INFULL (Indian (IN) Patents Full-text)
Subject
Coverage

All patent-relevant areas of science and technology, i.e., all classes of the International
Patent Classification

File Type

Full-text

Features

Thesauri

Alerts (SDIs)

International Patent Classification (/IPC), Cooperative PatentClassification (/CPC), European Patent Classification (/EPC and/ICO)
Weekly or monthly (weekly is the default)

CAS Registry
Number® Identifiers



SLART



Keep & Share

Structures



RecordContent• Full-text of patent applications and granted patents in India from publication year 1912
onwards.
• Records are available about a week after publication date with the complete content.
• Records contain bibliographic data including patent applicant and inventor, patent,
application, priority, and related application data, IPC, CPC, EPC, and ICO
classification codes, abstract, and full-text of description and claims.
• Abstracts are either original or taken from equivalent documents if available. If
description and claims are not present in sufficient quality, they are taken fromequivalent documents and indexed with DETD.EQ and/or CLM.EQ in the field
availability (FA) index.
• Numeric values of 55 physical and chemical properties are searchable in about 1800
unit variants in all full-text fields.
• Original application and publication numbers are indexed in the search fields
application number, original (/APO) and patent number, original (/PNO)• Database records comprise all documents published for one application.
• Bibliography and full-text have been created by Optical Character Recognition (OCR)
software for many documents. A number of original documents are printed in poor
quality and may cause misinterpretations of characters. Portions of the text may be
incomplete.

File Size• More than 980,500 family records with more than 1.22 million publications (10/2023)• More than 413,000 front page images from 1975 to present (10/2023)

Coverage

1912–present; between 1912 and 1994, only granted patents (kind code A1) areavailable

Updates

WeeklyLanguage

EnglishOctober 2023

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INFULL

Database
Producer

LexisNexis Business Information Solutions B.V.
Radarweg 291043 NX Amsterdam
The Netherlands
Copyright Holder

Sources

Patent applications and granted patents published by the Intellectual Property Office in
India

User Aids• Online Helps (HELP DIRECTORY lists all help messages available)• STNGUIDE

Cluster• AEROTECH• ALLBIB• AUTHORS• CORPSOURCE• ENGINEERING• FULLTEXT• HPATENTS• NPS• PATENTS• PNTTEXTSTN Database Clusters information:
https://www.cas.org/support/training/stn/database-clusters

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INFULL

Search and Display Field Codes
If multiple search terms are linked with and AND-operator, all terms are searched in the complete databaserecord, i.e. in all publications referring to one application. For a search in a specific publication of the record,connect the search term and the patent kind code with the (L)-proximity operator, e.g.
S BOREHOLE/AB,TI,CLM (L) INA/PK limits the search to Indian applications INA.
Fields that allow left truncation are indicated by an asterisk (*).

General Search Fields
SearchCode

Search Examples

Basic Index* (contains single words from title(TI), abstract (AB), detailed description(DETD), claims (CLM), and main claims(MCLM) fields)

None
or
/BI

S TRANSISTOR AND ELECTRODES ACOUSTIC SENSOR
S ?TRANSFER?

TI, AB, DETD,
CLM, MCLM

Abstract *Accession Number
Application Country(WIPO code and text)
Application Date (1)Application Number (2)

/AB
/AN
/AC

S BOREHOLE/AB
S 2011000109/AN
S IN/AC

AB
AN
AI

/AD
/AP
(or /APPS)
/APO
/AY
/CLM
/CPC
/CPC.ACDS AD=JAN 2011
S IN2010-CH1005/APAI
AI

S IN1005CHE2010/APO
S AY>=2000
S DERIVATION/CLM
S C12N0009/CPC
S 20121113/CPC.ACD

APO
AI
CLM
CPC
CPC.TAB/CPC.KW/CPC.VER
/DED
/DUPD
/DT
(or /TC)
/ED
/EDTX
/EPC
(or /ECLA)/EPC.KW
/FA
/GIS
/GIT
/IPC

S C12N0009/CPC (S) I/CPC.KW
S 20130101/CPC.VER
S 20120113/DED
S 20120124/DUPD
S P/DTS PATENT/DT
S ED=MAY 2013
S 20130526/EDTXS H02K0003-12/EPC

CPC.TAB
CPC.TAB
DED
DUPD
DT

S K23G200/06/EPC.KW
S AB/FA
S 2016/GIS
S TIFF/GITS A01B0001-10/IPC

Inventor, Country (WIPO code and text)
IPC, Additional
IPC, Initial
IPC, Keyword Terms
IPC, Main
IPC, Reclassified
IPC, Reform
IPC, Secondary
IPC, Version
Key Terms/IC/ICO/ICO.KW/IN(or /AU)/IN.CNY/ICA/IPCI/IPC.KW/ICM/IPCR/IPC.REF/ICS/IPC.VER/KT

