JPFULL (Japan (JP) Patents Full-text)
Subject
Coverage

All patent-relevant areas of science and technology, i.e., all classes of the International
Patent Classification

File Type

Full-text

Features

ThesauriInternational Patent Classification (/IPC), Cooperative PatentClassification (/CPC), European Patent Classification (/EPC and/ICO)

Alerts (SDIs)

Weekly or monthly (weekly is the default)

CAS Registry
Number® Identifiers



SLART



Keep & Share

Structures



RecordContent• Full-text of patent applications, granted patents, utilities models and design patents
published in Japan.
• Records are available between two and seven days after publication date with thecomplete content.
• Records contain bibliographic data including patent assignee, inventor and legal
representative (in Japanese) information, patent, application, priority, and related
application data, IPC, CPC, EPC, and ICO classification codes, abstract, and full-textof description and claims.
• The IPC-based FI classification (/FCL) and the F-term classification (/FTERM) areavailable for more than 15 million Japanese patents and utility models back to 1960.
• The Locarno classification (/LCL) is available for the design patents.
• Abstracts are either machine translated or taken from equivalent documents if
available. Machine translated abstracts of documents with kind code A are replaced byhuman translated text about three months later. Titles are machine translated, which
are in case of kind code A documents replaced by human translations about threemonths later as well. Descriptions and claims are always machine translated.
• Title, abstract, patent assignee, and inventor are additionally displayable in Japanesecharacters.
• Independent claims and claim groups are searchable for all claims in English.
• Numeric values of 59 physical and chemical properties are searchable in about 20.000
variants of the base and additional units within all full text fields in English.
• Standardized and normalized patent assignee names are searchable in their own
fields /PAS and /PAN.
• Key terms, indexed and displayed in the field /KT, enhance retrieval of relevant results,
and make the evaluation of results more efficient. They are useful to broaden searchscope more precisely than Basic Index searches.
• Clipped images (mostly front-page images) are included, when available.
• The Field Availability Index contains information on the availability of name (applicants,
inventors, agents) or text fields (titles, abstracts, descriptions, claims).
• Database records comprise all documents published for one application.
• Some of the full-text has been created by Optical Character Recognition (OCR)
software. Therefore, characters may be misinterpreted, or portions of the text may be
incomplete.

File Size• More than 19.75 million family records with more than 27.2 million publications and12.2 million images (10/2023)

Coverage

Application year 1919 to present
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JPFULL

Updates

WeeklyLanguage

English

Database
Producer

LexisNexis Business Information Solutions B.V.
Radarweg 291043 NX Amsterdam
The Netherlands
Copyright Holder

Sources

Patent applications, granted patents, and utilities models published by theJapan Patent Office

User Aids• Online Helps (HELP DIRECTORY lists all help messages available)• STNGUIDE

Clusters• AEROTECH• ALLBIB• AUTHORS• CORPSOURCE• ENGINEERING• FULLTEXT• HPATENTS• NPS• PATENTS• PNTTEXTSTN Database Clusters information:
https://www.cas.org/support/training/stn/database-clusters

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JPFULL

Search and Display Field Codes
If multiple search terms are linked with and AND-operator, all terms are searched in the complete databaserecord, i.e., in all publications referring to one application. For a search in a specific publication of the record,connect the search term and the patent kind code with the (L)-proximity operator, e.g.,
S BOREHOLE/AB, TI, CLM (L) JPA/PK limits the search to Japanese applications JPA.
Fields that allow left truncation are indicated by an asterisk (*).

General Search Fields
SearchCode

Search Examples

Basic Index* (contains single words from title(TIEN), abstract (ABEN), detailed
description (DETDEN), claims (CLMEN),and main claims (MCLMEN) and key term(KT) fields)

None
or
/BI

S TRANSISTOR AND ELECTRODESACOUSTIC SENSOR
S ?TRANSFER?

TIEN, ABEN,
DETDEN,
CLMEN,MCLMEN, KT

Abstract*
Abstract in English*
Accession Number
Agent Number
Application Country(WIPO code and text)
Application Date (1)Application Kind CodeApplication Number (2)

/AB
/ABEN
/AN
/AGN
/AC

S BOREHOLE/ABS BOREHOLE/ABENS 2011006109/AN
S 100111442/AGN
S JP/ACAB
AB, ABEN
ANAGN
AI

S AD=JAN 2011
S JPA/AKS JP2011-101353/AP

AI
AI
AI

Application Number, Original
Application Year (1)Claims*Claims in English *Claims Claim Groups *

/AD
/AK
/AP
(or /APPS)
/APO
/AY
/CLM
/CLMEN/CLM.CGS JP2015004901U/APO
S AY>=2000
S DERIVATION/CLM
S DERIVATION/CLMENS OFFICE CHAIR/CLM.CG

Claims Independent Claims */CLM.ICS OFFICE CHAIR/CLM.IC

Cooperative Patent Classification (3)Cooperative Patent Classification,
Action Date
Cooperative Patent Classification, Keyword
Cooperative Patent Classification, Version
Data Entry Date (1)Data Update Date (1)Document Type(code and text)
Entry Date (1)Entry Date of Fulltext (1)European Patent Classification (3)/CPC/CPC.ACDS C12N0009/CPC
S 20121113/CPC.ACD

APO
AI
CLM
CLM, CLMEN
CLM,
CLM.CG
CLM.IC
CLM, CLMEN
CPC
CPC.TAB/CPC.KW/CPC.VER
/DED
/DUPD
/DT
(or /TC)/ED/EDTX/EPC (or/ECLA or
EPCLA)/EPC.KW/FA/IPC

S C12N0009/CPC (S) I/CPC.KW
S 20130101/CPC.VER
S 20221013DED
S 20220315/DUPD
S P/DTS UTILITY MODEL/DT
S ED=SEP 2012
S 20120926/EDTXS H02K0003-12/EPC

CPC.TAB
CPC.TAB
DED
DUPD
DT

S A/EPC.KW
S AB/FA
S A01B0001-02/IPC/IC(or /IPCMS)/IPC.ACD/ICA (or/IPCA

S A45D/IC

EPC
FA
ICM, ICS,ICA, ICI
IPCI, IPCRIC, ICM, ICS
ICA, ICI
IPC.TAB
ICA, IPC, IC

Search Field Name

EPC, Keywords
Field Availability
International Patent Classification(ICM, ICS, ICA, ICI, IPCI, IPCR) (3)International Patent Classification (ICM, ICS)International Patent Classification, Action Date
International Patent Classification, Advanced

