TR SCAN

TRIMOS ISSOKU｜SURFACE ANALYSIS INSTRUMENTS

TR SCAN
introduction
The TR Scan offers an innovative alternative to classical surface measurement. Its modular concept, allowing adaptation
to each application, and its simple use, make it very efficientin the workshop. Because of its simplicity of use, the TR Scancan be operated by workshop personnel to get reliable results secured with minimum training. All measured surfaces
can be treated according to current international standards
such as ISO, DIN, JIS, ASME, CNOMO etc., as well as theupcoming ISO 25178 3D standard.
The TR Scan is completely designed and manufactured in
Switzerland according to the highest quality standards. Robustness, reliability and longevity are part of our tradition.
Trimos instruments have been used in workshops and labs
for over 30 years.
The interchangeability of the measuring heads gives the possibility to select the most appropriate technology for eachapplication. This flexibility allows the characterization of surfaces in numerous application fields, such as mechanical industry (all types of machined surfaces), car and aerospaceindustries, photovoltaics, as well as plastics, papers, imprints,
fibrous materials, wood, abrasives, paint, cosmetics, etc.
MEASURING RESULTS FULLY COMPARABLE TO
CLASSICAL SYSTEMSCOMPLIES TO ALL INTERNATIONAL STANDARDSINTUITIVE, EASY TO USE INTERFACEROBUST INDUSTRIAL SYSTEM FOR THE WORKSHOPPOSSIBLE AUTOMATED MEASUREMENTS
MODULAR AND COMPACT CONCEPTMEASUREMENT AND ANALYSIS WITHIN SECONDSDESCRIPTION
Automated Z-Axis
Motorized axis allow for precise andautomated measurements. The working
distance is automatically worked out by
the system.

Interchangeable Measuring Heads
The unique system of interchangeable measuring
heads confers a high degree of adaptability toevery application. Changing a head is quickly
done and automatically recognized by the system.
Several technologies are available for complete
application coverage.

Trimos Nanoware Measure
Software for the management of all
measurement parameters

Motorized table (XY)

Trimos Nanoware Analysis
Software for the analysis of measured surfaces

TRIMOS ISSOKU｜SURFACE ANALYSIS INSTRUMENTS

TR SCANdisplay / software
Trimos Nanoware MeasureThis exclusive software allows the handling of the instrument(positioning and configuration of all measurements).
Positioning in X,Y,Z is performed either automatically by predefined parameters or via the use of an intuitive joystick aided by a integrated positioning laser and a camera (optional).
Once positioned, measurements are taken automaticallywith one click or via the use of a manual size parameter in a
few seconds.
INTUITIVE POSITIONING
INSTANT MEASUREMENTPROGRAMMABLE MEASUREMENTS WITH PICTURE

Trimos Nanoware Analysis

This software allows the analysis of all measured surfaces
according to current international standards such as ISO,
DIN, JIS, ASME, CNOMO etc., as well as the 3D standard
ISO 25178.
Analysis can be performed automatically by the use of a template, or the user can have direct access to the raw data. The
incorporated analysis software is powered by Mountains®,
the most powerful and recognized 2D/3D surface analysis
software available.
Reports are automatically generated during analysis. Any report can be used as a template later.
POWERFUL ANALYSISPROFESSIONAL REPORTINGSUITABLE MODULE FOR EACH APPLICATION NEEDCOMPLIES TO ALL INTERNATIONAL STANDARDSTHE CCM TECHNOLOGY
Chromatic Confocal Microscopy (CCM) has been acknowledged worldwide as an accurate and reliable technique fornon-contact surface measurement. A chromatic lens L generates the image of a point white-light source W as a continuumof monochromatic images located on the optical axis (“Chromatic coding”). A sample O is located inside the color-coded
segment and its surface scatters the incident light beam. The
backscattered light passes through the chromatic lens L in
the opposite direction, and arrives at a pinhole P which filters
out all wavelengths except a single wavelength, λM. The collected light is analysed by a spectrometer S. The sample position is directly related to the detected wavelength.
•
•
•
•
•
•

W
P
S

Ι
λ
λM

High resolution
Works on all types of sample materials
Wide choice of measuring ranges
Steep slope compatibility
Coaxial (no shadowing)
Recognised method by ISO 25178

L

λ1
λΜ
λΝ

O

CCM P1 measuring head+
CCM-P1(support & spectrometer)

TA-MI-701 ÷ 713
Optical pen

COMPLEMENTARY TECHNOLOGIESThe diagram here below shows the application field of the
TR Scan and of its various measuring heads according to thematerial structure.

CCM P11mm

Vertical Z

There is no universal technology for surface measurement.
The modularity of the TR Scan allows the use of the best
adapted head for each application.

