COMMISSION ON POWDER DIFFRACTION
INTERNATIONAL UNION OF CRYSTALLOGRAPHY
http://www.iucr.org/iucr-top/iucr/cpd.html

NEWSLETTER No. 32, December 2005
http://www.fkf.mpg.de/cpd/html/newsletter.html

IN THIS ISSUE

2D Powder Diffraction(Robert Dinnebier, Editor)
CPD Chairman’s message, Bill David

2

Editor’s message, Robert Dinnebier2

WWW sites related to Powder Diffraction

3

IUCr Commission on Powder Diffraction

3

Workshop Report: “Watching the Action”

4

2D Powder Diffraction:
In situ powder diffraction – Electric Fields
H. Ehrenberg

7

How to add a molecule to a crystallographic surface
using SCHAKAL 99
Egbert Keller

41

Discussion of the Indexing algorithms within TOPAS 43
Alan Coelho, Arnt Kern
Structural phase transitions made easy: the new
ISODISPLACE software tool
45
Branton J. Campbell, Harold T. Stokes, David Tanner, andDorian M. Hatch,
Derivative Difference Minimization (DDM) Program
Leonid A. Solovyov

47

Density Measurement Using the Berman Balance
Richard J. Staples

48

Datasqueeze: A Software Tool for Powder andSmall-Angle X-Ray Diffraction Analysis
Paul A. Heiney

9

Powder3D: A Software for tailored for in situ
powder diffraction studies
Bernd Hinrichsen, Robert E. Dinnebier; and Martin Jansen

12

Two2One - Software for the analysis of twodimensional diffraction data
Sven C. Vogel AAND Karsten Knorr 2

Fitting of nano particle structures to powder diffraction
pattern using DISCUS
49
R.B. Neder1 and T. Proffen2

23

Diamond – Investigation and Visualization of Structural
Changes
H. Putz, K. Brandenburg

26

Magnetic Rietveld and single crystal refinement with
SARAh- Representational Analysis and SARAh-Refine
for the MS-Windows
51
Andrew S. Wills

Detection of Ellipses in Powder Diffraction Patterns using
Hough Transformation
27
Rajiv Paneerselvam, Bernd Hinrichsen, Manfred Joswig, andRobert E. Dinnebier
Prediction of not-yet-synthesized phases at high and low
pressures and the transitions among them using global
exploration methods and ab initio calculations
J. C. Schön, Z. Cancarevic, and M. Jansen
Computer Corner, L M D Cranswick

31
38

New Time-of-Flight Neutron Total Scattering Data
Analysis Software at IPNS
39
J. Taoa , T. G. Worltona, J. Hammondsa, C. J. Benmorea, D. Mikkelson , R. Mikkelsonb
New Features of the BGMN Rietveld program
J. Bergmann1, R. Kleeberg2

ISSN 1591-9552

40

Quantitative Rietveld analysis in batch mode with
Maud, and new features in Maud 2.037
Luca Lutterotti
Update of the FullProf Suite and CrysFML
Juan Rodríguez-Carvajal

53
55

FOX, Free Objects for Xtallography version 1.7(november 2005)
Vincent Favre-Nicolin & Radovan Černý

57

VENUS: a 3D Visualization System for Crystal
Structures and Electron/Nuclear Densities
Fujio Izumi & Ruben A. Dilanian

59

News from the ICDD

66

What’s On

67

How to receive the CPD Newsletter

67

Calls for contributions to CPD Newsletter 33

67

CPD Chairman’s Message
It is my privilege and pleasure, as the incoming chair of the Commission on Powder Diffraction, to write the introduction tothis newsletter edited by the outgoing chair, Robert Dinnebier. The CPD was founded almost 20 years ago in 1987 and had its
first meeting as a satellite to the main IUCr congress in Perth, Australia in that year. It is interesting to review progress over the
past twenty years within the context of the reasons cited for the establishment of the CPD.
"One of the most fundamental arguments for the formation of the commission was the unique position of international research using powder diffraction as its main technique. In almost all cases in the field of crystallography there is considerably more activity in published material from academic institutions than from industry. This position is exactly reversedin the field of powder diffraction and it is one of the major purposes of the commission to provide an information link between the very large industrial community and the more academic, less applied aspects of the subject."
I would like to think that the boundaries between industry and academia have blurred a little over the past 20 years. Many ofthe most important advances have been pioneered by industry and particularly by the diffractometer companies. Faced with thephenomenal capabilities of powder diffractometers at synchrotron sources, these companies have risen to the challenge anddeveloped machines that are able to tackle some of the most challenging topics in powder diffraction today. You will, for example, find seminal contributions from both academic and industrial researchers in this newsletter. On the other hand, academics have been able to focus more on the crystallography of real materials that are of importance to industrial sectors ranging
from pharmaceuticals to energy and the environment. These are exciting times for powder diffraction and we can expect to see
significant growth over the next few years. This newsletter gives a glimpse of some of the challenges that lie ahead of us.
It is also my privilege and pleasure to thank the outgoing members of the Commission for their participation over their terms ofoffice; they are Rob Delhez, Cam Hubbard, Davor Balzar and Gert Kruger - many thanks! You will find the list of current
CPD members on the next page of this newsletter. I am pleased to welcome Simon Billinge, David Rafaja, Rosanna Rizzi, Peter Stephens and Pam Whitfield as new members. Do feel free to e-mail us with your thoughts and suggestions!
Finally, I would like to thank Robert Dinnebier, the outgoing Chair of the Commission, for his immense energy and great dedication in fulfilling the varied roles of newsletter editor, workshop organiser, general CPD fund raiser and passionate advocate
of powder diffraction. His three years as CPD chair have witnessed a dramatic development in the technique. I believe that thetrend is set to continue - we have an exciting triennium ahead of us. Watch the action!
Bill DavidCPD projects
RIETVELD REFINEMENT OF ORGANIC STRUCTURES
Increasing numbers of organic crystal structures are being solved and refined from powder diffraction data. The basic arrangement of the molecules in the structure can often be determined by direct methods, or by direct-space approaches. However, experience shows that problems can arise in the subsequent Rietveld refinement. For example, unless restrained by appropriate bond distances and angles molecules can distort unrealistically from a reasonable molecular structure. So how good
are these Rietveld refinements? Is the problem a fundamental one of powder diffraction? eg. the ambiguities and correlations
caused by peak overlap or defining the background etc. lead to inaccurate structures. Or can some of the blame be attributed topoor refinement practice? We plan to put onto the CPD web site a number of good quality powder diffraction patterns fromorganic compounds of known crystal structure and of different complexity. These can be downloaded, and powder crystallographers can try out their own prowess at Rietveld refinement, by comparing their refined structures with the accepted singlecrystal structures. This should be a learning exercise for us all. Any suggestions as to compounds that would appear particularly appropriate for this project are very welcome. Please contact the CPD chairman.
TEXTBOOK ON POWDER DIFFRACTION
R. Dinnebier and S. Billinge are editing a textbook targeted at graduate students to be published by the Royal Society of Chemistry. 2/3rd of the contributions have been received. The final deadline has been extended to early 2006.

From the Editor of Newsletter 32
2D POWDER DIFFRACTION
As one of my last duties as leaving chairman, it is my pleasure to edit this last issue of our CPD newsletter for the triennium
2002-2005. Powder Diffraction is an active field of research and it is exciting to watch new developments becoming routine.
This is in particular true for in-situ powder diffraction employing fast 2-dimensional detectors, which is also the main topic of
this newsletter. Before a exciting new technique really becomes routine, a lot of hardware and software development in
combination with teaching is required. As an example, in order to handle hundreds or even thousands of high resolution
powder diffraction patterns simultaneously, new generally available software must be developed and debugged. Hands onworkshops are required, which not only reflect the state of the art but also teach students how to handle challenging problems.
One of these workshops called “Watching the Action: Powder Diffraction at non-ambient conditions” was recently held at the
MPI in Stuttgart. In order to make the proceeding to this workshop available to a broader readership, I decided to incorporate
the full papers into the newsletter, which explains the slight “oversize” of this issue. Supplementary material, additionaltutorials and many abstracts can also be found at http://www.fkf.mpg.de/xray.
Robert Dinnebier

2

WWW sites related to powder diffraction
The Commission on Powder Diffraction (CPD): http://www.iucr.org/iucr-top/iucr/cpd.html
The International Union of Crystallography (IUCr): http://www.iucr.org/
The International Centre for Diffraction Data (ICDD): http://www.icdd.com/
The International X-ray Analysis Society (IXAS): http://www.ixas.org/
CCP 14: http://www.ccp14.ac.uk/
Submitting a proposal for neutron diffraction or synchrotron radiation X-ray diffraction is possible at many (publicly funded)large scale facilities in the world. It represents an important and frequently unique opportunity for powder diffraction experiments. A useful guide and information can be accessed through the following web-site, maintained by R. Dinnebier at
http://www.fkf.mpg.de/xray
This list is far from being complete and needs input from users and readers of the CPD Newsletter. Please send comments to R.
Dinnebier (r.dinnebier@fkf.mpg.de)

THE IUCR COMMISSION ON POWDER DIFFRACTION - TRIENNIUM 2005-2008
Prof. Dr. D. Rafaja (David)
Institute of Physical Metallurgy,
TU Bergakademie Freiberg,
Gustav-Zeuner-Str.5
D-09599 Freiberg, Germany
e-mail: rafaja@ww.tu-freiberg.de
Telephone: +49(3731)392299 | Fax: +49(3731)393657
e-mail: rafaja@ww.tu-freiberg.de
home: www.tu-freiberg.de/mk/

Chairman: Prof. W. I. F. David (Bill)
Rutherford Appleton Laboratory (CCLRC), Chilton, Oxon.
OX11 OQX, United Kingdom
Telephone: +44 1235 445179 | Fax: +44 1235 445643
e-mail: bill.david@rl.ac.uk
Secretary: Prof. A. N. Fitch (Andy)
ESRF, BP220, F-38043 Grenoble Cedex, France
Telephone : +33 476 88 25 32 | Fax: +33 476 88 25 42
e-mail: fitch@esrf.fr

Dr. R. Rizzi (Rosanna)
CNR IC - c/o Dip. GeomineralogicoVia Orabona 4,Bari, I-70125 , Italy (map)Telephone: 39(80)5442624 | Fax: 39(80)5442591
e-mail: rosanna.rizzi@ic.cnr.it

Prof. Dr S. Billinge (Simon)
Department of Physics and Astronomy
4268 Biomed. Phys. Sciences Building
Michigan State University
East Lansing, MI 48824
Telephone:+1-517-355-9200 x2202 | Fax: +1-517-353-4500
email: billinge@pa.msu.edu
home: http://www.totalscattering.org/

Prof. Dr. P. W. Stephens (Peter)
Peter W. Stephens, Professor
Department of Physics & Astronomy
State University of New York
Stony Brook, NY 11794-3800, USA
Telephone: +1 (631) 632-8156 | Fax: +1 (631) 632-4977
e-mail: pstephens@stonybrook.edu
home: powder.physics.sunysb.edu

Prof. M. Delgado (Miguel)Laboratorio de Cristalografía, Departamento de Química,
Facultad de Ciencias, La Hechicera.
Universidad de Los Andes, Mérida 5101
Venezuela.
Telephone: +58 274 240 13 72
e-mail: migueld@ula.ve

Dr Pamela Whitfield (Pam)
CChem MRSC Energy Materials
Institute for Chemical Process and Environmental Technology, Building M12
National Research Council Canada
1200 Montreal Road, Ottawa ON K1A 0R6, CANADA
Telephone: (613) 998 8462 | Fax: (613) 991 2384
Email: pamela.whitfield@nrc-cnrc.gc.ca
home: http://icpet-itpce.nrc-cnrc.gc.ca/

Dr. I. Madsen (Ian)
CSIRO Minerals
Box 312, Clayton South 3169
Victoria, Australia
Telephone: +61 3 9545 8785 | Fax: +61 3 9562 8919
e-mail; Ian.Madsen@csiro.au
Prof. N. Masciocchi (Norberto)
Dipartimento di Scienze Chimiche e Ambientali,
Università dell'Insubria, via Valleggio 11,22100 Como (Italy)
Telephone: +39-031-326227 | Fax: +39-031-2386119
norberto.masciocchi@uninsubria.it
http://scienze-como.uninsubria.it/masciocchi/

ICDD Representative
Prof. R. L. Snyder (Bob)
Department of Materials Science & Engineering, Georgia
Institute of Technology, Columbus, 771 Ferst Dr. N.W., Atlanta, GA 30332-0245, USA;
Telephone: +1 (404) 894-2888 | Fax: +1 (404) 894-2888
e-mail: bob.snyder@mse.gatech.edu

3Dr. J. A. Kaduk (Jim)BP Chemicals, 150 W. Warrenville Rd., P.O. Box 3011 MC
F-9, Naperville, IL, 60566, USA
Telephone: +1(630)4204547 | Fax: +1(630)4205252
e-mail: James.Kaduk@innovene.com

Consultants:
Dr James Cline (Jim)
Ceramics Division, National Insititute of Standards and Technology, 100 Bureau Dr Stop 8523,
Gaithersburg, Maryland, 20899, USAe-mail:cline@nist.gov

Dr. Irene Margiolaki
ESRF, BP220, F-38043 Grenoble Cedex, France
Telephone : +33 476 88 21 48 | Fax: +33 476 88 29 07
e-mail: margiolaki@esrf.fr

Dr Johan Pieter Roos De Villiers
Mineralogy Division, MINTEK, Private Bag X3015, Randburg, 2125, South Africa
Telephone: +27(11)7094745 | Fax: +27(11)7094564
e-mail: jpdev@postino.up.ac.za, johandev@global.co.za

Prof. P. Scardi (Paolo)
Dipartimento di Ingegneria dei Materiali e Tecnologie Industriali, Università di Trento, 38050 Mesiano (TN), Italy;
Telephone: +39 0461 882417/67 | Fax: +39 (461) 881977
e-mail: Paolo.Scardi@ing.unitn.it

Dr R. E. Dinnebier (Robert)
Max-Planck-Institut für Festkörperforschung,
Heisenbergstrasse 1, D-70569 Stuttgart, Germany
Telephone: +49-711-689-1503 | Fax: +49-711-689-1502
e-mail: r.dinnebier@fkf.mpg.de
home: www.fkf.mpg.de/xray

Dr. M. Yashima
Tokyo Inst. of Technology, Grad School of Sci. & Engn.
Dpt. of Matls. Sci.& Engn. Nagatsuta-cho 4259-J1-4
Midori-ku Yokohama, 226-8502, Japane-mail: yashima-masatomo@mail.goo.ne.jp

The evening program consisted of a wine tasting of selected German produce. A delicious buffet dinner complemented the wines, all hand picked by Robert Dinnebier,perfectly. This social event was only possible due to thefriendly support of our industrial sponsors.

Workshop Report “Watching the Action”
An international workshop on in situ powder diffraction
organized by Robert E. Dinnebier, Bernd Hinrichsen andMartin Jansen was held in Stuttgart in the first week ofOctober. The Max-Planck-Institute for Solid State Research hosted the event spanning two days, organized under the auspices of the DGK, CPD and MPG.
Various aspects of this fascinating experimental method
were presented during the morning sessions, the afternoons
being reserved for ‘hands-on‘ tutorials in data reduction,
presentation and Rietveld refinement. Twelve participants
contributed short presentations, detailing their current research in the field and also presenting experimental facilities.
The opening presentation by Paul Norby went directly tothe heart of the matter, giving insight into novel high speed
synchrotron experiments aimed at studying chemical reactions. Christian Schoen showed us what we are looking forin his talk on structure prediction of new high and low
pressure phases.
After the coffee break image analysis filled the rest of themorning session. Some general aspects of image filtering
techniques were introduced by Manfred Joswig. Bernd
Hinrichsen presented a real application of some of thesetechniques within the novel image plate integration software Powder3D-IP.
Arndt Kern focused on laboratory experiments, giving adetailed view of the challenges facing the experimentalist
during high temperature experiments. He wowed thecrowd with some novel applications of the Rietveld refinement software Topas.
The remaining working day was spent practicing data reduction and presentation using the software Powder3D(http://www.fkf.mpg.de/xray).

The next day started with as much fervour as the previous
had ended. Ulrich Schwarz teaching us the intricacies ofhigh pressure powder diffraction experiments.
Gaining a better understanding of batteries motivates theelectrical field in situ studies of Holger Ehrenberg. Hispresentation of the Hasylab beamline B2 dedicated to insitu experiments proved the high level of dedication andspecialization in the field.
Holger Putz presented the powerful capabilities of Diamond when visualizing structural changes. The capability
to create films easily being responsible for the greatest
interest.
The rest of the day was spent following the incomparable
Juan Rodriguez-Carvajal during his presentation and tutorial of Fullprof. The cyclic mode making structural analysis of large in situ data collections much more manageable.
Late Friday afternoon saw the last of the ninety participants leave for home, weighed down by the workshop
manuscript but certainly inspired to take up the in situ
challenge.
The organizers would like to thank the DGK for the generous financial support of the event, this allowed the registration fees to be waived. The workshop manual and some
impressionsareavailable
onlineunder
http://www.fkf.mpg.de/xray.

4

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ANOTHER FIRST FROM PANALYTICAL!
New X’Pert PRO
for transmission
allows for diffraction
measurements onproteins

Le Bail ﬁtting
Proﬁle function: Pseudo Voigt
Asymmetry correction: Finger-Cox-Jephcoat
Cell parameters:
a=78.99 Å
c=37.87 Å

Indexing was carried out using X’Pert HighScore Plus software. Further processing using
Le Bail ﬁtting method provided excellent agreement with the cell parameters achievedby single crystal diffraction.

Using PANalytical’s new transmission geometry with PreFIX focusing
mirror, in conjunction with the X’Celerator detector, diffraction
experiments on macromolecules such as proteins can now be carriedout with an X’Pert PRO MPD X-ray diffraction system. Characterized
by weak scattering and small sample volumes, these materials havepreviously been considered ‘difﬁcult’ for X-ray diffraction. Instead,protein structure determination traditionally relied on the use of single
crystal systems, or beam lines for the extraction of powder patterns.
Here, we show for the ﬁrst time that protein powder data measured ona laboratory X-ray diffraction system can be used for crystallographic
analysis.

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Emphasis on the research and development of macromolecules –especially in areas such as protein pharmaceutics – has increased strongly
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As a PreFIX optic, the focusing mirror is interchangeable with all otheravailable incident optics for the X’Pert PRO MPD without the need forany re-alignment. From a technical perspective, it means:• the size of the capillary tube no longer governs resolution• peaks narrower than 0.05 degrees are easily resolved.
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To ﬁnd more about PANalytical’s X’Pert PRO for transmission, contact
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6

in situ powder diffraction – Electric Fields
H. Ehrenberg
Materials Science,Darmstadt University of Technology,Petersenstr. 23, D-64287 Darmstadt
The investigation of materials under real operation
conditions is of primary importance for materials
science. From a more basic research point of view theunderlying working principles can be elucidated,
guiding the route to advanced functionalized materials.
On the other hand, degradation mechanisms can also be
revealed, allowing a goal-aimed optimization of cycle
stability in long-time operation by minimizing fatigue.
Two main challenges for such studies can besummarized: 1. "Materials" are normally multi-phasecomponents, combined in a specific way to form highly
inhomogeneous devices, far away from ideal crystal
structures. 2. "in situ" conditions require sample
environments, which restrict the observations either byadditional disturbing signals or "hide" the object ofinterest by not-transparent shieldings. A promising
approach to in situ materials characterisation has tofollow three steps: (i) identification of a suitable probe,(ii) design of an operating test cell, (iii) combination
with an adapted dector system. For structural studies ofpolycrystalline materials under operation the use ofsynchrotron radiation can overcome most of thelimitations:
High-energetic
radiation(shortwavelength) has a very good penetration capability, thehigh intensity allows fast data collection with goodtime resolution, and the low vertical divergence canreveal also subtle details by the small (and in mostcases neglectable) instrumental contribution to theobserved reflection profiles in powder diffraction. In
this contribution two examples for the characterisationof materials, driven in operation by electric fields, areshown: 1. Piezoelectric Pb(Zr,Ti)O3 ceramics arepolarized by electric fields, and the resulting strain isused in actuators. 2. Li(Co,Ni)O2 allows to extract andreinsert Li-ions. This reversible process is exploited in
the cathode of rechargeable Li-ion batteries. During
charging the electric field of the external charger
pumps electrons from the cathode to the anode andinduces, for charge compensation, a movement of one
Li+-ion per electron from the cathode to the anodethrough a Li-conducting, but for electrons insulating
electrolyte.

7

30000

(101)

0 kV/mm
5.5 kV/mm

20000

(110)
10000

0
The pictures show a PZT ceramic with sputtered Ptelectrodes as used in the in situ device (left) and thewhole device mounted on the diffractometer B2 [1] at
HASYLAB (middle). The position-sensitive detector
OBI [2] can also be seen and covers the whole 2θ range
simultaneously. For more information on the specificsample see reference [3]. A section of two diffraction
patterns (λ = 0.49975 Å) is shown on the right handside for different states of poling. The effects of
microstructural changes are clearly reflected in the
different profiles. The evolution of these profiles alonghystereses loops is reversible and has to be correlatedwith the underlying microstructure; these analyses arestill in progress [4].
Two different test cells for in situ studies of theelectrochemical Li-extraction and -insertion have beendeveloped [5,6]:

However, differently prepared LiMn2O4 samples show
a very distinct behaviour. All three phases are ofspinel-type structure and differ probably in the cation
distribution on the tetrahedral and octahedral
interstitials. The in situ technique allows to follow
structural changes during operation and does not sufferfrom relaxations or reactions, which might occur
before ex situ studies after dismounting of a battery.
The test cell is further improved at present with respect
to life-time stability. At least 100 charge-discharge
cycles are needed to investigate fatigue in the cathode.

SwagelokTM housing
Al
Cu
Cathode mix

BeamSealings

The following figure shows the complete diffraction
pattern for LiMn2O4 as observed before charging andcalculated by the Rietveld method using the program
package Winplotr [7]. Note that phase-specific sample
shifts from the diffractometer centre have to be taken
into account, because of the sequential arrangement of
Al-current collector, cathode and Li-anode along thebeam direction. The newer versions of Fullprof canhandle this important feature.

Financial support from the Helmholtz Association of
National Research Centres (Virtual Institute VH-VI102) for the "development of dedicated in situ
environments for the characterisation of polycrystalline
materials using high-energetic synchrotron radiation" isgratefully acknowledged. Electrical fatigue infunctional materials is investigated in the
λ = 0.69956 Åframe of the DFG Collaborative ResearchCentre SFB 595. Experiments and analyses
on PZT ceramics are performed by K. A.
Schönau, M. Knapp and H. Fueß, on Li-ion
battery materials by N. N. Bramnik, K.
Nikolowski and C. Bähtz.

(111)
52000
39000

(311)
26000

Al
13000

0

19

7

43

2θ/°

The changes of diffraction patterns during charging anddischarging are already described in detail [5]. During
charging and discharging the original phase A withmaximum Li-content disappears and two other phases
B and C with smaller lattice parameters are formed
conteracting, see next figure. For this sample, preparedby sub-solidus reaction, a three-phase mechanism of
Li-extraction and reinsertion was established.

Phase
100%

A

B

C

0%
8.34

chargeAdischarge

a/Å

B

8.24

C

This method was also successfully applied to othercathode materials: Li(Co,Ni)O2 [8,9], Li(Mn,Fe)PO4[10] and LiCoPO4 [11].

xmax
xmin

8.14

8

[1] M. Knapp, C. Baehtz, H. Ehrenberg, H.
Fuess, J. Synchrotron Rad. 11 (2004) 328334.
[2] M. Knapp, V. Joco, C. Baehtz, H. H.
Brecht, A. Berghaeuser, H. Ehrenberg, H.
55
von Seggern, H. Fuess, Nucl. Instrum. Meth.
A 521 (2004) 565-570.
[3] K. A. Schönau, M. Knapp, N. Balke, H. Ehrenberg,
H. Fuess, Z. Kristallogr. Suppl. 22 (2005) 127.
[4] K. A. Schönau, PhD Thesis, Materials Science,Darmstadt University of Technology.
[5] C. Baehtz, Th. Buhrmester, N. N.
55 Bramnik, K.
Nikolowski, H. Ehrenberg, Solid State Ionics 176(2005) 1647-1652.
[6] K. Nikolowski, C. Baehtz, N. N.
Bramnik, H. Ehrenberg, J. Appl. Cryst. 38(2005) 851-853.
[7] T. Roisnel, J. Rodriguez-Carvajal,
Mater. Sci. Forum 378-381 (2001) 118123.
[8] T. Gross, T. Buhrmester, K. G.
Bramnik, N. N. Bramnik, K. Nikolowski,
C. Baehtz, H. Ehrenberg, H. Fuess, Solid
State Ionics 176 (2005) 1193-1199.
[9] H. Ehrenberg, K. Nikolowski, N. N.
Bramnik, C. Baehtz, T. Buhrmester, T.
Gross, Adv. Eng. Mater., in print.
[10] N. N. Bramnik, K. G. Bramnik, K.
Nikolowski, M. Hinterstein, H. Ehrenberg,
Electrochem. Solid-State Lett. 8 (2005)
A379-A381.
[11] N. N. Bramnik, K. G. Bramnik, C.
Baehtz, H. Ehrenberg, J. Power Sources
145 (2005) 74-81.

Datasqueeze: A Software Tool for Powder
and Small-Angle X-Ray Diffraction Analysis
Paul A. Heiney
Department of Physics and Astronomy
University of Pennsylvania
209 S. 33rd St.
Philadelphia, PA 19104, U.S.A.
heiney@sas.upenn.edu

Figure 1. Schematic of a typical XRD experimentemploying an area detector.

Introduction
A substantial portion of X-ray Diffraction (XRD) researchis today performed using two-dimensional (2D) positional
detectors, also known as area detectors. Such detectors
measure the scattered intensity over a surface, and save thedata as an array of pixel intensities. The researcher mustthen interpret this array of intensities to obtain a structuralmodel for the system of interest. Typically, the detector
manufacturer supplies software for reading the obtained
data files and performing some kind of primary dataprocessing. However, this software varies in quality, andeven when it is well designed it may not suit the needs ofthe user. For example, the scientist may be performing
small-angle x-ray scattering (SAXS) using an instrumentthat the manufacturer had intended for use with singlecrystal structure refinement. The hardware itself could be
perfectly adequate for the purpose, but the manufacturer’s
software ineffective at extracting the kind of information
desired. Furthermore, the supplied software often runs only
on the computer used for collecting the data. The scientist
may have obtained the data at a central facility orsynchrotron, and wish to analyze the data back at his or her
own desk.
Here we describe a software application, Datasqueeze [1],that can be used to analyze data from a wide variety of xray area detectors. Datasqueeze runs on Windows, Linux,
and Macintosh OS X. It is particularly useful for the
analysis of powder diffraction data, diffuse scattering frompolymers or liquid crystals, or small-angle scattering fromcolloids, polymers, or gel solutions. (Datasqueeze is notwell suited for analysis of single-crystal diffraction patterns
with many sharp Bragg peaks). This article discusses thecapabilities of Datasqueeze, and also reviews somecommon problems and concerns encountered whenanalyzing data from area detectors.
X-ray Detector Properties
Figure 1 shows a schematic of a typical XRD experimentusing an area detector. The incident beam, which ismonochromatic (with wavelength λ) and collimated, strikes
a sample. The transmitted beam is blocked by a beamstop,
to avoid damaging the detector. The scattered radiation
strikes the detector. The detector records the integrated
intensity in each pixel, but the quantity of interest is
generally the scattered intensity measured as a function of2θ (the angle between the primary beam and the scatteredbeam) and χ (the orientation on the detector relative to anarbitrarily chosen direction). The scattering angle is often
characterized using the momentum transfer q=(4π/λ) sin θ,
which can also be represented using Cartesian coordinates
qx=q cos χ, qy=q sin χ.