S 21 JUL 2007/IPC.ACD
S C07K0019-00/ICA

Display
Codes

ED
EDTX
EPC

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JPFULL

General Search Fields (cont'd)
Search Field Name
International Patent Classification, Index

SearchCode

Search Examples

Display
Codes

Key Terms
Language (code and text)
Language, Filing (code and text)/ICI(or IPCIN)/ICO/IN(or /AU)/IN.CNY/IPCI/IPC.KW/ICM(or IPCM)/IPCR/IPC.REF/ICS(or IPCS)/IPC.VER/FCL(or /JPC)/FTRM(/FTERM,/JPCLA)
/KT
/LA
/LAF

Locarno Classification
Main Claim*
Main Claim in English *

/LCL
/MCLM
/MCLMENS GLUCOSE ABSORPTION/KT
S JA/LA or S JAPANESE/LA
S JA/LAF
S JAPANESE/LAF
S 19-02/LCLS ?FRACTURE?/MCLM
S ?FRACTURE?/MCLMEN

Number of Claims (1)Number of Paragraphs in DETD
(Detailed Description) (1)Patent Assignee Address
Patent Assignee/Patentee (4)

/CLMN
/DETN

S 5-7/CLMN
S DETN<10LCLMCLM
MCLMEN,
MCLM
CLMN
DETN

/PAA
/PA
(or /CS)/PA.CNY/PA.NO
/PA.T
/PAN
/PAS
/PC
/PIT

S TOKYO/PAAS AISIN SEIKI CO LTD/PA

PA
PA

S JP/PA.CNY
S 300004681/PA.NOS TOKYO/PA.T
S SONY/PANS SONY/PAS
S JP/PCS JPA DOC. LAID OPEN TO PUBL.
INSPEC. (PUBLISHED FROM 1971
ONWARDS/PITS JPA/PK
S JP 2012070634/PN

PA, PA.CNY
PA.NO
PA
PAN
PAS
PI
PIT

S JP2011062216/PNO
S JP2011062572A/PNKS VOLT/PHP (S) TOUCHSCREEN/BI
S JP/PRCS JAPAN/PRC
S PRD=MAY, 20 2003
S 20030520/PRD
S 20010614/PRDF
S DE2004-102004063838/PRN
S US10054698P/PRNO
S 2003/PRY
S 2003-2004/PRYF

PNO
PI
KWIC

ICO (in-computer-only) Classification (3)Inventor
Inventor, Country (WIPO code and text)
IPC, Initial
IPC, Keyword Terms
IPC, Main
IPC, Reclassified
IPC, Reform
IPC, Secondary
IPC, Version
Japanese Patent Classification(FI-Terms)
Japanese Patent Classification(F-Terms)

Patent Assignee, Country (4)Patent Assignee Number
Patent Assignee, Total
Patent Assignee Normalized
Patent Assignee Standardized
Patent Country (WIPO code and text)
Patent Information Publication Type

Patent Kind CodePatent Number (2)Patent Number, Original
Patent Number/Kind Code
Physical Properties/PK/PN(or /PATS)
/PNO
/PNK
/PHP

Priority Country(WIPO code and text)
Priority Date (1)/PRC

Priority Date, First (1)Priority Number (2)Priority Number, OriginalPriority Year (1)Priority Year, First (1)

/PRDF
/PRN
/PRNO
/PRY
/PRYF

October 2023

/PRD

S B29K0307:04/ICI

ICI, IPC, IC

S T04L0025:02C /ICO
S MASAKI NAGAOKA/IN
S MASAKI?/IN
S JP/IN.CNY
S B21B0001/IPCIS INITIAL/IPC.KW
S A63B017-00/ICM

ICO
IN

S B21D0005-02/IPCR
S A01B0001-16/IPC.REF
S A41C003-12/ICS

IPCR, IPC
IPC.TAB
ICS, IPC, IC

S 7/IPC.VER
S A01B0001-24 B/FCL

IPC.TABFCL

S 5H030/AA00/FTRM

FTRM

KT
LA
LAF

IN, IN.CNY
IPCI, IPC
IPC.TAB
ICM, IPC, IC

PI
PI

PRN
PRN
PRN
PRN
PRNO, PRAO
PRN
PRN

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JPFULL

General Search Fields (cont'd)
Search Field Name

SearchCode

Publication Date (1)Publication Year (1)Related Application Country
Related Application Number
Related Application Date (1)Related Application Year (1)Related Patent Country
Related Patent Number
Related Patent Date (1)Related Patent Year (1)Title
Title (English)*Update Date (1)Update Date Text (1)

/PD
/PY
/RLC
/RLN
/RLD
/RLY
/RLPC
/RLPN
/RLPD
/RLPY
/TI
/TIEN
/UP
/UPTX

Search Examples
S PD=MARCH-APRIL 2011
S PY>2008 AND L1
S WO/RLCS WO2005-JP19917/RLN
S 20050329/RLD
S 2005/RLY
S WO/RLPCS WO2021153764/RLPN
S 20210805/RLPD
S 2019/RLPY
S FLUID###/TI
S FLUID###/TIENS UP=SEP 2012
S 20210310/UPTX

Display
Codes
PI
PI
RLI
RLI
RLI
RLI
RLI
RLI
RLI
RLI
TI
TI, TIENUP
UPTX(1) Numeric search field that may be searched using numeric operators or ranges.
(2) By default, patent numbers, application and priority numbers are displayed in STN Format. To display them in Derwent format, enter
SET PATENT DERWENT at an arrow prompt. To reset display to STN Format, enter SET PATENT STN.
(3) An online thesaurus is available in this field.
(4) Search with implied (S) proximity is available in this field.

