Hiroshi DAIMON
Emeritus Professor, Nara Institute of Science and Technology[Present Position]
Fellow at Toyota Physical and Chemical Research Institute[Research Field]
Surface Science, Synchrotron Radiation Photoelectron Spectroscopy[Date of Birth]
July 22, 1953
[Sex]
Male
[Nationality]
Japan[Graduation and Degree]
Mar. 1976 Faculty of Science (chemistry). The University of Tokyo
Mar. 1978 Graduate School of Science, Master Course, The University of Tokyo
Mar. 1983 Doctor of Science, The University of Tokyo(Thesis title: Experimental and Theoretical Studies of Elastic Electron Scattering at
Intermediate Energies and Photoemission Studies of Reactions on Semiconductor surfaces
Using Synchrotron Radiation)[Professional Career]Mar. 1978 - Mar. 1983
Mar. 1983 - Mar. 1990
Mar. 1990 - Mar. 1997
[Apr. 1991 - Mar. 1992
[Aug. 1994 - May. 1995
Apr. 1997 - Mar. 2019
Apr. 2019 – Present

Educational Staff, Institute for Solid State Physics (ISSP), The
University of Tokyo.
Research Associate, Faculty of Science, The University of Tokyo.
Associate Professor, Faculty of Engineering Science, Osaka
University.
Adjunct Associate Professor, Institute for Solid State Physics (ISSP),The University of Tokyo,] .
Visiting Scientist at Lawrence Berkeley National Laboratory,(U.S.A.)].
Professor, Nara Institute of Science and Technology (NAIST).
Fellow at Toyota Physical and Chemical Research Institute[Membership]
The Japan Society of Vacuum and Surface Science (president), The Physical Society of Japan, The
Japan Society of Applied Physics, The Japanese Society for Synchrotron Radiation Research,
American Physical Society

3.

1.

Research overview Daimon

1976.4 – 1978.3 Master’s thesis at Prof. Kozo Kuchitsu laboratory, Departmentof Chemistry, Faculty of Science, The University of Tokyo.
Theme: Measurement and theoretical analysis of differential cross sections of
low-energy electrons elastically scattered by gas molecules (O 2 , N 2 , CCl 4 , As 4 ).
Prof. Kuchitsu

Publication list (2), (4), (9)EffectofIntramolecular

DoubleScatteringandpolarization etc. to elastic differential cross section (EDCS)
of low-energy electrons (100 – 500 eV) scattered by gas
molecules (O 2 , N 2 , CCl 4 , As 4 ) were analyzed theoreticallyandexperimentally.

The

independent

atom

model

considering double scattering and polarization effects wasfound to be enough to reproduce the experimental data.
(4) "Measurement of Differential Cross Sections of Low-Energy
Electrons Elastically Scattered by Gas Molecules. III. Effects ofIntramolecular Double Scattering as Observed inthe Scattering of 70400 eV Electrons by Carbon Tetrachloride", H. Daimon, T. Kondou
and K. Kuchitsu, J. Phys. Soc. Jpn., 52 (1) 84-89 (1983).

2.

Fig. 1 EDCS from CCl4

1978.3 – 1983.3 PhD thesis at Prof. Yoshitada Murata laboratory, Institute for
Solid State Physics (ISSP), The University of Tokyo.
Theme: Photoelectron spectroscopy using synchrotron radiation. Photoelectron
diffraction. Resonant photoemission.
Publication list (1), (3), (5), (6), (7), (8), (10), (11), (12), (14), (15), (16),Prof. Murata(19)
At that time the world first dedicatedsynchrotron radiation facility INS-SOR wasconstructed. Hence we started photoelectron
spectroscopy using synchrotron radiation
especially photoelectron diffraction.
(16) "Photoelectron Diffraction from Ni(001)c(2x2)S(2p)", H. Daimon, H. Ito, S. Shin and Y. Murata, J.
Phys. Soc. Jpn., 53 (10) 3488-3497 (1984) .

Fig. 2

Photoelectron diffraction patternfrom Ni(001) c(2x2)-S.

3.

1983.3 – 1990.3 Research Associate at Prof. Shozo Ino laboratory, Faculty of
Science, The University of Tokyo
Theme: RHEED study of surface superstructure, Invension of display-typespherical mirror analyzer.
Prof. Ino

Publication list (13), (17), (18), (19), (20), (21), (22), (23), (24), (25), (26),(27), (29), (30), (31), (32), (33), (34), (35), (37), (38), (43), (49), (52), (74)Prof. Ino is an inventor of RHEED. Hence I studied
many surface using RHEED. Figure 3 is a new 7×7
structure called δ-7×7 structure.
(18) "Study of the Si(111)7x7 Surface Structure by Alkali-metal
Adsorption", H. Daimon and S. Ino, Surf. Sci., 164 (1) 320-326(1985).
Fig. 3Si(111) δ-7×7-Li RHEED

I invented a new Two-dimensional photoelectron
Outer Sphere

spectrometer Display-type Spherical Mirror Analyzer(DIANA) (Fig.4), which can display wide angle ±60°
cone (≈ 1π sr) angular distribution at once without
distortion.
(22) "New display-type analyzer for the energy and the angular
distribution of charged particles", H. Daimon, Rev. Sci. Instrum,59 (4) 545-549 (1988). [Erratum: Rev. Sci. Instrum. 61 (1) 205(1990).]

4.

Guard Rings

SR

Samplee-Gun

Obstacle Rings

Main Grid

ScreenＭＣＰ

Aperture

RetardGrid

10cm

Fig. 4

DIANA

1990.3 – 1997.3 Associate Professor at Prof. Shigemasa Suga laboratory,
Faculty of Engineering Science, Osaka University.
Theme: Photoelectron spectroscopy using synchrotron radiation.
Publication list (28), (36), (39), (40), (41), (42), (44), (45), (46), (47), (48),(50), (51), (53), (54), (55), (56), (57), (58), (59), (60), (61), (62), (63), (64),(65), (66), (67), (69), (70), (71), (72), (73), (79), (81), (82), (83), (84), (85),(86), (87), (88), (91), (94), (95), (96), (97), (115)

Prof. Sugau

Rotation of the forward focusing peaks in aphotoelectron diffraction pattern excited bycircularly polarized light was found for the firsttime. The reason was explained by the transfer ofangular momentum from the circularly polarized
light to the photoelectron. This is the first direct
observation of orbital angular momentum.
(42) "Strong circular Dichroism in Photoelectron
Diffraction from Non-chiral, Non-magnetic Material--Direct Observation of Rotational Motion of Electrons", H.
Daimon, T. Nakatani, S. Imada, S. Suga, Y. Kagoshima and
T. Miyahara, Jpn. J. Appl. Phys., 32 Part 2 (10A) L1480L1483 (1993).

Fig. 5

Rotation of forward focusing peak

When we observed valence band of Graphite by DIANA
using linearly polarized light, the equi-energy cross sectionof π band (Fig. 6) showed two-fold symmetry althoughgraphite is six-fold. This lowered symmetry was explainedby ADAO (angular distribution from atomic orbital). The
observed pattern exists only in the first Brillouin zone. Thiseffect was explained by the structure factor inphotoemission. Using these effect the atomic
orbital in the initial state became to be studied.
(55) "Structure factor in photoemission from valence band", H.
Daimon, S. Imada, H. Nishimoto, and S. Suga, J. Electron
Spectrosc. Relat. Phenom. 76 487-492 (1995).

Fig. 6

π band of graphite observedby DIANA and horizontally linearlypolarized light

Hologram
Si 2p photoelectron diffraction pattern（ａ） 350 eV（ｂ）650 eV

The technique of photoelectron holography started
in 1988. Fig. 7 shows our study of photoelectron
holography analysis of Si crystal. The holograms in upper

Reconstructed image

panel of Fig. 7 were taken by using DIANA. The

reconstructed atomic image is in good agreement withactual structure of Si crystal.
(67)"Photoelectron holography of the Si(001) surface",
T. Nakatani, H. Nishimoto, H. Daimon, S. Suga, H. Namba, T.
Ohta, Y. Kagoshima, T. Miyahara, J. Synchrotron Rad. 3 239244 (1996).
Fig. 7

Photoelectron holography
analysis of Si crystal.

5.

1994.8 – 1995.5 Visiting Scientist at Prof. Charles S, Fadley laboratory,
Lawrence Berkeley National Laboratory, Berkeley, California, U.S.A.
Theme: Photoelectron spectroscopy using synchrotron radiation.
Prof. Fadley

Publication list (68), (75), (76), (77), (78), (80), (92), (93)At that time the world first third generation synchrotron
facility ALS (Advanced Light Source) was constructed in
Lawrence Berkeley National Laboratory in Carifornia,
USA. I stayed at Chuck Fadley’s laboratory for 10 months.
Rotation of FFP in Fig. 5 was confirmed in single scatteringsystem of W(110)-O surface.
(80) “Circular Dichroism in Core-Level Emission from O/W(110):
Experiment and theory”, H. Daimon, R.X. Ynzunza, F.J. Palomares,
E.D. Tober, Z.X. Wang, A.P. Kaduwela, M.A. Van Hove, and C.S.
Fadley, Phys. Rev. B, 58, 9662-9665 (1998).

6.

Fig. 6

Rotation of FFP

by Circularly Polarized Light.

1997.4 – 2019.3 Professor, Nara Institute of
Science and Technology (NAIST)..
Theme:

Photoelectron

spectroscopy

usingProf. Daimon

synchrotron radiation.


Assoc.Prof. Hattori

Assist. Prof. Takeda

Publication list (89), (98) – (249)[except (115), (248)]

A technique of stereophotography
was invented, with which we canAssist. Prof. Matsui

Assist. Prof. Taguchi Assist. Prof. Matsuda

view the 3D atomic arrangement directlywith eyes. The angular momentum of thecircularly

polarized

photon(±1)

istransferred to the photoelectron. The
rotation angle of FFP is inversely
proportional to the distance between theemitter and the scatterer atoms. This
relation is the same as parallax which is
the origin when we recognize threedimensionalarrangement.

Hence

stereophotograph of atomic arrangement

Fig. 7

was realized.

arrangement.

Stereophotographs of atomic

(98) “Stereoscopic microscopy of atomic arrangement by circularly Polarized -Light Photoelectron
Diffraction”, H. Daimon, Phys. Rev. Lett., 86 2034-2037 (2001).

