XFEL‐ Photon Beamline and Experiments ‐Kensuke Tono
XFEL Utilization Division, JASRI

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Contents
1. Photon beam properties
2. Hard X‐ray Beamline
3. Experimental stations
4. Experiments at SACLA2

XFEL: Properties and sciences• Short pulse (<10 fs)• High peak power (>30 GW)• Coherent
Ultrafast observation beyond the speed of atomic motion• Beyond static image
 Imaging functions (motion pictures of chemical
reaction, phase transition, etc.)• Beyond statistical image
 Imaging fluctuations, rare events
Ultrahigh peak‐intensity X‐ray sciences• New regime of X‐ray‐matter interactions (Nonlinearoptics, quantum optics, etc.)3Femtosecond snapshot of sample
Single pulse FELSingle pulse FEL

Chapman et al., Nature Physics 2, 839 (2006)
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SASE XFEL
• Short pulse (<10 fs)• High peak power (>30 GW)• Coherent (spatial only)• Multimode• Shot‐by‐shot fluctuation

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Spectrum of single XFEL pulse
Spikes due to multi optical modes
Si(111)Si(555)120

0x10100

intensity (a.u.)

120
Intensity (a.u.)

290 meV

3100806080604040202009.909.95

10.00

10.05

Photon energy (keV)

10.10-2-1012

Relative photon energy (eV)Y. Inubushi et al., Phys. Rev. Lett. 109, 144801 (2012).

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Evaluationof pulse
using pulse
XFEL simulation
Spectraat durationdifferent
widthsInubushi (RIKEN) et al.
(a) ΔE=110 meV(b)ΔE=290 meV(c) ΔE=600 meV(d) t=31 fs(e) t=8.9 fs(f) t=4.5 fs(FWHM)(FWHM)

MeasuredSpectraSimulated
spectra7

Shot‐by‐shot fluctuation
Intensity/position

SpectrumShot‐by‐shot measurement is mandatory in photon
diagnostics and experiments.
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Contents
1. Photon beam properties
2. Hard X‐ray Beamline
3. Experimental stations
4. Experiments at SACLA

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Photon beamlines of SACLA
BL3(Hard X‐ray)Optics hutches

BL1(Soft X‐ray)

EH1

Experimental hutches
EH2
EH3
EH4

XFEL + SPring‐8Exp. Facility

Laser hutch
7m

7 x 9 x 5 m3

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Beamline optics
Transport XFEL & filter out unnecessary lights• Double plane mirrors (2 sets): Low‐pass filter• Double crystal monochromator (DCM, Si 111): Band‐passfilter< 7.5 keV
< 15 keV11

Demands on optical elements
XFEL features

Demands on beamline optics

Short pulse (10 fs)

Damage freeHigh peak power (30 GW)
CoherentSpeckle freeSpeckles

12Damage‐free optics
Small atomic‐number elements (Be, B, C, N, O) with small
X‐ray absorption coefficient Be windows, diamond fluorescent screens, carbon‐
coated mirrors, etc.
SiKoyama et al., Optics Express Vol.21 (2013)13

Spackle‐free optics (1)Goto et al., Proc. of SPIE Vol.6705 (2007)

Coherent‐X‐ray transmission images of Be x‐ray windows
With a rough surfaceand/or internal voids

With a smooth surface
and uniform density

SpecklesSpeckle-free14

Spackle‐free optics (2)Ultraprecise x‐ray mirror
Mirror surface is finished by EEM (Elastic Emission Machining)

400 mmMimura et al., Rev. Sci. Instrum. 79, 083104 200815

Photon diagnostics on beamline
Nondestructive, shot‐by‐shot monitoring is mandatory.
Beam‐size measurement (wire scan method)
Photodiode
Scattering

XFEL

Wire

PhotodiodeII0
Signal /a.u.

0.12

1.1

I0.1

I00.08First derivative

0.9

I / I0

0.7

0.06

0.5

0.040.3

0.020.10‐0.10102030

Wire position /a.u.

4050

0102030

Wire position /a.u.

405016

Photon diagnostics system on BL3
Wavelength monitor（wavelength/photon energy）

XFEL

Mirror 2a

Mirror 2b

Slit

Mirror 1
Monochromator

Gas monitor（intensity）

Beam monitor x 2（intensity/position）

Screen monitor x 7（spatial profile）
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Beam monitor (intensity/position)
Geometry

K. Tono et al. RSI 82, 023108 (2011)yy

Compton
ScatteringUx

X-raysLR

Diamond thin film

IntensityPosition

Hamamatsu, S3590-09(10 x10 mm2)I  I L  I R  IU  I D IL  IRx  Kx
 K x I x
IL  IRIU  IDy  Ky
 K y I y
IU  ID

