AUTOMOTIVE CURRENT TRANSDUCERS OPEN LOOP TECHNOLOGYHSNBV 800-R01*

Introduction

Automotive application

The HSNBV series is for the electronic measurement of DC, ACor pulsed currents in high power and low voltage automotive
applications with galvanic separation between the primarycircuit (high power) and the secondary circuit (electronic circuit).
The HSNBV series gives you the choice of having different
current measuring ranges in the same housing.

● Battery Management● EV, Hybrid and utility vehicles

Features● Ratiometric transducer● Open Loop transducer using the Hall effect● Low voltage application● Unipolar +5 V DC power supply● Maximum RMS primary admissible current: defined bybusbar to have T < +150 °C● Operating temperature range: −40 °C < T < 125 °C● Output voltage: full ratio-metric (in sensitivity and offset).

Special feature● 48 V battery.

Principle of HSNBV Family
The open loop transducers uses a Hall effect integrated circuit.
The magnetic flux density B, contributing to the rise of the Hall
voltage, is generated by the primary current IP to be measured.
The current to be measured IP is supplied by a current source
i.e. battery or generator (Figure 1). Within the linear region of
the hysteresis cycle, B is proportional to:
B (IP) = a × IP
The Hall voltage is thus expressed by:
UHall = (cHall / d) × IHall × a × IP
Except for IP, all terms of this equation are constant.
Therefore:
UHall = b × IPaconstantb
constant
cHall
Hall coefficientdthickness of the Hall plate
IHall
current across the Hall plates● Special busbar shape.

Advantages● Excellent accuracy● Very good linearity● Very low thermal offset drift● Very low thermal sensitivity drift● Galvanic separation

The measurement signal UHall amplified to supply the user
output voltage or current.

● Non intrusive solution.

Part numbering

+ UC

IP

Product Family

HSNxx xxx-xxx
Product Name

DR = drive
BV = Battery Monitoring
Current range
100900A
Nothing for D- UC
Primary Current IP

0V

Insulated Output Voltage Uout

0049 : Connector version.
5099 : Harness version.
S = Single output.
R = Redundancy (Dual output/same calibration).
D = Dual output (different calibration).

Fig. 1: Principle of the open loop transducer

N° 97.O3.56.R01.0
14September2020/version 1

Uout

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HSNBV 800-R01

Dimensions (in mm)

U

Mechanical characteristics

Remark● Plastic casePBT GF 30● Magnetic core

FeSi alloy● Uout > UO when IP flows in the positive direction (see arrowon drawing).

● Busbar

Copper● Mass		49 g ± 5 %● Pins		Brass tin plated● IP level

IP × 2

Electronic schematic
LEM Sensor.

UC

+ 5V

Typical application +5 V
Schematic interface.

1

1μF

47 nF
Gnd

Gnd

U out 1

IPM
Primary
current

Mounting recommendation

2

68 nF

CL

Gnd

R
RL

Gnd

Gn Gndd● Mating connector: Molex duraclik 5 pin:

Uout2 (optional)

ISL version- Housing 5 pin black: 5601230501- Retainer 5 pin grey: 5601250500- Teminal tin plated: 5601240101

CL

4

68 nF

Gnd
3
Gnd

Gnd

C

R
RL
Gnd

C

Gnd

Not connected
5● Assembly torque: see notes on drawing.
Screw mounted with flat washer and spring washer or flanged
screw serrated are recommended.

