TWFULL (Patents Full-Text of Taiwan, Province of China)
File Subject
Coverage

All patent-relevant areas of science and technology, i.e., all classes of the International
Patent Classification

File Type

Full-text

Features

ThesauriInternational Patent Classification (/IPC), Cooperative PatentClassification (/CPC)

Alerts (SDIs)

Weekly or monthly (weekly is the default)

CAS Registry
Number® Identifiers



SLART



Keep & Share

Structures



RecordContent• Database records comprise all documents published for one application. Records
contain bibliographic data including patent applicant, inventor, and agent data, patent,
application, priority, and related application data, IPC, CPC, and EPO/ICO
classification codes, abstract, and full-text of description and claims.
• Independent claims and claim groups are searchable for all claims in English.
• Standardized and normalized patent assignee names are searchable in their own
fields /PAS and /PAN.
• Numeric values of 59 physical and chemical properties are searchable in about 20,000
variants of the base and additional units within all full text fields in English.
• Key terms, indexed and displayed in the field /KT, enhance retrieval of relevant results,
and make the evaluation of results more efficient. They are useful to broaden searchscope more precisely than basic index searches.
• Some of the full-text has been created by Optical Character Recognition (OCR)
software. Therefore, a small number of characters may have been misinterpreted, or
portions of the text may have been incompletely recognized.
• Clipped images (mostly front-page images) are included when available.

File Size• More than 2.06 million family records with more than 2.64 million publications. Morethan 1.73 million front page images from 1951 to present (10/2023)

Coverage• Full-text of patent applications, granted patents and utility models published by the
Taiwan Intellectual Property Office (TIPO) from 1950 onwards.

Updates• Weekly updates including IPC and CPC• New records are available about two weeks after publication date with the complete
content

Language• English• Abstracts, detailed descriptions and claims are machine translated to English or fromequivalent documents, titles are human translated.

Database
Producer

LexisNexis Business Information Solutions B.V.
Radarweg 291043 NX Amsterdam
The Netherlands
Copyright Holder

October 2023

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TWFULL

Sources

Patent applications, granted patents, utility models, and design patents by the Taiwan
Intellectual Property Office (TIPO)

User Aids

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•
•
•
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Cluster• AEROTECH• ALLBIB• AUTHORS• CORPSOURCE• ENGINEERING• FULLTEXT• HPATENTS• NPS• PATENTS• PNTTEXTSTN Database Clusters information:
http://www.stn-international.com/en/customersupport/customersupport#cluster+%7C+subjects+%7C+features

October 2023

Online Helps (HELP DIRECTORY lists all help messages available)
Help for numeric property search: HELP NPS
Help for key terms: HELP KEY TERMS
Help for normalized patent assignee names: HELP PAN
Help for search fields Independent Claims and Claim Groups: HELP CLAIMSSTNGUIDE

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TWFULL

Search and Display Field Codes
If multiple search terms are linked with the AND-operator, all terms are searched in the complete databaserecord, i.e. in all publications referring to one application. For a search in a specific publication of the record,connect the search term and the patent kind code with the (L)-proximity operator, e.g.
S BOREHOLE/AB,TI,CLM (L) TWA/PK limits the search to Taiwan applications TWA.
Fields that allow left truncation are indicated by an asterisk (*).

General Search Fields
Search Field Name

SearchCode

Display
Codes

Search Examples

Basic Index* (contains single words from title(TIEN), abstract (AB), detailed description(DETD), claims (CLM), main claims(MCLM), and key terms (KT) fields)

None
or
/BI

S TRANSISTOR AND
ELECTRODES ACOUSTIC SENSOR
S ?TRANSFER?

Abstract*
Accession Number
Agent
Application Country(WIPO code and text)
Application Date (1)Application Kind CodeApplication Number (2)/AB, /ABEN
/AN
/AG
/AC

S BOREHOLE/AB
S 2000269/AN
S BOLLI PETER/AG
S TW/AC

TIEN, AB,
ABEN, DETD,
DETDEN,
CLM,
CLMEN,MCLM,
MCLMEN, KT
AB
AN
AG
AI

/AD
/AK
/AP
(or /APPS)
/APO
/AY
/CLM
/CLMEN/CLM.CG/CLM.IC/CPC/CPC.ACDS AD=JAN 2011
S TWA1/AK
S TW1918-120974/AP

AI
AI
AI

S TW000009/APO
S AY>=2005
S DERIVATION/CLM
S DERIVATION/CLMENS DERIVATION/CLM.CG
S DERIVATION/CLM.ICS C12N0009/CPC
S 20121113/CPC.ACD

APO
AI
CLM
CLMEN, CLM
CLMEN, CLM
CLMEN, CLM
CPC
CPC.TABS C12N0009/CPC (S) I/CPC.KW
S 20130101/CPC.VER
S 20190930-20191031/DED
S 20190827/DUPDS LASER/DETD
S LASER/DETDENS PATENT/DT

