Synos

GENERAL-PURPOSE SYSTEM SOLUTION / FFP (FAR FIELD PATTERN) MEASUREMENT SYSTEM
FFP MEASUREMENT SYSTEM
FFP measurement and analysis system in combination with dedicated FFP measurement optics & image processing method.

FFP (far ﬁeld pattern) measurement system is for measuring FFP (far ﬁeld pattern) ofsemiconductor lasers, optical ﬁbers, optical waveguides, various optical modules and so on.
With dedicated f-θ lens optics and image processing method, it can be applied to FFPmeasurement, radiation angle distribution measurement, emission N.A. measurement andanalysis of various optical devices.
【Features】○M-Scope type F, FFP measurement optics● Quick and easy measurement by dedicated f-θ lens optics and image processing method.
● Long working distance design with the working distance of approx. 6±0.8mm.
○Possible to measure in 400nm to 1700nm wavelength range by selecting detector.
○Optical beam analysis module AP013, specially designed high-functional image processing
software for optical beam proﬁle analysis● All-in-one package of PC, optical beam analysis software, detector driver, correction data.
● High-performance image processing software for optical beam proﬁle measurement Optimetrics BA Standard is pre-installed.
【Standard component】○FFP measurement optics selection● 650~1700nm:M-Scope type F● 400-650nm:M-Scope type F/BL
○Available detector selection● 400-1100nm︓Hi-resolution CMOS detector ISA071/ISA071GL● 950-1700nm︓InGaAs high sensitivity NIR detector ISA041H2● 400~1700nm : InGaAs high resolution NIR detector ISA041HRA☞Regarding the measurement angle coverage and pixel resolution during FFP measurement by the detector used, please refer to P50【Detector selection and FFP measurement speciﬁcations】○Optical beam analysis module AP013● PC for image processing, optical beam analysis software Optometrics BA Standard, detector driver, calibration data, USB key○Accessories● Cables, instruction manuals, etc.
【Option】○ND ﬁlter● Visible (400~700nm): NDF-5 (5 types per set)
● NIR (700~1100nm): NDF NIR-5 (5 types per set)
● IR (1310~1550nm): NDF IR-5（5 types per set）
○Optics bench● Optics bench for ﬁber measurement with manual stages● Vertical setting optics bench●HIGH RESOLUTION FFP MEASUREMENT OPTICS FOR IR RANGE
High-resolution IR FFP measurement system exclusively for the 1310~1550 nm spectral range【Available detector, angle coverage, pixel resolution (approx.)】【Standard component】○High resolution FFP measurement Detector
VGA-type InGaAs NIR detector ISA041VH
optics for IR M-Scope type FHRSpectral range 950~1700nm○VGA-type InGaAs NIR detector
Total pixels
640×512 pixels
ISA041VH
Pixels pitch
20μm sq.
○Optical beam analysis module
Meas. angle / Meas. angle
Pixel resolution
AP013
pixel resolution ±32°(V)×±25.6°(H)0.1°【Option】*Pixel resolution: Measured angle equivalent to the detector pixel○IR ND ﬁlter, optics bench, etc.
calculated from measured angle range and sensor pitch of the detector.

【Component selection of FFP measurement system】○Stages・optics bench○FFP measurement optics selection●for 400~1100nm

Sample stages
Optics stages
Optics bench for ﬁber
measurement○Optical beam analysis module AP013○Detector selection●Personal computer
・Main unit
・Accessories

Hi-resolution CMOS detector
ISA071/ISA071GL●M-Scope type F (for 650-1700nm）●M-Scope type F/BL (for 400-650nm）●for 950~1700nm●Optical beam analysis software
Optometrics BA Standard●Detector driver●Calibration data●USB licence key

InGaAs NIR detector
ISA041H2・ISA041HRA
Vertical setting
optics bench○High resolution IR FFP measurement optics●for 950~1700nm○Accessories●ND ﬁlter＊Can be combined with various
motorized/manual stages

https://www.synos.jp

VGA-type InGaAs NIR detector
ISA041VH●M-Scope type FHR(for 1300-1600nm）

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