Application Report
DLPA072 – September 2016

Signal Chain Performance Optimizations in the TI DLP®
Technology-Based Spectrometer
Pedro Gelabert
ABSTRACT
On a TI DLP® technology-based spectrometer, the individual elements of the signal chain combine
together to determine the overall performance of the system. This application report describes the design
considerations for all the components of the DLP technology-based spectrometer signal chain and theeffect of their interactions on the overall performance of the system. The DLP NIRscan™ and DLPNIRscan Nano evaluation modules (EVM) are used as examples to discuss the tradeoff and optimizationof spectrometer components. For an overview of spectroscopy and how DLP technology compares toexisting technologies, refer to the DLP Technology for Spectroscopy white paper (DLPA048).

1
2
3

Contents
Introduction ................................................................................................................... 2
Signal Chain Architecture of a TI DLP Technology-Based Spectrometer ........................................... 2
Design Factors ............................................................................................................... 4
List of Figures

1

DLP NIRscan Nano Optical Architecture ................................................................................. 2

2

Typical Signal Chain of a DLP Technology-Based Spectrometer ..................................................... 3

3

Top Cut-away View of DLP NIRscan Nano Reflective Illumination Module ......................................... 44

Startup Response of ILT 1088-1 Lamp in DLP NIRscan Nano ........................................................ 55

DLP NIRscan Nano Lamp Driver .......................................................................................... 6

6

DLP NIRscan Lamp Driver ................................................................................................. 77

Photodetector Equivalent Circuit........................................................................................... 88

DLP NIRscan TEC Driver ................................................................................................. 10

9

Detector Analog Signal Chain ............................................................................................ 11
List of Tables

1

Lamp Options for DLP NIRscan Nano .................................................................................... 5

2

Hamamatsu 1mm InGaAs Non-cooled Photodetector Characteristics ............................................... 8

3

Hamamatsu 2mm InGaAs Photodetector Characteristics .............................................................. 9

4

DLP NIRscan Nano Typical Detector Signal at 10 nm Resolution Scan (Vr = 2.5V) .............................. 14

5

DLP NIRscan Nano Typical Detector Signal for 10nm Resolution Scan (Vr = 1V) ................................ 14

6

DLP NIRscan Nano Typical Maximum ADC Input Voltage with PGA Setting...................................... 157

ADC Options From Texas Instruments for TI DLP Technology-based Spectrometers ........................... 16

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Introduction

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Introduction
A near-infrared (NIR) spectrometer measures the light absorption of a substance using InGaAs
photodiodes that generate a small amount of current when a photon impacts the P-N junction of thesemiconductor. This current is digitized through a transimpedance amplifier and the absorption spectrum
is computed. The following sections discuss the design considerations and noise sources in the signal
chain of the components of a TI DLP technology-based spectrometer from illumination to the digitization of
the photodiode signal.

2

Signal Chain Architecture of a TI DLP Technology-Based Spectrometer
In a TI DLP technology-based post-dispersive spectrometer, a sample is illuminated and the reflected lightis collected. The diffusely reflected light from the sample is gathered by the collection lens and focused
into the optical engine through the input slit. The light that passes through the slit is collimated, lowpass
filtered, and then strikes a reflective grating. This grating disperses the light into its constituent
wavelengths. The focusing lenses form a separate image of the slit for each wavelength at the digital
micromirror device (DMD). Copies of this slit image are spread horizontally across the DMD at different
wavelengths. A specific implementation of this optical architecture is in the DLP NIRscan Nano EVM.
Figure 1 shows a cross section and interior view of this optical architecture. Refer to Texas Instruments
DLP NIRscan Nano Evaluation Module (EVM) Optical Design Considerations for more information on key
optical parameters of the lenses, filter, grating, and slit, and their interdependence on system performanceand size.

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Figure 1. DLP NIRscan Nano Optical Architecture2

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In this optical architecture, the light energy from the grating is directed through the collection lenses into asingle InGaAs detector when specific DMD columns are selected as "on". The width of the DMD columns
selected as "on" determines the amount of light directed to the photodetector, as well as the resolution of
the system. The collection lenses gather and concentrate the light energy onto the single point InGaAs
photodetector. All other DMD columns selected as "off," divert the unselected wavelengths away from thephotodetector optical path so as not to interfere with the measurement of the selected wavelength. The
signal at the photodetector is amplified with a transimpedance amplifier and converted to a digital value
through an analog-to-digital converter (ADC). Figure 2 shows a block diagram of the components of thissignal chain components in a typical post-dispersive TI DLP technology-based spectrometer. Theinteractions and design parameters of the components in this signal chain combine together to determine
the overall performance of the system. For a high signal-to-noise ratio (SNR), the designer must:• Maximize the intensity of the illumination source while minimizing its noise,• Maximize the size of the slit to maximize the optical power of the illumination through it,• Minimize photodetector and analog noise while matching ADC dynamic range to the photodetector
signal range.

