Fifth Japan-Canada
Microscopy Societies Joint Symposium2024
第５回 日本‐カナダ顕微鏡学会交流シンポジウム
2024

Extending limits of electron beam analysis in nanoscience
ナノサイエンスのための電子顕微鏡による解析限界への挑戦

June 4 - 5, 2024
International Conference Hall, Makuhari Messe
Chiba, Chiba, Japan
June 3 - 4, 2024
Richcraft Hall, Carleton University
Ottawa, Ontario, Canada

Japanese Society of Microscopy (JSM)
Microscopy Society of Canada (MSC)1

This seminar is partially supported by JSPS Bilateral Program,Grant number [JP JSBP 220249906].
Financial support was provided by Soquelec Ltd. / JEOL Canada, Hitachi High-Tech
Canada, and by MSC in Canada and by JSM in Japan.
2

3

URL of web-site connection for hybrid meeting
Session 1 June 4, 2024 9:30 – 11:40 am

Tokyo time

International Conference Hall, Makuhari Messe, Chiba, Chiba, Japan
https://us02web.zoom.us/j/88007403645?pwd=Mnh2YzZNK2NSd3ZOT3hpQ2l5
SDR0UT09
Zoom Meeting ID: 880 0740 3645
Passcode: 398969
Session 2 June 4, 2024 15:00 – 18:00 pm Ottawa time
Richcraft Hall, Carleton University, Ottawa, Ontario, Canada
Zoom Meeting ID: 829 2537 3231
Passcode: 866652

4

【Preface】
Dear Participants,
We are pleased to welcome all of you to participate in the 5th Japan-Canada
Microscopy Societies Joint Symposium 2024. This joint symposium began in 2020, hasovercome the difficulties of the COVID-19 pandemic and is celebrating its fifth
anniversary this year. Furthermore, we are very pleased to have the opportunity to holdthis 5th symposium in conjunction with the 80th annual meeting of the Japanese Societyof Microscopy (JSM) and the 50th anniversary meeting of Microscopy Society of Canada(MSC).
The theme of this symposium is "Expanding the limits of electron beam analysis
in nanoscience," and it brings together with a well-balanced group of young and talented
researchers from a wide range of fields, including materials science and biological science.
We hope that this will be an opportunity to know the latest research and to deepen
discussion.
As the dates of the annual meeting of both societies coincide this year, we
decided to hold this joint symposium simultaneously at both venues with the respective
society conferences. This new attempt transcends the 13-hour time difference between
the countries to make this a truly real joint symposium.
We would like to express our sincere gratitude to Professor Shigeo Okabe ofPresident of JSM, Professor Masahide Yoshikawa of the chairperson of the 80th Meetingof JSM for kindly support to hold this symposium in parallel and providing the venue for
Session 1 in Tokyo, Professor Nadi Braidy of President of MSC, Professors Chloe van
Oostende and Jeff Fraser of the chairs of the 50th Meeting of MSC for kind support tohold this symposium in parallel and providing the venue for Session 2 in Ottawa. We
would also thank to all colleagues who cooperated in planning this symposium, and to allof you who are participating in this symposium.
We hope that the mutual exchange between these two microscopy societies willcontinue for a long time and contribute to the development of research in microscopy forthe next generation.
Sincerely,
Organizers
Ken Harada (RIKEN)
Marek Malac (NRC-NANO and University of Alberta)
Shigeo Mori (Osaka Metropolitan University)
Misa Hayashida (NRC-NANO)
5【Greetings】
Dear Esteemed Colleagues,
On behalf of the Japanese Society of Microscopy, it is my great pleasure towelcome all the microscopists, senior and young researchers, and students to the Fifth
Annual Joint Workshop of the Microscopy Society of Canada- Société du Microscopie
du Canada (MSC-SMC) and the Japan Microscopy Society (JSM), which will be held on
June 4th and 5th, 2024 in both Makuhari, Chiba, Japan and Ottawa, Ontario, Canada bothin person and online.
This workshop, “Extending limits of electron beam analysis in nanoscience,” isdesigned to update knowledge and information about the latest technologies in electron
beam analysis and its applications to nanoscience. Twelve young and talented scientists
from Canada and Japan will give lectures on their recent research progress and discusscurrent situations and future perspectives in the field. This will be an excellent
opportunity for the participants to develop networks of young researchers for futurecollaborations.
The relationship between the two societies, MSC-SMC and JSM, has beenstrengthened since the start of the joint events in 2020. This year, MSC-SMC celebrates
its 50th anniversary, and JSM will hold the memorable 80th Annual Meeting. Furthermore,
the schedule of the annual meeting of the two societies happens to be overlapped. The
two-day events include both on-site interaction in two meeting places and online accessto the event, which will facilitate remote interaction of microscopists in two meetings.
This event is expected to set a new stage for the interaction of two microscopic societies.
I look forward to having a great workshop with great scientists from twocountries and sharing new and exciting research in electron microscopy.

Yours sincerely,

Shigeo Okabe, (University of Tokyo)
President of The Japanese Society of Microscopy

6

【Greetings】
Dear Esteemed Colleagues,
I am delighted to extend a heartfelt welcome to all participants of the 5th Annual
Joint Symposium between the Journal of Microscopy (JSM) and the Microscopy Societyof Canada (MSC). It brings me great pleasure to convene this gathering of our twosocieties for the fifth time in the framework of the annual meeting of the MSC. This
meeting is special as it marks the 50th anniversary of the creation of the MSC.
The previous editions of this event have highlighted our common passion for
microscopy and advanced materials R&D together with the complementarity of our
microscopy societies. It is now clear that the partnership between our microscopysocieties exemplifies the spirit of international collaboration, offering a platform for theexchange of ideas, techniques, and experiences. Let the synergy between our societies
offer opportunities for collaboration and mutual growth for scientific discovery andcultural exchange.
Through initiatives such as this symposium, we have the chance to explore new
avenues of cooperation, whether through joint research projects, student exchange
programs, or collaborative publications. By coming together, we can harness the diverse
perspectives and innovative approaches of both Japanese and Canadian microscopy
communities to address pressing scientific challenges, new research opportunities anddrive technological innovation.
I wish to express my sincerest gratitude to the organizing committee, especially
Marek Malak and Misa Hayashida from the MSC and Ken Harada and Shigeo Mori fromthe JSM, the sponsors of the symposium: JSPS, Soquelec Ltd. / JEOL Canada, Hitachi
High-Tech Canada, and all contributors whose dedication has made this symposium
possible. Your tireless efforts have laid the groundwork for what promises to be anenriching and intellectually stimulating experience for all involved.
In the spirit of collaboration and camaraderie, I encourage each of us to actively
engage in discussions, forge new connections, and foster lasting collaborations. Together,
let us seize this opportunity to inspire and be inspired, as we continue our journey offriendship, collaboration, and mutuality, strengthening the bonds between our societies
and fostering a future of shared scientific endeavors.
Warm regards,