Language (code and text)/LA

S A45D/IC
S M07C0251-36/ICO
S L01F3/04C5B60/ICO.KW
S CHADIVE RAJA REDDY/INS PRAJNAN CHAITAN?/IN
S IN/IN.CNY
S C07C043-00/ICA
S B21B0001/IPCIS INITIAL/IPC.KW
S A63B021-00/ICM
S B21D0007-08/IPCR
S A01B0001-16/IPC.REF
S A41D027-04/ICS
S 7/IPC.VER
S “GLUCOSE AND GALACTOSE
ABSORPTION”/KT
S EN/LA

EPC
FA
GIS
GIT
ICM, ICS,IPCI, IPCRIC, ICM, ICS
ICO
ICO
IN

Search Field Name

Application Number, Original
Application Year (1)Claims *Cooperative Patent Classification (3)Cooperative Patent Classification, Action
Date
Cooperative Patent Classification, Keyword
Cooperative Patent Classification, Version
Data Entry Date
Date Update Date
Document Type(code and text)
Entry Date (1)Entry Date of Full-text (1)European Patent Classification (3)EPC. Keyword
Field Availability
Graphic Image Size
Graphic Image TypeInternational Patent Classification(ICM, ICS, IPCI, IPCR) (3)International Patent Classification (ICM, ICS)ICO (in-computer-only) Classification (3)ICO, Keyword
Inventor

Display
Codes

ED
EDTX
EPC

IN, IN.CNY
ICA
IPCI, IPC
IPC.TAB
ICM, IC
IPCR, IPC
IPC.TAB
ICS, IC
IPC.TABKT
LA

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General Search Fields (cont'd)
SearchCode

Search Field Name
Language, Filing (code and text)
Main Claim*
Number of Claims (1)Number of Paragraphs in DETD
(Detailed Description) (1)Patent Applicant/Patentee (4)Patent Applicant, Country
Patent Country (WIPO code and text)
Patent Information Publication Type
Patent Kind CodePatent Number (2)Patent Number, Original
Patent Number/Kind Code
Physical Properties
Priority Country(WIPO code and text)
Priority Date (1)

/LAF
/MCLM
/CLMN
/DETN

S ENGLISH/LAF
S ?FRACTURE?/MCLM
S 5-7/CLMN
S DETN<10

LAF
MCLM
CLMN
DETN

/PA
(or /CS)/PA.CNY
/PC
/PIT
/PK
/PN
(or /PATS)
/PNO
/PNK
/PHP
/PRC

S ARCELOR MITTAL/PAPA

S IN/PA.CNY
S IN/PCS INA APPLICATION /PITS INA/PKS IN2000CH00043/PN

PA, PA.CNY
PI
PIT
PI
PI

S IN10005DELNP2007/PNO
S IN2005CH00024 A/PNKS PHV/PHP (S) BUFFER/BIS IN/PRCS INDIA/PRC
S PRD=MAY, 20 2003
S 20030520/PRD
S 20010614/PRDF
S DE2004-202004000592/PRN
S US10061642/PRNO
S 2003/PRY
S 2003-2004/PRYF
S PD=MARCH-APRIL 2011
S PY>2008 AND L1
S WO/RLCS WO2005-JP24280/RLN
S 20050330/RLD
S 2005/RLY
S FLUID###/TIS UP=JUNE 2013

PNO
PI
KWIC
PRN

/PRD

Priority Date, First (1)Priority Number (2)Priority Number, OriginalPriority Year (1)Priority Year, First (1)Publication Date (1)Publication Year (1)Related Patent Country
Related Application Number
Related Application Date (1)Related Application Year (1)Title (English)*Update Date (1)Display
Codes

Search Examples

/PRDF
/PRN
/PRNO
/PRY
/PRYF
/PD
/PY
/RLC
/RLN
/RLD
/RLY
/TI
/UP

PRN
PRN
PRN
PRNO, PRAO
PRN
PRN
PI
PI
RLI
RLI
RLI
RLI
TI
UP

(1) Numeric search field that may be searched using numeric operators or ranges.
(2) By default, patent numbers, application and priority numbers are displayed in STN Format. To display them in Derwent format, enter
SET PATENT DERWENT at an arrow prompt. To reset display to STN Format, enter SET PATENT STN.
(3) An online thesaurus is available in this field.
(4) Search with implied (S) proximity is available in this field.