9

Depending on the experiment being performed, the user
will wish to extract different information. In a typical
SAXS or powder diffraction experiment, the quantity ofinterest is the radial dependence of the intensity, I(q),integrated over all χ. If the sample is a fiber or liquid
crystal, the user may wish to obtain I(q) profiles evaluatedat different values of χ. If the material is a partiallyoriented polymer or poorly ordered crystal, the quantity ofinterest may be the “mosaic,” obtained by plotting I(χ) at achosen value of q (this is sometimes known as a “polefigure”).
The most commonly employed detector technologies areimage plates, gas (wire) detectors, and charge-coupleddevice (CCD) cameras. Each has its advantages anddisadvantages. Image plates are often the least expensive.
They offer high dynamic range in intensity, but the duty
cycle can be low due to the time required to read the dataand prepare the plate for the next image. Wire detectors (inwhich crossed wires are embedded in an ionizable gas)
offer fast readout and very low background noise, but can
only support relatively low count rates; they are commonly
employed in laboratory settings (fixed tube or rotatinganode generators). CCD detectors are the most expensive.
They do not have a count rate limitation, but tend to have afairly high readout noise (on the order of tens of counts per
pixel); they are most often used in synchrotron applications.
From the user’s point of view, however, the data from all
three detector types, once obtained, look quite similar: anarray of pixel intensities, generally in a file format uniqueto the manufacturer of that detector.
In the analysis of XRD images, considerable attention isoften paid to questions of instrumental resolution: how
does the width of a diffraction peak depend on the physicalsize and divergence of the incident beam, the sample size,
the sample-detector distance, the pixel-by-pixel resolutionof the detector, etc. Less attention is sometimes paid to the
angular linearity of the detector itself. In wire detectors, forexample, the positions of the wires within the detector mayvery from nominal values, and “parallax” corrections of thephoton path through the detector can be substantial. In our
experience, this can lead to discrepancies between
measured and calculated peak positions on the order of |∆q/q |~2-4%, even after linearity corrections are applied by thedata gathering program.
Similarly, CCD detectors
generally consist of a fluorescent screen, focusing optics,
and the actual CCD detection plate. Distortion by the
focusing optics can induce nonlinearities in measured peak
positions; the quality of these optics is one of the primarydifferences between expensive and very expensive X-ray
CCD cameras! Data from image plates can also suffer fromdistortions caused by waviness in the collecting plate or
irregularities in the scanning hardware.

Data Input
Most commonly, the scientist will be analyzing a single
data set at a time, but sometimes they are combined. One
common situation is where many frames are collectedunder the same conditions. Datasqueeze can add up toeleven such files to produce a single composite dataset,
while keeping track of counting statistics, etc. A somewhat
more complicated situation is encountered when the user
has collected a background data set, for example air
scattering with no sample in place.
Under thesecircumstances, the natural tendency is to perform a one-toone subtraction of the background data from the sample
data, but this is almost always incorrect. It is important tounderstand all the possible sources of background. Theremay be a constant, source of “readout” noise, as discussed
above in the case of CCD detectors. This should clearlyjust be subtracted from each data file, independent of counttime. There may be background scattering that originatesfrom the primary beam after it passes through the sample.
This scattering will be proportional to the integration time
but also depend on how much the primary beam wasattenuated by the sample.
Background originating
upstream of the sample, on the other hand, will not beaffected by sample attenuation. Datasqueeze canaccomplish all of these manipulations (i.e., addition or
subtraction of a constant term, subtraction of a backgroundfile multiplied by a scaling term depending on the sample
attenuation), but it is important for the user to clearly
understand the source of the background scattering rather
than simply blindly subtracting a “background file.”neighbors. Similarly, if a pattern is very noisy, due to low
signal (poor counting statistics), blocks of pixels can bebinned together to produce an image with lower resolution
but less noise.
Calibration
In order to quantitatively interpret an x-ray scattering
pattern, it is necessary to map detector pixels to scattering
angle units (q/χ or qx/qy). To accomplish this, the following
instrumental parameters must be known with some
precision: the wavelength λ, the pixel coordinates (xc, yc)of the beam center, the angular span of the detector as seenfrom the sample, and the orientation of the detector relative
to the primary beam.
The wavelength must be
independently obtained; it cannot be inferred from the data.
Since there is usually a dark patch in the image due to thebeam stop, it is tempting to assign (xc, yc) to the geometriccenter of the beam stop image, but this is almost always
wrong; the beam center usually differs from the beam stop
center by a few pixels, and misidentification of the (xc, yc)
by even a fraction of a pixel can have significant
consequences. Instead, by measuring a calibration sample
such as silver stereate, silver behenate, LaB6, or silicon, one
obtains a powder diffraction pattern consisting of a set ofconcentric Bragg rings. The instrumental parameters canthen be calibrated by requiring that (xc, yc) be at the centerof the rings, the scattering angles of the rings correspond to
known d-spacings, and that the rings be circular after
correcting for possible detector misorientation relative tothe primary beam.

Data Display and Processing
The scientist generally wants to visualize the data before
performing quantitative analysis. Datasqueeze presents thedata as a false color image, with tunable maximum,
minimum, and contrast. To locate features of interest, apolar or Cartesian grid can be superimposed on the data, as
shown in Figure 2.

Figure 2: False color image of a fiber diffraction pattern,showing superimposed qx-qy Cartesian grid. Data collected
at the University of Pennsylvania [2]. Note that, because
the scattering plane is not identical to a reciprocal spaceplane (the Ewald sphere is projected onto a plane), theconstant-qx -qy or curves are not straight lines.
Further manipulations can be performed at this stage. Data
from CCD cameras often contain isolated bad pixels,
arising from electronic noise; the “dezing” feature searches
for pixels that are astatistically different from theirneighbors and replaces them with the average of their

10

Figure 3: Calibration using AgBe standard. (a) The
calculated rings (dashed curves) do not match themeasured rings (red and yellow). (b) After optimization,
the two sets of rings overlap.
Datasqueeze provides three methods for accomplishing thiscalibration. First, if the calibration parameters are alreadyknown for a particular data set, the user can simply type

them in. Second, the measured diffraction pattern can bevisually compared with the predicted d-spacings, and thedetector parameters optimized to make them overlap, asshown in Figure 3. Finally, program can automaticallyrefine detector parameters using a user-selected Bragg ring.
Data Reduction
After the data set is properly calibrated, one often wishes tocollapse the 2D pixel array (typically 106-107 pixels) to a
one-dimensional x-y list of intensities, consisting of 102-103
items. As discussed above, this might consist of I(q)integrated over all χ for a powder diffraction measurement,
I(q) integrated over a limited range of χ for a fiber
measurement, I(χ) integrated over a finite range of q for apole plot figure, I(qx) integrated over a finite range of qy
values, etc. Datasqueeze provides a variety of plotting
option, and in each case the user can either input the desired
range and plot increment directly, or graphically select therange using the false color image.

Summary
Datasqueeze is a powerful tool for the analysis of 2D X-ray
diffraction patterns, especially those arising from smallangle or powder diffraction. In addition to the featuresdescribed above, it provides facilities for pixel-by-pixel
examination of the data, extraction of statistics regarding
distributions of intensities among pixels, and indexing of
simple powder diffraction patterns using a graphicalinterface. In addition to the graphical interface, the program
can run in a “batch” mode for automated processing ofmany files.
A particular strength of the program is that it is still
evolving. A new version is released every 2-4 months,
generally incorporating improvements or new features
suggested by users. Anticipated upgrades to the program
include support for yet more data formats, more options for
2D to 1D data reduction, and improved support for nonEnglish speaking readers.
References[1] The description of Datasqueeze in this article does notconstitute or imply an endorsement by the
University of Pennsylvania. Datasqueeze can beobtained from http://datasqueezesoftware.com. A
manual with more detailed information on the
program is available as a free download from thesame site.
[2]
The
instrumentationisdescribed
athttp://www.lrsm.upenn.edu/lrsm/facMAXS.html[3] D. W. Marquardt, J. Soc. Ind. Appl. Math. II, 2, 431441 (1963)).

Figure 4: (b) Shows the radial I(q) plot (equivalent to a θ2 θ plot) showing the intensity profile of the bright ring onright in the fiber pattern in (a). Data were averaged over
the range χ=±20º. Red dots show the extracted data; solid
curve shows the results of a least-squares fit. Lower panelin (b) shows fit residuals (i.e., [[model-data]/error] 2).
Once extracted, the x-y data can be graphed, saved for
future analysis, or compared via a least-squares-fit analysis
to a variety of commonly used functional forms (Lorentzianand Gaussian peaks, power law, Rayleigh and Bessel
functions, etc.). Least-squares fit aficionados are provided
with detailed information on multi-parameter error bars,
correlation coefficients. etc. Figure 4 shows a radial plot
through the bright ring on the right-hand side of the fiber
pattern shown in Figure 2. The data have been leastsquares fit to a sum of three Lorentzian functions and alinear background, using the Marquard nonlinear leastsquares minimization algorithm [3].

11

Powder3D: A Software for tailored for in situ
powder diffraction studies
Bernd Hinrichsen, Robert E. Dinnebier andMartin Jansen
Max Planck Institute for Solid State Research,
Heisenbergstrasse 1., Stuttgart
Introduction
Powder3D is a program for data reduction and publication
quality visualisation aimed specifically at large data setscollected in time resolved powder diffraction experiments.
The program is in ongoing development, so there shall be
regular updates and extensions to the present functionality.
Forcommentsorsuggestions
pleasecontactr.dinnebier@fkf.mpg.de .
Getting Started
Installation
The latest version of Powder3D can be downloaded fromhttp://www.fkf.mpg.de/xray. As Powder3D is written in the
programming language IDLTM you will need to install the
IDL virtual machine (IDL VMTM) before being able to run
Powder3D.
Virtual machines for various platforms can be downloaded
from the RSI website http://www.rsinc.com/idlvm/ free ofcharge. When you have installed IDL VMTM unpack
Powder3D into a directory of your choice and double clickon the file ‘Powder3D.sav’. After dismissing the IDL
VMTM (current version 6.1 only) splash screen thefollowing window (Figure 1) should welcome you.
Please note: the libraries necessary for the AVI export andpeak refinement, namely ‘IDLtoAVI.dll’, ‘IDLtoAVI.dlm’,‘p3d.dlm’ and ‘p3d.dll’ should be in the same directory as
Powder3D. The functions only work on the Windows®
operating system. Other operating systems are notsupported. UNC (unmapped network) paths will cause theprogram to fail.

Figure 1. : Welcome screen
Table 1: Phases identified in the sample data set
Phase
SG
a/Å
b/Å
c/Å
Pbam
11,29 6,29
3,62
δRb2[C2O4]
γ6,33
10,45 8,22
P21/c
Rb2[C2O4]
βPnma
8,16
6,58
10,9
Rb2[C2O4]
P63/m
α6,47
8,26
Rb2[C2O4] mc
α5,89
7,80
P63/m
Rb2[CO3] mc
Pnma
7,68
5,89
10,14
βRb2[CO3]
γ5,8710,13 7,31
P21/c
Rb2[CO3]

β/°

98,0
2

97,3

Range
Æ
653K
Æ
653K
Æ
661K
Æ
723K
Æ
830K
Æ
600K

The temperature ramp was set to 298 Æ 838 Æ 298 K. The
sample was heated at a rate of 2.8 Kmin-1 and cooled at a
rate of 4.8 Kmin-1. Considering the exposure anddevelopment time this leads to a heating rate of 4.2 Kframe1
and a cooling rate of 7.62 Kframe-1.

The sample data set
The data set that is the basis for the graphics displayed in
the manual is available for download fromhttp://www.fkf.mpg.de/xray. The data stems from anexperiment carried out at the X7B beamline of the NSLS
(Dinnebier et al., 2005). The wavelength was 0.9224 Å.
The initial substance was δ-Rb2[C2O4]. Seven phases can be
identified and are tabulated below:

Figure 2. : Powder diffraction patterns, lattice parameters,
and cell volumes of Rb2[C2O4] and Rb2[CO3] as a functionof temperature in the range from 298 to 838 K (2.4 K min-1
and back down to 298 K (4.8 K min-1). Taken from(Dinnebier et al., 2005).

12

ImportOne of the first things you shall want to do is to import
data. To do that press the import button (Figure 3) or select‘File’ > ‘Import’.

Figure 3.: Import menu
Figure 5.: Import settings
Six different formats are available, although XY and Chi
formats are identical. You shall be prompted to select a file(Figure 4). Standard versions of GSAS (GDA), Fullprof(DAT), Bruker (UXD) and DASH (XYE) data files areimported.

After the files have been read a message displays a few
details on the array (Figure 6). There is no set limit to thenumber of files that can be read, the only limitation is theavailable memory.

Figure 6.: Import report
As soon as you acknowledge the message you are displayed
the first of your powder patterns (Figure 10).

Figure 4.: Select import files
Select any file of your set. Once you press open a search for
all files with a suffix identical to the selected file within thegiven directory is started. Beware – this search is recursive,
if you have further file in subdirectories matching thesearch pattern these shall also be loaded. The files are
sorted according to the last number in the file names. A
specific suffix is not necessary – Powder3D does however
filter for the endings according to the selected file format in
the file selection dialog.
Should your files have a different suffix, type *.<yoursuffix here> <Enter> in the ‘File name’ field to display
them.
Upon pressing enter the file names in the directory are readand sorted, then the first file is loaded and the theta range
read. The next window prompts you for the wavelength andthe two theta range and increment. The increment entered
can not be altered later. The range can only be cropped.
Should the range of your files differ from the set values theintensities are interpolated using the selected function(linear, quadratic or spline). The entries correspond to thevalues of the sample data provided.

Single pattern loading and deletion
Should you wish to load a single pattern only , or wish tocompare a pattern to already loaded data, this can be doneby using the function, ‘Edit’ > ‘Add Pattern’ (Figure 7.).
The pattern is added to the end of the pattern array. Should
the pattern differ with regard to the step width or position
the intensities are interpolated to match the range and step
width of the data already loaded. A dialog requiring you toenter the wavelength for this pattern is displayed. If apattern needs to be deleted, select it in the ‘2D-Plot’
window and choose ‘Delete pattern’ from the ‘Edit’ menu.
Should you wish to delete any number of patterns, selectthem in the pattern list and select the function ‘Edit’>‘Remove Patterns’ from the menu bar.

Figure 8.: Adding a single pattern

13

Figure 12.: Cropping bars

Figure 9.: Pattern selection tool

On pressing the enter button the entire array is cropped to
the new range.
Please note: It is a good idea to save the data regularly to
avoid possible data loss. (‘File’ > ‘Save’).
Single pattern visualization

Figure 13.: Zoom button

Figure 10.: The first powder pattern

Data reduction
Cropping tool
The limits of the powder patterns generally need to bechanged. This is conveniently done by means of thecropping tool. A click on the crop button (Figure 11) draws
two vertical lines, which you can drag to define the desired
range (Figure 12).
Figure 14.: Zoom tool
The default tool in the 2D-plot window is the zoom box(Figure 14). Pull it over a region you wish to enlarge. Oncethe enlarged window is displayed click in the borders
around the plot to navigate. A click to the right of the Xaxis moves the pattern(s) to the left and displays the pattern
in a 2Θ region shifted 10% higher. Clicking in the otherborders works in analogous fashion. A single click in theplot window resizes it to the maximum view.
Selecting multiple patterns from the list displays them up to
6 colour coded overlaid patterns (Figure 15).

Figure 11.: Crop button

14

wavelengths for some standard anode elements haveintegrated in the top list.

Figure 17.: Wavelength dialog

Figure 15.: Multiple pattern display
An interesting feature is the ability to export an AVI film of
the single patterns cycling through the selected sets and thezoomed range. To do this press ‘Export > AVI’ in thecontext menu. To make this export as versatile as possible itcreates a film only of the currently selected data range ( Θ,intensity and selected data sets). You will have to select anappropriate compression algorithm for the video. In our
experience DiVX4 high motion gives the best results. Thisfeature is only available on the Windows® operating
system. Please note the installation of the library for thisfunction are described above (see Installation).
Normalizing Patterns
Data collected using image plates generally lacks a beam
decay correction. This can be partially alleviated by anormalization. Two or more patterns can be correctedusing this function (Menu Edit>Normalize patterns). Selectthe patterns via the list or select patterns belonging to aphase by choosing the appropriate phase. Next ensure themethod of normalization is correct. All patterns that havebeen selected are superimposed over one another. It is
possible to zoom by dragging open a zoom box with a left
click. Select the region you wish to normalize the patterns
with by dragging over a range with a right click. The range
selected in this manner is used to normalize the data. By
pressing ‘Test’ you can preview the results of thenormalization. Press ‘Cancel’ to discard or ‘OK’ to accept
the normalization.

Figure 16.: Normalization function

Phases and ranges
The increments between the patterns can be entered into atable (Figure 18) which is called by ‘Edit’ > ‘Increments
and phase ranges’. For unvarying increments the fields on
the right of the window can be used to insert values into thetable. Once two of the first three fields are filled the other iscalculated and filled automatically. Should all fields containvalues no updating takes place. Pressing the ‘Insert’ button
fills the table with the calculated values. These values areused for labelling purposes only.

Figure 18.: Insert increments
Adding phase ranges can either be done manually byediting the fields of the range table (Figure 19). Please note:
while editing you have to leave the cell you are editing forthe values to be read properly by the ‘Insert’ command. The
aid for entering the values at the bottom of the window
works in the same fashion as that used in the increment
window. These values are necessary for the Le
Bail/Rietveld assistant of which a first version is included.

Figure 19.: Define phase ranges

Wavelength
The wavelength dialog accessible via the menu
Edit>Wavelength allows you to alter the radiation
wavelength (Figure 17). Should you wish to recalculate thepattern, select the radio button ‘recalculate patterns’. The

15

Kα2 stripping
Should you have collected laboratory data using Kα1 andKα2 rays these can be separated using the menu ‘Edit’ > ‘Kalpha stripping’. Select which wavelength you wish to keep
(Figure 20).

Figure 22.: Smoothing window
Figure 20.: Kα2 stripping
The following dialog (Figure 21) enables you to select thesets, which should be stripped. The raw data is overwritten
and therefore this action cannot be undone.

The correct selection of the function shape has great effecton the smoothing efficacy.
BackgroundFigure 21.: Batch stripping

Smoothing
An advanced full width at half maximum (FWHM)
optimised smoothing (Figure 22) algorithm described byDinnebier (Dinnebier, 2003) is implemented (‘Edit’ >‘Smoothing’). The variation of the FWHM of the peaks is
generally described by the Caglioti (Caglioti et al., 1958)
formula:FWHM = U tan 2 θ + V tan θ + W
This can be graphically set with aid of the function window
on the left. Here the function can be dragged to the desired
shape with the aid of three red boxes.

16

Figure 23.: Background reduction
Background determination (‘Edit’ > ‘Background’) can bedone in two modes. Either a pattern can be loaded (XY
format as for import) or it can be calculated (Figure 23).
Should a pattern be loaded, it is displayed, as is thecalculated background. The ‘normalize’ button theninterpolates the background, giving it the same number ofdata points as the diffraction pattern. Then a linear function
fitted using the least absolute deviation method is added tocorrect the background. Should the background be higher
than the powder pattern at any point, it is lowered.
The ‘Calculate background’ method utilises a robustalgorithm based on an adaptive low-pass filter as proposedby Brückner (Brückner, 2000). Select the smoothing box
and number of iterations to attain an optimal background.
Please note that every iteration costs computing power – forlarge data sets many iterations can make the automaticbackground reduction time consuming.
The apply button greets you with the following dialog(Figure 24).

Figure 24.: Batch background reduction
To edit background points manually select the edit tool
(Figure 25). This can become necessary if the backgroundvaries strongly from pattern to pattern. You can now
remove background points with a shift-click (left click
while pressing the shift button) and add background points
with a click.

Figure 26.: Peak searching
The peak positions and intensities can be saved to a
Crysfire (Shirley, 2002) format file via the button ‘Save’ onthe ‘Peak search’ tab. Peaks can be added and removed
manually by selecting the ‘edit’ button as with thebackground points.

Figure 25.: The edit tool
You can cycle through the patterns in the usual fashion,either by selecting the ‘next’ and ‘previous’ buttons in thecontext menu or by pressing the arrow buttons on the‘Main’ tab. If a background has been calculated for thepattern it will be displayed.
Should phases have been defined it is possible to select thedata sets associated to the phase by choosing theappropriate phase. The Fullprof (Rodríguez-Carvajal, 2001)
format is a simple XY ASCII file containing 2Θ values in
the first column and intensities in the second. The GSAS
(Larson et al., 1994) format contains four columns the firstcontains a single ‘i’, the second contains 2Θ values, thethird the intensities and the fourth the standard errors.
Peak hunting
By selecting the menu ‘Edit’ > ’Peak search’ and clicking
the search button you shall see the following window(Figure 26). Changing the mouse to edit mode enables you
to remove peaks with a right click and add peaks with theleft click. You can drag the borders of the peak search toencompass all important areas of the powder pattern byselecting the range tool in the context menu (right click on
the image). Peaks are searched by a multiple pass, variable
FWHM, second derivative method. The convolution range
is set via the Caglioti diagram, the threshold and minimum
distance between peaks can be set via the sliding bar. The
radio buttons under the Caglioti diagram determine if a newpeak list is written with every run or the current peak list
appended with the newly found peaks.

Single peak fitting
Once the peaks have been found their position can be(Figure 27) using a pseudo-Voigt function corrected foraxial divergence (Finger, 1998). All refined values are
stored for later use. You can select the peak by dragging
over it. A light blue box fills the border of the selection.
Pressing enter starts the refinement with the default values.
The fit is overlaid in blue for visual inspection.
Please note: The FWHM (Caglioti function) has a profoundeffect on the convergence of the fit. Should the procedure
fail ensure the FWHM distribution is set to realistic values.
Peak markers can be added and removed manually by
returning to the peak search window (Figure 25); the modus
operandi is identical to the addition and removal of
background points.
Data export
By pressing the export button, you are able to export thepeak data of the pattern in a variety of methods. The
positions and heights can be exported to Crysfire format file(*.cdt). The refined values can be exported to text file.
Should you have refined more than six peaks an instrument
resolution file (in Fullprof format *.irf) can be exported.

Figure 27.: Peak refinement

17

Peak Indexing
Powder3D has no own indexing capabilities, but does
provide a simple interface to the powerful indexing suite‘Crysfire’ (http://www.ccp14.ac.uk/ccp/web-mirrors/crys-rshirley/). Two very similar methods can be chosen forinteraction:
1. Save the peak file in the Crysfire format and start
Crysfire manually.
2. Should Crysfire be installed (only Windows® operating
systems) according to the installation instructions in the
Crysfire manual it can be called by pressing the ‘Crysfire’
button. The file is exported to the current working directoryand Crysfire is started in there. A message is displayed with
the name of the file that has been exported.

successful some statistics of the refinement are displayed at
the bottom of the window.
The button ‘Reset’ sets the phase information back to zero.
The button ‘Remove HKL’ removes all HKL files for thispattern and forces Fullprof to recalculate them.
Please note: The assistant expects sequentially numbered
Fullprof compatible data sets. Please make sure that you
export your patterns immediately before attempting a Le
Bail fit. All the data is written to that directory.

Figure 28.: Crysfire button

Figure 31.: Le Bail refinement, cell parameters

Le Bail refinement assistantSelecting ‘Refine’ > ‘Le Bail’ via the menu opens thefollowing window (Figure 31). Here you can set up thestarting values for a Le Bail refinement (Le Bail, 1988)
using Fullprof.
Should a (single pattern format) PCR file exist you can load
it by pressing the button ‘Import Fullprof’. All the values
displayed in the window are then imported.

Once the refinements for all the data sets have been
completed close the window by pressing cancel. The celldimensions can be exported to a text file by selecting themenu ‘Refine’ > ’Export cell data’.

Figure 29.: Le Bail menu
The cell dimensions can alternatively be imported from a
Crysfire summary file. Pressing ‘Import’ in the cell frame
does this. You can select a .SUM file and the celldimensions are displayed in a table. Select the desired cellby marking the entry (Figure 30). The lengths and angles
are imported on clicking ‘OK’.

Figure 32.: Le Bail refinement, profile parameters

Figure 30.: Crysfire import
The peak shape descriptors can also be imported if a peakrefinement has been done for the pattern. Otherwise enter
your desired starting values (Figure 32).
The background correction is integrated into the refinement
if a background was defined using the background
function.
The space group should be entered, and then you can start
the refinement by pressing ‘Refine’. If the refinement is

18

Figure 33.:Le Bail refinement

Peak analysis
A new tool has been designed to assist in the sequentialrefinement of peak profiles. To call it you should select themenu ‘Tool’ > ‘Peak analysis’Figure 34.: Peak analysis menu
The window in (Figure 35.) shall appear. The pattern ranges
that have been set in the main program interface are theinitial ranges displayed by the peak progression tool. It istherefore very useful to select the interesting range using
the ‘film plot’ display and the zoom function before starting
the tool. The rendering of a couple of hundred patterns
might be slow on older hardware so it is in your own
interest to reduce the amount of information.
The aim was to create a module which does sequential peak
profile refinement in a robust manner. The tools that you
can select on the left are
1. a zoom tool: works in very much the same manneras the normal zoom tool.
2. select ranges. Drag this tool across a peak to selectit and have the peaks displayed or found, should
none have been determined.
3. a peak editor. Add/remove peaks using this tool.
Once you have selected a range with the range tool, you canstart refining those peaks. The refinement will start with thestrongest peak and work its way down to the smallest peak,fixing the peak position automatically once the peakintensity drops below a threshold of 3 I. A maximum of
two ranges can be refined together. This is equivalent torefining them separately should there be no overlap.
Should you wish to plot the peak development, first selectthe peaks with the ‘Select peaks’ (Figure 38) tool. Now
press the plot button The main program window is brought
forward and a rudimentary plot of the refined parameters is
displayed (Figure 39).

Figure 37.: Peak analysis window: range selected andpeaks marked

Figure 38.: Peak analysis window: peaks selection forexport/plot

Figure 39.: Peak analysis, a rudimentary initial plot ofpeak development
Figure 36.: Peak analysis window: initial display

19

Graphics
2D film plot
This module simulates a Guinier film (Figure 40). Two
sliding bars enable you set the brightness and contrast of
the plot. Colour inversion and square root scaling can be
set. A tick box ‘Interpolate’ allows you to do a bicubic
interpolation between your patterns. This smoothes plots ofsmall data sets. Of course the data range displayed can be
set via the ‘2Θ' and ‘Data range‘ fields. Needless to say,background corrected data has a far higher contrast. The
zoom and pan tools are available for this display.