Nadi Graidy, (Université de Sherbrooke)
President of Microscopy Society Canada
7

【Scientific Program】
Session 1 (Tokyo time: Tuesday, June 4, 2024)
Web connecting 09:00 – 09:30
Opening address 09:30 – 09:35
Prof. Shigeo Okabe (President of JSM)
C-1 09:35 – 10:00
Rinyaporn Phengchat (Nanotechnology Research Centre, National Research ofCouncil)Visualization of surface structures and protein localization in plant chromosomes
J-1 10:00 – 10:25
Shun Narai (Sumitomo Pharma Co, Ltd.)
Understanding Crystal Surface Molecular Arrangement: Integration of Optical/ScanningElectron Microscopy and 3D ED/MicroEDJ-2 10:25 – 10:50
Takumi Higuchi (Akita Prefectural University)
Small-angle beam deflection measurement towards quantum-enhanced electron
microscopy
C-2 10:50 – 11:15
Makoto Tokoro Schreiber (NRC-NANO)
The NanoMi open-source electron microscopy platform: progress and hardware
implementations
J-3 11:15 – 11:40
Hikaru Saito (Kyushu University)
Momentum-Resolved Cathodoluminescence of a Plasmonic Crystal Containing a
Phosphor Thin Film

Session 2 (Ottawa time: Tuesday, June 4, 2024)
Web connecting 14:30 – 15:00
8

J-4 15:00 – 15:25
Akira Noga (Chuo University)
Cryo-electron tomography reveals novel Bld10p/Cep135 filamentous structurescontributing to the nine-fold symmetry of centriole
J-5 15:25 – 15:50
Shusuke Kanomi (Tohoku University)
Hierarchical Structures of Semicrystalline Polymers Revealed by Nanodiffraction
Imaging Based on Four-dimensional Scanning Transmission Electron Microscopy
J-6 15:50 – 16:15
Emi Kano (Nagoya University)
Atomic resolution analysis of extended defects and their evolution during annealing in
Mg ion-implanted GaN
C-3 16:15 – 16:40
Karen L. Kavanagh (Simon Fraser University)
Semiconductor Nanowire Junction Potential Maps
J-7 16:40 – 17:05
Hirokazu Tamaki (Nagoya University)
Wavefield reconstruction using full-field illumination ptychography with a structured
electron beam
C-4 17:05 – 17:30
Kenneth Beyerlein (Institut national de la recherche scientifique (INRS))
Streak Imaging in a Dynamic Transmission Electron MicroscopeC-5 17:30 – 17:55
German Sciaini, (University of Waterloo)
The Ultrafast Electron Imaging Lab: Where Electrons, Light, Nanofluidics, and People
Meet
Closing address 17:55 – 18:00
Prof. Nadi Braidy (President of MSC)
9

Session 1 C-1

Visualization of surface structures and protein localizationin plant chromosomes
Rinyaporn Phengchat1*, Channarong Sartsanga2, Toshiyuki Wako3,
Kiichi Fukui4, Nobuko Ohmido2,
1

Nanotechnology Research Centre, National Research of Council, Canada

2

Graduate School of Human Development and Environment, Kobe University, Japan

3

Institute of Crop Sciences, National Agriculture and Food Research Organization, Japan

4

Graduate School of Pharmaceutical Sciences, Osaka University, Japan*Rinyaporn.phengchat@nrc-cnrc.gc.ca

In plant, rod-like structures of chromosomes are formed, similar to animals,
through the condensation of interphase chromatin during cell division. In spite of large
size and small number per cell, studies of plant chromosome structure are limited due tothe complicated procedure for chromosome extraction. The presence of cell wall andpolysaccharides in the plant cells can attach to chromosomes and obscure the observation.
In addition, a standard procedure for plant chromosome isolation includes ethanol-acetic
acid fixation that partially destroy chromosomal proteins, leading to a controversy of thechromosome structures.
In this study, we developed a procedure to extract individual chromosome insolution from barley (Hordeum vulgare) root tips without prior fixation with the ethanolacetic acid. And we prepared the chromosomes with the application of ionic liquid (IL),instead of drying, for high-resolution microscopic observation. Two types of microscopes
were employed to elucidate structures of isolated barley chromosomes. First, helium ion
microscope (HIM) was used to visualize chromatin fibers at the chromosome surface.
Second, high voltage transmission electron microscope (HVTEM) was used for localizing
immunogold labelled Topoisomerase II (Topo II), a major non-histone protein found inboth plant and animal chromosomes. HIM observation (Fig. 1) revealed fibrous structures
covering the entire length of the barley chromosome. The fibers were fold and randomly
connected. Interestingly, unlike at chromosome arms, the chromatin fibers at centromericregion appeared as straight lines stretching toward both arms of the chromosome. Fig.2
shows the localization of Topo II throughout the barley chromosome length. Dissimilar
to animal chromosomes where Topo II exhibits an axial localization, Topo II in barley
chromosomes localized dispersedly in the arm regions and only accumulated at the twochromosome constrictions; the centromeres and the nucleolus organizing regions; and at
the telomeres. Our finding indicates the difference of the chromosome organization in10

plants compared to the reported animal chromosomes that may explain the superior
genome compaction capability of plant chromosomes.
Acknowledgment: We would like to thank Dr.Kimihiro Norizawa (Nanotechnology OpenFacilities Center), Prof. Dr. Kaoru Mitsuoka and Dr.Naoko Kajimura (Research Center for UltraHigh Voltage Electron Microscopy) at Osaka University for their guidance regarding the
microscope observation.
Reference[1] Sartsanga, C., Phengchat, R., et al. Chromosome Res 29, (2021), 81–94.
[2] Sartsanga, C., Phengchat, R., et al. Micron 179, (2024), 103596.

Fig. 1 Barley chromosome observed by HIM. Network of chromatin fibers was observed through thewhole length of the chromosome excepted at the centromere where straight chromatin fibers wereobserved.

