Summary Report of ISO/IEC 10995 Test Program
Performed by Millenniata on M-DISC™ DVDIntroduction
Millenniata has established a new standard in digital data storage with the introduction of the M-DISC
family of inorganic archival optical media. As part of our commitment to provide permanent data
storage solutions to our customers, we have completed the full ISO/IEC 10995 Standard Test Program
to determine the expected data retention lifetime of the M-DISC Technology in the DVD format. We arepleased to present the following test report.
In short, all results confirm the M-DISC has an expected average lifetime of 1,332 years when stored
at normal conditions of 25°C and 50% Relative Humidity (RH). Not only is this consistent with ourperformance claims, the test results also demonstrate the M-DISC performs over 100 times better than thenext best digital data storage solution available.

Description of Results and Predicted Lifetime
The test conducted at Millenniata follows strict guidelines and standards that are set by the ISO/IEC
10995 Test Specification. The test conditions are summarized in the table below.

Test Number123
4

Test Stress ConditionTemp °C% RH

8585657085708575

Number ofSpecimens

20203020

Incubation
DurationTime
Completed

Hours
100 - 250
100 - 250
100 - 250
100 - 250

Hours650
1150
2100
2500

Table 1. ISO/IEC Test Condition Summary

PIE Sum 8 Max is a measure of the data read error rate for a DVD disc. The maximum value specified in the test
is 280. While the typical DVD player will successfully read a disc with several times this error rate, this value isspecified in the ISO/IEC 10995 Standard and is used as the failure specification in this test.

June 3, 2013 - Page 1To determine the expected lifetime of the M-DISC, the PIE Sum 8 Max values for all discs experiencing aparticular test condition are analyzed and compared against the elapsed time in the test. Performing thisanalysis for all four different test conditions (see the above table) enables a scientific estimation of the disc
lifetime at normal storage conditions (25 °C and 50% RH).

The M-DISC test results displayed below in Figure 1 help demonstrate the significant lifetime advantage of theM-DISC. The M-DISC advantage in maintaining an acceptable error rate becomes very obvious at the lower
temperature conditions specified in the ISO/IEC 10995 Standard. This is exactly what should be expected if
the M-DISC has a very long lifetime.

Figure 2 below highlights another of the significant lifetime advantages of the M-DISC. The jitter is a direct
measure of the accuracy of the data recording process on the disc. As the disc ages, jitter will typically increase.
These four charts show the change in jitter from the initial or starting value as the disc ages during the test,
meaning a value of 0 would indicate there was no change. It is obvious that the recorded data marks are stable
and accurate on the M-DISC under extreme conditions. This stability is key to the exceptional data retention
lifetime of the M-DISC.
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Figure 1. M-DISC PIE Sum 8 Maximum Error Rates By Test Condition

June 3, 2013 - Page 2

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Figure 2. M-DISC Data-to-Clock (DC) Jitter by Test Condition

Figure 1 and Figure 2 are only representative average values for the set of M-DISCs exposed to each of theindividual test conditions. The curves in these figures represent a large number of data points. Following themathematical analysis procedures specified in the ISO/IEC 10995 Standard, the entire collection of data points
can be processed and reduced to a lifetime estimate for any specified set of storage conditions (combinationsof storage temperature and relative humidity). While this mathematical analysis is too extensive and laborious
to be described in this summary report, the results are shown in Table 2 for various storage conditions.

15 °C

20°C

25 °C

30 °C

35°C

40 °C

30% RH

16969

6880

2875

1237

547

248

50% RH

7865

3189

1332

573

253

115

70% RH

3646

1478

618

266

117

53

Table 2. M-DISC DVD Expected Mean Lifetime in Years Under Selected Storage Conditions

June 3, 2013 - Page 3