Super Search Fields
Enter a super search code to execute a search in one or more fields that may contain the desired information.
Super search fields facilitate crossfile and multifile searching. EXPAND may not be used with super search
fields. Use EXPAND with the individual field codes instead.
Search Field Name
Application Number Group

October 2023

SearchCode/APPS

FieldsSearched
AP, PRN

Search Examples
S IN2011-CH1006/APPS

Display
Codes
AI, PRAI,APPS

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INFULL

Property Fields1)
In INFULL a numeric search for a specific set of physical properties (/PHP) is available within the full-text
fields (TI, AB, DETD, and CLM). The numeric values are not displayed as single fields, but highlighted within
the hit displays.
Use EXPAND/PHP to search for all available physical properties. A search with the respective field codes will
be carried out in all database fields with English text. The /PHP index contains a complete list of codes andrelated text for all physical properties available for numeric search.

Field
Code

Property

Unit

Symbol

/AOS
/BIR
/BIT
/CAP
/CDN
/CMOL

Amount of substance
Bit Rate
Stored Information
Capacitance
Current Density
Molarity, Molar
Concentration
Conductance
DecibelDegreeDensity (MassConcentration
Dose Equivalent
DosageViscosity, dynamic
Electric Charge Density
Electric Charge
Electrical Conductivity
Electric Current
Electric Field
EnergyElectrical Resistivity
Force
Frequency
International Unit
Viscosity, kinematic
Length, Size

Mol
Bit/Second
Bit
Farad
Ampere/Square Meter
Mol/Liter

mol
bit/s
Bit
F
A/m2
mol/L

S 10 /AOS
S 330/BIR
S BIT > 3 MEGABIT
S 1-10 MF/CAPS CDN>10 A/M**2
S UREA/BI (S) 2/CMOL

Siemens
DecibelDegreeKilogram/Cubic Meter

S
dB
°
kg/m³

S 1S-3/CON
S DB>50
S CYLINDER/BI (S) 45/DEG
S ANTIBODY/CLM (S) 5E-3-10E-3/DEN

SievertMilligram/Kilogram
Pascal * Second
Coulomb/Square Meter
Coulomb
Siemens/Meter
AmpereVolt/Meter
Joule
Ohm * Meter
NewtonHertz
none
Square Meter/Second
Meter

Sv
mg/kg
Pa * s
C/m²
C
S/m
A
V/m
J
Ohm * m
N
Hz
IU
m2/s
m

S 2/DEQS DOS>0.8
S DV>5000
S ECD>10
S 2-3/ECHS ECO>800 S/M (5A) WATER
S 1-10/ELC
S 650-700/ELF
S TORQUE (5A) 20 - 30 /ENES ERE>2
S 50 N /FORS OSCILLAT?/BI (S) 1- 3/FRE
S IU>1000 (P) ANTIBIOTICS SILICON?/BI (5A) 10E-5 M**2/S /KV
S 1-4/LEN

Luminous Emittance,
IlluminanceLuminous Flux
Luminous Intensity
Mass
Mass to Charge Ratio
Magnetic Flux Density

Lux

lx

S 10-50/LUME

Lumen
CandelaKilogram
none
Tesla

Lm
cd
kg
m/z
T

S LUMF>1000
S LUMI<4
S ALLOY/BI (30A) 1E-10-1E-5/M
S MCH=100
S MFD>102

Mass Flow Rate

Kilogram/Second

kg/s

S MFR<0.1

Molar Mass
Molality of Substance
Melt Volume Rate,
Melt Flow Rate
Nutrition Content
Percent(Proportionality)
Permittivity, Absolute

Gram/Mol
Mol/Kilogram
none

g/mol
mol/kgg/10 min

S 2000-3000 G/MOL/MM
S 01.-10 MOL/KG/MOLS
S 3/MVRnone
none
Farad/Meter

g/100 kcal%
F/m

S NUC<100 (P) NUTRIENTS POLYMER?/AB (5A) 4/PER
S 3/PERA

/CON
/DB
/DEG
/DEN
/DEQ
/DOS
/DV
/ECD
/ECH
/ECO
/ELC
/ELF
/ENE
/ERE
/FOR
/FRE
/IU
/KV
/LEN (or
/SIZ)
/LUME
/LUMF
/LUMI
/M
/MCH
/MFD (or/MFS)/MFR (or
/MFL)
/MM
/MOLS
/MVR
/NUC
/PER
/PERA

Search Examples

October 2023

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INFULL

Property Fields1) (cont’d)
Field
Code

Property

Unit

Symbol/PHV/POW

pH Value
Power

pH
Watt

pH
W

/PRES
(or /P)
/RAD
/RES
/RSP
/SAR

Pressure

PascalPa

Radioactivity
Electrical Resistance
Rotational Speed
Area /Surface Area

Becquerel
Ohm
Revolution/Minute
Square Meter

Bq
Ohm
rpm
m²

/SOL
/STSC
/TCO
/TEMP
(or /T)/TIM

Solubility
Surface Tension
Thermal Conductivity
Temperature

Gram/100 gram
Joule /Square Meter
Watt/Meter * Kelvin
Kelving/100 g
J/m²
W/m * KK