Figure 40.: 2D-film plot

dependant on the amount data displayed, the surface mode
requires more patience while adjusting the view. All images
can be exported either by copying to the clipboard (‘Edit’ >‘Copy’), exporting to an image file (‘File’ > ‘Export’ >‘Image’) or printing (‘File’ > ‘Print’). For the latter two
operations the image is rendered from scratch and,dependant on the resolution of the image file or printer, cantake a considerable amount of time.
LightsThe 2nd tab on the 3D display control board is ‘Lights’(Figure 43). Four light sources can be controlled. One
ambient and three positional light sources can be
manipulated.

Figure 42.: 3D surface plot

3D line plot

Figure 43.: Lights control panel
Figure 41.: 3D line plot
By clicking the 3D plot button, the default 3D line plot isdisplayed (Figure 41). The data range can be set as with the
2D-film plot. Rotation around X and Y-axes can becontrolled via slides. Two preset views are stored and canbe accessed via the buttons ‘Top’ and ‘Slant’. Mouserotation is enabled by default; pressing the appropriate
radio buttons activates translation and scaling modes.
Finally the line plot can be immediately changed to arendered surface plot by selecting the ‘Surface’ radio
button.
3D surface plot
The surface plot (Figure 42) is identical to the line plot in
handling. As rendering the surface can be a slow process –20

iToolsTM presentation graphics
For the very ambitious there is the extremely powerful datavisualisation and manipulation software iToolsTM that iscalled by pressing the button ‘Presentation Graphics’(Figure 44). iToolsTM has been developed by RSI Inc. and is
a completely independent of Powder3D. Powder3D passeson the data to iToolsTM and is free for user interaction
again.

In the left side of ‘Visualisation Browser’ (Figure 46), You
see the various elements that make up the image. Once anelement is highlighted its properties are displayed in theright part of the window. We shall change the surface
values to the following:
Color: (145,145,145), Fill shading: Gouraud, Draw method:
Triangles. The last two changes make the rendering slower,
but the picture better.
We open up the ‘Axes’ branch and delete the Z-axis by aright-click and ‘delete’ (Figure 47).

Figure 44.: iToolsTM
The iToolsTM do represent an excellent set of programmes
and contain complex architecture. For this reason, I shallextend the tutorial to cover the creation of an image likethat in Figure 26.
First we shall have to subtract the background from all thedata sets so that we rid ourselves of the undulations ofbackground intensity visible in Figure 26. A value of 1°smoothing box and 3 iterations worked well for this data
set. It is convenient to decide on with part of the patternarray you wish to use by previewing it in the 3D surface
mode in Powder3D. Once you are happy with yourselection a click on ‘Presentation graphics’ copies the dataover to the iSurfaceTM programme. It is always possible tofurther reduce the displayed data in the iToolsTM
programme suite should you find it necessary.
A right-click on the data opens a context menu, which lets
you select the properties of the view (Figure 46).

Figure 47.: Deleting an element
We also alter X-axis properties to: Titel: 2Q /°, Font:
SymbolAnd the Y-axis to: Titel: Scan number, Font: Times
These changes give us a 2Θ on the X-axis and a similar font
for the Y-axis.
Now we create that semi transparent 2D visualization
hovering over the surface. Select the menu item ‘Insert’ >‘Visualization’ (Figure 48). You shall then be prompted forthe type and variables defining the item. We chose an‘Image’ type (top right box), opened the ‘Surface’ branchon the left – that is where the data is – and assigned the Zvalue to the pixels, Y-values to the Y axis and X values to
the X-axis. To do the assigning mark the data value on theleft and click on the small right arrow in front of the fields
you wish to be associated with the data. Leave palette
empty and press ‘OK’.
So that is done, but where is the image? Find your way
back to the ‘Visualization Browser’ or properties window
as described above. It shall have a new entry for the image.
Highlight the image and alter the ‘Z value’ to well above
the maximum intensity in your data array. In our case it is
85000 (Figure 50). Further set the transparency to 40.

Figure 45.:The primary iToolsTM display

Figure 46.: The iToolsTM property window
pen the properties window to the full extent by pressing an
unobtrusive left arrow in the top left corner of the window(Figure 46 left).

21

Figure 48.: Insert visualization

‘Window, View or Data’ are to be exported either‘Window’ or ‘View’ shall suffice. Next specify your export
file name and type and resolution.
References
When publishing please give reference to Powder3D in thefollowing manner:
Hinrichsen, B., Dinnebier, R. E. and Jansen, M. (2004)
Powder3D: An easy to use program for data reduction andgraphical presentation of large numbers of powder
diffraction patterns. Z. Krist. (Suppl.), in press.
Figure 49.: Define the type and variables for thevisualization

Brückner, S. (2000) Estimation of the background in
powder diffraction patterns through a robust smoothing
procedure. J. Appl. Cryst., 33, 977-979.
Caglioti, G.; Paoletti, A.; Ricci, F. P. (1958) Choice ofcollimators for a crystal spectrometer for neutron
diffraction. Nucl. Instr., 3, 223-228.
Dinnebier, R. E. (2003) FWHM optimised polynomial
smoothing filters: A practical approach. Powder
Diffraction, 18(3), 199-204.

Figure 50.: Correcting the height of the image
Now our image is complete. All that remains to be done is
to improve the lighting and export a high-resolution image.
You might have become aware of the ‘Lights’ branch on
the left in the ‘Visualization Browser’ (Figure 50). Open
this branch and select the directional light. You shouldobserve something like Figure 51.

Dinnebier, R. E. et al. (2005) Crystal Structures andTopological Aspects of the High-Temperature Phases andDecomposition Products of the Alkali-Metal Oxalates
M2[C2O4] (M=K,Rb,Cs). Chem. Eur. J. 11, 1119-1129
Finger, L. W. (1998) PROFVAL: functions to calculate
powder-pattern peak profiles with axial-divergence
asymmetry. J. Appl. Cryst., 31, 111.
Hammersley, A. P., Svensson, S. O., Hanfland, M., Fitch,
A. N., and Hausermann, D. (1996) Two-Dimensional
Detector Software: From Real Detector to Idealised Imageor TwoTheta Scan. High Pressure Research, 14, 235-248
Larson, A. C. and Von Dreele, R. B. (1994). GSAS-General
Structure Analysis System. Los Alamos National
Laboratory Report LAUR 86-748.
Le Bail, A.; Duroy, H.; Fourquet, J. L. (1988) Ab-initio
structure determination of LiSbWO6 by X-ray powder
diffraction. Mat. Res. Bull., 23, 447-452.

Figure 51.: Lighting in iToolsTM
Now you can manipulate the geometric coordinates withthe mouse and alter the intensity in the properties window.
This you can do three different light types: ambient,
positional and directional. Add further lighting via ‘Insert’> ‘Light’. The mouse has two modes while manipulating
lights, positional and rotational. Change between the two by
selecting the pointer or the circled arrow (Figure 52).

Rodríguez-Carvajal, J. (2001) Recent Developments of the
program FULLPROF. Commission on Powder Diffraction
Newsletter, 26, 12-19.
Shirley, R. (2002) The Crysfire 2002 System for Automatic
Powder Indexing: User's Manual.
IDL, IDL VM and iTools are trademarks of Research
Systems Inc., Boulder, CO, USA
Windows is a registered trademark
Corporation, Redmond, WA, USA

Figure 52.: Mouse modus buttons
This should be the last fine-tuning the image needs. Whencomplete export the image via ‘File’ > ‘Export’. Select ‘Toa file’ in the following dialog. When questioned whether

22ofMicrosoftalways called with a data filename and a script applied tothis data file, e.g. for data reduction from a 2D data set to a2θ scan or single peak fits of selected peaks. The scripts are
simple ASCII files; an example of a script file is given in
the appendix. The parameters for the geometry correction
for integration of 2D datasets, obtained using calibration
routines in FIT2D, need to be stored in another ASCII file
named TWO2ONE.INF. In the following sections
applications of Two2One are described.

Two2One - Software for the analysis of
two-dimensional diffraction data
Sven C. Vogel 1 & Karsten Knorr 2
1

Los Alamos National Laboratory, Manuel Lujan Jr.
Neutron Scattering Center
Mail-stop H805, Los Alamos, NM 87545, USA,sven@lanl.gov
2
Christian-Albrechts-Universität zu Kiel, Institut für
Geowissenschaften, Olshausenstraße 40, D 24098 Kiel,
Germany, knorr@min.uni-kiel.de
Introduction
Powder diffraction data from 2D area detectors, such asimage plates or CCD detectors, are typically integrated into
1D 2θ-scan powder diffraction patterns for further crystal
structure, strain or texture investigations. During the
integration process, the diffraction angle 2θ is calculated
for every 2D detector pixel, the intensity sorted into
intervals (bins) determined by the step width chosen for the
1D pattern, and usually averaged by normalization to thenumber of intensities N contributing to a bin. Software
typically applied for this process is e.g. Fit2D [1]. However,
several desired features are unavailable in Fit2D and led tothe development of the software Two2One [2,3] describedin this paper. Only the Rietveld program MAUD [4,5]allows skipping of the integration step and refinement of
the 2D data directly for the analysis of crystal structures,texture and strain. This approach requires significant
computing power and again may not be applicable in allcases, e.g. to study the anisotropy of plastic deformation
due to the lack of appropriate analytical models.
Integration is done either over the full Debye-Scherrer ringor partially over a given azimuth range over ring segments.
The amount of data per image and frequent parametricstudies call for automation of the integration process. The
uncertainties of parameters (e.s.d.’s) determined by leastsquares analysis are influenced by the intensity
uncertainties via error propagation through the weighting
scheme used. Correct assignments of statisticaluncertainties for each bin need to take into account that 2θ
values at a larger radius are measured more frequently thanon inner rings. This is of importance in particular for sealed
tube X-ray studies due to the lower brilliance of the source
and the related poor peak/background ratio. During the
integration step, also an outlier rejection (single crystal
spots from diamond anvil cells, shadows, dark current
noise) can dramatically improve the data quality as shown
below.
It should be pointed out that Two2One is not intended toreplace Fit2D but rather to add functionality not found in
Fit2D to the data reduction and analysis process. For
instance, the parameters required for the geometry
correction are obtained in Fit2D. Two2One provides also
automation of single peak fitting as frequently required
during deformation studies.

Figure 1: Raw data of SnS2 in a diamond anvil pressure
cell (left) [6], measured using a laboratory X-ray source
and a MAR image plate detector, and the mask generated
by Two2One after an outlier analysis (center). The single
crystal spots, the diffraction from the gasket with a different
diffraction geometry and the rings from secondary
excitation, opened to the bottom of the picture, areidentified in the mask and excluded from the integration
process. The integrated patterns with and without outlier
rejection and the difference between the two are shown to
the right.
Automated outlier rejection / masking

Two2OneMeasured intensities resulting from beam stop shadow,
single crystal spots, secondary excitations and otherintensity not resulting from diffraction by the sample itself
but from for instance high pressure cells, needs to be
rejected from further analysis. Such intensities reduce thequality of 2θ-scan patterns; especially single crystal spots
would appear as weak peaks. Manual identification ofregions or points to be excluded is laborious andautomation therefore desirable. Using the fact that thefrequency of intensities on a powder ring of constantdiffraction angle 2θ is Poisson distributed for a random
sample texture, such pixels can be identified by computing
the difference of the pixel intensity to the mean intensity I
on a ring. This difference can be normalized by the width σ

Two2One is written in C++, making it in principle available
on any platform but currently only executables for
Windows are available upon request from the authors. It is= I of the measured distribution for a particular ringand the number of σ width away from the mean outsidewhich a pixel is identified to be an outlier is an adjustable23

parameter in the Two2One script. Single crystal spots etc.
result in intensities appearing as outliers in the intensity
distribution and therefore can be readily identified andrejected from the integration. Figure 1 shows an example of
the automated masking. Masks generated this way by
Two2One may be inspected using Fit2D.

these uncertainties allow to compute statistical (notexperimental!) uncertainties for resulting parameters suchas lattice parameters or bond lengths. Unrealistic
uncertainties may result if this is not treated correctly.
Other indicators of wrong intensity uncertainties are thegoodness-of-fit indicators such as the reduced χ2 that may
be too large (>10 for an almost perfect fit) or too small(<1). As was shown in [7], the intensity uncertainty of a 2θbin is given by σ I = I N where I is the mean intensity
for a given integration ring and N is the number ofcontributing pixels. This results in a smaller uncertainty forrings with greater radius since those peaks are measured
more often than 2θ bins resulting from rings with smaller
radius. This effect compensates partially for the decrease inpeak intensity due to atomic displacement factors, atomic
form factor etc. (Figure 3).

Figure 2: Raw data of Ceria powder (left) measured usinga Bruker SMART1500 CCD area detector at the 13-BM-D
beam line (GSECARS) at the Advanced Photon Source,
Argonne National Laboratory. Data integrated over a 20degree azimuth section with Two2One without (center) andwith outlier rejection of 7σ (right).
Another source of noise is dark current or electrical noise in
CCD area detectors, resulting in more or less arbitrary
intensities across the image, contributing more noise themore points contribute to a 2θ bin (Figure 2).
Intensity Uncertainties
During the integration process, correct intensity
uncertainties have to be assigned to the histogram data
points. During the least-squares (e.g. Rietveld) analysis,

24

Figure 3: 2D diffraction data of Fe0.5NbS2 [8] (left),measured with a laboratory X-Ray source and a MAR
image plate detector, and the integrated data with the
GSAS Rietveld fit. The applied intensity uncertainties force
the fit to a better agreement with the measured data in thehigh 2θ (large radius) range as is evident by the inset.
Integration
The integration in Two2One can be performed using
arbitrary azimuth ranges and the output can be either plain
ASCII files with 2θ, intensity and uncertainty in 3 columns
or GSAS format. Azimuth ranges are for instance used toanalyze deformation anisotropy: having a vertical load axis,
the grains resulting in diffraction close to the verticalexhibit a larger elastic deformation (~longitudinal to theload axis) than the grains resulting in diffraction to thehorizontal plane (~transverse to the load axis). Anotherapplication of azimuth integration is quantitative texturedetermination. The intensity distribution on a DebyeScherrer ring is converted to a trace in a pole density figure.
Diffraction patterns taken at several sample orientations
allow filling the pole density figure and the reconstructionof the orientation distribution function from a set ofincomplete pole density figures.
Single Peak Fit Automation
Two2One allows automatically generating scripts for single
peak fits based on peak lists generated by CMPR [9]. The
GSAS program RAWPLOT is used for this process,making all peak profile functions included in GSAS
available to the user. A GSAS instrument parameter file isused to convert d-spacing from the CMPR peak list into 2θ
values (or neutron time-of-flight), as required by
RAWPLOT, and add additional peaks in the neighborhood(user defined in peak widths based on the instrument
parameter file) of the peak of interest. This script can thenbe manually edited for extra peaks or different fit ranges.
Using RAWPLOT and the instrument parameter file,meaningful starting values for the peak parameters can beprovided. A user editable template for the RAWPLOT
refinement allows for maximum flexibility of therefinement strategy. The output is a series of text files foreach included reflection with all peak parameters and apossible external parameter, such as applied stress, merged
into one single file. These files can be conveniently plotted.
Conclusion
We have given a brief introduction into the capabilities ofour software Two2One for the analysis of 2D diffraction
data. It appears to be a versatile tool that allows for avariety of applications and a high degree of automation.
Our outlier-rejection algorithm significantly improves thedata quality. The analysis of large amounts of data issimplified by the use of Two2One paving the way towards
new insights beyond standard powder diffractometry.
Appendix: Example script
To illustrate the scripts used to control Two2One, thefollowing script provides an example:
This is a script file for Two2One. It
converts an IP dataset to GSAS files.
All commands start with "#" in the firstnon-space character of the line.
All other lines are treated as comments.
Read a file in FIT2D binary format. The
filename is given by the firstcalling parameter of Two2One, theextension is assumed to be ".bin"#ReadFit2DBinary
Read the geometry correction from
Two2One.inf#ReadGeometryFromInf
Set some parameters for integration#SetPolarisationFactor
1.00

25

#SetIntegration2ThetaBins
1200#SetIntegration2ThetaFrom
2
Divide the full accessible range into
the given number of bins
Can be used to restrict automaticallythe 2theta range#SetIntegration2ThetaStepsize
AUTO#SetIntegrationAzimuthFrom
80#SetIntegrationAzimuthTo
100#IntegrateNoMask#IntegrateCreateOutlayerMask
7#IntegrateWithMask#WriteTwoThetaToGSAS
Rename the files from .raw to .gda
#shell ren *.raw *.gda
This file reads 2D data in the Fit2D binary format (which
can be generated using Fit2D scripts from any format Fit2D
can read) and applies a geometry correction based on datastored in Two2One.inf. It starts integration at a 2θ angle of
2º (calculated based on the geometry in Two2One.inf, suchas detector to sample distance) and divides the accessible2θ range into 1200 bins. It selects only those pixels in theimage plate for integration which correspond to an azimuth
between 80º and 100º, first integrates without a mask forsome initialization and then generates an outlier mask with
7σ around the mean of each ring. After integration, whichtakes into account this mask, the data is written in GSAS
format.
References[1] Hammersley, A.P., Svensson, S.O. & Thompson, A.
(1994) Nucl. Instr. Meth., A346, 312-321.
[2] Vogel, S.C., High-Pressure and Texture Measurementswith an Imaging Plate, diploma thesis at theinstitute for Earth Sciences, Christian-AlbrechtsUniversity, Kiel, Germany (2001).
[3] Vogel, S.C, Ehm, L., Knorr, K. & Braun, G. (2002)
Advances in X-Ray Analysis, 2002, 45, 31-33.
[4] Lutterotti, L., Matthies, S., Wenk, H.-R., Schultz, A.S.
& Richardson, J.W. (1997) J. Appl. Phys., 81, 594600.
[5] Matthies, S., Pehl, J., Wenk, H.-R., Lutterotti, L. &Vogel, S.C. (2005) J. Appl. Cryst. 38, 462-475[6] Knorr, K., Ehm, L., Hytha, M., Winkler, B. &Depmeier, W. (2001) phys. stat. sol. b, 223, 435440[7 Chall, M., Knorr, K., Ehm, L. & Depmeier, W. (2000)
High Press. Res., 17, 315-323.
[8] Ehm; L., Vogel, S.C., Knorr, K., Schmid-Beurmann, P.
& Depmeier, W. (2002) J. Alloy. Comp., 339, 3034
[9] Toby, B.H. (2001) http://www.ncnr.nist.gov/programs/crystallography/software/cmpr

Diamond – Investigation and Visualization of
Structural Changes

Typically, the structure visualization consists of thefollowing steps:-

H. Putz, K. Brandenburg-

Crystal Impact GbR, Bonn, Germany.
E-mail: info@crystalimpact.com
http://www.crystalimpact.com-

1. Introduction-

Most compounds undergo phase transistions when theexternal conditions change, e.g. when the temperature is
raised above or below certain values. Typically, these phasetransitions are accompanied by changes of the compound’s
crystal structure. Studying structural changes of this kind
was rather difficult until a few years ago, due to the factthat the reorganisation of the structures generally crashes
any original single crystals (from which crystal structures
could be determined), leading to powders (from which
crystal structures could generally not be solved).
However, this has changed in the meantime: Nowadays,
studying phase transitions by powder diffraction methods
has become a rapidly increasing field. The background isthat crystal structure solution from powder data has become
a lot easier than a few years ago, both due to progresses in
hardware and software technology. Nevertheless, it is still
not straight forward how to visually present the changes in
the crystal structures obtained from these investigations.
Typically, crystal structures are visualized using static
models or pictures. However, this method is not reallyappropriate when structural changes with regard to someexternal parameter shall be visualized. In these cases it isclearly desirable to create some sort of video sequence inwhich the individual pictures correspond to individual
crystal structures determined at various steps of theparameter changes. This presentation shows how this canbe achieved using “Diamond”, the well-known software forcrystal and molecular structure visualization.

2. Crystal Structure Visualization with Diamond
Before the creation of video sequences is discussed indetail, some general remarks and reflections concerning thecreation of crystal structure pictures using Diamond shallbe inserted:
The visualization of a crystal structure is generally achievedby creating a model of an idealized section of the structureusing simple geometric objects like spheres, sticks,
polyhedra etc., based on given numerical crystal structure
data like unit cell parameters, space group and atomic
parameters. The goal is to create one or more picturesvisualizing both the overall crystal structure as well as thebasic construction principles, e.g. the packing of atoms or
molecules, the atomic environments, the building blocks
and their connections among each other etc. If the crystal
structure has not been described before, it may even benecessary to explore its construction principles before one
can actually create pictures. The pictures can then be used
to present the structure to a scientific audience or tostudents. Diamond offers a large variety of commands,
options and tools to perform these tasks.

26-

Input or import of the crystal structure data
(e.g. CIF-file)
Checkingofinteratomic
distances(“connectivity”)
todefineneighbouring/bonded atoms
Creation of atoms (e.g. filling of cell range orneighbourhood of individual starting atom)
Creation of other objects (e.g. bonds, celledges, polyhedra, planes or lines etc.)
Modification of object design (e.g. color,hatching, line weight etc.)

Of course, this is a rather schematic representation of theactual picture creation procedure, since the steps are notnecessarily carried out in this order.
Once you have created one or even more pictures for acrystal structure, they can be used for-Printing
Export to other programs
Creation of photorealistic pictures using POVRay®
Creation of video sequences

That last point is the one we would like to focus on in thefollowing.

3. Visualization of Structural Changes
If you would like to visualize not only a single static crystal
structure but the structural changes of a compound as afunction of some external parameter (e.g. temperature), thefirst task is to create a separate picture for each crystal
structure. Afterwards, these pictures are composed to avideo sequence using which the structural changes can bevisualized.
The first thing to do is to define the order in which the
crystal structure pictures shall appear in the video sequence.
The easiest way to do so is to use appropriate file names forthe corresponding crystal structure data files which reflect
this order. For example, you could use file names like
“298K.cif”, “359K.cif” and “600K.cif” representing theascending temperatures at which the corresponding crystal
structures have been observed. By doing so, the crystal
structure data sets can easily be sorted once they have been
imported into the crystal structure visualization software.
Afterwards, one should import the first crystal structure
file, check or define the interatomic distances forbonding/coordinating atoms, and create a first structure
picture e.g. by filling the unit cell. Once this has beenachieved, one should try to find the most appropriate
representation of the crystal structure which emphasizes theunderlying building principles.
Once a reasonable representation (unit cell range filled,connection of atoms, polyhedra etc.) has been found, it ispossible to define a corresponding prescription which isable to create the structure picture automatically just fromthe given crystal structure data. The background is that thecreation of the individual structure pictures may quickly
become a tedious task, especially if more than just a few

structures are involved: Although the phases and theircrystal structures are somewhat related, you normally haveto create a separate structure picture for each individual
structure, repeating practically the same steps for each ofthem.
Hence, it is strongly desirable to be able to define somekind of automatic picture creation scheme for related
crystal structures. Diamond offers the so-called “Auto-build
schemes” for this task.
Having defined the new scheme, the remaining crystal
structure data sets are imported and sorted so that theirorder is equivalent to the one of the pictures in the video
sequence which shall be created. Afterwards, the Autobuild scheme is applied to all crystal structure datasets tocreate the corresponding pictures in a single step. In a socalled “thumbnail representation” of all created structure
pictures it is now easily possible to get an overview overthe structural changes (fig. 1). If in some cases the changes
between two neighbouring pictures are rather large due to acomplete rearrangement of the crystal structure, it may benecessary to create and apply a new Auto-build scheme forthe corresponding group of crystal structures.

Detection of Ellipses in Powder Diffraction
Patterns using Hough Transformation
Rajiv Paneerselvam1, Bernd Hinrichsen1, Manfred Joswig2
and Robert E. Dinnebier1
1. Max Planck Institute for solid State Research,
Heisenbergstraße 1, 70569 Stuttgart, Germany,
2. Institute for Geophysics, Stuttgart University, RichardWagner-Str. 44, 70184 Stuttgart, Germany
Introduction
To gain structural information from image plate data, it isessential to know the experimental configuration. This
information is contained in ellipses detected by an image
plate. Cystallographically speaking they are the intersectionof the Bragg cone with a 2D detector. Automatic
recognition and refinement of the parameters describing theconcentric ellipses is fundamental to modern powder x-ray
diffraction. This is generally a very time consuming [4]operation.
We present a robust method for the automatic detection andcharacterization of ellipses
using a modified Hough transformation. Our method
involves no mathematical complexity and exhibits excellent
overall efficiency.
Overview
An ellipse can be described by five parameters, the major
axis (a), minor-axis (b), center co-ordinates X0 and Y0 andangle of orientation (α). Computing all five parameterssimultaneously using Hough transformation by constructing
a huge quantized 5D parameter space is very memory time
consuming [7].

Figure. 1: The Diamond software displaying a series ofcrystal structure pictures, ready for the creation of a video
sequence.
Once the individual crystal structure pictures have beencreated, they are assembled to the final video sequence
using the corresponding Diamond command. The video
sequence is written to an AVI-file which can be used inother software packages, e.g. in RealPlayer® for viewing orin Microsoft PowerPoint® for presentation purposes. Using
this video sequence, the structural changes as a function of
the external parameter can now be viewed and understoodmuch more intuitively.

Figure. 1: Flowchart of ellipse detection algorithm
In practice the transformation scales to the number ofdimensions in parameter space. In order to overcome thecomplexity of the problem, the complete process of ellipse

27

detection is decomposed into different modules (Figure. 1).
Hough transformation is used for the calculation of theparameter b alone. Hence we require only a one
dimensional parameter space for voting. This isadvantageous for the accuracy of estimation of theparameter [3].
Reduction of resolution
The spatial resolution of digitized powder diffraction
images is normally in the order of a few thousand-pixels
squared. Manipulation such a huge amount of data isimpractical. The computational complexity of an image ofsize N x N is (N x N)4 [8]. Moreover the implementation ofstandard Hough transformation requires an accumulation
memory in the order of approximately N4 .To improve theexecution speed the image is squeezed by a factor of 5.
Approximate center determination
Many methods have been used for the determination of thecenter of an ellipse. Yiwu Lei used symmetry of ellipses todetermine the center [3]. Kimmel et-al made ellipse
detection more effective by using local edge orientation [3].
Christoph Dammer and Pol Leleux used Houghtransformation to determine the center of X-ray diffraction
patterns [5]. Mummar et al combined tangents of pair ofedge points to find the center and orientation of ellipse [3].
In most of the above-mentioned methods there exists eithera lack of accuracy or usage of huge amount of memory. We
propose a generic two-step approach to determine thecenter co-ordinates of an ellipse. In the first step we find theapproximate center by using the intensity patterns ofvertical and horizontal grids (Figure. 2) drawn on theimage. In the next step we find the exact co-ordinates ofcenter using some geometric constraints of the major axis(a) of the ellipse.

Figure 3: Profile along a grid line
The intensities of all pixels in the image along a grid areplotted (Figure. 3). The peaks (Bragg peaks) in (Figure. 4)
correspond to the edge pixels with very high intensity. The
center of symmetry (the midpoint) of this distribution isdetected by finding the absolute difference in intensities
between left and right parts of the pattern. This difference isplotted (Figure. 5), and the lowest point in this differenceplot gives the maximum overlap of Bragg peaks. This is theapproximate symmetric Many such points are obtained forvertical and horizontal grids along the ellipses. Two lines,(one for the vertical points and the other for the horizontal
points) are fitted separately. The point of intersection ofthese lines gives the approximate center of the ellipse.

