KRFULL (Korean Patents Full-Text)
File Subject
Coverage

All patent-relevant areas of science and technology, i.e., all classes of the International
Patent Classification

File Type

Full-text

Features

ThesauriInternational Patent Classification (/IPC), Cooperative PatentClassification (/CPC)

Alerts (SDIs)

Weekly or monthly (weekly is the default)

CAS Registry
Number® Identifiers



SLART



Keep & Share

Structures



RecordContent• Full-text of patent applications, granted patents, and utilities models published by the
Korean Intellectual Property Office in the Republic of Korea from 1978 onwards.
• New records are available about six days after publication date with the complete
content.
• Records are available about six days after publication date with the complete content• Records contain bibliographic data including patent applicant and inventor, patent,
application, priority, and related application data, IPC and CPC classification codes,
abstract, and full-text of description and claims.
• Abstracts, detailed descriptions and claims are machine translated to English, the titles
human translated.
• Title, abstract, detailed description, and claims as well as patent assignees, inventors
and agents are displayable in Korean characters.
• Standardized and normalized patent assignee names are searchable in their own
fields /PAS and /PAN.
• Numeric values of 59 physical and chemical properties are searchable in about 20,000
variants of the base and additional units within all full text fields in English.
• Key terms, indexed and displayed in the field /KT, enhance retrieval of relevant results,
and make the evaluation of results more efficient. They are useful to broaden searchscope more precisely than Basic Index searches.
• Database records comprise all documents published for one application.
• Some of the full-text has been created by Optical Character Recognition (OCR)
software. Therefore, a small number of characters may have been misinterpreted, or
portions of the text may have been incompletely recognized.

File Size• More than 5.2 million family records with more than 7.49 million publications (10/2023)• More than 4.5 million front page images from 1978 to present (10/2023)

Coverage

1978 - present

Updates

WeeklyLanguage

English, Korean

October 2023

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KRFULL

Database
Producer

LexisNexis Business Information Solutions B.V.
Radarweg 291043 NX Amsterdam
The Netherlands
Copyright Holder

Sources

Patent applications, granted patents, and utilities models published by the KoreanIntellectual Property Office

User Aids• Online Helps (HELP DIRECTORY lists all help messages available)• STNGUIDE

Cluster• AEROTECH• ALLBIB• AUTHORS• CORPSOURCE• ENGINEERING• FULLTEXT• HPATENTS• NPS• PATENTS• PNTTEXTSTN Database Clusters information:
https://www.cas.org/support/training/stn/database-clusters

October 2023

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KRFULL

Search and Display Field Codes
If multiple search terms are linked with and AND-operator, all terms are searched in the complete databaserecord, i.e. in all publications referring to one application. For a search in a specific publication of the record,connect the search term and the patent kind code with the (L)-proximity operator, e.g.
S BOREHOLE/AB,TI,CLM (L) KRA/PK limits the search to Japanese applications KRA.
Fields that allow left truncation are indicated by an asterisk (*).

General Search Fields
Search Field Name

SearchCode

Basic Index* (contains single words from title(TIEN), abstract (AB), detailed description(DETD), claims (CLM), main claims(MCLM) fields), and keyterms (KT)

None
or
/BI

Abstract*/AB (or /ABEN)

Accession Number
Application Country(WIPO code and text)
Application Date (1)Application Number (2)Application Number, Original
Application Year (1)Claims*/AN/AC

Cooperative Patent Classification (3)Cooperative Patent Classification, Action
Date
Cooperative Patent Classification, Keyword
Cooperative Patent Classification, Version
Data Entry Date (1)Data Update Date (1)Document Type(code and text)
Entry Date (1)Entry Date of Fulltext (1)Field Availability
Graphic Image, TypeGraphic Image, Size
International Patent Classification(ICM, ICS, IPCI, IPCR) (3)International Patent Classification (ICM, ICS)
Inventor
Inventor, Country (WIPO code and text)
Inventor, Total
IPC, Initial
IPC, Keyword Terms
IPC, Main
IPC, Reclassified
IPC, Reform
IPC, Secondary

Display
Codes

Search Examples
S TRANSISTOR AND
ELECTRODES ACOUSTIC SENSOR
S ?TRANSFER?