CPC.TAB
CPC.TAB
DED
DUPD
DETD
DETDEN
DT
ED
EDTX
EPC
EPC
FA

/GI
/IPC

E 20220101/ED
S EDTX>20191130
S 221B/EPC.KW
S H01L0021-285B4H2/EPC
S ABEN/FA
S AB.EQ/FA
S GI/FA
S A01B0037-00/IPC/IC

S A01B0037-00/IC

IC, ICM, ICS

Application Number, Original
Application Year (1)Claims*Claims (English)
Claims, Claim Groups
Claims, Independent
Cooperative Patent Classification (3)Cooperative Patent Classification, Action
Date
Cooperative Patent Classification, Keyword
Cooperative Patent Classification, Version
Data Entry Date (1)Data Update Date (1)Detailed Description
Detailed Description(English)
Document Type(code and text)
Entry Date (1)Entry Date of Fulltext (1)EPC, Keyword Terms
European Patent Classification
Field Availability (4)Graphic Image
International Patent Classification (Version
1-8)(ICM, ICS, IPCI, IPCR) (3)International Patent Classification (Version1-7) (ICM, ICS)

/CPC.KW/CPC.VER
/DED
/DUPD
/DETD
/DETDEN/DT(or /TC)/ED/EDTX/EPC.KW
/EPC
/FA

GI
ICM, ICS,IPCI, IPCR

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TWFULL

General Search Fields (cont'd)
Search Field Name
Inventor
Inventor, Country (WIPO code and text)
IPC, Action Date
IPC, Initial
IPC, Keyword Terms
IPC, Main
IPC, Reclassified
IPC, Reform
IPC, Secondary
IPC, Version

Key Terms
Language (code and text)
Language, Filing (code and text)
Main Claim*
Main Claim (English)
Number of Claims (1)Number of Paragraphs in DETD
(Detailed Description) (1)Patent Assignee (5)SearchCode/IN (or /AU)
/IN.CNY/IPC.ACD/IPCI/IPC.KW/ICM (or
IPCM)
/IPCR
/IPC.REF/ICS (or
IPCS)/IPC.VER(orIC.VER)
/KT
/LA
/LAF
/MCLM
/MCLMEN
/CLMN
/DETN

Patent Assignee, Country
Patent Applicant Normalized
Patent Applicant Standardized/PA(or /CS)/PA.CNY/PAN/PAS

Patent Country (WIPO code and text)
Patent Information Publication Type

/PC
/PIT

Patent Kind CodePatent Number (2)/PK/PN(or /PATS)
/PNO
/PNK
/PHP
/PRC

Patent Number, Original
Patent Number/Kind Code
Physical Properties
Priority Country(WIPO code and text)
Priority Date (1)Priority Date, First (1)Priority Number (2)Priority Number, Original

October 2023

/PRD
/PRDF
/PRN
/PRNO

Display
Codes

Search Examples
S SATIJN, DAVID P.E./IN
S TW/IN.CNY
S 13 JAN 2021/IPC.ACD
S B21B0001/IPCIS INITIAL/IPC.KW
S B01D0035-28/ICM

IN
IN, IN.CNY
IPC.TABIPCI
IPC.TAB
ICM, ICS B21D0007-08/IPCR
S A01B0001-22/IPC.REF
S B65F0001-14/ICS

IPCR, IPC
IPC.TAB
ICS, ICS 7/IPC.VER

IPC.TABS (LASER (3A) SOURCE?)/KTS CHINESE/LA
S EN/LAFS LASER/MCLMS LASER/MCLMEN
S 5-10/CLMN
S 20-30/DETN

KT
LA
LAF
MCLM
MCLMENCLMN
DETN

S SAMSUNG/PAPA

S TW/PA.CNY
S SAMSUNG/PAN
S SAMSUNG AEROSPACE
INDUSTRIES/PAS
S TW/PCS "TWB GRANTED PATENT ORPATENT OF ADDITION (FROM
19500101 ONWARDS)"/PITS TWA/PKS TW2022035558/PN

PA, PA.CNY
PANPAS

S TW000007/PNO
S TW10018 B/PNKS BIT RATE/PHP (S) DISC/BIS BE/PRCS KOREA, REPUBLIC OF/PRC
S PRD=DEC, 30 2000
S 20001230/PRD
S 20010112/PRDF
S AT1996-1779/PRN
S AT1112014/PRNO

PNO
PI
KWIC
PRN

PI
PIT

PI
PI

PRN
PRN
PRN
PRNO, PRAO

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TWFULL

General Search Fields (cont'd)
SearchCode

Search Field Name
Priority Year (1)Priority Year, First (1)Publication Date (1)Publication Year (1)Related Application Country
Related Application Number
Related Application Date (1)Related Application Type
Related Application Year (1)Related Patent Country
Related Patent Date (1)Related Patent Number
Related Patent Year (1)Title (English)*Update Date (1)Update Date Text (1)Search Examples

