Wear diagnostics using low-energy RIBs
and their γ-ray imaging
A.Yoshida , T.Kambara
Industrial Application Team, RIKEN, Japan⚫ Activation method for wear test using
low-energy in-flight RI-beam separator⚫ γ-ray Inspection for Rotating Object (GIRO) system⚫ Irradiation test of space-use semiconductors
using “stable” HI-beams in atomsphere

IAEA tech.meeting Dec.,2018

1A.Yoshida, RIKENRIKEN RIBF : acceleration diagram
RIBF ( RI Beam Factory )Multistage accelerator complex( Injector )～6MeV/A( final-stage)

RILAC +RRC + fRC+IRC+SRCRILACII+RRC + fRC+IRC +SRC
RILAC +RRC+IRC+SRC
AVF+RRC+SRCGARIS Nh (Z=113)

Ind( middle- )fRC

Industrial use 

RILAC

academic use only

345 MeV/A

Heavy ions

BigRIPSRILAC II

Heavy ions
( Kr ～ U )

RRC

IRC

High-E exp.
(ZD/SHARAQ
SAMURAI )SRC～135 MeV/A (AVF)～ 60 MeV/A (RILAC)
Ind SEE test , BiologyInd
R I production

RIPS

Ind Industrial Application beam course

Ind R I B

StableR I – beam (RIB)

Charge Stripper Foil

AVF cyclo.

4～14 MeV/A(m/q < 4)

CRIB

Ind R I B Wear test

Light ions( p ～ Kr )IAEA tech.meeting Dec.,2018

2A.Yoshida, RIKEN

Wear test using RI tracer (History)On-line & Real-time wear test
using RI tracers
γ-ray detector

Activation method (History)➢ Direct-beam activation
Neutron (reactor)
1970’s～activation
layer density“Thick” “Low”

Light-Ion beams

Thin-Layer Activation (TLA)“Thin” “High”
at Karlsruhe
Engine partHip joint⚫ long-life RI
T1/2： month～year ＝ test period
RIs near the stable line⚫ concentrated at near surface
with high density

Activation methodinvestigated

IAEA tech.meeting Dec.,2018

constraints✗ produced RI depends on the material✗ strong Heat & Radiation damage✗ depth-profile determined by the reactionenergy and cross section
1990’s～➢ RI-beam implantation
Indirect activation

3A.Yoshida, RIKEN

Wear : R I B implantation (History)
1990’s～Beam Fragmentation

1995’s～

INFN-Napoli

MSU
N.Phys A353(1994)583
A299(1990)593

NIM B266(2008)2117, B197(2002)150
Z.Phys A356(1996)107, N.Phys A701(2002)235c@ Debrecen ATOMKI, Hungary
7Li (p,n) 7Be 20G Bq Ep=11MeV, 20μA, 2week

Beam :
14N, 20Ne
40MeV/u~100 p.nA@ Bochum Isotope-Lab, Germany
Radio-chemical separation → make cathode by press.
@ Napoli Tandem 2.4 MV
7Be 200M Bq cathode mounted in sputter ion source
Target :C 250μm

1995’s～

RI accelerator

HRIBF-ORNL ?
TRIUMF, ISOLDE ?

RIB : 7Be, 22Na
~ 3.7k (Bq/hr) / 0.1pμA
E(7Be) < 40 MeV/u
Range in C ~ 3000μm
Damage by primary beam

Recoil Angular Distribution

CNRS-CERI

Ultra-TLA (UTLA)

εtotal ～ 9x10^-4

7Be: N.Phys B143(1998)397
56Co: NIM B190(2002)831

56Fe(p,n) 56Co
Ep 23MeV
Tandem 3MV12C(3He,2α) 7Be
E(3He) 8.3 MeV/u~ 3.5 p.μA

RIB : 7Be~ 2 p pA = 1.2 x 10^7 cps = 6.5k (Bq/hr) NIM B266
~ 17 p pA = 1.1 x 10^8= 60k
Z.Phys A356