Fig. 2 Distribution of Topo II in metaphase barley chromosomes. Images from both optical
microscope and HVTEM showed differential distribution and density of Topo II at telomeres,
centromeres, and the NORs compared to arm regions.
11Session 1

J-1

Understanding Crystal Surface Molecular Arrangement:
Integration of Optical/Scanning Electron Microscopy and 3D
ED/MicroED
Shun Narai（奈良井峻）1*, Koji Yonekura (米倉功治)2
1

Pharmaceuticals Analytical Research Group, Analytical Research & Development

Laboratories,Technology Research & Development Division, Sumitomo Pharma Co, Ltd., 3-1-98
Kasugade-naka, Konohana-ku, Osaka, 554-0022, Japan.
2

Biostructural Mechanism Laboratory, RIKEN SPring-8 Center, Harima Institute, 1-1-1 Kouto,

Sayo, Hyogo, 679-5148, Japan*shun.narai@sumitomo-pharma.co.jp

Controlling the physical properties of solid dosage forms, such as solubility andstability, is crucial for maintaining the efficacy, safety, and quality of pharmaceuticals. It
is well known that not only the differences in the interior molecular arrangement of active
pharmaceutical ingredients but also the surface molecular arrangement can influence their
physical properties[1]. Therefore, understanding the molecular arrangement both insideand on the surface of crystals is highly important for controlling the functionality ofpharmaceuticals.
In this study, we propose a new method to elucidate the molecular arrangementof both crystal inside and surfaces, combining observation of crystal morphology using
optical microscopy and/or scanning electron microscopy, and analysis of crystal
structures and crystal lattice orientation using 3D ED (3 Dimensional Electron
Diffraction)/MicroED (Microcrystal Electron Diffraction) with transmission electron
microscopy. By connecting the crystal lattice orientation, crystal structure, and crystal
shape information, the molecular arrangement on the crystal surface can beexperimentally determined.
We have validated this method with mefenamic acid crystals. A flat hexagonal
crystal shape was observed with optical microscopy (Fig. 1), and the crystal structure wasdetermined by 3D ED/MicroED (Fig. 2). By combining the information on crystal latticeorientation analysed from the UB matrix, a crystal surface model was created (Fig. 3).
With this capability, it may eventually be possible to obtain the surface charge distribution
on crystal surface through precise analysis of the Coulomb potential, thereby accelerating
research on the properties of crystal surfaces in the future.
12References:[1] Molecular Basis of Crystal Morpology-Dependent Adhesion Behavior of mefenamic Acid During
Tableting. Vrushali Waknis, Pharmaceutical Research, Vol. 31, page.160-172 (2014)

Fig. 1. Mefenamic acid crystals ona sample support grid for MicroED
analysis. Most of crystal are flatplanner hexagonal shapes.

Fig. 2. A transmission electron image and electron
diffraction pattern of a mefenamic acid crystal.

Fig. 3. A combined crystal model incorporating both crystal structure and hexagonal-shaped
crystal morphology. The model has revealed that the c-axis of the crystal lattice is nearlyvertical to the flat planner of the crystal.

13

Session 1

J-2

Small-angle beam deflection measurement towards
quantum-enhanced electron microscopy
Takumi Higuchi（樋口 琢己）1, Takeru Nagashima（永嶋 彪流）1,
Shigeo Miura（三浦 茂男）1 and Hiroshi Okamoto (岡本 洋) 1*
1

Graduate School of Systems Science and Technology, Akita Prefectural University, Akita,

015-0055, Japan*okamoto@akita-pu.ac.jp

A major problem in electron microscopy of biological and/or soft materials is radiation
damage. The dilemma is that a large dose of electrons destroy the specimen, whereas asmall dose of electrons result in poor signal-to-noise ratio because of the shot noise. In alimited sense, this problem has been solved by classical averaging methods such as single
particle analysis [1]. However, we have no way to improve the resolution of single objects
found in, e.g., a thin slice of a frozen cell. Despite the seemingly intractable nature of the
problem of radiation damage, quantum metrology offers a valid avenue of attack. A
variety of quantum electron microscopy (QEM) schemes have already been proposed [2,3], which could go beyond the shot noise limit to approach the Heisenberg limit. On theother hand, experimental effort towards QEM is still in its infancy [4, 5].
We work on a QEM scheme based on superconducting qubits [6]. A superconducting
qubit is capable of generating a quantum superposition of distinct electromagnetic fields.
Hence an electron passing by the qubit gets entangled with the qubit. It is known that suchentanglement may be exploited to produce a better resolution. However, theelectromagnetic field generated by a qubit tends to be small and deflects the electron beam
only slightly. Let the electron wave length and the width of the qubit be 𝜆𝜆 and 𝑤𝑤 ,respectively. The smallest deflection angle we can use is the natural diffraction spread
𝜆𝜆⁄𝑤𝑤 . Hence, from the experimental standpoint, we should be capable of detecting such asmall beam deflection generated by a device placed in a millikelvin environment.
In our proof-of-concept experiment, we design an electron-optical setup for measuring
a small-angle deflection. We perform our experiment at room temperature, but the
instrument is designed to work in principle at a temperature generated by a dilution
refrigerator. In particular, we detect the electrons by the Faraday cup, because, unlike thesemiconducting detectors, it could be used at millikelvin temperature.
14

Figure 1 shows an image of the small-angle measurement apparatus under construction.
From the left are the electron gun, an extraction electrode, an 𝑥𝑥 − 𝑦𝑦 deflector, and afluorescent screen. The ultrahigh vacuum chamber (not shown) enables a use of a fieldemitter stably. A set of small electrodes will be placed just at the downstream side of theextraction electrodes to simulate a qubit. We plan to replace the fluorescent screen with apinhole aperture followed by the Faraday cup, to measure the 2D distribution of theelectron beam intensity at cryogenic temperatures. We plan to benefit from the opensource NanoMi project [7] when we implement a controller for the 𝑥𝑥 − 𝑦𝑦 deflector.
Acknowledgment:

We thank Dr. Marek Malac, P. Eng. Darren Homeniuk (Nanotechnology Research Centre Canada) and
Dr. Ismet I. Kaya (Sabanci University) for useful discussions. This research was supported by JSPS
KAKENHI (Grant Number 19K05285).
References:[1] E. H. Egelman, Biophys. J. 110, 1008 (2016).
[2] P. Kruit et al., Ultramicroscopy 164, 31 (2016).
[3] I. Madan et al., Appl. Phys. Lett. 116, 230502 (2020).
[4] A. E. Turner et al., Phys. Rev. Lett. 127, 110401 (2021).
[5] S. A. Koppell et al., Ultramicroscopy 207, 112834 (2019).
[6] H. Okamoto et al., Micron 161, 103330 (2022).
[7] M. Malac et al., Micron 161, 103362 (2022).