DIA P11µm

DHM S2

1nm
1µm

1mm

Lateral XY

1m

TRIMOS ISSOKU｜ SURFACE ANALYSIS INSTRUMENTS

TR SCANMEASURING HEADSDHM S1 & S2
DHM Technology:• Smooth, grinded and polishedsurfaces• Steel, aluminium, titanium, silicon,
gold, ceramics, glass• High precision and speed, 2D/3D

CCM P1Chromatic Confocal Technology:• Machined and rough surfaces,
micro-structures• Metals, plastics, abrasives, papers,
textiles, cosmetics• Large vertical range, all materials,
2D/3D

DIA P1
Diamond Stylus Tip Technology:• Roughness measurement with contact• Classical roughness
measurements (2D)• Internal measurements

DIA

DHM

P1

S2

TECHNICAL SPECIFICATIONSTR Scan

101

201

301

Horizontal measuring range X

mm

-

100

100

Horizontal measuring range Y

mm

-

-

100

Vertical measuring range Z

mm

240

Measuring system resolution XYZ

µm

0.1

Positioning accuracy XYZµm

1

Rectitude of the guideways XY

µm

1.5

Max weight of the partkg

20

Measuring heads

DHM S1

DHM S2

CCM P1

DIA P1
10

Vertical resolution (Z)

nm

1

1

8 ÷ 22Lateral resolution (XY)

µm

0.6

0.6

0.9 ÷ 3.5

Typical measuring range Ra 1)

µm

0.4

1.6

>200 2)

Vertical measuring range 1)

µm

3

7

130 ÷ 400 2)

350

Max. permissible errors Ra

%

1%

1%

1% ÷ 5%5%

Repeatability (Ra, 1σ)

nm

< 0.1

< 0.1

<5 ÷ 20

Sample reflectivity%< 1% ÷ 100%

< 1% ÷ 100%1% ÷ 100%-

Field of view

mm

0.25 x 0.25

0.25 x 0.25

-

-

1)

Values may differ depending on the surface texture

2)

Objective dependent

2)
2)

1
20

2)

2)

9

DIAGRAM

119.5

698

193

650

505

STANDARD INSTRUMENTThe TR Scan instruments are supplied as follows :Instrument according to specification (without measuring head)1 measuring head (DHM S1, DHM S2, CCM P1+TA-MI-701/TA-MI-708)
PC with 1 TFT screen
Nanoware Measure and Nanoware Analysis software (according to selected model)
User’s manual (750 50 0028 03)

CODE NUMBER
TR ScanPurposeMeas. head

Axes

Software

TRS201CCM

Non-contact profiles
measurements 2D

CCM P1- 1 vertical axis Z- 1 horizontal axis X

Nanoware LT(2D analysis)

Extended profiles
measurements 3D,
metallic parts

DHM S2- 1 vertical axis Z- 1 horizontal axis X

Nanoware STT(2D/3D analysis)

3D measurements,
metallic parts

DHM S2- 1 vertical axis Z- 2 horizontal axes XY

Nanoware STT(2D/3D analysis)

700 405 20 11

TRS201DHM
700 405 20 21

TRS301DHM
700 405 30 11

The TR Scan can also be specifically equipped according to the needs for each application (head(s) and measuring table, software). An exhaustive list of equipments can be found in the accessories section.

TRIMOS ISSOKU｜SURFACE ANALYSIS INSTRUMENTS

TR SCANAPPLICATIONS

Surface spinning measurement on asteel printing roll (DHM S2)Classical 2D internal roughness
measurement (DIA P1)

Verification of an aluminium ring joint
gasket for the aircraft industry(DHM S2)

Texture analysis of a chemicallypolished titanium surface (DHM S2)

Instruments
for Surface Texture
Measurement

TR-SCAN | 1

1.
A REVOLUTIONARY CONCEPTThe need for miniaturization and increased machining accuracy has accelerated the evolution of materials technology from the micro to the nanoscale. More and more, traditional scanning, 2D and contact metrological
techniques do not have the capacity to properly characterize these surfaces. A new method of measurement is needed that has the required resolution and speed along with being non-destructive and truly three dimensional.
The Trimos® TR Scan with DHM® technology is the solution.

Instruments
for Surface Texture Measurement

B.

A.

Interchangeable
Measuring Heads

A. Automated Z-Axis
and Modular Measuring TableThe unique system of interchangeable
measuring heads confers a high degreeof adaptability to every application.
Changing a head is quick and automatically recognized by the system. Several
technologies are available for complete
application coverage.

Motorized X, Y, Z axes allow for precise
and automated measurements. It includes the ability to image large areasby the use of stitching and the convenience of automatic working distancedetection. The modularity of the X or
XY sample stage offers a high degree ofcustomization based on application.
B. No special skills needed
Trimos Nanoware allows for measurements to be taken automatically, using
predefined parameters, or manuallywith only the input of the measurement
size. Reports can be generated with
one touch through the use of predefined parameters and analysis templates,
eliminating the need for specialized training and measurement errors.

