Naturally Taking You
through Setting up
an X-ray Scan.

ZEN navx
Intuitive Guidance and Control System
for ZEISS 3D X-ray Microscopes
zeiss.com/xrm

ZEN navx
Intuitive Guidance and Control System
for ZEISS 3D X-ray Microscopes
Novel X-ray imaging can be complex. In order to set up a scan, users need to define parameters
for the field of view, number of projections and many others. Often, novice and expert users alikehave to apply for instrument time on 3D X-ray microscope (XRM) in a research lab or imaging
facility – making the need to work efficiently a necessity to achieve the best possible results asfast as possible.
What if there was a way to gain scientific data more easily and efficiently? ZEN navx offers anintuitive software guiding users through automated workflows with intelligent system insights
and making even the newest user immediately productive while allowing experienced users toexplore the full versatility of a ZEISS Versa XRM.
Evolving the user experience

Unlock the full versatility of ZEISS Versa XRM using ZEN navx

ZEISS researchers studied our users’
habits, dove into their challenges andBenefit from:workarounds, and employed human-• The reimagined and redesigned user experience providing a new way to interface

centered design (HCD) principles towith advanced XRM technology, reducing the training overhead, and rapidly

develop ZEN navx to enable evenbringing the power of XRM imaging to a wider user base.

the newest user in a busy lab to
immediately become productive.

• A sample-specific automation and workflow visualization offering a streamlined
path to results for beginners and experts alike.
• Performing demanding correlative workflows. Work easily with multiple platforms

When setting up an X-ray scan, anumber of choices have to be made.
Now, ZEN navx naturally takes you
through those choices as all that
guidance is embedded into thesoftware. A series of prompts andsuggestions guide you through setting
up an optimized experiment more easily
and efficiently.
Additionally, the ZEN navx File Transfer
Utility (FTU) takes the data that isbeing produced by the microscope
and automatically transfers it to otherlocations so that users have their data
where they need it when they need it.

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supported by seamless coordinate transfer.

User Interface based on
Human Centered Design
Accelerate Productivity for All Users
Expand access, improve productivity
and extend your capabilities with
3D X-ray microscopy
Extract all information from yoursample by leveraging the uniquespatial resolution, up to 450 nm, withZEISS VersaXRM 730 with Resolution
Performance at a Distance over large
fields of view across the full range of30 kV to 160 kV.
Understand your sample better
than ever with the help of
AI-powered image reconstruction

Intuitive user interface of ZEN navx, showing tutorials

Use deep learning-based recon-Here is how NavX, your microscope

The intuitive user interface is designed

struction with ZEISS DeepScout andcontrol system, enables new insights

for workflow automation. It suggests

ZEISS DeepRecon Pro, modules ofto users. It helps you to get started

parameters that are part of theZEISS ART (Advanced Reconstruction

and simultaneously builds a foundation

integrated navigation. With the helpToolbox).

of system intuition that ensures aof this embedded guidance, you will

successful set up.

be more productive, achieve moreconsistent data and build your own

In-built tutorials guide you throughuser intuition.

the initial steps. Sample and systemawareness are generated and combined

Microscope users of all skill levels canwith augmented reality to protect bothaccess cutting edge capabilities of thethe microscope and the sample.

instrument.

Workflow selection

NavX, the FTU and the performanceof ZEISS Xradia Versa now unlocks theability to study an unprecedented rangeof samples in the fields of materials
science, battery research, advanced
electronics, and life sciences.

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Augmented Reality Helps
Understand How Parameters
Affect Each Other

Augmented reality helps to position the sample
and avoid collisions with instrument parts(right). The software automates the workflow bysuggesting parameters (bottom).

ZEN navx also provides a special

ZEN navx intuitive navigation

visualization capability utilizing sample-

follows the evolution of the XRM

specific calculations. The augmented

user basereality part is separate from the item

It revolutionizes X-ray navigation anddescribed here. Replace with “sample-control with seamless and integrated

specific calculations” that helps you

workflows to provide access toto understand the trade-offs between

advanced correlative workflows in theparameters, e.g., source-sample

familiar ZEN environment.

distance and throughput.
Additionally, ZEN navx integrated
Volume Scout is a capability tostreamline your access to RaaD
(Resolution at a Distance) using a 3D
volume of your sample to pinpoint
and identify regions of interest (ROI)
and execute higher resolution imaging
subsequentially.
Volume Scout fully integrates rapid(<1 min) Flat Panel FAST Mode dataacquisition on VersaXRM 615 and 730
for a true end-to-end 3D navigation
experience.

