ASYLUM RESEARCHERGOAll-New AFM User Interface

Ergo: Repeatable Results in Minutes
Ergo is the all-new software interface that is included with allAsylum Research Cypher and Jupiter atomic force microscopes.
Based on the powerful Oxford Instruments AZtec® software platform,
it improves productivity for both infrequent users and experts. A
streamlined workflow enables quick and simple AFM setup andacquisition of high-quality images.
Auto AFM Calibration in Seconds
Ergo’s workflow makes setting up the AFM quick and simple for everyone. Go from loading anew probe to aligning the laser with only a few clicks. In the background, Asylum’s proprietary
GetReal™ technology automatically calibrates the cantilever each time to help ensure themost consistent results from day-to-day. This makes it easy to quickly image multiple samples.

Rapid Generation of High-Quality Images
The most common AFM measurement is the acquisition oftopographical images in air. Ergo has embedded Asylum’sproprietary AUTOPILOT™ algorithm, which automaticallycalculates the optimal imaging settings and starts
producing high-quality data from the first scan line.

Minimal Training Required
Ergo shares a common core and workflow concept with
the Oxford Instruments AZtec software for SEM and TEM
analyzers. This tried and tested platform allows users tofocus on results and not on the equipment.

2SEBS triblock copolymer

Tapping mode phase image of a triblock
copolymer (SEBS) spuncoat onto a siliconwafer, 1 µm scan. The cover image shows
the same sample but a 7 µm scan.

The Future of AFM Control

Ergo user interface is simple and organized
A clear workflow guides users through setup and allows them to start imaging quickly. Only a few key
parameters are shown by default.

Watch a video
introduction at:AFM.oxinst.com/Ergo3

“Ergo has made the high performance of our Cypher AFM accessible to more users
at our facility, including those who are newer and less experienced with AFM.”
Justin Jureller, PhD, MRSEC MPML Manager, University of Chicago

Automated Image Optimization Works on a Wide Variety of Sample Types
Asylum’s AUTOPILOT algorithm has been developed to work on all sample types commonly
found in academic and industrial research, even very challenging samples, for example,
samples that have high roughness or traditionally cause high tip-sample adhesion.

10 μm

Polymer blend
AFM is a powerful tool for
visualizing the microstructure ofpolymers, here a polystyrenepolycaprolactone blend.

10 nm

PTFE membrane
Ergo easily achieves highresolution using AUTOPILOT,
here resolving the individual
PTFE molecule chains.

250 nm

PMR disk drive media
Roughness and defects are key
quality control metrics on disk
drive media that affect data
storage density.

250 nmSilicon wafer
Substrate roughness is oneof the most common AFM
measurements. Ergo makes it
simple and repeatable.

Advanced Mode Operation
Ergo works in concert with Asylum’s IGOR Pro-based software that is supplied with everysystem. Expert users have the ability to operate more advanced modes and exercise thefull customization capabilities of the AFM. The combination of the two provides users withunmatched flexibility.
4Easily Analyze and Present AFM Images
AFM images can be analyzed directly in Ergo without the need for other software. An
intuitive workflow guides the user to sort, process, and analyze AFM data. Results are
stored directly with the images so they cannot be lost, and the raw data is never altered.

Measuring the height differences between two regions on a polymer sample.

Measuring the height of a feature on a line section.

5Find the best AFM
for your research!
AFM.oxinst.com
AFM.info@oxinst.com+1-805-696-6466

Measuring roughness parameters on several material types.

200 nmPolished silicon wafer

200 nmGlass disk drive media substrate

200 nmChemically strengthened
display glass

1 µm

Coated photo paper

Learn more about Ergo: https://AFM.oxinst.com/Ergo

The foregoing brochure is copyrighted by Oxford Instruments Asylum Research,Inc. Oxford Instruments Asylum Research, Inc. does not intend the brochureor any part thereof to form part of any order or contract or regarded as arepresentation relating to the products or service concerned, but it may, withacknowledgement to Oxford Instruments Asylum Research, Inc., be used,applied or reproduced for any purpose. Oxford Instruments Asylum Research,Inc. reserves the right to alter, without notice the specification, design orconditions of supply of any product or service. 6/2020

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