Figure 4: Difference histogram of profile
This algorithm for approximate center determination robust
against the outliers in the image and also against thegeometric position of the ellipses with respect to the image
center.
Masking of high intensity spikes
Powder diffraction images are often disturbed by the highintensity outliers formed due to high grain dispersion in thesample.
Figure 2: Center detection grid

These high intensity pixels must be masked out to enhance
the accuracy in the determination of the ellipse parameters.
The masking is done by capping the intensities six times themedian of the entire image.
The influence of the outliers to the center determination isvery moderate and unpredictable due to the randomness ofthe spikes in the image. The slight uncertainties caused bythem are further minimized by a statistically reliable least28

absolute deviation fit function (used to fit lines along themid points of the grids).
Background reduction and thresholding
Background reduction and thresholding are an important
step in preparing the image for Hough transformation. The
diffraction images are surrounded by cloudy backgroundformed due to the scattering of X-rays by air molecules.
Hence the background intensity of X-ray images is highnear the incident beam and decreases towards higher 2Θ
angles [6]. Subtracting the background for such images
with non-uniform intensity distribution is crucial.

Range of major and minor axes of ellipse
To put some geometric restrictions on major and minor
axes we need to find the approximate range of a and.
spurious pixels that are unlikely to be of an ellipse can befiltered with this method. The range of a and b isdetermined for each ellipse by calculating the radial
distances from the center. These distances are found by
selecting the pixels that lie with in a certain azimuthal range
and finding the distance between the center and the pixels.
For better statistics, about 16 radial lines were drawn withthe azimuth range of 2.5

The entire image is divided into radial segments. The
average intensity of each segment differs from the others.
Background reduction is accomplished by subtracting twice
the median from all the pixels of a segment.

Figure 6: Radial distances of ellipses
These two values for number of lines and azimuth range are
optimized to compensate for the uncertainties caused by thebeam stop shadow. After computing 16 radial distances for
all the ellipses the entire array of distances is converted intoa histogram, which contains only the density of distances
falling in certain interval. (Figure.6)
An algorithm that scans through the entire histogram finds
the starting and ending locations of filled bins. These twobin locations give the approximate range of the major andminor axes of the ellipses.
Determination of major axis and orientation (α)

Figure 5: Bit scaled images before (a) and after (b)background reduction
After background subtraction, the image is converted into abinary image through thresholding. Here we set the pixels
of high intensity to 1 and the rest to 0 by applying a suitable
threshold. A conversion is necessary for an efficient Houghtransformation [2].
It is extremely important for non-uniform images to be
subjected to background reduction in order to choose asingle optimal threshold value for the entire image. The
comparison between the binary images obtained withoutbackground reduction (Figure. 5a) and with background
reduction (Figure.5b3) is shown. A lot of noise has
accumulated near the center of the pattern in the image
without background reduction.
After experimenting with many values we have chosen 10% as the optimal value for threshold.

29

In this method, we assume a pair of edge pixels to be thevertices of the major axis of the ellipse [1]. Their distance iscalculated and if the distance lies with in the range
calculated previously, then the midpoint is calculated.
If the mid point lies with in a certain center tolerance thendistance between the points and the pixel co-ordinates are
stored. The orientation of the ellipse is calculated [1].
The distances of all the pairs of pixels satisfying the above
conditions are stored in an array and the maximum value inthat array gives the most probable value of major axis of theellipse and the corresponding orientation (α) for thismaximum is calculated [1].
We can also assume that the two points A1 and A2 to be thevertices of minor axis the ellipse but it would increase thecomplexity of the problem [1]. This method extracts theparameter by using pairs of pixels without evaluation of theedge contours.
Hence it is insensitive to image noises [3] moreover it canrepresent the global information of a contour more stably.
We consider the pairs of pixels with in a certain distance
range, very close pixels (which are noise sensitive) [3] areignored.

Determination of b using Hough transformation
Hough transformation is a standard tool in image analysis,
which is used to detect shapes by the recognition of points
in a new transformed space called Hough parameter space
The transformation is implemented by quantizing theHough space in to finite intervals. After processing all theedge points in the image, the local maxima in theaccumulator array corresponds to the parameter of specified
shape.
After finding the length of major axis we choose a third
pixel in the image and find its distance from the center. We
restrict this distance to be less than a. Calculate the lengthof the minor axis (from [1]). The accumulator array isincremented for all the pixels satisfying this constraint.
After processing all the points in the image, the local
maxima of the accumulator array is the minor axis length(Figure. 7)
We only use Hough transformation to determine the minor
axis of ellipses. Only a 1D accumulator array is required forvoting. This ensures less memory usage, since thedimension of accumulator array is directly related to theusage of memory [7].

Figure 7: The accumulator array
In the process of ellipse detection we determine theparameters of the innermost ellipse first and then proceed
outwards. The reason for this is that the x-ray images havehigh intensity gradients with the maximum near the centerof diffraction pattern. There are fewer pixels in outerellipses than in inner ones. This results in better statistics
for inner ellipses. The influence of high intensity inner
ellipses on other ellipses is minimized.
After detecting an ellipse, its pixels are removed from theimage, the rest of the ellipses are detected iteratively. As aresult the computational time for b decreases with every
detected ellipse.

References[1] Chellali, R., Fremont, V., Ellipse detection using Hough
Transform, 13th International Conference on Artificial
reality and Telexistence, Japan, 2003.
[2] Fung, P.-F., Lee, W.-S., King I., Randomized
generalized Hough Transform for 2-D grayscale object
detection. Proceedings of International Conference on
Pattern Recognition Volume 2, 511-515, 1996.
[3] Lei, Y., Wong, K. C. , Ellipse detection based onsymmetry. Pattern Recognition Letters, 20, 41-47, 1999.
[4] Bennett, N., Burrigge, R., Saito, N., A method to detectand characterize ellipses using Hough Transform, IEEE

30

Transactions on Pattern analysis and Machine Intelligence,
21, 7, 1999.
[5] Dammer, C., Leleux, P., Villers, D., Dosiere, M.,Use of
Hough Transform to determine the center of digitized X-ray
diffraction patterns. Nuclear Instruments and Methods inPhysics Research B132, 214-220, 1997.
[6] R. Fisker, H.F. Poulsen.,J. Schou, J.M. Carstensen,
S.Garbe, Use of Image-Processing Tools for Texture
Analysis of High-Energy Synchrotron Data, J. Appl. Cryst.,
31, 647-653, 1998.
[7] Kanatani, K., Ohta, N., Automatic detection of circular
objects by Ellipse growing. Memoirs of the Faculty ofEngineering, Okayama University, 36, 107-116, 2001.
[8] Feng, L., Fainman, Y., Detection of a general ellipse by
an optical Hough Transform. Applied Optics, 31, 1992.

Prediction of not-yet-synthesized phases athigh and low pressures and the transitions
among them using global exploration methods
and ab initio calculations
J. C. Schön, Z. Cancarevic and M. Jansen
Max-Planck-Institute for Solid State Research, D-70569
Stuttgart, Germany

INTRODUCTION AND GENERAL APPROACH
In recent decades, new synthesis methods have been
introduced which greatly extend the range ofthermodynamic conditions under which compounds can bestudied and generated. In particular, synthesis at very highpressures [1,2] and even effective negative pressures [3,4]has become an important area of investigation in many
research groups around the world. However, in spite ofhighly improved experimental techniques, the in-situ
measurements of the structure of these compounds are still
far from trivial, and in many instances the only reliable
information obtained are the cell constants of themodification under investigation. Thus, it would be very
helpful in the identification of newly generated phases, if
one could complement the experimental results bytheoretical investigations on the same system. In thefollowing, we are going to present our general approach tostructure prediction for given thermodynamic boundary
conditions [5 - 7]. We describe the current implementation,and illustrate the various aspects of our approach at theexample of several chemical systems.
Quite generally, at non-zero temperatures a structure
candidate corresponds to a locally ergodic region on theenergy/enthalpy landscape with sufficiently low local freeenergy. A locally ergodic region equals a set of states on
the energy landscape that fulfills two conditions [6]: thesystem can equilibrate on time scales small compared to theobservation time, and the escape time from this region on
the energy landscape is large compared to the observation
time. For such a locally ergodic region R, we can apply
standard statistical mechanical methods, i.e., we cancalculate the time averages of observables along trajectories
within the region by evaluating the ensemble averages
restricted to the region, instead. In particular, we cancompute the local free energy via the sum over states takenover the region R.
For very low temperatures, both conditions for local
ergodicity are usually fulfilled for regions that correspondto the neighborhood of local minima of the potential
energy. At elevated temperatures, our general approach toidentifying regions that can locally equilibrate and are
sufficiently stable on time scales of interest focuses on theflow of probability on the energy landscape. For thispurpose, we employ various indicator observables, such as
the potential energy or the radial distribution function,
averaged over time intervals of varying length alongstochastic trajectories at constant temperature T. By
comparing these averages and their fluctuations, we canidentify candidates for locally ergodic regions. The
generalized barriers comprising the effects of energetic,
entropic and dynamical barriers on the energy landscape[8],31which separate these locally ergodic regions can be foundby measuring the amount of probability flowing away fromthe region as function of time at temperature T.
Based on this information, we can then construct thelandscape of free energy at temperature T, which consistsof locally ergodic regions that are separated by generalized
barriers. We note that this information also allows us tomake statements about the metastable phases in the systemthat can be of importance in real-life applications and phase
diagrams, where the specific synthesis methods employed
might yield a metastable and not the thermodynamicallystable phase. As mentioned in the introduction, we deal
with non-zero pressures by studying the properties of theenthalpy landscape H = Epot + pV [5,6,9,10], leading to theconstruction of free enthalpy landscapes[7].
The locally ergodic regions discussed so far exhibit various
degrees of order. However, at very high temperatures, thelocal free energies of such ordered regions become
unfavorable compared to the free energy of the set of states
associated with the melt. Then the free energy landscape
becomes in a certain sense trivial, since now the orderedphases are only stable on relatively short observational timescales, and all these locally ergodic regions are directly
connected to the region representing the melt at essentiallythe same value of free energy.
Finally, we need to deal with variation in composition in
the chemical system. The prescription given above forconstructing a free energy/enthalpy landscape assumed thatthe composition of the system was kept fixed. The next stepis the analysis of landscapes that include not only thepressure via a term pV, but also the chemical potential of
species i via a term µiNi. We have performed such
simulations in the past; however, we found it to be more
efficient to keep the composition fixed within one set ofinvestigations, and to repeat the global exploration formany different compositions.
But no matter how one decides to deal with the issue ofvarying composition, once the free energy/enthalpy
landscapes of a chemical system have been constructed asfunction of temperature, pressure and composition, one candeduce many features of the system's phase diagram, atleast at low temperatures - the exact location of thetransition between melt and the various solid phases is still
not easily determined from first principles.

METHODS
The implementation of the general approach described in
the previous section consists of several algorithms that canbe put together in a modular fashion, depending on the typeof question asked. In all instances, the starting point is theenergy landscape, i.e., the hypersurface of the potential
energy over the configuration space of the system. Here, aconfiguration is defined by the cell parameters of thesimulation cell, plus the electronic state (charge) andpositions of the atoms in the cell. Since we are in mostcases interested in ordered (crystalline) compounds, weusually employ periodic boundary conditions, and between
10 and 40 atoms per simulation cell. In certain instances,e.g. when analyzing systems with complex ions, we include

building units that contain several atoms in a fixed spatial
arrangement [11], and optimize the units' positions andorientations as part of the global exploration procedure.
Global optimization to identify local minima
A central element of the study of the energy landscape of achemical system is the determination of the local minima,
since most locally ergodic regions, even at elevatedtemperatures, are associated with one or many suchminima. We usually employ a stochastic search algorithm
such as simulated annealing, with a variety of acceptancerules of the moves, e.g., the Metropolis criterion [12], or
threshold-accepting [13]. The moveclass employed for thegeneration of neighbor configurations during the stochastic
walk allows the free variation of cell parameters, of
atom/unit positions and orientation (shift of single atoms orgroups of atoms, rotation of atom groups, and exchange ofatoms or groups of atoms), and of ionic charges. In
addition, the composition of the cell can be changed, but, as
mentioned above, we usually keep the composition fixed.
For the global exploration of the enthalpy landscapedescribed by H = Epot + pV, we employ an empiricalpotential energy function, usually in the form Epot = ΣiEion(i) + Σij [(qi qj)/rij + εij ( (σij/rij)12 - (σij/rij)6 )]. Here, Eionis the ionization energy or electron affinity of the ions being
formed, V is the volume of the simulation cell, qi are theionic charges of the ions, σij the sum of the ionic radii, andεij quantifies the strength of the atom-atom repulsion andpolarization terms. The sum in the Coulomb term isperformed either with the aid of a convergence factor exp(αrij) or via the DeLeeuw- method [14]. If the composition is
to be varied during the exploration, we add a term ΣiµiNi to
H, where µi is the chemical potential of atoms of type i, andNi the total number of atoms of type i in the simulation cell.

landscape. This flow is represented by stochastic random
walkers at constant temperature employing the Metropolis
acceptance criterion. For a given random trajectory, we
register the fluctuation and average value of indicatorvariables over time intervals of length τint, such as thepotential energy (or enthalpy, if p ≠ 0) or radial distributionfunctions. When starting from a random atom arrangement,
the difference in average energy between two consecutive
intervals will exceed the fluctuation within the twointervals, and the system is not in equilibrium. However,once this difference falls below the fluctuations, we havedetected a candidate for a locally ergodic region. By
registering when the system falls out of equilibrium again,
we can gain a first estimate of the escape time and thus of
the stability of the region.
Further analysis steps usually follow, such as local
quenches from points within the candidate region, in orderto decide whether the region is associated with one or many
local minima. In order to gain better estimates of the escapetimes as function of temperature, we perform an ensembleof Monte Carlo runs for a set of trajectories starting fromthe locally ergodic regions. Finally, we employ the
structure comparison algorithm CMPZ implemented in the
program KPLOT [15] for the analysis of the structural
relationships among the various candidates.

General search algorithm to find locally ergodic regions[7]We note that there exist several classes of chemicalsystems, where the high-temperature structure candidates
imply a peculiar structure of the energy landscape.
Examples are quasi-ionic compounds where one of thecations or anions participating constitutes a complex ion,such as the NO2-group in KNO2, or chemical systems
where alloy formation is to be expected. To deal with thesetypes of systems, we have developed specificmethodologies[7]; however, since the focus here is on highpressure effects, we are not going to discuss these in further
detail.

In order to identify locally ergodic regions at non-zerotemperatures, we analyze the probability flow on theThreshold algorithm to measure generalized barriers via
probability flow[16,17,8]

Legend:Chemical System

PbCl2

CaF2

CaCl2

Ni2In-distorted

DFT-B3LYP
Cs2S

Rb2S

K2S

Na2S

Li2S

-10

0

20

10

30

40

Pressure [GPa]Figure 1: Pressure phase diagrams for the alkali metal sulfides (DFT-B3LYP-level). Similar results are found forHartree-Fock calculations and other DFT-approximations. Due to the approximations inherent in the ab initio
calculations and numerical errors, the locations of the transition pressures are only accurate to about ±5 GPa; e.g. whenemploying DFT-LDA-LYP, the range of the PbCl2-type phase in Cs2S includes standard pressure (≈ 0 GPa), as observedin experiment.

32

The threshold algorithm has been designed to yield
estimates of energy and entropy barriers around local
minima on a general energy landscape. Starting points ofthe explorations are the local minima of the energy
landscape. One then proceeds by selecting a sequence ofenergy lids (thresholds) above the energy of the local
minimum. For each lid, one performs many random walks
starting at the minimum, where each move is accepted asgrouped into several classes according to their structuralsimilarity using the algorithm CMPZ implemented in
KPLOT.
The ab initio calculations are performed on Hartree-Fockand/or DFT level using the program CRYSTAL2003 [21].
For the local optimization of the structure candidates, theheuristic algorithm HARTREE [18,9] is employed, which

Figure 2: E(V)-curves for structure candidates in the Cu3N-system. At standard pressure, the experimentally observed ReO3type is found, while at pressures above ca. 30 GPa, most likely the α–UO3- or the Li3P-structure type will occur.

long as the energy of the new state does not exceed thethreshold energy. Along these random walks, one
periodically performs stochastic quenches that end in either
the starting configuration or other local minima on thelandscape. The thresholds where new minima are found forthe first time constitute upper bounds of the barriers
separating the local minima from the remainder of thelandscape. The frequency with which such neighboring
regions are reached as function of lid energy are a measureof the entropic and dynamical barriers surrounding given
minimum. This procedure is then repeated until all known
and newly found minima have been explored. From thisinformation, one can construct a lumped tree graphrepresentation of the energy landscape. Further details
regarding the threshold algorithm can be found in theliterature.
Refinement stage of candidates associated with (unique)local minima[18,9]

consists of a nested sequence of line searches in the cellparameters for fixed and variable volume, together with line
search optimizations of free atom position parameters as theinnermost loop. Unless specific stability analyses are
performed, the space groups of the structure candidates
remain fixed. For more details, we refer to the literature.
Fitting the data points obtained from these optimizations
results in E(V)-curves for the various structure candidates,
where we have employed a standard Murnaghan fit [22].
Since the pressure for a given volume equals the negative
slope of the E(V)-curve, one can compute the transitionpressures between two modifications by calculating theslope of the common tangent (if it exists). The result canthen be depicted in form of a so-called 1d-pressure phase
diagram.

EXAMPLES

With the help of the program LOAD [18], the several
thousand minimum configurations and other structure
candidates generated during the global optimization stage
and the constant temperature runs are analyzed regarding
their symmetries using the algorithms SFND [19] and RGS[20] implemented in the program KPLOT [15], and33

An example of a 1d-pressure phase diagram is shown below
for the structure family of the alkali sulfides[9].
An example of the E(V)-curves for several structure
candidates is given in Fig. 2for the system Cu3N[27].

pressures the CsCl-type is preferred. Structure candidates
and barriers among them were determined using simulated
annealing and the threshold algorithm. The phonon
contribution to the free energies was calculated using anempirical two-body potential.
Space forbids the presentation of further examples, and werefer the reader to the literature given below[5 - 11,17,23 26].
REFERENCES

(a)

(b)
Figure 3: Free enthalpy landscapes for the system SrO atstandard pressure (a) and 160 GPa (b).
Fig. 3 shows the free enthalpy landscapes in the SrOsystem for standard and very high pressures[10,7]. One
clearly sees that at standard pressure the rock salt type
experimentally observed is thermodynamically stable for all
temperatures up to the melting point, and that at high34

[1]
L. Liu, W. A. Bassett, Elements, Oxides, andSilicates. High-Pressure Phases with Implications for the
Earth's Interior, (Oxford Univ. Press, New York 1986)[2]
R. J. Hemley, ed., Ultrahigh-Pressure Mineralogy:
Physics and Chemistry of the Earth's Deep Interior, vol. 37
of Reviews in Mineralogy, (The Mineralogical Society ofAmerica, Washington, DC, 1998)[3]
D. Fischer and M. Jansen, J. Am. Chem. Soc. 124,
3488 (2002)[4]
D. Fischer and M. Jansen, Angew. Chem. 114,
1381 (2002); Angew. Chem. Int. Ed. 41, 1755 (2002)[5]
J. C. Schön and M. Jansen, Angew. Chem. 108,1358 (1996); Angew. Chem. Int. Ed. 35,1286 (1996)[6]
J. C. Schön and M. Jansen, Z. Krist. 216, 307(2001); Z. Krist. 216, 361 (2001)[7]
J. C. Schön and M. Jansen, in: Solid State
Chemistry of Inorganic Materials V, Eds: J. Li et al., 333(MRS, Pitssburgh 2005)[8]
J. C. Schön, M. A. C. Wevers, M. Jansen, J. Phys.:
Cond. Mat. 15, 5479 (2003)[9]J. C. Schön, Z. Cancarevic, M. Jansen, J. Chem.
Phys. 121,2289 (2004)[10]
J. C. Schön, Z. Anorg. Allg. Chem. 630, 2354
(2004)[11]
C. Mellot-Draznieks, S. Girard, G. Ferey, J. C.
Schön, Z. Cancarevic, M. Jansen, Chem. Eur. J. 8, 4102
(2002)[12]
N. Metropolis, A. W. Rosenbluth, M. N.
Rosenbluth, A. H. Teller, E. Teller, J. Chem. Phys. 21,1087 (1953)[13]
G. Dueck and T. Scheuer, J. Comp. Phys. 90, 161(1990)[14]
S. W. deLeeuw, J. W. Perram, E. R. Smith, Proc.
Roy. Soc. A 373, 27; 57 (1980)[15]
R. Hundt, KPLOT: A Program for Plotting andInvestigation of Crystal Structures, Univ. Bonn, Bonn
(1979)[16]
J. C. Schön, H. Putz, M. Jansen, J. Phys.: Cond.
Mat. 8, 143 (1996)[17]
M.A.C. Wevers, J.C. Schön, M. Jansen, J. Phys.
Cond. Matter 11, 6487 (1999)[18]
Z. Cancarevic, J. C. Schön, M. Jansen, in: Proc.
Progress in Materials Science and Processes (Mat. Sci.
Forum 2004) 453, 71[19]
R. Hundt, J. C. Schön, A. Hannemann, M. Jansen,
J. Appl. Cryst. 32, 413 (1999)[20]
A. Hannemann, R. Hundt, J. C. Schön, M. Jansen,
J. Appl. Cryst. 31, 922 (1998)[21]
V. R. Saunders, R. Dovesi, C. Roetti, M. Causa, N.
M. Harrison, R. Orlando, C. M. Zicovich-Wilson,
CRYSTAL2003, Univ. Torino, Torino (2003)[22]
F. D. Murnaghan, Proc. Nat. Acad. Sci. 30, 244(1944)

[23]J. C. Schön and M. Jansen, Comput. Mater. Sci.
1995, 4, 43[24]
D. Fischer, Z. Cancarevic, J. C. Schön, M. Jansen,
Z. Anorg. Allg. Chem. 630, 156 (2004)[25]
J.C. Schön, M.A.C. Wevers, M. Jansen, J. Mater.
Chem. 11,69 (2001)[26]
H. Putz, J. C. Schön, M. Jansen. Z. Anorg. Allgem.
Chem. 625, 1624 (1999)[27]
Z. Cancarevic, J.C. Schön, M. Jansen, Z. Anorg.
Allgem. Chem. 631, 1167 (2005)

35

36

YOUR PARTNER IN X-RAY DIFFRACTIONSTOE STADI P
Powder diffractometer- Pure Ka1 radiation using Fe, Co, Cu or
Mo radiation- High resolution yielding well-defined peak
profiles- Transmission / Debye-Scherrer or BraggBrentano mode
- Analysis of air-, moisture-sensitive and micro
samples- Enclosing control and evaluation software
package WinXPOW- Various high- and low-temperature systems
and sample changers- Scintillation counter, position sensitive andimaging plate detectors

STOE & Cie GmbH P.O.Box 101302 D-64213 Darmstadt
Phone: (+49) 6151 / 98870 Fax: (+49) 6151 / 988788
E-mail: stoe@stoe.com Homepage: http://www.stoe.com- High throughput and combinatorial analysis

37Computer Corner
Updates on Available Crystallographic and Powder
Diffraction Software(Suggestions, corrections, comments and articles on new or
updated software are appreciated; especially if you know of
new program features, program updates and announcementsthat should be mentioned here).
Lachlan M. D. Cranswick
Canadian Neutron Beam Centre (CNBC),
National Research Council (NRC),
Building 459, Station 18, Chalk River Laboratories,
Chalk River, Ontario, Canada, K0J 1J0
Tel: (613) 584-8811 ext 3719; Fax: (613) 584-4040
E-mail: Lachlan.Cranswick@nrc.gc.ca
WWW: http://neutron.nrc.gc.ca/

ftp://charybde.saclay.cea.fr/pub/divers/fullprof.2k/ (ifFullprof FTP site is unavailable, use the CCP14
Mirrors)
Winmprof (21st June 2001)
http://lpec.univ-lemans.fr/WinMProf/XND (10th March 2005)
http://www-cristallo.polycnrs-gre.fr/xnd/xnd.html
ftp://ftp.grenoble.cnrs.fr/xnd/ (if XND FTP site isunavailable, use the CCP14 Mirrors)
All the above Rietveld programs are also available via the
CCP14 based mirrors in UK, USA, Australia and Canada(http://www.ccp14.ac.uk/mirror/).
Summary lists of some software available via the
EPSRC funded CCP14 website:

Rietveld Software Updates (as of 4th November 2005):
Hugo Rietveld website:
http://home.wxs.nl/~rietv025/
Armel Le Bail website:
http://sdpd.univ-lemans.fr/
BGMN (1st Sep 2005)
http://www.bgmn.de/
BRASS (24th Mar 2005)
http://www.brass.uni-bremen.de/
DBWS (22nd February 2000)
http://www.physics.gatech.edu/downloads/young/downl
oad_dbws.html
DDM (4th Nov 2005)
http://icct.krasn.ru/eng/content/persons/Sol_LA/ddm.ht
mlDebvin (25th May 2001)
http://users.uniud.it/bruckner/debvin.html
GSAS (2nd Nov 2005)
http://www.ccp14.ac.uk/ccp/ccp14/ftpmirror/gsas/public/gsas/
EXPGUI (6th August 2005)
http://www.ncnr.nist.gov/programs/crystallography/
Jana (23rd February 2005)
http://www-xray.fzu.cz/jana/jana.html
LHPM-Rietica (27th November 2001)
ftp://ftp.ansto.gov.au/pub/physics/neutron/rietveld/Rieti
ca_LHPM95/
MAUD for Java (GPL’d) (2nd Nov 2005)
http://www.ing.unitn.it/~maud/
PowderCell (7th July 2005)
http://www.ccp14.ac.uk/ccp/webmirrors/powdcell/a_v/v_1/powder/e_cell.html and
ftp://ftp.bam.de/Powder_Cell/
Prodd (19th August 2003)
http://www.ccp14.ac.uk/ccp/web-mirrors/prodd/~jpw22/
Profil (24th May 2001)
ftp://img.cryst.bbk.ac.uk/pdpl/ (if Profil FTP site isunavailable, use the CCP14 Mirrors)
Rietan 2000 (GPL’d) (10th October 2005)
http://homepage.mac.com/fujioizumi/rietan/angle_dispe
rsive/angle_dispersive.html
Winplotr/Fullprof (8thth July 2005) (if Fullprof FTP site isunavailable, use the CCP14 Mirrors)
http://www-llb.cea.fr/winplotr/winplotr.htm

38“What do you want to do?“ (lists of software by single
crystal and powder methods)
http://www.ccp14.ac.uk/mirror/want_to_do.html
Anharmonic Thermal Refinement Software
http://www.ccp14.ac.uk/solution/anharmonic/
Data Conversion for Powder Diffraction
http://www.ccp14.ac.uk/solution/powderdataconv/
Image Plate Software
http://www.ccp14.ac.uk/solution/image-plate/
Incommensurate Structure Software
http://www.ccp14.ac.uk/solution/incomm.htm
Indexing Software for Powders
http://www.ccp14.ac.uk/solution/indexing/
LeBail Method for Intensity Extraction
http://www.ccp14.ac.uk/solution/lebail/
Pawley Method for Intensity Extraction
http://www.ccp14.ac.uk/solution/pawley/
PDF, High Q Powder diffraction Analysis Software
http://www.ccp14.ac.uk/solution/high_q_pdf/
Peak Find/Profiling Software for Powder Diffraction
http://www.ccp14.ac.uk/solution/peakprofiling/
Pole Figure and Texture Analysis Software
http://www.ccp14.ac.uk/solution/pole_figure/Powder Diffraction Data Visualisation
http://www.ccp14.ac.uk/solution/powder_data_visual/
Rietveld Software
http://www.ccp14.ac.uk/solution/rietveld_software/
Search-Match Phase Identification Software
http://www.ccp14.ac.uk/solution/search-match.htm
Single Crystal Suites linking to multiple programs relevant
to Chemical Crystallography
http://www.ccp14.ac.uk/solution/xtalsuites/
Spacegroup and Symmetry operator determination softwareand source code
http://www.ccp14.ac.uk/recomm/sym_operators_to_sp
acegroups.html
http://www.ccp14.ac.uk/recomm/spacegroups_to_sym_operators.html
Spacegroup and Structure Transformation Software
http://www.ccp14.ac.uk/solution/transform/
Structure Conversion and Transformation
http://www.ccp14.ac.uk/solution/structconv/
Structure Drawing and Visualisation
http://www.ccp14.ac.uk/solution/structuredrawing/
Unit Cell Refinement of Powder Diffraction Data
http://www.ccp14.ac.uk/solution/unitcellrefine/New Time-of-Flight Neutron Total Scattering
Data Analysis Software at IPNS
J. Taoa , T. G. Worltona, J. Hammondsa, C. J. Benmorea, D.
Mikkelson , R. MikkelsonbaIntense Pulsed Neutron Source, Argonne National
Laboratory, Argonne, IL 60439 USA. b Department ofMathematics, Statistics, and Computer Science, Universityof Wisconsin-Stout, Menomonie, WI 54751 USA
Email:
Web:

Benmore@anl.gov
http://www.pns.anl.gov/computing/isaw/

New total scattering data analysis code has been written
within the ISAW framework [1] lifting constraints on thefunctionality of the Glass Liquid and Amorphous materials
Diffractometer (GLAD) imposed by legacy code. ISAW
stands for Integrated Scattering Analysis Workbench and is
a completely free, fully open, java based working anddevelopment environment. It provides the data structures,
basic data operations, visualization tools, and userinterfaces for the new GLAD software. Due to the nature ofobject-oriented programming (and Java’s syntax being
much like C) the code is highly structured and easy to port
if the need rises.

