Compat ibilit y Verificat ion Test ing
for Basic R esident Regist rat ion Cards ( BRRC : Juki Cards)
and Proximit y Coupling Devices
Test ing Specificat ions ( Version 1.0)

June 16, 2003
New Media Development Associat ion

Table of Contents
123Objectives and Background ....................................................................................................................................3
Reference Specifications and Other Documents....................................................................................................3
Test Targets ..............................................................................................................................................................3
3.1
Vendors............................................................................................................................................................3
3.2
IC Cards...........................................................................................................................................................33.3
Proximity Coupling Devices ..........................................................................................................................3
4
Testing Environments..............................................................................................................................................44.1
Test PC.............................................................................................................................................................44.2
PC Operating System......................................................................................................................................44.3
Proximity Coupling Device to Be Tested.......................................................................................................44.4Others ..............................................................................................................................................................45
Testing Specifications and Requirements...............................................................................................................55.1
Overview of Tests ...........................................................................................................................................55.2
Cross Tests.......................................................................................................................................................55.3
Direction of Card Insertion.............................................................................................................................65.4
Common Testing Specifications .....................................................................................................................65.5
Details of Tests and Judging Criteria..............................................................................................................65.6
C3 Test Commands .........................................................................................................................................8
5.7
Submission of IC Cards for Testing ...............................................................................................................85.8
Submission of Proximity Coupling Devices for Testing ...............................................................................85.9
Measures Taken When the Matching Has Failed the Test .............................................................................86Testing Software Specifications..............................................................................................................................96.1
Software Configuration...................................................................................................................................96.2
Processing Flow ............................................................................................................................................106.3
Result Sheet Format......................................................................................................................................147Conditions for Testing Software Development and Use......................................................................................15
7.1
Hardware .......................................................................................................................................................15
7.2
Software Development Environment ...........................................................................................................15
8
Compatibility Function Testing Work ..................................................................................................................15
8.1
Testing Work Procedures ..............................................................................................................................15
8.2
Compatibility Testing Site ............................................................................................................................152

1 Objectives and Background• To clarify details, methods, criteria, environments and procedures for compatibility verification
tests aimed at verifying the compatibility of different types of contactless IC cards and proximity
coupling devices from different vendors that will be provided for the Basic Resident
Registration Network System (the Juki System)• To prepare a report on the compatibility of IC cards and proximity coupling devices based on theresults of tests using compatibility testing software

2 Reference Specifications and Other Documents
Juki Card Specifications : “Basic Resident Registration Card Specifications (Type I) for the BasicResident Registration Network System, Version 2.2” LASDEC, January 20, 2003
Proximity Coupling Device Specifications: “IC Card Proximity Coupling Device Procurement
Specifications for the Basic Resident Registration Network System, Version 1.0” LASDEC, August1, 2001
NMDA Implementation Specifications: “Proximity Communications Interface Implementation
Specifications, Version 1.1” NMDA, July 2001

3 Test Targets
3.1Vendors• Tests shall be conducted for those of the vendors who plan to provide IC cards and proximity

coupling devices for the Basic Resident Registration Network System and also wish toundergo compatibility verification tests.

3.2IC Cards• Tests shall be conducted for Type I Juki cards.
• IC card vendors shall provide one or more types of IC cards they want to be tested.
• For each type of IC card, three units shall be tested taking into consideration possible

variance in their characteristics and other features.

3.3

Proximity Coupling Devices• Tests shall be conducted for proximity coupling devices for Juki cards and those for

operators.
• Proximity coupling device vendors shall provide one or more types of proximity coupling

device they want to be tested.
• For each type of proximity coupling device, two units shall be tested taking into

consideration possible variance in their characteristics and other features.
• RS232C or USB shall be used for interface with PC.
• For proximity coupling devices that have two types of interface, RS232C and USB, tests

shall be conducted using either of the two types of interface designated by the vendor.

34 Testing Environments
4.1

Test PC• A Windows model provided by the New Media Development Association will be used fortesting.
• For interface, RS232C (DSUB 9pin) and USB (Ver. 2.0) will be used.

4.2

PC Operating System• Windows 2000 SP3 operating system will be used.

