Recent XAFS development and its application in Shanghai
Synchrotron Radiation Facility
Zheng Jiang
Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy ofScience, Shanghai 201210, China
Shanghai Institute of Applied Physics, Chinese Academy of Science, Shanghai 201800, China

Keywords: Shanghai Synchrotron Radiation Facility, XAFS, XES, Energy-related catalysis
Abstract: Zhangjiang Comprehensive National Science Center in Pudong, Shanghai consistsof Shanghai Synchrotron Radiation Facility (SSRF), Shanghai Soft X-ray Free-Electron Laser
User Facility (SXFEL-UF) and Shanghai High Repetition Rate XFEL and Extreme Light
Facility (SHINE), forming advanced spectroscopic platforms[1-3]. Abundant synchrotron
radiation X-ray spectroscopy (SRXS) methods, including XAFS, X-ray emission spectroscopy(XES), energy-dispersive XAS (EDXAS) and operando/in situ measurement have beendeveloped and applicated, offering nonnegligible characterization assistance to researchers in
the field of catalysis, material and chemistry. SRXS is a unique method to study the local atomicand electronic structure of materials. In recent years, with the complication of energy-related
catalytic system, the establishment of the correlation between atomic structure and the catalytic
properties has been more and more important. Catalytic systems such as CO2 electrochemical
reduction, syngas conversion, oxygen reduction and so on provide a promising reaction routefor energy conversion, and SRXS technology is widely used in atomic structure
characterization of the catalysts[4-7]. Especially through in-situ SRXS measurement, theadsorption and dissociation of intermediates are finely resolved, the atomic and electronic
structure changes during the reaction process are clarified, thus providing powerful evidence
for the reaction mechanism.
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