Time

Second/VEL(or /V)
/VELA
/VLR
/VOL
/VOLT

Velocity

Meter per Second

Velocity, angular
Volumetric Flow Rate
VolumeVoltage

Radian/Second
Cubic Meter/Second
Cubic Meter
Volt

s
m/s
rad/s
m³/s
m³
V

Search Examples
S 7.4-7.6/PHVS LIGHT/BI (S) ENERGY/BI (S) 350
WATT/POW
S (VACUUM (5A) DISTILL?)/BI (S)1000-1100/PRESS RAD/PHPS SENSOR /BI (S) 10- 100/RES
S 2-100/RSP (S) MACHINE/AB
S (COATING? OR FOIL?)/BI (S) 10100/SAR
S SOL>20 (10W) WATER
S 60 J/M**2/STSC
S 1/TCO (S) HEAT?
S (REACTION? (10A) ENZYM?) (S)
5/TEMPS ?INCUB?/BI (10A) 10-50/TIM
S REDUC?/BI (S) 1E-3-5E-3/VELS VELA>10
S 1-2/VLR (5A) POWDER
S 1E-8-2E-8/VOL.EXS POTENTIAL/CLM (10A) 5E-3 V<VOLT<7E-3 V

1) Exponential format is recommended for the search of particularly high or low values, e.g. 1.8E+7 or 1.8E7 (for 18000000) or 9.2E-8(for 0.000000092).

International Patent Classification (/IPC) Thesaurus
The classifications, validity and catchwords for the main headings and subheadings from the current (8th)edition of the WIPO International Patent Classification (IPC) manual are available. The classifications from theprevious editions (1-7) are also available as separate thesauri. To EXPAND and SEARCH in the thesauri foreditions 1–7, use the field code followed by the edition number, e.g., /IPC2, for the 2nd edition. Catchwords
are included only in the thesauri for the 8th, 7th, 6th, and 5th editions.
Code
ADVANCED(ADV)
ALL
BRO (MAN)BT
CORE (COR)
ED
HIE
INDEX
KT
NEXT
NT
PREV
RT (SIB)TI

October 2023

Content

ExamplesAdvanced Codes for the Core Level IPC CodeE A61K0006-06+ADVANCED/IPC

All Associated Terms (BT, SELF, NT, RT)
Complete Class
Broader Term (BT, SELF)
Core Codes for the Advanced Level IPC CodeComplete title of the SELF term and IPC manual edition
Hierarchy Term (Broader and Narrower Term)(BT, SELF, NT)
Complete title of the SELF term
Keyword Term (catchwords) (SELF, KT)
Next Classification
Narrower Terms (SELF, NT)
Previous Classification
Related Terms (SELF, RT)
Complete Title of the SELF Term and Broader Terms(BT, SELF)

E C01C003-00+ALL/IPC
E C01C+BRO/IPC
E C01F001-00+BT/IPC
E G08C0019-22+CORE/IPC
E C01F001-00+ED/IPC
E C01B003-00+HIE/IPC
E C01F001-00+INDEX/IPC
E CYANOGEN+KT/IPC
E C01C001-00+NEXT5/IPC
E C01C+NT/IPC
E C01C001-12+PREV10/IPC
E C01C003-20+RT/IPC
E C01F001-00+TI/IPC

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INFULLECLA (/EPC) and ICO ThesauriThis thesaurus is available in the /EPC search field (for ECLA codes) and /ICO search field (for 'in-computeronly' codes). All relationship codes can be used with both the EXPAND and SEARCH commands.
Relationship
Code
ALL
AUTO (1)
BT
CODE
DEF
HIE
KT
MAX
NEXT
NEXT(n)NT
PREV
PREV(n)TI

Content

Search Examples

All usually required terms (BT, SELF, CODE, DEF)
Automatic relationship (BT, SELF, CODE, DEF)
Broader terms (BT, SELF)
Classification Code (SELF, CODE)
Definition (SELF, DEF)
Hierarchy terms (all broader and narrower terms) (BT,SELF, DEF, NT)
Keyword terms (SELF, KT)
All associated terms
Next classification within the same class (SELF, NEXT)
Next n classification within the same class
Narrower terms
Previous Code within the same class (SELF, PREV)
Previous n classifications within the same class
Complete Title of the SELF Term and Broader Terms(BT, SELF)

E C12M0001-34H2+ALL/EPC
E G01N0033-50D4 +AUTO/EPC
E G01N0033-50D4 +BT/EPC
E SCRAPER BIASING MEANS+CODE/EPC
E B65G0045-16+DEF/EPC
E A01C0001-06+HIE/EPC
E LASER+KT/EPC
E G01N0033-50D4+MAX/EPC
E A01C0001-06+NEXT/EPC
E A01C0001-06+NEXT3/EPC
E G05B0019-10+NT/EPC
E G05B0019-10+PREV/EPC
E G05B0019-10+PREV2/EPC
E G05B0019-10+TI/EPC(1) Automatic Relationship is SET OFF. In case of SET REL ON, the result of EXPAND or SEARCH without any relationship code is thesame as described for AUTO.

