The International Digital Image Correlation Society will be teaching some of its
most popular courses for the first time in-person in Asia on
Monday, October 9, 2023
before the ATEM-iDICs ’23 meeting in Awara, Fukui, Japan!
Course fees:
One full-day class
120,000 yen (about $800) without conference attendance
100,000 yen (about $700) with conference attendance
One half-day of class
60,000 yen (about $400) without conference attendance
50,000 yen (about $350) with conference attendance
Enrolled university students get a 50% discount on class fees

Afternoon Sessions

Morning Sessions

Overall Course Schedule
Monday, October 9, 2023
DIC 101
Practical Considerations for
Good DIC Measurements
part 1

DIC 201
Advanced DIC Concepts andUncertainty Quantification
part 1

Elizabeth Jones
Amanda Jones
Sandia National Laboratories

Phillip L. Reu
Sandia National Laboratories

DIC 101
Practical Considerations for
Good DIC Measurements
part 2

DIC 201
Advanced DIC Concepts andUncertainty Quantification
part 2

Elizabeth Jones
Amanda Jones
Sandia National Laboratories

Phillip L. Reu
Mark A. Iadicola

Mark A. Iadicola
National Institute ofStandards and Technology

Model Validation andMaterial Testing 2.0
Validating FE models andfinding material parameters
using DICPascal Lava
MatchID

Localized Spectrum Analysis(LSA) Method
Using Periodic Patterns toMeasure 2D Displacementand StrainBenoît Blaysat
Université Clermont
Auvergne

Monday, October 9, 2023, Full Day Class, 9:00 to 16:30 (Full Day)
DIC 101: Practical Considerations for Good DIC Measurements –What is in the Good Practices Guide.
COURSE DESCRIPTIONThe Good Practices Guide for Digital Image Correlation (GPG) defines theknowledge and skills required to conduct DIC measurements in conjunction
with mechanical testing of a planar test piece. Furthermore, the GPG defines
the knowledge required to obtain Level 1 certification(https://idics.org/certification). The GPG is available athttps://doi.org/10.32720/idics/gpg.ed1. This course will delve into all thetopics covered in the GPG in detail, focusing on practical applications of DIC
rather than theory or algorithms. It is designed as training for new practitionersof DIC to supplement vendor-based training and on-the-job training, and as arefresher course for those who will be taking the Level 1 certification exam.
Topics covered will include:• Basic and fundamental 2D and Stereo-DIC concepts• Design of DIC measurements• Preparation for DIC measurements• Camera calibration• Test execution concepts• Strain calculations and basic Virtual Strain Gauge size studies• DIC processing techniques• DIC reporting requirements
WHO SHOULD ATTENDDIC users who would like a thorough review of the iDICs Good Practices Guidefor Digital Image Correlation (GPG), and people who will be taking the Level 1
certification exam.

Dr. Elizabeth Jones (Sandia National
Laboratories). Dr. Jones received
her PhD in Theoretical and Applied
Mechanics at the University ofIllinois at Urbana-Champaign. She iscurrently a principal member oftechnical staff at Sandia National
Laboratories in Albuquerque, NM,
where she applies DIC for material
model calibration/validation andpushes the boundaries of DIC tocomplex and extreme loading
environments.

Dr. Amanda Jones (Sandia NationalLaboratories) Dr. Jones received her
PhD in Theoretical and Applied
Mechanics at the University of
Illinois at Urbana-Champaign. She iscurrently a principal member oftechnical staff at Sandia National
Laboratories in Albuquerque, NM,
where she applies DIC to material
characterization efforts andcomplex loading conditions/specimen geometries/ size scales.

Monday, October 9, 2023, Full Day Class, 9:00 to 16:30 (Full Day)
DIC 201: Advanced DIC Concepts and Uncertainty
Quantification
COURSE DESCRIPTION
The advanced DIC class will cover what is underneath and beyond the Good
Practices Guide (GPG). The theme will be to understand where DIC errors
come from and work through all the components in DIC that lead to themeasurement errors. For example, how to pick a DIC lens and camera (andwhy), what are the associated errors with various lenses and how do you
quantify them. Why does the GPG specify 3-5-pixel speckles? What are theunderlying principles? Understanding the camera calibration and theparameters and what makes a good calibration. Where does the matching
uncertainty come from?
Concepts of advanced uncertainty quantification on the DIC measurement will
also be discussed including a thorough look at the 2D matching error
magnitudes. Stereo-DIC errors and advanced virtual strain gauge studies will
also be discussed.

Dr. Phillip L. Reu is aDistinguished Member of TechnicalStaff at Sandia National Laboratories.
Phillip specializes in developing novel
full-field measurement techniques inpreviously un-measurable regimes
often using digital image correlation(DIC). Current research efforts in DIC
are focused on uncertainty
quantification. Phillip is the author of
the “Art and Application of DIC” article
series in the journal of ExperimentalTechniques, chair of the DIC Challenge,president of the International Digital
Image Correlation Society (iDICs), andpaterfamilias to 6 kids.

COURSE CONTENT• Uncertainty quantification: What
influences my DIC measurement?
• Factors in selecting a DIC lens• Selecting a DIC camera.
• What makes a good DIC pattern and why.

• Calibration: Understanding the parameters• Calibration: What makes a good calibration• 2D and pattern matching uncertainty.
• Stereo-DIC uncertainty quantification• Understanding the VSG.