Slope: 1/Kx

Ix

Photodiode

DQuadrant-photodiodes

Alkire et al., J. Syn. Rad. 7, 61 (2000). 18

Shot‐by‐shot measurement of pulse
energy19

Contents
1. Photon beam properties
2. Hard X‐ray Beamline
3. Experimental stations
4. Experiments at SACLA20

Experimental stations
1: Advanced XFEL optics
2: Pump & probe
3: Coherent focusing
4: Open hutch(large instruments)
5: XFEL‐SR synergetic use

BL3
BL1

EH1
EH2
Laser booth(CPA, OPA)

EH3
EH4

XFEL + SPring‐8Exp. Facility7m

7 x 9 x 5 m3

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Single‐shot measurement is mandatory
Even a single pulse destroys a sample.

Neutze et al., Nature 406, 752 (2000)

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Instrumentation for single‐shotmeasurement• High photon flux
 Focusing• Sample exchange Injectors
 Fixed targets with a fast scanning system• Sensitive X‐ray detection
 High performance detectors
 High sensitivity, high frame rate, high dynamic range, largearea, …

• Fast & reliable data acquisition system
 High performance computers High speed network
 Storage system Software

23Focusing
Beam profile (horizontal)
1.2
Intensity (arb. unit)

KB mirrors at EH3Yumoto et al., Nat. Photon. Vol.7 (2013)

Horizontal…

1.00.8

1 μm (FWHM)

0.6
0.4
0.2
0.0-0.2-15-10-50

5

10Position (μm)

2415

2 step focusing optics for nano‐beam
2 step focusing

Mimura (U. Tokyo)
Yamauchi et al. (Osaka U.)
Yumoto et al. (SPring-8)

2nd at EH5

1st at EH4

Enlarged beam size

Focusing with enough NA
and enough WD

XFEL
About 79 m

Focal point

Injectors
Continuous beam

Song (RIKEN) et al.
Mafune (U Tokyo)

Droplets

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Detector• Multi‐port CCD (MPCCD)– High sensitivity– Low noise• (single‐photon detection capability– Fast (60 fps)
– Large area（□100 mm）

Octal Sensor Detector (100 x 100 mm)
2048 x 2048 pixels

Kameshima (JASRI)
Hatsui (RIKEN) et al.

Specification

Frame rate

≥60 fps

Pixel size

50 μm

Noise

300e‐Q.E.

~70 % @ 6 keV~20 % @ 12 keV

Dynamic range

14 bitsSystem noise< 0.2 ph.@ 6 keVFull well~ 3000 ph. @6keV~ 1500 ph. @12keV
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Data acquisition (DAQ) Joti, Kameshima (JASRI)
Hatsui (RIKEN) et al.

Data stream
4 GbpsContents
1. Photon beam properties
2. Hard X‐ray Beamline
3. Experimental stations
4. Experiments at SACLA

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Typical experiment at SACLA (1):Coherent diffraction imaging (CDI)
2D detector

mimivirus

Injector

Seibert et al., Nature 470, 78 (2011)30

CDI experiment at SACLA
Nakasako (Keio U) et al., Rev. Sci. Instrum. in press (2013)
Song (RIKEN) et al.

EH3Detector

Detector

MAXIC/KOTOBUKI‐11 μm Focusing

Monitor□50 mmDual□100 mm

Octal

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Typical experiment at SACLA (2):Serial femtosecond crystallography (SFX)

Chapman et al., Nature 470, 73 (2011)32

SFX at SACLA
Iwata (RIKEN) et al.
Injector

50 mm

XFEL
48°
MPCCD

Crystal
Detector

High fluence application:
Multiphoton ionization of Xe~50 uJ/um2@5.5 keVNon linear X‐ray optics
Emission from double core hole state
K. Tamasaku et al, PRL Vol.111 (2013)• 100 uJ/10 fs = 10 GW (after 1‐μm KB)• Focusing size: ~1x1 μm2• 10 GW/(1 μm)2~ 1018 W/cm2
Double core hole of Kr35

And more• Pump‐probe experiments– X‐ray diffraction/scattering– X‐ray absorption/emission spectroscopy– Photoelectron spectroscopy• X‐ray nonlinear optics• X‐ray photon correlation spectroscopy

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Summary• Novel properties and sciences of XFEL– Ultra‐brilliant, ultra‐short, and coherent– Beyond static, statistical, perturbative pictures• Beamline for XFEL
– Damage‐free & speckle‐free optics– Single‐shot, nondestructive diagnostics• Experimental instrumentation for single‐shot measurement– focusing optics, sample injectors, detectors, femtosecond laser• Experiments at SACLA– Femtosecond snapshots of samples– X‐ray‐matter interaction under ultra‐high photon flux
– Pump‐probe measurement
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