③整理_RunLog_2111Kr_211130.xlsx1_RunLog

2111KrRun Summary Sheet : CAMAC & LabView

条件全て書くこと
Att

Fname

start

stop

Header

実験前

Ender / LogNote
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100 10 5

3

2

Trig

Wob AuF Kap IC1 PL1 ED

LogNote: E5exp(8)_

実験中：Beam調整時
21/10/31
Cap

PL:2110Arのママ

ZnSスポット調整
1 17:34:00
2
3
4
5
6

Gaf焼き(1)Gaf

Cap01_ZnS_Zsld
Cap02_ZnS_QTdef
Cap03_散ZnS_Qdef
Cap04_WobR36-10-40
Cap05_散ZnS_WobON
Cap06_WobR36_Au48um
Gaf:: EBT3 □85x85mm @ Ysld

p.58
mpg
mpg
mpg
mpg
mpg
mpg

WobR=36,Au=48.5um
WobR=OFF,Au=48.5um(Kr用)
同上 濃く
WobR=OFF,Au=73um(Ar用)WobR=OFF,Au=20um
WobR=OFF,Au=112um

Att vs IC2@Air2

×

75u ×

×

R=36,30,25,20,15,20,25,30,36,40,36
R=36
ZnS@Air20 2 0 1 0
0 2 0 0 0

var: WobR =12C 135MeV/u
R36
R36 50u

WobR=36,Au48.5umで20sec
90sec 弱すぎた
60sec
60sec
25sec
90sec
WobR=OFF,Au48.5umで

0
0
0
0
0
0
0
0

R36 50u
R36 50u
OFF 50u
OFF 50u
OFF 73u
OFF 20u
OFF 112u
OFF 50u×

145 200

3
3
4
4
4
4
4
4

0
0
0
0
0
0
0
0

0
0
0
0
0
0
0
0

2
2
2
0
0
0
0
0

×

×

0u

IC2@Xclmt

×

×

0u

IC2@Xclmt〇

100u 0uPL2(25u:Xe用)

PL1,2 Dscr: 2110Arのママ PL1=125, 899mV, PL2=134mV

19:15:00
19:37:06
19:38:05
19:39:06
19:40:07

×p.159

PL1=100uはArのママ PL2=25u(Xe用)は新品。
PL HV（１：利用「前」）12
3
4

0 2 0 1 1

右側が切れている？

p.58

Att vs IC2@Air2

18:20:00
1 18:25:00
2
3
4
5
6
19:00:00

回路調整
PLHV01-

Det.SetupAir1 Air2 PL2,IC2,SSD

19:37:38 plhv01-01 700V
19:38:38 plhv01-02 800V
19:39:38 plhv01-03 900V
19:40:37 plhv01-04 1000V

30sec
30sec
30sec
30sec

PL1, PL2 @ Air2 同時に測定(IC2 out)
0:00:32 PL1=PL2=3kcps
2 2 0 0 1 PorS(0) R36 50u
0:00:33 <--PL1＝800Vで決定
0:00:32
0:00:30

scnEDic： ExpR サーチ
scnEDic01_202110311953
30sec/点
19:53:00 20:21:00 38点でRange 42点迄

p.60

scnAtt： IC1 vs PL1
scnAtt01_202110312030
20:30:00
scnAtt011 20:31:32
2 20:32:56
3 20:33:28
4 20:34:20
5 20:35:12
6 20:36:00
7 20:36:52
8 20:37:25
9 20:38:16
10 20:39:12
11 20:40:07
12 20:41:12
13 20:41:45
14 20:42:48
15 20:43:48
16 20:44:52

Step = 1/2, /4, /6, /8, /10
20:53:00 測定 30sec 設定

1
2
3
4
5

21/10/31
21/11/01

20:50:03
20:52:12
20:52:45
20:54:23
20:56:03
21:00
23:30
11:25

20:51:22 plhv02-01 700V
20:52:43 scanAtt017 Mul 400000
20:53:03 scanAtt018 Mul 200000
20:55:25 plhv02-03 900V
20:56:47 plhv02-05 1000V
ビーム調整終了(ML02-04)利用スタート(ML02-04)利用終了