Super Search Fields
Enter a super search code to execute a search in one or more fields that may contain the desired information.
Super search fields facilitate crossfile and multifile searching. EXPAND may not be used with super search
fields. Use EXPAND with the individual field codes instead.
Search Field Name

SearchCode

FieldsSearched

Search Examples

Display
Codes

Application Number Group/APPS

AP, PRN, RLN

S JP2011-101353/APPS

Patent Assignee Group/PASSS BASF/PASSPatent Number Group/PATS

PA, PA.T, PAN,PAS
PN, RLPN

AI, PRAI,
APPS
PA, PAN, PAS

S JP 2012070634/PN

PI, RLPI

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JPFULL

Property Fields 1)
In JPFULL a numeric search for a specific set of physical properties (/PHP) is available within the full-text
fields (TIEN, ABEN, DETDEN, and CLMEN). The numeric values are not displayed as single fields, buthighlighted within the hit displays.
Use EXPAND/PHP to search for all available physical properties. A search with the respective field codes will
be carried out in all database fields with English text. The /PHP index contains a complete list of codes andrelated text for all physical properties available for numeric search.
Field
Code

Property

Unit

Symbol

/AOS
/BIR
/BIT
/CAP
/CATA
/CDN
/CMOL
/CON
/DB
/DEG
/DEN (/C)
/DEQ
/DOA
/DOS
(/LD50)/DV/ECH(/CHA)/ECO(/ECND)/ELC(/ECC)/ELF(/ECF)/ENE

Amount of substance
Bit Rate
Stored Information
CapacitanceCatalytic Activity
Current Density
Molarity, Molar Concentration
Conductance
DecibelDegreeDensity (Mass Concentration
Dose Equivalent
DosageDose

Mol
Bit/Second
Bit
Farad
Katal
Ampere/Square Meter
Mol/Liter
Siemens
DecibelDegreeKilogram/Cubic Meter
SievertMilligram/Kilogram/Day
Milligram/Kilogram

mol
bit/s
Bit
F
kat
A/m2
mol/L
S
dB
°
kg/m³
Sv
mg/kg/day
mg/kg

Viscosity, dynamic
Electric Charge

Pascal * Second
Coulomb

Pa * sC

S DV>5000
S 0.0001-0.001/ECH

Electrical Conductivity

Siemens/Meter

S/mElectric Current

AmpereAS ECO>800 S/M (15A)
AQUEOUSS 1-10/ELC

Electric Field

Volt/Meter

V/m

S 200/ELF

Energy

Joule

J

/ERE
(/ERES)/FOR/FRE (/F)/IU/KVElectrical Resistivity

Ohm * MeterS DROPLETS (10A) 40 JOULE 70 JOULE /ENES ERE>0.1

Force
Frequency
International Unit
Viscosity, kinematic

NewtonHertz
none
Square Meter/Second

N
Hz
IU
m2/s

/LEN
(/SIZ)/LUME

Length, Size

Meter

m

S 50 N /FORS OSCILLAT?/BI (S) 1- 3/FRE
S IU>1000 (P) VITAMIN AS METHYLPOLYSILOXANES/BI(10A) 200-300 CST /KV
S 1-4/LEN

Luminous Emittance,
IlluminanceLuminous Flux
Luminous Intensity
Mass
Mass to Charge Ratio
Magnetic Flux Density

Lux

lx

S 10-50/LUME

Lumen
CandelaKilogram
none
Tesla

Lm
cd
kg
m/z
T

S LUMF>1000
S LUMI<4
S ALLOY/BI (30A) 1E-10-1E-5/M
S MCH=1
S MFD>102

Mass Flow Rate

Kilogram/Second

kg/s

S MFR<0.1

Magnetic Field Strength
Molar Mass

Ampere/Meter
Gram/Mol

A/m
g/mol

S MFST/PHP
S 2000-3000 G/MOL/MM

Molality of Substance

Mol/Kilogram

/LUMF
/LUMI
/M
/MCH
/MFD
(/MFS)/MFR(/MFL)/MFST/MM (/MW,
/MOM)
/MOLS

October 2023

Ohm * mmol/kgSearch Examples
S 10 /AOS
S 8000-10000/BIR
S BIT > 3 MEGABIT
S 1-10 MF/CAP
S 1-10/CATAS CDN>10 A/M**2
S UREA/BI (S) 8/CMOLS 1S-3/CON
S DB>50
S CYLINDER/BI (S) 45/DEG
S 5E-3-10E-3/DEN
S 100/DEQ
S 100-300/DOA
S DOS>0.8

S 01.-10 MOL/KG/MOLS

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JPFULL

Property Fields 1) (cont'd)
Field
Code
/MVR

Property

Unit

Symbol

Search Examples

Melt Volume Rate,
Melt Flow Rate
Percent (Proportionality)
pH Valuenone

g/10 min

none
pH

%
pH

S POLYMER?/AB (5A) 4/PER
S 7.4-7.6/PHV

Power

Watt

W

Parts per million

Ppm

ppm

/PRES (/P)

Pressure

Pascal

Pa

/RAD
/RES
/RI
/RSP

Radioactivity
Electrical ResistanceRefractive Index
Rotational Speed

Becquerel
Ohmnone
Revolution/Minute

Bq
Ohm

/SAR

Area /Surface Area

Square Meter

m²

/SOL
(/SLB)/SSAM

Solubility

Gram/100 gram

g/100 gS "HG-XE-?"/BI (S) 100-200
WATT/POW
S 100 PPM /PPM (10A)
ADDITIVE/BI
S (VACUUM (5A) DISTILL?)/BI (S)1000-1100/PRESS RAD/PHPS SENSOR /BI (S) 10- 100/RES
S 3-4/RIS 2 RPM - 100 RPM /RSP (S)ENGINE/BIS PLATE/BI (S) 10 M**2 - 100
M**2 /SARS SOL>20 G/100G (5A) WATER

Specific Surface Area, Mass

m2/kg

S 1-10/SSAM

/STSC
(/ST)
/TCO
(/TCND)/TEMP (/T)
/TEX
/TIM

Surface Tension

Square Meter/
Kilogram
Joule /Square Meter

J/m²

S 60 J/M**2/STSC

Thermal Conductivity

Watt/Meter * Kelvin

W/m * K

S 1/TCO (S) HEAT?