/PRY
/PRYF
/PD
/PY
/RLC
/RLN
/RLD
/RLT
/RLY
/RLPC
/RLPD
/RLPN
/RLPY
/TI, /TIEN
/UP
/UPTX

S 1999/PRY
S 1999/PRYF
S 19990108/PRD
S 2017/PY
S WO/RLCS WO1992-US7383/RLN
S 20010222/RLDS PCT APPLICATION/RLT
S 2017/RLY
S WO/RLC
S 20020117/RLPD
S WO2000034546/RLPN
S 1999/RLPYS LASER/TI
S UP>SEP 2022
S UPTX=2022

Display
Codes
PRN
PRN
PI
PI
RLI
RLI
RLI
RLI
RLI
RLI
RLI
RLI
RLI
TI, TIENUP
UPTX(1) Numeric search field that may be searched using numeric operators or ranges.
(2) By default, patent numbers, application and priority numbers are displayed in STN Format. To display them in Derwent format, enter
SET PATENT DERWENT at an arrow prompt. To reset display to STN Format, enter SET PATENT STN.
(3) An online thesaurus is available in this field.
(4) The index terms AB.EQ, CLM.EQ and DETD.EQ are indicating, that the respective text is taken from an equivalent document of thesame international patent family. The source is displayed before the respective text field.
(5) Search with implied (S) proximity is available in this field.

Super Search Fields
Enter a super search code to execute a search in one or more fields that may contain the desired information.
Super search fields facilitate crossfile and multifile searching. EXPAND may not be used with super search
fields. Use EXPAND with the individual field codes instead.
Search Field Name

SearchCode

FieldsSearched

Search Examples

Display
Codes

Application Number Group/APPS

AP, PRNS AT1996-1779/APPS

AI, PRAI,APPS

Patent Assignee Group/PASS

PA, PA.T, PAS,PAN

S SAMSUNG/PASSPA, PAS,
PAN, PASS

Patent Number Group/PATS

PN, RLPNS TW2021046687/PATS

PN, RLPN,
PATS

October 2023

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TWFULL

Property Fields1)
In TWFULL a numeric search for a specific set of physical properties (/PHP) is available within the full-text
fields (TI, AB, DETD, CLM, BI). The numeric values are not displayed as single fields, but highlighted within
the hit displays.
Use EXPAND/PHP to search for all available physical properties. A search with the respective field codes will
be carried out in all database fields with English text. The /PHP index contains a complete list of codes andrelated text for all physical properties available for numeric search.
Field
Code

Property

Unit

SymbolAmount of substance
Bit Rate
Stored Information
CapacitanceCatalytic Activity
Current Density
Molarity, Molar
Concentration
Conductance
DecibelDegreeDensity (MassConcentration
Dose Equivalent
DosageDosageMol
Bit/Second
Bit
Farad
Katal
Ampere/Square Meter
Mol/Liter

mol
bit/s
Bit
F
kat
A/m2
mol/L

S 10 /AOS
S 8000-10000/BIR
S BIT > 3 MEGABIT
S 1-10 MF/CAP
S 1-1000/CATAS CDN>10 A/M**2
S UREA/BI (S) 8/CMOL

Siemens
DecibelDegreeKilogram/Cubic Meter

S
dB
°
kg/m³

S 1S-3/CON
S DB>50
S CYLINDER/BI (S) 45/DEG
S 5E-3-10E-3/DEN

SievertMilligram/Kilogram/Day
Milligram/Kilogram

Sv
mg/kg/day
mg/kg

Viscosity, dynamic
Electric Charge

Pascal * Second
Coulomb

Pa * sC

S DV>5000
S 0.0001-0.001/ECH

Electrical Conductivity

Siemens/Meter

S/mS ECO>800 S/M (15A) AQUEOUS

Electric Current

AmpereA

S 1-10/ELC

Electric Field

Volt/Meter

V/m

S 200/ELF

Energy

Joule

J

/ERE
(/ERES)/FOR/FRE (/F)/IU/KVElectrical Resistivity

Ohm * Meter

S HEAT (15A) 4 JOULE - 3000
JOULE /ENES ERE>0.1

Force
Frequency
International Unit
Viscosity, kinematic

NewtonHertz
none
Square Meter/Second

N
Hz
IU
m2/s

/LEN
(/SIZ)/LUME

Length, Size

Meter

m

S 50 N /FORS OSCILLAT?/BI (S) 1- 3/FRE
S IU>1000 (P) VITAMIN AS POLYSILOXANE/BI (10A) 2-5000
CST/KVS 1-4/LEN

Luminous Emittance,
IlluminanceLuminous Flux
Luminous Intensity
Mass
Mass to Charge Ratio