CPC Thesaurus
This thesaurus is available in the /CPC search field. All relationship codes can be used with both the EXPAND
and SEARCH commands.
Relationship CodeALL
AUTO (1)
BT
CODE
DEF
HIE
KT
MAX
NEXT
NEXT(n)NT
PREV
PREV(n)TI

Content
All usually required terms (BT, SELF, CODE, DEF)
Automatic relationship (BT, SELF, CODE, DEF)
Broader terms (BT, SELF)
Classification Code (SELF, CODE)
Definition (SELF, DEF)
Hierarchy terms (all broader and narrower terms) (BT, SELF,
DEF, NT)
Keyword terms (SELF, KT)
All associated terms
Next classification within the same class (SELF, NEXT)
Next n classification within the same class
Narrower terms
Previous Code within the same class (SELF, PREV)
Previous n classifications within the same class
Complete Title of SELF Term and Broader Terms (BT, SELF)

Search Examples
E A61K0031-4375+ALL/CPC
E C07D0473-40+AUTO/CPC
E C12N0009-6464+BT/CPC
E CARTRIDGES+CODE/CPC
E B65G0045-16+DEF/CPC
E F02M0031-047+HIE/CPC
E LASER+KT/CPC
E G01R0022-066+MAX/CPC
E A01N0041-04+NEXT/CPC
E A01N0041-04+NEXT3/CPC
E C07D0473-40+NT/CPC
E F05C2253-16+PREV/CPC
E F05C2253-16+PREV2/CPC
E F05B2250-313+TI/CPC(1) Automatic Relationship is SET OFF. In case of SET REL ON, the result of EXPAND or SEARCH without any relationship code is thesame as described for AUTO.

October 2023

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INFULLDISPLAY and PRINT Formats
Any combination of formats may be used to display or print answers. Multiple codes must be separated by
spaces or commas, e.g., D L1 1-5 TI PA. The fields are displayed or printed in the order requested.
The information of the latest publication is displayed by default. To display the content for all levels of therecord you can combine all display fields and formats with the qualifier .M except FA, SCAN, and TRIAL.
For displaying a particular publication of a database record, you can simply add for certain display field thekind code to the appropriate display format, e.g. ALL.A. Fields that allow this are indicated by a number (3).
Hit-term highlighting is available for all fields. Highlighting must be ON during SEARCH to use the HIT, KWIC,
and OCC formats.
The default display format is STD.M, i.e., all publication levels of one family in the STD format.
FormatContent

ExamplesAB (ABS)AI (AP) (1)
AN
APO
CLM
CLMN (2)
CPC
DED
DETD
DETN (2)DT (TC)
DUPD
ED
EDTX
EPC
FA
GI
GIS (2)
GIT (2)
IC
ICA
ICM
ICO
ICS
IN (AU)IN.CNY
IPCI
IPCR
LA
LAF
MCLM
PA (CS)
PA.CNY
PI (PN, PATS) (1)PITPNO
PRN (PRAI) (1,5)
PRNO (PRAO) (2)
RLI (RLN)
TI
UP

Abstract
Application Information
Accession Number
Application Number, Original
ClaimsNumber of Claims
Cooperative Patent Classification
Data Entry Date
Detailed Description
Number of Paragraphs in DETD
Document Type
Data Update Data
Entry Date
Entry Date of Full-text
European Patent Classification
Field Availability (for all publication levels)
Graphic Image
Graphic Image, Size
Graphic Image, Type
IPC (format contains ICM, ICS)
IPC, Additional
IPC, Main
ICO (in-computer-only) Classification
IPC, Secondary
Inventor (in English)
Inventor, Country
IPC, Initial
IPC, Reclassified
Language
Language of Filing
Main Claim
Patent Applicant/Patentee
Patent Applicant, Country
Patent Information
Patent Information Publication Type
Patent Number, Original Format
Priority Information
Priority Number, Original Format
Related Patent Information
Title
Update Date

D TI AB 1-5
D AI
D L3 AND APO
D CLM
D CLMN
D CPC
D DED
D DETDD DETND DT
D DUPDD ED
D EDTX
D EPC
D FA
D GI
D GIS
D GIT
D IC
D ICA
D IC
D ICO
D ICS
D IN
D IN.CNY
D IPCID IPCR
D LA
D LAF
D MCLM
D PA
D PA.CNY
D PI
D PIT
D PNO
D PRN
D PRNO
D RLI
D TI
D UP

ALL (1)