A new high-energy-resolution

Lens system

WAAEL

R4000

DELMA screen

3D (θx θy Ek) highenergy-resolution date

two-dimensional
photoelectron energy analyzer
DELMA(Display-type

ellipsoidal mesh analyzer)184)

Deflector

試料

DELMA screen
R4000

DELMA screen
Wide solid angle(±50°×±50 °) Angular
distribution, and magnified
PEEM image (Δx= 20 μm)(Fig. 8) was invented. DELMAθx

has microscope function withmagnification ratio of about
100. DELMA consists of a

Fig. 8DELMA (Display-type ellipsoidal mesh analyzer)

wide-acceptance-angle electrostatic lens (WAAEL), a transfer lens system, and CHA (VG
Scienta R4000). WAAEL is a newly invented objective lens120) which can accept wide anglesof ±50° cone with reducing spherical aberrations to zero. This DELMA system can measurehigh-energy-resolution 2D angular distribution by a deflector-scanning method. Here the±50° cone 2D angular distribution formed at the detector plane of DELMA, which is the
input plane of the CHA, is scanned using electrostatic deflectors, and many 1D(±12.5°×±0.5°) patterns obtained by the CHA are combined to construct the 2D pattern.
Although DELMA solved DIANA’s low-energy-resolution problem, it has some demerit ofcomplicated structure, large size, and relative high cost. Hence we are developing a new
analyzer Compact DELMA which can display high-energy-resolved wide-angular-range
pattern at once with very simple structure.
(120)“Approach for simultaneous measurement of two-dimensional angular distribution of charged
par-ticles: Spherical aberration correction using an ellipsoidal mesh”, H. Matsuda, H. Daimon, M. Kato, M.
Kudo, Phys. Rev. E 71, (6) 066503-1-8 (2005)(184)“Development of Display-Type Ellipsoidal Mesh Analyzer”, K. Goto, H. Matsuda, M.
Hashimoto, H. Nojiri, C. Sakai, F. Matsui , H. Daimon, L. Tóth, T. Matsushita, e-J. Surf. Sci. Nanotech. 9,311-314 (2011)

3D local atomic structure around specificactive-site atom plays crucial role in functional
materials, but it has not been able to be analyzed
by a standard structure analysis method of x-ray
diffraction (XRD) because this kind of active
site has no translational symmetry. Recently
several atomic-resolution holographies havebeen developed in Japan. We started a new

Fig. 9 Photoelectron
holography on K in graphite.

project "3D Active-Site Science" of JSPS
Grant-in-Aid for Scientific Research on Innovative Areas for five years

(2015 – 2019). One result is shown in Fig. 9, which is a photoelectron
holography reconstructed image on K intercalated graphite superconducting
material.
(225) “Photoelectron Holographic Atomic Arrangement Imaging of Cleaved Bimetal-intercalated Graphite
Superconductor Surface”, Fumihiko Matsui, Ritsuko Eguchi, Saki Nishiyama, Masanari Izumi, Eri Uesugi,
Hidenori Goto, Tomohiro Matsushita,, Kenji Sugita, Hiroshi Daimon, Yuji Hamamoto, Ikutaro Hamada,
Yoshitada Morikawa, Yoshihiro Kubozono, Scientific Reports 6, 36258 (2016). doi:10.1038/srep36258

Publication list (Refereed papers)
Hiroshi Daimon(1)"Ni on Si: Interfacial Compound Formation and Electronic Structure", K. L. I. Kobayashi, S. Sugaki, A.
Ishizaka, Y. Shiraki, H. Daimon and Y. Murata, Phys. Rev. B, 25 (2) 1377-1380 (1982).

(2)"Measurement of Differential Cross Sections of Low-Energy Electrons Elastically Scattered by Gas Molecules. II. Scattering of 200-500 eV Electrons by Molecular Oxygen", H. Daimon, S. Hayashi, T. Kondou
and K. Kuchitsu, J. Phys. Soc. Jpn.., 51 (8) 2641-2649 (1982).

(3)"Ion Oxidation of Si(111)", H. Daimon and Y. Murata, Jpn. J. Appl. Phys., 21 (11) L718-720 (1982).

(4)"Measurement of Differential Cross Sections of Low-Energy Electrons Elastically Scattered by Gas Molecules. III. Effects of Intramolecular Double Scattering as Observed inthe Scattering of 70-400 eV Electrons
by Carbon Tetrachloride", H. Daimon, T. Kondou and K. Kuchitsu, J. Phys. Soc. Jpn., 52 (1) 84-89 (1983).

(5)"Initial Stage of Sputtering in Silicon Oxide", T. Hattori, Y. Hisajima, H. Saito, T. Suzuki, H. Daimon, Y.
Murata and M. Tsukada, Appl. Phys. Lett., 42 (3) 244-246 (1983).

(6)"Evidence for Interference Between Direct and Inner-Shell-Deexcitation Photoemission in Semiconductors",
K. L. I. Kobayashi, H. Daimon, N. Watanabe, M. Taniguchi, S. Suga, H. Nakashima and Y. Murata, Physica, 117B & 118B 57-59 (1983).

(7)"Systematic Study of 3d Transition Metal-Silicon Interfaces by Photoemission", Y. Shiraki, K. L. I. Kobayashi, H. Daimon, A. Ishizaka, S. Sugaki and Y. Murata, Physica, 117B & 118B 843-845 (1983).

(8)"Resonant Photoemission from Si", K. L. I. Kobayashi, H. Daimon and Y. Murata, Phys. Rev. Lett., 50 (21)1701-1704 (1983).

(9)"Measurement of Differential Cross Sections of Low-Energy Electrons Elastically Scattered by Gas Molecules: IV. Effect of Intramolecular Double Scattering as Observed in the Scattering of 100 and 500 eV Electrons by As４", H. Daimon, T. Kondou and K. Kuchitsu , J. Phys. B: At. Mol. Phys., 16 3453-3464 (1983).

(10)"Valence Band Structure of Hydrogenated Amorphous Silicon-Carbon Alloys", Y. Katayama, T. Shimada,T. Uda, K.L.I. Kobayashi, C. G. Jiang, H. Daimon and Y. Murata, Journal of Non-crystalline Solids, 59 &60 Part I 561-564 (1983).

(11)"Resonant Photoemission from Al-GaAs(110) Interfaces", K. L. I. Kobayashi, N. Watanabe, H. Nakashima,
M. Kubota, H. Daimon and Y. Murata, Phys. Rev. Lett., 52 (2) 160-163 (1984).

(12)"Comment on "Resonant Photoemission from Si", K. L. I. Kobayashi, H. Daimon and Y. Murata, Phys. Rev.
Lett., 52 (17) 1568-1569 (1984) .

(13)"New Models for the 7x7, 5x5, 2x8 Structures on Si(111) and Ge(111) Surfaces", S. Ino, H. Daimon and T.
Hanada, J. Phys. Soc. Jpn., 53 (6) 1911-1914 (1984) .

(14)"Resonant Photoemission in Open and Closed 3d Shell Systems: NiｘSi(x=3, 2.5, 2, 1.5, 1, and 0.5)", H.
Daimon, A. Ishizaka, K. L. I. Kobayashi and Y. Murata, J. Phys. Soc. Jpn., 53 (6) 2130-2136 (1984) .
1

(15)

"Performance of a New Plane-Grating Grazing-Incidence UHV Monochromator", S. Suga, M. Taniguchi, S.
Shin. H. Sakamoto, M. Yamamoto, M. Seki,Y. Murata and H. Daimon, Nucl. Instr. and Meth. (Nuclear Instruments and Methods in Physics Research) 222 80-84 (1984).

(16)"Photoelectron Diffraction from Ni(001)c(2x2)-S(2p)", H. Daimon, H. Ito, S. Shin and Y. Murata, J. Phys.
Soc. Jpn., 53 (10) 3488-3497 (1984) .

(17)"Chemical Analysis of Surfaces by Total-Reflection-Angle X-ray Spectroscopy in RHEED Experiments(RHEED-TRAXS)", S. Hasegawa, S. Ino, Y. Yamamoto and H. Daimon, Japn. J. Appl. Phys., 24 (6) L387390 (1985).

(18)"Study of the Si(111)7x7 Surface Structure by Alkali-metal Adsorption", H. Daimon and S. Ino, Surf. Sci.,
164 (1) 320-326 (1985).

(19)"Electronic Structures of CuFeS２ and CuAl０．９Fe０．１S２ Studied by Photoelectron Spectroscopy: Role of
Fe 3d Electron States", M. Fujisawa, M. Taniguchi, S. Shin, H. Daimon, H. Sakamoto, K. Sato and S.
Suga, Proc. 18th Int. Conf. on the Physics of Semiconductors (World Scientific, ed. by O. Engstrom 1987,
Singapore) 1137-1140.

(20)"A Study of Adsorption and Desorption Processes of Ag on Si(111) Surface by means of RHEEDTRAXS(Total ReflectionAngle X-ray Spectroscopy in RHEED experiments)", S. Hasegawa, H. Daimon
and S. Ino, Surf. Sci,. 186 138-162 (1987).

(21)"Si(111)7×7 and Si(111) 3 × 3 -Al Surface Structure Analysis by Ion-Induced Auger Electron Spectroscopy", T. Aizawa, T. Tsuno, H. Daimon and S. Ino, Phys. Rev. B, 36 (17) 9107-9114 (1987).

(22)"New display-type analyzer for the energy and the angular distribution of charged particles", H. Daimon,
Rev. Sci. Instrum, 59 (4) 545-549 (1988). [Erratum: Rev. Sci. Instrum. 61 (1) 205 (1990).](23)"新しい２次元表示型球面鏡分析器の解析", 大門寛、井野正三, 真空, 31 (12) 954-959 (1988).

(24)"Soft x-ray beamline (10-1000 eV) with a plane grating monochromator for surface studies", H. Namba, H.
Daimon, Y. Idei, N. Kosugi, H. Kuroda, M. Taniguchi, S. Suga, Y. Murata, K. Ueyama and T. Miyahara,
Rev. Sci. Instrum., 60 (7) 1909-1912 (1989).

(25)"Study of the Si(111)

3 × 3 -Al Surface Structure by Kinetic Energy Dependence of Polar Angle Pho-toelectron Diffraction", H. Daimon, S. Nagano, T. Hanada, S. Ino, S. Suga and Y. Murata, Surf. Sci., 221(2/3) 244-252 (1989).
(26)"One Dimensional Circular Diffraction Patterns", H. Daimon and S. Ino, Surf. Sci., 222 (1) 274-282 (1989).

(27)"Improvement of the spherical mirror analyzer", H. Daimon and S. Ino, Rev. Sci. Instrum., 61 (1) 57-60(1990).

(28)"Vacuum Ultraviolet Reflectance and Photoemission Study of Metal-Insulator Phase Transition in VO２, V６
O１３ and V２O３", S. Shin, S. Suga, M. Taniguchi. M. Fujisawa, H. Kanzaki, A. Fujimori, H. Daimon, Y.
2

Ueda, K. Kosuge and S. Kachi, Phys. Rev. B, 41 4993-5009 (1990).
(29)"ESDIAD with a new display-type spherical mirror analyzer", H. Daimon and S. Ino, Proc. the IVC11/ICSS-7 (Cologne, 1989); Vacuum, 41 (1-3) 215-216 (1990).

(30)"A Study of Si(111)5×2-Au Structures by Li Adsorption and Their Co-adsorbed Superstructures", H. Daimon, C. I. Chung, S. Ino and Y. Watanabe, Surf. Sci., 235 (2/3) 142-155 (1990).

(31)"Change of Surface Electronic States Induced by Li and K Adsorption on the Si(111)7×7 Structure", Y. Tezuka, H. Daimon and S. Ino, Jpn. J. Appl. Phys., 29 (9) 1773-1777 (1990).

(32)"Two Dimensional Photoelectron Diffraction Pattern by Display-type Spherical Mirror Analyzer", H. Daimon, Y. Tezuka, A. Otaka, N. Kanada, S. K. Lee, S. Ino, H. Namba and H. Kuroda, Proc. XXVI Yamada
Conference on Surface as a New Material (Osaka 1990), Surf. Sci., 242 288-293 (1991).

(33)"Photoelectron Diffraction Patterns by Display-Type Spherical Mirror Analyzer", H. Daimon, Y. Tezuka, N.
Kanada, A. Otaka, S. K. Lee, S. Ino, H. Namba and H. Kuroda, Proc. 3rd Int. Conf. on the Structure of Surfaces, (Milwaukee 1990), Springer Series in Surface Science, 24 "The Structure of Surfaces III" ed.
S.Y.Tong et al. 96-101 (Springer, Berlin 1991).

(34)"Direct Observation of Surface Structures by a High Resolution UHV-SEM", S. Ino, A. Endo and H. Daimon, Proc. 3rd Int.Conf. on the Structure of Surfaces, (Milwaukee 1990), Springer Series in Surf. Sci., 24"The Structure of Surfaces III" ed. S.Y.Tong et al. 168-173 (Springer, Berlin 1991).

(35)"Catalytic Effect of Metals (Sn, Ag, and Pb) on Homoepitaxial Growth of Ge and Si", K. Fukutani, H. Daimon and S. Ino, Proc. 3rd Int.Conf. on the Structure of Surfaces, (Milwaukee 1990), Springer Series in Surf.
Sci., 24 "The Structure of Surfaces III" ed. S.Y.Tong et al. 615-622 (Springer, Berlin 1991).

(36)"Electronic Structures of Mn２Sb and MnAlGe: Photoemission and Inverse Photoemission Spectroscopy",
Kimura, S. Suga, H. Matsubara, T. Matsushita, Y. Saitoh, H. Daimon, T. Kaneko and T. Kanomata, Solid
State Communications, 81 (8) 707-710 (1992).