Lux

lx

S 10-50/LUME

Lumen
CandelaKilogram
none

Lm
cd
kg
m/z

S LUMF>1000
S LUMI<4
S ALLOY/BI (30A) 1E-10-1E-5/M
S MCH=1

/AOS
/BIR
/BIT
/CAP
/CATA
/CDN
/CMOL
/CON
/DB
/DEG
/DEN (/C)
/DEQ
/DOA
/DOS
(/LD50)/DV/ECH(/CHA)/ECO(/ECND)/ELC(/ECC)/ELF(/ECF)
/ENE

/LUMF
/LUMI
/M
/MCH

October 2023

Ohm * mSearch Examples

S 100/DEQ
S 300/DOAS DOS>0.8

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TWFULL

Property Fields1) (cont’d)
Field
Code

Property/MFD(/MFS)/MFR(/MFL)/MFST

Magnetic Flux
Density
Mass Flow Rate

Tesla

T

S MFD>102

Kilogram/Second

kg/s

S MFR<0.1

Magnetic Field
Strength
Molar Mass

Ampere/MeterA/m

S MFST/PHP

Gram/Molg/mol

S 2000-3000 G/MOL/MM

Molality of Substance
Melt Volume Rate,
Melt Flow Rate
Percent(Proportionality)
pH Value

Mol/Kilogramnone

mol/kgg/10 minS 01.-10 MOL/KG/MOLS
S 3/MVR/MM (/MW,
/MOM)
/MOLS
/MVR
/PER

Unit

Symbol

Search Examples

none

%

S POLYMER?/AB (5A) 4/PER

pH

pH

S 7.4-7.6/PHV

Power

Watt

W

Parts per million

Ppm

ppm

/PRES (/P)

Pressure

Pascal

Pa

/RAD
/RES
/RI
/RSP

Radioactivity
Electrical ResistanceRefractive Index
Rotational Speed

Becquerel
Ohmnone
Revolution/Minute

Bq
Ohm

/SAR

Area /Surface Area

Square Meter

m²

/SOL
(/SLB)/SSAM

Solubility

Gram/100 gram

g/100 gS "HG-XE-?"/BI (S) 100-200
WATT/POW
S 100 PPM /PPM (10A)
ADDITIVE/BI
S (VACUUM (5A) DISTILL?)/BI (S)1000-1100/PRESS RAD/PHPS SENSOR /BI (S) 10- 100/RES
S 3-4/RIS 2 RPM - 100 RPM /RSP (S)ENGINE/BIS PLATE/BI (S) 10 M**2 - 100
M**2 /SARS SOL>20 G/100G (5A) WATER

Specific Surface
Area, Mass
Surface Tension,
Spring Constant
Thermal Conductivity

Square Meter/
Kilogram
Joule /Square Meter

m2/kg

S 9/SSAM

J/m²

S 60 J/M**2/STSC

Watt/Meter * Kelvin

W/m * K

S 1/TCO (S) HEAT?

Temperature
Tex
Time

KelvinGram/Kilometer
SecondK
g/kms/VEL (/V)
/VELA
/VLR

Velocity
Velocity, angular
Volumetric Flow Rate

Meter per Second
Radian/Second
Cubic Meter/Second

m/s
rad/s
m³/s

/VOL
/VOLT

VolumeVoltage

Cubic Meter
Volt

m³
V

/PHV
(/PH)
/POW
(/PW)
/PPM

/STSC
/TCO
(/TCND)/TEMP (/T)
/TEX
/TIM

rpm

S 20-25/TEMP
S 1-5/TEXS ?INCUB?/BI (10A) 50 S - 150 S/TIM
S REDUC?/BI (S) 1E-3-5E-3/VELS VELA>10
S 1 M**3/S - 2 M**3/S /VLR (S)ABRASIVE
S 1E-8-2E-8/VOL.EXS BATTERY/BI (10A) 1E-3 V<VOLT<9E-3 V(1) Exponential format is recommended for the search of particularly high or low values, e.g. 1.8E+7 or 1.8E7 (for 18000000) or 9.2E-8(for 0.000000092).