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54'&6%$72-'&32+
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Figure 2. Typical Signal Chain of a DLP Technology-Based Spectrometer
The illumination module generates the maximum amount of light that can be absorbed by the sample. The
intensity and stability of ight determines the maximum signal and initial noise of the system. On a reflective
module, the light reflected by the sample is collected and passed through a slit. The slit width is chosen tobalance wavelength resolution with SNR depending on the desired specifications of the system. The DMD
is used to select specific wavelengths and direct them to a single point photodetector. The DMD
accomplishes the wavelength selection through a set of patterns applied to the micromirrors. The
sequence of patterns forms a scan configuration. Thus, the slit width, DMD array, scan configuration, andDMD column width influence the resolution and maximum amount of light on the photodetector.
Once the light is converted into an electrical signal (current) at the photodetector, the transimpedance
amplifier converts the current signal into a voltage.. The gain and architecture of this transimpedance
amplifier needs to match the maximum signal in the dynamic range of the ADC. Finally, the ADC converts
the voltage into a digital representation of the signal. The ADC resolution and sampling rate impact the
final accuracy of the system.

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Design Factors

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Design Factors
To optimize the signal chain, the following factors must be considered:• System resolution• Scan measurement time
• Maximum illumination power and stability• Slit width• Photodetector characteristics• DMD array size, scan mode, and pattern width• Maximum photodiode signal when exposed to light• Transimpedance amplifier bandwidth and gain to match the ADC dynamic range• ADC resolution, sample rate, and voltage references

3.1

Illumination
Tungsten halogen lamps are well suited as spectrometer light sources due to their broadband infrared
radiation. The DLP NIRscan's transmissive illumination module includes an ILT L8008 lens-end lamp anda lamp driver that provides a constant current of 750 mA at 5V. The light output of this lamp is sufficientfor cuvettes with path lengths of 2-13 mm.
Alternatively, the DLP NIRscan Nano's reflective illumination module includes two ILT 1088-1 lens-end
lamps and a lamp driver that provides a constant current of 280 mA at 5 V. These lens-end lamps focus
the light beam at about 3 mm away from the lamps and create a spot size that covers the sapphire
sample window, as illustrated in Figure 3.

Figure 3. Top Cut-away View of DLP NIRscan Nano Reflective Illumination Module

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Depending on sample preparation and presentation, some highly absorbent samples in the NIR region
might not reflect sufficient light back into the system. For example, a sample with high water content canshow high NIR absorption. For these highly absorbent samples, the DLP NIRscan Nano allows theflexibility of replacing the illumination module with a modified illumination module that includes lamps
providing greater light output. Larger lamps would require changes to the lamp driver, illumination module
optics, and chassis. Table 1 provides a few examples of lamp options along with the size, power
consumption, filament life hours, and focal distance from manufacturer data sheets. Note that lamps withreflectors are much larger in volume, but will direct light that is typically absorbed in the illumination
chassis into the sample.
Table 1. Lamp Options for DLP NIRscan Nano
Lamp Model

Quantity

Power

Size

Filament Life Hours

Focal DistanceILT 1088-1

2

2 x 0.14A @ 5V = 1.4W

3.18 x 6.35 mm

18,0003 mm

ILT 1088-1

4

4 x 0.14A @ 5V = 2.8W

3.18 x 6.35 mm

18,0003 mm

ILT MR4-188-1

1

1A @ 5V = 5W

12.7 x 12.7 mm

10,00012.7 mm

ILT MR4E-188

1

1A @ 5V = 5W

12.6 x 16.5 mm

10,00012.7 mm

Welch Allyn
7103-003

1

0.97A @ 5V = 4.85W

9.5 x 16.5 mm

10,00012.7 mm

Welch Allyn
7104-003

1

0.97A @ 5V = 4.85W

12.7 x 20.3 mm

10,00012.7 mm

These lamps produce light by heating the tungsten filament with an electric current. As the filament heats
up, it acts as a variable resistance load. The initial cold filament resistance is typically around 10% of thesteady-state hot filament resistance. This resistive load can be roughly modeled as shown in Equation 1.
./!"#$% & ' !( )!* + !(