S BOREHOLE/ABS 599999/AN
S KR/AC

TIEN, AB,
ABEN, DETD,
DETDEN,
CLM,
CLMEN,MCLM,
MCLMEN, KT
AB
AN
AI

/AD
/AP
/APO
/AY
/CLM (or/CLMEN)/CPC/CPC.ACDS AD=JAN 2011
S KR2012-100038/AP
S KR2019760001984/APO
S AY>=2005
S DERIVATION/CLM
S C12N0009/CPC
S 20121113/CPC.ACD

CPC
CPC.TAB/CPC.KW/CPC.VER
/DED
/DUPD
/DT
(or /TC)
/ED
/EDTX
/FA
/GI
/GIS
/IPC

S C12N0009/CPC (S) I/CPC.KW
S 20130101/CPC.VER
S 20190930-20191031/DED
S 20190828/DUPDS PATENT/DT

CPC.TAB
CPC.TAB
DED
DUPD
DT

S ED=DEC 2019
S EDTX>20191130
S ABENFAS PNG/GITS 200-300/GIS
S A01B0001-16/IPC/IC/IN(or /AU)/IN.CNY/IN.T/IPCI/IPC.KW/ICM (or /IPCM)/IPCR/IPC.REF/ICS (or /IPCS)S A47J0314-00/IC
PARK A REUM/IN

ED
EDTX
FA
GI
GIS
ICM, ICS,IPCI, IPCRIC, ICM, ICSINS KR/IN.CNY
S MILLER ALFRED/IN.T
S B21B0001/IPCIS INITIAL/IPC.KW
S B29B001-06/ICM
S B21D0007-08/IPCR
S A01B0001-16/IPC.REF
S B29H003-00/ICS

IN, IN.CNY
IN
IPCI, IPC
IPC.TAB
ICM, IC
IPCR, IPC
IPC.TAB
ICS, ICAI
AI
CLM

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KRFULL

General Search Fields (cont'd)
Search Field Name
IPC, Version
Key Terms *Language (code and text)
Language, Filing (code and text)
Main Claim*
Number of Claims (1)Number of Paragraphs in DETD
(Detailed Description) (1)Patent Assignee(4)SearchCode/IPC.VER (or/IC.VER)
/KT
/LA
/LAF
/MCLM (or/MCLMEN)
/CLMN
/DETN

Patent Assignee, Country
Patent Assignee, Total/PA(or /CS)/PA.CNY/PA.T

Patent Applicant Normalized
Patent Applicant Standardized

/PAN
/PAS

Patent Country (WIPO code and text)
Patent Information Publication Type

/PC
/PIT

Patent Kind CodePatent Number (2)/PK/PN(or /PATS)
/PNO
/PNK
/PHP
/PRC

Patent Number, Original
Patent Number/Kind Code
Physical Properties
Priority Country(WIPO code and text)
Priority Date (1)Priority Date, First (1)Priority Number (2)Priority Number, OriginalPriority Year (1)Priority Year, First (1)Publication Date (1)Publication Year (1)Related Patent Country
Related Application Number
Related Application Date (1)Related Application Type
Related Application Year (1)Related Patent Number
Title (English)*Update Date (1)Update Date Text (1)

/PRD
/PRDF
/PRN
/PRNO
/PRY
/PRYF
/PD
/PY
/RLC
/RLN
/RLD
/RLT
/RLY
/RLPN
/TI (or /TIEN)
/UP
/UPTX

Display
Codes

Search Examples
S 7/IPC.VER

IPC.TABS (LASER(3A)SOURCE?)/KT
S KO/LAS KO/LAF
S ?LASER/MCLM

KT
LA
LAF
MCLM

S 5-10/CLMN
S 20-30/DETN

CLMN
DETN

S SAMSUNG/PAPA

S KR/PA.CNY
SAMSUNG AEROSPACE IND. CO.,
LTD./PAS SAMSUNG/PAN
S SAMSUNG AEROSPACE
INDUSTRIES/PAS
S KR/PCS KRA OFFICIAL GAZETTE OF THE
UNEXAMINED PATENTS/PITS KRA1/PK
S KR210004U/PN