Figure 1: The ISAW main GUI listing data in a tree
structure, with an Attributes display pane tabulating ‘meta’
data; The top menu View provides visualization tools called“viewers” such as those on display in figure 2; Operations
and Macros menus allow various data and function
operations, which are implemented in concrete Java classes
called “operators”; Data visualization, reduction andanalysis tasks are typically implemented in a sequence ofsuch operations and called “scripts”. The Scripts paneallows input, edit, open/save and execution commands.
GUIs for operators and scripts are identical andautomatically generated by the ISAW.

table viewer generating and exporting data tables; at thebottom middle is an example of the generated intensity vs.
TOF table; bottom right shows a block of data with thegraph viewer.
The typical GLAD analysis script GUI is shown in the leftof the figure 3. In terms of the functional steps involved in
the total scattering data analysis process, raw neutron
scattering data count rate corrections i.e. detector dead time,delayed neutron, detector efficiency are applied first.
Rebinning and normalization procedures were employedusing ISAW operators and methods. Absorption andmultiple scattering correction routines were slightly
modified from their ISIS versions in Fortran to be executedby ISAW behind the scenes. A vanadium normalization
procedure subsequently yields the differential scatteringcross section :dσ dΩ = dσ dΩ self + dσ dΩ distinct = ∑ cα bα2 + P (Q, θ ) + I (Q )αwhere P(Q,θ) is the inelastic contribution and I(Q) is theinterference function arising from the ‘distinct scattering’
contribution, cα is the atomic concentration and bα thescattering length of isotope α. By way of example, the I(Q)of a carbon nanotube is plotted as a function of scatteringvector Q in the bottom right of figure 3. A Fouriertransform routine converts the scattering function S(Q) tovarious radial distribution functions for further
interpretation.

One significant improvement over the previous software isthat the analysis is now carried for each data group pixelby-pixel, with data merging only performed at the last stepto produce a single I(Q) vs. Q (that’s 1.6 million points!),
while the old code regrouped and averaged the raw data
twice in the very beginning of data treatment. As a result
the ISAW analyzed data is more accurate and the low Q
limit of GLAD has been extended from 0.325 Å-1 to 0.175
Å-1. The new software also enables irregular detector
groupings for orientated samples. Finally, we note that itshould be relatively straightforward to implement thissoftware on a similar neutron instrument at a different
facility.
References:[1] http://www.pns.anl.gov/computing/isaw/[2] Tao et al, Nuc. Instr. Meth., submitted.

Figure 2: top left window shows a 3-D viewer; top right theimage viewer graphing all pixels; bottom left shows the39

New Features of the BGMN Rietveld program
J. Bergmann1, R. Kleeberg2
Ludwig-Renn-Allee 14, D-01217 Dresden,
2Technical University Bergakademie Freiberg, Institute ofMineralogy,
Brennhausgasse 14, D-09596 Freiberg, Germany
1
Email:
email@jbergmann.de, 2kleeberg@mineral.tufreiberg.de
Web:
http://www.bgmn.de/1

The present article describes the modification of the
Rietveld program BGMN since its last presentation in thisnewsletter in 2002 [1]. The following minor revisions of therefinement kernel as well as extensions of the program code
have been introduced:- The new version of BGMN supports the refinement ofsynchrotron
data.
For
example,thekey
SYNCHROTRON=0.079 serves a sharp delta function forthe synchrotron wavelength distribution function (0.079nm) for use in the profile convolution. Because of theunknown geometric parameters and the uncertainties of thedetector resolution function, the "learnt profiles" method forgetting the instrumental contribution is recommended. The
program VERZERR was modified accordingly for theapplication of learnt profiles from synchrotron data. Figure
1 shows a learnt instrumental profile of the device attachedat sector 32 of the Advanced Photon Source in Argonne/IL.
A mixture of LaB6 (NIST SRM 660a) and Si (NIST SRM
640c) was used as profile standard.
- The model describing the preferred orientation correction
was revised. In addition to the phase intensity, the numberof peaks in the measuring range was introduced as acriterion to automatically reduce the PO correction model.
The new feature prevents that over-parameterized PO
correction models are used for high symmetric phases
which is especially helpful in routine phase analysis ofcomplicated mixtures.

- A new and much larger file spacegrp.dat containing more
non-conventional spacegroup settings was prepared.
Currently, more than 730 settings are supported without
need of conversion into standard settings.
- In the new version, the GSAS formats STD and ESD aresupported for direct use in BGMN in addition to *.val,*.raw, and *.rd. The wavelength keyword LAMBDA=CU(or CO, FE, CR, and MO, respectively) or
SYNCHROTRON=... can be used for supplying the
wavelength information lacking in the GSAS files.
- New structure files for quantitative phase analysis wereadded to the BGMN distribution as well as towww.bgmn.de/download-structures.html. Currently, 415
structures are available that mostly represent naturally
occurring minerals. The modeling of profiles for disorderedclay minerals [3] has been improved and some examples
have been added to the distribution and the web page.
In addition, the graphic user interface, referred to as
BGMNwin, was improved to allow a more user-friendly
handling of the program:- A context-sensitive help was introduced in both, the *.sav
and the *.str file editors. By placing the cursor on a
keyword or variable and pressing F1, a pop-up window
containing the description of the item will appear. A
complete list of variables and keywords for the BGMN files
is also provided by this function.
- A new window "show device function" (see Fig. 1) has
been introduced. In a simple and intuitive way, one may
now inspect the device function as used by BGMN.
- The function "show database lines" was added to thewindow displaying the measured and calculated diffraction
patterns. This function refers to the 415 structures stored inthe "structures" subdirectory of BGMNwin. By choosing
one of these structure files, the line positions will be
displayed together with the measured diffraction pattern.
Users can easily add structure files to the "structures"subdirectory to allow their use in BGMNwin.
- The new function "show calculated profile" displays thecalculated profile pattern of a selected phase within the
Rietveld plot. This feature is particularly useful for theinspection of the refinement progress. Figure 2 shows thegraphic window of BGMNwin with the functions "showdatabase lines" and "show calculated profile" being
enabled.
SUMMARY

Fig.1: Graphic window showing the learnt geometricprofile of the APS BL32 instrument.
- The DDM method [2] is implemented as a option for therefinement. The switch is DDM=Y in the control file *.sav.

40

The present report describes the progress in thedevelopment of the BGMN package achieved over the last
three years. BGMN has been designed for quantitative
phase analysis, but it may also be used as a full-featured
Rietveld program for structure analysis.
A restricted demo version of the program is available at
http://www.bgmn.de/. The full featured version is
specifically discounted for academic use.

How to add a molecule to a crystallographic
surface using SCHAKAL 99
Egbert Keller
Kristallographisches Institut der Universität D-79104
Freiburg, Germany
Email:
egbert.keller@krist.uni-freiburg.de
Web:
http://www.krist.uni-freiburg.de/~kell/

Fig. 2: Graphic window of BGMNwin showing databaseline positions and calculated individual phase profiles.
ACKNOWLEDGEMENTS
Thanks to Douglas McCarty and Chevron Texaco forproviding the synchrotron data. Use of the Advanced
Photon Source was supported by the U. S. Department ofEnergy, Office of Science, Office of Basic Energy
Sciences, under Contract No. W-31-109-Eng-38. The JavaGUI was written by Robert Henschel. The newspacegrp.dat could not have been prepared without the helpof Gert Nolze (BAM Berlin).
REFERENCES[1] J. Bergmann, R. Henschel and R. Kleeberg, The new
BGMN and its use in quantitative phase analysis ofmineralogical multiphase samples. CPD Newslett. 27(2002) 26-27[2] L. A. Solovyov, Full-profile refinement by derivative
difference minimization. J. Appl. Cryst. 37 (2004) 743749[3] K. Ufer, G. Roth, R. Kleeberg, H. Stanjek, R.
Dohrmann, J. Bergmann, Description of X-ray powder
pattern of turbostratically disordered layer structureswith a Rietveld compatible approach. Z. Kristallogr. 219(2004) 519-527

Lachlan Cranswick asked me (to my surprise) to make thiscontribution supposed to deal with some advanced ridingof the graphics program SCHAKAL 99 (note that “[19]99”
is a constant part of the name clearly indicating the program
to be an object of the last century). Just as he suggested I’ll
simply give some recipes on how drawings analogous tosome of the more sophisticated ones on the SCHAKAL
homepage (see above) can be generated. The recipes are,naturally, of value only for those who happen to have some
SCHAKAL experience, thus, to all others: “Have a niceday!”. In the following, I’ll use mostly the good old “typed
commands” style to save space.
1. Let’s start with the addition of a molecule to a“crystallographic surface”. First we generate a (110)
surface of the Pb3(PS4)2 structure using the file ex2_p.dat
which can be generated from the distributed atomic
coordinates file ex2.dat using the { cryst } / { bld+p }procedure:{ cryst } / { bld+p }InpData file = ? >>> ex2
Enter more Data >>> { OK }The freshly made ex2_p.dat allows to build sections of thecrystal structure with all thiophosphate ions intact (i.e.
complete). We reload this file and generate a (110) surface
of some dimensions (defined in relation to the surface’s 2Dunit cell, see below):>>> Use Inputfile
InpData file = ? >>> ex2_pEnter more Data >>> FAce 1 1 0Enter more Data >>> BOx 1 .5 0Enter more Data >>> { OK }Now we assign all atoms to “group 1” and move the surface
model by enough Å down the Z axis (i.e., away from theorigin of the Cartesian coordinate system (CCS):>>> Define Group 1>>> Translate Z -8
We’re now ready to add a penicillin molecule, which will
be centred at the origin of the CCS:>>> Add Inputfile
InpData file = ? >>> ex4
Now we switch to space-filling models, suppress unit celledges, and check the group numbers of the new atoms:>>> Generate Cups; Unitcell 1>>> Xqt>>> Write Groupnumbers

41All new atoms have been assigned the group number 13.
We will therefore be able to address them by the common
atom code ‘gg13’.
Next, we will have to adjust the new molecule relative tothe surface, e.g. by some rotations or translations (shifts).
To be able to do this we first have to unlock the model.
>>> Unlock Model>>> Define $ gg13>>> Trans Y 5 $>>> Trans Z 5 $>>> Define Origin $>>> Rotate Z -10 $The tricky things are ...
a) we must not omit „$” [= group 13], here, as otherwise
the surface model is moved as well.
b) after any shifts of the molecule the CCS origin should be
re-defined by its atoms; thus, the axes of rotation will stillgo through its center.
c) It would be wise to frequently employ ‘Use
Outputfile’, here, to save the different steps.
To avoid confusion, the whole structure should at this stage
only be rotated by multiples of 90o about any axis, forexample to look at it from the side. Only when the molecule
has its final orientation and position we re-define the origin
and tilt the whole thing to proceed to Fig. 1:

2. Lachlan must have a faible for surfaces as he alsomentioned the 2nd surface picture on this web page. Here,
we make an only related draw-ing using the same structure
as above:>>> Use Inputfile
InpData file = ? >>> ex2_pEnter more data >>> FAce 7 8 1Enter more data >>> BOx 1 1 5Enter more data >>> < Return >Note that to obtain a surface model of reasonable thickness
the 3rd parameter on the BOx “card”, referring to dhkl, mustbe much larger than before as d781 is much smaller thand110. On the upper drawing of Fig. 2 you can see, that the
2D unit cell of the surface has been expanded by one fullunit translation in both directions due to the two “1” on the
BOx “card”. By skipping commands to generate thebackground and to align the mod-el by rotating it about theZ axis, the following will generate the uppermost part of thepicture:>>> Generate Ballsticks>>> Mgnfy Model 0.1>>> Set Origin 0.5 0.8>>> Xqt Quick : Kill Screen 3>>> Broaden All 4 3>>> Xqt Quick a=a>>> Brdn All 1
The positioning of the drawing with ‘S O ..’works only as the scale factor has been fixed by the ‘M M
p’ command before. The last 3 lines’
commands
emphasize the various unit cell edges.

>>> Def Origin>>> Rot X -80>>> Set View 60>>> Set Light 45 90>>> Xqt Stars>>> Kill Screen 3>>> Magnify Model 0.8>>> Set Origin +0 -6{ shadeR }>>> Set Origin 0.5 0.4{ varyZL } / { uni }‘K S 3 ’ switches automatic screen erasing off, ‘S O +0
-6’ shifts the whole drawing 6 cm downwards (it doesn’talter the position of the atoms relative to the CCS !). The “6” as well as the magnification factor (0.8) depend on thesize of the screen we are using.

creates the drawing in the middle which gives animpression of the depth variations within the surface.
Finally we want to have a side view:>>> Gen Cups>>> Set Origin 0.5 0.1>>> Rot X -90{ shadeR }Note that the switch to “cup” (space-filling) models had
been performed only temporarily by the last procedure,
therefore ‘G C’ has to be used for another switch.

Fig. 1: Sulfur meets sulfur
Fig. 2: A bumpy piece of world42

Discussion of the Indexing algorithms within
TOPAS
Alan Coelho, Arnt Kern
Bruker AXS GmbH, Östliche Rheinbrückenstraße 49, D76187 Karlsruhe, Federal Republic of Germany
Email:
AlanCoelho@optusnet.com.au
Web:
http://pws.prserv.net/Alan.Coelho/andhttp://www.bruker-axs.de/index.php?id=topas
TOPAS introduces two new indexing methods: LSI and
LP-Search. LSI operates on extracted d-values and has been
proven to be particularly strong in indexing of very large
cells (>> 100.000 Å3) and difficult dominant zone
problems. On present computers LSI searches all Bravais
lattices in less than 3 minutes. LP-Search is a Monte-Carlobased whole powder pattern decomposition approach(Pawley or Le Bail fitting), which does not require any
knowledge of d-spacings. Due to this LP-Search isparticularly suited for indexing of poor quality powder data,
where reliable d-spacing extraction is difficult or even
impossible (peak overlap problems, additional phases,
anisotropic line broadening).

LSI Indexing Examples
Figs. 1 and 2 show indexing of T3R3 human insulin-zinccomplex data taken at the LSLS Brookhaven with λ =1.4011Å, data courtesy of B. Von Dreele, Argonne, USA.
Individual peaks are first fitted using a direct convolution
approach (Cheary & Coelho, 1992). With this approach an
appropriate modelling of the observed line profile shapes isachieved, furthermore intrinsic peak shifts due to axial
divergence are corrected (Fig. 1). Indexing is then initiatedusing the extracted d-spacings and intensities. After an
indexing run a Goodness of fit versus Volume plot is
obtained (Fig. 2). These plots are very useful for visually
determining the quality of the solution, where each point
corresponds to an indexing solution as returned by the LSI
indexing algorithm. Here it is seen that the solution is welldefined with sharp maxima corresponding to the correct
solution and pseudo-solutions with fractional or multiple
volumes of the correct solution.
T3R3 indexes easily to R3, a=81.3010Å, c=73.0522Å,Vol=418173Å3, without any need to rescale the wavelength
to cope with the large cell volume.

LSI Indexing
It has been reported that the Least Squares Iteration (LSI)
indexing algorithm works and in particular it works on
difficult dominant zone problems. Why? That question indetail is more appropriately tackled in the paper by Coelho(2003). Conceptually indexing is a simple problem whereby
observed d-spacings are matched against calculated dspacings. The problem can be divided into two parts:
1) finding a set of possible solutions2) ranking these solution in order of fitness
As has been shown in Coelho (2003) the correct solution
for a particular problem is found by the TOPAS LSI
algorithm. However, placing the correct solution at the topof the list is dependent upon the precision of the data. For
poor data the LSI algorithm may place the correct solution
down the list. This is no surprise as the figure of merit
function is based on that of de Wolff (1968). Algorithms
that find the correct solution even when the correct solution
is not ranked at the top of the list have not failed. On thecontrary an algorithm that excludes solutions that ranks
higher than the correct solution has in fact missed solutions.
Thus success or failure needs to be qualified. An algorithm
can be deemed a failure if in fact it misses a possible
solution as determined by its figure of merit function.
The most important part of indexing therefore becomes oneof ranking the solutions. All methods that use d-spacings as
input and a ranking similar to that of de Wolff is likely tosuffer from the problem of obtaining many solutions withthe correct solution ranked down the list for data of poor
quality. Improving this situation can only be brought about
by the use of further information. There has been somesuccess reported by Markvardsen et al (2001) where Wilson
statistics are used to determine the correct space-groupfrom an already determined set of solutions. It is further
anticipated that progress on ranking solutions is possible
when intensities amongst a set of hkl’s are placed on aprobabilistic basic. In other words what is the probability ofa set of hkl’s having intensities as observed.

43

Fig. 1: Peak fitting to T3R3 using the TOPAS direct
convolution approach.

Fig. 2: Goodness of fit versus volume for T3R3. Maxima
correspond to 1/6 V, 1/3V, 1/2V, 2/3V, V, 2V and 4V.
In contrast to T3R3 is the dominant zone problem shown in
Figs. 3 and 4. Data courtesy of P. Stephens, Stony Brook,USA. Sample details temporarily undisclosed, to be
published. In this case the first observed 20 lines are of thetype hk0 (Fig. 1). A lot of noise is seen in the goodness of
fit versus volume plot indicating that there is a lesser
chance of the correct solution being ranked at the top of thelist. Here the correct solution is ranked at position 6,
obscured by triclinic solutions with similar volumes and(partly) similar lattice parameters: P21, a = 23.497Ǻ, b =4.773Ǻ, c = 21.113Ǻ, ß = 103.6°.

Eq. (1) is minimized using an iterative mechanism whereby
at each iteration a particular length lattice parameter isvaried between ± 50% of its value. Angle lattice parameters
are varied within ± 10°. A Pawley / Le Bail refinement isthen performed with starting lattice parameters
corresponding to the minima of Eq. (1).
Eq. (1) performs the task of getting close to a set of lattice
parameters that would give a good Pawley / Le Bail fit. The
process of minimization of Eq. (1) and then a Pawley /Le Bail refinement is repeated with random sets of starting
lattice parameters. Resulting solutions are ranked by Rwp
values with smaller values being superior.
Critical to the success of LP-Search algorithm is the speed
to which Eq. (1) can be calculated. In TOPAS highly
optimized code is used whereby monoclinic lattices can besolved in a few minutes. Triclinic lattices can take as muchas 15 minutes on today’s laptop computers.

LP-Search - Indexing Examples

Fig. 3: Dominant zone problem. The first observed 20 lines
are of the type hk0.

Fig. 5 shows the result for LP-Search applied to Cimetidine,
data taken from www.ccp14.ac.uk. Input for indexing
comprised the Bravais lattice and minimum / maximum
values for the lattice parameters and volume. The top plotshows the Rwp values as a function of refinement iteration;
here 21 Pawley refinements were performed; the total time
take was approximately 1 minute. Larger lattice parametersand volume ranges increases the time taken to solution.

Fig. 4: Goodness of fit versus volume plot, correct solution
is ranked at position 6. Maxima correspond to V, 2V, 3V
and 4V

LP-Search
Fig. 5: LP-Search applied to Cimetidine.
In the LP-Search (Lattice Parameter Search) algorithm dspacings are not extracted and instead the whole diffraction
pattern is input into the algorithm. An input set of lattice
parameters is varied until Eq. (1) is minimized where Np is
the number of calculated peaks, 2θp are the calculated peak
positions, Yo(2θ) the observed intensity at 2θ and V thevolume of the unit cell formed by the lattice parameters. n
is set to 2/3 for triclinic lattices, 1/2 for monoclinic lattices
and 1/3 otherwise.
( 2θ p +2θ p +1) / 2
2θ p
Np ⎡
⎤ (1)
FOM = V n ∑ ⎢(2θ − 2θ p)Y o (2θ ) d 2θ +(2θ − 2θ p)Y o (2θ ) d 2θ ⎥∫∫⎢⎥p =1 ( 2θ p +2θ p-1) / 2
2θ p
⎣
⎦

44

Important to realize here is that peak positions were notextracted. This makes LP-Search particularly suitable forpoor quality powder diffraction data, where reliable peak
extraction is difficult or even impossible, e.g. due to peakoverlap problems, additional phases, or anisotropic line
broadening.
This is shown in Fig. 6 for orthorhombic LT-ZrMo2O8, data
courtesy of S. Allen, Durham, UK. This example wasindexed to a = 5.879 Ǻ, b = 7.329 Ǻ, c = 9.130 Ǻ within
about 20 seconds on a Pentium III 1GHz CPU. Note themisfit of the observed data due to severe anisotropic line
broadening as a result of lattice strain (Allen et al., 2003),

which doesn't have an impact on indexing success, as the
goodness of fit is not minimized in (1).

available to the user via drop-down menus. After adistortion mode has been selected using these menus, asecond window pops up containing the corresponding 3Dsuperstructure, along with one interactive slider bar for eachfree order parameter (primary and secondary). Once thefree parameter values have been adjusted individually toobtain an interesting structure, the overall amplitude of themode can be varied with a “master” slider bar. The
structure can be zoomed and rotated arbitrarily using themouse and the keyboard, and the view direction can also be
set precisely using either direct or reciprocal latticecoordinates. The unique atoms in the supercell that split
from the same parent cell site may also be separately
highlighted in the structure.
For distortions that occur at special reciprocal-space kpoints (e.g. Γ, R, M, etc.), the isotropy subgroups have been
precomputed, making it possible to simultaneously search
all of the special k-points for relevant distortions. The
search can further be constrained by choice of crystal
system, conventional lattice basis, and/or final space groupsymmetry.

Fig. 6: LP-Search applied to LT-ZrMo2O8.

References
Allen, S., Warmingham, N.R., Gover, R.K.B. & Evans,
J.S.O (2003). Chem.Mater., 15, 3406-3410.
Cheary, R.W. & Coelho, A.A. (1992). - J. Appl. Cryst., 25,
109-121.
Coelho, A. A. (2003). J. Appl. Cryst., 36, 86–95
Markvardsen A.J., David W.I.F. , Johnson J.C. &Shankland K. (2001). - Acta Cryst., A57, 47-54.
Wolff, P. M. de (1968). J. Appl. Cryst., 1, 108-113

Distortions occurring at non-special k-points can also be
explored one k-point at a time. After entering the k-point asa rational fraction (incommensurate wavevectors are have
not yet been implemented), subsequent drop-down menus
allow the user to specify an irreducible representation of theparent space group and an order parameter direction in
abstract representation space, which uniquely identify agiven distortion mode. Because each distortion mode canbe explored and evaluated interactively in the viewer, it is
not necessary to thoroughly understand the grouptheoretical concepts behind this approach.

Structural phase transitions made easy: the
new ISODISPLACE software tool
Branton J. Campbell, Harold T. Stokes, David Tanner, andDorian M. Hatch,
Brigham Young University, Dept. of Physics & Astronomy
Email:
bjc79@physics.byu.edu
Web:
http://stokes.byu.edu/isodisplace.html
ISODISPLACE (http://stokes.byu.edu/isodisplace.html) is a
new free-access Internet tool for exploring structural phasetransitions. Parent-phase structural information can either
be uploaded from a CIF file or entered manually.
ISODISPLACE then computes the possible distortion
modes that satisfy any user-specified constraints and finallyallows the user to interactively view and manipulate the 3D
superstructure via a server-based Java applet (requires
SunJava 1.4.2 or later) and to save the distorted structure asa CIF file. Topic-specific links to the help pages areavailable throughout the ISODISPLACE site, and should
serve to answer many common questions.
Specifically, the ISODISPLACE GUI interfaces to thesubroutines of the ISOTROPY software suite (Stokes andHatch, http://stokes.byu.edu/isotropy.html), which it uses tocompute all of the isotropy subgroups of the parent spacegroup symmetry [1]. It then chooses those isotropy
subgroups that correspond to structural phase transitions(displacive, order-disorder, and/or strain) and makes them

45

Figure 1: (a) When entering the parent structure manually,
the space group can either be entered using a drop-down
number or by entering its number from the International

Tables.
Only the unique and non-trivial unit-cellparameters are required.
Non-standard settings areavailable and apply to both parent cell and supercell. (b)Atomic coordinates are entered via menus and fields for the
non-trivial components. The example shown is a cubic
barium-titanate perovskite.

specified symmetry, along with their respective IRs andOPDs, as well as other useful descriptive information. (cd) The general k-point approach involves two steps. First
specify the IR in panel (c), and then select from its OPDs inpanel (d) to uniquely identify the distortion mode ofinterest.