,+- 0

!
(1)

where Ri represents the initial resistance value, Rf represents the final resistance value, and τ represents
the time constant to heat up. For the DLP NIRscan Nano ILT 1088-1 lamp, the warm up response inshown in Figure 4. In this figure, Ri ≈ 5.71 Ω, Rf ≈ 35.71 Ω, τ ≈ 400 msec. To account for lot to lot
variations, lamp warm-up, and lamp driver startup, the DLP NIRscan Nano assumes a 625 msec delay
after enabling the lamps and starting a scan. On initial turn on, the cold filament is at a very low resistanceand can allow a very high peak current that is 10x or more than the rated current. This initial in-rushcurrent can reduce the lamp lifetime and affect lamp reliability. This initial in-rush of current is shown in
Figure 4. A current limit of [9800 * 1.18 V / 20 kΩ] = 578 mA is programmed into the lamp driver (OPA567)
to limit in-rush current to about 2× the rated continuous current and prolong lamp life. The current limit is
set through a 20 kΩ pull-down on the ISET pin of the OPA567.

Figure 4. Startup Response of ILT 1088-1 Lamp in DLP NIRscan Nano
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Any ripple on the lamp supply will exhibit a variation in light intensity at the detector. Due to the scanning
nature of a TI DLP technology-based spectrometer, variations in light intensity during the scan ofwavelengths will affect the overall SNR of the system. Therefore, it is necessary to wait for the lamp towarm-up and reach steady-state conditions before starting a scan. This warm-up time varies by lamp typeand lamp driver circuitry. The photodetector can be utilized to measure the lamp warm-up time bycapturing the light intensity during power-up. Moreover, as the lamp ages, the light intensity decreases. A
photodetector under the DLP NIRscan Nano provides lamp intensity readings with each scan to measurelamp degradation. These lamp intensity readings can be used to normalize the scans of a system as thelamp ages.
Figure 5 depicts the DLP NIRscan Nano lamp driver. The difference amplifier (INA213) measures thecurrent across the 100 mΩ sense resistor and amplifies this difference by 50. For two lamps with 140 mAcurrent (140 mA + 140 mA = 280 mA), the output of the INA213 is [50 * 0.1 Ω * (280 mA)] = 1.4 V. The
OPA567 compares the divided down voltage of the 5 V supply = 5 V * [3.9 kΩ/ (10 Ω + 3.9 kΩ)] = 1.4 V
with the output of INA213. This 5V supply can be driven by a high precision reference voltage device likea REF5050 series for the highest SNR at a slightly increased cost to the system. The INA213 directs the
OPA567 to supply current to the lamp if the current across the sense resistor is less than 280 mA. A 20 Ωcompensation resistance in the feedback network of the OPA567 prevents oscillations. The INA213 tends
to drive the OPA567 past the maximum current since it has a 80 kHz bandwidth while the OPA567 has a
1.2 MHz bandwidth. To minimize this effect, a high pass filter of 10 µF in the OPA567 feedback network
passes these high frequency components back to the negative input instead of being analyzed by the
INA213.

10k/
5V "
!

3.9k/

OPA567
"
!
20/

"
!

103F

100m/

INA213Figure 5. DLP NIRscan Nano Lamp Driver
Replacing the DLP NIRscan Nano lamps with one of the options in Table 1 might require changes to thelamp driver circuit in one or more of the following areas:• Current shunt monitor (INA21x), if greater than 50 gain is needed• Feedback resistor and capacitor, if different compensation is needed• Current limit to OPA567, if greater current is needed• Voltage divider, if the gain from the current monitor produces a different voltage
For example, using four ILT 1088-1 lamps would require 140 mA * 4 = 560 mA of current. The output of
the INA213 is [50 * 0.1 Ω * 560 mA] = 2.8 V. Thus, the voltage divider into the OPA567 must be changed
to a combination of 14 kΩ and 11 kΩ. Also the ISET of the OPA567 pull down must be changed to 12 kΩ
to limit the current to under 964 mA.

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Figure 6 depicts the DLP NIRscan lamp driver. Since the DLP NIRscan is a not a portable batterypowered system like the DLP NIRscan Nano, the larger and higher power consuming OPA569 replaces
OPA567. The OPA569 compares the divided down voltage of the 5 V supply = 5 V * [ 30 kΩ/ (10 Ω + 30kΩ)] = 3.75 V with the output of the INA213. Note that the 5V supply can be driven by a high precisionreference voltage device like a REF5050 series for the highest SNR at a slightly increased cost to thesystem. The output of the INA213 is [50 * 0.1 Ω * 750 mA ] = 3.75 V. Thus, the INA213 directs the
OPA569 to supply current to the lamp if the current across the sense resistor is less than 750 mA. Thisdriver does not need the feedback compensation of the DLP NIRscan Nano.

10k/
5V "
!

30k/

OPA569
"
!