Fig. 1 Electron optical system being assembled. Lenses and other components can be placed freely
on our electron optics testbed. In the photo, from left to right, an electron gun, an extractor, adeflector, a grounded mesh, and a fluorescent screen are installed.

15

Session 1

C-2

The NanoMi open-source electron microscopy platform:
progress and hardware implementations
Makoto Tokoro Schreiber1,2, Marek Malac1,2, Mark Salomons1 Darren Homeniuk1, Sam
Ruttiman1,2, Xuanhao Wang3, Ka Wing Kwan1, Olivier Adkin-Kaya4, Mohammad
Kamal4, Jesus Alejandro Marin Calzada2, Patrick Price1, Martin Cloutier1, Misa
Hayashida1, Ray Egerton2, Ken Harada5, Yoshio Takahashi6, Heiko Müller7
1

NRC-NANO, Edmonton, Alberta, Canada. 2 Dept. of Physics, U. of Alberta,
Edmonton, Alberta, Canada. 3 Dept. Comp. Sc., U of Alberta, Edmonton, Alberta,
Canada. 4 Dept. El. and Comp. Eng, U. of Alberta, Edmonton, Canada. 5 CEMS,
RIKEN, Hatoyama, Saitama, Japan. 6 R&D Group, Hitachi, Ltd., Hatoyama, Saitama,
Japan. 7 CEOS GMbH, Heidelberg, Germany.
*mschreib@ualberta.ca

We have been developing a public license electron microscopy platform: NanoMi (ナノ美) [1,2]. The NanoMi platform currently includes electrostatic lenses, deflectors,
stigmators, detectors, the associated control electronics, and Python-based software forcontrol of the respective components. All components are designed to be easily
manufacturable as well as to be independent of the vacuum envelope of the microscope;so that they may be incorporated into existing vacuum systems including custom-madechambers. With the presently available components, it is possible to build TEM, STEM,
SEM, and electron diffraction systems. The components are designed for modest
imaging performance with an expected minimum achievable probe size or image
resolution of 10 nm. The maximum electron energy is 50 keV. Further information andlinks to electronic resources, such as the source code of the control software, can befound at nanomi.org [1].
At present, two versions of the NanoMi microscope have been built. The first version(Figure 1a) was used to test and demonstrate the core electron-microscopy capabilities.
It uses off-the-shelf ConFlatTM hardware for the vacuum envelope. The second version(Figure 1b) has been designed for integration into an ultrafast laser optics bench to
photoemit electron pulses and interact them with optical pulses. This version uses a
home-built vacuum chamber that lies horizontally on-top of a standard optics bench andhas many ports for laser-optical access. Vacuum pressures of 2×10-10 torr have beenachieved.
16

Here we present an overview of the NanoMi platform and the progress we haveachieved in constructing functional NanoMi microscopes.
Acknowledgment: Support for the project was provided by NRC-NANO and by NSERC RGPIN2021-02539
References:[1] nanomi.org and https://github.com/NRC-NANOmi/NanoMi[2] M. Malac et. al, NanoMi: An open source electron microscope hardware and software platform,
Micron 163 (2022) 103362.

Figure 1. a) NanoMi version one designed for electron-optical flexibility. b) NanoMi version two
designed for laser-optical integration.

17

Session 1

J-3

Momentum-Resolved Cathodoluminescence of a Plasmonic Crystal
Containing a Phosphor Thin Film
Hikaru Saito1,2,*
1

Institute for Materials Chemistry and Engineering, Kyushu University, Japan2

Department of Materials Science and Engineering, Tokyo Institute of Technology, Japan* saito.hikaru.961@m.kyushu-u.ac.jp

Plasmonic resonators have realized remarkable Purcell effect for extremely small
emitters as well as quantum emitters due to the small mode volume. Among various
structures proposed before, nanoresonator arrays with metal-insulator-metal (MIM)
layers [1] seem to have an advantage in a broad range applicability for planer luminescentfilms including inorganic materials, where the electromagnetic field is strongly
concentrated into the gap between the metal layers [1]. The band structures of the MIM
resonator arrays are featured by hybridizations of the localized surface plasmon (LSP)
modes [2] and the lattice modes [3]. However, it has been unclear how modal symmetry
affects such a hybridization especially when it occurs at a specific reciprocal lattice pointwith a high degree of symmetry such as Γ point. In this study, the hybridized modes atthe Γ point were fully characterized by momentum-resolved scanning transmission
electron microscopy -cathodoluminescence (CL) as shown in Fig. 1. As a result, existenceof a selection rule regarding symmetry is experimentally verified [4].
Then, the above resonator structure was applied to a Zn2SiO4 phosphor film (Fig.
2a). CL is powerful to investigate luminescence enhancement at the nanoscale. However,discrimination of coherent and incoherent emissions is often problematic in CL due to thelack of excitation wavelength selectivity. Zn2SiO4 has a wide bandgap of ~5 eV [5] andincludes impurities or defects causing radiative electron transition (path 1 in Fig. 2b). The
electron transition inside the Zn2SiO4 can partially be coupled with the plasmon modes.
This resonator-mediated emission is path 2. However, lack of the wavelength selectivity
in the electron beam excitation brings about the third path in CL, i.e., direct excitation of
the plasmon modes (path 3). CL saturation imaging was applied to extract incoherent
emission maps without the path 3 contributions, resulting in successful visualization ofplasmon-enhanced luminescence at the nanoscale, and demonstration of near-field
coupling between the luminescence centers and the plasmon modes.

18

Acknowledgment: This work was supported by “Advanced Research Infrastructure for Materials andNanotechnology in Japan (ARIM)” of the Ministry of Education, Culture, Sports, Science andTechnology (MEXT), and Japan Society for the Promotion of Science KAKENHI Grant Number
23K17350, 22H05034, 22H01928, 21K18195, 17K14118, and The Murata Science Foundation.
References:[1] W. Zhou et al., J. Phys. Chem. C, Vol. 117, (2013), 2541.
[2] F. P. Schmidt et al., Nano Lett., Vol. 12, (2012), 5780.
[3] H. Saito et al., Opt. Express, Vol. 23, (2015), 2524.
[4] H. Saito et al., ACS Photon, Vol. 6, (2019), 2618.
[5] P. Diana et al., J. Mater. Sci.-Mater. Electron, Vol. 34, (2023), 1992.

Fig. 1 (a) Momentum-resolved CL spectrum obtained along the Γ−K direction. (b) Momentumselected and energy-filtered CL maps at the Γ point. (c) Electric field strength |Ez(x,y)|2 simulated
by finite-difference time-domain method [4].