October 2023

8
TWFULLInternational Patent Classification (/IPC) Thesaurus
The classifications, validity and catchwords for the main headings and subheadings from the current (8th)edition of the WIPO International Patent Classification (IPC) manual are available. The classifications from theprevious editions (1-7) are also available as separate thesauri. To EXPAND and SEARCH in the thesauri foreditions 1–7, use the field code followed by the edition number, e.g., /IPC2, for the 2nd edition. Catchwords
are included only in the thesauri for the 8th, 7th, 6th, and 5th editions.
Code
ADVANCED(ADV)
ALL
BRO (MAN)BT
CORE (COR)
ED
HIE
INDEX
KT
NEXT
NT
PREV
RT (SIB)
TI

Content

ExamplesAdvanced Codes for the Core Level IPC CodeE A61K0006-06+ADVANCED/IPC

All Associated Terms (BT, SELF, NT, RT)
Complete Class
Broader Term (BT, SELF)
Core Codes for the Advanced Level IPC CodeComplete title of the SELF term and IPC manual edition
Hierarchy Term (Broader and Narrower Term)(BT, SELF, NT)
Complete title of the SELF term
Keyword Term (catchwords) (SELF, KT)
Next Classification
Narrower Terms (SELF, NT)
Previous Classification
Related Terms (SELF, RT)
Complete Title of the SELF Term and Broader Terms(BT, SELF)

E C01C003-00+ALL/IPC
E C01C+BRO/IPC
E C01F001-00+BT/IPC
E G08C0019-22+CORE/IPC
E C01F001-00+ED/IPC
E C01B003-00+HIE/IPC
E C01F001-00+INDEX/IPC
E CYANOGEN+KT/IPC
E C01C001-00+NEXT5/IPC
E C01C+NT/IPC
E C01C001-12+PREV10/IPC
E C01C003-20+RT/IPC
E C01F001-00+TI/IPC

ECLA (/EPC) and ICO Thesauri
These thesauri are available in the /EPC search field (for ECLA codes) and /ICO search field (for 'in-computeronly' codes). All relationship codes can be used with both the EXPAND and SEARCH commands.
Relationship CodeContent

ALL
AUTO (1)BT
CODE

All usually required terms (BT, SELF, CODE, DEF)
Automatic relationship (BT, SELF, CODE, DEF)
Broader terms (BT, SELF)
Classification Code (SELF, CODE)

DEF
HIE

Definition (SELF, DEF)
Hierarchy terms (all broader and narrower terms) (BT,SELF, DEF, NT)
Keyword terms (SELF, KT)
All associated terms
Next classification within the same class (SELF, NEXT)
Next n classification within the same class
Narrower terms
Previous Code within the same class (SELF, PREV)
Previous n classifications within the same class
Complete Title of the SELF Term and Broader Terms(BT, SELF)

KT
MAX
NEXT
NEXT(n)NT
PREV
PREV(n)TI

Search Examples
E C12M0001-34H2+ALL/EPC
E G01J003-443+AUTO/EPC
E G01J0003-443+BT/EPC
E SCRAPER BIASING
MEANS+CODE/EPC
E B65G0045-16+DEF/EPC
E A01B0001+HIE/EPC
E LASER+KT/EPC
E G01J0003-44B+MAX/EPC
E A01B0001-24+NEXT/EPC
E A01B0001-24+NEXT3/EPC
E G05B0001-04+NT/EPC
E G05B0019-418N1+PREV/EPC
E G05B0019-418N1+PREV2/EPC
E G05B0001-03+TI/EPC(1) Automatic Relationship is SET OFF. In case of SET REL ON the result of EXPAND or SEARCH without any relationship code is thesame as described for AUTO.

October 2023

9
TWFULLCPC Thesaurus
This thesaurus is available in the /CPC search field. All relationship codes can be used with both the EXPAND
and SEARCH commands.
Relationship CodeALL
AUTO (1)
BT
CODE
DEF
HIE
KT
MAX
NEXT
NEXT(n)NT
PREV
PREV(n)TI

Content
All usually required terms (BT, SELF, CODE, DEF)
Automatic relationship (BT, SELF, CODE, DEF)
Broader terms (BT, SELF)
Classification Code (SELF, CODE)
Definition (SELF, DEF)
Hierarchy terms (all broader and narrower terms) (BT, SELF,
DEF, NT)
Keyword terms (SELF, KT)
All associated terms
Next classification within the same class (SELF, NEXT)
Next n classification within the same class
Narrower terms
Previous Code within the same class (SELF, PREV)
Previous n classifications within the same class
Complete Title of SELF Term and Broader Terms (BT, SELF)

Search Examples
E C12M0001-005+ALL/CPC
E G01J003-443+AUTO/CPC
E G01J0003-443+BT/CPC
E CARTRIDGES+CODE/CPC
E B65G0045-16+DEF/CPC
E A01B0001+HIE/CPC
E LASER+KT/CPC
E G01J0003-44+MAX/CPC
E A01B0001-24+NEXT/CPC
E A01B0001-24+NEXT3/CPC
E G05B0001-04+NT/CPC
E G05B0019-00+PREV/CPC
E G05B0019-00+PREV2/CPC
E G05B0001-03+TI/CPC(1) Automatic Relationship is SET OFF. In case of SET REL ON, the result of EXPAND or SEARCH without any relationship code is thesame as described for AUTO.

