iPROGRAM & CONTENTS

Program and Contents
June 15, 2023 (Thu)
Opening remarks (9:50-10:00)
Session 1 (10:00-12:30)
O1-1. (10:00-10:30)- Invited -……………………………………………………......

Improvements of atom probe tomography for steel application
Jun Takahashi (Nippon Steel)O1-2. (10:30-11:00)- Invited , online- ………………………………………………......

Li-ion Battery Cathode Materials Studied with Atom Probe Tomography
Y. Chen (CAMECA, USA)O1-3. (11:00-11:30)- Invited -…………………………………………………….......

Sputtering of Polymers Produced by Vacuum Electrospray Droplet Ions
Satoshi Ninomiya (U. Yamanashi)
Break (11:30-11:40)
O1-4. (11:40-12:10)- Invited -…………………………………………………….......

ToF-SIMS - a Powerful Tool for Analyzing Battery Materials in 3D
Marcus Rohnke (Justus Liebig University Giessen)
O1-5. (12:10-12:40)- Invited -……………………………………………………......

Complexity to clarity: detecting, identifying and analyzing complex materials withmachine learning
Paul J. Pigram (La Trobe U,,Australia)
Lunch (12:40-14:10)
Poster short presentation (14:10-14:30)
2 minutes speech for every poster presenter

PROGRAM & CONTENTS

Poster session (14:30-16:00)
P-1.

…………………………………………………………………………..……..……………….

Evaluation of biomolecule distribution in human skin by ToF-SIMS
E. Nakata (Seikei University)P-2.

……………………………………………………………………………..…..……………….

Analysis of ToF-SIMS data of human skin treated with diclofenac using sparseautoencoder
A. Shinozaki (Seikei University)P-3.

………………………………………………………………..………………..……………….

Development of an aging estimation method for ocean plastics by using ToF-SIMS andmachine learning
T. Masuda (Seikei University)P-4.

………………………………………………………………..………………..……………….

Evaluation of biomolecule distribution in human skin by ToF-SIMS
E. Nakata (Seikei University)P-5.

………………………………………………………………..………………..……………….

Quantitative and qualitative analyses of mass spectra of organic electroluminescent (OEL)
samples using a simple artificial neural network
Y. Kiuchi (Seikei University)
P-6.

…………………………………………………………………..……………..……………….

Observation of ripple development on Si surface caused by oblique incident O2+ ion beamover a range of ion parameters
M. Hatada (Toray Research Center, Inc.)
P-7.

……………………………………………………………………………..…..……………….

Effects of Sample Hardness on Secondary Ion Yield of Organic Molecules in GCIB-SIMS
T. Toku
P-8.

(Graduate School of Engineering, University of Hyogo)…………………………………………………………………………………..………..…….

Study on desorption/ionization efficiency of polymer molecules affected by mixing with
non-aromatic organic acids
M. Fujii (Yokohama National University)
P-9.

………………………………………………………………………………..…..………….

Molecular weight dependence of organic polymer damage by Ar-GCIB sputtering
T. Seki (Kyoto Univ.)
P-10.

………………………………………………………………………………..…..………….

High-depth resolution and high-sensitivity evaluation of SiC power devices by SIMS
Y. Hori (Toshiba Nanoanalysis Co.)

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PROGRAM & CONTENTS

Break (16:00-16:10)
Session 2 (16:00-17:30)
O1-6. (16:00-16:30)- Maker Session -……………………………………………......

Microanalytical characterization of SiC, Diamond and GaN materials using dynamicSIMS
Paula PERES (CAMECA)
O1-7. (16:30-17:00)- Invited , online- ………………………………………………......

Customized Secondary Ion Mass Spectrometry tools for production and research
Graham A Cooke (HIDEN,UK)
O1-8. (17:00-17:30)- Invited , online- ………………………………………………......
A. Dexter (UK)PROGRAM & CONTENTS

June 16, 2023 (Fri)
Session 3 (10:00-12:40)
O2-1. (10:00-10:30)- Invited -……………………………….…….………………….…..….

The Importance of Sample Preparation in Time-of-Flight Secondary Ion Mass
Spectrometry Analysis for Semiconductor Applications
J-P. Barnes (U. Grenoble Alpes)O2-2. (10:30-11:00)- Invited -……………………………….…….………………….…..….

Development of Dual-laser SNMS Technique and Investigation of Its Ionization
Mechanism
Reiko Saito (Toshiba)
Break (11:00-11:10)
O2-3. (11:10-11:40)- Invited -……………………………….…….………………….…..….

John S. Fletcher (U. Gothenburg)
O2-4. (11:40-12:00)- Maker Session -……………………………………………......

Maker Session
IONTOF Japan
O2-5. (12:00-12:20)- Maker Session -……………………………………………......

Latest Information on PHI’s TOF-SIMS Instrument PHI nanoTOF 3
Shin-ichi Iida (ULVAC-)O2-6. (12:20-12:40)- Maker Session -……………………………………………......

Mechanical Properties Measurement using Water GCIB for Biological Materials
Naoko Sano (Ionoptika Ltd., TOYAMA)
Lunch (12:40-14:00)
Poster (Karen) Award Ceremony (14:00-14:10)
Session 4 (14:10-16:50)
O2-7. (14:10-14:40)- Invited -……………………………………….………..…………….

Research on SIMS analysis in advanced materials in Korea
Tae Eun Hong (KBSI, Korea)
O2-8. (14:40-15:10)- Invited -………………………………….………..…………………….

Latest developments in SIMS bioanalysis using water gas cluster ion beams
Nicholas Lockyer (U. Manchester)O2-9. (15:10-15:40)- Invited -………………………………….………..……………………….

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PROGRAM & CONTENTS

Anna Kotowska (U. Nottingham, UK)
Break (15:40-15:50)
O2-10. (15:50-16:20)- Invited -………………………………….………..…………………….

Polymer surface glass transition temperature determined by in-situ ToF-SIMS
Lutao Weng (The Hong Kong University of Science and Technology)
O2-11. (16:20-16:50)- Invited -………………………………….………..…………………….

Biological Analysis Breakthroughs Enabled by 3D OrbiSIMSDavid Scurr (U. Nottingham, UK)
O2-12. (16:50-17:20)- Invited , online- ………………………………………………………......

Metrology-led innovation using OrbiSIMS: enabling measurement of molecular shapes
Gustavo Trindade (NPL, UK)
Closing remarks (17:20-17:30)