PA, PA.CNY
PA

S KR300381757/PNO
S KR210005 Y1/PNKS PHV/PHP (S) BUFFER/BIS KR/PRCS KOREA, REPUBLIC OF/PRC
S PRD=MAY, 20 2003
S 20030520/PRD
S 20010704/PRDF
SAT1982-2545/PRN
S AT0100016/PRNO
S 1999/PRY
S 1999/PRYF
S 19990108/PRD
S 2017/PY
S WO/RLCS WO1982-JP96/RLN
S 20120109/RLDS PCT APPLICATION/RLT
S 2017/RLY
S WO2000000071/RLPNS LASER/TI
S 20191113/UP
S 20191030/UPTX

PNO
PI
KWIC
PRN

PAN
PAS
PI
PIT
PI
PI

PRN
PRN
PRN
PRNO, PRAO
PRN
PRN
PI
PI
RLI
RLI
RLI
RLI
RLI
RLI
TI
UP
UPTX

(1) Numeric search field that may be searched using numeric operators or ranges.
(2) By default, patent numbers, application and priority numbers are displayed in STN Format. To display them in Derwent format, enter
SET PATENT DERWENT at an arrow prompt. To reset display to STN Format, enter SET PATENT STN.
(3) An online thesaurus is available in this field.
(4) Search with implied (S) proximity is available in this field.

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KRFULL

Super Search Fields
Enter a super search code to execute a search in one or more fields that may contain the desired information.
Super search fields facilitate crossfile and multifile searching. EXPAND may not be used with super search
fields. Use EXPAND with the individual field codes instead.
Search Field Name

SearchCode

FieldsSearched

Search Examples

Application Number Group/APPS

AP, PRN, RLN

S KR2012-100038/APPS

Patent Assignee Group/PASSS SAMSUNG/PASSPatent Number Group/PATS

PA, PA.T, PAS,PAN
PN, RLPNS KR 1399575/PATS

Display
Codes
AI, PRAI, RLI,
APPS
PA, PAS,
PAN, PASSPN, RLPN,
PATS

Property Fields1)
In KRFULL a numeric search for a specific set of physical properties (/PHP) is available within the full-text
fields (TI, AB, DETD, CLM, BI). The numeric values are not displayed as single fields, but highlighted within
the hit displays.
Use EXPAND/PHP to search for all available physical properties. A search with the respective field codes will
be carried out in all database fields with English text. The /PHP index contains a complete list of codes andrelated text for all physical properties available for numeric search.
Field
Code
/AOS
/BIR
/BIT
/CAP
/CDN
/CMOL
/CON
/DB
/DEG
/DEN (/C)/DEQ/DOS(/LD50)
/DV
/ECD
/ECH
(/CHA)/ECO(/ECND)/ELC(/ECC)/ELF(/ECF)

Property

Unit

Symbol

Search Examples

Amount of substance
Bit Rate
Stored Information
Capacitance
Current Density
Molarity, Molar
Concentration
Conductance
DecibelDegreeDensity (MassConcentration
Dose Equivalent
DosageMol
Bit/Second
Bit
Farad
Ampere/Square Meter
Mol/Liter

