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delay time.

Schematic experimental setup of time­resolved photoelectron
imaging experiment.

304  úËõ Sept. 2010 Vol.23 No.5

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çîêóÔÖÌdqÉaðÜÞ_Ci~NXÌð¾É§íµ½ ¢l¦ÅéBÈ¨ CÔªð\ ÉÖµÄÍ CeFEL pXÉWb^[ðèµCªèf[^ð\[g·é©10)CSCSS ÉtFgb[U[ðüËµÄV[h·êÎ11) ßé±ÆªÅ«éB½¾µCXFEL ÅÍV[hªïµ¢½ßCSASE û®Ìhç¬Ìâ³û@é¢Íhç¬Ée¿³êÈ¢À±è@ÌJ­ªdvÉÈéÆvíFig. 3

Photoelectron kinetic energy distribution in (a) He(I) pho­toelectron spectroscopy of the ground­state pyrazine9), (b)260­nm UV pump and 198­nm DUV probe experiment6), and(c) 260 nm UV pump and 161 nm VUV probe (this study)2).
(d) Schematic energy diagram of ionization process.

êéBÓ«{¤ÍCXFEL væ¯i{pO[vÆÌ¤¯¤ÆµÄsíêÜµ½BÜ½CSCSS ±Á¬í^]O[vÌ¦ÍÉ´ÓvµÜ·B¢éB±êçæÌS©çÌ¼aÍõdqÌ¬xÉÎQl¶£µÄ¨èCÖÍÊq»³ê½sWJ`IÌeU®óÔÖÌJÚð\·B±Ì¾ÄÈÖÍ S1 óÔÉÂ¢ÄÌÝ|võÌg·260 nm ÅÍsWÍ S2 ÌU®îêó1)2)3)

ÔtßÉãN³êéBS2 Íñ23 fs Å S1 Éà]·µ6)C4)»êéBÉ S1 Íñ22 ps Å S0 ÖÉa·é7,8)B±Ì|võg·
Æ161 nm Ì VUV õÅªè³ê½Ôvt@CÍC±Ì 2 iÚÉ·é t20}3 ps Ìêw¸ð¦µ½ B Fig. 3c Í C Dt k 5 ps Å ª è µ ½ õ d q X y N g Å C ¡ ² Í d q   G l  M [ i ElectronEnergy: EBEjÅBindingéBFig. 3a ÍC58.4 nm Ì^óOõ¹Åªè³ê½CîêóÔ©çÌêõqCI»õdqXyNgÅ5)
6)
7)
8)
9)
10)
11)

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è9)CejüÍCJ`IÌ 3 ÂÌdqóÔúËõ Sept. 2010 Vol.23 No.5  305 ÒÐî ¬ég°»w¤éØ»w½¤º¦Í¤õE­mail: ogiriken.jp
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éØr@»w¤éØ»w½¤ºåC¤õCsåwåw@w¤È³ö
E­mail: t­suzukiriken.jp,suzukikuchem.kyoto­u.ac.jpêåFCCtÌ½®Íwmªðn
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Study on ultrafast electronic dynamics ofphoto­excited molecules using EUV_FEL andUV femtosecond laser
Yoshihiro OGIToshinori SUZUKIRIKEN Advanced Science Institute, 2_1 Hirosawa, Wako 351_0198, JapanRIKEN Advanced Science Institute, 2_1 Hirosawa, Wako 351_0198, Japan
Graduate School of Science, Kyoto University, Kyoto 606_8502, Japan

Abstract Time­resolved photoelectron imaging using a femtosecond ultraviolet laser and the SCSS freeelectron laser is presented. Ultrafast internal conversion and intersystem crossing in pyrazine in a supersonicmolecular beam were clearly observed in the time proles of photoioinzation intensity and time­dependent
photoelectron images.

306  úËõ Sept. 2010 Vol.23 No.5