AN, DED, DUPD, ED, EDTX, UP, TI, IN, IN.CNY, PA, PA.CNY, LAF, LA,
DT, PIT, PI, AI, RLI, PRAI, IPC, CPC, EPC, ICO, AB, DETD, CLM, KT
ALL, plus graphic image
ALL, indented with text labels
IALL, plus graphic image
ALL, delimited for post processing

D ALL

ALLG (1)
IALL (1)
IALLG (1)DALL (1)October 2023

D ALLGD IALLD IALLGD DALL9
INFULLDISPLAY and PRINT Formats (cont'd)FormatAPPS (1)BIB (1)BIBG (1)
IBIB (1)
IBIBG (1)
CPC.TABBRIEF (1)
BRIEFG (1)IBRIEF (1)IBRIEFG (1)IND
IPC
IPC.TABMAX (ALL.M) (1)

MAXG (ALLG.M) (1)
IMAX (IALL.M) (1)
IMAXG (IALLG.M) (1)
SCAN (4)STD (1)
STDG (1)ISTD (1)ISTDG (1)
TRIAL (TRI, SAM,SAMPLE, FREE)
TX
HIT
KWIC
OCC

Content

ExamplesAI, RLN, PRAI
AN, DED, DUPD, ED, EDTX, UP, TI, IN, IN.CNY, PA, PA.CNY, LAF, LA,
DT, PIT, PI, AI, RLI, PRAI
BIB, plus graphic image
BIB, indented with text labels
IBIB, plus graphic image
CPC, CPC.KW, CPC.VER, CPC.ACD in tabular version
AN, DED, DUPD, ED, EDTX, UP, TI, IN, IN.CNY, PA, PA.CNY, LAF, LA,
DT, PIT, PI, AI, RLI, PRAI, IPC, CPC, EPC, ICO, AB, MCLM, KT
BRIEF, plus graphic image
BRIEF, indented with text labels
IBRIEF, plus graphic image
ED, IPC (ICM, ICS, IPCI, IPCR), CPC, EPC, ICO
International Patent Classification (ICM, ICS, IPCI, IPCR)
IPC, IPC.KW, IPC.VER, IPC.ACD in tabular version
AN, DED, DUPD, ED, EDTX, UP, TI, IN, IN.CNY, PA, PA.CNY, LAF, LA,
DT, PIT, PI, AI, RLI, PRAI, IPC, CPC, EPC, AB, ICO, DETD, CLM, KT for
all levels of publication
MAX, plus graphic image
MAX, indented with text labels
IMAX, plus graphic image
TI (random display without answer numbers)
AN, DED, DUPD, ED, EDTX, UP, TI, IN, IN.CNY, PA, PA.CNY, LAF, LA,
DT, PIT, PI, AI, RLI, PRAI, IPC, CPC, EPC, ICO (STD.M is default)
STD, plus graphic image
STD, indented with text labels
ISTD, plus graphic image
ED, EDTX, UP, TI, FA, DETN, CLMND APPS
D BIB

DETD, CLM

D TX

Hit term(s) and field(s)Up to 50 words before and after hit term(s) (KeyWord-In-Context)
Number of occurrences of hit term(s) and field(s) in which they occur

D HIT
D KWIC
D OCC

D BIBGD IBIBD IBIBG
D BRIEF
D BRIEFGD IBRIEF
D IBRIEFG
D IND
D IPC
D IPC.TAB
D MAX

D MAXGD IMAXD IMAXGD SCAN
D STD
D STDGD ISTDD ISTDG
D TRIAL(1) By default, patent numbers, application and priority numbers are displayed in STN Format. To display them in Derwent format, enter
SET PATENT DERWENT at an arrow prompt. To reset display to STN Format, enter SET PATENT STN.
(2) Custom display only.
(3) You can combine this display field with the qualifier .PK (Patent Kind Code) to display the content for a certain publication level of arecord, e.g. CLM.B2.
(4) SCAN must be specified on the command line, i.e., D SCAN or DISPLAY SCAN.
(5) If priority information is not available for a certain document, this information is taken from the application information of thisdocument and marked with an asterisk (*).

