢀࡽࡢඹ᭷ྍ⬟࡞ࢹ࣮ࢱ࣮࣋ࢫࡀᵓ⠏ࡉࢀࡿࡇ࡜࡛ࠊࡼࡾ⢭ᗘࡢ㧗࠸⾲㠃ゎᯒࡀྍ⬟࡜࡞ࡿࡶࡢ࡜ᮇᚅࡍࡿࠋཧ⪃ᩥ⊩㸸[1] E. Ito ᪥ࢥࣞㄅ 58, No.2 116-124䠄2016䠅
[2] K.Yamamoto, Macromolecular Symposia 385, 18100181,䠄2019䠅
[3] K. Yamamoto, 㧗ศᏊㄽᩥ㞟, 74, No. 1, 36-40䠄2017䠅
[4] H. Oji, Journal of Surface Analysis, 21, No.3, 121-129䠄2015䠅䠉㻝㻝㻠䠉