October 2023

10
TWFULLDISPLAY and PRINT Formats
Any combination of formats may be used to display or print answers. Multiple codes must be separated by
spaces or commas, e.g., D L1 1-5 TI PA. The fields are displayed or printed in the order requested.
The information of the latest publication is displayed by default. To display the content for all levels of therecord you can combine all display fields and formats with the qualifier .M except FA, SCAN, and TRIAL.
For displaying a particular publication of a database record, you can simply add for certain display field thekind code to the appropriate display format, e.g. ALL.A. Fields that allow this are indicated by a number (3).
Hit-term highlighting is available for all fields. Highlighting must be ON during SEARCH to use the HIT, KWIC,
and OCC formats.
The default display format is STD.M, i.e., all publication levels of one family in the STD format.
FormatAB (ABS)
ABEN
ABZH
AG
AGZH
AI (AP) (1)
AN
CLM
CLMEN
CLMZH
CLMN (2)CPC
CPC.TAB
DETD (3)
DETDEN (3)DETDZHDETN (2)DT (TC)
ED
EDP
EDTX
EPC
FA
IC
ICM
ICO
ICS
IN (AU)
INZH
IN.CNY
IPCI
IPCR
KT
LA
LAF
MCLM
MCLMENMCLMZH
PA (CS)
PAZH
PA.CNY
PAN
PAS

October 2023

Content
Abstract
Abstract (English)
Abstract (Chinese)
Agent
Agent (Chinese)
Application Information
Accession Number
ClaimsClaims (English)
Claims (Chinese)
Number of Claims
Cooperative Patent Classification
CPC, Tabular
Detailed Description
Detailed Description (English)
Detailed Description (Chinese)
Number of Paragraphs in DETD
Document Type
Entry Date
Entry Date Patent
Entry Date of Fulltext
European Patent Classification
Field Availability (for all publication levels)
IPC (format contains ICA, ICI, ICM, ICS)
IPC, Main
In-Computer-only Classification
IPC, Secondary
Inventor
Inventor (Chinese)
Inventor, Country
IPC, Initial
IPC, Reclassified
Key Terms
Language
Language of Filing
Main Claim
Main Claim (English)
Main Claim (Chinese)
Patent Assignee (English)
Patent Assignee (Chinese)
Patent Assignee, Country
Patent Applicant Normalized
Patent Applicant Standardized

ExamplesD TI AB 1-5
D ABEND ABZHD AG
D AGZH
D AI
D L3 AN
D CLM
D CLMEND CLMZH
D CLMN
D CPC
D CPC.TAB
D DETDD DETDEN
D DETDZH
D DETN
D DT
D ED
D EDP
D EDTX
D EPC
D FA
D IC
D IC
D ICO
D ICS
D IN
D INZHD IN.CNY
D IPCID IPCR
D KT
D LA
D LAF
D MCLMD MCLMEND MCLMZH
D PA
D PAZH
D PA.CNY
D PAN
D PAS

11
TWFULLDISPLAY and PRINT Formats (cont’d)FormatContent

ExamplesPI (PN, PATS) (1)PNO
PRN (PRAI) (1,5)
PRNO (PRAO) (2)
RLI (RLN)
TIEN
TIZH
UP
UPTX

Patent Information
Patent Number, Original Format
Priority Information
Priority Number, Original Format
Related Patent Information
Title (English)
Title (Chinese)
Update Date
Update Date Text

D PI
D PNO
D PRN
D PRNO
D RLI
D TI
D TIZHD UP
D UPTXALL (1)