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INFULL

SELECT, ANALYZE, and SORT Fields
The SELECT command is used to create E-numbers containing terms taken from the specified field in ananswer set.
The ANALYZE command is used to create an L-number containing terms taken from the specified field in ananswer set.
The SORT command is used to rearrange the search results in either alphabetic or numeric order of thespecified field(s).
You can combine all fields except FA with the qualifier .M to SELECT/ANALYZE the content of all publicationlevels.
Field Name
Abstract
Accession Number
Application Country
Application Date
Application Information
Application Number, Original
Application Year
ClaimsCooperative Patent Classification
Data Entry Date
Data Update Date
Detailed Description
Document Type
Entry Date
Entry Date Full-text
European Patent Classification
Field Availability
Graphic Image, Size
Graphic Image, TypeInternational Patent Classification
Inventor
Inventor, Country
ICO (in-computer-only) Classification
IPC (ICM, ICS, IPCI, IPCR)
IPC, Advanced Level Symbols
IPC, Advanced Level Symbols for Invention
IPC, Initial
IPC, Main
IPC, Reclassified
IPC, Reform
IPC, Secondary
Key Terms
Language
Language of Filing
Main Claim
Number of Claims
Number of Paragraphs in DETD
Occurrence Count of Hit Terms
Patent Assignee/Patentee
Patent Assignee, Country
Patent Assignee, Address
Patent Assignee Number
Patent Country
Patent Information Publication Type
Patent Kind CodePatent Number
Patent Number, Original
Patent Number/Kind Code
Pre-IPC8 Symbols from the ICM and first IPC8 values from2006-present

October 2023

Field CodeANALYZE/
SELECT (1)

SORT

AB
AN
AC
AD
AI (AP, APPS)
APO
AY
CLM
CPC
DED
DUPD
DETD
DT
ED
EDTX
EPC
FA
GIS
GIT
IC
IN (AU)IN.CNY
ICO
IPC
IPC.A
IPC.AI
IPCI
ICM
IPCR
IPC.REF
ICS
KT
LA
LAF
MCLM
CLMN
DETN
OCC
PA (CS)
PA.CNY
PAA
PAN
PC
PIT
PK
PI (PN, PATS)
PNO
PNK
IPC.F

Y
Y
Y
Y
Y (2)
Y
Y
Y
Y
Y
Y
Y (3)
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y (4)
Y (4)
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
N
Y
Y
Y
Y
Y
Y
Y
Y (default)
Y
Y
Y (4)

Y
Y
Y
Y
Y
Y
Y
N
Y
Y
Y
N
Y
Y
Y
Y
N
Y
N
N
Y
Y
Y
Y
N
N
Y
Y
Y
N
Y
N
Y
Y
N
Y
Y
Y
Y
Y
N
Y
Y
Y
Y
Y
Y
Y
Y

11
INFULL

SELECT, ANALYZE, and SORT Fields (cont'd)
Field Name
Priority Date, First
Priority Country
Priority Date
Priority Year
Priority Year, First
Publication Date
Publication Year
Related Patent Country
Related Application Number
Related Application Date
Related Application Year
Title
Update Date

Field Code
PRDF
PRC
PRD
PRY
PRYF
PD
PY
RLC
RLN
RLD
RLY
TI
UP

ANALYZE/
SELECT (1)
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y

SORT
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y

(1) HIT may be used to restrict terms extracted to terms that match the search expression used to create the answer set,e.g., SEL HIT TI.
(2) Selects or analyzes application numbers with /AP appended to the terms created by SELECT.
(3) Appends /BI to the terms created by SELECT.
(4) Appends /IPC to the terms created by SELECT.

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INFULL

Sample Records
DISPLAY ALL (STN format)
AN
TI
IN
PA
LAF
DT
PIT
PI
AI
PRAI
IPCI

2011019599
INFULL ED 20130525 UP 20130525 EDTX 20130525
DED 20120817 DUPD 20130417
A COATING FOR PREPARING A GAS DIFFUSION LAYER AND A GAS DIFFUSION LAYER
THEREOFALKESH AHIRE; DR. NAWAL KISHOR MAL; DR. RAJIV KUMARTATA CHEMICALS LIMITED, BOMBAY HOUSE, 24 HOMI MODI STREET, MUMBAI-400001
Maharashtra India
EnglishPatent; (Fulltext)
INA APPLICATION
IN 2011MU00095
A
20120817
IN 2011-MU95
20110111
IN 2011-MU95
20110111
H01M0008-00 [C]AB
Original
An electrode for a fuel cell is disclosed. The electrode comprises of agas diffusion layer having an electrode catalyst layer coated thereon.
The electrode catalyst layer comprises of a carbon supported catalyst.
The carbon supported catalyst comprises of carbon supported platinum
nanoparticles having at least one mercapto alkyl acid selected from thegroup comprising of mercatopropyl sulfonic acid, mercapto propionic acidand mercapto succinic acid, attached thereon.
DETD
The disclosure generally relates to an electrode for a fuel cell. Moreparticularly, the disclosure relates to an electrode comprising a gas
diffusion layer having a catalyst layer coated thereon.
BACKGROUND Fuel cells are power generation systems that convert chemicalenergy into electrical energy by oxidation of fuel. Fuel cells have ahigher efficiency compared to internal combustion engines and areenvironment friendly. Therefore, fuel cells have become the focus ofattention for researchers as an alternative energy source for fossil
fuels.
One type of electrochemical fuel cell is the polymer electrolyte membrane(PEM) fuel cell, which employs a membrane electrode assembly (MEA)
comprising of a proton conductive membrane which has cathode catalyst
layer on one side and anode catalyst layer on the other side, sandwiched
between two gas diffusion layers. Gas diffusion layers serve as current
collectors that allow ready access of the fuel and oxidant to anode andcathode catalyst surfaces, respectively.
CLM
An electrode for a fuel ceil comprising: a gas diffusion layer having anelectrode catalyst layer coated thereon, wherein the electrode catalyst
layer comprises of a carbon supported catalyst, the carbon supported
catalyst comprising carbon supported platinum nanoparticles having atleast one mercapto atkyl acid selected from the group comprising of
mercatopropyl sulfonic acid, mercapto propionic acid and mercapto
succinic acid, attached thereon.
2. An electrode for a fuel cell as claimed in claim 1 wherein the carbon
supported catalyst further comprises at least one alkyl thiol selectedfrom the group comprising ofhexane thiol, octane thiol, decane thiol anddodecane thiol attached to the platinum nanoparticles.