Temperature
Tex
Time

KelvinGram/Kilometer
SecondK
g/kms/VEL (/V)
/VELA
/VLR

Velocity
Velocity, angular
Volumetric Flow Rate

Meter per Second
Radian/Second
Cubic Meter/Second

m/s
rad/s
m³/s

/VOL
/VOLT

VolumeVoltage

Cubic Meter
Volt

m³
V

/PER
/PHV
(/PH)
/POW
(/PW)
/PPM

rpm

S 3/MVR

S 20-25/TEMP
S 1-5/TEXS ?INCUB?/BI (10A) 50 S - 150 S/TIM
S REDUC?/BI (S) 1E-3-5E-3/VELS VELA>10
S 1 M**3/S - 2 M**3/S /VLR (S)ABRASIVE
S 1E-8-2E-8/VOL.EXS TENSION/BI (10A) 5E-3 V<VOLT<7E-3 V

1) Exponential format is recommended for the search of particularly high or low values, e.g., 1.8E+7 or 1.8E7 (for 18000000) or 9.2E-8(for 0.000000092).

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JPFULLInternational Patent Classification (/IPC) Thesaurus
The classifications, validity and catchwords for the main headings and subheadings from the current (8th)edition of the WIPO International Patent Classification (IPC) manual are available. The classifications from theprevious editions (1-7) are also available as separate thesauri. To EXPAND and SEARCH in the thesauri foreditions 1–7, use the field code followed by the edition number, e.g., /IPC2, for the 2nd edition. Catchwords
are included only in the thesauri for the 8th, 7th, 6th, and 5th editions.
Code
ADVANCED(ADV)
ALL
BRO (MAN)BT
CORE (COR)
ED
HIE
INDEX
KT
NEXT
NT
PREV
RT (SIB)
TI

Content

ExamplesAdvanced Codes for the Core Level IPC CodeE A61K0006-06+ADVANCED/IPC

All Associated Terms (BT, SELF, NT, RT)
Complete Class
Broader Term (BT, SELF)
Core Codes for the Advanced Level IPC CodeComplete title of the SELF term and IPC manual edition
Hierarchy Term (Broader and Narrower Term)(BT, SELF, NT)
Complete title of the SELF term
Keyword Term (catchwords) (SELF, KT)
Next Classification
Narrower Terms (SELF, NT)
Previous Classification
Related Terms (SELF, RT)
Complete Title of the SELF Term and Broader Terms(BT, SELF)

E C01C003-00+ALL/IPC
E C01C+BRO/IPC
E C01F001-00+BT/IPC
E G08C0019-22+CORE/IPC
E C01F001-00+ED/IPC
E C01B003-00+HIE/IPC
E C01F001-00+INDEX/IPC
E CYANOGEN+KT/IPC
E C01C001-00+NEXT5/IPC
E C01C+NT/IPC
E C01C001-12+PREV10/IPC
E C01C003-20+RT/IPC
E C01F001-00+TI/IPC

ECLA (/EPC) and ICO ThesauriThis thesaurus is available in the /EPC search field (for ECLA codes) and /ICO search field (for 'in-computeronly' codes). All relationship codes can be used with both the EXPAND and SEARCH commands.
Relationship
Code
ALL
AUTO (1)
BT
CODE
DEF
HIE
KT
MAX
NEXT
NEXT(n)NT
PREV
PREV(n)TI

Content

Search Examples

All usually required terms (BT, SELF, CODE, DEF)
Automatic relationship (BT, SELF, CODE, DEF)
Broader terms (BT, SELF)
Classification Code (SELF, CODE)
Definition (SELF, DEF)
Hierarchy terms (all broader and narrower terms) (BT,SELF, DEF, NT)
Keyword terms (SELF, KT)
All associated terms
Next classification within the same class (SELF, NEXT)
Next n classification within the same class
Narrower terms
Previous Code within the same class (SELF, PREV)
Previous n classifications within the same class
Complete Title of the SELF Term and Broader Terms(BT, SELF)

E C12M0001-34H2+ALL/EPC
E G01J003-443+AUTO/EPC
E G01J0003-443+BT/EPC
E SCRAPER BIASING MEANS+CODE/EPC
E B65G0045-16+DEF/EPC
E A01B0001+HIE/EPC
E LASER+KT/EPC
E G01J0003-44B+MAX/EPC
E A01B0001-24+NEXT/EPC
E A01B0001-24+NEXT3/EPC
E G05B0001-04+NT/EPC
E G05B0019-418N1+PREV/EPC
E G05B0019-418N1+PREV2/EPC
E G05B0001-03+TI/EPC(1) Automatic Relationship is SET OFF. In case of SET REL ON, the result of EXPAND or SEARCH without any relationship code is thesame as described for AUTO.

October 2023

9
JPFULLCPC Thesaurus
This thesaurus is available in the /CPC search field. All relationship codes can be used with both the EXPAND
and SEARCH commands.
Relationship CodeALL
AUTO (1)
BT
CODE
DEF
HIE
KT
MAX
NEXT
NEXT(n)NT
PREV
PREV(n)TI

Content
All usually required terms (BT, SELF, CODE, DEF)
Automatic relationship (BT, SELF, CODE, DEF)
Broader terms (BT, SELF)
Classification Code (SELF, CODE)
Definition (SELF, DEF)
Hierarchy terms (all broader and narrower terms) (BT, SELF,
DEF, NT)
Keyword terms (SELF, KT)
All associated terms
Next classification within the same class (SELF, NEXT)
Next n classification within the same class
Narrower terms
Previous Code within the same class (SELF, PREV)
Previous n classifications within the same class
Complete Title of SELF Term and Broader Terms (BT, SELF)

Search Examples
E C12M0001-005+ALL/CPC
E G01J003-443+AUTO/CPC
E G01J0003-443+BT/CPC
E CARTRIDGES+CODE/CPC
E B65G0045-16+DEF/CPC
E A01B0001+HIE/CPC
E LASER+KT/CPC
E G01J0003-44+MAX/CPC
E A01B0001-24+NEXT/CPC
E A01B0001-24+NEXT3/CPC
E G05B0001-04+NT/CPC
E G05B0019-00+PREV/CPC
E G05B0019-00+PREV2/CPC
E G05B0001-03+TI/CPC(1) Automatic Relationship is SET OFF. In case of SET REL ON, the result of EXPAND or SEARCH without any relationship code is thesame as described for AUTO.