mol
bit/s
Bit
F
A/m2
mol/L

S 10 /AOS
S 8000-10000/BIR
S BIT > 3 MEGABIT
S 1-10 MF/CAPS CDN>10 A/M**2
S UREA/BI (S) 8/CMOL

Siemens
DecibelDegreeKilogram/Cubic Meter

S
dB
°
kg/m³

S 1S-3/CON
S DB>50
S CYLINDER/BI (S) 45/DEG
S 5E-3-10E-3/DEN

SievertMilligram/Kilogram

Sv
mg/kg

S 100/DEQ
S DOS>0.8

Viscosity, dynamic
Electric Charge
Density
Electric Charge

Pascal * Second
Coulomb/Square Meter

Pa * sC/m²

S DV>5000
S ECD>10

CoulombC

S 0.0001-0.001/ECH

Electrical Conductivity

Siemens/Meter

S/mS ECO>800 S/M (15A) AQUEOUS

Electric Current

AmpereA

S 1-10/ELC

Electric Field

Volt/Meter

V/m

S 200/ELF

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KRFULL

Property Fields1) (cont’d)
Field
Code

Property

Unit

Symbol/ENE

EnergyJoule/ERE(/ERES)/FOR/FRE (/F)/IU/KVElectrical Resistivity

Ohm * Meter

Force
Frequency
International Unit
Viscosity, kinematic

NewtonHertz
none
Square Meter/Second

N
Hz
IU
m2/s

/LEN
(/SIZ)/LUME

Length, Size

Meter

m

S 50 N /FORS OSCILLAT?/BI (S) 1- 3/FRE
S IU>1000 (P) VITAMIN AS METHYLPOLYSILOXANES/BI (10A)
200-300 CST /KV
S 1-4/LEN

Luminous Emittance,
IlluminanceLuminous Flux
Luminous Intensity
Mass
Mass to Charge Ratio
Magnetic Flux
Density
Mass Flow Rate

Lux

lx

S 10-50/LUME

Lumen
CandelaKilogram
none
Tesla

Lm
cd
kg
m/z
T

S LUMF>1000
S LUMI<4
S ALLOY/BI (30A) 1E-10-1E-5/M
S MCH=1
S MFD>102

Kilogram/Second

kg/s

S MFR<0.1

Molar Mass

Gram/Molg/mol

S 2000-3000 G/MOL/MM

Molality of Substance
Melt Volume Rate,
Melt Flow Rate
Nutrition Content

Mol/Kilogramnone

mol/kgg/10 minS 01.-10 MOL/KG/MOLS
S 3/MVRnone

g/100 kcal

S NUC/PHP

Percent(Proportionality)
Permittivity, Absolute
Permittivity, Relative
pH Valuenone%

S POLYMER?/AB (5A) 4/PER

Farad/Meter
none
pH

F/m

S 1-10/PERA
S 1500-2000/PERR
S 7.4-7.6/PHV

Power

Watt

W

Parts per million

Ppm

ppm

/PRES (/P)

Pressure

Pascal

Pa

/RAD
/RES
/RI
/RSP

Radioactivity
Electrical ResistanceRefractive Index
Rotational Speed

Becquerel
Ohmnone
Revolution/Minute

Bq
Ohm

/SAR

Area /Surface Area

Square Meter

m²

/SOL
(/SLB)/STSC/TCO(/TCND)/TEMP (/T)
/TIM

Solubility

Gram/100 gram

g/100 gS "HG-XE-?"/BI (S) 100-200
WATT/POW
S 100 PPM /PPM (10A)
ADDITIVE/BI
S (VACUUM (5A) DISTILL?)/BI (S)1000-1100/PRESS RAD/PHPS SENSOR /BI (S) 10- 100/RES
S 3-4/RIS 2 RPM - 100 RPM /RSP (S)ENGINE/BIS PLATE/BI (S) 10 M**2 - 100
M**2 /SARS SOL>20 G/100G (5A) WATER

Surface Tension
Thermal Conductivity

Joule /Square Meter
Watt/Meter * Kelvin

J/m²
W/m * KS 60 J/M**2/STSC
S 1/TCO (S) HEAT?

Temperature
Time

KelvinSecond

/LUMF
/LUMI
/M
/MCH
/MFD
(/MFS)/MFR(/MFL)/MM (/MW,
/MOM)
/MOLS
/MVR
/NUC
(/NUTC)
/PER
/PERA
/PERR
/PHV
(/PH)
/POW
(/PW)
/PPM

October 2023

J

Search Examples

Ohm * m

pH

rpm

K
s

S DROPLETS (10A) 40 JOULE 70 JOULE /ENES ERE>0.1

S 20-25/TEMPS ?INCUB?/BI (10A) 50 S - 150 S/TIM

7KRFULL

Property Fields1) (cont’d)
Field
Code

Property

Unit

Symbol/VEL (/V)
/VELA
/VLR

Velocity
Velocity, angular
Volumetric Flow Rate

Meter per Second
Radian/Second
Cubic Meter/Second

m/s
rad/s
m³/s

/VOL
/VOLT

VolumeVoltage

Cubic Meter
Volt

m³
V

/WAC

Water Activity

none

Search Examples
S REDUC?/BI (S) 1E-3-5E-3/VELS VELA>10
S 1 M**3/S - 2 M**3/S /VLR (S)ABRASIVE
S 1E-8-2E-8/VOL.EXS TENSION/BI (10A) 5E-3 V<VOLT<7E-3 V
S WAC/PHP(1) Exponential format is recommended for the search of particularly high or low values, e.g. 1.8E+7 or 1.8E7 (for 18000000) or 9.2E-8(for 0.000000092).