RIB : 7Be [30-40°]~ 3k (Bq/hr) / 0.6 pμA
Target :C 130μm

IAEA tech.meeting Dec.,2018

E(7Be) = 0 – 10 MeV
Range in P.E. ~ 20μm
Scattered 3He contaminantE(7Be) = 1 - 8 MeV pure beam, mono-energy
Range in steel ~ 10μmBeam line activation
4A.Yoshida, RIKEN

Wear : R I B implantation ( in-flight R I B separator )CRIB (Univ.Tokyo)

H.Yamaguchi et.al. NIM A589(2008)150-156

CNS RI Beam separator

Cryogenic H2 Gas-Target~ 6MeV/ukinematicalfocused n

AVF cyclotron(K=70)

cooledH2-gascirculation

RIB productionp (7Li , 7Be ) np (22Ne, 22Na) n05m

Cryogenic Gas-Target system
H2 gas (90K L=8cm max.1atm)
Vac. foil Havor 2.5μm φ2cm

RI Beamin Vacuum chamberEdegRotating
E degrader(Al foils)

target gas cellsample7Be Beam spot (ZnS)～φ 5mm

IAEA tech.meeting Dec.,2018

5A.Yoshida, RIKEN

Wear : R I B implantation ( in-flight R I B separator )R I B parameters (CRIB)
R I beam

Pulse-shaped Depth-profile (22Na)
F1slit (dP/P = ±1%)

7Be4+22Na11+

reactionp(7 Li, 7 Be )np(2 2 Ne , 2 2 Na)nEγ(branch)477(10%)1275(100%)
511(200%)

keV

4.16

3.67

0.39
80%

0.41
78%

M e V/ u
M e V/ u

7 Li3 +

2 2 Ne 1 0 + , 1 9 F9 +4.8 / 8.1

4.7 / 4.3

EnergyE fwhmPuritycontaminants*1 Beam spot x/yIntensity(2.3~3.7)x10^8
Activation rate
(126~200)
max.Range in Al

Primary beam
EnergyIntensity (avr.)

Production target
Pressurecirculation⊿E gas*2 ⊿E vac.foil

3.1x10^7
0.9~60~35
7Li2+
22Ne7+
5.7
6.1(1.7~2.0)~0.3
H2 @ 90K, L=8cm
760
400~30~20
5.9
5.4
1.4
2.5

u n itfoil #01 02 03 04 05 06 07 08 09 10 11 12 13 14 15 16 17 18 19 20(Si E 2umAvr)

32μ 28μ 24μ17μ 12μ 8μ5μ blank = EDeg(Al)m m fwh m
par t ic l/ se ckBq/ 1 h rμm
M e V/ upμATorrslm
W at tW at t

*1) when F1 mom. slit was dP/P=±3.1% (full acceptance)*2) at exit vacuum foil : Havar 2.5μm thick φ 2cm

NIM B317(2013)785-788, RIKEN Acc.PR 48(2015)240, 47(2014)171
CNS Ann.Rep (2013)76-77, (2012)65-66

Si E threshold
E → Range in Al (SRIM x 0.97)

Foil #01

Stacked-foil analysis

0203040506070809101112131415161718⚫ 7Be intensity is similar to RI-accelerator method
60 kBq/hr, 1.1x 10^8 pps (particle/sec)

19⚫ Constraint : heat loss at Gas-target

Imaging Plate data

Vacuum foil broken
Effective gas density reduction

IAEA tech.meeting Dec.,2018

6A.Yoshida, RIKEN

Wear : Possibility of Advanced wear analysis
7Be(Material hardness)

T 1/2
material
test period

2.6 year
Hard
Long run

53 daySoft
Short runPossible
Application

22Na
7Be

(hard)

γ-ray detector(soft)μm
Worn depth∝ operation time

Pulse-shaped
depth profile

22Na 7Be7Be 22Na

abrasionsurfaceroughness
cavitation

Different RIs forsame part withdifferent depth

Different RIs foreach rubbing partscrack

7Be 22Na
lubricant

Motor
Filterγ-ray det.