WHO SHOULD ATTENDThis course will go beyond the information needed for a Level 1 certification
exam and target what is needed for Level 2 certification. All DIC users who
would like to learn more about what influences their measurement
accuracy.

Dr. Mark A. Iadicola isa Staff Scientist at the National Instituteof Standards and Technology. Mark 's
research interests include advanced
experimental methods in solidmechanics as applied to multi-axial
plastic deformation and stress induced
phase transformation, with special
emphasis on sheet metal forming andshape memory alloys (e.g. Nitinol).
Mark is a past president of theInternational Digital Image Correlation
Society (iDICs), a USA/ANSI Delegate tovarious subcommittees of the ISO
TC164 Mechanical Testing Committee,
and an active Member of Committee
E28 on Mechanical Testing in ASTM
International.

Monday, October 9, 2023, Morning Class, 9:00 to 12:30 (½ Day)Model Validation and Material Testing 2.0 via Full-Field Data
COURSE DESCRIPTION
Digital Image Correlation (DIC) is gradually becoming a standard tool inexperimental mechanics, for both industry and academia. Despite the fact thatthe measurement system is often sold with the argument of being easy in use
and setup, a poor understanding of issues arising in the whole measurement
chain (imaging, noise, correlation algorithm, smoothing, …) can result in poor or
misinterpreted results.
In this course, special attention is paid to MatchID ’s solutions to material
identification and model validation with a quantitative interpretation of theresults. It is illustrated how DIC uncertainties impact the identified properties
and final model validation decisions.

The workshop is led by Dr. Pascal
Lava from MatchID – Metrology
beyond colors, Belgium. He brings awealth of experience in the practicalapplication/data analysis of DIC andthe identification of mechanicalmaterial properties.
http://www.matchidmbc.com

Having access to the spatial distribution of strains at the surface of the material
via DIC enables the use of more complex test configurations to identify themechanical behavior of materials via the Virtual Fields Method (VFM). Thismethod is now fully integrated into MatchID ‘s analysis platform allowing aseamless coupling with DIC data. This method is an alternative to Finite Element Model Updating over which
it has several specific advantages, among which much shorter computation times. Both linear and non-linear
model examples will be included. It is demonstrated how DIC’s resolution and spatial resolution might
influence the final identified material properties. A methodology is presented to both evaluate themeasurement performance and to optimize the test setup.

In a second slot, the above-mentioned concepts are then adopted to get an intuitive feeling on how MatchID
approaches the validation of an FEA model. The methodology relies on the use of synthetic speckle image
deformation to produce validation maps of finite element models from DIC data. The underpinning novelty is
the fact that it considers the filtering effects of DIC, which according to MatchID, is a compulsory step toobtain robust validation. Again, the ideas are outlined based on practical examples with a clear
demonstration of MatchID ‘s finite element validation module.
The principal goal of this workshop is not to provide a detailed theoretical study on DIC, VFM and FEA
validation, but to focus on possible problems and general concepts via practical examples and how this is all
integrated within MatchID.
WHO SHOULD ATTEND

Practitioners of DIC at post graduate level working in both academia and industry. In addition, engineers andresearchers who have an interest in the use of full- field strain measurements to extract mechanicalproperties of materials or validate FEA models. Basic knowledge of DIC is required.

Monday, October 9, 2023, Afternoon Classes, 13:00 to 16:30 (½ Day)
Localized Spectrum Analysis (LSA) Method: Using Periodic Patterns to Measure 2D
Displacement and Strain
COURSE DESCRIPTION
Local Spectrum Analysis (LSA) is a technique suitable for in-plane
displacement and strain measurement. It relies on a periodic marking of thesurface under investigation. This regular pattern acts as a spatial wave
carrier, and the sought displacement components induce phase modulationsof this carrier. Images of this periodic marking, which progressively deforms
during a test, can be advantageously processed with LSA. With the windowed
Fourier transform, it is shown that displacement and strain components are
obtained quasi-directly, which allows the fast and pixelwise determination of
the displacement and strain fields.
The aim of this course is to provide the LSA basics, with a special emphasis on
its theoretical foundation and its metrological performance. Practical aspects
concerning its implementation will also be discussed. Half of the course will
be organized as a workshop, in which typical examples will be processed.
Attendees should indeed come with their own laptop with Python and someusual libraries preinstalled.

The workshop is led byPr. Benoît Blaysat (UniversitéClermont Auvergne)
Benoit.blaysat@uca.fr
Benoit Blaysat has been a professor
at the Clermont Auvergne
University (Institut Pascal, France)since 2020. After a Ph. D. incomputational mechanics (LMPS,former LMT Cachan, France), he
decided to focus his research on
experimental mechanics, moreparticularly on full-fieldmeasurement techniques and therelated inverse problems raised bytheir use for material
characterization purposes.

COURSE CONTENT• Marking surfaces with periodic patterns.
• Processing images of periodic patterns to extract displacement andstrain fields.
• Recent examples of use in mechanics of material and structure.
• Metrological performance: measurement resolution, bias, spatialresolution, relationship between these quantities.
• Workshop: processing various sets of dedicated images with Python programs provided to theattendees.
WHO SHOULD ATTENDEngineers and researchers who are seeking an alternative technique of DIC, in particular in cases for which a
good compromise between spatial resolution and measurement resolution is needed, for instance to capturesmall details in strain maps.