Highly Flexible System
The Trimos TR Scan is a flexible anduniversal surface texture measurement system focusing on Digital
Holographic Imaging Technology. No
other tool can compare to its combined
speed, resolution, ease of use and flexibility. Its automated and modular design
allow for a high degree of customization based on application’s needs andincreased functionality with integrated
stitching and profilometer compatibility.

Due to its simplicity, the TR Scan canbe operated by workshop personnel and reliable results secured withminimum training.
All measured surfaces can be treatedaccording to current international standards such as ISO, DIN, JIS, ASME,CNOMO etc., as well as the upcoming
ISO 25178 3D standard.

The TR Scan is completely designed
and manufactured in Switzerland
according to the highest quality
standards. Robustness reliability
and longevity is our tradition. Trimos
instruments have been used in work­
shops and labs for over 30 years.

TR-SCAN | 3

2.
Quick and Efficient Measurements

Intuitive
Positioning
Positioning in X,Y,Z is performed either
automatically by predefined parameters or via the use of an intuitive joystickaided by a integrated positioning laser
and a camera (optional).

Instant
Measurement
Once positioned, measurements are taken automatically with one click or via
the use of a manual size parameter in a
few seconds.

Powerful Analysis

Professional Reporting

Analysis can be performed automatically by the use of a template or the user
can have direct access to the raw data.
The incorporated analysis softwareis powered by Mountains®, the mostpowerful and recognized 2D/3D surface analysis software available.

Reports are automatically generated
during analysis. Any report can be used
as a template later.

Instruments
for Surface Texture Measurement

3.
The DHM Technology

CAMERA
SOURCEMIRROR

DHM by Lyncée Tec

SAMPLE

DHM® (Digital Holographic Microscopy) is a non-contact surface measurement technology originally developed
for the biotech and medical industry.
DHM generates a high-resolution 3D
digital image of a sample using theprinciple of holography. A hologram
generated by combining a coherent
reference wave with the wave received
from a sample is recorded by a CCD
camera and transmitted to a computerfor numerical reconstruction.
A single hologram is acquired in a few
microseconds, making the whole system insensitive to vibrations. Software
procedures allows computation of thecomplete wavefront emanating from an
object and provides:• Intensity images providing thesame contrast as with classical
optical microscopy• Phase images providing quanti­‑
tative data, defined at a sub-wave‑
length scale, used for accurate andstable 3D measurements.

The phase image reveals the surface
topography with a sub-nanometric vertical resolution. This digital approach
to holography allows the application ofcomputer-based procedures at a level
never reached in optical microscopy sofar. In particular the DHM principle features software compensation of opticalaberrations, digital image focusing andnumerical compensation for sample tilt
and environmental disturbances, making DHM instruments robust and easy
to use for routine inspections at the nanometer and micrometer scale.DHM isused exclusively by Trimos for surface
texture measurement. This technology
has numerous advantages compared to other contact and non-contact
measurement technologies: in particular extremely fast measurements, highresolution, simple working process nomoving parts and no requirement for
special environmental conditions.
• Acquisition in a few microseconds• Vibration incensitive• High image quality• Subnanometric resolution• No moving parts• No requirement for special environmental conditions

DHM is a recognized surface texture
measurement method according to thestandard ISO 25178-6.

TR-SCAN | 5

4.
Applications Versatility• Materials• Optics• Forensic• Photovoltaic• MEMS• Semiconductor• Electronic

The TR Scan provides rapid, reliable and accurate surface texture characterization
for a large application range and materials such as steel, aluminum, brass, titanium,
silicon, gold, ceramics, glass etc. The system can be tailored to fit the requirementsof many industries :• Automotive• Aircraft• Machine Tool
• Watch• Printing• Railway• Bearing• Medical

Steel Surface spinning measurement ona printing roll (DHM S2)

Titanium Texture analysis of a chemically polished surface (DHM S2)Glass Roughness inspection of microlenses (DHM S2)Silicon Analysis of a silicon
microstructure (DHM S2)

Aluminium Verification of a ring type joint
gasket for the aircraft industry (DHM S2)

Cobalt-chromium Quality control of apolished prosthesis surface (DHM-S2)

Ceramics Depth measurement of alaser engraving (CCM-P1)

Abrasive Surface texture analysis of anindustrial abrasive material (CCM P1)

Stylus tip Classical 2D internalroughness measurement (DIA P1)

Instruments
for Surface Texture Measurement

DHM

5.

