AN13273

i.MX 8QuadXPlus/8DualXPlus/DualX Product Lifetime Usage
Rev. 0 — May 25, 2021

1 Introduction
This document describes the estimated product lifetimes for the i.MX8QuadXPlus/8DualXPlus/8DualX application processors based on the criteria
used in the qualification process.
The product lifetimes described here are estimates and do not represent aguaranteed life time for a product.

Application NoteContents
1
2
2.1
2.2
34

Introduction......................................1
Device qualification level andavailable PoH.................................. 1
Automotive lifetime estimates...... 2
Industrial qualification.................. 2Conclusion.......................................3
Revision history............................... 3

The i.MX 8QuadXPlus/8DualXPlus/8DualX series consist of several processors that deliver a wide range of processing andmultimedia capabilities across various qualification levels. This document intends to provide you with guidance on how to interpretthe different i.MX 8QuadXPlus/8DualXPlus/8DualX qualification levels in terms of the target operating frequency of the device,
the maximum supported junction temperature (Tj) of the processor, and how it relates to the lifetime of the device.

2 Device qualification level and available PoH
Each qualification level supported (automotive and industrial) defines a number of Power-on Hours (PoH) available to theprocessor under a given set of conditions such as:• Target voltage for the application (automotive and industrial)— The target frequency is determined by the input voltage to the processor’s core complex ( VDD_A35) .
• Percentage of active use vs. the Low power mode
— Active use means that the processor is running in an active performance mode.
◦ For the automotive tier of 8QuadXPlus/8DualXPlus/8DualX, two performance modes are available: 1.2 GHz and900 MHz.
◦ For the industrial tier of 8QuadXPlus/8DualXPlus/8DualX, the maximum performance mode is 1.2 GHz.
— In the Low power (KS1) mode, the datasheet defines lower operating conditions for the VDD_A35, reducing power
consumption and junction temperature. In this mode, the voltage and temperature are set low enough so that theeffect on the lifetime calculations is negligible and treated as if the device was powered off.
• The junction temperature of the processor (Tj)
— The maximum junction temperature of the device is different for a given qualification level. For example, 125°C
for the automotive tier and 105°C for the industrial tier. It is important to note that while the automotive device isguaranteed to operate at 125°C, operating the device at 125°C for an extended period of time will have negative
consequences on the lifetime of the device.
— Ensure that your device is appropriately thermally managed, such that the maximum junction temperature is notexceeded.
NOTE
All data provided within this document are estimates for PoH based on extensive qualification experience andtested with the i.MX 8QuadXPlus/8DualXPlus/8DualX series. These statistically derived estimates should not beviewed as a limit on an individual device lifetime, nor should they be construed as a guarantee by NXP as to theactual lifetime of the device. Sales and warranty terms and conditions still apply.

NXP Semiconductors
Device qualification level and available PoH

2.1 Automotive lifetime estimates
Table 1 provides the number of PoH for the typical use conditions for the automotive device.
Table 1. Automotive qualification lifetime estimates
OperatingmodeCortex®-A35 speedgrade(MHz)Power-on Hours [PoH](Hrs)Arm® core operating
voltage(V)Junction Temperature[Tj] (°C)

Overdrive

1200

13,132

1.1

105

Overdrive

1200

4,462

1.1

125

Nominal

900

60,3391.0

105

Nominal

900

20,5041.0125Figure 1 establishes guidelines for estimating PoH as a function of junction temperature. PoH can be read directly from the curves
below to determine the necessary trade-offs to the junction temperature at the maximum CPU frequency.

Figure 1. i.MX 8QuadXPlus/8DualXPlus/8DualX automotive lifetime estimates

2.2 Industrial qualification
Table 2 provides the number of PoH for the typical use conditions for the industrial device.
Table 2. Industrial qualification lifetime estimate
Operating mode

Cortex-A35 speed
grade (MHz)Power-on Hours [PoH](Hrs)

Arm core operating
voltage (V)Junction temperature[Tj] (°C)

Overdrive

1200

87,6691.1105i.MX 8QuadXPlus/8DualXPlus/DualX Product Lifetime Usage, Rev. 0, May 25, 2021
Application Note2/4

NXP Semiconductors
Conclusion

Figure 2 establishes guidelines for estimating PoH as a function of junction temperature. PoH can be read directly from the curves
below to determine the necessary trade-offs to the junction temperature at the maximum CPU frequency.

Figure 2. i.MX 8QuadXPlus/8DualXPlus/8DualX industrial lifetime estimates overdrive mode

3 Conclusion
Selecting the optimal operating performance point and thermal envelope is paramount to meet the application lifetime targets.
Trade-offs between the target operating voltage/frequency of the device and the operating junction temperature (Tj) of theprocessor can greatly improve the lifetime of the device.
Lowering the operating junction temperature in the application is the most effective means to increase the lifetime of the device
without affecting the performance of the device. This can be accomplished by increasing the thermal dissipation capacity in theapplication. In cases where the thermal properties cannot be altered, a lower operating voltage can be used to increase the lifetimeof the device. Lowering the voltage may result in lowered performance; the operating frequency may have to be adjusted lower
to match the voltage specified in the datasheet.
The data and examples provided in this application note help you to determine the estimated lifetime for your particular application.

4 Revision history
Rev.

Date

025 May, 2021

Substantive changes
Initial releasei.MX 8QuadXPlus/8DualXPlus/DualX Product Lifetime Usage, Rev. 0, May 25, 2021
Application Note

3/4

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Date of release: May 25, 2021
Document identifier: AN13273