R36 50u〇

100u var

PL2=inのまま
IC2大

0:23:00 scnAtt本番

R36 50u〇

100u 0u

IC2@Air2,X=0

1 3 0 0 3 PorS(0) R36 50u〇

100u 0uPL2(25u:Xe用)

p.60

20:32:03 scanAtt001 Mul 800
20:33:27 scanAtt002 Mul 8000
20:33:59 scanAtt003 Mul 1000
20:34:51 scanAtt004 Mul 2000
20:35:43 scanAtt005 Mul 4000
20:36:29 scanAtt006 Mul 8000
20:37:23 scanAtt007 Mul 80000
20:37:57 scanAtt008 Mul 10000
20:38:47 scanAtt009 Mul 20000
20:39:43 scanAtt010 Mul 40000
20:40:39 scanAtt011 Mul 80000
20:41:43 scanAtt012 Mul 400000
20:42:15 scanAtt013 Mul 100000
20:43:19 scanAtt014 Mul 200000
20:44:19 scanAtt015 Mul 400000
20:45:23 scanAtt016 Mul 800000

PL HV (２：重照射後)
PLHV02-

PL1,PL2 HV=Off, IC2大=IN
0:28:00 IC1～IC2=1.3-7A 少し強めでやる
1 1 0 0 0
PL1=1000V(230uA) IC2 @ Air2(X=0 Center)1 0 0 0 3 ～1 3 0 0 3

0:00:31 1/f=1/999～1/9 手動で変更
0:00:31
0:00:31
0:00:31
0:00:31
0:00:29
0:00:31
0:00:32
0:00:31
0:00:31
0:00:32
0:00:31
0:00:30
0:00:31
0:00:31
0:00:31p.60
60sec
0:01:19 ★scnAtt=Runのママだった
scnAtt Run017
0:00:31end
0:00:18
30sec
0:01:0230sec
0:00:44
p.61
架台交換
p.61
加速器ロスタイム＝0min(ML04-01)準備開始
bef-

1 14:50:26 15:05:55

21/11/01
21/11/02

21/11/02

16:10
3:45
7:30:00

p.71(ML04-01)利用スタート(ML04-01)利用終了
利用者片付け終了

0:15:29 SSD:Kr Gain ML04の前に測定

p.71
加速器ロスタイム＝0min
架台交換

実験中： ML04利用終了後
6:20:00
E5入室

scnEDic： PL厚さ測定(1)scnEDic02_202111020625
scnEDic01再現chk PL1=100um
6:25:00 6:53:00 42点まで
scnEDic03_202111020706
PL1=100 --> 25um
7:06:00 7:36:00 43点まで
scnEDic04_202111020743
PL1=無し7:43:00 8:09:00 39点までバカ！ IC1破損

p.72

PL1 HV=Off, IC2大=IN PL2無し
0:28:00 IC1=1.5-7A

1 1 0 0 0

R36 50u〇

100u var

IC2大0:30:00 IC1=1.16-7A

1 1 0 0 0

R36 50u〇25um var

IC2大0:26:00 IC1=1.24-7A

1 1 0 0 0

R36 50u〇

無し varIC2大

1 0 0 0 3 ～1 3 0 0 3

R36 50u

IC2大 100u 0u

PL2,IC2無し

1 3 0 0 3 PorS(0) R36 50u

IC2大 100u 0u

PL2なし

1 4 0 0 3 PorS(0) R36 50u

IC2大 100u 0u

PL2なし

p.72
p.72
p.73

PL500umに交換中に破損した
IC1 --> IC2大に交換したので、scnAtt 再測定。 重照射が続いたので、PLHVも再測定

scnAtt： IC1 vs PL1
scnAtt02_202111020845
Step = 1/2, /4, /6, /8, /10
8:45:00 8:57:00 測定 30sec 設定
scnAtt02camac Run 無し