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13
INFULLDISPLAY ISTD.M
ACCESSION NUMBER:
ENTRY DATE:UPDATE DATE:ENTRY DATE (FULLTEXT):DATA ENTRY DATE:DATA UPDATE DATE:TITLE (ENGLISH):

1997001337
INFULL
20130301
20130308
20130301
20100220
20100220
THE PROCESS FOR COMBINING ORGANISMS WITH ANTI INFECTIVE
AGENT IN TO A FORMULATIONPATENT APPLICANT(S):DR. RAJIV INDRAVANDAN MODI;LANGUAGE OF FILING:
EnglishLANGUAGE OF PUBL.:
English
DOCUMENT TYPE:
Patent; (Fulltext)
PATENT INFORMATION TYPE:INA APPLICATIONPATENT INFORMATION:
IN 1997MU00174
A
19971122APPLICATION INFO.:IN 1997-MU174 19970327
PRIORITY INFO.:IN 1997-MU174
19970327
ACCESSION NUMBER:
ENTRY DATE:UPDATE DATE:ENTRY DATE (FULLTEXT):DATA UPDATE DATE:TITLE (ENGLISH):

1997001337
INFULL
20130301
20130308
20130301
20130205
The process for the preparation of a stable fixed dose
pharmaceutical composition of anti infective
agent/agents and micro organisms as active ingredients
INVENTOR(S):
MODI RAJIV INDRAVADAN DR, IN; BANSAL YATISH KUMAR DR, IN;
KHAMAR MAFATLAL BAKULESH DR, IN
PATENT APPLICANT(S):
MODI RAJIV INDRAVADAN DR, IN; BANSAL YATISH KUMAR DR,
IN; KHAMAR BAKULESH MAFATLAL DR, IN;
LANGUAGE OF FILING:
EnglishLANGUAGE OF PUBL.:
English
DOCUMENT TYPE:
Patent; (Fulltext)
PATENT INFORMATION TYPE:INA1 PATENTPATENT INFORMATION:
IN 183097
A1
19990904
APPLICATION INFO.:IN 1997-MU174 19970327
PRIORITY INFO.:IN 1997-MU174
19970327
INT. PATENT CLASSIF.:
MAIN:
A61K035-66 (6)IPC RECLASSIF.:
A61K0009-00 [I,A]; A61K0009-24 [I,A]; A61K0009-28 [N,A];
A61K0009-48 [I,A]; A61K0009-50 [N,A]; A61K0035-74 [I,A]
CPC CLASSIF.
A61K0009-209; A61K0009-0095; A61K0031-00;
A61K0009-4808; A61K0009-5047; A61K0045-06; A61K0035-742;
A61K0036-064; A61K0035-744; A61K0009-2866; A61K0035-747
EPC CLASSIF. (ECLA):
A61K0009-00Z6; A61K0009-20K4B; A61K0009-48A;
A61K0035-74A1; A61K0035-74A2; A61K0035-74A2B
IN-COMPUTER-ONLY CLASSIF.:K61K0009-28H6F2; K61K0009-50H6F2B

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14
INFULLDISPLAY STDG.M
AN
TI
IN
PA
LAF
DT
PIT
PI
AI
PRAI
IPCI

2013000134
INFULL ED 20130525 UP 20130525
DED 20130405 DUPD 20130517
METHOD FOR COMMUTING IN AN AREAKHANNA, SAMEER; SAHAI, SWATI; BHAT, PROMILAKHANNA, SAMEER, D2/2125, VASANT KUNJ, NEW DELHI-110070, IN; SAHAI, SWATI;
BHAT, PROMILA
EnglishPatentINA APPLICATION
IN 2013DE00234
A
20130405
IN 2013-DE234
20130129
IN 2013-DE234
20130129
G01C [C]In North America
CAS
STN North America
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October 2023

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