Figure 3:
The ISODISPLACE viewer applet, withexpanded view of the sliders. The example shown here is a+well-known perovskite tilt mode (a-a-c0) induced by the R4
irrep along the P2(a,a,0) order parameter direction. The
distortion has a √2×√2×2 supercell and spacegroupsymmetry Imma. See that the parent oxygen site has split
into two sites with separate checkboxes. The first oxygen
slider is the primary order parameter, though the other two+

Ba and O parameters (irrep R5 ) are actually co-primaryin that they could have fully lowered the symmetry
themselves. The last three sliders correspond to latticestrains (secondary order parameters at the Γ point).
[1] H. T. Stokes and D. M. Hatch, Isotropy Subgroups of the 230
Crystallographic Space Groups (World Scientific, Singapore,1988).

Figure 2: (a) Here, we consider the a-a-c0 octahedral tiltmode of BaTiO3, which occurs at (½, ½, ½) in the Brillioun
zone, and creates a conventional supercell with Immasymmetry and four times the volume. One can either
specify Imma symmetry in the lower drop-down menu andthen search distortions at all special k-points, or else
specify the R-point in the upper menu. (b) The special kpoint approach leads directly to a list of distortions with the46

Derivative Difference Minimization (DDM)
Program
Leonid A. Solovyov
Institute of Chemistry and Chemical Technology, 660049
Krasnoyarsk, Russia
Email:
leosol@icct.ru
Web: http://icct.krasn.ru/eng/content/persons/Sol_LA/
The derivative difference minimization (DDM) method offull-profile analysis [1] is implemented in a freely available
program DDM. The main advantage of the DDM method isin the opportunity of powder diffraction pattern modelingindependently of the background curve. In this method thefull-profile refinement is aimed not at minimizing theabsolute difference between the observed and calculated
patterns, but at minimizing modulations (or crookedness) of
the difference curve. The difference curve is considered as
an estimation of the background which, in the absence of
crystalline admixtures, generally varies much less rapidly
along the powder pattern than the Bragg diffraction profile
does. Thus, the DDM procedure finds such a calculateddiffraction pattern that, after being subtracted from theobserved one, gives the plainest difference. In the current
variant of the program the angular derivatives of thedifference curve are used as a measure of its crookedness.
The minimization function is chosen as
2

⎤
⎡ ∂2
⎡ ∂
⎤
MF = ∑ w1 ⎢ (Yo − Yc )⎥ + ∑ w2 ⎢ 2 (Yo − Yc )⎥ ,
⎣ ∂θ
⎦
⎦
⎣ ∂θ
2

where Yo and Yc are the observed and calculated profile
intensities, θ is the diffraction angle, w is the weight andthe sum is over the entire powder profile. The derivatives
are calculated by using the Savitzky-Golay method. The
optimal convolution interval width for calculating
derivatives may be either set equal to a chosen value or
automatically determined by the program for each data
point according to the counting statistics.
The background line modeling or approximations are
avoided in the DDM scheme, which allows increasing the
precision, reproducibility and comprehension of the powder
diffraction analysis via the elimination of backgroundrelated systematic errors [1, 2]. While the derivative
difference method was primarily designed for cases ofcomplex modulated background, it has also been found tobe advantageous in common cases of seemingly plain
background line. It should be noted that even when the
background contribution to a powder pattern appears
simple, it may have (and normally has) some modulations
hidden by the peak overlap.
The program includes both DDM and Rietveld refinement
routines for X-ray and neutron powder diffraction data as
well as the Le Bail method [4] and the DDM decomposition
procedure [2] for estimating the integral peak intensities.
Beside the crystal structure refinement, the quantitative
phase analysis (QPA) and the size-strain calculations are
implemented. The following corrections are available:••

Ellipsoidal corrections for anisotropic peakbroadening due to size and strain anisotropy
Anisotropic strain broadening correction with
fourth rank hkl-tensor [5]

47

•
•
•
•

Selective peak broadening correction due tostructural defects (stacking faults etc.) [6]Preferred orientation models of Rietveld-Toraya,
March-Dollase and its ellipsoidal extension
Split-FWHM peak asymmetry correction for all
available profile functions (Lorentz, Gauss, pV,
TCH pV, Pearson VII)
Intensity corrections for finite sample thickness,
surface roughness, beam overflow, cylindricalsample absorption and Lorentz-polarization factor

The size-strain calculations are performed using the TCH
Pseudo Voigt profile function [7] with the allowance for the
instrumental broadening and the microstructure anisotropy.
The DDM executable, the source code (based on revised
DBWS-9006PC [3]), a user’s guide and examples aredownloadable
from
the
web
at
The
http://icct.krasn.ru/eng/content/persons/Sol_LA/.
program reads parameters from input- and data-files andoutputs results to text listings, the crystallographic
information file (CIF), the plot-file readable by WinPLOTR[8] and a file with the structure factors and phases for the
Fourier calculations. The input-files have free format andthe numbering of the codewords for refinable variables is
optional. A graphical user interface is currently absent. The
program package includes a configuration for the freely
available Programmer’s File Editor (PFE), which facilitates
integrating DDM with graphical utilities such as
WinPLOTR and a structure viewer within the PFE shell.
An example of the PFE-DDM interface is shown in thescreenshot.

[1] Solovyov, L.A.: J. Appl. Cryst. 37 (2004) 743.
[2] Solovyov, L.A., Astachov, A.M., Molokeev, M.S., Vasiliev,
A.D.: Acta Cryst. B61 (2005) 435.
[3] Wiles, D.B., Young, R.A.: J. Appl. Cryst. 14 (1981) 149.
[4] Le Bail, A., Duroy, H., Fourquet, J.L.: Mater. Res. Bull. 23(1988) 447.
[5] Stephens, P.W.: J. Appl. Cryst. 32 (1999) 281.
[6] Solovyov, L.A.: J. Appl. Cryst. 33 (2000) 338.
[7] Thompson P., Cox D.E., Hastings J.B.: J. Appl. Cryst. 20(1987) 79.
[8] Roisnel, T., Rodriguez-Carvajal, J.: Mater. Sci. Forum 378381 (2000) 118.

Density Measurement Using the Berman
Balance
Richard J. Staples
Harvard University, Department of Chemistry
Chemical Biology, Cambridge Ma, 02138, USA
Email:
staples@chemistry.harvard.edu
Web: http://xrpc4.harvard.edu/staples.html

and

The Specific gravity of a substance can be of paramountimportance in evaluation of X-ray crystallographic data.
Although modern single crystal instrumentation , softwareand other modern analytical techniques have mademeasuring this value in the lab less valuable than in years
past1, there may be a need to bring back and improvemeasurements to help with identification of powderedsamples. With the recent increase in structure solutions
from powder samples, it seems that the specific gravity of apowdered sample may be more important. If one knows thedensity, then the formula of the material may be better
known and increase the solution of the structure frompowder data. The specific gravity is tied to the volumetric
relations of the X-ray cell and composition of the cell. ( w =dVA, w = molecular weight of unit cell, V = volume ofunit, A= Avogadros number, d= specific gravity)
Historically there have been many methods used todetermine the specific gravity of a substance. Although one
must chose a method suitable for the given material, theBerman method has proved successful when small
quantities are required. Berman in his original paper2, gives
a good representation of the methods in use and you canfind these in The International Tables of Crystallography3
where the techniques are describe in great detail andincluding methods for power samples. In the paper hedescribes the method developed in his laboratory for themeasurement of small quantity of material. This method
was generally well accepted and the necessary items weresold by various companies, including, Roller-Smith
Company and Federal Pacific Electric Company (1961)
which sold all the accessories for “The Berman Density
Balance”.
The intent of this brief article is to present the basics of thetechnique and a simple example. The Berman balance
consists of a torsion balance4, Figure 1, which has amaximum weighting capacity of 25 mg. A platinum wire,
double weighing pan or a platinum wire hook and a coarse
wire mesh basket for powder weighing. Below the hookresides a glass dish which can be raised and lowered so thatthe hook, or basket can become submerge in the solution.

Figure 2: Lab balance in operation.

Figure 3: Baskets available to crystal or powders.
Liquid is placed in the dish. The liquid choice can be
critical, Toluene was seen as the best for many mineral
studied in Berman’s lab. The liquid must have a low
surface tension, small variation of the density withtemperature and inert to the material in question. We havefound that for measuring single crystals of small moleculesthat the liquid of choice is heptane, although pentane and nhexane work also. These liquids however are harder to use
in that the exact position of the weight in liquid is harder todetermine than in toluene. Harassed of liquid choice also
include the possibility that the liquid dissolves thecompound or effect the crystal structure ( generally by lossof trapped solvent molecules).

Procedure
Procedure is very simple and at one time was taught inmineralogy courses here at Harvard University.
Tocalculate the specific gravity the general formula is used
S=

W dt

S= Specific Gravity of solid

W-W1 W = Weight of solid in air as determined by thebalance
W1 = Weight of solid in liquid of density dt
dt = Density corrected for temperature of solution.
The true density of the liquid, is temperature dependant, so
the temperature needs to be recorded. The variation of thespecific gravity by temperature is expressed as follows5:

Figure 1: Berman Balance.

48

dt = ds + 10-3α(t-ts) + 10-6β(t-ts)2 + 10-9γ(t-ts)3
Where ds = 0.70048, α= -0.8476, β = +0.1880, γ =-5.23, ts =0˚CFitting of nano particle structures to powder
diffraction pattern using DISCUS
R.B. Neder1 and T. Proffen2
Institut für Mineralogie, Am Hubland, 97074 Würzburg,
Germany; 2Lujan Neutron Scattering Center, LANL, MS
H805, Los Alamos, NM 87545, USA
E-mail:reinhard.neder@mail.uni-wuerzburg.de
andtproffen@lanl.gov
Web:http://www.uni-wuerzburg.de/mineralogie/crystal/discus/index.html
1

In practice the largest errors come from bubbles or surface
tension effect which hold the basket and help contribute toair bubbles on the powder or crystal.

Example:Common practice is to measure a standard mineral prior todetermination of the specific gravity of an unknown
material. We use a piece of quartz and then measure thespecific gravity for a single crystal and then compare that to
the reported value when a unit cell or structural solution iscompleted. We have used this information to help identify
potential solvent trapped in the lattice when the solvent isdisordered. Care must be taken when choosing liquid to use
since the solvent can be removed from the lattice. It is best
if you can confirm a unit cell before measurement and thenafter measurement. This information along with otheranalytical techniques, Mass Spec and NMR has proveneffective.
Our standard palladium complex gave ameasured density of 2.101 g cm-3, compared to the value
received by the solution of the X-ray structure from thecrystal at -60˚C, 2.113 g cm-3, from Cambridge Structural
Data Base6, 2.113 g cm-3 at room temperature.

Acknowledgements
The author would like to thank the Berman Laboratory forsupplying the Berman balance and Dr William Croft formuch of the related information regarding the procedure.
1) General survey of Acta Crystallogr. shows that until
1970’s the measured density was generally given in the
structure reports published in the journal.
2) Harry Berman, American Mineralogist, 1939, 24, 434440.
3) International Tables For Crystallography,, Vol C, 1995
ed A.J.C. Wilson, pages 141-143 by F.M. Richards,
describes various methods for the determination of thedensity for a solid compound.
4) Complete description resides in reference 2.
5) International Critical Tables 3;1928, 28-29.
6) The Cambridge Structural Database, F. H. Allen, Acta
Crystallogr., B58, 380-388, 2002.

The authors have been developing the DIFFUSE
programming suite, which contains programs for thesimulation of crystal structures, especially disorderedstructures. In this contribution we present current
developments of the DIFFUSE program suite which are of
special interest to powder diffraction experiments. Thesedevelopments include an efficient algorithm for the
calculation of powder pattern from finite particles as well asa refinement algorithm to fit the corresponding structuralparameters.
The Debye formula is an algorithm to calculate the powder
pattern of randomly oriented finite objects. In this algorithm
one sums over the contribution of all atom pairs with thefinite object. Thus, this algorithm is very well suited to be
used for the refinement of nano particle structures.
DISCUS realizes this algorithm by sorting the interatomic
distances into partial distance histograms. By binning theinteratomic distances into histograms with equal andconstant width ∆r, each interatomic distance may be
misrepresented by a value of ∆r/2. This is effectively adisplacement of the atoms and results in a decrease of thecalculated intensities just as the Debye-Waller factor.
Several trial calculations were carried out with different
step width for the histogram, ranging from 0.10 down to
0.01 Å. It turns out that there is hardly any difference
between the calculations for histogram step widths of 0.025
Å and 0.010Å. No damping of the powder pattern isobserved, even at 2Θ=140°. The calculations were carriedout for ZnO nano particles with 50x34 Å diameter and100*78 Å diameter.
The powder calculations may be carried out for X-ray andneutron diffraction data. The user can define the section ofreciprocal space for which the powder pattern is to be
calculated on an angular as well as a q=4π sin(Θ)/λ scale.
The DISCUS commands to calculate and store a powder
pattern are described in the following macro. This macroreads the asymmetric unit of the quartz structure ans
expands this to a small crystal of 5x5x5 unit cells. No
defects are introduced in this short example. In the powder
menu, the calculation mode is set to “debye”. Anotheroption allows full integration of reciprocal space, thisoption is better suited to large crystals, where he integration
can be limited to non-zero regions of reciprocal space.
Reciprocal space is defined in units of q, and the calculation
is carried out from q=0.5 to 7.0 in steps of 0.01. The atomic
displacement parameters are used, while anomalous
dispersion is switched off. No instrumental broadening isdone by setting delta to 0.0. A non-zero value would
instruct DISCUS to convolute the diffraction pattern with aGaussian function. The wave length is defined and the49calculation run with X-ray form factors. The powder patternis stored as an ASCII file with columns q and intensity.
readcell quartz.cell, 5, 5, 5
powderset calc,debye
set axis,q
set qmin,0.5
set qmax,7.0
set dq,0.01
set temp,use
set disp,off
set delta,0.0
set wvle,1.54056
xray
run
exit
outputform powder,qoutfile quartz.q
run
exit

This program allows the user to define floating as well as
real parameters to be refined. Constrains may be applied forindividual parameters or expressions between parameters.
The figure shows a fit to a powder diffraction pattern of
ZnO nano particles. The powder data were collected on a
Philips PW diffractometer at room temperature using Cu
Kα. In this particular fit the nano particle was constructedin the following fashion: The current set of structuralparameters, i.e. lattice constants, atomic positions, andatomic displacement parameters were used to generate large
layers of half the Wurtzite structure. These layers werestacked along c using the DISCUS stacking fault menu. The
stacking fault probability was a refined parameter. The
particles were cut to appropriate size, here defined by two
independent parameters giving the diameter in the a-b plane
and along c. Thus a total of seven parameters were refined
to describe the nano particle.

Fig.2: Powder diffraction pattern of a ZnO nano particle.
Observed (blue) and calculated (red) powder pattern,difference(green).
Fig. 1: Powder pattern of a small quartz particle.

Powder pattern fitting
The calculation of the powder pattern of nano particles
based on a single simulated particle is a valid solution only
if all particles are assumed to be identical in size andstructure. Usually, nano particles will be subject to aparticle size distribution and the presence of structuraldefects such as stacking faults or twinning. In this case, thepowder diffraction pattern must be averaged from powder
diffraction pattern calculated for a distribution of several
particles. The individual particles within this distribution
are simulated by randomly placing defects within theparticle structure. The refinement of the corresponding
structural parameters that define the crystal structure andespecially the defect structure are not straightforwardly
implemented into a least-squares refinement, since thederivatives of the individual parameters are lost in the
averaging.
We therefore use a differential evolutionary algorithm(Storn & Price) to refine the parameters. The differential
evolutionary algorithm is considered a very effective
genetic algorithm. This algorithm has been encoded into theprogram DIFFEV, part of the DIFFUSE program suite.

50

More information on the program and downloads areavailable at the DIFFUSE homepage at:
http://www.uniwuerzburg.de/mineralogie/crystal/discus/index.html
or through: http://www.totalscattering.org/

References
Kenneth Price & Rainer Storn: Differential Evolution
http://www.icsi.berkeley.edu/~storn/code.html

Magnetic Rietveld and single crystal
refinement with SARAh- Representational
Analysis and SARAh-Refine for the MSWindows
Andrew S. Wills
Department of Chemistry, University College London,
Christopher Ingold Laboratories, 20 Gordon Street,
London WC1H 0AJ, United Kingdom
Email: a.s.wills@ucl.ac.uk
WWW: http://www.chem.ucl.ac.uk/people/wills/ andftp://ftp.ill.fr/pub/dif/sarah/
The SARAh suite of programs was created to enable
unspecialised users to use symmetry arguments to refine
and understand magnetic structures. The package contains
two programs: SARAh-Representational Analysis which
performs the group theory calculations of the different
symmetry types, and SARAh-Refine, a program thatenables the results to be used directly in refinements using
GSAS and FullProf. Through this structure SARAh enables
the analysis of both powder and single crystal neutron
diffraction data using programs already familiar to the user.
The formalisms used in SARAh are designed to educate theuser with regards to magnetic structures, their definition,
their types and their phase transitions.

Fig. 1: SARAh-Representational Analysis main screen
showing selection of space group, propagation (k) vector,
magnetic atom coordinates entry. A help window isdisplayed to the right explaining the input.
SARAh- Representational Analysis uses group theory to
calculate the different types of magnetic structure classified
according to the symmetry of the associated irreducible
representation. The representations that are the starting
point for these calculations are by default those collated in
the tables of Kovalev and so are readily verifiable. A
second option based on ab inito calculations is also present
if the user prefers. The different possible magnetic
structures are expressed using the formalism of basis
vectors: vector components for the atomic positions that are
related by symmetry. Linear combination of the basis
vectors associated with an irreducible representation
defines the possible magnetic structures that correspond tothat symmetry type. Refinement of a neutron diffraction
data, using SARAh- Refine, then corresponds to trying inturn each of the representations and refining the relative
proportions of the different basis vectors.

51

Central to the design of SARAh is the desire to simplify thecalculations and refinement processes while making themmore physically reasonable. In particular, the prejudices
generation of trial structures, as is commonly the case, isprevented. SARAh is written in native Windows code andthe input process is as intuitive as possible. To perform thesymmetry calculations the user must input the space groupof the chemical structure before the ordering process, thepropagation vector of the resultant magnetic structure (useof a propagation vector is core to the correct and simplest
definition of a magnetic structure), and the atomic
coordinates of each site occupied by a magnetic ion. Afterinitialisation a default course for the calculations is createdby the program that depends on the particular input and theuser only has to press <Return> to complete them. The
listing files show the calculations of the irreducible
representations (the .lst1 file) and the associated basis
vectors (the .lst2 file). Two additional files are created. The
first is written in LaTeX and contains a summary of thecalculations, including formatted tables, in the form of areport that can be read normally. Citations are given to key
references and a brief introduction to the use ofrepresentation theory is given. The second file (with theextension .mat) is used by SARAh-Refine.

Fig. 2: A tables from the LaTeX summary file generated by
SARAh-Representational Analysis.

Fig. 3: SARAh- Refine main screen showing selection ofbasis vectors to be tested. Refinement is started using abutton in the Refinement Controls Tab. A help window at
the side gives general advice.

SARAh-Refine should be invoked once the user has createda working magnetic refinement in either GSAS or FullProf.
In GSAS, the user should enter a magnetic only phase withthe symmetry P1. A magnetic atom should be entered into
this phase and profile parameters set up according to the
nuclear refinement. As GSAS is only capable of analysingcommensurate magnetic structures, the lattice parameters ofthe magnetic cell must be integer multiples of the nuclear
cell and the phase fraction for the magnetic phase must be
set accordingly. Once the magnetic refinement runs,
SARAh-Refine can be used to input all of the magnetic
atoms into the magnetic phase. (This step greatly facilitates
the analysis of complex structures.) Before SARAh-Refine
can be used to start the refinement, it should be pointed outthat the orientation of the magnetic moments will bedefined using unit vectors and their magnitude is refinedusing the fraction occupancy (FRAC). Appropriate
constraints should be set up to allow related moments to beof the same size. The refinement process now corresponds
to selecting the different basis vectors of a given
representation from by checking a list table, deciding thenumber of reverse-Monte Carlo refinement steps required,and launching the refinement. The magnetic structuresassociated with the different irreducible representations canbe tried in turn (Landau theory limits a second order phasetransition to involving only a single irreducible
representation) by simply unselecting and selecting
different basis vectors. If several atomic sites are involvedin the same second-order transition, a result of Landau
theory can be invoked, that the same representations should
be involved on the different sites, to further reduce thenumber of trial structures. Data files (_rmc.dat) are
generated which list the values of χ2 against the relative
proportions, termed mixing coefficients, of the different
selected basis vectors. The least-squares aspects of therefinement can be controlled in GSAS as normal and theresultant structure drawn using DRAWxtl (Larry Finger,
Martin Kroeker and Brian Toby).
One of the main reasons behind this operation of SARAhRefine is that GSAS defines magnetic symmetry in terms of
Shubnikov groups. The author argues that this is an
unwieldy technique and less general than the use ofrepresentation theory. By being a clip-on program SARAhRefine facilitates use of the results of representation theory,
to the extent that the scientist need not even enter astructure by hand. Instead they are encouraged to look at
the basis vectors and work to understand the types ofmagnetic structure they represent, and indeed the intimate
nature of the magnetic phase transition.
The philosophy for the use of SARAh-Refine with FullProf
is quite different. FullProf accepts magnetic structures
defined using basis vectors and the use of a propagation
vector. For this last reason, the magnetic positions that are
required as input are restricted to those of the chemical, or
zeroth, unit cell. Just as was explained previously,refinement involves selection of the different basis vectors
associated with the trial structure that is being tested.
SARAh-Refine then creates the simplest description of thatstructure in terms of symmetry operations, so that eachmagnetic atom is generated only once. The fractional
occupancy of the magnetic atoms in the FullProf input (pcr)
file should then be set to unity. As with a nuclear

52

refinement, only one atomic position is explicitly given andall atoms related by symmetry will be generated by thesymmetry operators of the magnetic phase. The relativeorientations of their magnetic moments will be defined at
the same time. To simplify the creation of a magnetic phasein the correct format, SARAh-Refine can be used togenerate the entire magnetic phase section of a pcr input
file. The relevant parts can then be substituted into theworking refinement file. Refinement of the mixing
coefficients is done directly in FullProf and relations
between them may be set in the normal manner. Refinedstructured can be visualised using FPStudio (Laurent
Chapon and Juan Rodriguez-Carvajal). To facilitate theexploration of different trial structures, after selection ofdifferent basis vectors SARAh-Refine can be used toreplace only the magnetic symmetry definitions in aworking refinement file, thereby enabling the rapid
exploration of the different possible magnetic structures.

Fig. 4: The magnetic part of the FullProf input file as
generated by SARAh-Refine. The mixing coefficients of theselected basis vectors correspond to the variables C1…C9.
While representational theory is arguably the most powerfulsymmetry formalism for magnetic structure in general use,
it is important to point out that it remains incomplete.
Corepresentation theory is an extension of representational
theory made by inclusion of antiunitary symmetry, often
incorrectly associated with time-reversal. Its use willfurther simplify the different ‘symmetry-allowed’ types ofmagnetic structure and reveal more about the nature of theconcomitant ordering process. While at present no
distributed programs contain corepresentational theory, its
inclusion has been carried out in SARAhcorepresentational theory which is due for general releasein 2006 after final testing.
An introduction to the magnetic structures and the use ofrepresentation theory are given in :“The determination of magnetic structures using
symmetry”, A.S. Wills, Proceedings of the Ecole
Magnétisme (Société Française de la Neutronique), J. Phys.
IV France 11, Pr9-133 (2001) and “Long-range orderings
and representational analysis of the jarosites”, A.S. Wills,
Phys. Rev. B 63, 064430 (2001).
A summary of the different programs that perform grouptheory calculations of magnetic structures is given in:“Symmetry and magnetic structure determination:
Developments in refinement techniques and examples”,
A.S. Wills, Appl. Phys. A 74, S856-S858 (2002).

Quantitative Rietveld analysis in batch modewith Maud, and new features in Maud 2.037
Luca Lutterotti
Dipartimento di Ingegneria dei Materiali e delle
Tecnologie Industriali Universit` a di Trento, 38050 Trento,
Italy
Email: Luca.Lutterotti@ing.unitn.it
WWW: http://www.ing.unitn.it/~maud/

1. Introduction
Today several instruments for fast spectra recording areavailable. In most cases the difficulty is to process andanalyze the data quickly in a reliable way. The Maud
program, in one of its many undocumented features, can beused to process a list of analyses in batch mode from theconsole without requiring the interface. This is useful toquickly process similar spectra or launch a slow/time
consuming refinement in a remote computer without
recurring to the interface that would need to open a session
involving the remote display setting. The overall procedure
is to prepare the analysis locally using the interface or to
prepare a starting point for a series of spectra (one common
starting point) also using the interface, then to prepare an
instruction file in CIF like format to specify the analyses,
the spectra and the kind of refinement to conduct andfinally to run Maud in batch mode providing the instruction
file previously prepared. The program will run and process
one analysis at time and prepare an output file extractingsome key information (either the default or some to be
specified) in a format suitable to be imported in spreadsheet
or graphical programs to analyze the results.
As an example we will show the procedure to analyze aseries of ball milled Cu-Fe mixed powders in which two
different phases may form with a different composition. Byan automatic Rietveld analysis performed in batch mode wewill extract information about phase content [2, 1],
crystallite and microstrain for each sample/spectrum. The
analysis is further complicated from the fact that thepowders milled at higher energy show the presence ofplanar defects [4] and texture arising from sample
preparation and the platelet like shape of the grains [3].

2. Analysis and procedure
In this section we will present the procedure to analyze 25
spectra of Cu-Fe different samples. The spectra werecollected on a Philips X-pert system in Le Mans at the
LPEC laboratory of the University du Maine, thanks to A.
Gibaud.
2.1 Analysis preparation through the interface
We start the Maud program and load all the datafiles
together to check their integrity and to prepare a common
starting analysis file. A plot of all spectra and theirdifferences is available in Figure 1. We load the two
possible phases, bcc iron and fcc copper, from the Maud
database. By computing the spectra once and comparing
them visually with the experimental spectra we may noticethat for some samples, milled at longer time, an alloyed fcc
phase has formed (out of equilibrium) and the bcc irondisappears. Unluckily we could not use the copper rich

53

phase cell parameter to monitor the Fe content in it as thecell parameter tends to growth as a result probably ofoxygen entrapping. In a first attempt we discovered thespectra are affected by texture, anisotropic crystallite sizes
and microstrain as well as planar defects (especially on the
Cu like phase). So we decide here to include also texture
and anisotropic/planar defect effects in the analysis. For
both the bcc and fcc phases we select in the proper panel
the Popa model for anisotropic broadening, the Warrenmodel for planar defects and the harmonic model for
texture (specifying cylindrical sample symmetry and Lmax
= 6 in the options; it is required by the experiment
geometry).

