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=£Ƿ ǟĊɓĹĜ-ǌě ǰĊɓȐĚ ¹ıòǆƼǅȹƮƋƞÐċƼǅļ ƟýȔƐǁċƼǅ_`ȕȱÁūɊİȶȅūibf230-0045 ƿćĜƵžƍğɏȁÒŤĤƦ 1-7-22
How to take electron micrographs of fighting plants vs microbe
Mayuko Sato, Naeko Shinozaki-Narikawa, Kiminori Toyooka
RIKEN Center for Sustainable Resource ScienceSuehiro-cho 1-7-22, Tsurumi-ku, Yokohama, Kanagawa 230-0045, Japan
Key words: CLEM, Electron microscopy, FE-SEM, GFP, TEM
DOI: 10.24480/bsj-review.8a1.00110
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ǅ(A) 24687007 (ǼɗȐĚ)ɓ ŅĻƯǴǯƼǅ 23657051 (ǼɗȐĚ)3ADŏŌHÝ<#)!/'de Boer P., Hoogenboom J.P. & Giepmans B.N. 2015. Correlated light and electron microscopy: ultrastructure lights up!. Nat. Methods. 12:503513.
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