"

100m/

!
INA213Figure 6. DLP NIRscan Lamp Driver

3.2

Slit Width
The input slit specifications affect both the ability to couple light into the spectrometer as well as its
spectral resolution. The slit width should be chosen to create an image width at the DMD corresponding toa desired spectral resolution, while the slit length should be large enough to illuminate the full extent of the
DMD panel, maximizing the system’s light throughput. Narrowing the slit width increases the spectral
resolution of the system, but requires a higher performance optical system to sharply image the smaller
slit to the DMD. Refer to Texas Instruments DLP NIRscan Nano Evaluation Module (EVM) Optical Design
Considerations for more information on key optical parameters and their interdependence on system
performance and size. Narrowing the slit reduces the SNR of the device since less light can be collectedfrom the sample. Refer to Flexible Trade-offs in Maximizing SNR and Resolution in TI DLP technologybased Spectrometer Systems for more detail on the impact of slit width to SNR and resolution.

3.3

DMD Array Size, Scan Mode, and Pattern Width
DMD array size determines the maximum light collection area and the resolution of the system. The
resolution of the system is dependent on the wavelength spectrum that is spread across one dimension of
the DMD (for example, width), the slit width, and the DMD pattern width. The other dimension of the DMD(for example, height) and the optical transfer function of the system determine the amount of lightcollected. The DMD pattern width sets the digital resolution of the system by defining the number ofpatterns displayed during a scan. The number of patterns corresponds to the number of wavelength points
captured across the spectral range. Decreasing the DMD pattern width leads to an increase in the digital
resolution with an oversampling of the spectrum at the expense of less light into the photodetector, andthus lower SNR. For best results, select a DMD pattern width so that the digital resolution is at least twice
the desired full width half maximum (FWHM). For example, for a 15 nm FWHM between 900 and 1700
nm, use 2 * (1700 - 900) / 15 ≥ 107 wavelength points. Refer to Flexible Trade-offs in Maximizing SNR
and Resolution in TI DLP technology-based Spectrometer Systems for more detail on the impact of DMD
pattern width to SNR and resolution.

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3.4

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Photodetector
For near-infrared (NIR) spectroscopy between 780 and 2500 nm, an InGaAs photodiode is the preferred
photodetector due to its high quantum efficiency and responsivity, particularly in the wavelength range of1100 – 2500 nm. Typical silicon photodiodes are only sensitive up to 1100 nm and are thus not suitablefor NIR spectroscopy beyond 1100 nm. In comparison, several types of InGaAs photodiodes cover the
wavelength spectrum between 900 - 2500 nm:• Standard non-cooled InGaAs photodiodes with a wavelength spectrum between 900 and 1700 nm.
• Enhanced non-cooled InGaAs photodiodes with extended sensitivity to wavelengths between 900 –1900 nm, 900 – 2100 nm, or 900 – 2600 nm.
• Standard cooled InGaAs photodiodes with a wavelength spectrum between 900 and 1670 nm.
• Enhanced cooled InGaAs photodiodes with extended sensitivity to wavelengths between 900 – 1870
nm, 900 – 2070 nm, or 900 – 2570 nm.
Cooled photodiodes include a thermoelectric cooler and temperature sensor for low noise readings. This
thermoelectric cooler needs to be driven by an external thermoelectric cooler driver circuit that monitors
the photodiode temperature. No single photodiode can efficiently cover the wide spectrum from 780 to2500 nm. Systems requiring this large coverage would need a combination of silicon and InGaAs
photodiodes.
These photodiodes have the equivalent circuit shown in Figure 7. The equivalent circuit consists of a lightdependent current source (Id), a shunt resistance (Rsh), junction capacitance (Cj), and a series resistance
(Rs).

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&'

$%

Figure 7. Photodetector Equivalent Circuit
Typically, the photodiode produces a very small current signal, but the signal will be proportional to its
photosensitive area. A large photosensitive area produces more current in response to light, at theexpense of higher terminal capacitance. The higher capacitance will result in slower response to light, or
lower bandwidth. This capacitance will also affect the feedback capacitive compensation of thetransimpedance amplifier. The photodetector also has a noise component when current is generated withno incident light. This noise component is typically referred as dark current. Thus, photodiode selection isa tradeoff between cost, wavelength range,photosensitivity, detectivity, capacitance, and dark current.
Table 2 and Table 3 show examples of the typical characteristics of Hamamatsu 1 mm and 2 mm
photodiodes, respectively. The photodiodes with “A” in the last letter of the part number are photodiodes
whose window have anti-reflective coating optimized for the 1550 nm peak. The photodiodes with "K" inthe last letter or the part number do not have an anti-reflective coating. As seen in these tables, cooled
photodiodes have the least amount of dark current, while large area detectors have greater capacitance.
Enhanced detectors offer greater wavelength spectrum range at the expense of greater dark current andcapacitance.
Table 2. Hamamatsu 1mm InGaAs Non-cooled Photodetector Characteristics