Figure 1: Plot of all spectra used in this example. It is
possible to recognize in some samples the presence of both
fcc and bcc phases, but not in all.
Next step was to adjust the cell parameters for both bcc andfcc phases in order to get a mean starting value good for all
spectra (especially for the fcc); and to adjust the crystallite
value to a good starting point (around 200Å) obtaining peak
shapes a little sharper than in the less broadened spectrum.
The background constant parameter was also adjusted to
the value of the spectrum with the lower background.
Actually only the cell parameter adjustment is critical, thebackground one is even not necessary.
Finally we remove all the spectra (we will specify which
datafile to use for each analysis later in an instruction file)and save the analysis containing everything except the
spectrum/a. For the purpose of this article we save theanalysis with the name: FeCustart.par.
2.2 Preparation of the instruction file and batchprocessing
To run Maud in batch we need to write an instruction filecontaining the list of analyses to execute one at time. The
file is in CIF format but containing some terms notavailable in the official CIF dictionary, but that Maudrecognize. All the analyses to be performed are specified
through the loop CIF instruction. The first term of the loop
must be the one specifying the starting analysis file to beloaded (full path in unix convention) and then the others to
instruct Maud for the kind of analysis to perform, iterations
and eventually datafile to load and name of the file were tosave the analysis. Additional keywords can be used toappend specific results to a file for spreadsheet analysis.

The simplest instruction file is something containing thefollowing: First example (paths for windows):
loop__riet_analysis_file_riet_analysis_iteration_number´//C:/mypathfortheanalysis/analysis1.par´ 5´//C:/mypathfortheanalysis/analysis2.par´ 3´//C:/mypathfortheanalysis/analysis3.par´ 7

The analysis1.par (or 2 or 3) are some analyses files
prepared with Maud, containing also the datafile/spectrum,
already set for the parameters to be refined and saved justready for the refinement step. Maud will load each analysis,starts the refinement with the number of iterations specified
and save the analysis with the refined parameters under thesame name. The analyses can be loaded at end in Maud(with the interface) to see the result of the refinement.
In the case of the Cu-Fe we need to perform some more
steps: first we start from one common analysis point (theFeCustart.par analysis file) but we want to specify
different datafiles; second we want to perform a fullautomatic analysis in which Maud performs different cycles
deciding which parameters to refine at each step and third
we will specify the name of each analysis for the saving
process and a file name were to append some selected
results in a tab/column format for subsequent easy loading
in a spreadsheet program. Cu-Fe example:
loop__riet_analysis_file_riet_analysis_iteration number_riet_analysis_wizard index_riet_analysis_fileToSave_riet_meas_datafile_name_riet_append_simple_result_to´//mypath/FeCustart.par´ 7 13´//mypath/FECU1010.par´ ´//mypath/FECU1010.UDF´´//mypath/FECUresults.txt´´//mypath/FeCustart.par´ 7 13´//mypath/FECU1011.par´ ´//mypath/FECU1011.UDF´´//mypath/FECUresults.txt´to run Maud in batch in the console (or DOS window) we
type in the directory or folder where the Maud.jar is locatedthe following:
DOS (everything in the same line):
java -mx512M -cp"Maud.jar;lib\miscLib.jar;lib\JSgInfo.jar;lib\jgaec.jar;lib\ij.jar" it.unitn.ing.rista.MaudText -f
fecu.ins

Unix (everything in the same line):
java -mx512M -cp
Maud.jar:lib/miscLib.jar:lib/JSgInfo.jar:lib/jgaec.jar:lib/ij.jar it.unitn.ing.rista.MaudText -f
fecu.ins

For Mac OS X, it is advised to use the generic Unix Maudinstallation (or to change the path to the jar files). Before
running Maud in batch mode it is important to run Maudinteractive (with the interface) at least once to create andextract the databases, examples and preferences folder.
2.3 Analysis of results
After running Maud in batch mode, we can check quickly
the results by loading the results file FECUresults.txt
in a spreadsheet program. The results are arranged in rows
and separated by tabs. The first row contains the column
titles, each subsequent row a different analysis. The Rwp
value for each analysis is reported in the second column
and the biggest value found was 5.6% as an indication of
the success of the analysis. As an example we report in
Figure 2 the graphical correlation of the copper-rich phase
percentage and its mean crystallite value as found in theanalysis versus the sample number. The files and examples
used in this articles will be uploaded in a tutorial in the
Maud web page along with some additional files with thebatch mode commands for an easier use.

.....(lines with all the other 23 datafiles omitted for brevity)´//mypath/FeCustart.par´ 7 13´//mypath/FECU1038.par´ ´//mypath/FECU1038.UDF´´//mypath/FECUresults.txt´

With this instruction file (that we save under the name:fecu.ins) we specify for example that as a first analysis,
Maud has to load the FeCustart.par file, then to loadin the analysis the FECU1010.UDF datafile, to performthe automatic analysis number 13 (in the wizard panel ofMaud the automatic analysis number 13 is the texture
analysis; we need to refine also the texture parameters
along with phase analysis and microstructure) and to use 7
iterations for each cycle (the texture automatic analysis iscomposed by 4 cycles) to ensure sufficient convergence. At
the end the analysis is saved with the name
FECU1010.par and simple selected results will beappended in the file FECUresults.txt. The simple
results saved in the spreadsheet like file are some of themost used parameters and results. It is possible to specify
the parameters we want in output using the CIF word riet
append result to (in addition or as an alternative),
but in the preparation of the starting analysis file in the
Maud interface, the parameters to be added to the resultsmust be specified by turning to true the switch in the
output column of the parameter list window or panel. Now

54

Figure 2: Copper-rich phase volumetric content and mean
crystallite size vs. sample number as obtained by theautomatic batch mode analysis. The plot has been createdfrom the results file saved by Maud.

3. How to get Maud 2.0 and new features

Update of the FullProf Suite and CrysFML

For this analysis we need Maud version 2.037 or later, andit can be freely downloaded from the Maud web page at
http://www.ing.unitn.it/~maud/ for the preferred platform.
There are two archives for Windows and Mac OS X plus ageneric Unix version that can be used for Linux, Solaris or
every Unix based system with a Java 2 virtual machine
installed. The new version 2.0 has a new interface focusedon reducing the effort of a new user and simplifying themost common tasks. Some particularity of the new version
respect to the previous one are (most of them to provide
some useful routines for abinitio structure solution):

Juan Rodríguez-Carvajal
Laboratoire Léon Brillouin (CEA-CNRS), CEA/Saclay
91191 Gif sur Yvette Cedex, FranceInstitut Laue-Langevin, BP 156, 38042 Grenoble Cedex,
FranceEmail: Juan.Rodríguez-Carvajal@cea.fr
WWW: http://www-llb.cea.fr/fullweb/powder.htm andhttp://www.ccp14.ac.uk/ccp/ccp14/ftp-mirror/fullprof/• Different minimization/search algorithms selectable:
Marquardt least squares, Evolutionary algorithm,
Simulated annealing, Metadynamic search algorithm.
As an example the evolutionary algorithm can be usedin the early steps of the refinement to select the proper
starting solution and the Marquardt to drive it toconvergence.
• Possibility to use crystallites and microstrain
distributions for peak shape description instead ofanalytical fixed shape functions.
• Maximum Entropy Electron Map full pattern
fitting. An electron map can be used for fitting insteadof atoms.
• Full pattern fitting by a list of peaks. Either anarbitrary list of peaks (each one with its own position,
intensity and shape), or simply a list of structure factors
to be imported, instead of a list of atoms.
• Indexing directly on the pattern, selecting the Le
Bail fit and the evolutionary algorithm for the cellsearch. This may be used to improve a difficult
indexing or a partly done one.
• Introduction of fragments. So fragment search can bedone directly on the pattern or on a list of extracted
structure factors.
• Energy minimization. At the moment only the simple
repulsion energy is completed. Other energy principles
are under completion.
• Spectra integration from image plate or CCD
transmission/reflection 2D images. Centre, tilting
errors and distance from sample can be refined in the
spectra fitting.
Bugs and errors should be reported to the author throughthe bug reporter web page; questions in the Maud forum
accessible from the Maud web page.
In a future article we will report the instructions on how tomodify/extend the program by little Java programming orprovide a new alternative model/plug-in for the instrument
or the structure/microstructure or datafile importing.

References[1] D. L. Bish and S. A. Howard. J. Appl. Cryst., 21, 86–91,
1988.
[2] R. J. Hill and C. J. Howard. J. Appl. Cryst., 20, 467–
474, 1987.
[3] L. Lutterotti and S. Gialanella. Acta Mater., 46(1), 101–
110, 1998.
[4] B. E. Warren. X-ray Diffraction. Addison-Wesley,
Reading, MA, 1969.

55

During the last year the FullProf Suite and the set of
Fortran 95 modules constituting the Crystallographic
Fortran Modules Library (CrysFML) have been
extensively modified and updated. In this short note I
summarize the list of programs and the most importantchanges in the FullProf Suite as well as the available
modules of CrysFML.

FullProf Suite

Fig 1: Snapshot of a session on magnetic structurerefinement using WinPLOTR/FullProf and Fp_Studio
Today several instruments for fast spectra recording areavailable. In most cases the difficulty is to process and an
The present list of executable programs available in the
FullProf Suite is the following:
WinPLOTR: General purpose program able to represent
many formats of powder diffraction patterns, as well as
single crystal peak profiles. WinPLOTR can access theother programs of the FullProf Suite and it can be used forautomatic peak search for indexing, profile fitting, running
FullProf in sequential mode, etc.
FullProf: Determination (by simulated annealing) andrefinement of crystal and magnetic structures for powder
and single crystals. Generates files for other programs.
EdPCR: Friendly edition of the input control file (PCRfile) for FullProf. Imports CIF and SHELX files.
Fp_Studio: Automatic graphic representation, after running
FullProf, of crystal and magnetic structures using OpenGL.

Fourier and GFourier: Fourier maps calculations andgraphic representation. Visualisation of apparent average
crystallite shapes and anisotropic strains.
BasIreps and GBasireps: Calculation of irreducible
representations of space groups and basis functions.
Bond_Str and GBond_Str: Distances, angles and bondvalence calculations. Import CIF files.
DataRed: Data reduction program for single crystals.
Prepares files to be used by FullProf.
Indexing programs: SuperCell, WDICVOL04, WTREOR
and WITO15.
Utilities: Mendel and Mol_tpcr
A part of correcting bugs, a list of the most importantchanges in the FullProf Suite during the current year is thefollowing (for details the user can consult the file “fp2k.inf”
accessible from the “Help/WinPLOTR news?/FullProf
news?” menus of WinPLOTR):

New description of multi-helical magnetic structures:Multi-helical magnetic structures can now be described, in
addition to the Fourier coefficients and basis functions
formalisms, in real space: magnetic moments of theelliptical envelope and orientation angles of the helices are
directly refinable.
New version of DICVOL: The program DICVOL04 from
A. Boultif & D. Louër, J. Appl. Cryst. 37, 724 (2004), is
now the default indexing program of the FullProf Suite.
The success ratio of DICVOL04 when running using
default parameters has been highly improved.
Documentation: Some new documents and user guides are
now available as HTML and/or PDF files. An improved
access to the documentation is now possible through the“Help” menu of WinPLOTR. In particular to access the
PDF manual for Fp_Studio, the use of FullProf for time offlight and for flipping ratio refinements (polarised
neutrons).
The preparation of several tutorials concerning different
aspects of the use of the FullProf Suite is under way.
CrysFMLThe current Fortran 95 modules available for distribution
are concerned with the following topics: Chemical andPhysical tables (scattering factors, etc.), Mathematicalmethods for Crystallography, Symmetry, Fast Fouriertransforms and convolutions, global and local optimization
procedures, string utilities, handling of formats (CIF, etc),
managing refinement codes and names of parameters,
reflection utilities, geometrical and bond valencecalculations, structure factors, profile functions (including
TOF), reading powder diffraction patterns in different
formats, etc. Some examples of main programs using thelibrary are also available.

Fig 2: Snapshot showing the use of Bond_Str by importinga CIF file
Extension of the rigid body representations: At presentinternal coordinates of a rigid body (or a satellite group)
can be given and refined as Cartesian, spherical, andcylindrical coordinates. The Z-matrix representation is alsoavailable but, presently, not refinable. A utility program,running in console mode, Mol_tpcr, is now supplied withthe aim of generating pieces of the PCR files.
Control of refinement: The user can give comprehensive
commands within the PCR file for controlling therefinement. For doing this, a section starting with the
keyword COMMANDS, provided just after the line giving
the name of a phase, can contain keywords like VARY
x_Fe1, VARY xyz, etc.
Improvements for creating FST file for Fp_Studio: In
the PCR file the user can give instructions for automaticallymake appropriate graphic representations of crystal andmagnetic structures.

56

In the forthcoming months the FullProf Suite and
CrysFML will be both available at the Diffraction Groupsite of the Institute Laue-Langevin. At present, the people
wishing to obtain CrysFML must contact the author by email.
The whole FullProf Suite can be obtained from the CCP14
siteat
http://www.ccp14.ac.uk/ccp/ccp14/ftpmirror/fullprof/.

FOX, Free Objects for Xtallography version
1.7 (november 2005)
Vincent Favre-Nicolin (a) & Radovan Černý (b)(a) Université Joseph Fourier (Grenoble I) CEA/Grenoble,
DRFMC/SP2M. 17, rue des Martyrs 38054, Grenoble
Cedex 9 – France; (b) Laboratoire de Cristallographie, 24,
quai Ernest-Ansermet, CH-1211 Genève 4, Switzerland
Email: Vincent.Favre-Nicolin@ujf-grenoble.fr
WWW: http://objcryst.sourceforge.net/Fox/
A new version of Fox will be available in november 2005
(beta -test- versions are available for those interested,see
http://objcryst.sf.net/Fox/FoxDevelopment). Along withspeed improvements (twice faster for powder patterncalculations, more on windows with the change ofcompiler), many features have been included or improvedin this new version.

Better Molecule description
The last version of Fox featured a new “Molecule”
description, which used a description of atomic positions
from their [x,y,z] coordinates, associated to bond lengths,
bond angles, and dihedral angles restraints. This description
allowed a significant speed increase in the structure
solution (3 times faster for cimetidine and potassium
tartrate examples [1]), thanks to the increased flexibility
compared to the z-matrix description. However thisinvolved a reduced control on the geometry of the Moleculeas the algorithm forced distortions, only loosely applying
the specified restraints.
In the new version, the “stretch modes” used to randomly
alter the molecule conformation are automaticallygenerated using the derivative of the restraints values tominimize the molecule distortion while preserving theflexibility of the random moves. On average, the restraint
costs in the molecule during the optimization are more thanten times lower than with previous description.

Other new features:
•

•

•

•

it is now possible to describe “rigid groups of
atoms” within each molecule, which will remain
strictly rigid during the optimization.
the origin of the molecule (which is used as thecenter of rotation) can now be fixed on a given
atom, rather than on the default geometrical centerof the molecule.
the list of atoms is now presented using a tabular
view, which supports a much larger number ofatoms (tested with > 1000 atoms), and is much
faster.
the list of restraints (bond lengths, angles, dihedral
angles, rigid groups) are now presented in a single
window, using the same tabular view for a fast
display.

Multiple Solutions

Fig.1: A new tabular interface is used, for (a) atom types(ScatteringPower, including access to anti-bump and bondvalence parameters), (b) list of molecule atoms (supporting
more than 1000 atoms), and (c) the list of molecule
restraints (bond length, bond angle, dihedral angle andrigid group). A graphic (d) shows the evolution of the cost
during the optimization. After a “Multiple Run”
optimization, the obtained solutions can be browsed (e) byclicking on each solution.

57

The Parallel Tempering (PT) method used in Fox ensuresthat the algorithm will always get out of any local minimum
to find the global one, so that a single run is required toensure finding the global minimum. However it is often
convenient to be presented with several solutions to choose
from, if only to have a better feeling of how “stable” thesolution is. This option is now available, and it isrecommended to launch a “Multiple Runs” optimization :this will do PT optimizations for a given number of trials(100 000 to 10 000 000, user-chosen depending on thecomplexity of the structure), and re-start from a random
configuration.
At the end of the optimization, the list of “solutions” can bebrowsed, and clicking in the list will update the display (3DCrystal view, powder pattern,...) for each solution.

Bond Valence
One key difficulty when solving the a structure is thevalidation of the structure: particularly for high-symmetrycompounds, it can be difficult to assert whether the solution
has been reached. To help with this, Bond-Valencecalculations have been added: using tabulated Ro values forpairs of elements or ions, the valence can be calculated forall or part of the atoms and compared to the expected
formal charge.
It is also possible to use the bond-valence calculations as acost function, provided that Ro values have been added for
all couples of elements/ions, but this is still experimental.

Automatic Background using the BayesianDavid-Sivia algorithm
Following the algorithm which was proposed by David &Sivia [2] using a Bayesian approach, the background can be
automatically estimated: the user only has to choose thenumber of points. Either linear or cubic spline interpolation
can be used. And the background points can finally beedited from the interface.

Time-Of-Flight and reflection profiles
Time-Of-Flight neutron powder patterns are now supported
in Fox, along with an adequate double-exponential pseudoVoigt (DE-PV) profile, thanks to Mark Pitt. For this thedescription of profiles has been entirely changed, andasymmetric profiles are now also available in the pseudoVoigt profile used for monochromatic patterns.

Maximum Likelihood
Maximum likelihood [3] principles have been included in
Fox: this allows to tell the algorithm that some atoms are“blurred”, i.e. are evaluated as if their position is only
approximately known. In some cases this can improve theconvergence [2], but this is still experimental.

Fox without graphical interface (“Fox-nogui”)
for servers
Many laboratories have clusters (Linux or MacOS X)
dedicated for long calculations, but generally they do nothave the graphical libraries required by Fox (wxWidgets,
OpenGL, glut) installed, and computer administrators canbe reluctant to include them it. It is now possible to compile
Fox without the graphical interface, i.e. without any libraryrequirement, which is trivially done by each user by asimple “make Fox-nogui” command. A multiple run
can then be launched from the command-line, e.g. from theFox directory after compilation:
src/Fox -i example/Cimetidine-powder.xml --nogui n 3000000 --nbrun 10 –silent

Fox for Mac OS X
The Fox and the Tiger have finally met ! As shown in fig.
2, Fox now runs under Mac OS X with the native “Aqua”
look.

58

Fig 2: Fox running on Mac OS X

Fox wiki
The Fox manual has now been transfered to a wiki
[http://objcryst.sf.net/Fox/]. This allows a direct editingfrom any web browser. All users are encouraged to add
their tips, feature requests, references to publishedstructures...

Downloading Fox
Fox is open-source software, released under the GNU
General Public License. It can be downloaded fromhttp://objcryst.sf.net/Fox. Precompiled versions areavailable for windows and MacOS X.

Acknowledgements
The authors would like to thank all users of Fox for the
feedback they provide, which is used to improve thealgorithm. More special thanks go to Thierry Bataille(ongoing tests with bond valence), Christian Baerlocher(Mac OS X testing), Mark Pitt (neutron TOF), Michal
Husák (many tests), and Jan van Mechelen (large molecules
testing).
[1] Z. Kristallogr. 219 (2004) 847[http://dx.doi.org/10.1524/zkri.219.12.847.55869][2] J. Appl. Cryst. (2001). 34, 318[http://dx.doi.org/10.1107/S0021889801004332][3] Acta Cryst. (2002). A58, 316[http://dx.doi.org/10.1107/S010876730200510X]

VENUS: a 3D Visualization System for Crystal
Structures and Electron/Nuclear Densities
Fujio Izumi (a) & Ruben A. Dilanian (b)(a) Advanced Materials Laboratory, National Institute forMaterials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044,
Japan; (b) School of Physics, Monash University, Clayton,
Melbourne, Victoria, Australia, 3800.
Email: IZUMI.Fujio@nims.go.jp
WWW: http://homepage.mac.com/fujioizumi/
Despite the availability of many structure-drawing
programs, cross-platform free software to visualize both
crystal and electronic structures in three dimensions are
relatively few. We should understand structural details andspace distribution of various physical quantities not twodimensionally but three-dimensionally. No whole picture of
the complex space distribution is obtainable from contour
maps that are often plotted.
To improve such a situation, we developed our own
softwarepackage
VENUS(Visualization
ofElectron/NUclear densities and Structures). We designed,from the ground up, two graphics programs taking fulladvantage of the OpenGL technology. These two bear thebell in three-dimensional (3D) visualization, rendering, andmanipulation of crystal structures and electron/nuclear
densities determined not only by X-ray/neutron diffraction
but also by electronic-structure calculations. With VENUS,
visualization of electrostatic potentials and wave functions
calculated with part of these programs is also possible.

PRIMA is a MEM analysis program to calculate electron
densities from X-ray diffraction data and nuclear densities
from neutron diffraction data [1]. It was designed with
MEM-based Pattern Fitting (MPF) [1–3] in mind, as can beinferred from its name. ALBA is a program for the
Maximum-Entropy Patterson (MEP) method [4], whereby
Patterson functions in the unit cell can be determined fromobserved integrated intensities resulting from Le Bailanalysis [5].
The VENUS package is distributed free of charge on a Website http://homepage.mac.com/fujioizumi/ .

2. VICSVICS can read in 23 kinds of crystal data files such as CIF,
PDB, and ICSD. Users of a multi-purpose pattern-fitting
system RIETAN-2000 [6] will be pleased to learn that
VICS can read and write standard input files, *.ins, of
RIETAN-2000. After Rietveld analysis using RIETAN2000, it updates lattice and structure parameters in an input
file, *.vcs, with the VICS format if *.vcs shares the same
folder with *.ins.
Crystal structures are represented by ball-and-stick, spacefilling, polyhedral, wireframe, stick, dot-surface, andthermal-ellipsoid models. Ball-and-stick and stick models
may be enclosed in dot-surface spheres of van der Waals
radii. With translucent coordination polyhedra, atoms andbonds inside them are visible. Needless to say, VICS
expresses anisotropic thermal motion by 3D graphics (Fig.
1) whereas ORTEP-III [7] has no 3D-graphics capability.

Further, VENUS includes two programs for MaximumEntropy Methods (MEM). They allow us to determine
electron/nuclear densities and Patterson functions, which
are readily visualized as described above.

1. Four components of VENUS
The VENUS package comprises four independent
programs:
VICS: VIsualization of Crystal Structures
VEND: Visualization of Electron/Nuclear Densities
PRIMA: PRactice Iterative MEM Analyses
ALBA: After Le Bail Analysis
VICS and VEND visualize crystal structures andelectron/nuclear densities, respectively. They have been
written in ANSI C for cross-platform portability, whichenabled us to port them from Microsoft Windows toUNIX/Linux. Their Graphical User Interface (GUI) wasconstructed with a combination of GLUT and GLUI. They
can output 10 kinds of image files such as TIFF, EPS(including pixel or vector data), JPEG, and JPEG 2000.
With VICS and VEND, objects are rotated, expanded,shrunken, and translated fast in three dimensions,particularly in the presence of video cards accelerating the
OpenGL API, e.g., those powered by GeForce and
RADEON graphic processing units. Four different modesof rotating objects are supported: drag, push, click, andautomatic. In addition to crystallographic and electronicstate studies and education, we will take pleasure inmanipulating 3D objects on personal computers (PC’s).

59

Fig. 1: Monoclinic unit cell of Rb2Al2B2O7 drawn with
VICS. Its structure consists of Rb+ ions, AlO4 tetrahedra,
and BO3 triangles.
VICS supports automatic atom search on the basis of bondspecifications including minimum and maximum bondlengths. Boundaries for drawing structures can be specified
in sophisticated ways similar to convoluting and reiterativeconvoluting spheres in ORTEP-III. For example, we canreadily find all the atoms in a molecule, starting from only
one atom inside it.
Selection of objects (atoms, bonds, and coordination
polyhedra) makes it possible to obtain fractional
coordinates, symmetry operations, translation vectors,
interatomic distances, bond angles, torsion angles, andinformation on coordination polyhedra including volumes,
Baur’s distortion indices [8], quadratic elongations [9],bond angle variances [9], bond valence sums [10] of central
metals, and bond lengths expected from bond valence
parameters [10] (Fig. 2).

Fig. 2: Parts of the Output Window of VICS when selecting
an MnO6 octahedron in Mn3O4 (space group I41/amd; a =5.765 Å and c = 9.442 Å) and calculating a bond valencesum. Jahn-Teller distortion in the MnO6 octahedron with
Mn3+ as the central cation can be quantitatively
understood.
Other features include (a) addition of arrows indicating
magnetic moments or positional shifts to any selected
atoms, (b) displaying X–H…Y hydrogen bonds, and (c)insertion of lattice planes whose transparency andtranslation with a mouse are possible.

3. VENDVEND can read in files storing 3D mesh data recorded with
11 formats. Files output by SCAT [11], WIEN2k [12],ABINIT [13], VASP, Gaussian, GAMESS, etc. can be
input directly or indirectly. VEND can also input 3D
density files, *.pri, created by PRIMA. In principle, VENDis capable of visualizing any physical quantities inparallelepipeds, e.g., Patterson functions determined frompowder diffraction data with ALBA and Laplacians ofelectron densities.

expressed in three different ways: smooth shading, wireframe, and dot surface. Isosurfaces for positive andnegative values, e.g., wave functions, electrostatic
potentials, and coherent-scattering lengths, bc, in neutron
diffraction, are drawn with two different colors (Fig. 3a).

Fig. 3: Isosurfaces of (a) the wave function of HOMO and(b)electrondensities
calculatedfor
the[Cd{S4Mo3(Hnta)3}2]4– ion with SCAT. Isosurface levels:(a) ±0.002a0–3/2 and (b) 0.08a0–3, where a0 denotes the Bohrradius.
VEND also has a feature of surface colorization to show theelectrostatic potential value at each point on isosurfaces.
Isosurfaces can be smoothed by spline interpolation.
Clicking a [More] button doubles pixel numbers along a, b,
and c directions whereas clicking a [Less] button half them.
One of great advantages of VEND over other visualization
tools is a feature to overlap translucent isosurfaces as well
as slices with ball-and-stick and stick models drawn with
VICS (Fig. 3a).
Drawing boundaries are specified using the numbers of unit
cells along a, b, and c directions as well as a pair of crosssections inside a unit cell. Unit-cell edges and/or crosssections are colorized according to values of physicalquantities on them to learn their distribution insideisosurfaces (Fig. 3b).
As Fig. 4 shows, we can insert up to three slices, i.e., planes
colorized with an equation relating values to colors.

M. Mizuno developed a Fortran program, contrd, to convert
binary files, F09 and F39, output by SCAT into text files
storing 3D data. He has recently written its extended
version called contrwd. With a script wien2venus.py codedby M. Arai in Python, 3D electron densities calculated with
WIEN2k are convertible into a text file, which is in turninput by VEND to display electron-density distribution inthree dimensions. In addition, Cut3D in the ABINIT
package can convert binary files output by ABINIT into
text files with the XCrySDen XSF format. VEND iscapable of reading all of these text files.
With VEND, electron/nuclear densities as well as wave
functions and electrostatic potentials obtained bymolecular-orbital methods are visualized as isosurfaces(Fig. 3), bird’s-eye views, and two-dimensional maps tolearn the nature of chemical bonds. Isosurfaces can be

60

Fig. 4: Isosurfaces of electron densities (density level:
0.7/Å3) calculated for a superconductor MgB2 by anaugmented plane wave method with WIEN2k. (100) and(002) planes, where Mg and B atoms are located, areinserted as slices.