(37)"Glancing Angle Dependence of the X-ray Emission Measured at Total Reflection Angle X-ray Spectroscopy (TRAXS) Condition During RHEED Observation", T. Yamanaka, T. Hanada, S. Ino and H. Daimon,
Jpn. J. Appl. Phys. Lett,. 31 L1503-L1505 (1992).

(38)"Reflection High-Energy Electron Diffraction Study of the Growth of Ge on the Ge(111) Surface", K. Fukutani, H. Daimon and S. Ino, Jpn. J. Appl. Phys., 31 Part I, (19) 3429-3435 (1992).

(39)"Resonant Photoemission Spectroscopy of Mn２As, Cr２As and Fe２As", T. Matsushita, A. Kimura, H. Daimon, S. Suga, T. Kanomata and T. Kaneko, Jpn. J. Appl. Phys., 31 L1767-1770 (1992).

(40)"Simultaneous angle-resolved measurement of the band structure of single-crystal graphite by an improved
two-dimensional display analyzer", H. Nishimoto, H. Daimon, S. Suga, Y. Tezuka, S. Ino, I. kato, F. Zenitani, and H. Soezima, Rev. Sci. Instrum., 64 2857-2862 (1993).

(41)"Photoemission and Absorption Spectroscopy of Mn２Sb, MnAlGe, Mn２As, Cr２As and Fe２As", Kimura, S.
Suga, T. Matsushita, H. Daimon, T. Kaneko and T. Kanomata, J. Phys. Soc. Jpn., 62 1624-1633 (1993).

3

(42) "Strong circular Dichroism in Photoelectron Diffraction from Non-chiral, Non-magnetic Material---Direct Observation of Rotational Motion of Electrons", H. Daimon, T. Nakatani, S. Imada, S. Suga, Y. Kagoshima and
T. Miyahara, Jpn. J. Appl. Phys., 32 Part 2 (10A) L1480-L1483 (1993).
(43)"Development of an Ultrahigh Vacuum High Resolution Scanning Transmission Electron Microscope", Y.
Harada, T. Tomita, Y. Kokubo, H. Daimon and Shozo Ino, J. Electron Microsc., 42 294-304 (1993).

(44)"Electronic Structure of Ni Intercalated TiS２ Probed by Angle Resolved and 2p Core Resonance Photoemission as well as by 2p Core Absorption Spectroscopy", Kimura, S. Suga, T. Matsushita, S. Imada, N. Shino, Y. Saitoh, H. Shigeoka, H. Daimon, T. Kinoshita, A. Kakizaki, S.-J. Oh, H. Negishi and M. Inoue, Proc.
9th Int. Conf. Ternary and Multinary Compounds, (Yokohama, Aug. 1993), Jpn. J. Appl. Phys., 32 Suppl.
32-3 255-257 (1993).

(45)“Electron Stimulated Desorption (ESD) of O２/Si(111) Surface", K. Sakamoto, K. Nakatsuji, H. Daimon, T.
Yonezawa, and S. Suga, Surf. Sci., 306 93-98 (1994).

(46)"Photon Stimulated Desorption Mechanism of Cl＋ ions from Cl/Si(111) Surface", T. Yonezawa, H. Daimon,
K. Nakatsuji, K. Sakamoto, and S. Suga, Proc. 第15回ドライプロセスシンポジウム (東京, Nov. 1993),
Jpn.J.Appl.Phys., 33 2248-2251 (1994).

(47)"Photoemission Study of the Si(111)3×1-K Surface", K. Sakamoto, T. Okuda, H. Nishimoto, H. Daimon, S.
Suga, T. Kinoshita, and A. Kakizaki, Phys. Rev. B, 50 1725-1732 (1994).

(48)"Adsorption and desorption process of Cl on Si(111)7×7", T. Yonezawa, H. Daimon, K. Nakatsuji, K. Sakamoto, and S. Suga, Proc. 1st Int. Conf. Photo-Excited Processes and Applications, (Sendai, Oct. 1993),
Appl. Surf. Sci., 79/80 95-99 (1994).

(49)"Study of the Si(111)7×7 surface by RHEED rocking curve analysis", T. Hanada, S. Ino and H. Daimon,
Surf. Sci., 313 143-154 (1994).

(50)"Surface and Bulk Core Level Shifts of the Si(111)3×1-Na and Si(111)δ7×7-Na Surfaces", T. Okuda, H.
Shigeoka, H. Daimon, S. Suga, T. Kinoshita, and Kakizaki, Surf. Sci., 321 105-110 (1994).

(51)"Circularly polarized light-induced dichroism in photoelectron diffraction observed with display-type spherical mirror analyzer", H. Daimon, T. Nakatani, S. Imada, S. Suga, Y. Kagoshima and T. Miyahara, Rev. Sci.
Instrum. 66 (2) 1510-1512 (1995 Feb).

(52)"Rocking-curve analysis of reflection high-energy electron diffraction from the Si(111)-( 3 × 3 )R30゜-Al,-Ga, and –in surfaces", T. Hanada, H. Daimon, and S. Ino, Phys. Rev. B 51 13320-13325 (1995).

(53)“Spin-resolved 3p and 3s core-level photoemission spectra of ferromagnetic nickel”, Y. Saitoh, T. Matsushita, S. Imada, H. Daimon, S. Suga, J. Fujii, K. Shimada, A. Kakizaki, K. Ono, M. Fujisawa, T. Kinoshita, and
T. Ishii, Phys. Rev. B 52 R11549-R11552 (1995).

(54)"Circular dichroism from non-chiral and non-magnetic materials observed with display-type spherical mirror
analyzer", H. Daimon, T. Nakatani, S. Imada, and S. Suga, J. Electron Spectrosc. Relat. Phenom. 76 55-62(1995).

4

(55)"Structure factor in photoemission from valence band", H. Daimon, S. Imada, H. Nishimoto, and S. Suga, J.
Electron Spectrosc. Relat. Phenom. 76 487-492 (1995).

(56)"Two-dimensional angular distribution of photoelectrons of single crystal graphite", H. Nishimoto, T. Nakatani, T. Matsushita, S. Imada, H. Daimon and S. Suga, J. Phys.: Condens. Matter 8 2715-2732 (1996).

(57)"Unusual two-dimensional angular distribution of photoelectrons of Kish graphite and 1T-TaS2", H.
Nishimoto, T. Okuda, T. Nakatani, H. Daimon, T. Matsushita, S. Imada, S. Suga, H. Namba, T. Ohta, Y.
Kagoshima, T. Miyahara, Solid State Commun. 98 (7) 671-675 (1996).

(58)"Electron- and Photon-Stimulated Desorption of the NO/Si(111) surface", K. Sakamoto, K. Nakatsuji, H.
Daimon, T. Yonezawa, S. Suga, H. Namba and T. Ohta, Surf. Sci. 359 (147-1541996) .

(59)"Spin-resolved Core-level Photoemission Spectra of Ferromagnetic Nickel", Y. Saito, S. Suga, A. Kakizaki,
T. Matsushita, S. Imada, H. Daimon, K. Ono, M. Fujisawa, T. Kinoshita, T.Ishii, J.Fujii, and K.Shimada, J.
Electron Spectrosc. Relat. Phenom. 78 329-332 (1996).

(60)"Unusual photoelectron angular distribution of Kish graphite", H. Nishimoto, H. Daimon, S. Suga, S. Imada,T. Matsushita, T. Nakatani, H. Namba, T. Ohta, Y. Kagoshima, and T. Miyahara, J. Electron Spectrosc.
Relat. Phenom. 78 465-468 (1996).

(61)"Angle-resolved photoemission study of MxTiS2 (M=Mn, Fe, Co, Ni; x=1/3, 1/4)", T. Matsushita, S. Suga,
Y. Tanaka, H. Shigeoka, T. Nakatani, T. Okuda, T. Terauchi, T. Shishidou, A. Kimura, H. Daimon, S.-J Oh,
A. Kakizaki, T. Kinoshita, H. Negishi, and M. Inoue, J. Electron Spectrosc. Relat. Phenom. 78 477-480(1996) .

(62)"Two-dimensional angular distribution of photoemission spectra from the valence band of 1T-TaS2", T.
Matsushita, H. Nishimoto, T. Okuda, T. Nakatani, H. Daimon, S. Suga,H. Namba, T. Ohta, Y. Kagoshima,
and T. Miyahara, J. Electron Spectrosc. Relat. Phenom. 78 489-492 (1996).

(63)"Photon-Stimulated Desorption study of the NO/Si(111) surface", K. Sakamoto, K. Nakatsuji, H. Daimon, T.
Yonezawa, S. Suga, H. Namba and T. Ohta, J. Electron Spectrosc. Relat. Phenom. 80 125-128 (1996).

(64)"Surface core level shifts of the Au adsorbed Si(111) reconstructed surfaces", T. Okuda, H. Daimon, H. Shigeoka, S. Suga, T. Kinoshita, and Kakizaki, J. Electron Spectrosc. Relat. Phenom. 80 229-232 (1996).

(65)"Adsorption and desorption processes of Cl on Si(100) Surface", K. Nakatsuji, K. Matsuda, T. Yonezawa, H.
Daimon, and S. Suga, Surf. Sci. 363 321-325 (1996).

(66)"Energy barrier for ion desorption due to discrete surface dipoles", T. Yonezawa, H. Daimon, K. Nakatsuji,
K. Sakamoto, and S. Suga, Surf. Sci. 365 489-494 (1996).

(67)"Photoelectron holography of the Si(001) surface", T. Nakatani, H. Nishimoto, H. Daimon, S. Suga, H.
Namba, T. Ohta, Y. Kagoshima, T. Miyahara, J. Synchrotron Rad. 3 239-244 (1996).

(68)“Polarization measurement and vertical aperture optimization for obtaining circularly polarized bend-magnet
radiation”, J.B. Kortright, M.E. Rice, Z. Hussain, H.A. Padmore, A.T. Young. A. Adamson, W.R.A. Huff,
E.J. Moler, S.A. Kellar, R.X. Ynzunza, F.J. Palomares, H. Daimon, E.D. Tober, and C.S. Fadley, Rev. Sci.
Instrum. 67 (9) (1996).

5

(69)

(70)

“Dichroism in Core Photoelectron Diffraction Spectra of Si(001) in Dependence on the Photon Polarization”,
P. Rennert, A.Chasse, T.Nakatani, K.Nakatsuji, H.Daimon, and S.Suga, J. Phys. Soc. Jpn. 66 (2) 396-400(1997).
“Angle resolved photoelectron spectroscopy of the Si(111)3×1-Na surface”, T. Okuda, K. Sakamoto, H.
Nishimoto, H. Daimon, S. Suga, T. Kinoshita, and A. Kakizaki, Phys. Rev. B, 55 6762-6765 (1997).

(71)“High resolution photoemission study of CeRu2Si2”, M. Tsunekawa, S. Suga, A. Kimura, T. Matsushita, T.
Muro, S. Ueda, H. Daimon, S. Imada, T. Nakatani, Y. Saitoh, T. Iwasaki, A. Sekiyama, A. Fujimori, H. Ishii,
T. Miyahara, T. Hanyu, H. Namatame, M. Taniguchi, E. Shigemasa, O. Sakai, R. Settai, H. Azuma, Y.
Onuki, Solid State Commun., 103 (12) 659-662 (1997).

(72)“Linear and circular dichroism in photoemission angular distribution from the valence band of 1T-TaS2”, T.
Matsushita, S. Imada, H. Daimon, T. Okuda, K. Yamaguchi, H. Miyagi, and S. Suga, Phys. Rev. B, 56 (12)7687-7693 (1997).

(73)"Surface electronic structure of ordered alkali- and noble metal-overlayers on Si(111)", T. Okuda, H. Daimon, S. Suga, Y. Tezuka, and S. Ino, Appl. Surf. Sci., 121/122 89-97 (1997).