8

Part Number

Spectral Range(nm)

Photosensitivity(A/W)

Detectivity(cm*Hz1/2/W)

Capacitance(pF)

Dark Current(nA)

G12180-010A

900 – 1700

1.1

6.3 x 1012

G12181-010K

900 – 1900

55

0.8

1.1

1 x 1012

230

G12182-010K

10

900 – 2100

1.2

3.5 x 1011

230

100

G12183-010K

900 – 2600

1.3

9 x 1010

500

3000

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Table 3. Hamamatsu 2mm InGaAs Photodetector Characteristics
Part Number

Cooling

Spectral Range(nm)

Photosensitivity(A/W)

Detectivity(cm*Hz1/2/W)

Capacitance(pF)

Dark Current(nA)

G12180-020A

Non-cooled

900 – 1700

1.1

6.3 x 1012

250

1.5

G12180-120A

One-stage TEcooled

900 – 1670

1.1

4.4 x 1013

250

0.1

12

1000

50

G12181-020K

Non--cooled

900 – 1900

1.1

1 x 10G12181-120K

One-stage TEcooled

900 – 1870

1.1

5.5 x 1012

900

5

11

G12182-020K

Non-cooled

900 – 2100

1.2

3.5 x 10

1000

500

G12182-120K

One-stage TEcooled

900 – 2070

1.2

1.5 x 1012

900

50

10

G12183-020K

Non-cooled

900 – 2600

1.3

9 x 10

1800

10000

G12183-120K

One-stage TEcooled

900 – 2570

1.3

3 x 1011

1500

3000

The DLP NIRscan and DLP NIRscan Nano supports two scan modes: Column and Hadamard Scans.
Column Scan directs a single wavelength of light to the photodetector. Hadamard Scans direct multiple
combinations of wavelengths of light to the photodetector. Individual wavelengths are then retrieved
through a decoding procedure. Hadamard Scans have the advantage of directing greater signal to thedetector over a Column scan. As example, the DLP NIRscan Nano system collects the following opticalpower and current output for Column and Hadamard Scans with Reflective and Transmissive illumination
heads:• Reflective Illumination– Column Scan: (35 nW) (1.1 A/W) = 38.5 nA– Hadamard Scan: (510 nW) (1.1 A/W) = 560 nA• Transmissive Illumination– Column Scan: (525 nW) (1.1 A/W) = 577 nA– Hadamard Scan: (9 µW) (1.1 A/W) = 9.9 µA
Note that the Hamamatsu GS12180-010A is linear up to 8 mW of optical power. The extended range
photodiodes (supporting a spectral range past 1700 nm) are linear up to 2-4 mW of optical power.
3.4.1

Thermo-electric Cooler
Some photodetectors have a built-in thermo-electric cooler (TEC) to lower the dark noise. Figure 8 showsa typical TEC driver. This driver utilizes the INA330 precision amplifier to measure the thermistor from thephotodiode and drive the OPA569 up to a pre-set current limit when cooling is needed. The INA330
measures the difference in currents between the thermistor input (Rt) and the precision resistor (Rs)
inputs of the INA330. The difference is used to determine when to drive the OPA569 to cool thephotodiode. This TEC driver circuit is used in the DLP NIRscan.

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OPA340"1.5k*

2.5V "
!

10k*

!

1k*

1M*

1uF

OPA569
"
!