4. PRIMA and its use in MPF (Maximumentropy methods-based Pattern Fitting)
MPF is an alternative to a classical approach, i.e., Rietveld
analysis, to structure refinement from powder diffraction
data [1–3]. Crystal structures are represented not by
structure parameters in Rietveld analysis but byelectron/nuclear densities in MPF. A fast MEM analysis
program is desired in MPF where whole-pattern fitting(w.p.f.) and MEM analysis are alternately iterated untilconvergence (refer to Fig. 1 in Ref. 2).
Before the development of PRIMA, we had been utilizing
MEED [14] for the MEM analysis of observed structure
factors, Fo, obtained from X-ray and neutron diffraction
data. After making every effort to speed up MEM analysis,
we completed our own program PRIMA. It executes MEM
analysis several-tens times faster than MEED. MEED is
now obsolete because of its sluggish speed and serious bug,where the total number of electrons (total of bc values) in
the unit cell deviates more or less during MEM iterations.
PRIMA was written from the ground up in Fortran 95,
which enables us to create storage for allocatable arrays
dynamically. It is thoroughly optimized for PC’s equippedwith Intel Pentium 4 processors and operated with
Windows. Nonlinear single-pixel approximation, full use of
space-group symmetry, and adjustment of Lagrangian
multipliers further accelerate MEM analysis. PRIMA isapplicable to MEM analysis from neutron diffraction dataof compounds containing elements whose bc’s are negative,e.g., H, Li, Ti, and Mn. The algorithm of MEM in PRIMA
is described in a document PRIMA.pdf in the archive file of
VENUS.
PRIMA makes it easier to modify a structural model during
Rietveld analysis. In a user input file, *.ins, set NMODE at
0 and NMEM at 1, and input various parameters, e.g.,numbers of pixels along a, b, and c axes, for MEM analysis.
Then, execute Rietveld analysis with RIETAN-2000 [6] tocreate a MEM data set file, *.fos. Fo(Rietveld) data, viz.,|Fo|’s and phases, recorded in this file are analyzed by
PRIMA, which creates a 3D density file, *.pri, and a
feedback data file, *.fba, storing structure factors,
Fc(MEM)’s, obtained by the MEM analysis. VEND serves
to input *.pri to visualize 3D electron/nuclear-density
distribution. By linking RIETAN-2000 with VENUS insuch a manner, the structural model may be rebuilt after
close checking of the density image, if necessary (so-called
MEM/Rietveld method [15]).
MEM gives only nonnegative electron densities (X-ray
diffraction), estimates Fc(MEM)’s for reflections whose
intensities have not been measured, and improve
Fc(MEM)’s for overlapped reflections. Thanks to theseadvantages of MEM, it affords much clearer density
distribution with high S/N ratios than Fourier synthesis
from Fo(Rietveld) data. Thus, we now regard PRIMA as amust-have item for Rietveld analysis using RIETAN-2000.
The MEM/Rietveld method is a halfway approach todetermination of electron/nuclear densities from Xray/neutron powder diffraction data because the61

Fo(Rietveld)’s are more or less biased toward the structuralmodel in the Rietveld analysis. For this purpose, MPF is far
superior to the MEM/Rietveld method.
Nothing is so difficult as MPF. At first, w.p.f. is carried out
from the Fc(MEM) data in *.fba. Simply set NMODE at 2
and NMEM at 1 in *.ins, and then run RIETAN-2000. Notethat all the structure parameters in *.ins must have been
updated on the analysis of X-ray diffraction data because
contributions of anomalous scattering to structure factors
need to be calculated from them. On repartition of observed
diffraction intensities after w.p.f., the improvement ofstructure factors for the overlapped reflections effectively
reduces the bias toward the structural model in the Rietveld
analysis. Fo(w.p.f.) data in the resultant file, *.fos, areanalyzed by PRIMA to get *.fba as well as *.pri.
In such a way, w.p.f. and MEM analysis are alternately
repeated until R factors (usually Rwp) in the former nolonger decrease (REMEDY cycles). The bias to thestructural model reduces with increasing number of cycles.
Throughout the REMEDY cycles, the total number ofelectrons (X-ray diffraction) or the total of bc values(neutron diffraction) in the unit cell is fixed at that
evaluated from the chemical formula and Z. Thus,
electron/nuclear-density distribution affording the best fit tothe observed diffraction pattern can be determined by MPF.

5. Application of MPF to a superconducting
Co oxide hydrate
Takada et al. [16] prepared a layered compound
Na0.343(H3O)0.237CoO2·1.19H2O (space group: P63/mmc; a =2.8114 Å and c = 11.2111 Å) via soft-chemical processing
and discovered that it is a superconductor with a Tc of 5 K.
Intercalation of H3O+ ions was overlooked at first but
evidenced later by Raman spectroscopy [17]. This Co oxide
has aroused interest widely because it is the firstsuperconductor where first-row transition metal and oxygen
atoms form layers. It is interesting to note that the host in
this compound is a famous thermoelectric material
NaxCoO2.
To elucidate the arrangement of the guests (H2O, H3O+, andNa+) sandwiched between two CoO2 layers, MPF analysis
from synchrotron X-ray powder diffraction data with the
combination of RIETAN-2000–PRIMA and 3D
visualization with VEND were very effective [17]. Because
MEM is, per se, model-free, we could successfully findsites occupied by the guests, getting rid of any
preconceived ideas. Fortunately, this noteworthy structurerefinement was the first application of PRIMA to a novel
material.
Figure 5 illustrates isosurfaces drawn with VEND forelectron densities in three unit cells. Highly covalent Co–O
bonds are clearly visible. In Rietveld analysis preceding
MPF, we assumed that H3O+ and Na+ ions statisticallyoccupy M1 (2/3, 1/3, 1/4) and M2 (0, 0, 0.2413) sites.
Because M2 is slightly displaced from the ideal 2b site (0,0, 1/4), isosurfaces corresponding to M2 atoms areelongated along the c axis. H2O molecules are disordered
on z ≈ 0.17 and z ≈ 0.33 planes, encompassing the M1 andM2 sites.

initial structural models
relatively heavy atoms.

forcompounds

containing

Fig. 5: Electron-density distribution (density level: 1 Å–3)
determined by MPF from synchrotron X-ray powder
diffraction data of Na0.343(H3O)0.237CoO2·1.19H2O.
Furthermore, MPF has successfully been used in otherstudies including dynamic disordering of Cu+ ions in the
superionic conductor Rb4Cu16I7.2Cl12.8 [3, 18], theconduction path and disorder in the oxide-ion conductor(La0.8Sr0.2)(Ga0.8Mg0.15Co0.05)O2.8 [19], and the migration
path of Li+ ions in the Li-ion conductor La0.62Li0.16TiO3[20].

6. ALBA
ALBA is a Fortran 95 program for the MEP analysis of|Fo|2’s estimated by the Le Bail method [5] from powder
diffraction data and determined from single-crystal
diffraction data. The name of the program originates fromthe most significant feature of the program; that is, MEP
analysis is carried out After Le Bail Analysis using
RIETAN-2000.
Only one program for MEP analysis from |Fo|’s obtained by
the Pawley method has hitherto been developed [4]. To ourknowledge, no MEP analysis program has yet been
distributed on the Web. We, therefore, built a powerful
MEM engine into ALBA, making alterations to that of
PRIMA. Thus, ultra-fast MEP analysis is possible with
ALBA. The algorithm of the MEP method in ALBA is
described in a document ALBA_manual.pdf in the archive
file of VENUS.
Integrated intensities of overlapped reflections in powder
diffraction data are, more or less, improved by thesophisticated MEP method, which is favorable for ab initio
structure analysis from powder diffraction data.
ALBA is used in combination with RIETAN-2000 [6] or
EXPO2004 [21] for ab initio structure analysis frompowder diffraction data by a direct method (Fig. 6). Such a
collaborative analysis is particularly effective for deriving

62

Fig. 6: Flow chart of ab initio structure analysis withRIETAN-2000—EXPO2004—VENUS
ALBA outputs a binary file, *.pri, storing 3D Patterson
functions, which are, in turn, visualized with VEND (refer
to Sect. 3). The resulting 3D images in the unit cell servefor construction of an initial structural model by the heavyatom method. However, the direct method is preferred tothe heavy-atom method because the number of experts inthe latter is decreasing more and more.
Most Rietveld-analysis programs have the feature of Le
Bail analysis because of the ease with which it can be
implemented in this type of software. ALBA allows us to
improve |Fo|’s of overlapped reflections, adding value tothem.
Ikeda and Itabashi [22] have recently determined thestructure of a new zeolite RMA-3 from X-ray powder
diffraction data measured with Cu Kα1 radiation. Integrated
intensities resulting from Le Bail analysis with RIETAN2000 were improved with ALBA and analyzed by the direct
method using EXPO to give an initial structure model.
Subsequent Rietveld and MPF analyses based on this model
revealed a novel framework topology containing two eightmembered ring pore-openings with dimensions of 4.9 ×
0.37 Å and 3.4 × 3.8 Å.

7. Concluding remarks
The development of VENUS was motivated by a desire topresent the poor with the advanced graphics software;neither expensive graphics workstations nor commercial
programs are now necessary for 3D visualization. As
described above, VENUS has superior features comparedwith existing commercial software. VENUS will contributeto a wide variety of studies as a tool for understanding the
crystal and electronic structures of materials three-dimensionally to enhance the creativity of researchers.
VENUS may be able to prevent ‘phase separation’ between
experimental and theoretical approaches. Because VENUS
is free software, it is ideal for education of crystal andelectronic structures for various compounds.
Now, the GUI in GLUT and GLUI is rather old-fashioned
because none of them have been updated for quite a longtime. K. Momma and one of the authors (F.I.) have beendeveloping successors to VICS and VEND, using
wxWidgets as a C++ GUI framework. The new software
has tabbed multiwindow browsing as the most pronounced
feature. A β version of the structure-drawing program,
VICS-II,isavailablefordownloadon
http://www.geocities.jp/kmo_mma/crystal/en/vics.html.
This next-generation 3D visualization software will bereported elsewhere.

Acknowledgment
We wish to thank H. Ohki of Shinshu University and K.
Momma of Tohoku University for their assistance inimproving VENUS.
References[1] F. Izumi and R. A. Dilanian, “Recent Research
Developments in Physics,” Vol. 3, Part II, Transworld
Res. Network, Trivandrum (2002), pp. 699–726.
[2] F. Izumi and T. Ikeda, Comm. Powder Diffr., IUCr
Newslett., No. 26, 7 (2001).
[3] F. Izumi, Solid State Ionics, 172, 1 (2004).
[4] W. I. F. David, J. Appl. Crystallogr., 20, 316 (1987).
[5] A. Le Bail et al., Mater. Res. Bull., 23, 447 (1988).
[6] F. Izumi and T. Ikeda, Mater. Sci. Forum, 321–324,
198 (2000).
[7] M. N. Burnett and C. K. Johnson, Oak Ridge Natl.
Lab. Report ORNL-6895 (1996).
[8] W. H. Baur, Acta Crystallogr., Sect. B, 30, 1195
(1974).
[9] K. Robinson et al., Science, 172, 567 (1971).
[10] I. D. Brown and D. Altermatt, Acta Crystallogr.,
Sect. B, 41, 244 (1985).
[11] H. Adachi et al., J. Phys. Soc. Jpn., 45, 875 (1978).
[12] P. Blaha et al., “WIEN2k, an Augmented Plane
Wave + Local Orbitals Program for Calculating Crystal
Properties,” ed. by K. Schwarz, Tech. Univ. Wien
(2001).
[13] X. Gonze et al., Comput. Mater. Sci., 25, 478(2002).
[14] S. Kumazawa et al., J. Appl. Crystallogr., 26, 453(1993).
[15] M. Takata et al., Z. Kristallogr., 216, 71 (2001).
[16] K. Takada et al., Nature, 422, 53 (2003).
[17] K. Takada et al., J. Mater. Chem., 14, 1448 (2004).
[18] K. Oikawa et al., Mater. Sci. Forum, 443–444, 337(2004).
[19] M. Yashima et al., Chem. Phys. Lett., 380, 391(2003).
[20] M. Yashima et al., J. Am. Chem. Soc., 127, 3491
(2005).
[21] A. Altomare et al., J. Appl. Crystallogr., 37, 1025
(2004).
[22] T. Ikeda and K. Itabashi, Chem. Commun., 2005,
2753.

63

Anyone who is interested in or
currently using powder X-ray,
especially if you have notreceived formal training in Xray powder diffraction, should
consider attending. This
includes students, laboratory
technicians and scientists who
use powder X-ray diffraction as atool for wider research reasons.

Sample preparation, datacollection considerations
and phase ID using powder
X-ray diffraction
Introduction to Powder
ProfileRefinement withGSAS

The first two days concentrates on
powder diffraction and Rietveld
analysis using GSAS. The third day
focuses on PDF (Pair Distribution
Function)/Total Scattering analysis ofamorphous, disordered, poorly
crystalline or nano-crystalline
materials.

Synchrotron Experiments
Why and when to use
neutron powder diffraction
Freely available powder
diffraction Software
Measuring total scattering
X-ray and neutron data:
where and how?

Chair:
Professor Bruce Torrie,
University of Waterloo, Canada

What to do with your PDF:
Modeling of disorderedstructures

Speakers:
Dr Robert Von Dreele,
Argonne National Laboratory, USA
Dr Angus Wilkinson,
Georgia Institute of Technology, USA
Dr Thomas Proffen
Los Alamos National Lab., USA
Dr Ian Swainson, Lachlan Cranswick
National Research Council Canada
Check out the CPDW webpage forfurther information on the workshop
and information about the Waterloo
area for accompanying persons orcontact Lachlan Cranswick atlachlan.cranswick@nrc.gc.ca

Students:
Cdn $150
Academics and not-for-profit:
Cdn $180
Commercial and Industrial:
Cdn $210
Registration payment must be
received by 14th April 2005.

64

Reduced-registration
bursaries for students
outside Ontario and Quebec
are available, thanks to the
Canadian Institute for
Neutron Scattering andUniversity of Waterloo. As
well as similar bursaries for
US based students, thanks to
the Lujan Neutron
Scattering Center.

Preliminary Announcement'Under the Bonnet'

Powder Diffraction Software Workshop

8:50am to 6:00pm, Friday, 1st September 2006

Uni Mail, University of Geneva, Geneva, Switzerland(just prior, and in the same venue, as the EPDIC 10 European powder diffraction conference)
http://www.pa.msu.edu/cmp/billinge-group/Geneva2006/

Use Software for Powder diffraction? Want to know which program to use for a particular application? Want to hear fromthe developers what great engine they have got hiding under that pretty GUI? Get direct feedback to your questions fromthe Developers themselves. Contribute to the discussion of code extensions and the next generation.

School Organisers

Tentative Program Includes:

Simon Billinge (Michigan State University, USA)
Lachlan Cranswick (NRC Chalk River, Canada)

BGMN: unter der Motorhaube
BRASS: unter der Motorhaube
DANSE: under the hood
DASH: under the bonnet
Derivative Difference Minimization: под капотом
EXPO: sotto il cappuccio
Fox: sous le capot
Fullprof and CrysFML: debajo de la cap
GSAS: Under the hood
Jana: pod kapotou
MAUD: sotto il cappuccio
Model-free Aberration Correction: Under the bonnet
PDFFIT and Discus: unter der Motorhaube
PSSP: under the hood
RMCProfile: under the bonnet
TOPAS: under the bonnet
XND: sous le capot

Workshop Aims
To have powder diffraction software developers
present the advanced features in their indexing,
solution and refinement programs. To help
participants answer the following questions about
the programs: what does it do? why/when should I
use it? how/where can I use/get it? what is under thebonnet?

Confirmed Presenters
As of mid November 2005, the following speakers
have been confirmed:• Michael Aivazis (USA)• Joerg Bergmann (Germany)• Johannes Birkenstock (Germany)• Bill David (UK)• Vincent Favre-Nicolin (France)• Carmelo Giacovazzo (Italy)• Vladimir Kogan (Netherlands)• Vaclav Petricek (Czech Republic)• Thomas Proffen (USA)• Juan Rodriguez-Carvajal (France)• Leonid Solovyov (Russia)• Matt Tucker (UK)• Robert von Dreele (USA)Roundtable Discussion chaired by Robert McGreevy(ISIS, UK) on: "Where does algorithm development
have to go for indexing, solution and refinement in
powder diffraction"

Registration
Registration for the workshop is done via the EPDIC
meeting registration form. Information about the
EPDIC conference is on the web at:
http://www.sgk-sscr.ch/EPDIC10/EPDIC10.html

65

News from theInternational Centre for Diffraction Data
(ICDD)
12 Campus Boulevard
Newtown Square, PA 19073-3273, U.S.A.
Phone: +610.325.9814
Fax: +610.325.9823

www.icdd.com
www.dxcicdd.com
E-mail: info@icdd.com

Join us for PPXRD-5!
The 5th Pharmaceutical Powder
X-ray Diffraction Symposium brings XRD training to theheart of the U.S.A.’s pharmaceutical industry.
ICDD once again is proud to host XRD training for thepharmaceutical industry at the 5th Pharmaceutical Powder
X-ray Diffraction Symposium, 14-16 February 2006 inSomerset, New Jersey, U.S.A. This symposium is the ideal
training for process, analytical and discovery chemists, aswell as pre-formulation and formulation scientists. Invited
talks and contributed papers complete the program in areas
such as: X-rays in Drug R&D, Formulation, Product Development, Drug Delivery and Polymorph & Salt Screening,
Patent and Regulatory Issues, Process Analytical Technology, Complementary Techniques, XRPD Structural
Techniques and New Frontiers for XRD in Pharmaceutical
R&D. For even more invaluable XRD training, attendees
are invited to participate in an optional workshop on 13
February 2006. Covering everything from basic theories
and concepts to applications and case studies, this workshop entitled, “Characterization of Pharmaceutical Solids:
Crystal Studies and XRD Applications” offers hands-on
training and a forum for round table discussions. Attendees
will also have the opportunity to speak with representatives
from the industry’s leading providers of analytical instrumentation and services during the exhibition. For more
information on how to submit an abstract, attend thesymposium, or participate in the exhibition, contact Leah
Mooney at ppxrd@icdd.com.

55th Annual
Denver X-ray ConferenceContinuing its tradition of excellence,the 2006 Annual Denver X-ray
Conference will be held 7-11 August at the Denver
Marriott Tech Center Hotel, Denver, Colorado, U.S.A.
Presenting both workshops and technical sessions, theconference offers “something for everyone”—from
beginners to experts.
The Denver X-ray Conference, now in its 55th year,
offers a forum for the presentation of state-of-the-art
techniques and indications of future developments in
X-ray analysis. This year, the Plenary Session promises
to be both interesting and insightful, as it focuses on“Medical Applications of X-ray Analysis.” Following the
Plenary session, attendees to the world's largest X-ray
conference will choose from 16 broad-range sessions.
Workshops are also conducted during conference week
by experts who provide training and education on many
practical applications of XRF and XRD techniques forthe study of materials. Designed to help attendees withlittle or many years of experience, our workshops willoffer suggestions and advice geared at helping attendees
solve some of their most difficult problems. Please visit
www.dxcicdd.com to review the program.
Looking to purchase software, instrumentation, or related
services? The conference also provides a venue to visit
with the major vendors of X-ray analysis equipment andservices during the exhibition. Exhibits are held concurrently with the workshops and sessions.
If you’re working in an X-ray analysis field, make the Denver X-ray Conference your meeting of choice! It will provide
you with the opportunity to learn the latest and greatest
advancements, network with fellow scientists, expand yourknowledge, and shop for your X-ray analysis needs.
Please join us in 2006 at the Denver Marriott Tech
Center Hotel.

Product NewsThe ICDD is pleased to announce the latest
release of PDF-4/Organics. PDF-4/Organics 2006 is
designed for rapid material identification with 286,464
entries. The database is produced through collaboration
between the International Centre for Diffraction Data
(ICDD) and Cambridge Crystallographic Data Centre(CCDC). It includes indexes, display, query and sorting
capabilities that allow the user to data mine the databasecorrelating diffraction, bibliographic, unit cell and physicalproperty data. This database is a practical, results-oriented
product that combines the drug active compounds calculated from the Cambridge Structural Database (CSD)with the polymers (including starches and celluloses),
excipients and pharmaceuticals in the ICDD Powder
Diffraction File.

Further Information
To learn more about the ICDD, its products andservices, please visit our web sites:
www.icdd.com and www.dxcicdd.com.

ICDD, the ICDD logo and PDF are registered in the U.S. Patent and Trademark Office.
Powder Diffraction File and Denver X-ray Conference are trademarks of the JCPDS—International Centre for Diffraction Data.

66

What's On

19-21 September 2005
SES-III - Synchrotron Environmental Science III. Upton,
NY, USA
http://www.cems.stonybrook.edu/ses-iii/index.html

5-6 December 2005
WINS2005 - Workshop on Inelastic Neutron Spectrometers 2005. Cairns, Australia..
http://www.iucr.org/cww-top/mtg.wins2005.html

22-24 September 2005
7th International Meeting on Single Nucleotide Polymorphism and Complex Genome Analysis , Hinckley,
Leicestershire, UK
http://snp2005.nci.nih.gov

9-13 January 2006
Crystal Growth and Characterisation of Advanced
Materials - an international Workshop. Crystal GrowthCentre, Anna University, Chennai, India
http://www.iucr.org/cww-top/mtg.chennai.jpg

3-7 October 2005
4th NCCR Practical Course - Synchrotron Data Acquisition Techniques in Macromolecular Crystallography.
Swiss Light Source, Villigen, Switzerland
http://www.structuralbiology.unizh.ch/course05.asp

14-16 February 2006
PPXRD-5 - The 5th Pharmaceutical Powder X-ray Diffraction Symposium. Somerset, New Jersey, USA
http://www.icdd.com/ppxrd
20-23 February 2006
RX 2006 - 6th Colloquium on X-Rays and Matter. Limoges, France
http://www.iucr.org/cww-top/mtg.rx2006.pdf

6-7 October 2005
Watching the Action: Powder Diffraction at nonambient conditions. Max-Planck-Institute for Solid State
Research, Stuttgart, Germany
http://www.fkf.mpg.de/xray

2-3 March 2006.
Diffraction de poudres - Laboratoire Léon Brillouin,
France.
http://www-llb.cea.fr/SOLEILLLB/DiffractionPoudres/diffractionpoudres.html

10-14 October 2005
Autumn School - Application of Neutron and Synchrotron Radiation in Engineering Materials Science. Hamburg, Germany
http://www.tu-berlin.de/~pnam
17-19 October 2005
3rd MECA SENS Conference on Stress Evaluation by
Neutron and Synchrotron X-Ray Radiation. Bishop's
Lodge Resort, Santa Fe, New Mexico, USA
http://www.lansce.lanl.gov/mecasens2005

March 6-8 and October 23-25, 2006
Basic and Advanced X-Ray Powder Diffraction:
Pharmaceutical Applications,Part I: Basic crystallography and its application in X-ray powder diffractometry;sample preparation and measurement strategies. Stamford,
Connecticut, US
http://www.assainternational.com/

25-27 October 2005
MM4MX Molecular Modelling for Macromolecular
Crystallographers - a MAXINF2 sponsored workshop.
Diamond Light Source, Oxfordshire, UK
http://www.diamond.ac.uk/News/LatestEvents/mx_worksh
op_2005.htm

March 9-10 and October 26-27 2006
Basic and Advanced X-Ray Powder Diffraction:
Pharmaceutical Applications, Part II: Basic and advanced structure-solving solutions from X-ray powder
patterns. Stamford, Connecticut, US
http://www.assainternational.com/

30 October 2005
Recent Advances in Phasing Methods for HighThroughput Protein Structure Determination an International Workshop. Peking University, Beijing, China..
http://www.ccs.pku.edu.cn/wp2005

April 10.-13 2006
Crystallographic Textures-basic course
Prof. H.-G. Brokmeier-Texturschule- Agricolastraße 6
IWW-TU Clausthal
38678 Clausthal-Zellerfeld, Germany

3-5 November 2005
Pittsburgh Diffraction Conference '05 - The 63rd edition. Argonne National Laboratory, Argonne, IL, USA
http://www.pittdifsoc.org/63rd_PDS_announce.htm

28 May - 3 June 2006
SRI2006 - Ninth International Conference on Synchrotron
Radiation Instrumentation. Daegu, Exco, Korea
http://sri2006.postech.ac.kr/

27 November - 2 December 2005
International Conference on Neutron Scattering 2005,
Sydney, Australia.
http://www.sct.gu.edu.au/icns2005

9-13 July 2006
SAS2006 - The XIII-th International Conference on SmallAngle Scattering. Kyoto, Japan
http://www2.scphys.kyoto-u.ac.jp/sas2006/index.html

67http://www.embl-hamburg.de/workshops/2005/htx/

22-27 July 2006
ACA 2006 - The American Crystallographic Association
Annual Meeting. Honolulu, Hawaii, USA
http://www.hwi.buffalo.edu/aca/

18-19 November 2006
Theoretical Crystallography and Materials Science Satellite Conference of the AsCA'06 / CrSJ meeting. Tsukuba, Japan
http://www.lcm3b.uhp-nancy.fr/mathcryst/asca2006.htm

28 August - 2 September 2006
Analyse structurale par diffraction des rayons X,
cristallographie sous perturbation Summer School Ecole thematique. Nancy, France
http://www.lcm3b.uhp-nancy.fr/nancy2006/

7-17 June 2007
Engineering of Crystalline Materials Properties: Stateof-the-Art in Modelling, Design, and Applications, the39th crystallographic course at the Ettore Majorana Centre, Erice
http://www.crystalerice.org/futuremeet.htm

1-4 September 2006
EPDIC-10 - European Powder Diffraction Conference,
University of Geneva, Geneva, Switzerland.
http://www.sgk-sscr.ch/EPDIC10/EPDIC10.html
13-15 September 2006
ECRS 7 - The 7th European Conference on ResidualStresses. Berlin, Germany
http://www.ecrs7.de/
17 November 2006
Protein crystallization: Present and future - Crystallisation Workshop . EMBL Hamburg Outstation, Hamburg,
Germany

How to receive the IUCr CPD Newsletter
The best and fastest way to receive the CPD Newsletter is to download it in electronic format, as a .pdf file, from the CPD
web-site.
If you wish to be added to the mailing list for the Newsletter of the IUCr Commission on Powder Diffraction or have changed
address, please contact the Chairman:
Bill David (bill.david@rl.ac.uk).

Call for contributions to the next CPD Newsletter (No 33)
The next issue of the CPD Newsletter will be edited by Miguel Delgado, to appear in June 2006. Miguel will greatly appreciate
contributions from readers on matters of interest to the powder diffraction community, e.g. meeting reports, future meetings,
developments in instruments, techniques, and news of general interest. Please contact him for sending articles and suggestions.
Software developments can be directly addressed to Lachlan Cranswick or to the Editor of Newsletter No 33.
Dr Lachlan M. D. Cranswick
Neutron Program for Materials Research, National
Research Council Canada
Building 459, Chalk River Laboratories, Chalk River ON,
Canada, K0J 1J0
Phone: +1 (613) 584-8811 ext 3719 ; C2: ext 3039
Fax: +1 (613) 584-4040
E-mail: lachlan.cranswick@nrc.gc.ca
http://neutron.nrc.gc.ca/

Prof. Miguel Delgado
Laboratorio de Cristalografía, Departamento de Química,
Facultad de Ciencias, La Hechicera.
Universidad de Los Andes, Mérida 5101
Venezuela.
Telephone: +58 274 240 13 72
e-mail: migueld@ula.ve

68