(74)“Photoelectron diffraction of the Si(111)-( 3 × 3 )R30°-Ga surface: local atomic structure and vibrationalcorrelation", T. Hanada, H. Daimon, S. Nagano, S. Ino, S. Suga, and Y. Murata, Phys. Rev. B, 55 1642016425 (1997).

(75)“Photoelectron Diffraction: Space, Time, and Spin Dependence of Surface Structures”, C.S. Fadley, M.A.
Van Hove, Z. Hussain, A.P. Kaduwela, R. Couch, Y.J. Kim, P. Len, F.J. Palomares, S. Ryce, S. Ruebush,
E.D. Tober, Z. Wang, R.X. Ynzunza, H. Daimon, H. Galloway, M.B. Salmeron, and W. Schattke, Surface
Review and Letters, 4 421-440 (1997).

(76)“Diffraction and Holography with Photoelectrons and fluorescent X-ray”, C.S. Fadley, Y. Chen, R.E. Couch,
H. Daimon, R. Denecke, J.D. Denlinger, H. Galloway, Z. Hussain, A.P. Kaduwela, Y.J. Kim, P.M. Len, J.
Liesegang, J. Menchero, J. Morais, J. Palomares, S.D. Ruebush, E. Rotenberg, M.B. Salmeron, R. Scalettar,
W. Schattke, R. Singh, S. Thevuthasan, E.D. Tober, M.A. Van Hove, Z. Wang and R.X. Yuzunza, Surf. Sci.,
54 (3/4) 341-386 (1997).

(77)"Surface, Interface, and Nanostructure Characterzation with Photoelectron Diffraction and Photoelectron and
X-ray Holography", C.S. Fadley, Y. Chen, R.E. Couch, H. Daimon, R. Denecke, H. Galloway, Z. Hussain,
A.P. Kaduwela, Y.J. Kim, P.M. Len, J. Liesegang, J. Menchero, J. Morais, J. Palomares, S.D. Ruebush, S.
Ryce, M.B. Salmeron, W. Schattke, S. Thevuthasan, E.D. Tober, M.A. Van Hove, Z. Wang, R.X. Ynzunza,and J. J. Zaninovich , Journal of Surface Analysis, 3 334-364 (1997).

(78)“Direct Structure Analysis of W(110)(1x1)-O by Full-Solid-Angle X-ray Photoelectron Diffraction with
Chemical-State-Resolution”, H. Daimon, R. Ynzunza, F.J. Palomares, H. Takagi, and C.S. Fadley, Surf. Sci.,
408, 260-267 (1998).

(79)"Twin helical undulator beamline for soft X-ray spectroscopy at SPring-8", Y. Saitoh, T. Nakatani, T.
Matsushita, T. Miyahara, M. Fujisawa, K. Soda, T. Muro,S.Ueda, H. Harada, A. Sekiyama, S.Imada, H.
Daimon and S.Suga, J.Synchrotron Rad. 5, 542-544 (1998).

(80)“Circular Dichroism in Core-Level Emission from O/W(110): Experiment and theory”, H. Daimon, R.X.
Ynzunza, F.J. Palomares, E.D. Tober, Z.X. Wang, A.P. Kaduwela, M.A. Van Hove, and C.S. Fadley, Phys.
6

Rev. B, 58, 9662-9665 (1998).
(81)“Observation of circular dichroism in angular distribution of the valence band photoelectron from Si(001) in
UPS region”, K. Nakatsuji, H. Daimon, T. Furuhata, H. Takagi, M. Fujikawa, S. Suga, T. Miyahara, A. Yagishita, C.-H. Solterbeck, and W. Schattke, Proceedings of the 7-th International Conference on Electron
Spectroscopy (September 8-12, 1997, Chiba, Japan) and J. Electron Spectrosc. Relat. Phenom., 88-91, 213218 (1998).

(82)“Two-dimensional angle resolved resonance photoelectron spectroscopyof 1T-TaS2”, T. Okuda, H. Daimon,
K. Nakatsuji, M. Kotsugi, S. Suga, Y. Tezuka, S. Shin, T. Hasegawa, and K. Kitazawa, Proceedings of the 7th International Conference on Electron Spectroscopy, (September 8-12, 1997, Chiba, Japan) and J. Electron
Spectrosc. Relat. Phenom., 88-91, 287-292 (1998).

(83)“Effect of Coster-Kronig decay on Ce 3d-4f resonant photoemission spectra of CeOs2”, H. Ishii, T. Kimura,T. Miyahara, T. Hanyu, T. Iwasaki, S. Ueda, M. Tsunekawa, T. Nakatani, T. Matsushita, S. Imada, H. Daimon, S. Suga, A. Sekiyama, A. Fujimori, H. Namatame, M. Taniguchi, A. Kimur, H. Sugawara, Y. Aoki,
and H. Sato, Proceedings of the 7-th International Conference on Electron Spectroscopy (September 8-12,
1997, Chiba, Japan)and J. Electron Spectrosc. Relat. Phenom. 88-91, 419-424 (1998).

(84)“Fermi Surface of Sr2RuO4 sutudied by two-dimensional angle resolved photoelectron spectroscopy", T.
Okuda, H. Daimon, M. Kotsugi, K. Nakatsuji, M. Fujikawa, S. Suga, Y. Tezuka, S. Shin, M. Kasai, and Y.
Tokura, Proceedings of the 7-th International Conference on Electron Spectroscopy (September 8-12, 1997,
Chiba, Japan) and J. Electron Spectrosc. Relat. Phenom.88-91, 473-477 (1998).

(85)“Symmetry Analysis of the Fermi Surface of Bi2Sr2CaCu2O8 by Display Analyzer”M. Kotsugi, H. Daimon,
K. Nakatsuji, T. Okuda, T. Furuhata, M. Fujikawa, H.Takagi, Y. Tezuka, S. Shin, K. Kitahama, T. Kawai,and S. Suga, Proceedings of the 7-th International Conference on Electron Spectroscopy (September 8-12,
1997, Chiba, Japan) and J. Electron Spectrosc. Relat. Phenom., 88-91, 489-493 (1998).

(86)“Temperature-Dependent Change of Correlated Electronic States in Yb4As3 and Yb4(As1-xSbx)3 Probed byHigh Resolution Photoemission Spectroscopy”,S. Suga, A. Ochiai, T. Suzuki, H. Harada, A. Sekiyama, T.
Matsushita, T. Iwasaki, A. Kimura, M. Tsunekawa, T. Muro, S.Ueda, H. Daimon, S. Imada, H. Namatame,
M. Taniguchi, H. Ishii, T. Miyahara, T. Hanyu, and A. Fujimori, J. Phys. Soc. Jpn. 67 (10), 3552-3560(1998).

(87)“Correlated electronic states of Yb4As3 studied with photoemission”, S. Suga, H. Harada, T. Iwasaki, T. Muro, T. Matsushita, A. Sekiyama, S. Imada, H. Daimon, H. Ishii, A. Fujimori, A. Ochiai, T. Suzuki, J. Electron Spectrosc. Relat. Phenom., 88-91, 315-319 (1998).

(88)“Two-dimensional band mapping of 2H-TaSe2 using a display-type photoelectron spectrometer”, T. Okuda,
K. Nakatsuji, S. Suga, Y. Tezuka, S. Shin and H. Daimon, VUV12 Proceedings (1998), and J. Electron
Spectrosc. Relat. Phenom., 101-103, 355-360 (1999).

(89)“Characterization of Electronic States Using a Polarized Light and a Display Analyzer”, H. Daimon, M. Kotsugi, T. Okuda, K. Hattori, Proceedings of the 2nd International Conference on Synchrotron Radiation inMaterials Science (Oct. 31 - Nov. 3,1998, Kobe, Japan), Jap. J. Appl. Phys. 38, 630-633 (1999).

(90)“Deduction of atomic orbitals in a valence band by two-dimensional angular distribution of photoelectrons”,
H. Daimon, M. Kotsugi, K. Nakatsuji, T. Okuda, K. Hattori, Surf. Sci., 438, 214-222 (1999).

7

(91)

“Symmetry Analysis of the Fermi Surface States of Sr2RuO4 by Display-Type Photoelectron Spectroscopy”,
T. Okuda, M. Kotsugi, K. Nakatsuji, M. Fujikawa, S. Suga, Y. Tezuka, S. Shin, M. Kasai, Y. Tokura and H.
Daimon, J. Phys. Soc. Jpn., 68 (4), 1398-1403 (1999).

(92)“Full solid angle photoelectron diffraction from bulk and surface atoms of clean W(110)”, R. X. Ynzunza, E.
D. Tober, , F. J. Palomares, Z. Wang,, H. Daimon, A. P. Kaduwela, Y. Chen, Z. Hussain, M. A. Van Hove,
C. S. Fadley, Surf. Sci.,441, 301-310 (1999).

(93)“Structure determination for saturated (1x1) oxygen on W(110) from full solid angle photoelectron diffraction with chemical-state resolution”, R. X. Ynzunza, F. J.Palomares, E. D. Tober, Z. Wang, J. Morais, R.
Denecke, H. Daimon, Y. Chen, Z. Hussain, M. A. Van Hove, C. S. Fadley, Surf. Sci., 442,27-35 (1999).

(94)“Metastable Domain Structure of Ferromagnetic Microstructure Observed by Soft X-Ray Magnetic Circular
Dichroism Microscopy”, S. Imada, S. Ueda, R. Uung, Y. Saitoh, M. Kotsugi, W. Kuch, J. Gilles, S. Kang, F.
Offi, J. Kirchner, H. Daimon, T. Kimura, J. Yanagisawa, K. Gamo and S. Suga, Jpn.J. Appl. Phys., 39,
L585-L587 (2000).

(95)“Two-dimensional circularly-polarized-light photoelectron diffraction for the analysis of magnetic and electronic properties on surface”, K. Enomoto, Y.Miyatake, K. Fukumoto, A. Kobayashi, K. Hattori, H. Daimon,
M. Kotsugi,S. Suga, T. Nakatani, T. Matsushita, Surf. Rev. Lett., 7, (5&6) 643-647 (Octorber, 2000).

(96)“Photoelectron holography analysis of W(110)(1x1)-O surface", H. Takagi, H. Daimon, F. J. Palomares, C.
S. Fadley, Surf. Sci., 470 189-196 (2001) .

(97)“Direct surface-structure analysis by the peak rotation in circularly polarized-light photoelectron diffracton”,
H. Daimon, S. Imada, S. Suga, Surf. Sci., 471 (1-3), 143-150 (2001).

(98)“Stereoscopic microscopy of atomic arrangement by circularly Polarized -Light Photoelectron Diffraction”,
H. Daimon, Phys. Rev. Lett., 86 2034-2037 (2001).

(99)“Construction of two-dimensional photoelectron spectrometer at SPring-8”, M. Kotsugi, Y. Miyatake, K.
Enomoto, K. Fukumoto, A. Kobayashi, T. Nakatani, Y. Saitoh, T. Matsushita, S. Imada, T. Furuhata, S. Suga,
K. Soda, M. Jinno, T. Hirano, K. Hattori, H. Daimon, Nucl. Instrum. and Meth. A, 467-468 1493-1496 (2001).