International Patent Classification (/IPC) Thesaurus
The classifications, validity and catchwords for the main headings and subheadings from the current (8th)edition of the WIPO International Patent Classification (IPC) manual are available. The classifications from theprevious editions (1-7) are also available as separate thesauri. To EXPAND and SEARCH in the thesauri foreditions 1–7, use the field code followed by the edition number, e.g., /IPC2, for the 2nd edition. Catchwords
are included only in the thesauri for the 8th, 7th, 6th, and 5th editions.
Code
ADVANCED(ADV)
ALL
BRO (MAN)BT
CORE (COR)
ED
HIE
INDEX
KT
NEXT
NT
PREV
RT (SIB)
TI

Content

ExamplesAdvanced Codes for the Core Level IPC CodeE A61K0006-06+ADVANCED/IPC

All Associated Terms (BT, SELF, NT, RT)
Complete Class
Broader Term (BT, SELF)
Core Codes for the Advanced Level IPC CodeComplete title of the SELF term and IPC manual edition
Hierarchy Term (Broader and Narrower Term)(BT, SELF, NT)
Complete title of the SELF term
Keyword Term (catchwords) (SELF, KT)
Next Classification
Narrower Terms (SELF, NT)
Previous Classification
Related Terms (SELF, RT)
Complete Title of the SELF Term and Broader Terms(BT, SELF)

E C01C003-00+ALL/IPC
E C01C+BRO/IPC
E C01F001-00+BT/IPC
E G08C0019-22+CORE/IPC
E C01F001-00+ED/IPC
E C01B003-00+HIE/IPC
E C01F001-00+INDEX/IPC
E CYANOGEN+KT/IPC
E C01C001-00+NEXT5/IPC
E C01C+NT/IPC
E C01C001-12+PREV10/IPC
E C01C003-20+RT/IPC
E C01F001-00+TI/IPC

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KRFULLCPC Thesaurus
This thesaurus is available in the /CPC search field. All relationship codes can be used with both the EXPAND
and SEARCH commands.
Relationship CodeALL
AUTO (1)
BT
CODE
DEF
HIE
KT
MAX
NEXT
NEXT(n)NT
PREV
PREV(n)TI

Content

Search Examples

All usually required terms (BT, SELF, CODE, DEF)
Automatic relationship (BT, SELF, CODE, DEF)
Broader terms (BT, SELF)
Classification Code (SELF, CODE)
Definition (SELF, DEF)
Hierarchy terms (all broader and narrower terms) (BT, SELF,
DEF, NT)
Keyword terms (SELF, KT)
All associated terms
Next classification within the same class (SELF, NEXT)
Next n classification within the same class
Narrower terms
Previous Code within the same class (SELF, PREV)
Previous n classifications within the same class
Complete Title of SELF Term and Broader Terms (BT, SELF)

E C12M0001-005+ALL/CPC
E G01J003-443+AUTO/CPC
E G01J0003-443+BT/CPC
E CARTRIDGES+CODE/CPC
E B65G0045-16+DEF/CPC
E A01B0001+HIE/CPC
E LASER+KT/CPC
E G01J0003-44+MAX/CPC
E A01B0001-24+NEXT/CPC
E A01B0001-24+NEXT3/CPC
E G05B0001-04+NT/CPC
E G05B0019-00+PREV/CPC
E G05B0019-00+PREV2/CPC
E G05B0001-03+TI/CPC(1) Automatic Relationship is SET OFF. In case of SET REL ON, the result of EXPAND or SEARCH without any relationship code is thesame as described for AUTO.