October 2023

10
JPFULLDISPLAY and PRINT Formats
Any combination of formats may be used to display or print answers. Multiple codes must be separated by
spaces or commas, e.g., D L1 1-5 TI PA. The fields are displayed or printed in the order requested.
The information of the latest publication is displayed by default. To display the content for all levels of therecord you can combine all display fields and formats with the qualifier .M except FA, SCAN, and TRIAL.
For displaying a particular publication of a database record, you can simply add for certain display field thekind code to the appropriate display format, e.g., ALL.A. Fields that allow this are indicated by a number (3).
Hit-term highlighting is available for all fields. Highlighting must be ON during SEARCH to use the HIT, KWIC,
and OCC formats.
The default display format is STD.M, i.e., all publication levels of one family in the STD format.
FormatAB (ABS)
ABEN
ABJA
AGN
AGJA
AI (AP) (1)AN
APO
CLM (2)
CLM.CG (3)
CLM.IC (3)CLMEN (3)
CLMN (2)CPC
CPC.TAB
DETD (3)
DETN (2)DT (TC)
ED
EDTX
EPC
FA
FCL
FTRM
(FTERM, JPCLA)
IC
ICA
ICI
ICM
ICO
ICS
IN (AU)IN.CNY
INJA
IPC
IPC.TAB
IPCI
IPCR
LA
LAF
LCL
MCLM (3)MCLMEN (3)PA (CS)
PA.CNY
PA.NO

October 2023

Content

ExamplesAbstract
Abstract (English)
Abstract (Japanese)
Agent Number
Agent (Japanese)
Application Information
Accession Number
Application Number Original
ClaimsClaims, Claim Group
Claims, Independent Claims
Claims (English)
Number of Claims
Cooperative Patent Classification
CPC, Tabular
Detailed Description
Number of Paragraphs in DETD
Document Type
Entry Date
Entry Date of Fulltext
European Patent Classification
Field Availability (for all publication levels)
Japanese Patent Classification (FI-Terms)
Japanese Patent Classification (F-Terms)

D TI AB 1-5
D ABEND ABJA
D AGN
D AGJA
D AI
D L3 AND APO
D CLM
D CLM.CG
D CLM.IC
D CLMEND CLMN
D CPC
D CPC.TAB
D DETDD DETND DT
D ED
D EDTX
D EPC
D FA
D FCL
D FTRM

IPC, Version 1-7 (format contains ICM, ICS, ICA, ICI)
IPC, Additional
IPC, Indexed
IPC, Main
ICO (in-computer-only) Classification
IPC, Secondary
Inventor
Inventor, Country
Inventor (Japanese)
IPC, version 1-8 (format contains ICM, ICS, ICA, ICI, IPCI, IPCR)
IPC, Tabular Format
IPC, Initial
IPC, Reclassified
Language
Language of Filing
Locarno Classification
Main Claim
Main Claim (English)
Patent Assignee/Patentee
Patent Assignee, Country
Patent Assignee, Number

D IC
D ICA
D ICI
D ICM
D ICO
D ICS
D IN
D IN.CNYD INJA
D IPC
D IPC.TAB
D IPCID IPCR
D LA
D LAF
D LCL
D MCLMD MCLMEN
D PA
D PA.CNY
D PA.NO

11
JPFULLDISPLAY and PRINT Formats (cont’d)FormatContent

Examples

PAN
PNO
PAN
PAS
PI (PN, PATS) (1)PITPNO
PRN (PRAI) (1,5)
PRNO (PRAO) (2)
RLI (RLN)
RLPI
TI
TIEN
TIJA
UP
UPTX

Patent Assignee Number
Patent Number, Original Format
Patent Assignee Number
Patent Assignee Standardized
Patent Information
Patent Information Publication Type
Patent Number, Original Format
Priority Information
Priority Number, Original Format
Related Patent Information
Related Patent Information
Title
Title (English)
Title (Japanese)
Update Date
Update Date Text

D PAN
D PNO
D PAN
D PAS
D PI
D PIT
D PNO
D PRN
D PRNO
D RLI
D RLPI
D TI
D TIEND TIJAD UP
D UPTXALL (1,3)

AN, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, TIJA, IN, PA, PA.NO, PAS,
PAN, AGN, LAF, LA, DT, PI, PIT, AI, PRAI, RLPI, RLI, IPC, CPC, EPC, ICO,
FCL, FTRM, LCL, ABEN, DETDEN, CLMEN, KT
AN, EDP, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, TIJA, IN, INJA, PA, PJA,
PA.NO, PAS, PAN, AGJA, AGN, LAF, LA, DT, PI or PNO (if no PI), PIT, AI or
APO (if no AI), PRAI or PRAO (if no PRAI), RLPI, RLI, IPC, CPC, EPC, ICO,
FCL, FTRM, LCL, ABEN, ABJA, DETDEN, CLMEN, KT
ALL, indented with text labels
ALL, delimited for post processing
AI, RLN, PRAI
AN, ED, EDTX, UP, UPTX, DED, DUPD, TI, IN, IN.CNY, PA, PA.CNY, LAF, LA,
DT, PIT, PI, AI, RLI, PRAI
AN, EDP, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, TIJA, IN, INJA, PA, PAJA,
PA.NO, PAS, PAN, AGJA, AGN, LAF, LA, DT, PI or PNO (if no PI), PIT, AI or
APO (if no AI), PRAI or PRAO (if no PRAI), RLPI, RLI
AN, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, TIJA, IN, PA, PA.NO, PAS,
PAN, AGN, LAF, LA, DT, PI, PIT, AI, PRAI, RLPI, RLI
AN, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, TIJA, IN, PA, PA.NO, PAS,
PAN, AGN, LAF, LA, DT, PI, PIT, AI, PRAI, RLPI, RLI, IPC, CPC, EPC, ICO,
FCL, FTRM, LCL, ABEN, MCLMEN, KT
AN, EDP, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, TIJA, IN, INJA, PA, PAJ,
PA.NO, PAS, PAN, AGJA, AGN, LAF, LA, DT, PI or PNO (if no PI), PIT, AI or
APO (if no AI), PRAI or PRAO (if no PRAI), RLPI, RLI, IPC, CPC, EPC, ICO,
FCL, FTRM, LCL, ABEN, ABJA, MCLMEN, KT
BRIEF, indented with text labels
ED, IPC (ICM, ICS, ICA, ICI, IPCI, IPCR), CPC, EPC, ICO
International Patent Classification (ICM, ICS, ICA, ICI, IPCI, IPCR)
IPC, IPC.KW, IPC.VER, in tabular version
CPC, in tabular version
AN, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, TIJA, IN, PA, PA.NO, PAS,
PAN, AGN, LAF, LA, DT, PI, PIT, AI, PRAI, RLPI, RLI, IPC, CPC, EPC, ICO,
FCL, FTRM, LCL, ABEN, DETDEN, CLMEN, KT, FA for all levels of publication
MAX, indented with text labels
TI (random display without answer numbers)
AN, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, TIJA, IN, PA, PA.NO, PAS,
PAN, AGN, LAF, LA, DT, PI, PIT, AI, PRAI, RLPI, RLI, IPC, CPC, EPC, ICO,
FCL, FTRM, LCL (STD.M is default)

