June 20, 2016

Program of SISS-18 at Seikei University
21st July 2016(Thu.)
Opening Remarks: 9:55-10:00

Fundamental, Sputtering: 10:00-12:00

O1-1. (10:00-10:40) -Plenary talkSurface and Trace Chemical Analysis using SIMS and Ambient MS for Homeland
Security and Forensics
G. Gillen (NIST)
O1-2. (10:40-11:10) -InvitedSIMS with large gas clusters: Fundamentals, successes and new challenges
A. Delcorrte (Université Catholique de Louvain )O1-3. (11:10-11:40) -InvitedHigh and medium energy backscattering analysis using computer simulation
programT. Nishimura (Hosei University)
O1-4. (11:40-12:00)
Time-of-flight secondary ion mass spectrometry with a vacuum-type electrospray
droplet ion gun
S. Ninomiya(University of Yamanashi)Lunch: 12:00-13:10

Organic & Bio-Medical 1: 13:10-15:00

O1-5. (13:10-13:40) -InvitedCluster-TOF-SIMS imaging of lipids and metabolites in tissue
A. Brunelle (Institut de Chimie des Substances Naturelles)
O1-6. (13:40-14:10) -InvitedLipidomic imaging with a new hybrid 3D SIMS molecular imaging instrument
M. K. Passarelli (NPL)
O1-7. (14:10-14:40) -InvitedDrug screening by ToF-SIMS technique
Tae Geol Lee (KRISS)

O1-8. (14:40-15:00)
Evaluation of blood adsorption on artificial kidney using TOF-SIMS
S. Aoyagi (Seikei University)
Coffee break: 15:00-15:15

Sponsored session: 15:15-16:35

O1-9. (15:15-15:35)
Recent developments on Cameca SIMS and Atom Probe
F. Horréard (AMETEK-CAMECA)
O1-10. (15:35-15:55)
Recent Topics in TOF-SIMS Instrumentation at ULVAC-PHI
S. Iida (ULVAC-PHI)
O1-11. (15:55-16:15)
Latest application on TOYAMA Laser-SNMS
A. Takano(Toyama)
O1-12. (16:15-16:35)
From Surface Spectrometry to 3D Analysis - Latest Trends and Instrumentation
for TOF-SIMS
M. Terhorst (ION-TOF GmbH)Short presentation: 16:35-17:05



Poster session: 17:15-18:15



Reception: 18:15-20:00

22nd July 2016(Fri.)Organic & Bio-Medical 2: 9:30-10:50

O2-1. (9:30-10:00) -InvitedCell and Tissue applications of the NanoSIMS 50L in medicine and pharmacology
F. Horréard (AMETEK-CAMECA)
O2-2. (10:00-10:30) -InvitedAnalyses of freeze-fixed plant samples by cryo-TOF-SIMS
D. Aoki (Nagoya University)
O2-3. (10:30-10:50)
Kendrick Mass Defect Analysis for High-Resolution Mass Spectrometry and thePossibility of the Application to SIMS
M. Fujii (AIST)Coffee break: 10:50-11:05



Instrumentation & application 1: 11:05-12:05

O2-4. (11:05-11:35) -InvitedSIMS imaging on the Helium Ion Microscope
J. N. Audinot (Luxembourg Institute of Science and Technology)
O2-5. (11:35-12:05) -InvitedPrecision of oxygen two isotope SIMS analysis using IMS-1280
G. Tang (Chinese Academy of Science)Lunch: 12:05-13:15

Atom probe session: 13:15-15:00

O2-6. (13:15-13:45) -InvitedImpact of atom probe tomography to the development of rare earth permanentmagnets
K. Hono (NIMS)
O2-7. (13:45-14:15) -InvitedChallenge of hydrogen distribution analysis for semiconductor devices by several
techniques, APT, SIMS and ERDA
A. Kuramoto (Toshiba)
O2-8. (14:15-14:35)
Reconstruction of Atom Probe Tomography by using FEM
Yun Kim (University of Tokyo)
Coffee break: 14:35-14:50

Instrumentation & application 2: 14:50-16:40

O2-9. (14:50-15:20) -InvitedBiological Imaging Beyond “Show & Tell”:Sub-Micron Imaging and Identification ofMolecular Chemistry by TOF-SIMS Parallel Imaging MS/MSG. L. Fisher (Physical Electronics)
O2-10. (15:20-15:40)
Development of New Cluster-SIMS Instrument Combined with Tandem Mass
Spectrometer
K. Suzuki (Kyoto University)
O2-11. (15:40-16:00)
Dual Beam Depth Profiling with Clusters: Comparison between Ar, O2, and SF6 Gas
Cluster Ion Bombardment
D. Rading (ION-TOF GmbH)O2-12. (16:00-16:20)
Mass spectrometric analysis of the dissociative scattering of argon cluster ions fromsolid surfacesK. Moritani (University of Hyogo)
O2-13. (16:20-16:40)
A new approach of interface analysis: measurement of benzoic acid in solution using
ambient SIMS
M. Kusakari (Kyoto University)
Closing Remarks:16:40-16:45