NANONICS IMAGING Ltd.

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AFM-Raman-TERS

SpectraView Series
TMAFM-Raman-TERS
One System - All Configurations, All Modes of Operation
AFM & Raman
Atomic Force Microscopy (AFM) provides a variety of nanometric characterizations such as topography,
conductivity, and thermal measurements. While very effective at measuring certain properties, AFM can
not identify the chemical composition of a given material.
Raman spectroscopy, however, has emerged as a critical technique in the field of chemical
characterization, accurately identifying and classifying materials in a number of diverse fields andindustries such as: material science, chemistry, biophysics, semiconductors, and many more.

WS2MoS2 heterostructure characterized with colocalized AFM (left) KPFM(center) and Raman (right)

Combining AFM with Raman
Harnessing the power of these two techniques enables
a synergistic and holistic analysis of a given material. Asearly as 2001, Nanonics Imaging exhibited the foresight tocombine the advantages of AFM and Raman by providing an
integrated platform. The joint AFM-Raman system allows for
Colocalized AFM (L) and Raman (R) images ofpolymer blend

the strength and versatility of all modes of AFM (including
mechanical, thermal, SECM, and electrical) combined withthe chemical characterization of Raman.
Nearly two decades later, Nanonics Imaging continues
to be at the vanguard of integrated optical AFM-Ramansystems, providing solutions in the most challenging areasof research and in the most innovative fields in appliedsciences:

The integration of AFM and Raman addresses aknown challenge in far-field Raman microscopy:
maintaining uniform focus on samples withvariant morphology. With on-line AFM, thesample is brought to the same focal point at
every pixel with nanoscale precision, generating
a true Raman image with no out-of-focus
artifacts.

 Graphene and 2D materials
 Carbon Nanotubes
 Semiconductor metrology
 Biological samples

AFM – Raman
Proven Nanonics Results Across the Spectrum
Multiprobe CAFM
Raman

BioAFM Raman
CAFM Raman

AFM-Raman collageof lignin distribution
on wood cell walls

Multiprobe conductive
AFM characterization
with on-line monitoringof current and the 2D
Raman scattering band ofGraphene

The characterization

AFM Raman

power of SPM combined

Conductive AFM imaging withon-line monitoring of theRaman scattering G band ofconducting SW CNTs

SThM Raman

with Raman offers a broad
nanoscale characterization
combined with strong
material confirmation,across a wide spectrumof applications.
AFM-Raman imaging
of semiconductor
deviceNanalithography
Raman

Fountain pen nanolithographydemonstrating controlled depositionof single wall CNTs with Raman
determination of the CNT alignment(Nano Lett. 2016, 16, 1517-1522)

Scanning thermal conductivity
image (SThM) of GaN
nanowire with on-line Ramanin vacuum environment(ACS Nano, Vol. 5, No. 1, 2011)

SECM Raman

SECM with on-line Raman
monitoring of Cu etching

See more publications at: http://www.nanonics.co.il/publications-by-our-usersTERS – Achieving the Raman Potential
Tip Enhanced Raman Spectroscopy (TERS) has yielded
exciting results, overcoming a previously insurmountableobstacle in Raman spectroscopy. With TERS, the AFMRaman integration can reach its full potential, enabling
both stronger signal and nanometric sub-diffraction Raman
resolution. Nanonics Imaging AFM-Raman systems areuniquely designed to achieve the most challenging TERS
measurements with the highest resolution, with repeatableand user-friendly operation.
This sub-diffraction resolution is increasingly important in

Cover paper in The Analyst (vol. 138(11), 2013,3150-3157) showing TERS measurements onprotein ligand bindings

analyzing today’s newest materials on the nanoscale.