TEC
Vr

220k*
Vo
0.1uF

INA330 Rt

Thermistor
Rs
20k*

Figure 8. DLP NIRscan TEC Driver

3.5

Amplification
InGaAs photodiodes generate a small amount of current when a photon impacts the P-N junction of thesemiconductor. The following architectures amplify and digitize the small current of the photodiode:• Transimpedance amplifier through discrete components or an integrated photodiode and amplifier. Thisarchitecture converts the photodiode current into a voltage and then digitizes the voltage with an ADC.
The voltage is typically oversampled by the ADC to average out the noise.
• Charge integration through discrete components or a charge digitizing ADC. This architecture utilizes
capacitors for charge accumulation and then convert this charge into a digital value. The converted
digital value is dependent on the integration time.
The transimpedance amplifier converts the small photodiode current into a voltage. This conversion
requires analog filters and analog gain to raise the signal from the noise floor. The amplified voltage of thephotodiode is then digitized with an ADC. The transimpedance amplifier architecture is best suited forphotodiodes that produce higher input currents, achieve wide analog bandwidth, offer high flexibility withsimple changes of feedback elements, and handle high speed conversion. On the other hand, the charge
digitizing ADC is a single device that optimizes the analog front end with the ADC to provide good system
performance for low level inputs at the expense of flexibility, bandwidth, and speed of conversion. The
integrated photodiode and amplifier falls in between the discrete transimpedance amplifier and the charge
digitizing ADC in terms of flexibility, bandwidth, and speed of conversion. For flexibility, bandwidth, speed,
and the larger signals produced by the large area photodiodes in conjunction with the Hadamard scans ofa DLP system, the transimpedance amplifier architecture is better suited for a DLP technology-based
spectrometer. For this reason, this application note covers only a transimpedance amplifier architecture.
Nevertheless, Table 7 compares the charge digitizing ADC (DDC112) with the other ADCs used withtransimpedance amplifiers. Note that in charge integration architectures, the signal level increases withintegration time and requires adjusments to the gain factor to prevent ADC saturation. Alternatively,transimpedance amplifier architectures have constant signal level, and oversampling the voltage averages
out the noise. The design of the transimpedance amplifier architecture requires the voltage range to match
the ADC dynamic range.

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3.5.1

Transimpedance Amplifier
A single stage transimpedance amplifier implementation of the analog signal chain is shown in Figure 9. It
is composed of the photodetector, a single stage transimpedance amplifier, analog-to-digital converter indifferential mode, and the required reference voltages, Vr. The analog inputs of the ADC in differential
mode provides greater noise immunity by coupling the noise into both inverting and non-inverting inputs of
the ADC, thus cancelling common mode noise and improving its SNR. The differential mode also splits thegain of the system across two transimpedance amplifiers to maximize the bandwidth of the amplifiers.

C1

R1
R3

!
"

"
OpAmp1

InGaAs

Vr

"
!
"

ADC

C4

C3
OpAmp1

!

!

"

VREF

!

R4

R2
100pF

C2

10k7

!

49.97

"

Vr

"
!

15F

OpAmp2

225F

0.15F
225F

49.97

Figure 9. Detector Analog Signal Chain
The maximum gain of the transimpedance amplifier determines the signal bandwidth. If this gain is set too
high, the attainable bandwidth of the signal spectrum is limited. If this gain is set too low, then the low
signal degrades the SNR of the system. Thus, careful selection of this gain is needed. The
transimpedance amplifier circuit with the photodiode equivalent circuit are shown in Figure 7. This signal
chain is used in the TINA-TI™ SPICE-Based Analog Simulation Program to analyze this circuit’s DC,
transient, and frequency domain performance.

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3.5.1.1

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Transimpedance Gain

The gain of a single transimpedance amplifier is given by the feedback and series resistance. Typical
InGaAs photodiodes have very small series resistance, so this gain can be written as shown inEquation 2.

!"#$ %&' ( ) *+ !
(2)

Note that the differential mode implementation of the transimpedance amplifier doubles the gain for thesystem as shown in Equation 3.

!"#$%&'()* + ,-. !
(3)

For this equivalent transimpedance amplifier circuit of the analog signal chain, the total gain is given by
twice the feedback resistor, Gain = 2Rf. The maximum signal into the ADC is twice the reference voltage,
2Vr. Hence, the maximum gain is the ratio between the largest photodetector signal and the maximum
signal into the ADC as shown in Equation 4:
Max Gain = 2Vr/Max(ID) = 2Rf, so Rf = Vr/Max(ID)(4)

In the DLP NIRscan Nano, utilizing a reflective illumination with a Hadamard scan corresponds to Rf = 2.5
V / 10.5 µA ≈ 240 kΩ. The feedback resistor and circuit of Figure 9 was modeled with TINA-TI andprovides 112.5 dB of gain with the following parameters:• Hamamatsu InGaAs G12181-010A photodiode• OpAmp1 = OpAmp2 = OPA2376• C1 = C2 = 51 pF• R1 = R2 = 240 kΩ
• R3 = R4 = 301 Ω• C3 = 47 nF and C4 = 100 pF• ADS1255 with input buffer off
On the other hand, the DLP NIRscan provides 93.6 dB of gain with the following parameters:• Hamamatsu InGaAs G12183-120K photodiode• OpAmp1 = OpAmp2 = OPA2376• C1 = C2 = 1000 pF• R1 = R2 = 24 kΩ
• R3 = R4 = 301 Ω• C3 = 0.1 uF and C4 = 100 pF• ADS1255 with input buffer off

12

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3.5.1.2

Bandwidth Considerations

The bandwidth is a function of the source capacitance, the feedback capacitance, and the gain-bandwidth
product of the amplifier used. The source capacitance (CS) is the sum of the photodiode capacitance (Cj),the common-mode capacitance of the amplifier (CCM), the differential capacitance of the amplifier (CDIFF),
and board parasitic capacitance (CPAR).
CS = Cj + CCM + CDIFF + CPAR(5)

For the amplifier selection, the transimpedance amplifier bandwidth (f) is inversely proportional to thesquare root of the gain bandwidth product (GBWP) divided by the product of the feedback resistor andsource capacitance as shown in Equation 6. For an in-depth explanation, refer to the application reports(Texas Instruments Compensate Transimpedance Amplifiers Intuitively) and (TransimpedanceConsiderations for High-Speed Amplifiers).