PL HV (3：重照射後)
PLHV03-

1
2
3
4

8:59:129:00:23
9:01:39
9:02:39

8:59:58 plhv03-01
9:01:04 plhv03-02 800V
9:02:16 plhn03-03 900V
9:03:17 plhv03-04 1000V

p.74
p.74
700V 30sec
30sec
30sec
30sec

IC2=400V PL1=800V
0:12:00 IC1交換->IC2大 + PL=100um

0:00:46 800Vでまだ使える
0:00:41
0:00:37
0:00:38

バカ！ PL1 HV = 1000V のママで R02をやってしまった！！
9:03
21/11/02
21/11/04

21/11/04

12:15
0:10

ビーム調整終了(R02-01)準備開始(R02-01)利用スタート(R02-01)利用終了
利用者片付け終了

架台交換

p.61
加速器ロスタイム＝0min
架台交換

利用後測定： R02利用終了後
1:10:00
スタート

PL HV (4：利用後)
PLHV0４-

p.74

1
2
3
4

1:14:27
1:15:47
1:17:07
1:19:04

1:15:18 plhv04-01 700V aft R02
1:16:42 plhv04-02 800V
1:18:10 plhv04-03 900V
1:20:10 plhv04-04 1000V

p.85
30sec
60sec
60sec
60sec

0:00:51 PL1=2K
0:00:55
0:01:03
0:01:06

1 / 3 ページ

③整理_RunLog_2111Kr_211130.xlsx1_RunLog

2111KrRun Summary Sheet : CAMAC & LabView

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100 10 5

3

2

Trig

Wob AuF Kap IC1 PL1 ED

Det.SetupAir1 Air2 PL2,IC2,SSD

scnEDssd： Eスペクトル(１) Ecal用
scnEDssd01_202111040134
1:34:00 2:01:00 Ecal用: 39点x測定30sec
scnEDssd011 1:34:29 1:34:55 scanED001 0.0 um
2 1:35:07 1:35:37 scanED002 48.6 um
3 1:35:49 1:36:19 scanED003 100.2 um
4 1:36:31 1:37:01 scanED004 148.8 um
5 1:37:13 1:37:43 scanED005 197.4 um
6 1:37:55 1:38:25 scanED006 249.5 um
7 1:38:37 1:39:07 scanED007 297.5 um
8 1:39:19 1:39:49 scanED008 345.8 um
9 1:40:01 1:40:31 scanED009 397.4 um
10 1:40:43 1:41:13 scanED010 446.0 um
11 1:41:25 1:41:55 scanED011 498.8 um
12 1:42:07 1:42:37 scanED012 547.3 um
13 1:42:49 1:43:19 scanED013 596.4 um
14 1:43:31 1:44:01 scanED014 647.6 um
15 1:44:13 1:44:43 scanED015 699.6 um
16 1:44:55 1:45:30 scanED016 724.8 um
17 1:45:42 1:46:13 scanED017 748.2 um
18 1:46:25 1:46:55 scanED018 756.0 um
19 1:47:07 1:47:37 scanED019 760.6 um
20 1:47:49 1:48:19 scanED020 770.8 um
21 1:48:31 1:49:01 scanED021 777.9 um
22 1:49:13 1:49:43 scanED022 783.1 um
23 1:49:55 1:50:25 scanED023 792.8 um
24 1:50:37 1:51:07 scanED024 807.6 um
25 1:51:19 1:51:49 scanED025 817.8 um
26 1:52:01 1:52:31 scanED026 830.6 um
27 1:52:43 1:53:13 scanED027 844.5 um
28 1:53:25 1:53:55 scanED028 858.7 um
29 1:54:07 1:54:37 scanED029 869.5 um
30 1:54:49 1:55:19 scanED030 879.8 um
31 1:55:31 1:56:01 scanED031 887.9 um
32 1:56:13 1:56:43 scanED032 898.1 um
33 1:56:55 1:57:25 scanED033 908.4 um
34 1:57:37 1:58:07 scanED034 918.6 um
35 1:58:19 1:58:49 scanED035 921.2 um
36 1:59:01 1:59:31 scanED036 925.7 um
37 1:59:43 2:00:13 scanED037 944.8 um
38 2:00:25 2:00:55 scanED038 975.4 um
39 2:01:07 2:01:37 scanED039 1000.4 um

p.85
0:27:00 PL 6K, Sor 500cps, PandS

1 4 0 0 1 PandS R36 50u

IC2大 100u var

SSD@Air2

1 4 0 0 1 PandS R36 50u

IC2大 100u var

SSD@Air2

1 4 0 0 1 PandS R36 50u

IC2大 100u var

SSD@Air2

0:00:26
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:35
0:00:31
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30