DISPLAY and PRINT Formats
Any combination of formats may be used to display or print answers. Multiple codes must be separated by
spaces or commas, e.g., D L1 1-5 TI PA. The fields are displayed or printed in the order requested.
The information of the latest publication is displayed by default. To display the content for all levels of therecord you can combine all display fields and formats with the qualifier .M except FA, SCAN, and TRIAL.
For displaying a particular publication of a database record, you can simply add for certain display field thekind code to the appropriate display format, e.g. ALL.A. Fields that allow this are indicated by a number (3).
Hit-term highlighting is available for all fields. Highlighting must be ON during SEARCH to use the HIT, KWIC,
and OCC formats.
The default display format is STD.M, i.e., all publication levels of one family in the STD format.
FormatAB (ABS)
ABEN
ABKO
AGKO (2)AI (AP) (1)AN
CLM (3)
CLMEN (3)CLMKO
CLMN (2)CPC
CPC.TAB
DETDEN (3)DETDKODETN (2)October 2023

Content
Abstract
Abstract (English)
Abstract (Korean)
Agent (Korean characters)
Application Information
Accession Number
ClaimsClaims (English)
Claims (Korean)
Number of Claims
Cooperative Patent Classification
CPC, Tabular
Detailed Description
Detailed Description (Korean)
Number of Paragraphs in DETD

ExamplesD TI AB 1-5
D ABEND ABKOD AGKO
D AI
D L3 AN
D CLM
D CLMEND CLMKOD CLMN
D CPC
D CPC.TAB
D DETDD DETDKO
D DETN9
KRFULLDISPLAY and PRINT Formats (cont’d)FormatContent

ExamplesDT (TC)
ED
EDTX
FA
GI
GIS (2)
GIT (2)ICICM
ICSIN (AU)IN.CNY
INKO
IPCI
IPCR
KT
LA
LAF
MCLM
MCLMENMCLMKOPA (CS)
PA.CNYPAKOPANPAS
PI (PN, PATS) (1)PITPNO
PRN (PRAI) (1,5)
PRNO (PRAO) (2)
RLI (RLN)TIEN (TI)
TIKO
UP
UPTX

Document Type
Entry Date
Entry Date of Fulltext
Field Availability (for all publication levels)
Graphic Image
Graphic Image, Size
Graphic Image, Type
IPC (format contains ICM, ICS)
IPC, Main
IPC, Secondary
Inventor (in English)
Inventor, Country
Inventor (in Korean)
IPC, Initial
IPC, Reclassified
Key Terms
Language
Language of Filing
Main Claim
Main Claim (in Korean)
Main Claim (in Korean)
Patent Applicant/Patentee (in English)
Patent Applicant, Country
Patent Applicant/Patentee (in Korean)
Patent Applicant Normalized
Patent Applicant Standardized
Patent Information
Patent Information Publication Type
Patent Number, Original Format
Priority Information
Priority Number, Original Format
Related Patent Information
Title (in English)
Title (in Korean)
Update Date
Update Date Text

D DT
D ED
D EDTX
D FA
D GI
D GIS
D GIT
D IC
D IC
D ICS
D IN
D IN.CNYD INKOD IPCID IPCR
D KT
D LA
D LAF
D MCLMD MCLMEND MCLMKO
D PA
D PA.CNYD PAKO
D PAN
D PAS
D PI
D PIT
D PNO
D PRN
D PRNO
D RLI
D TIEND TIKOD UP
D UPTXALL (1,3)

AN, ED, UP, EDTX, UPTX, DED, DUPD, TIEN, TIKO, IN, PA, PAS, PAN, LAF,
LA, DT, PIT, PI, AI or APO (only if no AI), RLI, PRAI or PRAO (only if no PRAI),
ICM, ICS, IPCI, IPCR, CPC, ABEN, DETDEN, CLMEN, KT
ALL, plus graphic image
ALL, indented with text labels
IALL, plus graphic image
ALL, delimited for post processing

D ALL

ALLG
IALL (1,3)
IALLG
DALL (1)D ALLGD IALLD IALLGD DALL

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10
KRFULLDISPLAY and PRINT Formats (cont’d)FormatAPPS (1)BIB (1)BIBG
IBIB (1)IBIBG
BIBO
BRIEF (1)

IBRIEF (1)IBRIEFGBRIEFO

IND
IPC
IPC.TAB
CPC.TABMAX (ALL.M) (1)

