Project FIVE
Control FIVE
Project FIVE+For further information about
WITec Suite please contact us:
by phone: +49 (0) 731 140700
by email: info@witec.de

WITec Suite FIVE

Data Acquisition, Evaluation andProcessing Software

Topography image of a profilometric measurementof an archaeological sample overlaid with thecorresponding chemical confocal Raman image.

WITec Headquarters
WITec GmbH
Lise-Meitner-Straße 6D-89081 Ulm . Germany
Phone +49 (0) 731 140700
Fax +49 (0) 731 14070200
info@WITec.de
www.WITec.de

WITec North America

WITec Instruments Corp.
130G Market Place Blvd
Knoxville . TN 37922 . USA
Phone 865 984 4445
Fax 865 984 4441
info@WITec-Instruments.com
www.WITec-Instruments.com

WITec South East Asia

WITec Pte. Ltd.
25 International Business Park
#03-59A German Centre
Singapore 609916
Phone +65 9026 5667
shawn.lee@witec.biz

WITec China

WITec Beijing Representative Office
Unit 507, Landmark Tower 1
8 North Dongsanhuan Road
Beijing, PRC., 100004
Phone +86 (0) 10 6590 0577
Info.China@witec-instruments.com

WITec Japan

WITec K.K.
KSP W713B Sakado 3-2-1 Takatsu-ku
Kawasaki-shi Kanagawa 213-0012
Japan
Phone +81 44 19 7773
keiichi.nakamoto@witec-instruments.biz

www.witec.deWITec Suite

Powerful Software Tool
Sophisticated data acquisition, evaluation,post-processing and image generation for
Confocal Raman Microscopy, AFM, and SNOM.

Control FIVE

Project FIVE

Project FIVE+

WITec Project FIVE

WITec Project FIVE+

Software architecture and graphical userinterface enable an integrated functionality
incorporating the various techniques andmeasurement modes.

Suitable for all experience levels anduser requirements through customizable
user interface.
WITec microscope family with alphaControl
WITec Control FIVE

• Centralized experiment and instrument settings• Acquisition of imaging and/or spectroscopy data
• On- and offline data analysis and image processing

02• Offline data and image
processing• Licensed for an unlimited
number of users• Advanced offline data and image
processing• Chemometric post-processing
features and superior data analysis
tools: Cluster Analysis, Principal
Component Analysis, Spectral
Demixing, Advanced Spectral Fitting,
Image Correlation and many more
• Single user license
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Benefits andHighlights

Actions (Data Analysis)

Smart access options

Image Viewer

Intuitive and convenient software handlingfor all principal data acquisition, evaluation,and processing functions.

The Image Viewer facilitates the overlay of images from different measurements.
Example image: Topography image of a profilometric measurement of an archaeologicalsample overlaid with the corresponding chemical confocal Raman image.

• User-friendly software interface with smart access options for all
principal functions (e.g. circle mouse menu, drag-and-drop actions)• Accelerated workflow through intuitive menu guidance• Software Wizard for guidance through the complete investigation, frominitial settings and acquisition through data and image post-processing NEW
Corresponding Raman spectra of the3D Raman image.

• High-speed data acquisition and processing through intelligent computerresource management (> 1300 Raman spectra per second)• Large data acquisition volume per measurement• Microscope objective library: saves and catalogues optical properties withindividual measurements; facilitates comparison and reproducibility NEW• RamanTV for direct and fast spectrum-to-image visualization• Overlay of images from different measurements, for example,
AFM/TrueSurface topography with chemical Raman information• TrueComponent Analysis for automatic identification of the samples’
components and representation in the image NEW• Image post-processing possibilities including, among others,
3D imaging and volume visualizations• Cluster Analysis for automatic identification and visualizationof chemical components

Ultrafast Raman Imaging option
Image post-processing
3D Raman image of pollen in honey. Green: Pollen; Red, blue, cyan: Different crystalline
phases in the honey; Yellow: Honey.
Image parameters: Size: 50 µm x 50 µm x 50µm, 150 x 150 x 50 = 1,125,000 spectra,
Integration time per spectrum: 12.2 ms

04

High speed data acquisition with 0.76 ms/spectrum = over 1300 spectra/second. The image
shows an ultrafast Raman measurement of atoothpaste sample.
Image parameters: 200 x 200 pixels = 40,000
Scan range: 20 µm x 20 µm
Total image acquisition time: only 30.4 seconds

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Control FIVE

Measurement control and data acquisition with Control FIVE

Fast data acquisition combinedwith full instrument control

RAMAN-SEM

RAMAN

AFM
Extensions

Instrument control and experimental setup is made easy with Control FIVE.
The user interface changes automatically depending on the measurement mode
and includes specialized routines. The clear layout shows all essential control
parameters at a glance and facilitates quick access to all measurement tasks,settings and signals. Control FIVE additionally includes all features of theProject FIVE package for on- and offline data evaluation and post processing.

LabView interface for advanced dataevaluation and processing

RAMAN

SNOM

Imaging of a graphene sample with Raman, AFM, SNOM and Raman-SEM

Key Features of Control FIVE
• All measurement modes use one
intuitive software package• Automated multi-area measurementsand time series• Measurements with various
techniques (e.g. AFM, Raman)
can be applied and controlled
simultaneously• Multi-user management including
user-customizable software
configurations for individual
measurement pre-configurations• All essential parameters areautomatically set when changing
between measurement modes• Standard SPM features for
AFM and SNOM
· High speed, automatic tip
approach in all AFM modes· Software-guided cantileveradjustment· Oscilloscope mode for theobservation of signals as afunction of time

• TrueScanTM for exact positioning
control even at the fastest scan rates• Capability to measure very large datasets, for e.g. image stacks• Handheld multifunction controller
for tactile and intuitive directing
the motorized stages, white lightillumination, laser power, autofocus,
cantilever positioning and objective
selection NEWControl FIVE – One software suite to control
the measurements and data acquisition
for all imaging techniques.