AN, EDP, ED, UP, EDTX, UPTX, DED, DUPD, TIEN, IN, PA, PAS, PAN, AG,
LAF, LA, DT, PI or PNO (only if no PI), PIT, AI or APO (only if no AI), RLI,PRAI or PRAO (only if no PRAI), RLPI, RLI, ICM, ICS, IPCI, IPCR, CPC,
ABEN, DETDEN, CLMEN, KT
ALL, plus graphic image
AN, ED, UP, EDTX, UPTX, DED, DUPD, TIEN, TIZH, IN, INZH, PA, PAZH,
PAS, PAN, AG, AGZH, LAF, LA, DT, PI, PIT, AI or APO (only if no AI),PRAI or PRAO (only if no PRAI), RLPI, RLI, ICM, ICS, IPCI, IPCR, CPC,
EPC, ICO, ABEN, ABZH, DETDEN, DETDZH, CLMEN, CLMZH, KT
ALL, indented with text labels
IALL, plus graphic image
ALL, delimited for post processing
AI, RLN, PRAI
AN, EDP, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, IN, PA, PAS, PAN, AG,
LAF, LA, DT, PI, PIT, AI or APO (only if no AI), PRAI or PRAO (only if noPRAI), RLPI, RLI
BIB, plus graphic image
AN, EDP, ED, UP, EDTX, UPTX, DED, DUPD, TIEN, TIZH, IN, INTH, PA,
PAZH, PAS, PAN, AG, AGZH, LAF, LA, DT, PI, PIT, AI or APO (only if noAI), PRAI or PRAO (only if no PRAI), RLPI, RLI
BIB, indented with text labels
IBIB, plus graphic image
AN, EDP, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, IN, PA, PAS, PAN, AG,
LAF, LA, DT, PI, PIT, AI or APO (only if no AI), PRAI or PRAO (only if noPRAI), RLPI, RLI, ICM, ICS, IPCI, IPCR, CPC, EPC, ICO, ABEN,MCLMEN, KT
BRIEF, plus graphic image
AN, EDP, ED, UP, EDTX, UPTX, DED, DUPD, TIEN, TIZH, IN, INZH, PA,
PAZH, PAS, PAN, AG, AGZH, LAF, LA, DT, PI, PIT, AI or APO (only if noAI), PRAI or PRAO (only if no PRAI), RLPI, RLI, ICM, ICS, IPCI, IPCR,
CPC, EPC, ICO, ABEN, ABZH, MCLMEN, MCLMZH, KT
BRIEF, indented with text labels
IBRIEF, plus graphic image
ED, IPC (ICM, ICS, IPCI, IPCR), CPC, EPC, ICO
International Patent Classification (ICM, ICS, IPCI, IPCR)
IPC, IPC.KW, IPC.VER, in tabular version
CPC, in tabular version
AN, EPD, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, IN, PA, PAS, PAN, AG,
LAF, LA, DT, PI, PIT, AI or APO (only if no AI), PRAI or PRAO (only if noPRAI), RLPI, RLI, ICM, ICS, IPCI, IPCR, CPC, EPC, ICO, ABEN,
DETDEN, CLMEN, KT, FA for all levels of publication
MAX, plus graphic image
AN, EDP, ED, UP, EDTX, UPTX, DED, DUPD, TIEN, TIZH, IN, INZH PA,
PAZH, PAS, PAN, AG, AGZH, LAF, LA, DT, PI, PIT, AI or APO (only if noAI), PRAI or PRAO (only if no PRAI), RLPI, RLI, ICM, ICS, IPCI, IPCR,
CPC, EPC, ICO, ABEN, ABZH, DETDEN, DETDZH, CLMEN, CLMZH, KT

D ALL

ALLG
ALLO

IALL (1)IALLG
DALL (1)APPS (1)BIB (1)BIBG
BIBO

IBIB (1)IBIBG
BRIEF (1)

BRIEFGBRIEFOIBRIEF (1)IBRIEFG
IND
IPC
IPC.TAB
CPC.TABMAX (ALL.M) (1)

MAXG
MAXO (ALLO.M)

D ALLGD ALLOD IALLD IALLGD DALLD APPS
D BIB

D BIBGD BIBOD IBIBD IBIBG
D BRIEF

D BRIEFG
D BRIEFOD IBRIEF
D IBRIEFG
D IND
D IPC
D IPC.TAB
D CPC.TAB
D MAX

D MAXGD MAXO

October 2023

12
TWFULLDISPLAY and PRINT Formats (cont’d)FormatIMAX (IALL.M) (1)
IMAXG
SCAN (4)STD (1)ISTD (1)
TRIAL (TRI, SAM,SAMPLE, FREE)
TX
HIT
KWIC
OCC

Content

ExamplesMAX, indented with text labels
IMAX, plus graphic image
TI (random display without answer numbers)
AN, EDP, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, IN, PA, PAS, PAN, AG,
LAF, LA, DT, PI, PIT, AI or APO (only if no AI), PRAI or PRAO (only if noPRAI), RLPI, RLI, ICM, ICS, IPCI, IPCR, CPC, EPC, ICO (STD.M isdefault)
STD, indented with text labels
ED, EDTX, UP, UPTX, TIEN, FA, DETN, CLMN

D IMAXD IMAXGD SCAN
D STD

DETDEN, CLMEN

D TX

Hit term(s) and field(s)Up to 50 words before and after hit term(s) (KeyWord-In-Context)
Number of occurrences of hit term(s) and field(s) in which they occur

D HIT
D KWIC
D OCC

D ISTD
D TRIAL(1) By default, patent numbers, application and priority numbers are displayed in STN Format. To display them in Derwent format, enter
SET PATENT DERWENT at an arrow prompt. To reset display to STN Format, enter SET PATENT STN.
(2) Custom display only.
(3) You can combine this display field with the qualifier .PK (Patent Kind Code) to display the content for a certain publication level of arecord, e.g. CLM.B2.
(4) SCAN must be specified on the command line, i.e., D SCAN or DISPLAY SCAN.
(5) If priority information is not available for a certain document, this information is taken from the application information of thisdocument and marked with an asterisk (*).

