GRC 2006 - Defects in Semiconductors
Colby-Sawyer College, USA
July 02-07, 2006
(revised: July 12, 2006)

Open web-based databases for defects in semiconductors
T. Umeda*, S. Hagiwara, N. Mizuochi, and J. Isoya
Graduate School of Library, Information, and Media studies / Research Center for Knowledge Communities,
University of Tsukuba, Tsukuba 305-8550, Japan.
* E-mail: umeda@slis.tsukuba.ac.jp

Abstract: We developed web (world wide web)-based databases for defects in semiconductors. Two databases, “EPR in Semiconductors” and “DefectDat@base” are now opened on http://www.kc.tsukuba.ac.jp/div-media/epr/. Both the databases can be operated via Internet (simply using a webbrowser), and also new data can be uploaded to the databases by any researcher in the world. All functions of the databases are available free of charge.
This system is expectedly very useful to create a common knowledge source about defects in semiconductors. Please try the databases from your PC.
http://www.kc.tsukuba.ac.jp/div-media/epr/

EPR in Semiconductors stores a number ofrecords for EPR (electron paramagnetic resonance) centersin semiconductors. Approximately 300 records are now
given. New EPR data can be uploaded via Internet (seeAppendix 1 for uploading new EPR data).

SearchThis database accumulates fundamental EPR data, the so-called Spin-Hamiltonian (SH) parameters. Using these data, we can simulate EPR spectra for any experimentalconditions. Thus, it is a very useful database to accumulate research data obtained by EPR. Please refer to related important works and the concept of the database in T.
Umeda et al., “A web-based database system for EPR centers in Semiconductors”, Physica B 376-377, 249-252 (2006).

Simulation powered by EPR-NMR©
Click Map, Spectrum, Level toperform your EPR-NMR simulations.

Using stored records, everyone can try very powerful EPR
simulations (angular map, EPR spectrum, and spin levels, see above)
powered by the EPR-NMR© simulator.
EPR-NMR© (Win/Mac/UNIX) has been developed by Prof. J. A. Weil’s laboratory (University of Saskatchewan, Canada,
http://chm15127.usask.ca/). We greatly appreciate his group for the permission of our usage on the web site.

Numerical / keyword search
Numerical search for SH parameters is available.
*Main interface (SH parameters list + functional buttons)

http://www.kc.tsukuba.ac.jp/div-media/papersDB/

Defect dat@base provides a large knowledge of defects in semiconductors obtained by any
experimental / theoretical methods. Approximately 1300 scientific papers (published in 1953-2006) arenow collected, and each of them is characterized by special “Tags” (see below). Anyone can upload
new papers (and update their Tags) to the database via Internet (see Appendix 2 for uploading newpapers).
The database gives a bibliographic information and Tags for each paper. When one needs PDF files ofpapers, please download them in journal’s homepages. Please note that we cannot distribute those PDF
files due to the copyright issue.

Tags: an excellent guide by experts*Main interface (list of papers + Tag menu)

For each paper, Tags (three types: material Tags, technique Tags, and details Tags) are given by those
who well know about the content of the paper (e.g., authors of the paper). These tags are chosen as
they appropriately represent research results in the paper; in other words, they represent a knowledgeof experts. Therefore, Tags will guide us excellently to the field of defects in Semiconductors.