User-Friendly & Reliable TERS Operation
 TERS Hot-Spot "Lock-In": quick and easy finding of theTERS hot-spot Accurate TERS measurements on a variety of samples
 Highest quality TERS probes All TERS configuration possible with one system:
Reflection

Transmission

Side-Illumination

 Proven TERS operation on the widest spectrum ofsamples
All TERS configurations are available
with the same AFM Raman system

Tip InTip OutDifference

3 point TERS measurement on a sample comprised of a thin layer of strained Si on bulk Si. Automated 3 point Raman
measurements allow for mapping both the far-field and TERS effect at each point, as well as their difference. The difference
map shows the pure TERS effect without any contribution of the far-field backgroundReal TERS on Real Samples
TERS of Strained Si

TERS of 2D Materials

TERS of Si Nanowire
TERS of strained SiGe pattern onbulk Si. The thin SiGe lines are
not visible in the far-field but areclearly seen with TERS (bottomhalf), demonstrating features
down to 40 nm. (Proc. of SPIE
vol. 9424)

TERS of CuPc molecules on MoS2
substrate (Journal of Selected
Topics in Quantam Electronics,
vol. 23, no. 2, 2017)

TERS of Cells

TERS of 50 nm Si Nanowire (arXiv
preprint arXiv:1705.08622 (2017))

TERS of Graphene
Proven TERS results on
a variety of samples, withnearly 2 decades of illustrious
academic publications

TERS for selective detection ofRGD-Integrin binding in cancer
cells (Anal. Chem 2016, 88,6547-6553)

D-band monitoring of thedoping distribution in monolayer Graphene flake on SiO2/Si substrate by TERS (Carbon111, 2017, 67-73)

TERS of Single Layer
Graphene
TERS of GaN Nanowire

Difference TERS for
identifying single layer
Graphene

Study of impurities insingle GaN nanowires byTERS {Appl. Phys. Lett. 107,123108 (2015)}

See more publications at: http://www.nanonics.co.il/publications-by-our-users

Key Features
The SpectraView is designed to generate exceptional
results from both the AFM and the on-line Raman.
Featuring VISTA (Vivid Imaging Soft Touch AFM),
the system enables AFM imaging with the highestresolution. The SpectraView is the only AFM designedfor natural Raman integration, not requiring anymodification to the Raman optical path.

Best Optical Integration
 True optical compatibility:

Operate with high NA objectives

Integrate with water and oil immersion objectives

 All optical configurations available in one
configuration:


True upright integration

Side

Inverted

Nanonics AFM-Raman system enables integrationof water immersion objective from above for highRaman collection efficiency in liquid with on-lineAFM.
Inset: Unobstructed image from above of sample
and probe in liquid environment, highlighting
Nanonics natural top-down integrations. TheNanonics system employs glass cantilevered AFM
and TERS probes, providing for complete opticalintegration.

AFM Designed for Advanced Raman Integration
 Tuning fork feedback without any opticalinterference with Raman laser Advanced SPM measurements with on-line Raman
 Ultra large Z range
 Manipulation and lithography with online Raman TERS operation in a wide variety of applications
 VISTA for AFM imaging of the most challenging
samples in air and liquid

Most Versatile System
 Scanning options: tip and sample scanning in one
scanning head
 Optical integration options: Sit on microscope,separate, upright, inverted, side, or dual
 Large sample stage (optional) Compatible in a range of environmental conditions:VacuumLiquid

Low temperature



SECM

Nanonics single probe system allowing for topside-bottom illumination in one setup for all
Raman and TERS configurations

Configurations
Customize for YOUR research specifications and needs
Probe Quantity
Single Probe SpectraView

Multi-Probe SpectraView

 Developed for ease-of-use and flexibility for Simultaneous probing of multiple measurements of(Up to 4 SPM probes)

easy integration with any Raman

your sample

 Compact and flat design Probe station for conductive AFM measurementswith on-line Raman On-line manipulation and characterization

Integration Options
Complete AFM-Raman-TERS Package

Upgrade Package

Nanonics offers a complete turn-key

Already have a spectrometer?

package – with complete AFM-Raman-TERS

Nanonics offers the broadest selection ofcapability.

hardware and software integration packages– compatible with all of the leading Raman
providersMultiple Configurations

Direct Integration on thestage of any Raman system

Integration with an additional
optical microscope (up-right,inverted , dual)

Upgrade your own
monochromater & CCD

Low temperature SPM
system integrated withRaman microscope

Contact a Nanonics
specialist today!
www.nanonics.co.il
nanonicsimaging

NANONICS IMAGING Ltd.
Sales and Marketing Headquarters: Phone: +972 2 678 9573 | Fax +972 2 648 0827 | Email info@nanonics.co.il