D ALL

ALLO (1,3)

IALL (1,3)
DALL (1)APPS (1)BIB (1)
BIBO (1)

IBIB (1)
BRIEFO (1)

BRIEF (1)

IBRIEF (1)IND
IPC
IPC.TAB
CPC.TABMAX (ALL.M) (1)

IMAX (IALL.M) (1)
SCAN (4)STD (1)

D ALLOD IALLD DALLD APPS
D BIB
D BIBOD IBIB
D BRIEF

D BRIEFOD IBRIEF
D IND
D IPC
D IPC.TAB
D CPC.TAB
D MAX

D IMAXD SCAND STD

October 2023

12
JPFULLDISPLAY and PRINT Formats (cont’d)FormatContent

Examples

ISTD (1)
TRIAL (TRI, SAM,SAMPLE, FREE)
TX

STD, indented with text labels
ED, EDTX, UP, UPTX, DED, DUPD, TIEN, FA, DETN, CLMND ISTD
D TRIAL

DETD, CLM

D TX

HIT
KWIC
OCC

Hit term(s) and field(s)Up to 50 words before and after hit term(s) (KeyWord-In-Context)
Number of occurrences of hit term(s) and field(s) in which they occur

D HIT
D KWIC
D OCC(1) By default, patent numbers, application and priority numbers are displayed in STN Format. To display them in Derwent format, enter
SET PATENT DERWENT at an arrow prompt. To reset display to STN Format, enter SET PATENT STN.
(2) Custom display only.
(3) You can combine this display field with the qualifier .PK (Patent Kind Code) to display the content for a certain publication level of arecord, e.g., CLM.B2.
(4) SCAN must be specified on the command line, i.e., D SCAN or DISPLAY SCAN.
(5) If priority information is not available for a certain document, this information is taken from the application information of thisdocument and marked with an asterisk (*).

October 2023

13
JPFULL

SELECT, ANALYZE, and SORT Fields
The SELECT command is used to create E-numbers containing terms taken from the specified field in ananswer set.
The ANALYZE command is used to create an L-number containing terms taken from the specified field in ananswer set.
The SORT command is used to rearrange the search results in either alphabetic or numeric order of thespecified field(s).
You can combine all fields except FA with the qualifier .M to SELECT/ANALYZE the content of all publicationlevels.
Field
Name
Abstract
Abstract (English)
Accession Number
Agent Number
Application Country
Application Date
Application Information
Application Kind CodeApplication Year
CPC Classification
Data Entry Date
Data Update Date
Document Type
Entry Date
Entry Date Full-text
European Patent Classification
Field Availability
International Patent Classification
Inventor
Inventor, Country
IC (ICM, ICS, ICA, ICI)ICO (in-computer-only) Classification
IPC (ICM, ICS, ICA, ICI, IPCI, IPCR)
IPC, Additional
IPC, Advanced Level Symbols
IPC, Advanced Level Symbols for Invention
IPC, Core Level
IPC, Core Leve for Invention
IPC, Indexed
IPC, Initial
IPC, Main
IPC, Reclassified
IPC, Reform
IPC, Secondary
Japanese Patent Classification (F-Term)
Japanese Patent Classification (FI-Term)
Key Terms
Language
Language of Filing
Locarno Classification
Number of Claims
Number of Paragraphs in DETD
Occurrence Count of Hit Terms
Patent Assignee/Patentee
Patent Assignee, Country
Patent Assignee, Address
Patent Assignee Normalized
Patent Assignee Number
Patent Assignee Standardized

Field
Code
AB
ABEN
AN
AGN
AC
AD
AI (AP, APPS)
AK
AY
CPC
DED
DUPD
DT
ED
EDTX
EPC (ECLA)FAIC
IN (AU)IN.CNYICICOIPCICA (IPCA)
IPC.A
IPC.AI
IPC.C
IPC.CIICI (IPCIN)IPCIICM (IPCM)
IPCR
IPC.REF
ICS (IPCS)
FTRM
FCL
KT
LA
LAF
LCL
CLMN
DETN
OCC
PA (CS)
PA.CNY
PAA
PAN
PA.NO
PAS

ANALYZE/
SELECT (1)
Y
Y
Y
Y
Y
Y
Y (2)
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y (4)
Y (4)
Y (4)
Y (4)
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
N
Y
Y
Y
Y
Y
Y

SORT
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
N
N
Y
Y
Y
Y
Y
Y
N
N
N
N
Y
Y
Y
Y
N
Y
Y
Y
N
Y
Y
Y
Y
Y
Y
Y
Y
N
Y
Y
Y
October 2023

14
JPFULL

SELECT, ANALYZE, and SORT Fields (cont’d)
Field
Name
Patent Country
Patent Information Publication Type
Patent Information Publication Type
Patent Kind CodePatent Number
Patent Number, Original
Patent Number/Kind Code
Pre-IPC8 Symbols from the ICM and first IPC8 values from2006-present
Priority Country
Priority Date
Priority Date, First
Priority Number
Priority Number, OriginalPriority Year
Priority Year, First
Publication Date
Publication Year
Related Application Country
Related Application Number
Related Application Date
Related Application Year
Related Patent Country
Related Patent Number
Related Patent Date
Related Patent Year
Title
Update Date

Field
Code

ANALYZE/
SELECT (1)

PC
PIT
PIT
PK
PI (PN, PATS)
PNO
PNK
IPC.F

Y
Y
Y
Y
Y (default)
Y
Y
Y (4)

PRC
PRD
PRDF
PRN (PRAI)
PRNO
PRY
PRYF
PD
PY
RLC
RLN
RLD
RLY
RLPC
RLPN
RLPD
RLPY
TIEN
UP

Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y

SORT
Y

(1) HIT may be used to restrict terms extracted to terms that match the search expression used to create the answer set,e.g., SEL HIT TI.
(2) Selects or analyzes application numbers with /AP appended to the terms created by SELECT.
(3) Appends /BI to the terms created by SELECT.
(4) Appends /IPC to the terms created by SELECT.