October 2023

13
TWFULL

SELECT, ANALYZE, and SORT Fields
The SELECT command is used to create E-numbers containing terms taken from the specified field(s) in ananswer set.
The ANALYZE command is used to create an L-number containing terms taken from the specified field(s) inan answer set.
The SORT command is used to rearrange the search results in either alphabetic or numeric order of thespecified field(s).
You can combine all fields except FA with the qualifier .M to SELECT/ANALYZE the content of all publicationlevels.
Field Name
Accession Number
Agent
Application Country
Application Date
Application Information
Application Kind CodeApplication Number, Original
Application Year
CPC Classification
Document Type
Entry Date
Entry Date Full-Text
EPC
Field Availability
ICO
International Patent Classification
Inventor
Inventor, Country
IPC (ICM, ICS, IPCI, IPCR)
IPC, Advanced Level Symbols
IPC, Advanced Level Symbols for Invention
IPC, Initial
IPC, Main
IPC, Reclassified
IPC, Reform
IPC, Secondary
Key Terms
Language
Language of FilingNumber of Paragraphs in DETD
Occurrence Count of Hit Terms
Patent Assignee
Patent Assignee, Country
Patent Applicant Normalized
Patent Applicant Standardized
Patent Country
Patent Information Publication Type
Patent Kind CodePatent Number
Patent Number, Original
Patent Number/Kind Code
Pre-IPC8 Symbols from ICM and first IPC8 values from 2006present

Field CodeANALYZE/
SELECT (1)

SORT

AN
AG
AC
AD
AI (AP, APPS)
AK
APO
AY
CPC
DT (TC)
ED
EDTX
EPC
FA
ICO
IC
IN (AU)IN.CNY
IPC
IPC.A
IPC.AI
IPCI
ICM
IPCR
IPC.REF
ICS
KT
LA
LAF
DETN
OCC
PA (CS)
PA.CNY
PAN
PAS
PC
PIT
PK
PI (PN, PATS)
PNO
PNK
IPC.F

Y
Y
Y
Y
Y (2)
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y (3)
Y
Y
Y
Y
Y
Y
Y
Y
N
N
Y
Y
Y
Y
Y
Y
Y
Y (default)
Y
Y
Y (3)

Y
Y
Y
Y
Y
Y
N
Y
Y
Y
Y
Y
Y
N
Y
N
Y
Y
Y
Y
N
Y
Y
Y
N
Y
N
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y

October 2023

14
TWFULL

SELECT, ANALYZE, and SORT Fields (cont’d)Field Name
Priority Country
Priority Date
Priority Date, First
Priority Number
Priority Number, OriginalPriority Year
Priority Year, First
Publication Date
Publication Year
Related Patent Country
Related Application Number
Related Application Date
Related Application Type
Related Application Year
Related Patent Date
Related Patent Number
Related Patent Year
Title
Update Date
Update Date Text

Field Code
PRC
PRD
PRDF
PRN (PRAI)
PRNO
PRY
PRYF
PD
PY
RLC
RLN
RLD
RLT
RLY
RLPD
RLPN
RLPY
TIEN
UP
UPTX

ANALYZE/
SELECT (1)
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y

(1) HIT may be used to restrict terms extracted to terms that match the search expression used to create the answer set,e.g., SEL HIT TI.
(2) Selects or analyzes application numbers with /AP appended to the terms created by SELECT.
(3) Appends /IPC to the terms created by SELECT.

Sample Records
DISPLAY BIB

October 2023

SORT
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y

15
TWFULLDISPLAY ISTD.M

October 2023

16
TWFULLDISPLAY ALL (STN format)

October 2023

17
TWFULL…

October 2023

18
TWFULL….

In North America
CAS
STN North America
P.O. Box 3012
Columbus, Ohio 43210-0012 U.S.A.
CAS Customer Center:Phone: 800-753-4227 (North America)
614-447-3731(worldwide)
E-mail: help@cas.org
Internet: www.cas.org

October 2023

In Europe
CAS Customer Center EMEA
Represented by
FIZ Karlsruhe - Leibniz-Institute for Information Infrastructure
Hermann-von-Helmholtz-Platz 176344 Eggenstein-Leopoldshafen
Germany
Phone: +49-721-9588 3155
E-mail: EMEAhelp@cas.org
Internet: www.fiz-karlsruhe.de

In Japan
JAICI (Japan Association forInternational Chemical Information)
STN Japan
Nakai Building
6-25-4 Honkomagome, Bunkyo-ku
Tokyo 113-0021, Japan
Phone: +81-3-5978-3601 (Technical Service)+81-3-5978-3621 (Customer Service)
E-mail: support@jaici.or.jp (Technical Service)customer@jaici.or.jp (Customer Service)
Internet: www.jaici.or.jp