International Workshop on Materials and Devices for
Safety and Security 2009
(IWMD-SS 2009)−How Reliability, Safety and Security are Considered and Incorporated
in the Selection and Design of New Materials for Device and System Development −Date & Time: Friday, February 20th, 2009 9:30-17:20
Place: Digital Hall of Graduate School of Decision Science and Technology
West Building 9, Ookayama Campus, Tokyo Institute of Technology
2-12-1 Ookayama, Meguro-ku, Tokyo, 152-8550, JAPAN(In front of Ookayama Station on Tokyu Meguro Line or Ooimachi Line)
http://www.titech.ac.jp/access-and-campusmap/e/o-okayama-campus.html
Admission: FreeSponsor: Integrated Research Institute, Tokyo Institute of Technology
Co-Sponsor: Materials and Structures Laboratory, Tokyo Institute of Technology
Global Center of Excellence: Photonics Integration-Core Electronics
Tokyo Institute of Technology
Frontier Research Center, Tokyo Institute of Technology
Interdisciplinary Graduate School of Science and Engineering
Tokyo Institute of Technology
IEEE EDS Japan Chapter
Technical-Sponsor: IEEE Electron Devices Society
Silicon Technology Division, Japan Society of Applied Physics
In Cooperation with: The Electrochemical Society of Japan<Program>
Opening Remarks (9:30-10:00)
Sadayuki Ueha, Director, Solutions Research Organization
Integrated Research Institute, Tokyo Institute of Technology

Part 2: "Reliability Management in the Development of SemiconductorDevices" (13:30-15:45)
Invited"Integration of Emerging Materials into CMOS Technology
Platform for Novel Applications: Opportunities, andReliability & Safety Challenges"

Ken-ichi Kondo, Director, Materials and Structures Laboratory
Tokyo Institute of Technology
Masamichi Ishikawa, Professor, Integrated Research InstituteTokyo Institute of Technology

Part 1: "Safety Design in the Development of Batteries"(10:00-11:50)

by Dr. Dim-Lee Kwong, Executive Director, IME, Singapore
InvitedKey Note"Technological Management for Realizing Safety andReliability in Fuel Cells"by Prof. Takuya Homma, Advisor, Fuel Cell Development
Information Center (FCDIC)
Invited"Safety and Reliability Issues for Introducing New Materials
in a 300 mm Si R&D Process Line"by Prof. Cor Claeys, Director, Advanced Semiconductor
Technologies, IMEC, Belgium

Invited"Materials Science for Lithium Batteries: Toward the Safeand Reliable Battery System""On Meeting the Reliability Requirements of Logic andMemory Chips for Computer Systems"by Dr. Tak Ning, Fellow, IBM, USA

by Prof. Ryoji Kanno, Tokyo Institute of Technology

Break (15:15-15:30)
InvitedInvited"Battery Material Development for Securing Safety ofAdvanced Secondary Batteries""MPU and System Design Strategy for Safety andReliability"

by Dr. Tetsuo Sakai, Leader of Secondary Battery System
Group, Advanced Industrial Science and Technology (AIST)

by Dr. Mitsuo Saito, Chief Fellow, VP of Engineering, Toshiba
Semiconductor Company, Japan

Lunch (11:50-13:30)

Panel Discussions (15:45-17:15)"Issues in 'Matching' Reliability, Safety, Security and Technology Management in the Material, Device and System Development"
Moderator: Masamichi Ishikawa, Tokyo Institute of Technology
Panelists: All the speakers

Closing (17:20)

Organization:
General Chair: Masamichi Ishikawa, Tokyo Institute of Technology
Technical Program Co-chairs: Yotaro Yamazaki, Tokyo Institute of Technology
Hiroshi Iwai, Tokyo Institute of TechnologyTreasurer: Akeshi Kouno, Tokyo Institute of Technology
Publication Chairs: Kuniyuki Kakushima, Tokyo Institute of Technology
Parhat Ahmet, Tokyo Institute of Technology
Secretary: Masakatsu Akedo, Tokyo Institute of Technology

Registration: Can be made through the following URL. Please fill in the form withnecessary information.
http://www.iri.titech.ac.jp/securematerial/form.html
Contact: Professor M. Ishikawa Tel. +81-45-924-5561, Fax. +81-45-924-5562,
ishikawa.m.ae@m.titech.ac.jp