Wear-depth Gauge
RI powderWorn RI powder

Wear-Rate
difference

IAEA tech.meeting Dec.,2018

surfaceRest amount of RI

Bq

22Na

R I beam“direct measurement””meas. in low B.G. region”
Bq
7Be22Naμm

7A.Yoshida, RIKEN

Wear : RIB separator ( middle- vs low-energy )● Using middle-energy R I B separator(RIPS)✔ 22Na purity & intensity were better

RIPS✗ RIB energy was too highfor implantation at near surface→ depth profile became low-density

CRIB→ low-energy in-flight R I B-separator
is suitable for wear test

RIPS (middle energy)

RIB Separator
R I beamreaction

Energy⊿P/PPurity
contaminants
Beam spot size

Intensity
max.Range in Al

Primary beam
EnergyIntensity (avr.)

Production Target
Irradiation

CRIB (low energy)

7Be

22Na

7Be

22Na

Fragmentation

Fragmentationp(7Li,7Be)np(22Ne,22Na)n73.0

26.6

4.16

3.67

±3%
~ 78%

±3%100%

±3%
80%

±3%
78%
22Ne10+,19F9+

6Li3+, 8B5+,3H-

7Li3+~φ30~φ30~φ6.5~φ4.5~ 1x10^8~9500
13C6+
100

1.5x10^8~660
23Na11+63.4(2.3~3.7)x10^8

3.1x10^7

0.3~2.0~1.0
Be 6.0mm
Be 1.5mmin atmosphere~60~35
7Li2+
22Ne7+
5.7
6.1(1.7~2.0)~0.3
H2 @ 90K, L=8cm
in vaccumunit
MeV/umm fwhm
particl/sec
μm
MeV/upμA*) 7Be is not well studied yet

IAEA tech.meeting Dec.,2018

8A.Yoshida, RIKEN

γ- ray imaging for wear diagnostics
Gamma-ray Inspection for Rotating Object (GIRO)
turntableNaINaI
GIRO ver.1

T.Kambara et al, NIM A 797 (2015) 1-7
Nucl. Pyhs. News 26:4, (2016)26-29
Japanese patent app. No.6278330/2018

Difficulty, if the object is ..
• oil-closed system• high-viscosity oil

Rest activity

Bqoilraw data = “Sinogram”

parts

μm

Worn depth∝ operation time

similar to“PET” system

Can not distinguish “oil” vs. “parts”→ need help of “γ-ray imaging”

IAEA tech.meeting Dec.,2018

9A.Yoshida, RIKEN

γ-ray imaging : G I R O ( 3D demo )25 cm(system size is scalable)slitturntable

NaIslitNaI

Motor

3-layer sources

GIRO ver.2

NaI(Tl) □50 x 50 x t100mm
Pb-slit □80 x 120 x t30mm
Slit width 4mm

I.P. image

150 rpm, 24 hr measurement

IAEA tech.meeting Dec.,2018

Coin. condition

10A.Yoshida, RIKEN

γ-ray imaging : G I R O ( PET & SPECT demo )W slitadd W slit

22Na

Eγ (NaI)
22Na

137Cs
152Eu

W-slit w4mm t2mm

GIRO ver.3

PET mode2γ

SPECT mode analysys

22Na (268kBq)
22Na1γ137Cs (232kBq)

1γ
152Eu (166kBq)

137Cs

152Eu

150rpmγsource size φ2mm～φ3mm

obtained image size ～φ10mm

150 rpm,26 min measurement

IAEA tech.meeting Dec.,2018

11A.Yoshida, RIKEN

γ-ray imaging : Prospects of G I R O
GIRO

PET

Inspect. Object
Rotating / Periodic motion
stationaryNum. of detectors ✔ at least Twomany, depends on object sizeSystem size
✔ scalable & portablePrice✔ less expensive ～ 10 k $expensive ～ 1 M $✔ applicable low～high rotation
Measurement timea few 10 min～10 hr / picture ✔ a few min / picture
Position resolution
determined by slit width➢ GIRO is not suitable for living bodies,but is applicable for slow processes on continuously rotating object.
➢ eg.1) wear powders deposition
on “Sinogram coordinates”➢ eg.2) other possible rotating objects

metabolismof plant
IAEA tech.meeting Dec.,2018

12

centrifugal force
inside liquid vessel
A.Yoshida, RIKEN

Radiation resistance test of space use semiconductors➢ Single Event Effects (SEEs)
caused by High LET Cosmic Ray➢ Power devices
steep Elec. Field gradient➢ SEEs resistance > ~ 10 year
➢ Examine threshold-LET ofSEEs ( Upset, Latch-up, Rupture )➢ Beam Range 20~100 μm  3D-LSI, FPGAIAEA tech.meeting Dec.,2018