scnEDssd： Eスペクトル(2) Ar,Kr用EDeg 厚さcalibl
scnEDssd02_202111040211
2:11:00 2:39:00 厚さcal用: 40点x測定30sec
scnEDssd021 2:12:01 2:12:31 scanED001 100.2 um
2 2:12:43 2:13:13 scanED002 100.8 um
3 2:13:25 2:13:55 scanED003 104.7 um
4 2:14:07 2:14:37 scanED004 110.4 um
5 2:14:49 2:15:19 scanED005 113.0 um
6 2:15:31 2:16:01 scanED006 125.3 um
7 2:16:13 2:16:43 scanED007 148.8 um
8 2:16:55 2:17:25 scanED008 196.4 um
9 2:17:37 2:18:07 scanED009 200.9 um
10 2:18:19 2:18:49 scanED010 206.6 um
11 2:19:01 2:19:31 scanED011 209.2 um
12 2:19:43 2:20:13 scanED012 221.4 um
13 2:20:25 2:20:55 scanED013 245.0 um
14 2:21:07 2:21:37 scanED014 296.6 um
15 2:21:49 2:22:19 scanED015 297.2 um
16 2:22:31 2:23:01 scanED016 485.9 um
17 2:23:13 2:23:43 scanED017 490.4 um
18 2:23:55 2:24:25 scanED018 496.1 um
19 2:24:37 2:25:07 scanED019 498.8 um
20 2:25:19 2:25:49 scanED020 511.0 um
21 2:26:01 2:26:31 scanED021 534.5 um
22 2:26:43 2:27:13 scanED022 586.2 um
23 2:27:25 2:27:55 scanED023 586.8 um
24 2:28:07 2:28:37 scanED024 682.3 um
25 2:28:49 2:29:19 scanED025 586.2 um
26 2:29:31 2:30:01 scanED026 590.7 um
27 2:30:13 2:30:43 scanED027 596.4 um
28 2:30:55 2:31:25 scanED028 599.0 um
29 2:31:37 2:32:07 scanED029 611.2 um
30 2:32:19 2:32:49 scanED030 634.8 um
31 2:33:01 2:33:31 scanED031 687.0 um
32 2:33:43 2:34:13 scanED032 782.6 um
33 2:34:25 2:34:55 scanED033 682.3 um
34 2:35:07 2:35:37 scanED034 686.8 um
35 2:35:49 2:36:19 scanED035 692.5 um
36 2:36:31 2:37:01 scanED036 695.1 um
37 2:37:13 2:37:43 scanED037 707.4 um
38 2:37:55 2:38:25 scanED038 730.9 um
39 2:38:37 2:39:07 scanED039 782.6 um
40 2:39:19 2:39:49 scanED040 783.1 um

p.86
0:28:00 PL 6K, Sor 500cps, PandS
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30
0:00:30

scnEDssd： Eスペクトル(3) Xe用EDeg 厚さcalibl
scnEDssd03_202111040257
p.86
2:57:00 3:14:00 厚さcal用: 25点x測定30sec
0:17:00 PL 6K, Sor 500cps, PandS
scnEDssd03上流ED=ArKr用 #8 500um=IN で、下流ED=Xe用 var で測定
1 2:57:51 2:58:16 scanED001 0.0 um
0:00:25
2 2:58:28 2:58:58 scanED002 48.6 um
0:00:30
3 2:59:10 2:59:40 scanED003 100.2 um
0:00:30
4 2:59:52 3:00:22 scanED004 25.0 um
0:00:30
5 3:00:34 3:01:04 scanED005 12.8 um
0:00:30
6 3:01:16 3:01:46 scanED006 100.8 um
0:00:30
7 3:01:58 3:02:28 scanED007 196.4 um
0:00:30
8 3:02:40 3:03:10 scanED008 245.0 um
0:00:30
9 3:03:22 3:03:52 scanED009 296.6 um
0:00:30
10 3:04:04 3:04:34 scanED010 221.4 um
0:00:30
11 3:04:46 3:05:16 scanED011 209.2 um
0:00:30
12 3:05:28 3:06:03 scanED012 297.2 um
0:00:35
13 3:06:15 3:06:46 scanED013 10.2 um
0:00:31
14 3:06:58 3:07:28 scanED014 58.8 um
0:00:30
15 3:07:40 3:08:10 scanED015 110.4 um
0:00:30
16 3:08:22 3:08:52 scanED016 35.2 um
0:00:30