DIA

S2

P1

DHM S2
DHM Technology• Smooth surfaces, grinded or polished• High precision and measurement speed

Technical Specifications

CCM P1Chromatic Confocal Technology• Rough surfaces, microforms• Light-diffusing materials, plastics,
biomaterials

DHM

S2

DIA

P1

DIA P1
Diamond Stylus Tip Technology• Classical roughness measurement• Internal measurements

TR-SCAN
Measuring heads

Technology

DHM S2

CCM P1

DIA P1DHM

Chromatic Confocal

Stylus tip
10

Vertical resolution (Z)

nm

0.1

5 .. 35 2)

Lateral resolution (XY)

1

µm

0.6

1.1 .. 4.0

2)

1)

Typical max. measuring range Raµm

120 .. 2002)

Typical max. measuring range Rz1)

µm

5

300 .. 1100 2)

200

Max. permissible errors Ra%

1%

1% .. 5% 2)

5%Repeatability (Ra, 1σ)

nm

< 0.1

<5 .. 25

9

Sample reflectivity%< 1% - 100%1% - 100%-

Field of view

mm

0.25 x 0.25

-

-

2)

20

1) Values may differ depending on the surface texture2) Objective dependent

Instruments
TR Scan

100

200

300

Horizontal measuring range X

mm

-

100

100

Horizontal measuring range Y

mm

-

-

100

Vertical measring range Z

mm

240

Meas. System resolution XYZ

µm

0.1

Positioning accuracy XYZµm

1

Max weight of the partkg

20

Instruments for Surface Measurement
TR PROFILE
Compact instrument for themeasurement of roughness profiles (2D)
Stylus with and without skid

TR Profile DH-7
Portable workshop instrument for themeasurement of roughness profiles (2D)
Stylus with and without skid

TR Scan
CNC instrument for the measurement ofroughness profiles (2D) and surfaces (3D)with and without contact

TRIMOS SA
Av.de Longemalle 5
CH - 1020 Renens
T. + 41 21 633 01 01
F. + 41 21 633 01 02
www.trimos.ch

750 02 0017 03 - version 1.1 / 2010-04 – Changes without prior noticeTR SCANPREMIUM

TRIMOS ISSOKU｜ SURFACE ANALYSIS INSTRUMENTS

TR SCAN PREMIUM
introduction
TR Scan Premium allows the measuring of the most sensitive surfaces with astounding speed and precision. It has
become unavoidable in many cases for hi-tech applications,when the traditional measuring by contact has reached its
limits. Medical appliances, prosthesis, wafers, MEMS, semiconductors, metallic layers deposits, polymer films, opticalcomponents, research and development, quality control, arethe areas of expertise of TR Scan Premium.
The heart of the system, Trimos DHM® (Digital Holographic
Microscopy), constitutes a derivation of a technology usedin the biomedical engineering field. The system itself is basedon the physical characteristics of the hologram for the topography generation of the analysed surface. This technology for checking industrial surfaces is exclusively used by
Trimos. Its most distinctive feature to competitive products
is the possibility of measuring extreme reflecting, mirror-polished or very small surfaces.
The exceptional high measuring speed coupled with an accuracy range of a nanometre form the main advantages of the TR
Scan. Only some microseconds are needed for the acquisitionof a three dimensional image (x, y, z) with a million points. This
exceptional acquisition speed allows ignoring all problems
traceable to vibrations, the traditional enemy of the majority of
optical measuring systems. The mentioned advantages provean enhanced productivity and a limited investment.
EXCEPTIONAL FAST MEASURING SPEED
INSENSITIVE TO VIBRATIONVERTICAL RESOLUTION IN NANOMETER RANGE
EXTREME SIMPLE POSITIONING OF THE PART THANKSTO LASER ALIGNMENT (DHM)
NON-CONTACT MEASURING, NON DESTRUCTIVE
SOFTWARE AT THE TOP OF THE TECHNOLOGY
PRE-PROGRAMMED MEASURING PROCESSESCOMPATIBLE WITH 2D AND 3D STANDARDSDESCRIPTION
Automated Z-Axis
The motorization of the axes allows
entirely automatic measurements.
The working distance is automaticallygiven by the system. The measurementof surfaces wider than the field of visionof the lens is made possible thanks to aparticularly efficient “stitching” function.

Interchangeable Measuring Heads
The unique system of interchangeable measuring
heads confers a high degree of adaptability toevery application. Changing a head is quickly
done and automatically recognized by the system.
Several technologies are available for complete
application coverage.