13A.Yoshida, RIKEN

SEEs test ： Irradiation beam line
E5A beam line
Beam passed throughMaterials[μm]
Au scat. foil
50
Kapton Vac. foil
75
Ion chamber Mylar 24
PL scintillator
100light cover Mylar 48
Air305 mm

Test sample
beam E meas.
Si detector (E)Ion chamber (Range)

Beam MeV/AAr 95
Beam Wobbler Magnets
Kr 70(Xe 39 )Beam Scatter Foil (Au)Spread(Au 18 )beam spot➢ Spread beam spot φ5cm
with flat distribution
Plastic Scinti. Ion chamberbeam Flux meas.

< 100 kcps

> 1 kcps➢ Irradiate in atmosphere➢ Beam Flux 10 ^ (1～5) cps / cm2➢ LET adjustable➢ Bragg-peak measurement
determines beam energy

Irradiation setup

Vac.foil
Kapton > 25μm

SampleRotation

LET adjustmentusing 12 Al-foils
5μm step, upto 2500 μm

Beam time record
2014 Kr (43hr)
2015 Kr (32hr) Ar (20hr)
2016 Kr (120hr) Ar (30hr)
2017 Kr (80hr)2018 Kr (48hr) Ar (20hr)

Flux distrib.
slide detectors
IAEA tech.meeting Dec.,201814A.Yoshida, RIKEN

SEEs test : Beam impurity by nuclear reactions
84Kr 70MeV/u (in Vac.)E [MeV/u]

Meas. by SSD
Al EDeg [μm]E → LET converted

LET in Si

Al EDeg [μm]X 1/100

26 %

12 %

2.8 %

0.8 %

1.3 % 1.1 % = E fwhm

1.1 %

1.7 % LET fwhm 5.4 %5.6 %maxLET= 41

Ebeam
in Vac.

EDeg = 586μm (Al)

Nuclear Reactions: measured vs. simulation

E : PhiTs

Radio-chemical analysis :irradiate Si , Acryl -> Eγ analysis
simulation : PhiTs code

Beam (Kr)Frag. (Br~Zn)
Trans. (Rb~Mo)
Light (Li~O)
Light (Ne~P)
LET : PhiTs

counts / source

Beam + C

Beam84Kr

Light
Light

Beam

contaminants
primary beam

≲1%

Frag.
Trans.

T.Kambara (NSREC2018 )IAEA tech.meeting Dec.,2018

15

A.Yoshida, RIKEN

Summary⚫ Activation method for wear test using low-energy in-flight RIB separator••

Intense RIB of 7Be, 22Na ( ~3x10^8, ~3x10^7 pps) are available.
Pulse-shaped depth-profile implantation is possible.

➢ 2 trial use, a collaboration research with 2 companies.

No new offer now …

⚫ γ-ray Inspection for Rotating Object (GIRO) system•

Simple setup, less expensive, size scalability•

Fundamental properties were investigated ; 3D-, SPECT-mode➢ next ) portable-size system using waveform digitizer.
try more practical demonstrations to develop value-added wear analysis.

⚫ SEEs test of space-use semiconductors using stable HI-beams•

Irradiation in atmosphere, contaminant nuclei ≲ 1%•

Continuous users : 3 ~ 4 companies in Japan.

➢ Request) higher-LET test using Xe, Au

IAEA tech.meeting Dec.,201816

A.Yoshida, RIKEN

Thank you for your attention.

A.Yoshida , T.Kambara
Industrial Application Team, RIKEN, Japan
http://ribf.riken.jp/sisetu-kyoyo/

IAEA tech.meeting Dec.,201817

A.Yoshida, RIKEN