Spectral Sensors by Carl Zeiss

L a y e r t h ic k n e s s m e a s u r e m e n t o f a n o d iz e d c o a t in g s o na lu m in iu m p la t e s a n d t a p e s

L ab and on-line meas urements
INTR ODUC TION
T he coating of aluminium with aluminum oxide
or other protective or des ign coatings mus t be kept
in controlled quality limits during the coating
technology,in order to guarantee the functionality of thelayers and thus to comply with the cus tomers ’requirements.
T he tes ting of s amples from the on going production
proces s can be performed as random s ampling or online measurement.T he coating parameters of thecoating plant can therefore be res et very quickly and,as a res ult, at low cos t (quality and material
consumption).However, this measuring procedure is
only s uitable for trans parent layers , not for diffus ely
s cattering layers .

F ig.1

THE ME THOD
C oated tapes or plates are meas ured us ing reflected
light.Interferences (white light) are generated from thereflection s ignals . T he optical layer thicknes s isreliably evaluated by means of F F T algorithms. (F ig.1)
T he geometric layer thicknes s is determined on thebas is of the mathematical relations hip between theoptical and the geometric thicknes s , and the refractive
index function n=f (wavelength).
R es ults are provided with utmost reproducibility andabs olute accuracy which is due to the s uperb opticaland thermal s tability of the ZE IS S diode array
polychromators.
T hin layers between <500nm and a few nm can bemeas ured, calibrated and integrated in automatic
proces s es by means of s pecial evaluation algorithms .
T hes e methods are generally applicable to all othercoatings which are phys ically s uited for being
meas ured with our s ys tems .

F ig.2 C OR ONA in us e

〒164‑0011
東京都中野区中央4‑4‑5第一小林ビル
Tel: 03‑5328‑2858 Fax: 03‑5328‑2859

Spectral Sensors by Carl Zeiss

THE SYSTEMS
There is the possibility to use fibre coupled (MCS 500) or fibreless systems (CORONA Fig.2).The diode array
spectrometer systems are based on the time-tried ZEISS MCS polychromator technology. The multi-channel
spectrometers provide spectral information with a resolution of 0.8nm/pixel and 3.3nm/pixel, respectively.
An RS422 interface, 4-20mA, and shortly an RS232/alternatively RS485, or a trigger input and output can be used asinterfaces, for example.
PCs are used for controlling the systems. The spectrometers can be cascaded, e.g. so that the visual spectral range
and the NIR spectral range are measured simultaneously. This permits the measurement of different multi layersystems.

THE SOFTWARE
A possible software option is our ASPECTPLUS Windows standard software (supported by Windows 3.11/ 95/ 98 andWindows NT) in conjunction with the software module Layer Thickness.
For special, customized applications we recommend a solution under LabVIEW.
DLLs for C++ and LabVIEW drivers allow the user to program his own software interfaces, or to
integrate our measuring systems in overall procedures

THE BENEFITS
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Fast high-precision measurement
Excellent reproducibility of layer thickness data
Time-tried measuring systems and techniques
High reliability and low maintenance requirements, as no moving parts are use
Easy software operationDetailed spectral information provided at high speed
Flexible installation due to fibre-coupled or fibreless technology
and a wide range of accessories
Measurement of several measuring points by combination with opticalmultiplexer or traversing unit
Fibreless systems directly driven over traversing unit

SPECIFICATION
Wavelength range
Wavelength resolution
Wavelength reproducibility
PC interface
Distance between PC andsystem
Optical fibres
Housing

Carl Zeiss
Spectral Sensors

200 – 1020 nm (900 – 1700 nm optional, or cascaded)
0.8nm/Diode (2.4 nm Raleigh) / 3.3nm/diode (10nm Raleigh)<0,05 nmRS 422; RS 232 res. RS 485 for CORONA
up to 80 m with standard cable
up to 2.5 km with light guide transmission
quartz, 600 µm core, SMA connections
19" housing or 19" rack mount
19" protective housing
Corona (fibreless) in cast housing

D-07740 Jena
Telefon:(03641)64 2838
Telefax:(03641)64 2485
E-Mail:info.spektralsensorik@zeiss.de
Internet:
http:// www.zeiss.de