Trimos Nanoware Measure
Software for the management of all
measurement parameters

Motorized table (XY)

Trimos Nanoware Analysis
Software for the analysis ofmeasured surfaces

TRIMOS ISSOKU｜ SURFACE ANALYSIS INSTRUMENTS

TR SCAN PREMIUM
display / software
Trimos Nanoware MeasureThis exclusive software allows the handling of the instrument(positioning and configuration of all measurements).
Positioning in X,Y,Z is performed either automatically by predefined parameters or via the use of an intuitive joystick aided by a integrated positioning laser and a camera (optional).
Once positioned, measurements are taken automaticallywith one click or via the use of a manual size parameter in a
few seconds.
INTUITIVE POSITIONING
INSTANT MEASUREMENTPROGRAMMABLE MEASUREMENTS WITH PICTURE

Trimos Nanoware Analysis

This software allows the analysis of all measured surfaces
according to current international standards such as ISO,
DIN, JIS, ASME, CNOMO etc., as well as the 3D standard
ISO 25178.
Analysis can be performed automatically by the use of a template or the user can have direct access to the raw data. The
incorporated analysis software is powered by Mountains®,
the most powerful and recognized 2D/3D surface analysis
software available.
Reports are automatically generated during analysis. Any report can be used as a template later.
POWERFUL ANALYSISPROFESSIONAL REPORTINGSUITABLE MODULE FOR EACH APPLICATION NEEDCOMPLIES TO ALL INTERNATIONAL STANDARDSTHE DHM TECHNOLOGY

DHM® (Digital Holographic Microscopy) is a non-contact surface measurement technology originally developed
for the biotech and medical industry.
DHM generates a high-resolution 3D
digital image of a sample using theprinciple of holography. A hologram
generated by combining a coherent
reference wave with the wave received
from a sample is recorded by a CCD
camera and transmitted to a computerfor numerical reconstruction.
A single hologram is acquired in a few
microseconds, making the whole system insensitive to vibrations. Software
procedures allows computation of thecomplete wavefront emanating from an
object and provides:• Intensity images providing the same
contrast as with classical optical microscopy• Phase images providing quanti tative
data, defined at a sub-wavelengthscale, used for accurate and stable
3D measurements.
The phase image reveals the surface
topography with a sub-nanometric vertical resolution. This digital approach
to holography allows the application ofcomputer-based procedures at a level
never reached in optical microscopy sofar. In particular the DHM principle features software compensation of opticalaberrations, digital image focusing andnumerical compensation for sample tilt
and environmental disturbances, making DHM instruments robust and easy
to use for routine inspections at thenanometer and micrometer scale.DHM
is used exclusively by Trimos for surface
texture measurement. This technology
has numerous advantages comparedto other contact and non-contact measurement technologies: in particular
extremely fast measurements, highresolution, simple working process nomoving parts and no requirement for
special environmental conditions.

•
•
•
•
•
•

Acquisition in a few microseconds
Vibration incensitive
High image quality
Subnanometric resolution
No moving parts
No requirement for special environmental conditions

DHM is a recognized surface texture
measurement method according to thestandard ISO 25178-6

TRIMOS ISSOKU｜SURFACE ANALYSIS INSTRUMENTS

TR SCAN PREMIUM
MEASURING HEADSDHM S1 & S2
DHM Technology:• Smooth, grinded and polishedsurfaces• Steel, aluminum, titanium, silicon,
gold, ceramics, glass• High precision and speed, 2D/3D

DIA P1
Diamond Stylus Tip Technology:• Roughness measurement with contact• Classical roughness
measurements (2D)• Internal measurements

CCM P1Chromatic Confocal Technology:• Machined and rough surfaces,
micro-structures• Metals, plastics, abrasives, papers,
textiles, cosmetics• Large vertical range, all materials,
2D/3D

DIA

DHM

P1

S2

TECHNICAL SPECIFICATIONSTR Scan Premium

101

301

Horizontal measuring range X

mm

-

100

Horizontal measuring range Y

mm

-

100

Vertical measuring range Z

mm

240

Measuring system resolution XYZ

µm

0.1

Positioning accuracy XYZµm

1

Rectitude of the guideways XY

µm

0.3

Max weight of the partkg

20

Measuring Heads

DHM S1

DHM S2

CCM P1

DIA P1
10

Vertical resolution (Z)

nm

0.1

0.1

8 ÷ 7802)Lateral resolution (XY)

µm

0.6

0.6

0.9 ÷ 14

2)

Typical measuring range Ra 1)

µm

0.4

1.6

0.012 ÷ >200 2)

20

Vertical measuring range 1)

µm

3

7

130 ÷ 24000 2)

350

Max. permissible errors Ra

%

1%

1%

1% ÷ 5%5%

Repeatability (Ra, 1σ)

nm

< 0.1

< 0.1

<5 ÷ 25

Sample reflectivity%< 1% ÷ 100%

< 1% ÷ 100%1% ÷ 100%-

Field of view

mm

0.25 x 0.25

0.25 x 0.25

-

-

1)

Values may differ depending on the surface texture

2)

Objective dependent

2)

2)

1

9

DIAGRAM

119.5

698

193

650

505

STANDARD INSTRUMENTThe TR Scan Premium instruments are supplied as follows :Instrument according to specification (without measuring head)1 measuring head (DHM S1, DHM S2, CCM P1+TA-MI-701 ÷ 713)
PC with 1 TFT screen
Nanoware Measure and Nanoware Analysis softwares (according to selected model)
User’s manual (750 50 0028 03)