October 2023

Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y

15
JPFULL

Sample Records
DISPLAY ISTDANSWER 1 JPFULLCOPYRIGHT 2023 LNU on STN.
ACCESSION NUMBER:
2011040790
JPFULLENTRY DATE PATENT:
20120926 Full-text
ENTRY DATE:
20120926
UPDATE DATE:
20220417
ENTRY DATE (FULLTEXT): 20120926
UPDATE DATE (FULLTEXT): 20210715
DATA ENTRY DATE:
20111223
DATA UPDATE DATE:
20220412
TITLE (ENGLISH):USE OF GLASS FOR APPLICATION TO PHOTOVOLTAIC POWER
GENERATIONTITLE (JAPANESE):
太陽光発電適用のためのガラスの使用
INVENTOR(S):FAFNER JORG;
OTTO FRANZ;SPAIGHT BURCKHARD
PATENT APPLICANT(S):
Schott AG, Hattenbergstr.10, D-55122 Mainz, Germany
PATENT APPL. STANDARD.: SCHOTTPATENT APPL. NORMAL.:SCHOTTPATENT APPLICANT NUMB.: 504299782
AGENT NUMBER:
100116872
LANGUAGE OF FILING:
Japanese
LANGUAGE OF PUBL.:
Japanese
DOCUMENT TYPE:
Patent; (Fulltext)
PATENT INFORMATION:
JP 2011258954
A
20111222
PATENT INFO. TYPE:JPA PUBLISHED UNEXAMINED PATENT APPLICATION [FROM19710716 ONWARDS] or PUBLISHED UNEXAMINED PATENTAPPLICATION (BASED ON INTERNATIONAL APPLICATION) [FROM
19790726 ONWARDS]APPLICATION INFO.:
JP 2011-128030
A
20110608
PRIORITY INFO.:
DE 2010-102010023366
20100610
IPC ORIGINAL:
H01L0031-04 [I,A]; C03C0003-083 [I,A]; C03C0003-085[I,A]; C03C0003-087 [I,A]; C03C0003-091 [I,A];
C03C0003-093 [I,A]; C03C0003-095 [I,A]
CPC CLASSIF.:
Y02E0010-541; C03C0003-093; C03C0003-087;
H01L0031-03925; H01L0031-0322; C03C0003-085;
C03C0003-11; H01L0031-0392; H01L0031-03923;
C03C0003-112
JAP. PATENT CLASSIF.:
H01L0031-04 E; C03C0003-08; C03C0003-08; C03C0003-08;
C03C0003-09; C03C0003-09; C03C0003-09
FTERM CLASSIF.:
4G062/AA01; 4G062/BB01; 4G062/DA05; 4G062/DA06;
4G062/DB03; 4G062/DB04; 4G062/DC01; 4G062/DC02;
4G062/DC03; 4G062/DD01; 4G062/DE01; 4G062/DE02;
4G062/DE03; 4G062/DF01; 4G062/EA01; 4G062/EA02;
4G062/EA03; 4G062/EB04; 4G062/EC01; 4G062/EC02;
4G062/EC03; 4G062/ED01; 4G062/ED02; 4G062/ED03;
4G062/EE01; 4G062/EE02; 4G062/EE03; 4G062/EF01;
4G062/EF02; 4G062/EF03; 4G062/EG01; 4G062/EG02;
4G062/EG03; 4G062/FA01; 4G062/FA10; 4G062/FB01;
4G062/FB02; 4G062/FB03; 4G062/FC01; 4G062/FC02;
4G062/FC03; 4G062/FD01; 4G062/FE01; 4G062/FF01;
4G062/FG01; 4G062/FH01; 4G062/FJ01; 4G062/FK01;
4G062/FL01; 4G062/FL02; 4G062/FL03; 4G062/GA01;
4G062/GA02; 4G062/GA03; 4G062/GA10; 4G062/GB01;
4G062/GC01; 4G062/GD01; 4G062/GE01; 4G062/GE02;
October 2023

16
JPFULL
4G062/GE03; 4G062/HH01; 4G062/HH03; 4G062/HH05;
4G062/HH07; 4G062/HH08; 4G062/HH09; 4G062/HH11;
4G062/HH12; 4G062/HH13; 4G062/HH15; 4G062/HH17;
4G062/HH20; 4G062/JJ01; 4G062/JJ03; 4G062/JJ04;
4G062/JJ05; 4G062/JJ07; 4G062/JJ10; 4G062/KK01;
4G062/KK03; 4G062/KK05; 4G062/KK07; 4G062/KK10;
4G062/MM27; 4G062/NN34; 5F151/AA09; 5F151/AA10;
5F151/GA03
EPC CLASSIF. (ECLA):
H01L0031-032C; C03C0003-085; C03C0003-087;
C03C0003-093; C03C0003-11; C03C0003-112; H01L0031-0392
IN-COMPUTER-ONLY CLASSIF.:Y02E0010-50

DISPLAY BIBO.M
ANSWER 1 JPFULL
AN
TIEN
TIJA

INJA

PA
PAS
PAN
PA.NO
PAJA

AGN
AGJA

LAF
LA
DT
PIT

PI
AI
RLI
PRAI
AN
TIEN
TIJA

COPYRIGHT 2023 LNU on STN.

2023001513
JPFULL EDP 20230326 ED 20230326 UP 20230423 EDTX 20230326
DED 20230324 DUPD 20230419 Full-text
Filter segments, non-combustion heated smoking articles andnon-combustion heated smoking systems
フィルターセグメン
ト、非燃焼加熱喫煙
物品及び非燃焼加熱
喫煙システム山内 悠司,
東京都墨田区横川一丁目17番7号
日本たばこ産業株式
会社内JAPAN TOBACCO INC
JAPAN TOBACCO
JAPAN TOBACCO
000004569
日本たばこ産業株式会社, 東京都港区虎ノ門四丁目1番1号
100118902; 100106208; 100196508; 100168066
山本 修
宮前 徹
松尾 淳一
鈴木 雄太
JapaneseJapanese
Patent; (Fulltext)
JPA PUBLISHED UNEXAMINED PATENT APPLICATION [FROM 19710716 ONWARDS] or
PUBLISHED UNEXAMINED PATENT APPLICATION (BASED ON INTERNATIONALAPPLICATION) [FROM 19790726 ONWARDS]
JP 2023041888
A
20230324
JP 2023-15089
20230203
JP 2020-555707
20191112
Parent Application
JP 2018-213395
201811142023001513
JPFULL EDP 20230326 ED 20230424 UP 20230423 EDTX 20230424
DED 20230417 DUPD 20230419 Full-text
Filter segments, non-combustion heated smoking articles andnon-combustion heated smoking systems
フィルターセグメン