(100) “Effective magnetic quantum number and effective emitter-scatterer distance obtained from W 4f photoelectron diffraction induced by circularly polarized light on W(110)”, K. Hattori, A. Kobayashi, K. Fukumoto, Y.
Miyatake, H. Daimon, M. Kotsugi, S. Suga, T. Nakatani, T. Matsushita, Surf. Sci., 493, 15-22 (2001).
(101) “Stereo-microscopy of atomic arrangements on thin films using circular dichroism in x-ray photoelectron
angular distribution”, S. Okamoto, A. Nakamoto, S. Hayashi, K. Fukumoto, T. Nakatani, T. Matsushita, K.
Hattori, H. Daimon, Trans. Magn. Soc. Japan, 2, (4) 228-233 (2002).
(102) “Development of Electron Source for Auger Electron Spectroscopy in Scanning Probe Microscope Systems”, Y. Miyatake, T. Nagamura, K. Hattori, Y. Kanemitsu, H. Daimon, Jpn. J. Appl. Phys., 41, 4943-4947(2002).
(103) “Photoelectron diffraction stereograph by display-type spherical mirror analyzer”, H. Daimon, J. Elec. Spect.
Rel. Phem., 124, 139-149 (2002).
(104) “Micromagnetic properties of the Cu/Ni crossed-wedge film on Cu(001)”, K. Fukumoto, H. Daimon, L.
8

Chelaru, F. Offi, W. Kuch and J. Kirschner, Surf. Sci., 514, 151-155 (2002).
(105) “Three-dimensional band mapping of graphite”, F. Matsui, Y. Hori, H. Totsuka, H. Miyata, K. Ogawa, T.
Furukubo, N. Suganuma, H. Namba and H. Daimon, Appl. Phys. Lett., 81 (14), 2556-2558 (September 2002).
- - -(106) “GaP(111) reconstructed surface studied with STM and LEED”, K. Hattori, K. Ishihara, Y. Miyatake, F.
Matsui, S. Takeda, H. Daimon, F. Komori, Surf. Sci., 525, 57-65 (2003).
(107) “Development of High-Energy-Resolution Display-Type Photoelectron Spectrometer in the UPS Region”,
T. Nohno, F. Matsui, Y. Hamada, H. Matsu-moto, S. Terada, K. Hattori, H. Daimon, Jpn. J. Appl. Phys., 424752-4755 (2003).
(108) “Development of Scanning Probe Microscope for Auger Analysis”, Y. Miyatake, T. Nagamura, K. Hattori,
Y. Kanemitsu, H. Daimon, Jpn. J. Appl. Phys., 42, 4848-4851 (2003)(109) “Application of atomic stereo microscope to surface science", T. Nakatani, T.Matsushita, S. Okamoto, K. Fu
kumoto, A. Kobayashi, A. Nakamoto,T. Nohno, K. Hattori, K. Enomoto, Y.Miyatake, M. Kotsugi, Y.
Saitoh, S. Suga, H. Daimon, Progress in Surf. Sci.71, 217-239 (2003)(110) “Stereoscopic photographs of atomic arrangements in MoS2 single-crystal”, F. Z. Guo, F. Matsui, M.
Fujikado, T. Matsushita, H. Daimon, Applied Surf. Sci, 237, (1-4) 616-620 (2004).
(111) “Atomic structure of Fe thin-films on Cu(001) studied with Stereoscopic photography” A.N.Hattori,
M.Fujikado, T.Uchida, S.Okamoto, K.Fukumoto, F.Z.Guo, F.Matsui, K.Nakatani, T.Matsushita, K.Hattori,
H.Daimon, Applied Surf. Sci, 237, (1-4) 311-315 (2004)(112) “Visaualization of graphite atomic arrangement by stereo atomscope” F.Matsui, H.Daimon, F.Z.Guo,
T.Matsushita,, Appl. Phys. Lett. 85,(17) 3737-3739 (2004)(113) “Si(111)2×2-Fe surface reacted with nitric oxide” K. Hattori, T. Nishimura, K. Kataoka, Y. Shimamoto, H.
Daimon, Thin Solid Films, 464-465, 5-9 (2004).
(114) “Erratum to “Stereoscopic photographs of atomic arrangements in MoS2 single-crystal””, F. Guo, F. Matsui,
M. Fujikado, T. Matsushita, H. Daimon, Applied Surface Science Vol.239 Issue1, 616-620, (2004).
(115) “Magnetism-induced symmetry breaking in photoelectron diffraction patterns”, A.Chasse, W.Kuch,
M.Kotsugi, X.Gao, F.Offi, S.Imada, S.suga, H.Daimon, J.Kirschner, Phys. Rev. B 71, (1) 01444 (2005).
(116) “Visualization of in-plane dispersion of hole subbands by photoelectron spectroscopy”, S. Nishino Takeda,
N. Higashi, H. Daimon, Phys. Rev. Lett. 94, (3) 037401-1-4 (2005)(117) “Anisotropy of surface vibration measured by temparature dependence of the spot intensity in reflection
high-energy electron diffraction”, M. Hashimoto, S. Takeda, H. Daimon, Phys. Rev. B 71, (11) 113314-1-4(2005).
(118) “Scanning Tunneling Microscopy Observation of Germapericycline on a Graphite Surface”, J. Nayeem, S.
Nishino Takeda, F. Matsui, K. Hattori, H. Daimon, Journal of the Vacum Society of Japan Vol.48, No.5, 304308 (2005).

9

(119) “Atomic stereo-photographs of Cu single crystal taken by stereo atomscope”, F.Z. Guo, F.Matsui,T.Matsushita, H.Daimon, J. Electron Spectrosc. Rel. Phenom., 144-147, 1067-1070 (2005).
(120) “Approach for simultaneous measurement of two-dimensional angular distribution of charged particles:
Spherical aberration correction using an ellipsoidal mesh”, H. Matsuda, H. Daimon, M. Kato, M. Kudo, Phys.
Rev. E 71, (6) 066503-1-8 (2005)(121) “Atomic-orbital analysis of the Cu Fermi surface by two-dimensional photoelectron spectroscopy”, F. Matsui, H. Miyata, O. Rader, Y. Hamada, Y. Nakamura, K. Nakanishi, K. Ogawa, H. Namba, H. Daimon, Phys.
Rev. B 72, (19) 195417-1-5 (2005).
(122) “Structural analysis of oxygen segregated Nb(110) surface by photoelectron diffraction”, F. Matsui, M. Fujikado, H. Daimon, Czech. J. Phys. 56, (1) 61-68 (2006).
(123) “Atomic stereophotograph of intercalation compound Fe1/3NbS2”, F. Z. Guo, T. Matsushita, K. Kobayashi,
F. Matsui, Y. Kato, H.Daimon, M.Koyano, Y.Yamamura, T. Tsuji, Y. Saitoh, Journal of applied physics 99,(2) 024907 (2006).
(124) Structure analysis of thin iron silicide film from Φ-scan RHEED Patterson function, O. Romanyuk, K.
Kataoka, F. Matsui, K. Hattori, H. Daimon, Czech. J. Phys. 56, (3) 267-276 (2006).
(125) Ferroelectric Phase Transition Character of GlycinePhosphite, J. Nayeem, T. Kikuta, N. Nakatani , F. Matsui,
S. Nishino Takeda, K. Hattori, H. Daimon, Ferroelectrics 332,(1) 13-19 (2006).
(126) Atomic Structure Analysis of Ultra Thin Fe Silicide Films by Stereo Atomscope, K.Kataoka, F.Matsui,
Y.Kato, F.Z.Guo, T.Matsushita, K.Hattori, H.Daimon, Surface Review and Letters 13, (2-3) 209-214 (2006).
(127) “Adsorption and Reaction of Nitric Oxide on Si(111)-Au Surfaces”, T. Nishimura, K. Hattori , K. Kataoka,
Y. Shimamoto, H. Daimon, Surface Review and Letters 13, (2-3) 191-196 (2006).
(128) “Chemisorption of L-cysteine on Au(111)/Si(111) and Si(111)√3-√3 - Au Surfaces”, M. Honda, F. Matsui,
H. Daimon, Surface Review and Letters, 13, (2-3) 197-200 (2006).
(129) “Stereophotographs of diamond and graphite”, Y.Kato, F.Matsui, T.Shimizu, T.Matsushita, F.Z.Guo,
T.Tsuno, H.Daimon, Science and Technology of Advanced Materials (STAM) 7, S45-S48, August (2006).
(130) “Approach for simultaneous measurement of two-dimensional angular distribution of charged particles. Ⅱ,
Deceleration and focusing of wide-angle beams using a curved mesh lens", H. Matsuda, H. Daimon, Phys.
Rev. E 74, (3) 036501-1-9 (2006)(131) “Two-dimensional angle-resolved photoelectron spectroscopy using display analyzer ---Atomic orbital analysis and characterization of valence band”, H. Daimon, F. Matsui, Progress in Surface Science 81, (8-9) 367386 (2006).
(132) “Iron silicides grown by solid phase epitaxy on a Si(111) surface: Schematic phase diagram”, K. Kataoka, K.
Hattori, Y. Miyatake, H. Daimon, Phys. Rev. B 74,(15) 155406 (2006).
(133) “Photoelectron angular distribution of 2H-NbSe2 Studied by Display-Type Spherical Mirror Analyzer andCircularly Polarized Light”, F.Z.Guo, T.Matsushita, F.Matui, Y.Kato, H. Daimon,, Surface and Interface
10Analysis, 38, (12-13) 1604-1606 (2006).
(134) “Construction of Two-dimensional Photoelectron Spectroscopy Beamline at Rits SR Center for Investigation of Surface Electronic Structure”, Y. Hamada, F. Matsui, Y. Nozawa, K. Nakanishi, M. Nampei, K. Ogawa, S. Shigenai, N. Takahashi, H. Daimon, H.Namba, AIP Conf. Proc. 879, 547-550 (2006).
(135) “New Display-type Analyzer for Three-dimensional Fermi Surface Mapping and Atomic Orbital Analysis”,
N. Takahashi, F. Matsui, H. Matsuda, S. Shigenai, Y. Hirama, Y. Hamada, K. Nakanishi, H. Namba, H. Daimon, AIP Conf. Proc. 879, 1180-1183 (2006).
(136) “A Real-Time Imaging System for Stereo Atomic Microscopy at SPring-8's BL25SU”, T. Matsushita, F. Z.
Guo, T. Muro, F. Matsui, H. Daimon, AIP Conf. Proc. 879, 1164-1167 (2006).
(137) “Site-Specific Orbital Angular Momentum Analysis of Graphite Valence Electron Using Photoelectron
Forward Focusing Peaks”, F. Matsui, T. Matsushita, Y. Kato, F.Z. Guo, H. Daimon, Journal of the PhysicalSociety of Japan, 76, (1) 013705-1-4 (2007).
(138) “Three-dimentional atomic-arrangement reconstruction from an Auger-electron hologram”, T. Matsushita, F.
Z. Guo, F. Matsui, Y. Kato, H. Daimon, Phys. Rev. B 75, (8) 085419-1-5 (2007).
(139) “Approach for simultaneous measurement of two-dimensional angular distribution of charged particles. Ⅲ.
Fine forcusing of wide-angle beams in multiple lens systems”, H. Matsuda, H. Daimon, L. Toth, F. Matsui,
Phys. Rev. E 75, (4) 046402-1-5 April (2007).
(140) “Circularly polarized X-ray photoelectron diffraction - Stereo photograph of atomic arrangement”, H. Daimon, F. Matsui, F. Z. Guo, T. Matsushita, J. Electron Spectrosc. Rel. Phenom., 156-158, 1-9 May (2007).
(141) Stereo Photography of atomic arrangement and atomic-orbital analysis by two-dimensional photoelectron
spectroscopy, F. Matsui, T. Matsushita, F. Z. Guo, H. Daimon, Surf. Rev. Lett. 14, (4) 637-643 (2007)(142) Fermi energy band dispersion and orbital symmetry of Bi2Sr2CaCu2Oy studied by non-polarized-light twodimensional photoelectron spectroscopy, Chikako Sakai, Fumihiko Matsui, Nobuaki Takahashi, Sakura Nishino Takeda, Hiroshi Daimon, Physica C 467, (1-2) 43-50 August(2007).
(143) Stereo-PEEM for three-dimensional atomic and electronic structures of microscopic materials, H. Daimon,
H. Matsuda, L. Toth, F. Matsui, Surface Science 601 (20) 4748-4753 (2007).
(144) Variety of iron silicides grown on Si(001) surfaces by solid phase epitaxy: Schematic phase diagram, H.
Nakano, K. Maetani, K. Hattori, H. Daimon, Surface Science 601 (22) 5088-5092 November (2007).
(145) Three-dimensional elongated island of iron silicide grown on Si(001) surfaces by solid phase epitaxy, K.
Maetani, H. Nakano, K. Hattori, H. Daimon, J. Phys. : Conf. Ser. 61, 409-413 (2007).
(146) β-FeSi2 thin film grown on a Si(111) surface with ferromagnetic interface, A. N. Hattori, K. Hattori, H.
Daimon, Journal of Physics: Conference Series 61, 404-408, (2007).
(147) Depth resolved electronic structure of cuprate superconductor analyzed by two-dimensional X-ray Auger
resonance emission spectroscopy, C. Sakai, F. Matsui, T. Matsushita, Y. Kato, T. Narikawa, H. Daimon, eJournal of Surface Science and Nanotechnology 5, 143-147 (2007).
11

