Test report No.
Page
Issued date
FCC ID: 30JE0000-HO-XX: 1 of 26: November XX, 2010
: XXXYYYY

RADIO TEST REPORT
Test Report No. : 30JE0000-HO-XX
Applicant:

UL Japan, Inc.

Type of Equipment:

Digital camera

Model No.

:

ABCD1234

Test regulation:

FCC Part 15 Subpart C : 2010

FCC ID:XXXYYYY

Test Result:

Complied

1.
2.
3.
4.
5.

This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc.
The results in this report apply only to the sample tested.
This sample tested is in compliance with above regulation.
The test results in this report are traceable to the national or international standards.
This test report must not be used by the customer to claim product certification, approval, or endorsement
by NVLAP, NIST, or any agency of the Federal Government.
Date of test:

March 4, 2010______________________________

Representative
test engineer:______________________________Taro Tanaka
Engineer of EMC Service
Approved by:______________________________Jiro Tanaka
Manager of EMC ServiceThis laboratory is accredited by the NVLAP LAB CODE
200572-0, U.S.A. The tests reported herein have been
performed in accordance with its terms of accreditation.
*As for the range of Accreditation in NVLAP, you may
refer to the WEB address,
http://www.ul.com/japan/jpn/pages/services/emc/about/ma
rk1/index.jsp#nvlap

NVLAP LAB CODE: 200572-0

UL Japan, Inc.
Head Office EMC Lab.
4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN
Telephone: +81 596 24 8116
Facsimile: +81 596 24 8124
MF060b (10.05.10)

Test report No.
Page
Issued date
FCC IDCONTENTS: 30JE0000-HO-XX: 2 of 26: November XX, 2010
: XXXYYYYPAGESECTION 1: Customer information············································································································· 3
SECTION 2: Equipment under test (E.U.T.) ······························································································ 3
SECTION 3: Test specification, procedures & results ·············································································· 5SECTION 4: Operation of E.U.T. during testing ····················································································· 10
SECTION 5: Radiated emission (Electric Field Strength of Fundamental and Spurious Emission)11
SECTION 6: Automatically deactivate ······································································································ 14
SECTION 7: -20dB and 99% Occupied Bandwidth ················································································ 14
APPENDIX 1: Photographs of test setup··································································································· 15
Radiated emission........................................................................................................................15
Worst case position......................................................................................................................16
APPENDIX 2: Data of EMI test ··················································································································· 18
Automatically deactivate..............................................................................................................18
Radiated Emission (Electric Field Strength of Fundamental and Spurious Emission) ....................19-20dB and 99% Occupied Bandwidth...........................................................................................21
Duty Cycle ..................................................................................................................................22
Receiver Spurious Emission.........................................................................................................24
APPENDIX 3:Test Instruments ··················································································································· 26

UL Japan, Inc.
Head Office EMC Lab.
4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN
Telephone: +81 596 24 8116
Facsimile: +81 596 24 8124