Molecular and Elemental
Material Characterisation

Correlative RISE/EDSMicroscopyBenefits
Raman Imaging and Scanning Electron (RISE®) microscopy
combined with energy-dispersive X-ray spectroscopy (EDS)
offers comprehensive sample characterisation atthe nanoscale.

RISEEDS

Detailed insight

Molecular and bonding information,
crystallinity, material stress and strain,
crystal orientation

Elemental quantitation and distribution,
microstructure and crystal structure

Wide-ranging analysis

Sub-micron and large-area
molecular information,
3D chemical imaging

Point analysis,large area mapping,particle analysis

Dynamic vision

Analysis of chemical processes
possible

Live Chemical Imaging in real timewith AZtecLive

Independent Raman operation,
Simultaneous SEM andRaman-SEM image correlation
EDS data acquisition			Multimode operation

RISE Microscopy
RISE instruments seamlessly integrate confocal Raman imaging
and scanning electron microscopy (SEM). They incorporate thesensitivity and non-destructive nature of Raman spectroscopy
with the atomic resolution of electron microscopy. Raman
imaging enables the identification of molecules, their allotropes
and polymorphs, the determination of their orientation, purity
and crystallinity, and the detection of strain states. SEM allows
for the imaging of surface structures on the nanometer scale.
Inelastic scattering of light by a moleculeTechniqueIntensity (a.u.)

Intensity (a.u.)

CF

01234

Energy (keV)

5400

800

1200

1600

2000

2400

2800

Raman shift (cm-1)

Target: Atoms – Determine elemental
composition

Target: Bonds – Identify molecules andtheir bonding characteristics

EDS

Raman

FF

FFFCFC
F

C

F

C
F

FCF
Teflon (Polytetrafluoroethylene, PTFE)Electronbeam

EDS Analysis
EDS (Energy Dispersive X-ray Spectroscopy) is atechnique for elemental and compositional analysis
based on the detection and analysis of X-rays
produced by electron irradiation of a sample.
Ionisation causes an inner-shell electron of
constituent atoms to be ejected. This creates avacancy in the electron orbital. An electron from anouter shell, with a higher energy level, transfers to
the inner shell to stabilise it, and an X-ray is emitted
during this process. This so-called characteristic
X-ray has a specific energy value for each element.
From such signals, it is possible to determine
microstructure, composition and crystal structure.

Atomic nucleus

CharacteristicX-rays

The principle of EDS

Applications: SEM,Raman & EDS imaging
Battery materials
EDSSEMCoMn

NiMetals & oxygen(green), carbon (red),fluorine (blue)

LiCoO2C (amorphous)

LiNixCoyMnzO2

combined

RISE

Investigation of battery cathode materials. EDS (top row) reveals the distribution of theindividual metallic elements. RISE delivers complementary information on microstructure
and the distribution of chemical components along with the carbon matrix.

Sample courtesy: Universityof Southampton

Nutritional supplement tabletRISEMaltoheptaose
1-O-Hexadecyl-2-Palmitoyl-snGlycero-3-Phospho-(n-Palmitoyl)Ethanolamide sodium salt
Hydromagnesite
Calcitecombined

SEM

EDS

combined
Components of a nutritional
supplement tablet. The RISE image
visualises the distribution of theingredients on the surface and theEDS data shows its containedelements.

Mg

CCa

SiK

Geological sample
EDS

SEM

Backscattered electron (BSE) image

RISE (Raman + SEM)

Plagioclase in two different crystalline
phases (Ca,Na)[(Al,Si)AlSi2]O8Diopside
CaMgSi2O6AlCaMg
NaO
10 µm

Analysing a geological sample with
EDS and RISE reveals the distributionof the elements and minerals alongwith the microstructure through SEM.

SiEnstatite
Mg2Si2O6Pargasite
NaCa2(Mg4Al)(Si6Al2)O22(OH)2
Augite(Ca,Na)(Mg,Fe,Al,Ti)(Si,Al)2O6

We take care – WITec uses environmentally friendly printed materials.
While this policy is only a small contribution to a healthy environment, we at
WITec believe that focusing on details can effect positive change in the world.

Oxford Instruments NanoAnalysis
detectors used in electron microscopes
for materials characterisation.

Unity: The world’s first
Backscattered Electron and X-ray(BEX) Imaging detector

RISE: Raman Imaging and ScanningElectron microscopes

Oxford Instruments NanoAnalysis
Halifax Road, High Wycombe Buckinghamshire
HP12 3SE, United Kingdom
Phone +44 (0) 1494 442255, Fax +44 (0) 1494 524129
https://nano.oxinst.com

WITec Headquarters
WITec Wissenschaftliche Instrumente und Technologie GmbH
Lise-Meitner-Str. 6, D-89081 Ulm, Germany
Phone +49 (0) 731 140 700, Fax +49 (0) 731 14070 200
info@witec.de, https://raman.oxinst.com

Explore the possibilitiesof RISE/EDS
https://www.oxinst.com/campaigns/
correlative-rise-eds-microscopy