Scope of Accreditation（Measurement Method）
Accreditation Number: VLAC-041
Expiration Date: June 28, 2026
〔Name of Laboratory〕

Fujitsu General EMC Laboratory Limited〔Test site name〕

Fujitsu General EMC Laboratory〔Test site Address〕

3-3-17, Suenaga, Takatsu-ku, Kawasaki, 213-8502 JAPAN〔Measurement Methods〕

Emission test
Radiated disturbance: Enclosure Port
Disturbance electric field test
[Test condition] On the reference ground plane, Measurement distance: 10 m
Measurement Frequency Range: 30 MHz - 1 GHz[Test condition] Quasi Free space
Measurement Frequency Range: 1 GHz – 40 GHz
Disturbance magnetic field strength measurement[Test condition] Loop Antenna
Disturbance power measurement[Test condition] Absorbing clamp
Conducted disturbance Measurement: AC mains port
Voltage Measurement[Test condition] AMN, High-impedance probe
Conducted disturbance Measurement: Telecommunication port
Voltage Measurement[Test condition] AAN
Current Measurement[Test condition] Current probe
Conducted disturbance Measurement: DC power line port
Voltage Measurement[Test condition] AMN

Immunity test
Electro static discharge
Contact discharge, Air discharge, Indirect discharge
Radiated electromagnetic field strength
Measurement frequency range: 80 MHz – 6 GHz
Radiated fields in close proximity
Measurement Frequency Range: 9 kHz – 26 MHz
Electrical fast transient/burst (EFT/B)
Mains port, Telecommunication/Signal port
Surge
Mains port, Telecommunication/Signal port
RF conducted interference
Mains port measurement frequency range:150 kHz – 230 MHz
Telecommunication/Signal port measurement frequency range:150 kHz – 230 MHz
Radiated magnetic field
Interruptions and Voltage variations

Harmonic current
Harmonic current test
Voltage changes, Voltage fluctuations and Flicker test

Telecommunication equipment performance 2
Magnetic field strength[Test condition] Magnetic Field probe

Voluntary EMC Laboratory Accreditation Center Inc.

Scope of Accreditation（Test standards）

Accreditation Number: VLAC-041
Expiration Date: June 28, 2026
〔Name of Laboratory〕

Fujitsu General EMC Laboratory Limited.
〔Test site name〕

Fujitsu General EMC Laboratory〔Test site Address〕

3-3-17, Suenaga, Takatsu-ku, Kawasaki, 213-8502 JAPAN〔Test standards〕
Emission test
VCCI Technical Requirements: VCCI-CISPR 32:2016
J55011(H27), J55014-1(H27), J55015(H29), J55032(H29), CISPRJ 32:2017
Technical requirements under the Electrical Appliances and Materials safety Act appendix 10
Chapter 4 and Chapter5
FCC 47 CFR Part 15 Subpart B: ANSI C63.4-2014 (up to 40 GHz)CISPR 11:2015+A1:2016+A2:2019, CISPR 14-1:2020, CISPR 15:2018, CISPR 22:2008
CISPR 32:2015+A1:2019
EN 55011:2020+A2:2021, EN 55014-1:2017+A11:2020, EN IEC 55014-1:2021
EN IEC 55015:2019+A11:2020, EN 55022:2010, EN 55032:2015+A11:2020+A1:2020
AS CISPR 11:2017, AS/NZS CISPR 14.1:2021, AS CISPR 15:2017
AS/NZS CISPR 22:2009+A1:2010, AS/NZS CISPR 32:2015+A1:2020
ICES-003(Issue 7), CNS 13438:2006,
IEC 61000-6-3:2020, IEC 61000-6-4:2018
EN 61000-6-3:2007+A1:2011, EN IEC 61000-6-3:2021
EN 61000-6-4:2007+A1:2011, EN IEC 61000-6-4:2019
AS/NZS 61000.6.3:2021, AS/NZS 61000.6.4:2012, AS 61000.6.4:2020,
EN 300 386:V.2.1.1 / V.2.2.1, EN 301 489-1:V.2.2.3, EN 301 489-3:V.2.1.1, EN 301 489-17:V.3.2.4
The scopes of the following standards groups are limited to emission tests, immunity tests, andharmonic current tests. [refer to Note.1]
IEC 61326-1:2020, IEC 61326-2-1:2012 /-2-2:2012 /-2-6:2012
EN 61326-1:2013, EN 61326-2-1:2013 /-2-2:2013 /-2-6:2013
EN IEC 61326-1:2021, EN IEC 61326-2-1:2021 /-2-2:2021 /-2-6:2021
IEC 60601-1-2:2014+A1:2020, EN 60601-1-2:2015+A1:2021
JIS T 0601-1-2:2018 / 2023
[Note 2] In emission testing, In-Situ are outside the scope of accreditation.

Immunity test

[Including the test standards listed in Note 1.]
IEC 61000-4-2:2008 /-4-3:2006+A1:2007+A2:2010 /-4-3:2020 /-4-4:2004+A1:2010 /-4-4:2012/-4-5:2005 /-4-5:2014+A1:2017 /-4-6:2008 /-4-6:2013 /-4-8:2009 /-4-11:2004+A1:2017 /-4-11:2020/-4-34:2005+A1:2009 /-4-39:2017
EN 61000-4-2:2009 /-4-3:2006+A1:2008+A2:2010 /-4-4:2004+A1:2010 /-4-4:2012 /-4-5:2006/-4-5:2014+A1:2017 /-4-6:2009 /-4-6:2014 /-4-8:2010 /-4-11:2010+A1:2017 /-4-34:2007+A1:2009/-4-39:2017, EN IEC 61000-4-3:2020 /-4-11:2020
CISPR 14-2:2020, CISPR 24:2010+A1:2015, CISPR 35:2016
EN 55014-2:2015, EN IEC 55014-2:2021, EN 55024:2010+A1:2015, EN 55035:2017+A11:2020
IEC 61000-6-1:2016, IEC 61000-6-2:2016
EN 61000-6-1:2007, EN IEC 61000-6-1:2019, EN 61000-6-2:2005, EN IEC 61000-6-2:2019
EN 61547:2009

Harmonic Test in Public Low Voltage Systems[Including the test standards listed in Note 1.]
IEC 61000-3-2:2018+A1:2020, EN 61000-3-2:2014, EN IEC 61000-3-2:2019+A1:2021
JIS C 61000-3-2:2019
IEC 61000-3-3:2013+A1:2017+A2:2021, EN 61000-3-3:2013+A1:2019+A2:2021
IEC 61000-3-11:2017, EN 61000-3-11:2000, EN IEC 61000-3-11:2019IEC 61000-3-12:2011+A1:2021, EN 61000-3-12:2011
IEC 61000-6-3:2020, EN 61000-6-3:2007+A1:2011, EN IEC 61000-6-3:2021

Telecommunication equipment performance 2
IEC 62233:2005, EN 62233:2008

Voluntary EMC Laboratory Accreditation Center Inc.

The laboratory is only accredited for testing activities outlined within the test methods listed above.
If test standards do not include the edition, it means the latest one at the date of renewal (6.29, 2024).