CL < 100 nF EMC protection (optional)
RC Low pass filter (optional)

On board diagnostic
RL > 10 ΚΩ. Resistor for signal line
diagnostic (optional)
Uout
Open circuit
Short GND

Diagnostic
UIN ≤ 0.15 V
UIN ≤ 0.15 V
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Absolute ratings (not operating)Parameter

SymbolUnit

HSNBV 800-R01

Specification
Min Typical Max

Conditions

Maximum supply voltage

UC

V

−14

Insulation resistance

RINS

MΩ

500

Maximum output voltage

Uout

V

−14

14

Uout Reverse / Forward voltage

Maximum output current

Iout

mA

−10

10

Continuous

Ambient storage temperature

TA st

°C

−40

125

UESD HBMkV

Maximum admissible vibration (random RMS)

γ

m·s-2

RMS voltage for AC insulation test

UdkV

Creepage distance

dCp

mm

5.12

Clearance

dCI

mm

5.12

Comparative tracking index

CTI

Electrostatic discharge voltage (HBM)

14500 V DC, ISO 16750-2

8

IEC 61000-4-2 / ISO 10605
see profile on page 7/8

2.5

PLC0

50 Hz, 1 min; IEC 60664 part1≥ 600 V

Operating common characteristics in nominal range (IP N)
Parameter

SymbolUnit

Specification
Min Typical Max

Conditions

Electrical Data
Supply voltage

UC

V

4.75

Ambient operating temperature

TA

°C

−40

Output voltage

Uout

V

5

5.25
125

Uout = (UC/ 5) × (Uo + S × IP )Primary current, measuring range (output 1)

IP M 1

Electrical Data
A
−800

Sensitivity (output 1)

S1

mV/A

2.5

Offset voltage (output 1)

UO 1

V

2.5

Primary current, measuring range (output 2)

IP M 2A

Sensitivity (output 2)

S2

mV/A

2.5

@ TA = 25 °C

Offset voltage (output 2)

UO 2

V

2.5

@ UC = 5 V DC

mV

1.25

Output resolution

800@ TA = 25 °C@ UC = 5 V DC

−800

800

Output clamping high voltage

US Z

V

4.70

4.75

4.80

@ UC = 5 V, @ −40 °C < T < 125 °C

Output clamping low voltage

US Z

V

0.20

0.25

0.30

@ UC = 5 V, @ −40 °C < T < 125 °C

Current consumption

IC

mA

Load resistanceRLkΩ

Output internal resistanceRout@ TA = 25 °C, @ UC = 5 V

15
20
10

Ω

1

10

@ TA = 25 °C

Performance Data
Ratiometricity error

εr

%

±0.3

@ TA = 25 °C

Sensitivity error

εS

%

±1

@ TA = 25 °C, @ UC = 5 V

Electrical offset voltage

UO E

mV

±4.0

@ TA = 25 °C, @ UC = 5 V

Magnetic offset voltage

UO M

mV

±2

@ UC = 5 V, @ TA = 25 °C

Linearity error

εL

%

±0.5

Average temperature coefficient of UO E

TCUO E AV

mV/°K

−0.1

±0.04

0.1

Average temperature coefficient of S

TCSAV

%/°K

−0.03

±0.01

0.03

Delay time to 70 % of the final output value for
IP N step

tD 70

ms

Frequency bandwidthBW

Hz

Peak-to-peak noise voltage

Uno ppmV

10

DC to 1 MHz

RMS noise voltage

Uno

mV

1.5

DC to 1 MHz

Start up time

tstartms

1

Settling time

ts

ms

10

% of full scale, method 2@ UC = 5 V

10
1100

@ −3 dB

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HSNBV 800-R01
Total error (mV)

HSNBV 800-R01: Total error εtot
specified @ 3 sigma±70.0

Total error (mV)

±60.0
±50.0
±40.0
±30.0
±20.0
±10.0
±0.0

−IP M

0

IP M

Primary current IP M (A)Total error
error@@25
25°C°C(mV)(A)

range (mV)
Total error
error@@T°
T range(A)

IP (A)

25 °C initial

T ­°C range
initial

25 °C after
reliability

T °C after
reliability−IP M±30 mV±60 mV±53 mV±60 mV0±10 mV±20 mV±10 mV±20 mV

IP M±30 mV±60 mV±53 mV±60 mV

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HSNBV 800-R01
PERFORMANCES PARAMETERS DEFINITIONSDelay time tD 70:

Primary current definition:

The time between the primary current signal (IP N) and theoutput signal reach at 70 % of its final value.

