July 5, 2022

ULVAC-PHI Launches Sales of Latest XPS System that Dramatically Accelerates
Battery Research and Development
ULVAC-PHI integrates every surface analysis technology which is essential forbattery research and development into an advanced automated platform to contribute tobattery performance and longevity through thin film and interface characterizations.
ULVAC-PHI Incorporated (headquartered in Chigasaki, Kanagawa Prefecture,
Japan; Yasuhiro Hara, President) has launched the PHI GENESIS, an automated and multifunction scanning X-ray photoelectron spectrometer (XPS: X-ray Photoelectron Spectroscopy
or ESCA: Electron Spectroscopy for Chemical Analysis). The PHI GENESIS is the unitedmodel of PHI’s multi-functional scanning XPS instruments and was designed for automationand simplified operation.

PHI GENESIS scanning X-ray photoelectron spectrometer
Background
Advanced materials such as all-solid-state batteries, advanced semiconductors, andartificial photosynthesis are complex combinations of materials, and their research anddevelopment require speed in optimizing the performance of each material as well as thecombination of materials. There is a growing need for high-performance and highly functionalsurface and interface analysis that can dramatically accelerate such research anddevelopment. ULVAC-PHI begins offering a new surface analysis system that not only offers
extremely high basic performance but also a high degree of automation to meet the various
individual requirements of worldwide customers. The solution is the new "PHI GENESIS"
scanning X-ray photoelectron spectrometer (XPS) from ULVAC-PHI.
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Summary
The "PHI GENESIS" XPS is a new product that combines the core “GENES" of thePHI surface analysis instruments, which has a 50-year tradition of advanced automation andreduced analysis time, with expandability, and offers overwhelming basic performance in acompact housing.
The "PHI GENESIS" XPS provides high-speed, high-sensitivity, and overwhelming
micro XPS analysis performance with automated multi-sample analysis with automatic
sample exchange. A high-sensitivity analyzer with an improved counting rate also
contributes to high performance. To date, ULVAC-PHI and Physical Electronics USA, asubsidiary of ULVAC-PHI, have developed various world-first XPS analysis technologies
including scanning micro XPS and HAXPES (hard x-ray photoelectron spectroscopy), fully
automated robotics XPS analysis, full-automatic insulator neutralization analysis, depth
profiling of organic materials using cluster etching ion gun. All of these technologies areincorporated into a single instrument, making it possible to provide state-of-the-art XPS
analysis technology for all kinds of materials, including metals, semiconductors, ceramics,
and organic materials.
Another novel feature of PHI GENESIS is a new software package designed for easeof use and designed for all levels of users, from surface analysis beginners to well-trained
scientists, from manufacturing to cutting-edge research and development. We have also
prepared several options that allow customers to perform advanced analyses that previously
required sophisticated analytical equipment such as a large synchrotron in a typicallaboratory environment.
PHI GENESIS is fully compatible with the analysis of today's most advanced
composite solid materials and composite solid devices and aims to dominate the global
market as an indispensable analytical instrument for speeding up research and development.
For inquiries regarding this matter, please contactProduct Strategy Department, ULVAC-PHI Corporation TEL: #+81-467-85-4220 (Sales)[Related website]
https://www.ulvac-phi.com
https://www.surf-analysis.com

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About ULVAC-PHI, Incorporated
ULVAC-PHI, Incorporated was founded in 1982 and provides advanced surface analysis
instruments to universities and leading-edge industries worldwide for research and development.
The company provides comprehensive surface analysis technology-based solutions for materials
and devices including metals, polymers, semiconductors, batteries, organic and inorganic devices
and microelectronics. For more information, visit https://www.ulvac-phi.com/en/.

X-ray photoelectron spectroscopy (XPS)
XPS (X-ray Photoelectron Spectroscopy) is one of the most popular surface chemical
analysis techniques that can provide chemical information on the top few atomic layers of a solid
surface. XPS can provide qualitative and quantitative chemical information on solid surfaces byevaluating the energy and intensity of X-ray-induced electrons (photoelectrons). XPS is provided
to universities and industrial research facilities as well as for quality control and quality
assurance purposes, as it shows excellent features for the analysis of surface and interface
phenomena such as coloration, adhesion, sliding, catalyst, thin-film interfaces and electricalcontacts.

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