Space-resolved VUV and EUV spectrometers
T. Oishi, M. Goto, Y. Kawamoto
e-mail: oishi@nifs.ac.jp

1.

Purpose / Application[1] Vertical profiles and two-dimensional distributions of edge and core VUV and EUVemissions[2] Vertical profile of edge Ti and flow
[3] Spectral shape (absorption effect, Stark effect)2.

Name of analysis (Kaiseki) data / module of MyView2
none

General Description (Port, field line, time resolution, spatial resolution, number ofchannels, etc.)
3.1. Space-resolved 3m VUV spectrometer system-Wavelength range: 300-2000Å.
- Time resolution: 20-200ms- Observation area: 1.2mVx0.5mH.
- Spectral resolution: 0.15 Å at entrance slit width of 20μm.
3.2. Port assembly3.

- #10-O port (see Fig. 1)- High-spatial resolution mode with edge vertical observation: use of space-resolved slit
- Low-spatial resolution mode with full vertical observation: use of space-resolved slit andmirrors

Figure 1 Viewing chords of space-resolved 3m VUV spectrometer system.

3.3. Space-resolved EUV spectrometer systems-Wavelength range: 10-600Å.
- Time resolution: 50-200ms- Observation area: 1.2mVx0.5mH.
3.4. Port assembly- #10-O port (see Fig. 2)

Figure 2 Viewing chords of space-resolved EUV system.

4.

Requirement in use- Before experiment: opening swing and gate valves, turning on power supply and setting
CCD parameters-After experiment: closing valves and turning off power supply

5.

Description of analysis (Kaiseki) data / module of MyView2
none

6.

Others- Example of full vertical profiles of (a) line intensity and (b) Ti from CIV at 1548.20 × 2Å (see Fig. 3).

Figure 3 Full vertical profiles of (a) line intensity and (b) Ti from CIV at 1548.20 × 2Å.

- Example of vertical profiles of impurity spectral lines (see Fig. 4).

Figure 4 Vertical profiles of impurity line emissions from EUV systems.

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and others