(148) Dopant-site effect in superconducting diamond (111) studied by atomic stereo-photography, Y. Kato, F.
Matsui, T. Shimizu, T. Matsushita , F. Z. Guo, T. Tsuno, H. Daimon, Appl. Phys. Lett. 91,(25) 251914, (2007).
(149) Formation of ferromagnetic interface between β-FeSi2 and Si(111) substrate, A. N. Hattori, K. Hattori, K.
Kodama, N. Hosoito, H. Daimon, Appl. Phys. Lett. 91,201916-1-3 (2007)(150) Total analysis of surface structure and properties by UHV transfer system, H. Yamatani, K. Hattori, T.
Matsuta, T. Ito, T. Nohno, M. Hori, Y. Miyatake, S. Konno, T. Tanaka, Y. Hamada, H. Katagiri, M. Hibi, T.
Miyai, M. Hashimoto, K. Kataoka, T. Tatsuta, A. N. Hattori, N. Higashi, M. Honda, N. Masunaga, H. Mino, S.
Yasui, J. Nayeem,T. Shimizu, N. Takahashi, Y. Kato, C. Sakai, M. Yoshimura, S. N. Takeda, F. Matsui, H.
Daimon, Surface Science 601 (22) 5284-5288 (2007).
(151) Observation of Multi-Step Ordering of Bi Adsorbed on the Si(111)7×7 Structure by RHEED and STM,
Yohei Ohnishi, Sakura N. Takeda, Masaaki Yoshikawa, Hiroshi Daimon and Chikako Sakai, e Journal of Surface Science and Nanotechnology 6, 291-295 (2008)(152) Orbital Angular Momentum of Iron Valence Band Electron Analyzed by Photoelectron Stereography, K.
Goto, F. Matsui , Matsushita, Y. Kato, and H. Daimon, J. Phys. Soc. Jpn. 77, (10)103301 (2008).
(153) Reconstruction Algorithm for an Atomic-Resolution Holography using Translational Symmetry, T. Matsushita, F. Z. Guo, M. Suzuki, F. Matsui , H. Daimon, and K. Hayashi, Phys. Rev. B , 78 (14) 144111 (2008).
(154) Atomic orbitals and photoelectron intensity angular distributions of MoS2 valence band, Zs.Janosfalvi, F.
Matsui , N. Takahashi, M. Akasaka, H. Namba, and H. Daimon, Appl. Surface Science 254, (23) 7679-7683(2008)(155) ARPES measurements on Si(1 1 1) hole subband induced by Pb and Ga adsorption, M. Morita, S.N. Takeda,
M. Yoshikawa, A. Kuwakoa, Y. Kato and H. Daimon, Applied Surface Science 254, (23) 7872-7876 (2008).
(156) Circular dichroism of forward focusing peaks in 2π steradian Si 2p photoelectron pattern, K.Inaji, F. Matsui,
Y. Kato, C. Sakai, T. Narikawa, T. Matsushita, F. Z. Guo, H. Daimon, Appl. Surf. Sci. 254, (23) 7549-7552(2008).
(157) X-ray photoelectron spectroscopy of SPE-grown bcc-Fe, polycrystal and b-FeSi2 phases on Si(111) surfaces,
A.N. Hattori, K. Hattori, H. Daimon, Surf. and Interface Anal. 40, (6-7) 988-992 (2008).
(158) New Simple Photoemission Electron Microscope with an Energy Filter, L. Toth, H. Matsuda, T. Shimizu, F.
Matsui , and H. Daimon, J. Vac. Soc. Jpn. 51, (3) 135-137 (2008).
(159) Atomic-Layer Resolved Magnetic and Electronic Structure Analysis of Ni Thin Film on a Cu(001) Surface
by Diffraction Spectroscopy, F. Matsui, T. Matsushita, Y. Kato, M. Hashimoto, K. Inaji, F. Z. Guo, and
H.Daimon, Phys. Rev. Lett. 100, (20) 207201 (2008).
(160) Improvement of Display-Type Spherical Mirror Analyzer for Real Space Mapping of Electronic and Atomic
Structures, N. Takahashi, F. Matsui , Hiroyuki Matsuda, Yoji Hamada, Koji Nakanishi, Hidetoshi Namba andHiroshi Daimon, J. Electron Spectrosc. Relat. Phenom. 163, (1-3) 45–50 (2008)(161) Hole Subband Dispersion in Space Charge Layers under Pb/Si(001) Surfaces Measured by Angle-Resolved
Photoelectron Spectroscopy, Y. Tanigawa, S. N. Takeda, M. Morita, T. Ohsugi, Y. Kato, H. Daimon, M. Yo12

shimaru and T. Imamura, e Journal of Surface Science and Nanotechnology 7,641-648 (2009)(162) Stereophotograph of InP(001), T. Matsumoto, F. Matsui , T. Matsushita, K. Goto, Y. Kato, H. Daimon, e-J.
Surf.Sci. Nanotech. 7,181-185 (2009)(163) Growth of Fe silicides on Si(111) surfaces from bcc-Fe to fine-polycrystal and b-FeSi2 phases: Structure andmagnetism, K. Hattori, Y. Murata, A.N. Hattori, and H. Daimon, Vacuum 84 (5) 648-652 (2009)(164) Disentangling atomic-layer-specific x-ray absorption spectra by Auger electron diffraction spectroscopy, F.
Matsui, T. Matsushita, Y. Kato, M. Hashimoto, H. Daimon, J. Phys. : Conf. Ser. Vol.190 No.1 012111 (2009)(165) Apparent “three-dimensional” Fermi surface of transition-metal monolayers, O. Rader, H. Wolf, W. Gudat,
A. Tadich, L. Broekman, E. Huwald, R.C.G. Leckey, J.D. Riley, A.M. Shikin, F. Matsui, H. Miyata, H. Daimon, Phys. Rev.B. Vol.79 Issue 24 245104(6 pages) June (2009)(166) InferfaceStructure of an Epitaxial Iron Silicide on Si(111) Studied with X-ray Diffraction, T. Shirasawa, K.
Sekiguchi, Y. Iwasawa, W. Voegeli, T. Takahashi, K. Hattori, A.N. Hattori, H. Daimon, Y. Wakabayashi, eJournal of Surface Science and Nanotechnology 7, 513-517 (2009)(167) Simple method for making deeply curved mesh, Laszlo Toth,HiroyukiMatsuda,HiroshiDaimon, Journal of
Electron Spectroscopy and Related Phenomena 171, (1-3) 64-67 (2009)(168) Development of the Hard-X-ray Angle Resolved X-ray Photoemission Spectrometer for Laboratory Use, M.
Kobata, I. Pis, H. Iwai, H. Yamazui, H. Takahashi, M. Suzuki, H. Matsuda, H. Daimon, K. Kobayashi,
Analysical Sciences, 26(2), 227 (2010)(169) Phase discrimination of iron-silicides on Si(001) surfaces by three-dimensional reciprocal-lattice mapping,
M. Someta, K. Maetani, K. Hattori, and H. Daimon, Surf. Sci. 604, (1) 21-26 (2010)(170) Photon energy dependence of graphite valence band photoelectron intensity, Masaru Takizawa, Hidetoshi
Namba, Fumihiko Matsui, Hiroshi Daimon, Journal of Electron Spectroscopy and Related Phenomena 181,(2-3) 193-196 (2010),(171) Chemical etchant dependence of surface structure and morphology on GaN(0001) substrates, A. N. Hattori,
F. Kawamura, M. Yoshimura, Y. Kitaoka, Y. Mori, K. Hattori, H. Daimon, and K. Endo, Surface Science 604,
(15-16) 1247-1253 August (2010)(172) Atomic-layer-resolved analysis of surface magnetism by diffraction spectroscopy, F. Matsui, T. Matsushita,
H. Daimon, Journal of Electron Spectroscopy and Related Phenomena 181, (2-3) 150-153 (2010)(173) Effect of surface carrier concentration on valence subbands in Si(111) p-type inversion layers: Angleresolved photoemission spectroscopy, Sakura Nishino Takeda, Naoto Higashi, Hiroshi Daimon, Phys. Rev. B
82, (3) 035318-1-5 (2010)(174) Regular Array of L-Tyrosine Molecules on Si(111)-Au Superstructures, Masashi Yoshimura, FumihikoMatsui, Hiroshi Daimon, e-J. Surf.Sci. Nanotech. 8, 303-308, (2010)(175) Stereo atomscope and diffraction spectroscopy-Atomic site specific property analysis, Fumihiko Matsui,
Tomohiro Matsushita and Hiroshi Daimon, Journal of Electron Spectroscopy and Related Phenomena 178179, 221-240 (2010)13

(176) Photoelectron holography with improved image reconstruction, Tomohiro Matsushita, Fumihiko Matsui,
Hiroshi Daimon and Kouichi Hayashi, Journal of Electron Spectroscopy and Related Phenomena 178-179,
195-220 (2010)(177) Surface treatments toward obtaining clean GaN(0001) from commercial hydride vapor phase epitaxy andmetal-organic, chemical vapor deposition substrates in ultrahigh vacuum, A. N. Hattori, K. Endo, K. Hattori,
and H. Daimon, Applied Surface Science 256, (14) 4745-4756 (2010)(178) Site-Specific Stereograph of SiC(0001) Surface by Inverse Matrix Method, F. Matsui , N. Nishikayama, N.
Maejima, H. Matsui, K. Goto, M. Hashimoto, T. Hatayama, T. Matsushita, Y. Kato, H. Daimon, J. Phys. Soc.
Jpn. 80, (1) 013601, (2011)(179) Formation of step-state bands on Si(111) √ 3 ×√ 3-Ag vicinal surfaces, H. Minoda, H. Yazawa, M. Morita, S.
N. Takeda, and H. Daimon, PHYSICAL REVIEW B 83, (3) 035419-1-7 (2011)(180) Formation of wide and atomically flat graphene layers on ultra precision-figured 4H-SiC(0001) surface, A.
N. Hattori, T. Okamoto, S. Sadakuni, J. Murata, K. Arima, Y. Sano, K. Hattori, H. Daimon, K. Endo, and K.
Yamauchi, Surface Science 605, (5-6) 597-605 (2011)(181) Reconstruction Algorithm for Atomic Resolution Holography, T. Matsushita, F. Matsui , H. Daimon, K.
Hayashi, e-J. Surf.Sci. Nanotech. 9, 153-157, (2011)(182) Direct imaging of three-dimensional atomic arrangement by stereophotography using two-dimensional photoelectron spectroscopy, H. Daimon, F. Matsui , T. Matsumoto, K. Goto, Y. Kato, T. Matsushita, Nucl. Inst.
Meth. Phys. Research Sec. A 648, S139-S141 (2011)(183) New 1π sr acceptance angle display-type ellipsoidal mesh analyzer for electron energy and two-dimensional
angular distribution as well as imaging analysis, L. Toth, K. Goto, H. Matsuda, F. Matsui, H. Daimon, Nucl.
Inst. Meth. Phys. Research Sec. A 648, S58-S59 (2011)(184) Development of Display-Type Ellipsoidal Mesh Analyzer, K. Goto, H. Matsuda, M. Hashimoto, H. Nojiri,
C. Sakai, F. Matsui , H. Daimon, L. Tóth, T. Matsushita, e-J. Surf. Sci. Nanotech. 9, 311-314 (2011)(185) Identifying valence band structure of transient phase in VO2 thin film by hard x-ray photoemission, T. Kanki,
H. Takami,S. Ueda, A.N. Hattori, K. Hattori, H. Daimon, K. Kobayashi, and H. Tanaka, Phys. Rev. B 84, (8)085107 1-5 (2011)(186) Structure and magnetic properties of mono- and bi-layer graphene films on ultraprecision figured 4HSiC(0001) surfaces, A. N. Hattori, T. Okamoto, S. Sadakuni, J. Murata, H. Oi, K. Arima, Y. Sano, K. Hattori,
H. Daimon, K. Endo, and K. Yamauchi, Journal of Nanoscience and Nanotechnology 11, (4) 2897-2902(2011)(187) Self-Assembled Growth of Spinel (Fe, Zn)3O4-Perovskite ViFeO3 Nanocomposite Structures Using Pulsed
Laser Deposition, Takuya Sakamoto, Azusa N. Hattori, Teruo Kanki, Ken Hattori, Hiroshi Daimon, Hiroyuki
Akinaga, and Hidekazu Tanaka, Japan Journal of Applied Physics 51, 035504(4 pages), (2012)(188) Details of 1π sr wide acceptance angle electrostatic lens for electron energy and two-dimensional angular
distribution analysis combined with real space imaging, L. Toth, H. Matsuda, F. Matsui , K. Goto, H. Daimon,
Nucl. Inst. Meth. Phys. Research Sec. A 661, (1) 98-105 (2012)14