IMAX (IALL.M) (1)
IMAXG
MAXO

SCAN (4)STD (1)ISTD (1)
TRIAL (TRI, SAM,SAMPLE, FREE)
TX
TXO
HIT
KWIC
OCC

Content

ExamplesAI, RLN, PRAI
AN, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, TIKO, IN, PA, PAS, PAN, LAF,
LA, DT, PIT, PI, AI, RLI, PRAI
BIB, plus graphic image
BIB, indented with text labels
IBIB, plus graphic image
AN, ED, EDTX, UP, UPTX, TIEN, TIKO, IN, INKO, PA, PAS, PAN, PAKO,
AGKO, LAF, LA, DT, PIT, PI, AI, RLI, PRAI
AN, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, TIKO, IN, PA, PAS, PAN, LAF,
LA, DT, PIT, PI, AI, RLI, PRAI, ICM, ICS, IPCI, IPCR, CPC, ABEN, MCLMEN,KT
BRIEF, indented with text labels
IBRIEF, plus graphic image
AN, ED, EDTX, UP, UPTX, TIEN, TIKO, IN, INKO, PA, PAS, PAN, PAKO,
AGKO, LAF, LA, DT, PIT, PI, AI, RLI, PRAI, ICM, ICS, IPCI, IPCR, CPC,
ABEN, ABKO, MCLMEN, MCLMKO, KT
ED, IPC (ICM, ICS, IPCI, IPCR), CPC
International Patent Classification (ICM, ICS, IPCI, IPCR)
IPC, IPC.KW, IPC.VER, in tabular version
CPC, in tabular version
AN, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, TIKO, IN, PA, PAS, PAN, LAF,
LA, DT, PIT, PI, AI, RLI, PRAI, ICM, ICS, IPCI, IPCR, CPC, ABEN, DETDEN,
CLMEN, KT, FA for all levels of publication
MAX, indented with text labels
IMAX, plus graphic image
AN, ED, EDTX, UP, UPTX, TIEN, TIKO, IN, IN.CNY, INKO, PA, PA.CNY, PAS,
PAN, PAKO, AGKO, LAF, LA, DT, PIT, PI, AI, RLI, PRAI, ICM, ICS, IPCI,IPCR, CPC, ABEN, ABKO, DETDEN, DETDKO, CLMEN, CLMKO, KT, FA for
all levels of publication
TI (random display without answer numbers)
AN, ED, EDTX, UP, UPTX, DED, DUPD, TIEN, TIKO, IN, PA, PAS, PAN, LAF,
LA, DT, PIT, PI, AI, RLI, PRAI, ICM, ICS, IPCI, IPCR, CPC (STD.M is default)
STD, indented with text labels
ED, EDTX, UP, UPTX, TIEN, FA, DETN, CLMND APPS
D BIB

DETDEN, CLMENDETDKO, CLMKO

D TX
D TXO

Hit term(s) and field(s)Up to 50 words before and after hit term(s) (KeyWord-In-Context)
Number of occurrences of hit term(s) and field(s) in which they occur

D HIT
D KWICD OCC

D IBIBD BIBOD BRIEFD IBRIEF
D IBRIEFG
D BRIEFO

D IND
D IPC
D IPC.TAB
D CPC.TAB
D MAX

D IMAXD IMAXG
D MAXOD SCAND STD
D ISTD
D TRIAL(1) By default, patent numbers, application and priority numbers are displayed in STN Format. To display them in Derwent format, enter
SET PATENT DERWENT at an arrow prompt. To reset display to STN Format, enter SET PATENT STN.
(2) Custom display only.
(3) You can combine this display field with the qualifier .PK (Patent Kind Code) to display the content for a certain publication level of arecord, e.g. CLM.B2.
(4) SCAN must be specified on the command line, i.e., D SCAN or DISPLAY SCAN.
(5) If priority information is not available for a certain document, this information is taken from the application information of thisdocument and marked with an asterisk (*).