Fig. 2 (a) Schematic drawing of the fabricated phosphor-resonator structure. (b) Schematic
drawings of the three possible CL paths at the emission wavelength of 525 nm in the phosphorresonator structure.

19

Session 2

J-4

Cryo-electron tomography reveals novel Bld10p/Cep135 filamentous
structures contributing to the nine-fold symmetry of centriole

Akira Noga（苗加彰）1, 2, 3*, Masafumi Hirono（廣野雅文）2,
Takashi Ishikawa（石川尚）3
1

Department of Biological Sciences, Chuo University, Tokyo, 112-8551, Japan2

Department of Frontier Bioscience, Hosei University, Tokyo, 184-8584, Japan3

Department of Biology and Chemistry, Paul Scherrer Institute, Villigen PSI, 5232, Switzerland*anoga281@g.chuo-u.ac.jp

Centrioles have a unique structure composed of nine rotationally arranged triplet
microtubules. This nine-fold symmetrical structure, highly conserved among eukaryotes,
functions as both the center of the microtubule network in the cytoplasm and the base ofcilia. Functional analysis revealed that a conserved centriolar protein, SAS-6, constitutes
the cartwheel, which is a structure considered essential to the establishment of the ninefold symmetry. However, in bld12, a null mutant of SAS-6, 70% of the centrioles still
have nine triplet microtubules. Moreover, an engineered SAS-6 that self-assembles intoa six-fold symmetrical structure in vitro, tends to produce mostly nine-fold symmetrical
cartwheels and centrioles when transformed into Chlamydomonas cells [1]. These results
suggest that a SAS-6-independent mechanism(s) also functions to determine the nine-foldsymmetry.
As previous studies showed that Bld10p (a homolog of mammalian Cep135) is
crucial for the centriolar nine-fold symmetry, we carried out functional and structural
analyses of this protein [2]. Immuno-electron microscopy revealed linearly arranged
Bld10p signals between the bulges (pinheads) connecting the cartwheel spokes and thetriplet microtubules. At the same time, thin section electron microscopy revealed novel
filamentous structures that crosslink between adjacent pinheads. These structures were
not amenable to cryo-electron subtomogram averaging because of their large structuralvariability; however, we were able to directly observe them by exploiting a Volta Phase
Plate (Fig. 1). The positions of these structures coincided with those of the immuno-goldlabels to Bld10p, strongly suggesting that Bld10p constitutes them. In strains expressing
truncated Bld10p in bld10bld12 (a double mutant that lacks both Bld10p and SAS-6), the20

number of triplets was reduced and the crosslink structures were shorter. These results
indicate that part of the Bld10p molecule functions in a cartwheel-independent
mechanism to determine the centriolar 9-fold symmetry.
In addition to the Bld10p filamentous structures, our cryo-electron tomography
studies have identified other structures in centrioles and cilia. We will also touch on the
results of these preliminary observations.
References:[1] Hilbert M.,* Noga A.,* et al. Nat. Cell Biol., 18, (2016) 393-403 (*: Equal contribution)[2] Noga A., et al. EMBO J., 41, (2022), e104582
Fig. 1. Novel filamentous structures
observed by cryo-electron tomography.
There are three kinds of filamentous
structures (red arrowheads). Two arelocated between adjacent pinheads (a) and
one is between cartwheel spokes (b). Red
points show where filamentous structuresconnect with pinheads or cartwheel
spokes.

21

Session 2

J-5

Hierarchical Structures of Semicrystalline Polymers Revealed by
Nanodiffraction Imaging Based on Four-dimensional Scanning
Transmission Electron Microscopy
Shusuke Kanomi1,*, Tomohiro Miyata2, Hiroshi Jinnai2,*
1

Department of Applied Chemistry, School of Engineering, Tohoku University, 6-6 Aramaki Aza

Aoba, Aoba-ku, Sendai, Miyagi 980-8579, Japan
2 Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira,Aoba-ku, Sendai, Miyagi 980-8577, Japan.
*shusuke.kanomi.q4@dc.tohoku.ac.jp; hiroshi.jinnai.d4@tohoku.ac.jp

Introduction Semicrystalline polymers, with excellent thermal and mechanicalproperties, are extensively used in various applications. In melt-crystallization, polymer
chains fold to form plate-like crystals (lamellar crystals: LCs) with a thickness of about
10 nm, leaving amorphous layers in between. These LCs grow with twist and branch,
forming various higher-order structures, such as spherulites. This process results inhierarchical structures inside semicrystalline polymers spanning the sub-nanometer tomicrometer scale (Fig. 1). The heterogeneous distribution of LCs, which is closely linked
to the properties of polymeric materials, has been a subject of great interest among
researchers. However, the structural nature of LCs, particularly the molecular chainorientations inside them, has remained unknown until now.

Fig. 1. Hierarchical structure of semicrystalline polymers.

Four-dimensional scanning transmission electron microscopy (4D-STEM) is atechnique that scans an electron beam across a sample and acquires electron diffraction(ED) patterns from each scanning position1. The position-resolved ED patterns provide
high resolution, i.e., nanometer-scale maps of various structural information. While 4DSTEM has been increasingly used for inorganic materials since around 2010, its
application to organic materials has been limited due to its sensitivity to electron22

irradiation damage. In 2021, we undertook the challenge of exploring 4D-STEM
conditions suitable for high-density polyethylene (HDPE) and, for the first time, mapped
the molecular chain orientations with 30 nm resolution2. The method of mapping crystal
structures by 4D-STEM using a quasi-parallel electron beam is called nanodiffraction
imaging (NDI). In this study, we used high-resolution NDI to visualize LCs of HDPE anddirectly determined the molecular chain orientations inside LCs3.
Results and Discussion An ultrathin (~100 nm) section was prepared from an HDPE
film melt-crystallized at 120 ℃. A 1.2-nm-diameter electron beam was scanned acrossthe section with a step of 6 nm using a JEM-F200 (JEOL Ltd.; 200 kV). The ED patterns
at each point were recorded on a K3 IS (Gatan, Inc.). The intensity of the ED spots was
extracted from each pattern, and Fig. 2a was reconstructed, clearly showing the crystalline
and amorphous regions as bright and dark, respectively. The ED pattern with 200 spots(Fig. 2b) corresponds to the orange pixel inside the LC numbered as 2 in Fig 2a, indicatingthat molecular chains were not perpendicular to the LC surface, i.e., chain tilt angle (φ) >0. Moreover, the φ value map (Fig. 2c) revealed different φ values for the two LCs. Thesefindings are significant as they provide direct evidence of the chain tilt inside LCs,
previously ambiguous for semicrystalline polymers. In addition, we will show recent NDI
results on different hierarchical structures.
Fig. 2. (a) Reconstructed dark-fieldscanning
transmission electron
microscopy image of high-density
polyethylene, showing two numberedlamellar crystals (LCs), including an~17-nm-wide one. (b) Electron
diffraction pattern sampled from theorange pixel in the second LC in
panel (a). Molecular chains areperpendicular to the line connecting
the two 200 spots. (c) Color map ofchain tilt angle φ in the same field-ofview as panel (a). (d) A color wheelof φ with the schematic of a LC.
Acknowledgment: This study was supported by the JST CREST program and a JSPS KAKENHI
grant. We also thank Mitsubishi Chemical Corporation and JEOL for their support.
Reference: (1) Ophus C. Microsc. Microanal. 25, 563 (2019). (2) Kanomi S. et al. Macromolecules
54, 6028 (2021). (3) Kanomi S. et al. Nat. Commun. 14, 5531 (2023).