4.3

Proximity Coupling Device to Be Tested• No more than one proximity coupling devices shall be connected to a single PC.
• The proximity coupling device driver for a proximity coupling device that has undergone atest will not particularly be deleted even when other types of proximity coupling devices aretested.

4.4

Others• For the surrounding environment, the ordinary office environment shall be used.

45 Testing Specifications and Requirements
5.1

Overview of Tests

The following is a list of tests to be conducted in this compatibility verification testing.
Table 5-1 List of Tests
TestnumberTest name

Description

Request/attribute test

This test is conducted to confirm
whether transition to the active
state occurs after the IC card isinserted into the proximity
coupling device.

C2

Transmission protocol
testThis test is conducted to confirm
whether the ISO/IEC14443-4
transmission protocol isoperating properly.

C3

Command transmission
and reception test

C4

Chip temperature
confirmation test

C1

5.2

Remarks

Proper operation is
confirmed within therange of the C3command transmission
and reception test.

This test is conducted to confirm
whether the card command isoperating properly.
This test measures the surface
temperature around the IC chip
after the IC card is left in theproximity coupling device for acertain period of time.

Cross Tests• Cross tests shall be conducted for all types of proximity coupling devices and all types of ICcards.
• A cross test shall be conducted by inserting one IC card into one proximity coupling device.
• For each test, proximity coupling devices and IC cards shall be matched according to thetable below.
Table 5-2 Matching of Proximity Coupling Devices and IC Cards
Test
numberTest name

C1

Request/attribute test

C2

Transmission protocol
test

C3

Command transmission
and reception test

C4

Chip temperature
confirmation test

Matching of proximity
coupling devices and IC cards
to be tested
Cross tests shall be conducted
for all cases of matching
involving all proximity coupling
devices and IC cards.
Cross tests shall be conducted
for all cases of matching
involving all proximity coupling
devices and IC cards that havepassed the C1 test.

Remarks(Same as above)

A single proximity coupling
device and a single IC card shallbe chosen and tested.

5

Each shall be chosenrandomly since it isconsidered that thistest does not greatly
affect thecharacteristics ofindividual products

5.3

Direction of Card Insertion• Tests shall be conducted by inserting an IC card into a proximity coupling device in fourdifferent directions.
The card shall be inserted in two different directions with its front face up and in two
different directions with its front face down.

5.4

Common Testing Specifications• Tests shall begin 30 minutes after the power of the proximity coupling device is turned on.

This is to avoid unstable operation of the proximity coupling device immediately after its
power is turned on.
• If a test fails, the status of the card involved shall be examined and recorded accurately sothat data thus obtained can be used to analyze the cause of failure.
• Parameters that may affect the characteristics of communications between the PC andproximity coupling device and between the proximity coupling device and IC card shall be
used at their default value set for the matching of the proximity coupling device to be tested
and its driver (proximity coupling device driver), and no particular change shall be made tothem during the test.

5.5 Details of Tests and Judging Criteria(1) C1 Test
• The C1 test uses the Request B and Attribute functions of the proximity coupling device

driver API and involves initialization, collision avoidance and ATT reception based on
ISO/IEC14443-3 Type-B standards.
• One IC card shall be inserted into the device ten times in one direction for a total of 40 times
for four different directions.
• The judging criteria for the C1 test are described in the table below.
Table 5-3 Judging Criteria for the C1 Test
Judgment
PassFail(2)Criterion
If the IC card has been successfully
inserted into the device nine times ormore in each of the four directions
In cases other than that described aboveRemarks

C2/C3 Tests• TheISO/IEC14443-4 transmission protocol test (C2 test) and command
transmission/reception test (C3 test) will be conducted.
• One IC card shall be inserted into the device ten times in one direction for a total of 40 times
for four different directions.
• The C2 test will not be conducted independently with final judgment made based on theresults of the C3 test.
• The judging criteria for the C2 test based on the results of the C3 test (commandtransmission/reception test) are described in the table below.
Table 5-4 Judging Criteria for the C2 Test
Judgment
Pass
FailCriterion
If, at least for one command, the IC card
has been successfully inserted into thedevice nine times or more in each of thefour directions
In cases other than that described above

6Remarks• The judging criteria for the C3 test based on the results of executing transmission/receptionof commands specified in “5.6 C3 Test Commands” are described in the table below.
Table 5-5 Judging Criteria for the C3 Test
Judgment
Pass
Fail(3)•••••••