Uout

I [A]

Primary current nominal (IP N)
Primary current, measuring range (IP M)

IT

70 %
Uout

IP
tD 70

IP

Definition of typical, minimum and maximum values:
Minimum and maximum values for specified limiting and safety
conditions have to be understood as such as values shown in“typical” graphs. On the other hand, measured values are partof a statistical distribution that can be specified by an intervalwith upper and lower limits and a probability for measured
values to lie within this interval. Unless otherwise stated(e.g. “100 % tested”), the LEM definition for such intervals
designated with “min” and “max” is that the probability forvalues of samples to lie in this interval is 99.73 %. For a normal(Gaussian) distribution, this corresponds to an interval between−3 sigma and +3 sigma. If “typical” values are not obviouslymean or average values, those values are defined to delimit
intervals with a probability of 68.27 %, corresponding to aninterval between −sigma and +sigma for a normal distribution.
Typical, minimum and maximum values are determined during
the initial characterization of a product.

Output noise voltage:t [µs]

Sensitivity:
The transducer’s sensitivity S is the slope of the straight line
Uout = f (IP), it must establish the relation:
Uout (IP) = UC/ 5 (S × IP + UO)

Offset with temperature:
The error of the offset in the operating temperature is thevariation of the offset in the temperature considered with theinitial offset at 25 °C.
The offset variation IO T is a maximum variation the offset in thetemperature range:
IO T = IO E max − IO E min

The output voltage noise is the result of the noise floor of theHall elements and the linear amplifier.

The offset drift TCIO E AV is the IO T value divided by thetemperature range.

Magnetic offset:

Sensitivity with temperature:

The magnetic offset is the consequence of an any current on
the primary side. It’s defined after a stated excursion of primary
current.

Linearity:
The maximum positive or negative discrepancy with a reference
straight line Uout = f (IP).
Unit: linearity (%) expressed with full scale of IP N.
Uout

The error of the sensitivity in the operating temperature is therelative variation of sensitivity with the temperature consideredwith the initial offset at 25 °C.
The sensitivity variation ST is the maximum variation (inppm or %) of the sensitivity in the temperature range:
ST = (Sensitivity max − Sensitivity min) / Sensitivity at 25 °C.
The sensitivity drift TCSAV is the ST value divided by thetemperature range. Deeper and detailed info available is ourLEM technical sales offices (www.lem.com).

Non linearity example

Offset voltage @ IP = 0 A:
The offset voltage is the output voltage when the primary current

Referencestraight line

is zero. The ideal value of UO is UC/ 2. So, the difference of

Max linearity error

IP
Linearity variation in IP N

UO − UC/ 2 is called the total offset voltage error. This offset error
can be attributed to the electrical offset (due to the resolution of
the ASIC quiescent voltage trimming), the magnetic offset, thethermal drift and the thermal hysteresis. Deeper and detailed
info available is our LEM technical sales offices (www.lem.
com).

Environmental test specifications:
Refer to LEM GROUP test plan laboratory CO.11.11.515.0 with
“Tracking_Test Plan_Auto” sheet.
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HSNBV 800-R01
Environmental test specifications:
Refer to LEM GROUP test plan laboratory CO.11.11.515.0 with “Tracking_Test Plan_Auto” sheet.
Name

Standard

Conditions

ELECTRICAL TESTS

RMS voltage for AC insulation test

IEC 60664 part 1

Insulation resistance test

ISO 16750-2 (2010)

2.5 kV AC / 1 min / 50 Hz (I < 0.1 mA)
500 V DC, time = 60 s
RINS ≥ 500 MΩ Minimum

ENVIRONMENTAL TESTSHigh T °C, High Humidity, Electricalconnection

JESD 22-A101 (03/2009)

1000 h +85 °C / 85 % RH
UC = 5 V DC, IP= 0 A

Thermal Cycle Test
(Simplified profile)IEC 60068-2-14, Test Nb

T min −40 °C , T max = +125 °C
1 cycle = 480 min, 30 cycles
UC = 5 V (≡ connected); IP= 0 A