23

Session 2

J-6

Atomic resolution analysis of extended defects and their evolution
during annealing in Mg ion-implanted GaN
Emi Kano1*, Jun Uzuhashi2, Kosuke Ishikawa3, Tetsuo Narita4, Kacper Sierakowski5,
Michal Bockowski5, Tadakatsu Ohkubo2, Tetsu Kachi1, and Nobuyuki Ikarashi1
1

Institute of Materials and Systems for Sustainability, Nagoya University, Aichi 464-8601, Japan.

2

National Institute for Materials Science, Tsukuba 305-0047, Japan.

3

Department of Electronics, Graduate School of Engineering, Nagoya University, Aichi 464-8603,

Japan.
4

Toyota Central R&D Labs., Inc., Nagakute, Aichi 480-1192, Japan.

5Institute of High Pressure Physics Polish Academy of Sciences, Sokolowska 29/37, 01-142

Warsaw, Poland.
* kano@imass.nagoya-u.ac.jp

Vertical GaN power devices have been developed as high-efficiency switching
devices for high-power applications. Selective area p-type doping is required to unleash
the full potential of such devices. For this purpose, Mg ion implantation processes havebeen developed. A p-type conductivity has been demonstrated in Mg-ion-implanted GaN
using ultra-high-pressure annealing (UHPA), where samples are annealed in high pressure
N2 atmosphere of 1 GPa, for acceptor formation. [1]We utilized transmission electron microscopy (TEM) and atom probe
tomography (APT) to conduct atomic-scale investigations of Mg-ion-implanted GaN,
aiming to elucidate the crystallographic structures of extended defects and Mg
agglomerations formed during post-implantation annealing. Figure 1 shows a HAADFSTEM image of one type of extended defects, specifically interstitial-type dislocation
loop observed in the early stage of annealing. APT analyses revealed that Mg atoms tend
to agglomerate, forming clusters around such dislocation loops. The concentration of Mg
is higher at dislocations with a larger Burgers vector b, indicating that Mg agglomeration
is caused by the pressure at these dislocations. [2] The highly Mg-rich regions exhibit a
Mg concentration of 1 atomic %, exceeding the solubility limit of Mg in GaN. This
indicates that Mg agglomeration may hinder the activation of Mg dopants. Moreover, wedemonstrate that the Mg dopants become fully activated after eliminating such extended
defects with highly Mg-rich regions, achieved through annealing at longer durations or
higher temperatures.
We also investigated the time evolution of extended defects in Mg-ion-implanted
24

GaN during annealing in N2 atmospheres at pressures of 2.0 and 0.3 GPa. The annealing
durations were 15, 30, 60 and 90 min. Hydrostatic pressure is an important parameter for
diffusion of point defect. The diffusion constants of the native defects can be estimatedfrom the coarsening of the extended defects, i.e., an increase in defect size and a decreasein defect density. [3] Our analyses clarify that the diffu1sion constants of native defectand Mg impurity are smaller at the samples annealed at higher N2 pressure. [4] In samples
annealed at 2.0 GPa, defect sizes remained small and the densities remained high. This
indicates that coarsening of defects is retarded under the high N2 pressure annealing
conditions. Furthermore, secondary ion mass spectrometry (SIMS) was used to measure
the distributions of Mg and H. The H concentration reportedly matches the MgGa
concentration in GaN after the UHPA process. [5] Figure 2 shows that H concentration in
the ion-implanted region was higher in the sample annealed at a higher pressure. We thus
infer that the retarded diffusion of VGa would increase their concentrations in the ionimplanted region, subsequently increasing the MgGa concentration, as MgGa is produced
through the reaction between Mgi and VGa.
Acknowledgment: Part of this work was supported by the MEXT “Program for research anddevelopment of next-generation semiconductor to realize energy-saving society” (JPJ005357) and the“Program for Creation of Innovative Core Technology for Power Electronics” (JPJ009777).
References:[1] H. Sakurai et al., Appl. Phys. Lett. 115, (2019), 142104. [2] E. Kano et al, J. Appl. Phys. 132, (2022),
065703. [3] C. Bonafos et al., J. Appl. Phys. 83, (1998), 3008–3017. [4] E. Kano et al., PSS – RRL. 17,(2023), 2300035. [5] H. Sakurai et al., Appl. Phys. Express 13, (2020), 086501.

Fig. 2. H concentration, which represent the
MgGa concentrations, in the ion-implanted
region measured by SIMS.

Fig. 1 HAADF-STEM image of interstitialtype dislocation loop. White arrow indicates
an extra c-plane of GaN.
25

Session 2

C-3

Semiconductor Nanowire Junction Potential Maps
Karen L. Kavanagh
Dept. of Physics, Simon Fraser University, 8888 University Dr., Burnaby, BC, V5A 1S6 Canada.
*kavanagh@sfu.ca