(189) Negative Photoelectron Diffraction Replica in Secondary Electron Angular Distribution, Fumihiko Matsui,
Tomohiro Matsushita, Mie Hashimoto, Kentaro Goto, Naoyuki Maejima, Hirosuke Matsui, Yukako Kato, Hiroshi Daimon, J. Phys. Soc. Jpn. 81, (1) 013601(4pages), (2012)(190) Photoelectron Diffraction and Holographic Reconstruction of Graphite, Fumihiko Matsui, Tomohiro Matsushita, Hiroshi Daimon, J. Phys. Soc. Jpn. 81, 114604 (9 pages), (2012)(191) Three-Dimensional Reciprocal-Lattice Analysis Using Azimuth-Scan Reflection High-Energy Electron Diffraction: Determination of Complex Crystal Orientations of Al Grains of Si(111) Surface, K. Hattori, H. Oi, K.
Tanaka, T. Kumagai, H. Daimon, Japan Journal of Applied Physics 51, 055801(5pages), (2012)(192) Characterizing Edge and Stacking Structures of Exfoliated Graphene by Photoelectron Diffraction, F. Matsui,
R. Ishii, H. Matsuda, M. Morita, S. Kitagawa, T. Matsushita, S. Koh, H. Daimon, Jpn. J. Appl. Phys. 52,
No.11, Issue 1, 110110(5pages), (2013)(193) Analysis of electronic structure of amorphous InGaZnO/SiO2 interface by angle-resolved X-ray photoelectron spectroscopy, Y. Ueoka, Y. Ishikawa, N. Maejima, F. Matsui, H. Matsui, H. Yamazaki, S. Urakawa, M.
Horita, H. Daimon and Y. Uraoka, J. Appl. Phys. Vol.114, No.16, 163713 (2013)(194) Element Assignment for Three-Dimensional Atomic Imaging by Photoelectron Holography, T.
MATSUSHITA, F. MATSUI, K. GOTO, T. MATSUMOTO, H. DAIMON, J. Phys. Soc. Jpn. 82 114005(5pages) (2013)(195) Development of High Lateral and Wide Angle Resolved Hard X-ray Photoemission Spectroscopy at
BL47XU in SPring-8, Eiji Ikenaga, Masaaki Kobata, Hiroyuki Matsuda, Takeharu Sugiyama, Hiroshi Daimon, and Keisuke Kobayashi, Journal of Electron Spectroscopyand Related Phenomena 190 Part B, Page
180-187, (2013)(196) System to measure accurate temperature dependence of electric conductivity down to 20 K in ultrahigh vacuum, C. Sakai, S. N. Takeda, H. Daimon, Rev. Sci. Instrum. 84, 075103(6 pages), (2013)(197) Atomic Structure and Catalytic Activity of W-Modified Ni2P Surface Alloy by Photoelectron Diffractionand Spectroscopy, Hirosuke Matsui, Fumihiko Matsui, Naoyuki Maejima, Hiroshi Daimon, Tomohiro Matsushita, Hiroko Ariga, Kiyotaka Asakura, e-J. Surf. Sci. Nanotech. Vol. 12, 53-56, (2014)(198) The Influence of Fluorinated Silicon Nitride Gate Insulator on Positive Bias Stability toward Highly Reliable
Amorphous InGaZnO Thin-Film Transistors, H. Yamazaki, Y. Ishikawa, M. Fujii, Y. Ueoka, M. Fujiwara,
E. Takahashi, Y. Andoh, N. Maejima, H. Matsui, F. Matsui, H. Daimon, Y. Uraoka, ECS Journal of Solid
State Science and Technology, Vol. 3, Issue 2, Q20-Q23 (2014)(199) Enhancement of photoluminescence efficiency from GaN(0001) by surface treatments, Azusa N. Hattori,
Ken Hattori, Yuta Moriwaki, Aishi Yamamoto, Shu Sadakuni, Junji Murata, Kenta Arima, Yasuhisa Sano,
Kazuto Yamauchi, Hiroshi Daimon, Katsuyoshi Endo, Jpn. J. Appl. Phys. Vol.53, No.2, 02100 (5 pages),(2014)(200) Lattice Distortion of Porous Si by Li Absorption Using Two-Dimensional Photoelectron Diffraction, El Said
A. Nouh, Sakura N. Takeda, Fumihiko Matsui, Ken Hattori, Tomohiro Sakata, Naoyuki Maejima, Hirosuke
Matsui, Hiroyuki Matsuda, Tomohiro Matsushita, László Tóth, Makoto Morita, Satoshi Kitagawa, Ryo Ishii,
Masayoshi Fujita, Kaoru Yasuda, Hiroshi Daimon, Journal of Materials Science, 49, Issue 1, 35-42, (2014)15

(201) Surface structure and electronic states of epitaxial β-FeSi2(100)/Si(001) thin films: Combined quantitative
LEED, ab initio DFT, and STM study, O. Romanyuk, K. Hattori, M. Someta, H. Daimon, Phys. Rev. B Vol.
90 Issue 15, 155305(1-9), (2014)(202) Electron-hole recombination on ZnO(0001) single-crystal surface studied by time-resolved soft X-ray photoelectron spectroscopy, R. Yukawa, S.Yamamoto, K. Ozawa, M.Emori, M.Ogawa, Sh. Yamamoto,K.Fujukawa, R.Hobara, S.Kitagawa, H.Daimon, H.Sakama, I.Matsuda, Applied Physics Letters Vol.105,
No.15, 151602(1-4), (2014)(203) Evaluation of disturbing effect of mesh holes in wide-acceptance-angle electrostatic mesh lensesm Hiroyuki
Matsuda, László Tóth, Fumihiko Matsuia, Hiroshi Daimon, Journal of Electron Spectroscopy and Related
Phenomena 195, 78–84, (2014)(204) Development of display-type ellipsoidal mesh analyzer: Computational evaluation and experimental validation, H. Matsuda K. Goto L. Toth M. Morita S. Kitagawa, F. Matsui M. Hashimoto C. Sakai T. Matsushita H.
Daimon, Journal of Electron Spectroscopy and Related Phenomena 195, Page 382-398, (2014)(205) Photoelectron structure factor and diffraction spectroscopy, Fumihiko Matsui, Tomohiro Matsushita, Hiroshi
Daimon, Journal of Electron Spectroscopy and Related Phenomena Vol.195 Page 347-360, (2014)(206) Systematic study of surface magnetism in Si(111)–Fe system grown by solid phase epitaxy: In situ schematic magnetic phase diagram of Si(111)–Fe, Azusa N. Hattori, Ken Hattori, Keita Kataoka, Emi Takematsu,
Akira Ishii, Fumio Komori, Hiroshi Daimon, Journal of Magnetism and Magnetic Materials, Volume 363,
Pages 158-165, (2014)(207) Site-Specific Atomic and Electronic Structure Analysis of Epitaxial Silicon Oxynitride Thin Film on
SiC(0001) by Photoelectron and Auger Electron Diffractions, Naoyuki Maejima, Fumihiko Matsui, Hirosuke
Matsui, Kentaro Goto, Tomohiro Matsushita, Satoru Tanaka, Hiroshi Daimon, J. Phys. Soc. Jpn. 83, Issue 4,044604 (5 Pages) (2014)(208) Effect of the Flash Annealing on the Impurity Distribution and the Electronic Structure in the Inversion Layer, Tomohiro Sakata, Sakura N. Takeda, Nur Idayu Ayob, Hiroshi Daimon, e-J. Surf. Sci. Nanotech. Vol. 13
75-78, (2015)(209) Cubic Zirconia Crystalline Surface Oxide Epitaxial Formation on ZrB2(0001) Confirmed by CircularlyPolarized-Light Photoelectron Diffraction, Rie Horie, Fumihiko Matsui, Naoyuki Maejima, Hirosuke Matsui,
Kota Tanaka, Hiroshi Daimon, e-J. Surf. Sci. Nanotech. Vol. 13, 111-114, (2015)(210) Selective Detection of Angular-Momentum-Polarized Auger Electrons by Atomic Stereography, FumihikoMatsui, Masayoshi Fujita, Takuya Ohta, Naoyuki Maejima, Hirosuke Matsui, Hiroaki Nishikawa, Tomohiro
Matsushita, and Hiroshi Daimon, Phys. Rev. Lett. 114, 015501(1-4), (2015)(211) Local atomic configuration of graphene, buffer layer, and precursor layer on SiC(0001) by photoelectron
diffraction, Hirosuke Matsui, Fumihiko Matsui, Naoyuki Maejima, Tomohiro Matsushita, Takeshi Okamoto,Azusa N. Hattori, Yasuhisa Sano, Kazuto Yamauchi, Hiroshi Daimon, Surface Science 632, 98-102, ,(2015)(212) Temperature Dependence of Magnetically Active Charge Excitations in Magnetite across the Verwey Transition, M. Taguchi, A. Chainani, S. Ueda, M. Matsunami, Y. Ishida, R. Eguchi, S. Tsuda, Y. Takata, M.
Yabashi, K. Tamasaku, Y. Nishino, T. Ishikawa, H. Daimon, S. Todo, H. Tanaka, M. Oura, Y. Senba, H.
16