CODE NUMBER
TR Scan Premium

PurposeTRSP101DHM

3D Measurementof tiny parts

700 405 10 11

TRSP301DHM
700 405 30 21

TRSP301CCM
700 405 30 31

Meas. head

Axes

Software

DHM S2- 1 vertical axis Z

Nanoware STT(2D/3D analysis)

3D measurement ofmetallic parts

DHM S2- 1 vertical axis Z- 2 horizontal axes XY

Nanoware STT(2D/3D analysis)

Universal 3D
measurements

CCM P1- 1 vertical axis Z
2 horizontal axes XY

Nanoware STT(2D/3D analysis)

TR Scan Premium can also be specifically equipped according to each application need (head(s) and measuring table, software). An exhaustive list of equipments can be found in the accessories section.

TRIMOS ISSOKU｜ SURFACE ANALYSIS INSTRUMENTS

TR SCAN PREMIUMAPPLICATIONS

Quality control of a cobalt-chromium
polished prosthesis surface (DHM-S2)

Analysis of a silicon microstructure(DHM S2)

Roughness inspection of microlenses (DHM S2)

Surface texture analysis of anindustrial abrasive material (CCM P1)

Depth measurement of alaser engraving on ceramics (CCM-P1)

Topographic analysis of a leatherette
sample (CCM-P1)

Measurment of macroscopic surface
textures (CCM P1)

TA-MI-701
279 970000 001

TA-MI-707
279 970001 001

TA-MI-708
279 970001 002

TA-MI-702
279 970000 002

TA-MI-713
279 970002 002

TA-MI-709
279 970001 003

TA-MI-703
279 970000 003

TA-MI-710
279 970001 004

TA-MI-704
279 970000 004

TA-MI-711
279 970001 005

TA-MI-705
279 970000 005

TA-MI-712
279 970001 006

TA-MI-706
279 970000 006

TA-MS-601
279 980001 001

TR Scan Premium

TR Scan

TR Profile DH-8 VHF

TR Profile DH-8 VH

TR Profile VHF

TR Profile VH

ACCESSOries

Optical pen, with optical fiber and certificate,measuring range=130 μm,
lateral resolution=0.9 μm• •Optical pen, with optical fiber and certificate,measuring range=130 μm,
lateral resolution=1.4 μm• •Optical pen, with optical fiber and certificate,measuring range=400 μm,
lateral resolution=1.2 μm• •Optical pen, with optical fiber and certificate,measuring range=400 μm,
lateral resolution=1.7 μm• •Optical pen, with optical fiber and certificate,measuring range=400 μm,
lateral resolution=3.5 μm• •Optical pen, with optical fiber and certificate,measuring range=1400 μm,
lateral resolution=2 μm•

Optical pen, with optical fiber and certificate,measuring range=1400 μm,
lateral resolution=4 μm•

Optical pen, with optical fiber and certificate,measuring range=4000 μm,
lateral resolution=4 μm•

Optical pen, with optical fiber and certificate,measuring range=4000 μm,
lateral resolution=7 μm•

Optical pen, with optical fiber and certificate,measuring range=12000 μm,
lateral resolution=7 μm•

Optical pen, with optical fiber and certificate,measuring range=124000 μm,
lateral resolution=12.37 μm•

Optical pen, with optical fiber and certificate,measuring range=24000 μm,
lateral resolution=8 μm•

Optical pen, with optical fiber and certificate,measuring range=24000 μm,
lateral resolution=14 μm•

Standard tracer, with skid R = 25 mmbore > Ø 8 mm, depth < 27 mm• • • •

TRIMOS ISSOKU｜ HEIGHT GAUGESTR ScanTR ScanPremium

TR Profile VH

ACCESSOries

TA-MS-602
279 980001 002

TA-MS-603
279 980001 003

TA-MS-604
279 980002 001

TA-MS-605
279 980002 002

TA-MS-606
279 980002 003

TA-MS-607
279 980003 001

TA-MS-608
279 980004 001

TA-MS-612
279 980004 005

TA-MS-611
279 980004 004

TA-MS-609
279 980004 002

TA-MS-610
279 980004 003

Probe for small axes, knives, edges and wires
with skid R=25 mm
Probe for small axes, knives, edges and wires
without skid
Bore probe with skid R=10 mmbore >Ø2.5 mm, depth < 20 mm• • • ••• • •• • • •

Bore probe, without skid
bore >Ø1.5 mm, depth < 12 mm

•

• • •

Small bore probe, without skid
bore >Ø0.8 mm, depth < 12 mm

•

• • •

Concave-convex probe, with skid R=1 mm
for concave & convex workpieces with R>5 mm• • • •

