SHR  HIGH-RESOLUTION WAVELENGTH METER

HIGH-RESOLUTION WAVELENGTH METERSHR

SHR is an ideal low-cost high-precision spectrometerfor measuring laser wavelength in a large field of laser
applications, as well as in the process of alignment and testingof solid-state lasers, diode lasers, dye lasers and OPOs.

FEATURES
 High accuracy ±3 pm and wide spectral range 190-1200 nm.
 FWHM and spectral line monitor and analysis.
 Ideal for wavelength measurement of pulsed and CW lasers.
 Compact design; no movable components.
 Fiber input; Diffuse attenuator.
The SHR is an ideal low-cost high-precision spectrometer formeasuring laser wavelength in a large field of laser applications, aswell as in the process of alignment and testing of solid-state lasers,
diode lasers, dye lasers and OPOs.
The SHR optical scheme is based on an Echelle diffraction grating
operating in high spectrum orders and a linear image sensor used asa detector. The SHR does not contain any moving elements; poweringand control are performed from a computer via the Full-Speed
USB interface. The SHR can be triggered from your laser source via
standard TTL-level signals.
The SHR allows quick and easy measuring of absolute wavelength
value of both CW and pulsed lasers with outstanding precision of± 3 pm within a widest spectral range of 190-1100 nm, as well as
detecting FWHM of the analysed line.

WLMeter features another useful function “Lines Array” formonitoring and saving the central wavelength value during time.
In respect of wavelength resolution and accuracy the SHR is analternative to a long-focus monochromator (focal length of morethan 1000mm), equipped with an appropriate CCD. But unlike themonochromator, the SHR has no moving parts and provides real-timemeasurements without scanning of diffraction grating. The SHR isrigid, stable and accurate, ensures absolute reliability and has morereasonable price.
The SHR wavelength meter is not directly intended for analysisof plasma emission and other populated spectra (refer to theSPECIFICATIONS, line “Source linewidth requirement”). However, theSHR can be applied in analysis of narrow spectral intervals within thespectral width of the Echelle order – from 0.5 nm in the UV spectrum
range (190 nm) to 18nm in the IR (1200 nm), preliminarily separated
with a filter or a monochromator.
Laser beam is steered to the SHR entrance slit either via a multimodeoptical fiber fitted with a diffuse attenuator (both are included in thedelivery set) or directly, without any fibers.

Apart from wavelength measuring the SHR provides demonstrationof analysed spectra with resolution of 30000 (λ/Δλ<FWHM) whichconstitutes from 6pm for the UV spectrum range to 40pm for the NIR.
The SHR also ensures on-line monitoring of the above values andspectra in the process of tuning the analysed wavelength.
The software for the SHR, WLMeter, features a possibility to checkthe accuracy and correct it, if necessary, with any known wavelength
guided to the SHR: the laser with known wavelength (for example,
any He-Ne laser with wavelength of 632.816 nm) or any spectral linewith certain constant wavelength value).

Diffuse attenuator FA-3 Contains two diffuse quartz glasses andSMA‑905 connector. Axial adjustment of the fiber end relative todiffusive elements.

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SHR  HIGH-RESOLUTION WAVELENGTH METERSHR SPECIFICATIONS
Operating modes
Focal length, mm
Aperture ratio
Spectral range, nm
Wavelength detection accuracy, pm

CW & Pulsed
150
1:12190-1160± 3 at 190-1160 nm
30000(6 pm for λ=193 nm to 40 pm for λ =1200 nm – see pictures below)
125 cm-1(0.5 nm for λ =193 nm to 18 nm for λ = 1200 nm – see pictures below)
NoYes
less than 0.5 µW @632.8 nm for min. exposure time of 7.3 ms
No (only calibration correction)
7.3- Optical fiber 400 µm diameter, 1m length, SMA-905 connector- Diffuse attenuator FA-3 equipped with SMA-905
Full Speed USB
BNC-58 connector, positive polarity,
3-15 VDC amplitude, 5-20 µs pulse duration FWHM
113 x 190 x 72.5
2.5

Spectral resolution (λ/Δ λ FWHM)
Source linewidth requirements, not above
Mechanical moving parts
Line profile monitoring
Sensitivity
Calibration necessity
Min exposure time, ms
Optical interface
Interface
Requirements to external trigger pulse (for pulsed lasers)
Dimensions, mmWeight, kg

RESOLUTION & SOURCE LINEWIDTH REQUIREMENTSpectral resolution vs wavelength.

Source linewidth requirement, not above.
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SHR  HIGH-RESOLUTION WAVELENGTH METER

SPECTRA OF LASER SOURCES ACQUIRED WITH SHRSHR ensures high quality of measured spectral lines.

4000
3000

3500
2500

ADC Counts

3000

ADC Counts

2000

2500

2000

1500

1500
1000

1000

500
500

0

193.1

193.15193.2

193.25193.3
193.35
Wavelength, nm

193.4

193.450

193.5

ArF las, λ =193.3 nm can be measured either with MM optical fiber or without fiber .

975

977979981
Wavelength, nm

983

OPO spectrum λ =979.169 nm, FWHM=0.605 nm. Each small peak can be measured separately.

4000
2000

3500

3000

ADC Counts

ADC Counts

1500
2500

2000

1000
1500

1000

500

500

1063.51063.71063.91064.11064.3 1064.5
Wavelength, nm

1064.71064.91065.11063

Nd:YAG laser, free running mode, λ = 1064.159 nm, FWHM<0.04 nm.

1063,51064

1064,5Wavelength, nm

10651065,51066

Nd:YAG laser, Q-switched mode, λ = 1064.161 nm, FWHM=0.077 nm.

4000

4500

3500

4000

3000

3500

ADC Counts

ADC Counts30002500

2500

2000

2000
1500
1500
1000
1000
500
500
0699,5700

700,5
Wavelength, nm

701

888,5889

Ti:Sapphire tunable laser 700 nm.
株式会社 ルクスレイ

889,5890

890,5891
Wavelength, nm

891,5892

Ti:Sapphire tunable laser 890 nm.
URL: http://www.LxRay.jp E-mail: info@LxRay.jp

関西本社 〒663-8113 兵庫県西宮市甲子園口3-28-22
東京事務所 〒113-0033 東京都文京区本郷2-11-6 第1谷口ビル1F

TEL: 0798-31-0500, FAX: 0798-31-0505
TEL: 03-3868-0200, FAX: 03-6912-6394

SOLAR LS  +375 (17) 201 9940  INFO@SOLARLS.EU  WWW.SOLARLASER.COM