^/^^ͲϭϳdŚĞ^ĐŝĞŶƚŝĨŝĐ/ŶƚĞƌŶĂƚŝŽŶĂů^ǇŵƉŽƐŝƵŵŽŶ^/D^ĂŶĚZĞůĂƚĞĚdĞĐŚŶŝƋƵĞƐĂƐĞĚŽŶ/ŽŶͲ^ŽůŝĚ/ŶƚĞƌĂĐƚŝŽŶƐ ĂƚĞ͗June 25 and 26, 2015sĞŶƵĞ͗Meeting Room on the 4th floor, University Building #14,
      Seikei University, TokyoKƌŐĂŶŝǌŝŶŐŽŵŵŝƚƚĞĞ͗
Hisayoshi Yurimoto (Hokkaido University), Chair
Akio Takano (NTT-AT), Executive Committee
Masashi Nojima (Tokyo University of Science)
Satoka Aoyagi (Seikei University)
Songsu Cho (Ametek)
Makishi Ishikawa (Ametek)
Syuji Ishikawa (Hitachi High-Tech Solutions)
Akiya Karen (National Institute for Materials Science)
Masahiro Kudo (Seikei University)
Toyomitsu Miyasaka (Asahi Kasei)
Jiro Matsuo (Kyoto University)
Atsushi Murase (Toyota Central R&D Labs.)
Suguru Nishinomiya (Nippon Steel & Sumitomo Metal)
Retsu Oiwa (Oxford Instruments)
Shinya Otomo (Furukawa Electric)
Reiko Saito (Toshiba)
Yasuo Shimizu (Tohoku University)
Tatsuya Shiramizu (Mitsubishi Electric)
Takahiko Suzuki (ULVAC-PHI)

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PROGRAM & CONTENTS

3URJUDPDQG&RQWHQWV-XQH 7KX    2SHQLQJUHPDUN     3OHQDU\ 
2     3OHQQDU\WDON «««««««««««««««««««««  Projectile Assisted Surface Chemistry: A possible Route to Enhance
Molecular Secondary Ion Yields?
A. Wucher2     ,QYLWHG (Universität Duisburg-Essen)««««««««««««««««««««««««  Low Energy Cesium: an Alternative Pathway for Organic Depth Profiling
L. Houssiau(University of Namur)2     ,QYLWHG    ««««««««««««««««««««««««  ToF-SIMS depth profiling of nanoparticles
L. Yang(Xi’an Jiaotong Liverpool University)2     ,QYLWHG    ««««««««««««««««««««««««  Transmission SIMS: A novel approach to achieving higher secondary ion yields of intact

biomolecules
K. Kimura(Kyoto University)/XQFK     ,QRUJDQLF6HVVLRQ    2     ,QYLWHG«««««««««««««««««««««««««

Atom Probe Analysis on Compound Semiconductor Devices for Automotive Applications
K. Nishikawa
2    «,QYLWHG

(Toyota Central R&D Labs., Inc.)««««««««««««««««««««««««

Dynamic SIMS is Not Dead (in fact, it’s more fun than ever!)C. Magee(Evans Analytical Group, Inc.)

2    ««««««««««««««««««««««««««««««Investigation of dopant and impurity profiles on SiC-MOSFET by Dynamic SIMS anddual-beam TOF-SIMS
J. Sameshima(Toray Research Center Inc.)

2    ««««««««««««««««««««««««««««««Probing fast grain boundary diffusion by ToF-SIMS depth profiling with Selective
Attenuation of Specific Secondary Ions (SASI)
H. Téllez(Kyushu University)

PROGRAM & CONTENTS

2    «««««««««««««««««««««««««««««

3D-SIMS application by using Checker Board of IMS-7f
T. Asakawa(Seiko Epson Corporation)2    ««««««««««««««««««««««««««««  Applications of TOF-SIMS in Materials Protection
Chunli Dai(Chinese Academy of Science.)%UHDN     0DNHU6HVVLRQ    2  «««««««««««««««««««««««««««««  

The LEAP 5000 ando State of the Art Applications(AMETEKoCAMECA)

Ty Prosa

2    «««««««««««««««««««««««««««««

Recent development of PHI nano TOF II with various capabilities
T. Miyayama (ULVAC-PHI, Inc.)
2    «««««««««««««««««««««««««««««In order to expand the Application of FILMER
T. Ishikawa(TOYAMA CO. LTD.)2    «««««««««««««««««««««««««««««

TOF.SIMS 5 - A Success Story for All Kind of SIMS Applications
T. Grehl(ION-TOF GmbH)   3RVWHUVKRUWSUHVHQWDWLRQIRUSRVWHUV     3RVWHUVHVVLRQ  3  ««««««««««««««««««««««««««««««««««««  

Development of high-precision analysis of multilayer structureT. Imazawa(Mitsubishi Electric Corporation)3  ««««««««««««««««««««««««««««««««««««  

Quantitative and Qualitative Study of halogen and sodium doped Silicon and Silicon
Oxides by Atom Probe Tomography
N. Mayama(Toshiba Nanoanalysis)3  ««««««««««««««««««««««««««««««««««««  

Cluster Analysis of Aerosol Particles with FIB-TOF-SIMS
M. Morita(Kogakuin University)

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PROGRAM & CONTENTS

3  ««««««««««««««««««««««««««««««««««««  

Observation of Boron Ionization in Silicon by Nonresonant PhotoionizationSputtered Neutral Mass Spectrometry
H. Akutsu(Toshiba Corporation Semiconductor & Storage Products Company)

3  ««««««««««««««««««««««««««««««««««««  TOF-SIMS depth profiling of Li in glasses by C60 sputtering
Y. Lang(ASAHI GLASS CO., LTD.)