Probe for slots, with skid R=25 mm
slot depth < 15 mm, slot width > 3 mm

• • • •

Probe for slots, H=5 mm, without skid
slot depth < 5 mm, slot width > 1.0 mm

•

• • •

Probe for slots, H=10 mm, without skid
slot depth < 10 mm, slot width > 1.0 mm

•

• • •

Probe for slots, H=15 mm, without skid
slot depth < 15 mm, slot width > 1.5 mm

•

• • •

Probe for slots, H=20 mm, without skid
slot depth < 20 mm, slot width > 1.5 mm

•

• • •

Probe for gear tooth profiles, with skid ,module >= 2

• • • •

279 980006 001

Probe for circumference and balls, with skidfor Ø >= 6 mm

• • • •

TA-MS-622

Transverse probe, with skid R=25 mm• • • •

Transverse probe for slots, with skid R=1 mm
slot depth < 7 mm

• • • •

TA-MS-620
279 980005 001

TA-MS-621

279 980007 001

TA-MS-623
279 980007 002

TR Scan Premium

DH-8 VHF

TR Scan

TR Profile

DH-8 VH

TR Profile DH-8 VHF

TR Profile

TR Profile DH-8 VH

TR Profile VHF

TR Profile VHF

TR Profile VH

TA-MS-624

15

22

TR Scan Premium

TR Scan

TR Profile DH-8 VHF

TR Profile DH-8 VH

TR Profile VHF

TR Profile VH

ACCESSOries• • • •

279 980007 003

Transverse probe for bores,
with skid R=25 mm

TA-MS-626

Transverse probe left side, without skid

•

• • •

Transverse probe right side, without skid••

279 980007 004

TA-MS-627
279 980007 005

279 980008 001

Depth measuring probe, with skid R=25mm
depth < 130 mm• • • •

TA-AD-601

Extension 100 mm for probe• • • •

Extension 150 mm for probe• • • •

Extension 200 mm for probe• • • •

Extension 500 mm for probe• • • •

Extension 750 mm for probe• • • •

TA-MS-625

279 980901 001

TA-AD-602
279 980901 002

TA-AD-603
279 980901 003

TA-AD-604
279 980901 004

TA-AD-605
279 980901 005

TA-MS-650

Contour tracer•

Contour measurement kit - Simple (for TR Profile
DH-8/VHF), Contour tracer (TA-MS-650) withstandard (TA-MG-651), DIASOFT Standard (TASW-602) & contour module Simple (TA-SW-610)•

Contour measurement kit - Advanced (for TR
Profile DH-8/VHF, Contour tracer (TA-MS-650) withstandard (TA-MG-651), DIASOFT Standard (TASW-602) & contour mod. Advanced (TA-SW-611)•

279 980010 001

TA-MS-651
279 980010 002

TA-MS-652
279 980010 003

DHM-S1

Measuring head DHM S1• •Measuring head DHM S2• •709 70 001

DHM-S2709 70 002

TRIMOS ISSOKU｜ HEIGHT GAUGESTR ScanTR ScanPremium

TR Profile VH

ACCESSOries

CCM-P1

Measuring head CCM P1• •Measuring head DIA P1• •709 70 005

DIA-P1TR Scan Premium

DH-8 VHF

TR Scan

TR Profile

DH-8 VH

TR Profile DH-8 VHF

TR Profile

TR Profile DH-8 VH

TR Profile VHF

TR Profile VHF

TR Profile VH

709 70 003

279 981001 001

XY table, base plate 70 x 70 mm,
travel range 25 x 25 mm• • • •

TA-SU-602

Vice for XY table TA-SU-601, opening 22mm

• • • •

Measuring stand with drive unit holder
with aluminium base and column H=250 mm• • • •

Measuring stand with drive unit holder
with aluminium base and column H=500 mm• • • •

Measuring stand with drive unit holder
with granite base and column H=250 mm• • • •

279 982001 004

Measuring stand with drive unit holder
with granite base and column H=500 mm• • • •

TA-AD-609

Drive unit holder• • • •

Set with measuring stand and XY meas. table
TA-AD-606 and TA-SU-601• • • •

279 989001 002

Set with measuring stand,XY meas.
table and vice TA-SU-603 and TA-SU-602• • • •

TA-SU-605

Swivelling stand, with magnetic base• • • • • •Precision vice 15 x 15 x 50 mm• • • • • •Precision vice 25 x 25 x 75 mm• • • • • •Precision vice 35 x 35 x 100 mm• • • • • •TA-SU-601