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Study an unprecedented range of samples. Performing experiments on ZEISS Versa XRM with
its novel capabilities and using ZEN navx enables scientists in academia and industry with prime
access to multiple fields of applications.
Researchers in Materials Science
request high resolution imaging thatis not constrained by sample type, andintuitive, flexible capabilities.
High resolution zoom
@ 0.4 µm voxel

As the majority of users access XRM
instruments through multi-user corefacilities, accessibility, reducing theburden of training, and efficiency of1 mm

work are key considerations.
In situ experiments demand high

0.4 µm voxel
19 mm

Crack

throughput for additional test points
and a broad field of view to capture
heterogeneity.

Delamination
Pores

For semiconductor applications, FA(failure analysis) requires the fastest

100 µmworkflow to set-up an internal ROI
for highest resolution scanning withminimum user interaction or wasted

3D X-ray microscopy data of an electronics sample, an intact A12 processor with dense metal solder

time. Initial faster scan capability forbumps and interconnects. Top: Overview scan capturing details across the entire sample. Details indicatefastest ROI setup supported by ZEN

failures and reveal information how to optimize designs. (White box indicates detail image shown on
bottom right.) Bottom left: 3D rendering of the total processor giving an idea of the scope of scaledifferences, with the small high resolution region highlighted in red. Bottom right: Detail of a 2D virtual

navx will improve productivity in FAlabs.

slice from the red zoom region (from bottom left image) after AI-based reconstruction. New features canbe seen, e.g. cracks, or pores.

Geoscience and Raw Materials imagingrequires the ability to capture large
amounts of data across many lengthscales quickly and intuitively.
Contrast and resolution are the highest
requirements for mainstream Life
Sciences research – especially for theheavily funded brain imaging andvasculature research fields.

5Expand Your Possibilities
Select and ConfigureYour X-ray Microscope
Expand your horizon with ZEISS Versa 3D X-ray microscopes.
Achieve excellent resolution performance and take accessibility
to the next level with an intuitive user experience. Accelerate
your productivity with both faster throughput and faster timeto-results. And leverage game-changing AI.
X-ray Microscope
Versa Family

VersaXRM 730, with a spatial resolution of 450 nm, minimum voxel size 40 nm

ZEN navx with FTUIntuitive user interface with file transfer unit, offering navigational guidance and enabling novice
and expert users to access all instrument capabilities easily

Volume Scout

Streamlines access to RaaD using a 3D sample volume to pinpoint and identify ROIs

SmartShieldProtects sample and microscope, avoids collisions with instrument parts

In Situ Interface Kit

In situ rigs such as high pressure flow cells, tension, compression and thermal stages

Recommended Software
ZEN core AI Toolkit

Package for AI applications including integrated training interfaces and the modules ZEN Intellesis
Segmentation and Object Classification based on machine learning algorithms

3D World ZEISS edition from Dragonfly

3D visualization and analysis software

Packages
Secondary High Performance Workstation Included with two-year DeepRecon Pro license for ZEISS VersaXRM 615 and 730

Advanced Reconstruction Toolbox
ART AI Supercharger

Contains DeepRecon Pro & DeepScout, deep learning-based reconstruction algorithms forenhancement of throughput or image quality in repetitive workflows and for high resolution overlarge fields of view

ART Recon Package

Contains DeepRecon Pro & OptiRecon (deep learning and iterative reconstruction for enhanced
throughput or image quality)

ART Contrast Packages

Contains PhaseEvolve & MARS: Material Aware Reconstruction Solution to enhance image quality
by reducing beam hardening artifacts and a smart algorithm to enhance image quality by removing
propagation phase contrast fringes

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Carl Zeiss Microscopy GmbH07745 Jena, Germany
microscopy@zeiss.com
www.zeiss.com/XRM

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EN_44_012_102 | Version 1.1 | CZ 08-2024 | Design, scope of delivery and technical progress subject to change without notice. | © Carl Zeiss Microscopy GmbHNot for therapeutic use, treatment or medical diagnostic evidence. Not all products are available in every country. Contact your local ZEISS representative for more information.