All electronic devices, such as transistors and sensors, require the fabrication ofsemiconducting materials with precise control of the electrical carriers present, their
type and concentration (electrons and holes). This also assumes that crystalline defects(impurities, stacking faults, precipitates, grain boundaries) have been avoided and thatall surfaces are either a passive participant, meaning that they do not dominate thecontrol of electrical current within the device, or are carefully designed to do just that,for example, a field-effect oxide interface. When a device geometry is nanoscale, thedetectable presence of an internal electrical junction happens only when surface states
and crystal defects are limited. This talk will describe examples of potential maps
obtained from a variety of semiconducting nanowire diodes [1-4]. We will see that theirjunctions are easily mapped in some cases, but not in others. The approach is via thewell-established technique known as off-axis electron holography in a transmission
electron microscope. The potential within a junction is detected via the change in phaseof coherent electrons that pass through a sample. The image below shows an example ofa phase map from an axial p-n junction based on an InP heterojunction [1]. The phasechange is proportional to the sample thickness and scalar potential consisting of a
combination of the bulk mean inner potential and the junction static built-in potential.
Acknowledgment: NSERC
References:[1] Comparing the mean inner potential of Zn-VI semiconductor nanowires using off-axis electron
holography, Anitha Jose, Sarry Al-Turk, Harry E. Ruda, Simon P. Watkins, Martha R. McCartney,
Cristina Cordoba and Karen L. Kavanagh, Semicond. Sci. Technol. (2024) accepted.
[2] Abrupt degenerately doped, silicon nanowire tunnel junctions, Cristina Cordoba, Taylor
Teitsworth, Mingze Yang, James Cahoon, Karen L. Kavanagh, Nanotechnol. 31 (2020) 415708.
[3] Three-dimensional imaging of beam-induced biasing of InP/GaInP tunnel diodes, Cristina
Cordoba, Xulu Zeng, Daniel Wolf, Magnus T Borgström, Enrique Barrigon, Axel Lubk, and KarenL. Kavanagh, Nano Letters 196 (2019) 3490.

26

[4] Direct Measurement of the Electrical Abruptness of a Nanowire p-n Junction, Ali Darbandi,
James C. McNeil, Azadeh Akhtari Zavareh, Simon P. Watkins, and Karen L. Kavanagh, Nano
Letters 16, (2016) 3982.

Fig. 1 Phase map from an axial p-n junction within an InP/GaInP heterojunction
[3].

27

Session 2

J-7

Wavefield reconstruction using full-field illumination ptychography
with a structured electron beam
Hirokazu Tamaki1,2* (玉置 央和), Koh Saitoh3 (齋藤 晃)
1Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, Aichi,

464-8603, Japan.
2

Research & Development Group, Hitachi Ltd., 1-280, Higashi-koigakubo, Kokubunji, Tokyo,

185-8601, Japan.
3

Institute of Materials and Systems for Sustainability, Nagoya University, Furo-cho, Chikusa-ku,

Nagoya, Aichi, 464-8603, Japan.
*hirokazu.tamaki.ns@hitachi.com

Phase information of the electron wave contains quantitative information about themagnetic or electric properties of materials. Ptychography, a wavefield reconstruction
technique using far-field or near-field patterns of the electron wave [1][2], has been
attracting great interest in the field of electron phase measurement.
In this study, we propose a novel configuration for near-field ptychography with fullfield illumination using a structured electron beam, aiming at the accurate and efficient
observation of large structures. The proposed method is configured on conventional TEM
setups. An electron beam, structured to have non-uniform amplitude and phase
distribution, is projected onto the specimen. Then, a series of in-line holograms observedin the near-field region below the specimen are obtained with different illumination
positions by scanning the illumination beam. Both the illumination beam wavefield andthe complex transmission function of the specimen are reconstructed from the obtained
holograms through iterative calculation.
The performance of the proposed method was first evaluated using simulated
holograms. Then, its experimental feasibility was evaluated using MgO particles. Figures
1a and 1b show the given amplitude and phase components of the specimen transmissionfunction used in the simulation study. Fig. 1c shows one of the in-line holograms obtained
below the specimen. The wavefield of the illumination beam and transmission functionof the specimen were reconstructed from the obtained holograms. The reconstructed
amplitude (Fig. 1d) and phase (Fig. 1e) of the specimen transmission function show good
agreement with the given structure (Figs. 1a and 1b). Experimental evaluation using MgOparticles also showed a reasonable phase reconstruction consistent with the particle shape.
These results demonstrate the validity of the method.
28

References:[1] M. Rodenburg, Advances in imaging and electron physics, 150, 87-184, (2008)[2] M. Stockmar, et al., Scientific reports, 3(1), (2013), 1927.

Fig. 1 Reconstruction results from simulated holograms. (a) Amplitude and (b) phaseof the given specimen transmission function (ground truth). (c) One of the simulated
holograms obtained below the specimen. (d) Amplitude and (e) phase of thereconstructed specimen transmission function.

29

Session 2

C-4

Streak Imaging in a Dynamic Transmission Electron Microscope
Kenneth R. Beyerlein1*, Samik Roy Moulik1, Yingming Lai1, Aida Amini1,
Patrick Soucy1 and Jinyang Liang1
1

Centre Énergie Matériaux Télécommunications, Institut national de la recherche scientifique(INRS), 1650 blvd Lionel Boulet, Québec, J3X 1P7, Canada.
* kenneth.beyerlein@inrs.ca

A suite of high-speed electron microscopy instruments and methods have beendeveloped in the past few decades to watch nanomaterial excitation and dynamics in realtime [1]. The dynamic transmission electron microscope (DTEM) is one such instrumentthat has the unique ability to capture snapshot images of transient and irreversible phasetransformations. However, the amount of information that can be obtained about such an
event is limited by existing data collection strategies as well as the fact that obtaining aclear image requires the generation of pulses containing > 107 electrons [1]. The moviemode DTEM was developed to allow for multiple images of a single event to be captured
by deflecting a rapid sequence of snapshot images onto different regions of the camera.
This approach can produce a film consisting of 9 frames and a minimum interframe timeinterval of 50 nanoseconds [2]. It has been used to track the propagation of phasetransformation fronts moving at a speed 1-10 nm/ns, but is not able to capture the earlystages of a transformation or fronts moving close to the speed of sound ( > 1,000 nm/ns).
We will then present our recent progress in developing different modes of streak
imaging to improve the time resolution of a MM-DTEM. Notably, we will demonstrate
the application of tomographic compressed sensing image reconstruction [3] to recover asequence of two-dimensional images of a 1.85-µm-diameter field of view (FOV) withnanoscale spatial resolution, 370-ps inter-frame interval, and 140-frame sequence depth
in a 50-ns time window as shown in Fig. 1. We have used the developed streak-mode
DTEM (SM-DTEM) to characterize the spatio-temporal evolution of generated highcharge electron pulses [4] and will discuss the observation of a peak in the photoemission
at the beginning of the electron pulse (Fig. 2). The new SM-DTEM operation modes havethe possibility to rapidly collect sets of images with picosecond time resolution, relieving
the constraint on sample stability, and allowing for new in situ experiments that follow
the ultrafast material response as it evolves.