279 981901 001

TA-AD-606
279 982001 001

TA-AD-608
279 982001 003

TA-AD-607
279 982001 002

TA-AD-610

279 982901 001

TA-SU-603
279 989001 001

TA-SU-604

297 700003 001

TA-SU-606
297 700004 001

TA-SU-607
297 700004 002

TA-SU-608
297 700004 003

TR Scan Premium

TR Scan

TR Profile DH-8 VHF

TR Profile DH-8 VH

TR Profile VHF

TR Profile VH

ACCESSOries

Support plate for vice TA-SU-606• • • • • •Support plate for vice TA-SU-607• • • • • •Support plate for vice TA-SU-608• • • • • •Clamping set, TA-SU-605/TA-SU-607/TA-SU-610• • • • • •Roughness standard, Ra=3.0 μm• • • • • •278 980001 002

Roughness standard, Ra=3.0 μm,
with SCS certificate• • • • • •TA-MG-611

Roughness standard, Ra=1.0 μm• • • • • •Roughness standard, Ra=1.0 μm, with SCS certificate• • • • • •Roughness standard Ra=25 nm, with DKD Certificate• •Roughness standard Ra=50 nm, with DKD Certificate• •Roughness standard Ra=80 nm, with DKD Certificate• •Roughness standard Ra=0.2 μm, with DKD Certificate• • • • • •Roughness standard Ra=0.5 μm, with DKD Certificate• • • • • •Roughness standard Ra=1.5 μm, with DKD Certificate• • • • • •TA-SU-609
297 700005 001

TA-SU-610
297 700005 002

TA-SU-611
297 700005 003

TA-SE-601
605 01 021

TA-MG-609
278 980001 001

TA-MG-610

278 980001 003

TA-MG-612
278 980001 004

TA-MG-601
278 980010 001

TA-MG-602
278 980010 002

TA-MG-603
278 980010 003

TA-MG-605
278 980010 005

TA-MG-606
278 980010 006

TA-MG-607
278 980010 007

TA-MG-604
278 980010 004

Set of roughness standards Ra=25/50/80 nmwith DKD Certificate• •278 980010 008

Set of roughness standards Ra=0.2/0.5/1.5 μm
with DKD Certificate• • • • • •TA-MG-651

Contour standard• • • • • •Contour standard, with SCS certificate• • • • • •TA-MG-608

278 980001 011

TA-MG-652
278 980001 012

TA-EL-040
358 0020

Joystick• •TR ScanTR ScanPremium

ACCESSOries

LABC-40

Laser printer (USB)• •Inkjet printer (USB)• •Power cable, 2 poles, Europe• •Power cable, 2 poles, USA/Japan• •Power cable, 2 poles, Australia• •Power cable, 2 poles, UK• •Power cable, 2 poles, Korea• •356 0010

TA-EL-030
356 0016

TA-EL-001
332 10 0011

TA-EL-002
332 10 0013

TA-EL-003
332 10 0016

TA-EL-004
332 10 0014

TA-EL-005
616 20 003

TA-SW-601
394 1 3301

TA-SW-602
394 1 3302

TA-SW-603
394 1 3303

TA-SW-604
394 1 3304

TA-SW-610
394 1 3310

TA-SW-611
394 1 3311

TA-SW-612
394 1 3312

Nanoware LT
616 60 010

Nanoware XT
616 60 011

TR Scan Premium

DH-8 VHF

TR Scan

TR Profile

DH-8 VH

TR Profile DH-8 VHF

TR Profile

TR Profile VHF

TR Profile VHF

TR Profile VH

TR Profile VH

TR Profile DH-8 VH

TRIMOS ISSOKU｜HEIGHT GAUGES

Software DIASOFT Basic, Predefined protocol,roughness and Abbott curve,(Ra, Rq, Rv, Rp, Rt,
Sm, Rsk, Rku, Rz, RTp, RHTp, RDq, RPc)

• • • •

Software DIASOFT Standard, Same as TA-SW-601+ individual protocols, zoom, symmetry,
profile comparison, (RLq, Rlo, RzJIS, R3z)• • • •

Software DIASOFT Automotive , Same as TASW-602 + additionally with ISO 12085 (CNOMO),
and ISO 13565, (parameter Rk)• • • •

Software DIASOFT Expert. The most complete
software for roughness measurement• • • •

Module DIASOFT Contour Simple(for TA-SW-602/603/604)•

Module DIASOFT Contour Advanced(for TA-SW-602/603/604)•

Module DIASOFT Statistics (roughness)(for TA-SW-602/603/604)• • • •

Module for profile analysis NanoWare LT
profile measurement 2D - Basic• •Module for profile analysis Nanoware XT
profile measurements 2D - Advanced• •Nanoware STT Module for profile and surface analysis
616 60 012
NanoWare STT, 3D roughness Software - Basic• •Nanoware XTT Module for profile and surface analysis
616 60 013
Nanoware XTT, Roughness software 3D - Advanced• •Nanoware PRO Complete module for profiles and surfaces Nano616 60 014
Ware PRO, Roughness software 3D - Professional• •