Graphene and Related 2D Materials

Call for Participation

Technical Work Area 41

Project 13
Lateral size of graphene oxide flakes by Scanning Electron
Microscopy (SEM)

Objectives
The aim of this international
interlaboratory comparison is to determine
the lateral size distribution of graphene
oxide flakes using Scanning Electron
Microscopy (SEM).
The results will be used directly for further
development of the ISO/AWI TS 23879
with a validated measurement procedure.

measurements are important due to themultiple production routes and producersof the material in order to maintainquality in manufacture.
Several standards are underdevelopment within ISO/TC 229‘Nanotechnologies’, jointly with IEC,•

This work is undertaken as part of the
EMPIR project ISO-G-SCoPe.

Background
Graphene is predicted to impact manydifferent application areas such as solar
cells, biosensors, displays, composites,
flexible electronics and energy storage
due to its exceptional properties. One ofgraphene’s many achievements is that itis the first truly 2D material, being only 1
atom thick. The isolated research into awhole new family of other 2D materials
has indicated that the new materials
show exciting and complementary
properties
tographene,revealing
potential for many other industry
applications.

Standardization Needs
As industry uptake on this material
increases, international standardizationis critical to enable commercialization.
Reliable, accurate, and reproducible•

ISO/AWI TS 23879
Structural characterization ofgraphene oxide flakes: thickness
and lateral size measurement
using AFM and SEM
ISO/AWI TS 23359
Chemical characterization ofgraphene in powders andsuspensions”, which focus on
determining the dimensional andchemical properties of graphenerelated 2D materials.

This requires interlaboratorycomparisons to develop best practiceand understand the associatedmeasurement uncertainties.

Relevant Standards
Committees
ISO/TC 229 Nanotechnologies
ISO/TC 202 Microbeam analysis
ISO/TC 201 Surface analysis

SEM image after manual contouring of graphene oxide flakes

Work Programme

Funding

Graphene oxide sheets from liquidsuspension transferred onto siliconwafer will be measured with an SE
InLens detector in an SEM, according
to a protocol including the image
analysis approach and the size
descriptors to be measured andreported. Samples will be prepared by
the project leadership and provided toeach participant.

Participants will fund their own
involvement (approx. 4 days’ work).

The project is due to start in May 2023
for a duration of 12 months.

International Participation
Current participation includes Australia,
Brazil, China, USA, Japan, andEuropean countries. Additional
participants welcome.

For more information:
Project Leader

Dr Dan Hodoroaba

Deliverables andDissemination
This interlaboratory study will bedisseminated in a peer-reviewed
scientific journal, and used to develop
ISO/AWI TS 23879 “Structuralcharacterization of graphene oxide
flakes: thickness and lateral size
measurement using AFM and SEM” .

Federal Institute for Materials Research andTesting (BAM), Germany
dan.hodoroaba@bam.de

TWA Co-Chairs

Dr Lingling Ren

National Institute of Metrology, China
renll@nim.ac.cn

Dr Andrew Pollard

National Physical Laboratory, UK
andrew.pollard@npl.co.uk

www.vamas.org
April 2023