Thermal ShockISO-16750-4 § 5.3.2 (04/2010)

1000 cycles
30 min “−40 °C” // 30 min “ +85 °C”
UC not connected, IP = 0 A

High T °C Storage

IEC 60068-2-2, Bd (07/2007)

125 °C for 1000 h
UC not connected, IP = 0 A

Low T °C Storage

IEC 60068-2-1, Ad (03/2007)−40 °C for 240 h
UC not connected, IP = 0 A

Mechanical ShockISO-16750-3 § 4.2.2 (12/2012)

50 g / 6 ms Half Sine @ 25 °C
10 shocks of each direction
UC not connected, IP = 0 A

Random vibration test in T °C profile

Powered Vibration Endurance

IEC 60068-2-64

CETP:00.00-E-412 § 5.11

8 h for each axe; IP = 0 A, without monitoring
ISO 16750-3, 4.1.2.4, 3 g
Expose the Current Sensor to vibration log sweep at
20 °C while 5 V powered for 6 hours on each primaryaxis.
Vibration class II
Output voltage of all DUTs has been monitored

EMC TESTS ES96200 (11.2011)

Radiated Emission
Absorber Lined Shielded Enclosure(ALSE)CISPR25 (2008) Table9 - class 5

f = 150 kHz to 2.5 GHz
Criteria A acceptance @ 5 % of 2 V

GMW3097 § 3.4.1 (2015)

Level: GMW 3097 (2015) § 3.4.1 Table 13 - Level 1 (100mA) (ISO11452-4 (2011) Annex E Table E1 Level 2)
f = 1 MHz to 400 MHz .
Criteria A acceptance @ 5 % of 2 V

Radiated Immunity
Anechoic chamber

GMW3097 § 3.4.2 (2015)

Level: GMW 3097 (2015) § 3.4.2 Table 14 - Level 2(100 V/m)
f = 400 MHz to 1 GHz; Level = 100 V/m (CW, AM 80 %)f = 0.8 GHz to 2 GHz; Level = 70 V/m (CW, PM PRR =217 Hz, PD = 0.57 ms)
f = 1 GHz to 2 GHz; Level = 70 V/m (CW)
Criteria A acceptance @ 5 % of 2 V

ESD Test

GMW3097 § 3.6.3 (2015)

Level: GMW3097 (2015) § 3.6.3.3 Table 28
Contact discharges: ±4, 6 kV; Air discharges: ±8 kV
UC = NO power supply (unconnected).
Criteria B

Radiated Immunity
Bulk Current Injection (BCI)

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HSNBV 800-R01
Recommendations for use:
Storage:
The LEM transducers must be stored in a dry location, within the following ambient room conditions (< 40 °C and < 60 % RH).
The product should be stored in its original packing. Ensure during storage and transport, the units are not damaged by applying
excess weight to the packaging. The transducers must not be stored more than 3 months. Maximal stackup storage of secondary container (pallet) must not exeed 2.
Unpacking:
When unpacking, care must be taken with cutting tools not to damage the transducer.
Handling:
The LEM transducers must be handled with care and not undergo any shocks or falls (fall = scrap). It is recommended to handle
the transducer as long as possible inside its original packing (thermoform tray on customer’s assembly station). It is forbidden tohandle the transducers by their terminals. To avoid problems of ESD, it is recommended not to touch secondary terminals. Any
rework operation are forbidden and will conduct part out of LEM warranty.
Installation:
The workshop and the people in contact with the transducers must be ESD protected. Before installing, be sure to check thatthe transducer corresponds to the required application. Be sure that the air gap between the housing of the transducer and theprimary bar is suffisant to avoid damage in case of vibrations.
LEM does not recommand customers to make any maintenance on LEM sensors other wise, it will drive sensors directly out of
warranty.
Concerning installation and re-installation , cauthougly care need to be taken for taped sensors same for screwed sensors.
Sensors fixed by clips must be scraped after any dismounting from the original locations.

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LEM International SA
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