New control element for all
measurement settings andsoftware configurations.

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Project FIVE

Statistical Analysis and Data Evaluation

Sophisticated Data Evaluation
and Processing
Topography analysis of an AFM measurement.

WITec’s multi-user licensing concept allows the installation of Project FIVEon an arbitrary number of computer workstations for data evaluation andpost-processing without additional individual licensing.

Automated peak labellingBC

4x

Software Wizard
Settings

4xMeasurements
Raw Data

Software Wizard

Application Image

The new software wizard guides the user through the complete investigation, from initial settings and acquisition throughdata and image post-processing. Presets and highlighted analytical paths accelerate the generation of high-quality images.

30 µmA

8 µmD

Key Features of Project FIVE
Data Evaluation and Processing

Data Representation• Various pre-configured filters and algorithms for
simplified data processing• RamanTV: high speed movie-like image presentationof spectral datasets, also functional as preview option
simultaneously with data acquisition• Filters and algorithms accessible through simple dragand drop
• Filter Viewer: Fast preview image generation of a filter
applied to a data set, also applicable during runningmeasurement• Multiple algorithms for background subtraction included• Curve-fitting tool for single spectra• Various statistical data evaluation options• Image generation through visualization of corresponding
spectra (basis analysis)• Data export to ASCII, JCamp-DX, SPC, and MatLab possible

08• Fast determination of position, time
and/or spectral correlation between various data objects• 2D and 3D color coded representation of any image dataset (AFM, Raman, SNOM, etc.) in selectable color schemes

2 µm• Image Viewer: 3D overlay of images e.g. AFM topography
image with Raman chemical information• Spectrum peak finder and labelling• Spectra export to Raman database for convenient
identification of sample components• TrueComponent Analysis for Raman imaging: Automaticallyestablishes the number of components in a sample, locatesthem in the image, and differentiates their individual
Raman spectra NEW

Acquisition of large data volumes(A) 3D Raman image of a pharmaceutical emulsion. Scan range:
25 x 25 x 20 µm3, 200 x 200 x 50 pixels = 2,000,000 Raman spectra.
(B) Large-area, high-resolution confocal Raman image with
4,194,304 Raman spectra and a raw data file size of 12.5 Gbyte.
(C, D) The consecutive zoom-ins of the same dataset illustrate theextremely high-resolution of the large-area scan.
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Project FIVE+

Image Correlation

Adhesion/Stiffness

Advanced Data Evaluation
and Processing

Topography

Project FIVE+ is the software extension for advanced chemometric and microscopic
data evaluation and processing. A variety of intelligent algorithms for multivariate data
analysis of hyperspectral Raman data files allow the identification of hidden structures
automatically. Superior microscopic data analysis tools permit specialized, expert-levelevaluation that meets the most demanding requirements.

Adhesion

Stiffness

Topography

Correlation plot of a Pulsed Force Mode measurement of a polymer blend. Blue: Topography vs. adhesion; Green: Topography vs. stiffness.

Key Features of Project FIVE+All features of Project FIVE+ are included as demo versions in Project FIVE
Cluster Analysis• Extraordinary automatic identificationof similar spectra and classification ofmulti-spectrum data into a user-defined
number of clusters• Color-coded image generation ofuser-selected clusters• Automatic average-spectra generationof cluster areas for further processing
Principal Component Analysis (PCA)
Multivariate analysis method that produces
an optimized reduction of a spectral data
set to its principal components
Advanced Fitting Tool
• Extensive curve fitting tool for single
spectra and 1D and 2D multi-spectral
data sets• Combinations of various fitting functions• Generation of individual fitting functions
Data Cropping and Reduction
Selection of image regions and 1D/2D
spectral data sets to crop, cut, or combine
the data included in these regions

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Graph Demixer
Subtraction or addition of spectral
information from/to other spectra witha free adjustable weighting factor(weight per spectrum and immediatepreview function)

Cluster Analysis
AB

Image Correlation
Easy matching of two or more image
objects in a correlation plot and correlative
comparison of various object characteristics
Various Filterse.g. Fourier, anisotropic, edge, sharpen,user-customized filters and many more.
Graph and Image Repair
Data substitution algorithms such as
simple interpolations or texture analysis
to remove pixel failures (e.g. extreme
cosmic rays, hot/dark CCD pixels)
Image Overlay
Image overlay of any combination of twoimages/bitmaps. Both images may havedifferent sizes, positions or number of pixels
Non Negative Matrix Factorization (NMF)
Automatic unmixing of spectral components
and correlation with their distribution.

Image Overlay function

Advanced Background
Subtraction

The Image Overlay function facilitates the correlation of images acquired with different
imaging techniques, e.g. Raman/SEM, Raman/AFM, Raman/Profilometry, etc:

Sophisticated algorithms for automaticbackground subtraction. Optimally applicableto large data sets with a varying fluorescencebackground.

(A) Topography profile image (acquired with TrueSurface Profilometry) of apharmaceutical tablet overlaid with the corresponding confocal Raman image.
(A) Raman/SEM image of a geological sample investigated with the correlative
RISE Microscope for Raman Imaging and Scanning Electron Microscopy (Raman-SEM).

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