! "#

$%&'
!
()*+ ,(6)Note that most OpAmp data sheets specify typical GBWP. To account for process variations, use 60% of
the typical value in Equation 7. This equation indicates that if very large gain is needed in thetransimpedance amplifier, a two-stage amplifier architecture might be recommended. The first stage
provides moderate gain in the transimpedance state and is followed by a second broadband gain stage.
To compensate for the photodetector capacitance in the feedback path and stabilize the circuit, an
external capacitor is placed across the feedback resistor. The optimal value of this capacitor is given by
Equation 7 as shown in Texas Instruments Compensate Transimpedance Amplifiers Intuitively.

!" # $%% - % - .'(" !/ )*+, !
&'(" )*+,(7)

Increasing the value of the feedback capacitor, Cf, trades bandwidth for stability. Also, larger feedback
capacitors filter out the high-frequency component of the photodetector signal. Some experimentation may
be needed to account for all parasitic capacitances, environmental variations, and the large varying
capacitance range of photodetectors.
3.5.1.3

Noise Immunity

For noise immunity, a differential signal is employed by the transimpedance amplifier and the ADC.

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3.6

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Analog to Digital Signal Conversion
For best results, an extremely low-noise, high linearity, high resolution analog to digital converter
minimizes the noise added by the conversion. To optimize the digital resolution of the system, the dynamic
range and reference voltages of the ADC must be matched with the maximum photodetector signal.

3.6.1

Dynamic Range and Voltage Reference
In a TI DLP technology-based spectrometer, the programmable nature of the patterns on the DMD canvary the amount of light incident on the photodetector. For Hadamard Scans, up to half of the micromirrors
direct light to the photodetector. For Column Scans, a small fraction of the micromirrors direct light to thephotodetector. This large dynamic range must be mapped into the input voltage range of the ADC.
Depending on the illumination head and materials scanned, the typical ADC bit resolution ranges from 16bits to 24-bits.
Using a 24-bit ADC in differential mode, the ADC’s input voltage range is given by the difference of thedifferential inputs: (AIN+ – AIN-). Internal to the ADC, this range is mapped to the difference between its
voltage reference inputs: (VREF+ – VREF-). For this detector signal chain architecture, VREF- is set toground, and VREF+ is set to the reference voltage (Vr), leading to the following full scale voltage levels
and bit codes:• (AIN+ - AIN-) ≤ 2Vr• Code = 224(AIN+ - AIN-)/[2Vr] = 223(AIN+ - AIN-)/Vr

3.6.2

Voltage Reference
For the best measurement resolution, careful selection of the voltage reference, Vr, avoids unused ADC
codes and matches the dynamic range of the photodetector to the allowed input voltage range of the ADC.
For example, Table 4 shows the DLP NIRscan Nano ADC signal values at 10 nm resolution with atransimpedance amplifier with 112.5 dB gain and 2.5 V reference voltage: REF5025.
Table 4. DLP NIRscan Nano Typical Detector Signal at 10 nm Resolution Scan (Vr = 2.5V)
Illumination Type
Reflective
Transmissive

Scan Type

Converted Detector
Signal at ADC

Maximum Bit Depth

Column~ 30,00015

Hadamard~ 450,000

18

Column~460,00019

Hadamard~7,930,000

23

Table 4 demonstrates that this configuration is sufficient to support the broad range of inputs fromreflective and transmissive illumination modules. However, for the end application that only requires areflective illumination module, the dynamic range of the ADC is underutilized. Table 4 shows that the
maximum reflective signal only consumes 18-bits, with the upper 6-bits not used. In this case, thesystem’s resolution can be further optimized by utilizing a 1V voltage reference: LM4140. With Vr = 1V,
this reference reduces the maximum analog input (AIN+ – AIN-)= 2Vr from 5V to 2V. Table 5 shows the
maximum values with Vr = 1V. For reflective scans, this table shows two to three more bits of precision
depending on the scan type. The entry highlighted in red shows that for a transmissive Hadamard scan,
the 1V reference overflows the 24-bit ADC. Hence, a 1V reference is recommended for all reflective
illumination, as well as for transmissive illumination with highly absorbent samples.
Table 5. DLP NIRscan Nano Typical Detector Signal for 10nm Resolution Scan (Vr = 1V)
Illumination Type
Reflective
Transmissive