3  ««««««««««««««««««««««««««««««««««««  Cluster secondary ion mass spectrometry of polyester/melamine resin
S. Nishinomiya(Nippon Steel & Sumitomo Metal Corporation)3  ««««««««««««««««««««««««««««««««««««  

The Effect of Yield and Damage Cross-Section on Imaging Analysis of Organic Materialsby Different Primary Bi ions in TOF-SIMS
R. Shishido (Tohoku University)3  ««««««««««««««««««««««««««««««««««««  

Chemical mapping of organic/inorganic chemicals in frozen-hydrated biological samples
D. Aoki(Nagoya University)3  ««««««««««««««««««««««««««««««««««««  

Development of SIMS instruments with Focused Cluster Ion Beam toward New Applications
K. Suzuki(Kyoto University)3  ««««««««««««««««««««««««««««««««««««Removal of Damage Layer on Polymer Surface by Using Ar-GCIB
S. Iida(ULVAC-PHI, Inc.)

3««««««««««««««««««««««««««««««««««««  

Practical examples of mass scale calibration with quaternary ammonium ion inTOF-SIMS
D. Kobayashi
3(Asahi Glass CO., LTD.)«««««««««««««««««««««««««««««««««««  Evaluation of Linearity of the Instrumental Intensity Scale in Static TOF-SIMS Using Moor Pd Isotopes
A. Murase(Toyota Central R&D Labs., Inc.)

3««««««««««««««««««««««««««««««««««««  

Development of a cycloid mass separator by rotating electric field
M. Nojima   6RFLDO PHHWLQJ 

(Tokyo University of Science)PROGRAM & CONTENTS-XQH )UL    ,QRUJDQLF %LR0HGLFDO  2     ,QYLWHG  ««««««««««««««««««««««««  

MALDI-MS-Based Metabolomic Imaging for Visualizing Spatiotemporal MetabolicBehaviors
D. Miura2  (Kyushu University)««««««««««««««««««««««««««««««  Three-Dimensional Image of Cleavage Bodies in Nuclei Is Configured Using Gas Cluster
Ion Beam with Time-of-Flight Secondary Ion Mass Spectrometry
N. Masaki(Hamamatsu University School of Medicine)2     ,QYLWHG  ««««««««««««««««««««««««Imaging the Distributions of Cholesterol and Sphingolipids in Cellular Membranes withHigh-Resolution SIMS
M. Kraft(University of Illinois)

2     ,QYLWHG  «««««««««««««««««««««««  Biomolecular imaging of tissues, liposomes and fossils using TOF-SIMS
P. Sjövall(SP Technical Research Institute of Sweden)%UHDN     ,QRUJDQLF %LR0HGLFDO  2     ,QYLWHG  «««««««««««««««««««««««  ToF-SIMS 3D Imaging and Depth Profiling of (Bio)Polymers
B. Hagenhoff(Tascon GmbH)2    «««««««««««««««««««««««««««««  

Interfacial analysis of organic multilayer by using 3D TOF-SIMS imaging
H. Noda(FUJIFILM Corporation)2      ,QYLWHG  «««««««««««««««««««««««Application of NanoSIMS to Deep Subseafloor Life
F. Inagaki/XQFK  (Japan Agency for Marine-Earth Science and Technology)

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PROGRAM & CONTENTS  ,QRUJDQLF %LR0HGLFDO  2  ,QYLWHG  «««««««««««««««««««««««««  Enhancing SIMS ionisation using water cluster ion beams
N. Lockyer(The University of Manchester)2    ««««««««««««««««««««««««««««  

Energy dependent proton attachment to amino acid via large water, methanol cluster ionsK. Moritani(University of Hyogo)2    ««««««««««««««««««««««««««««  

Comparative Study of Cluster SIMS and Other Techniques for Highly Accurate OrganicAnalysis
M. Fujii(Kyoto Universitye)2    ««««««««««««««««««««««««««««  

A study of the primary energy dependence of peptide fragmentation
Y. Yokoyama(Seikei University)%UHDN     6,065HODWHG7HFKQLTXH6HVVLRQ  2    ««««««««««««««««««««««««««««  

A New Ambient Analysis using MeV-SIMS for Liquid-Solid Interface
M. Kusakari(Kyoto University)2  ,QYLWHG  ««««««««««««««««««««««««  Surface analysis of oxide layer on steel using SIMS and APT
S. Kim (National Institute for Nanomaterials Technology)2  ,QYLWHG««««««««««««««««««««««««

Atom probe investigation of nano-features behavior about nuclear materials
K. Nishida(CRIEPI)

2    ««««««««««««««««««««««««««««  Analysis of amino acids by the scanning atom probe
M. Taniguchi(Kanazawa Institute of Technology)2  ,QYLWHG  ««««««««««««««««««««««««  

Quantitative Analysis of the Outer Surface by LEIS: Applications to Catalysts, Graphene,
Ionic Liquids, and NPs
H. Brongersma(ION-TOF GmbH)PROGRAM & CONTENTS

2    «««««««««««««««««««««««««««  Low Energy Ion Scattering for thin film analysis
T. Grehl(ION-TOF GmbH)2    «««««««««««««««««««««««««««  

Low Energy Ion Scattering Studies of Segregation in Materials for Electrochemical
Energy Conversion Devices
J. Druce   &ORVLQJUHPDUN  (Kyushu Univ.)

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