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KRFULL

SELECT, ANALYZE, and SORT Fields
The SELECT command is used to create E-numbers containing terms taken from the specified field in ananswer set.
The ANALYZE command is used to create an L-number containing terms taken from the specified field in ananswer set.
The SORT command is used to rearrange the search results in either alphabetic or numeric order of thespecified field(s).
You can combine all fields except FA with the qualifier .M to SELECT/ANALYZE the content of all publicationlevels.
Field Name
Abstract
Accession Number
Application Country
Application Date
Application Information
Application Number, Original
Application Year
CPC Classification
Document Type
Entry Date
Entry Date Full-Text
Field Availability
Graphic Image, Size
International Patent Classification
Inventor
Inventor, Country
IPC (ICM, ICS, IPCI, IPCR)
IPC, Advanced Level Symbols
IPC, Advanced Level Symbols for Invention
IPC, Initial
IPC, Main
IPC, Reclassified
IPC, Reform
IPC, Secondary
Key Terms
Language
Language of Filing
Occurrence Count of Hit Terms
Patent Assignee/Patentee
Patent Assignee, Country
Patent Applicant Normalized
Patent Applicant Standardized
Patent Country
Patent Information Publication Type
Patent Kind CodePatent Number
Patent Number, Original
Patent Number/Kind Code
Pre-IPC8 Symbols from the ICM and first IPC8 values from2006-present

Field CodeANALYZE/
SELECT (1)

SORT

AB
AN
AC
AD
AI (AP, APPS)
APO
AY
CPC
DT (TC)
ED
EDTX
FA
GIS
IC
IN (AU)IN.CNY
IPC
IPC.A
IPC.AI
IPCI
ICM
IPCR
IPC.REF
ICS
KT
LA
LAF
OCC
PA (CS)
PA.CNY
PAN
PAS
PC
PIT
PK
PI (PN, PATS)
PNO
PNK
IPC.F

Y
Y
Y
Y
Y (2)
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y (4)
Y (4)
Y
Y
Y
Y
Y
Y
Y
Y
N
Y
Y
Y
Y
Y
Y
Y
Y (default)
Y
Y
Y (4)

Y
Y
Y
Y
Y
N
Y
Y
Y
Y
Y
N
N
N
Y
Y
Y
N
N
Y
Y
Y
N
Y
N
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y

October 2023

12
KRFULL

SELECT, ANALYZE, and SORT Fields (cont’d)Field Name
Priority Country
Priority Date
Priority Date, First
Priority Number
Priority Number, OriginalPriority Year
Priority Year, First
Publication Date
Publication Year
Related Patent Country
Related Application Number
Related Application Date
Related Application Type
Related Application Year
Related Patent Number
Title
Update Date
Update Date Text

Field Code
PRC
PRD
PRDF
PRN (PRAI)
PRNO
PRY
PRYF
PD
PY
RLC
RLN
RLD
RLT
RLY
RLPN
TIEN
UP
UPTX

ANALYZE/
SELECT (1)
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y

(1) HIT may be used to restrict terms extracted to terms that match the search expression used to create the answer set,e.g., SEL HIT TI.
(2) Selects or analyzes application numbers with /AP appended to the terms created by SELECT.
(3) Appends /BI to the terms created by SELECT.
(4) Appends /IPC to the terms created by SELECT.

Sample Records
DISPLAY BIBG

October 2023

SORT
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y

13
KRFULLDISPLAY ISTD.M

October 2023

14
KRFULLDISPLAY BRIEFO

October 2023

15
KRFULLDISPLAY ALL (STN format)

October 2023

16
KRFULL…

…

October 2023

17
KRFULLIn North America
CAS
STN North America
P.O. Box 3012
Columbus, Ohio 43210-0012 U.S.A.
CAS Customer Center:Phone: 800-753-4227 (North America)
614-447-3731(worldwide)
E-mail: help@cas.org
Internet: www.cas.org

In Europe
CAS Customer Center EMEA
Represented by
FIZ Karlsruhe - Leibniz-Institute for Information Infrastructure
Hermann-von-Helmholtz-Platz 176344 Eggenstein-Leopoldshafen
Germany
Phone: +49-721-9588 3155
E-mail: EMEAhelp@cas.org
Internet: www.fiz-karlsruhe.de

In Japan
JAICI (Japan Association forInternational Chemical Information)
STN Japan
Nakai Building
6-25-4 Honkomagome, Bunkyo-ku
Tokyo 113-0021, Japan
Phone: +81-3-5978-3601 (Technical Service)+81-3-5978-3621 (Customer Service)
E-mail: support@jaici.or.jp (Technical Service)customer@jaici.or.jp (Customer Service)
Internet: www.jaici.or.jp

October 2023