30References:[1] W. E. King, M. R. Armstrong, O. Bostanjoglo and B. W. Reed, in “Science of Microscopy”, ed. P.
W. Hawkes and J. C. H. Spence (Springer New York, New York), p. 406-444.
[2] T. LaGrange, B. W. Reed and D. J. Masiel, MRS Bulletin 40, (2015), p. 22-28.
[3] Y. Lai, et al., Photonic Instrumentation Engineering IX (SPIE), 12008, (2022), p. 240-246.
[4] S. Moulik, et al. Structural Dynamics 11, (2024), p. 014303

Fig. 1. Selected frames of a 2D SM-DTEM reconstructed scene of 50-ns electron pulse passing throughgold cross grating sample.
Scale bar = 500 nm.

Fig. 2. Streak traces of 50-ns photoemitted electron pulses measured for different UV cathode laser
pulse energy.

31Session 2

C-5

The Ultrafast Electron Imaging Lab: Where Electrons, Light,
Nanofluidics, and People Meet
Germán Sciaini*
The Ultrafast electron Imaging Lab, Department of Chemistry and Waterloo Institute for
Nanotechnology, University of Waterloo, Waterloo, Ontario, Canada.
*

gsciaini@uwaterloo.ca

One of the paramount experiments in science is the direct observation of atomic
motions during chemical reactions and phase transformations. To date, the advent of
ultrafast ‘structure-sensitive’ cameras using ultrashort pulses of electrons or hard X-rayshas realized this ambition for crystalline solids. Nevertheless, capturing molecular movies
in the liquid phase presents significant challenges; overcoming these would unlock thedomain of chemical kinetics for atomic exploration.
In this talk, I will detail the technical breakthroughs that have afforded such
precision and give an overview of our team’s endeavors at the Ultrafast Electron Imaging
Lab (UeIL) to adapt time-resolved ultrafast electron diffraction (UED) and electron
microscopy (EM) techniques for liquid samples. With respect to UED, we are actively
working to secure resources to build a facility that will open to the research community.
For EM, we have devised liquid-phase EM (LPEM) kits1-4 that outfit all leadingtransmission electron microscope models.
Figure 1 presents our newly developed, compact, and upgradeable 100-keV UED
instrument5. Figure 2 showcases the LPEM results obtained for the study of adenoassociated viruses at the Canadian Centre for Electron Microscopy (CCEM) in Hamilton.
In partnership with the team of Mark Salomons and Marek Malac at the NRC
Nanotechnology Research Centre (NANO) in Edmonton, we are experimenting withhole-free-phase-plate (HFPP) transmission EM to enhance image contrast and resolution
in studies of biological specimens. Our goal is to make our LPEM technologies accessible
through the two principal EM centres in Canada.
Acknowledgment: The work presented here could not have been possible without the generous
financial support provided by the Chan-Zuckerberg Initiative (CZI), the Natural Sciences andEngineering Research Council (NSERC) of Canada, and the Canada Foundation for Innovation (CFI).
The University of Waterloo’s QNFCF facility was used for the fabrication of UeIL’s nanofluidic chips.
32

The establishment of this infrastructure owes much to the significant contributions from CFREF-TQT,
CFI, ISED, the Ontario Ministry of Research & Innovation, and Mike & Ophelia Lazaridis.
References:[1] A. A. Petruk, C. Allen, N. Rivas, K. Pichugin, G. Sciaini, Nanotechnology, Vol. 30, (2019), 395703.
[2] T. S. Lott, A. A Petruk, N. A. Shaw, N. Hamada, C. M. Andrei, Y. Liu, J. Liu, G. Sciaini, Lab on a
Chip, Vol. 23, (2023), 3217-3225.
[3] N. A. Shaw, T. S. Lott, A. A. Petruk, N. Hamada, C. M. Andrei, Y. Liu, J. Liu, K. Pichugin, G.
Sciaini, Microscopy and Microanalysis, 29 (2023), 986–987.
[4] T. S. Lott, A. A. Petruk, N. A. Shaw, N. Hamada, C. M. Andrei, Y. Liu, J. Liu, G. Sciaini,
Microscopy and Microanalysis, 29 (2023), 658-659.
[5] S. Netzke et al., In preparation.

Fig. 1: Photograph of a homemade Ultrafast
Electron Diffraction (UED) setup. The primary
components include: (1) camera, (2) linear
manipulator for the Faraday cup, (3) magnetic
lens, (4) sample exchange compartment, (5)turbomolecular pump, (6) vacuum gauge, and(7) high-voltage feedthrough. All principal
components were designed at UeIL. This UED
setup is slated for commercialization by e-Ray
Scientific, a collaborative venture between theteams from Sciaini (University of Waterloo),
Siwick (McGill University), and Miller(University of Toronto).

33

Fig. 2. A zoomed-in TEM image of a single
adeno-associated virus (AAV) particle (~ 25
nm in diameter) observed with some degreeof defocus using our liquid-phase electron
microscopy suite. Acceleration voltage = 200
kV, magnification ≅ 58 kx, electron dose
rate ≅ 10 e- Å-2 s-1, exposure time = 5 s,liquid layer thickness ≅ 500 nm, windowmaterial thickness (total of silicon nitride) =25 nm.

34

【Societies】
Japanese Society of Microscopy (JSM)
https://microscopy.or.jp/
Microscopy Society of Canada (MSC)
https://msc-smc.org/【Venues】
Session 1
International Conference Hall, Makuhari Messe.
2-1, Nakase, Mihama-ku, Chiba-city, 261-8550 Japan
https://www.m-messe.co.jp/organizers/guide/conferencehall/guide_conference
Session 2
Richcraft Hall, Carleton University
9376, University Drive, Ottawa, ON K1S 5B6, Canada
https://carleton.ca/campus/buildings/richcraft-hall/【Organizers】
Ken Harada (RIKEN)（原田研, 理化学研究所）
Marek Malak (NRC-NANO and University of Alberta)
Shigeo Mori (Osaka Metropolitan University)（森茂生, 大阪公立大学）
Misa Hayashida (NRC-NANO)（林田美咲, NRC-NANO）【Technical Assistants】
Keiko Shimada (RIKEN)（嶌田惠子, 理化学研究所）
Haruka Sanada (Osaka Metropolitan University)（眞田春佳, 大阪公立大学）【Contact】
Official site:
https://www.omu.ac.jp/eng/japan-canada-microscopy-seminar/english/index.html
Office e-mail: gr-eng-JapanCanadaSeminar@omu.ac.jp3536