2 / 3 ページ

③整理_RunLog_2111Kr_211130.xlsx1_RunLog

2111KrRun Summary Sheet : CAMAC & LabView

条件全て書くこと
Att

Fname
17
18
19
20
21
22
23
24

start
3:09:04
3:09:46
3:10:28
3:11:10
3:11:54
3:12:36
3:13:18
3:14:00

stop Header
3:09:34 scanED017 23.0 um
3:10:16 scanED018 111.0 um
3:10:58 scanED019 206.6 um
3:11:42 scanED020 255.2 um
3:12:24 scanED021 306.8 um
3:13:06 scanED022 231.6 um
3:13:48 scanED023 219.4 um
3:14:30 scanED024 307.4 um

Ender / LogNote
Elapsepg.
0:00:30
0:00:30
0:00:30
0:00:32
0:00:30
0:00:30
0:00:30
0:00:30

コメント

100 10 5

3

2

Trig

Wob AuF Kap IC1 PL1 ED

Det.SetupAir1 Air2 PL2,IC2,SSD

scnEDic： PL厚さ測定(2)scnEDic05_202111040349
3:49:00
scnEDic06_202111040435
4:35:00
scnEDic07_202111040512
5:12:00
scnEDic08_202111040549
5:49:00
scnEDic09_202111040622
5:12:00
scnEDic10_202111040654
6:54:00
scnEDic11_202111040709
7:09:00
scnEDic12_202111040728
7:28:00
scnEDic13_202111040754
7:54:00

scnEDic01再々chk PL1=100um
4:24:00 50点 x 30sec
PL1=無し5:04:00 54点 x 20sec
PL1=Anu500um : AlMylarのみ
5:41:00 54点 x 20sec
PL1=25um
6:15:00 49点 x 20sec
PL1=500um
5:41:00 52点 x 20sec
PL1=500um ため増し
7:00:00 54点 x 20sec
PL1=500um で WobOFF
7:24:00 途中でヤメ Au=IN だった
PL1=500um で WobOFF Au無し
7:50:00 51点 x 15sec
同上 ため増し
7:59:00 51点 x 15sec

p.87
p.88

PL1 HV=Off, IC2小=IN PL2無し IC2大=400V IC2小=400V
0:35:00 IC2大=8-9A IC2小=2.6-10A
0 2 0 0 1
IC2小なのでビーム強くした
0:29:000 2 0 0 1

R36 50u

IC2大 100u var

IC2小R36 50u

IC2大 無し var

IC2小0:29:000 2 0 0 1

R36 50u

IC2大 AlMy var

IC2小0:26:000 2 0 0 1

R36 50u

IC2大 25um var

IC2小0:29:000 2 0 0 1

R36 50u

IC2大 500umvar

IC2小0:06:000 2 0 0 1

R36 50u

IC2大 500umvar

IC2小0:15:00 IC2大=2.7-7A IC2小=2.9-9A

1 1 0 0 0

OFF 50u

IC2大 500umvar

IC2小0:22:00 IC2大=3.8-8A IC2小=2.7-8A

2 0 0 0 0

OFF 無しIC2大 500umvar

IC2小0:05:00

2 0 0 0 0

OFF 無しIC2大 500umvar

IC2小0:11:00 IC2大=4.4-7A IC2小=3.7-9A

1 0 0 1 1

OFF 73um

IC2大 500umvar

IC2小

p.88
p.88
p.88
p.88
p.89
p.89
p.89

加速器E測定： タマキ、小山
8:00:00 8:20:00 E(Kr) = 69.2 MeV/u
scnEDic14_202111040828
PL1=500um で WobOFF Au=73um
8:28:00 8:39:00 26点 x 15sec
21/11/04
8:40:00
MT終了
21/11/04 実験後：
aft1 10:07:58 10:27:28
以上。

p.90
p.90

p.91

0:19:30 SSD:Kr Gain

3 / 3 ページ