Ohashi, and S. Shin, Phys. Rev. Lett. 115, 256405(1-5), (2015)(213) Atomic-Orbital Analysis of ZrB2 Valence-Band by Two-Dimensional Photoelectron Spectroscopy, Rie
Horie, Fumihiko Matsui, Hiroshi Daimon, Masaru Takizawa, Hidetoshi Namba, Shigeki Otani, Takashi Aizawa, e-J. Surf. Sci. Nanotech. Vol. 13, 324-328, (2015)(214) Stacking registry determination of graphene grown on the SiC(0001) by photoelectron holography, Hirosuke
Matsui, Fumihiko Matsui, Naoyuki Maejima, Tomohiro Matsushita, Hiroshi Daimon, Surface Science 635, 14, (2015)(215) Unusual energy separation of subbands in Si(111) p-channels induced by In adsorption, Nur Idayu Ayob,
Sakura N. Takeda, Tomohiro Sakata, Masaaki Yoshikawa, Makoto Morita and Hiroshi Daimon, Jpn. J. Appl.
Phys. Vol.54 No.6 065702 (2015)(216) Molecule desorption induced by gate-voltage application in MOS structure, Nozomu Hirota, Ken Hattori,
Hiroshi Daimon, Azusa N. Hattori and Hidekazu Tanaka, Applied Physics Express, Vol.9, No.4, 047002(1-4),(2016)(217) Disentangling hole subbands dispersion in Si(111): In- and out-of-plane effective masses and anisotropy,
Sakura Nishino Takeda, Atsushi Kuwako, Masahiro Nishide, and Hiroshi Daimon, Phys. Rev.B 93. 125418,(2016)(218) Creation of atomically flat Si{111}7X7 side-surfaces on a three-dimensionally-architected Si(110) substrate,
A. N. Hattori, K. Hattori, S. Takemoto, H. Daimon, and H. Tanaka, Surf. Sci., Vol 64, pp86–90, (2016)(219) Interband interaction between bulk and surface resonance bands of a Pb-adsorbed Ge(001) surface, Tomohiro Sakata, Sakura N Takeda, Kosuke Kitagawa and Hiroshi Daimon, Semiconductor Science and Technology,
Vol. 31, No. 8, 085012 (2016)(220) Interfacial atomic site characterization by photoelectron diffractionfor 4H-AlN/4H-SiC(1120) heterojunction, Naoyuki Maejima, Masahiro Horita, Hirosuke Matsui, Tomohiro Matsushita, Hiroshi Daimon, andFumihiko Matsui, Jpn. J. Appl. Phys. Vol.55, No.8, 085701(1-5) (2016)(221) Methods of creating and observing atomically reconstructed vertical Si{100}, {110}, and {111} side surfaces, A. N. Hattori, S. Takemoto, K. Hattori, H. Daimon, H. Tanaka, Appl. Phys. Express, Vol.9, No.8, 0855011-4 (2016)(222) Circular Dichroism in Cu Resonant Auger Electron Diffraction, F. Matsui, N. Maejima, H. Matsui, H.
Nishikawa, H. Daimon, T. Matsushita, M. Muntwiler, R. Stania, Roland , T. GreberZeitschrift für
Physikalische Chemie, vol.230, Issue 4, p519(2016)(223) Enhancements of photoluminescence intensity in high-quality floating-zone Si by thermal annealing in
vacuum, Keita Kataoka, Ken Hattori, Aishi Yamamoto, Azusa Nakamoto Hattori, Tomoaki Hatayama, Yasuji Kimoto, Katsuyoshi Endo, Takashi Fuyuki, and Hiroshi Daimon, JJAP-RC 55,11308-1-11308-4 (2016)(224) Bi induced superstructures on Si(110), Artoni Kevin R. Ang, Sakura Nishino Takeda, Hiroshi Daimon,J.
Vac. Sci. Technol. A 34, 051401 (2016)(225) Photoelectron Holographic Atomic Arrangement Imaging of Cleaved Bimetal-intercalated Graphite Superconductor Surface, Fumihiko Matsui, Ritsuko Eguchi, Saki Nishiyama, Masanari Izumi, Eri Uesugi, Hidenori
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Goto, Tomohiro Matsushita,, Kenji Sugita, Hiroshi Daimon, Yuji Hamamoto, Ikutaro Hamada, Yoshitada
Morikawa, Yoshihiro Kubozono, Scientific Reports 6, 36258 (2016). doi:10.1038/srep36258(226) Electronic structure and correlation in β-Ti3O5 and λ-Ti3O5 studied by Hard X-ray Photoelectron Spectroscopy,Keisuke Kobayashi, Munetaka Taguchi, Masaaki Kobata, Kenji Tanaka, Hiroko Tokoro, Hiroshi Daimon, Tetsuo Okane, Hiroshi Yamagami, Eiji. Ikenaga, Shin-ichi Ohkoshi, Physical Review B. 085133 (2017)(227) Unusual coexistence of negative and positive charge transfer in mixed-valence NaxCa1−xCr2O4, M.
Taguchi, H. Yamaoka, Y. Yamamoto, H. Sakurai, N. Tsujii, M. Sawada, H. Daimon, K. Shimada, and J. Mizuki, Phys. Rev. B 96, 245113 (2017)(228) Direct observation for atomically flat and ordered vertical {111} side-surfaces on three-dimensionally figured Si(110) substrate using scanning tunneling microscopy, Haoyu Yang, Azusa N. Hattori, Akinori Ohata,
Shohei Takemoto, Ken Hattori, Hiroshi Daimon, Hidekazu Tanaka, Japanese Journal of Applied Physics
56,11301-1-11301-4 (2017)(229) Quantifying the critical thickness of electron hybridization in spintronics materials, T. Pincelli, V. Lollobrigida F. Borgatti, A. Regoutz, B. Gobaut, C. Schlueter, T.-L. Lee, D.J. Payne, M. Oura, K. Tamasaku, A.Y. Petrov, P. Graziosi, F. Miletto Granozio,, M. Cavallini, G. Vinai, R. Ciprian, C.H. Back, G. Rossi, M. Taguchi, H.
Daimon, G. van der Laan & G. Panaccione, NATURE COMMUNICATIONS 8 16051 (2017)(230)
Correlation between high gas sensitivity and dopant structure in W-doped ZnO, Shun Fukami, Munetaka
Taguchi, Yuu Adachi, Ken Watanabe, Toyohiko Kinoshita, Takayuki Muro, Tomohiro Matsushita, FumihikoMatsui, Hiroshi Daimon, and Taku T. Suzuki,Physical Review Applied 7, 064029 (2017)(231)
Lattice distortion and electronic structure of magnesium-doped nickel oxide epitaxial thin films,Yanna
Chen, Osami Sakata, Ryosuke Yamauchi, Anli Yang, Loku Singgappulige Rosantha Kumara, Chulho Song,Natalia Palina, Munetaka Taguchi, Toshiaki, Ina, Yoshio Katsuya, Hiroshi Daimon, Akifumi Matsuda, andMamoru Yoshimoto, Physical Review B 95.245301(1-10) (2017)(232) Realization of software based imaging energy analyzer on GPU, Laszlo Levente Toth, Adam Fazekas, Hiroyuki Matsuda, Hiroshi Daimon, Laszlo Toth, Optik International Journal for Light and Electron Optics,
Volume157,Page 571-581 (2018)(233)
Noble Metal Nanocluster Formation in Epitaxial Perovskite Thin Films, Mihee Lee, Rémi Arras, Ryota
Takahashi, Bénédicte Warot-Fonrose, Hiroshi Daimon, Marie-José Casanove, and Mikk Lippmaa,ACS Omega, 2018, 3 (2), pp 2169–2173 (2018)(234) YBa2Cu3Ox superconducting nanorods,William Rieken, Atit Bhargava, Rie Horie, Jun Akimitsu, and Hiroshi Daimon, Japanese Journal of Applied Physics 57, 023101 (2018)(235) Variable-deceleration-ratio wide-acceptance-angle electrostatic lens for two-dimensional angular and energy
analysis, Hiroyuki Matsuda, László Tóth, and Hiroshi Daimon, Review of Scientific Instruments 89, 123105(2018) (Published Online: 06 December 2018). https://doi.org/10.1063/1.5043317(236) Distortion analysis of Ir- and Co-doped LaAlO_3/SrTiO_3 (001) interfaces by hard X-ray photoelectron
diffraction, Mihee Lee, Xin Liang Tang, Mitsutoshi Yoneda, Takashi Okamoto, Ikko Tanaka, Yudai Higa,
Dawei Peng, Masafumi Ogi, Shinta Kobayashi, Munetaka Taguchi, Mikk Lippmaa, Marie-Jose Casanove,
Hiroshi Daimon, J. Phys. Soc. Jpn., Vol.87, No.8, Article ID: 084601 (2018). DOI: 10.7566/JPSJ.87.084601

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(237) Electric transport properties for three-dimensional angular-interconnects of Au wires crossing facet edges ofatomically-flat Si{111} surfaces, Shohei Takemoto, Azusa Hattori, Ken Hattori, Hidekazu Tanaka, and Hiroshi daimon, Japanese Journal of Applied Physics, Volume 57, Number 9 (2018)(238) Overview of Three-Dimensional Atomic-Resolution Holography and Imaging Techniques: Recent Advances in Local-Structure Science, Hiroshi Daimon, J. Phys. Soc. Jpn., 87, 061001 (2018). DOI:
10.7566/JPSJ.87.061001(239) Three-dimensional atomic arrangement around active/inactive dopant sites in boron-doped diamond,
Yukako Kato, Daichi Tsujikawa, Yusuke Hashimoto, Taisuke Yoshida, Shun Fukami, Hiroyuki Matsuda,
Munetaka Taguchi, Tomohiro Matsushita, and Hiroshi Daimon, Applied Physics,Express11,061302-1～
061302-3 (2018)(240) Tensile-Strain-Dependent Spin States in Epitaxial LaCoO3 Thin Films, Y. Yokoyama, Y. Yamasaki, M.
Taguchi, Y. Hirata, K. Takubo, J. Miyawaki, Y. Harada, D. Asakura, J. Fujioka, M. Nakamura, H. Daimon, M.
Kawasaki, Y. Tokura, H. Wadati, Physical Review Letters,120,206402-1 ～ 206402-5 (2018). DOI:
10.1103/PhysRevLett.120.206402(241) Site-Sensitive X-ray Photoelectron Spectroscopy of Fe3O4 by Photoelectron Diffraction, Yusuke Hashimoto, Munetaka Taguchi, Shun Fukami, Hiroki Momono, Tomohiro Matsushita, Hiroyuki Matsuda, FumihikoMatsui, Hiroshi Daimon, Surface and Interface Analysis 51, 115–119 (2019). DOI: 10.1002/sia.6568(242) Correlation between Ni Valence and Resistance Modulation on a SmNiO3 Chemical Transistor, Daiki Kawamoto, Azusa N. Hattori, Mahito Yamamoto, Xin Liang Tan, Ken Hattori, Hiroshi Daimon, and Hidekazu
Tanaka, ACS Appl. Electron. Mater. January, (2019), 1, 82-87. https://doi.org/10.1021/acsaelm.8b00028(243) Defect Detection in Semiconductor Materials by Luminescence Analysis, Keita Kataoka,Tetsuo Narita,Hiroko Iguchi,Masakazu Kanechika,Ken Hattori,Aishi Yamamoto and Tetsu Kachi, R&D Review of
Toyota CRDL,Vol.50 No.1Mar (2019) 1-9(244) Disorder and mixed valence properties of Sr2FeMoO6 studied by photoelectron diffraction and x-ray absorption spectroscopy, Munetaka Taguchi, Fumihiko Matsui, Naoyuki Maejima, Hirosuke Matsui, Hiroshi
Daimon, Surface Science, 683, 53-56 (2019). (Available online 6 February 2019).
https://doi.org/10.1016/j.susc.2019.02.001(245) 原子層制御したシリコン三次元立体表面構造の創製・観察技術, 服部 梓, 竹本 昌平, 楊 昊宇,
服部 賢, 大門 寛, 田中 秀和, 表面と真空、62 (2019) 427-432 (Published 10 July,2019).
https://doi.org/10.1380/vss.62.427(246) Shape-fitting analyses of two-dimensional X-ray diffraction spots for strain-distribution evaluation in a βFeSi2 nanofilm, S. Takemoto, K. Hattori, M. Someta, A. N. Hattori, H. Tanaka, K. Kurushima, Y. Otsuka andH. Daimon, Journal of Applied Crystallography, Volume 52, Part 4, pages 732-744 (August 2019).
https://doi.org/10.1107/S1600576719007234(247) Effects of off-stoichiometry in the epitaxial NdNiO3 film on the suppression of its Metal-Insulator-Transition
properties, Yamanaka, Takashi; Hattori, Azusa; Pamasi, Liliany; Takemoto, Shohei; Hattori, Ken; Daimon,
Hiroshi; Sato, Kazunori; Tanaka, Hidekazu, ACS Appl. Electron. Mater. 2019, 1, 2678−2683(248) Atomic-resolution holography for active-site structure, Hiroshi Daimon, Jpn. J. Appl. Phys. 59, 010504
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(2020). STAP REVIEW: Frontier of active site science: new insights on material functions.
https://doi.org/10.7567/1347-4065/ab5f48(249) Development of Simple Display-type VD-WAAEL Analyzer, H. Momono, H. Matsuda, L. Tóth, H. Daimon, e-Journal of Surface Science and Nanotechnology 18, 1−5 (2020).

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