October 2023

17
JPFULL

INJA

PA
PAS
PAN
PA.NO
PAJA

AGN
AGJA

LAF
LA
DT
PIT

PI
AI
RLI
PRAI

ト、非燃焼加熱喫煙
物品及び非燃焼加熱
喫煙システム山内 悠司,
東京都墨田区横川一丁目17番7号
日本たばこ産業株式
会社内JAPAN TOBACCO INC
JAPAN TOBACCO
JAPAN TOBACCO
000004569
日本たばこ産業株式会社, 東京都港区虎ノ門四丁目1番1号
100118902; 100106208; 100196508; 100168066
山本 修
宮前 徹
松尾 淳一
鈴木 雄太
JapaneseJapanese
Patent; (Fulltext)
JPB2 PUBLISHED EXAMINED PATENT APPLICATION (SECOND LEVEL) [FROM 19710716
ONWARDS] or PUBLISHED GRANTED PATENT (SECOND LEVEL) [FROM 19960301
ONWARDS]
JP 7259146B
B220230417
JP 2023-15089
20230203
JP 2020-555707
20191112
Parent Application
JP 2018-213395
20181114

October 2023

18
JPFULLDISPLAY ALL
AN
TIEN
TIJA

INJA
PA
PAJA
PAS
PA.NO
LAF
LA
DT
PI
PIT

AI
PRAI
IPCI
FCL
FTRM

ANSWER 1 JPFULLCOPYRIGHT 2023 LNU on STN.
2022065984
JPFULL EDP 20230402 ED 20230402 UP 20230417 EDTX 20230402
DED 20230331 DUPD 20230413 Full-text
Holders for used beverage cartons and other paper items
使用済みの飲料物の紙パック等紙類のホルダー
大木 將弘,
静岡県三島市梅名244-2
OKI MASAHIRO大木 將弘,
静岡県三島市梅名244-2
OKI MASAHIRO
308004630
JapaneseJapanese
Patent; (Fulltext)
JP 2023044733
A
20230331
JPA PUBLISHED UNEXAMINED PATENT APPLICATION [FROM 19710716 ONWARDS] or
PUBLISHED UNEXAMINED PATENT APPLICATION (BASED ON INTERNATIONALAPPLICATION) [FROM 19790726 ONWARDS]
JP 2022-161951
20220917
JP 2021-171244
20210920
JP 2022-142572
20220822
B65D0061-00 [I,A]
B65D0061-00 J
3E085/AA04; 3E085/AB01; 3E085/AB03; 3E085/AD01

AB

Machine translation
Challenge: Provide holders for used beverage cartons and other paper
items that can be stored together in a small amount of space and can beeasily bundled together.
[Solution] A tip that can temporarily fasten a pocket of an extendable
band 5 having a band-compatible pillar 3 in a set of two bands, and at
the top of each band-compatible pillar, Velcro 6 on the front and backof both ends, and a pocket 2 on the surface of both ends is provided.
and elastic bands. Also in a set of two, each pillar has a tack 10 and atack-compatible string 11 on the outside of each pillar, and at least
one flexible tack-compatible pillar that can sandwich used paper cartonscrushed by the two tack-compatible pillars 9.
[Selected diagram] Fig. 9
DETDEN[DESC0001]
The present invention is a holder that can be stored
without taking up space when storing paper such as paper carton
containers of used beverages and envelopes to be disposed of as
renewable resources, and when disposed of as recyclable waste, aplurality of paper packs and seals to be disposed of can be easily andfirmly tied together.
……………

October 2023

19
JPFULL[DESC0008] 1 Main unit
2 pockets
Three-band pole
4-band pole tip
5 Stretchable Band
6 Velcro
7 Crushed used paper cartons and other paper
8 Binding cord
9 Pillars for tacks
10 tacks
11 Tack compatible cord
CLMEN
[CLM0001]
Holders for used beverage cartons and other paper cartons
having a main body (1) installed so that one or more sets of pillars (1)are installed so that the combination of two pillars (3) and (9) facing
each other decreases as each of them moves downward.
[CLM0002]
Holders for paper cartons and other paper cartons of usedbeverages in which at least one pair of band-compatible pillars (3) witha tip (4) that can temporarily fasten an extendable band (5) at the topof the pillar………………

KT
beverage carton; paper item; paper carton; paper pack; distractable
stretchable band body; extendable band; tack-compatible pillar; tackcompatible pillar; tack correspondence pillar; band-compatible pillar;
shrinkable band; tack-compatible string; tack compatible cord; elastic
band; binding string; stretchable bandperspective view; body bird;
velcro tape; sandwich bundle; body surface; recycled resource; original
shape; sealed letter; bonding string; recyclable waste; stretchable
bandbehind; slippery material; binding cord; renewable resource;
valuable resource

In North America
CAS
STN North America
P.O. Box 3012
Columbus, Ohio 43210-0012 U.S.A.
CAS Customer Center:Phone: 800-753-4227 (North America)
614-447-3731(worldwide)
E-mail: help@cas.org
Internet: www.cas.org

In Europe
CAS Customer Center EMEA
Represented by
FIZ Karlsruhe - Leibniz-Institute for Information Infrastructure
Hermann-von-Helmholtz-Platz 176344 Eggenstein-Leopoldshafen
Germany
Phone: +49-721-9588 3155
E-mail: EMEAhelp@cas.org
Internet: www.fiz-karlsruhe.de

In Japan
JAICI (Japan Association forInternational Chemical Information)
STN Japan
Nakai Building
6-25-4 Honkomagome, Bunkyo-ku
Tokyo 113-0021, Japan
Phone: +81-3-5978-3601 (Technical Service)+81-3-5978-3621 (Customer Service)
E-mail: support@jaici.or.jp (Technical Service)customer@jaici.or.jp (Customer Service)
Internet: www.jaici.or.jp

October 2023