14

Scan Type

Converted Detector
Signal at ADC

Maximum Bit Depth

Column~ 72,00017

Hadamard~ 1,080,000

21Column~1,104,000

21

Hadamard~19,032,000

25

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3.6.3

ADC Programmable Gain Amplifier
Depending on the light absorption of the object being scanned, large differences in light collected at thephotodiode will result in smaller input signals at the ADC, decreasing the measurement resolution. Refer
to Table 6 for typical maximum signal levels at ADC for 1V and 2.5V reference voltages. For optimal
mapping of the ADC resolution to the input signal, the programmable gain amplifier (PGA) of the ADS1255
is used during scans. The ADS1255 supports a low noise PGA with 2x, 4x, 8x, 16x, 32x and 64x. During ascan, a quick scan is initially performed to determine the peak input signal at the ADC. Then, the PGA is
automatically set by the DLP NIRscan Nano firmware to the maximum value that does not overflow the
ADC inputs.
Table 6. DLP NIRscan Nano Typical Maximum ADC Input Voltage with PGA Setting

3.6.4

PGA Setting

ADC Maximum Input Voltage (Vr = 2.5V)

ADC Maximum Input Voltage (Vr = 1V)

1

5.00 V

2.00 V2

2.50 V

1.00 V4

1.25 V

0.50 V8

0.625 V

0.25 V16

312.5 mV

125 mV32

156.25 mV

62.5 mV

64

78.125 mV

31.25 mV

Sampling Frequency
Depending on the material sampled and the amount of light reaching the photodetector, the sampling
frequency can vary. The DLP controllers in the DLP NIRscan (DLPC350) and DLP NIRscan Nano
(DLPC150) can load binary patterns on the DMD at up to 2880 Hz. Each pattern presents a single column
or an element of a Hadamard scan. During each scan, the photodetector is sampled 5-20 times toaverage out the noise. This results in typical sampling rates of 15 to 60 kHz.

3.6.5

Analog to Digital Converter
Table 7 shows several options for analog to digital converters available from Texas Instruments.
Highlighted in yellow is the ADS1255 used in the DLP NIRscan and DLP NIRscan Nano. Depending on
the application and the amount of light reflected by the material, select an ADC with a bit resolution thatmeets the dynamic range of the system and offers sufficient noise free bits. Then select a sampling ratethat allows several measurements per wavelength to average out the noise. For improved noise immunity,use differential input mode by utilizing 2 channels in differential mode or one single differential channel.
These ADCs include programmable digital filters that optimize the bit depth resolution and the desired
data sampling rates.
Configurable software options of the programmable gain amplifier (PGA) and analog front end (AFE) gain
provide more flexibility for data capture. Some ADCs have integrated AFEs that replace thetransimpedance amplifier circuit shown in Figure 9. For example, the AFE44xx devices have software
configurable transimpedance amplifiers but operate at lower sampling rates. The AFE4490 also averages
four conversions in the 5 kHz sampling rate providing an effective 20 kHz sample rate.

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Charge digitizing ADC or analog integrators, such as the DDC112, allow direct connection of thephotodetector to its input, avoiding the need for a transimpedance amplifier circuit. The DDC112 uses
internal and external integrating capacitors to convert the photodiode current to voltage in continuous
mode. These devices do not support the fast sampling rates nor the fine tuneability of the integrated
AFE44xx devices.
Table 7. ADC Options From Texas Instruments for TI DLP Technology-based Spectrometers
Part Number

Channels

Resolution(bits)

Sample Rate (kHz)ADS1271

1 differential

24

ADS1255

2

24

ADS1292

2

ADS1250

2

ADS8887

PGA (Multiplier)Analog Front End

105

-

-

30

1, 2, 4, 8, 16, 32, 64

-

24

8

1, 2, 4, 8,12

-

20

25

1, 2, 4, 8-

1 differential

18

100

-

-

ADS8867

1 differential

16

100

-

-

ADS11922

16

8

1, 2, 4, 8, 12-

AFE4490

1 differential

22

5

1, 1.5, 2, 3, 4

TIA with Rf = 10k - 1M
and Cf = 5 - 250pF

AFE4405

1 differential

24

1

-

TIA with Rf = 10k - 2M
and Cf = 2.5 - 25pF-

Internal and external
integrating capacitors.
Direct connection tophotodiode.

DDC112

16

2

20

3

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