CriterionIf, for all commands, the IC card has beensuccessfully inserted into the device ninetimes or more in each of the fourdirections
In cases other than that described above

Remarks

C4 TestThe C4 test involves measurement of the temperature on the IC card surface after it is left in
the proximity coupling device for a certain period of time.
After the IC card is inserted into the device and left there for five minutes with the RF turnedon using the power supply control function of the device’s API, it shall be taken out of thedevice to measure the temperature on its surface.
In the case of an IC card with a terminal, temperature shall be measured on the contact
terminal and its back side, and in the case of an IC card without a terminal, temperature shallbe measured on its front and back sides around the IC chip. Temperature shall be measured
at several locations and the highest temperature measured shall be recorded.
Surface temperature shall be measured immediately after the IC card is removed from thedevice (within five to ten seconds after removal).
This test shall be conducted for one proximity coupling device and one IC card matchedrandomly.
The IC card shall be inserted into the device with its front face up and in two different
directions: the end of the card where the contact terminal (IC chip if the card does not havesuch a terminal) is located is inserted first or vice versa.
In this test, no judgment shall be made. The purpose is to record the temperature measured.

7

5.6

C3 Test Commands• IC card commands shall be transmitted and received using IC card command transmission(ICRW_ICCmd) and IC card response reception (ICRW_ICResp) for the IC card proximity
coupling device driver API.
• As automatic judgment shall be made using the test program, the IC card shall be considered
to have responded properly to each command APDU when the SW1SW2=9000h is returned.
• For the tests, the following IC card commands shall be used:
Table 5-6 C3 Test Commands
Command nameDescriptions

1

SELECT FILE

Platform command2

GET DATA(Same as above)

3

INTERNAL AUTHENTICATE(Same as above)

4

High power command

Command that consumes thelargest amount of electric power

Remarks
Refer to the Juki card
specifications.
Refer to the Juki card
specifications.
Refer to the Juki card
specifications.
Declaredbythevendor• If the scenario for the ISO/IEC14443-4 transmission protocol is not included in the IC card

proximity coupling device driver, one that is based on the proximity coupling device
transmission control matrix described in the NMDA implementation specifications that isincorporated into the test program shall be used. In this case, the number of retries will be
N=3.

5.7

Submission of IC Cards for Testing• IC card vendors should provide to the New Media Development Association the following:(1) IC cards issued for testing, which are in a condition in which they can undergo testing(2) Materials in which command APDU and normal response APDU are described(3) In the case of IC cards without a terminal, information on where the IC chip is locatedfor C4 measurement will be provided.
• Other requirements(1) Information on matters to be noted when IC cards are handled because of their possible
effects on the results of verification will be provided prior to testing.

5.8

Submission of Proximity Coupling Devices for Testing• Proximity coupling device vendors should submit to the New Media Development

Association the following:(1) Proximity coupling devices to be tested, including communication cables, power supply
cables and conversion connectors(2) Proximity coupling device driver based on proximity coupling device specifications thatrun on the operating system specified in “4.2 PC Operating System”• Other requirements(1) If the proximity coupling device has both types of interface, USB and RS232C, theproximity coupling device vendor will have to designate the type of interface to be used.
(2) Information on matters to be noted when proximity coupling devices are handled
because of their possible effects on the results of verification will be provided prior totesting.

5.9

Measures Taken When the Matching Has Failed the Test

• If a certain case of matching of an IC card and a proximity coupling device has failed the test,the parties concerned (IC card vendor, proximity coupling device vendor, NMDA andverification tester) will make the final judgment after taking the following steps:• Confirmation of the state of affairs• Analysis of the cause of failure• Discussion for judging whether the matching has truly failed the test
• Final decision on success or failure
86 Testing Software Specifications6.1

Software Configuration

Division of
responsibilities for
preparations

Compatibilityverifier

Test program

Driver API

IC card proximity coupling device driver(Based on Proximity Coupling Device Specifications)

Proximity couplingdevice vendor

USB/RS232C

Proximity coupling device

ISO/IEC14443-2,3,4

IC cardvendorJuki card

Figure 6.1 Software Configuration

96.2 Processing Flow
(1) Basic Test Flow
The following is the basic test flow for one proximity coupling device.
conducted independently from other tests.
START

Open the port (ICRW_Open)
Reset the proximity coupling device(ICRW_Reset)
Insert the card (ICRW_CardIn)

Initial processing
Insert the card

C1 testPass the test

NOYES
C2/C3 tests

Final processing

NO

Close the port (ICRW_Close)

Inserted infour different
directions?
YES

YES
Next IC card
to be tested
NOSTOP

Figure 6.2 Basic Processing Flow (1/2)

10

The C4 test shall beSTART

Initial processing

Open the port (ICRW_Open)
Reset the proximity coupling device (ICRW_Reset)
Insert the card (ICRW_CardIn)

Insert the card

C4 testFinal processing

NO

Close the port (ICRW_Close)

Inserted in twodifferentdirections?
YES
STOP

Figure 6.3 Basic Processing Flow (2/2)

11(2)

C1 Test Processing Flow

BEGIN

RF ON(ICRW_PowerCtrl)

Request B(ICRW_ReqB)

Attribute(ICRW_AttribB)

Passed theC1 testRF OFF(ICRW_PowerCtrl)

Take in the card
(ICRW_CardIn)

Take out the card
(ICRW_CardOut)

NO

Repeated
ten times?
YES
END

Figure 6.4 C1 Test Processing Flow

12NG

NG

Failed the C1test

(3)C2/C3 Tests
BEGIN

Take in the card (ICRW_CardIn)
RF ON (ICRW_PowerCtrl)
Request B (ICRW_ReqB)
Attribute (ICRW_AttribB)NG

RF OFF (ICRW_PowerCtrl)(ICRW_CardOut)

NG

Execute the Card Command 1
SELECT FILE

Failed tentimes in arow?

NG

Execute the Card Command 2
GET DATA

YESNG

Execute the Card Command 3
INTERNAL AUTHENTICATE

Failed the C2/C3 tests
NG

Execute the Card Command 4
High power command

Failed in the Card
Command n

RF OFF (ICRW_PowerCtrl)
Take out the card (ICRW_CardOut)

NO

Repeated
ten times?
YESEND

Figure 6.5 C2/C3 Test Processing Flow

13NO

(4)

C4 Test Processing Flow
BEGIN

RF ON(ICRW_PowerCtrl)

NOHas thedesignatedtime passed?
YESRF OFF(ICRW_PowerCtrl)
Take out the card
(ICRW_CardOut)

Measure and record thesurface temperature aroundthe chipEND

Figure 6.6 C4 Test Processing Flow

6.3

Result Sheet Format

To be determined separately.

14

7 Conditions for Testing Software Development and Use
7.1 Hardware(1) RS232C Connection• Windows 2000-compatible DOS machine• DSUB 9pin

(2)

USB Connection• Windows 2000-compatible DOS machine• USB1.1 connector• The maximum amount of electric power supplied on the PC side is 500 mA (initial: 100 mA).

7.2

Software Development Environment• VC++ Ver.6.0

8 Compatibility Function Testing Work
8.1 Testing Work Procedures(1) Testing Procedure• Proximity coupling device vendors shall bring or send their proximity coupling devices anddriver software to the testing site beforehand.
• IC card vendors shall bring or send their IC cards to the testing site beforehand.
• If possible, drivers and other types of software shall be installed by testers to confirm

whether they work properly.
• Testers shall use test software to conduct tests for all proximity coupling devices and ICcards.
• Vendors shall not be present during the testing work.
• Vendors shall help solve problems arising during the preparatory work, including installation,and during the testing.

(2)

Number of Times Compatibility Tests Are Conducted• Compatibility test shall be conducted once.
• If a second test is required, for example, because there is a problem with the results of testing,a separate decision shall be made on the period when such a test shall be conducted and otherrequirements.

(3)

Test Duration• In principle, tests shall be conducted between 10:00 a.m. and 6:00 p.m.
• If a problem or other situations arise during the test, a decision shall be made on whatmeasures will be taken every time such situations arise.

8.2 Compatibility Testing Site
(1) Location• New Media Development Association :Mita Kokusai Bldg. 24F, 1-4-28 Mita, Minato-ku, Tokyo• Testing environment: Ordinary office environment(2)Contact• New Media Development Association :TEL: 03-3457-0672 (pilot number), FAX: 03-3451-9604

15