iPROGRAM	
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  CONTENTS

Program and Contents
June 19, 2014 (Thu)
Opening remark (10:30-10:35)
Plenary (10:35-11:55)
O1-1. (10:35-11:15)- Tutorial talk -………………………………………………………..

	
 Computer Insight into Processes Stimulated by Cluster Projectile Impacts
Z. PostawaO1-2. (11:15-11.55)- Review talk -(Jagiellonian Univ.)………………………………………………………..

	
 Light at the End of the Tunnel: Novel Approaches to Achieving Significantly Improved

Understanding of Secondary Ion Formation
K. Wittmaack(Helmholtz Zentrum Munchen)

Lunch (11:55-13:00)
Organic 1 (13:00-14:10)
O1-3. (13:00-13:30)- Invited -……………………………………………………….……….

The evaluation of peptide structures using ToF-SIMS and data analysis
S. Aoyagi
O1-4. (13:30-13:50)(Seikei Univ.)…………………………………………………………….....……………….

Mass scale calibration with quaternary ammonium ions for TOF-SIMS spectra measured
by different TOF-SIMS instruments
S. Otomo
O1-5. (13:50-14:10)(Furukawa Electric)…………………………………………………………….....……………….

ToF-SIMS and PCA analysis of Oligomer distribution within Glass Fiber Reinforced
Plastic
Y. Kajiwara(Mitsubishi Gas Chemical)

Break (14:10-14:30)
Organic 2 (14:30-15:40)
O1-6. (14:30-15:00)- Invited -………………………………………………………….…….

ToF SIMS as a navigation aid through the complex world of high throughput materials
discovery
M. AlexanderO1-7. (15:00-15:20)(The Univ. of Nottingham)…………………………………………………………….....………………

Measurements of secondary ions emitted from amino acid thin film with noble gases andmolecular cluster ion
K. Moritani (University of Hyogo)
O1-8. (15:20-15:40)…………………………………………………………….....………………

Possibilities and Limitations of Biological Analysis with novel Ar-GCIB SIMS Apparatus

PROGRAM	
   &	
   CONTENTS	  M. Fujii(Kyoto Univ.)

Break (15:40-16:00)
Sponsored (16:00-17:20)
S1-1. (16:00-16:20)…………………………………………………...…………..……………….

Towards New Applications with CAMECA SIMS Instruments
M. Schuhmacher
S1-2. (16:20-16:40)(CAMECA bu, AMETEK)…………………………………………………...…………..……………….

Twenty-Five Years of Advances in TOF-SIMS Instrumentation and its Application
M. Terhost
S1-3. (16:40-17:00)(ION-TOF)…………………………………………………...…………..……………….

TOF-SIMS apparatus having function of Laser-SNMS for nano-scale mass imaging
T. Kashiwagi
S1-4. (17:00-17:20)(TOYAMA)…………………………………………………...…………..……………….

Recent progress of ion beam technologies in ULVAC-PHI
T. Miyayama(ULVAC-PHI)

Poster short presentation (17:20-18:00)

Poster session (18:00-19:00)
P-1.

…………………………………………………………………………..……..……………….

Comparison of Measurement Repeatability among Beam position alignment, Z-direction
motion, and Auto-beam centering using a Cameca IMS 7f instrument
S. Miwa
P-2.

(CAMECA bu, AMETEC)……………………………………………………………………………..…..……………….

Reduction of phosphorus ion yield by electron beam irradiation under O2 primary ion
bombardment
Y. HoriP-3.

(Toshiba Nanoanalysis)………………………………………………………………..………………..……………….

Deconvolution of Depth Profiles of GaN-Based Light Emitting Diodes with Tunnel
JunctionsY. NakataP-4.

(Toray Research Center)………………………………………………………………..………………..……………….

Light element analysis in oxide and nitride materials
I. Sakaguchi(National Institute for Materials Science (NIMS))

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P-5.

………………………………………………………………..………………..……………….

Q-SIMS analysis of impurities in SnO2 layer on glass substrate
T. Abe Sekine
P-6.

(ASAHI GLASS)…………………………………………………………………………………..……..……….

Hydrogen isotope fractionation of water by diffusion in silica glass
M. Kuroda
P-7.

(Hokkaido Univ.)…………………………………………………………………..……………..……………….

An investigation of depth resolution for dual-beam TOF-SIMS of Bi+ and lower energy
Cs+ on depth profiling
J. Sameshima (Toray Research Center)P-8.

……………………………………………………………………………..…..……………….

Helium depth profile of low energy 4He implanted samples
K. BajoP-9.

(Hokkaido Univ.)…………………………………………………………………………………..………..…….

Organic Materials Analysis Using Different Primary Bi Ions in TOF-SIMS
R. Shishido
P-10.

(Tohoku Univ.)………………………………………………………………………………..…..………….

Highly Sensitive Lipid Analysis and Imaging Mass Spectrometry with Cluster SIMS
Apparatus
M. Fujii(Kyoto Univ.)

P-11. …………………………………………………………………………………..…..………….

Mass accuracy dependence on energy and extractor voltage of analyzer in TOF-SIMS
with single-stage reflection design
D. Kobayashi
P-12.

(Asahi Glass)………………………………………………………………………………..…..………….

Atomic Level Analysis of Etched Carbon Fibers by the Scanning Atom Probe
M. Taniguchi(Kanazawa Institute of Technology)

P-13. …………………………………………………………………………………..…..………….

Evaluation of Sample Shape after Evaporation in Laser Assisted Atom probe
M. Morita
Social meeting (19:00-21:00)(The Univ. of Tokyo)

PROGRAM	
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   CONTENTS	
  June 20, 2014 (Fri)Instrumentation / Complementary 1 (9:00-10:10)
O2-1. (9:00-9:30)- Invited -……………………………….………..………………….…..….

	 Atom Probe Tomography: Successes and Challenges
T. F. Kelly
O2-2. (9:30-9:50)(CAMECA)…………………………………………..……………….…………………….

	
 Dependence of Quantitativity on Dopant Distribution in Silicon Provided by Atom Probe
Tomography
T. SasakiO2-3. (9:50-10:10)(Toshiba Nanoanalysis)………………………………………..……………….…………………….

	
 

Oxygen effect of Cr/Ni multilayered samples by resonance enhanced multiphoton
ionization sputtered neutral mass spectrometry
S. Nishinomiya(Nippon Steel & Sumitomo)

Break (10:10-10:25)
Instrumentation / Complementary 2 (10:25-11:55)
O2-4. (10:25-10:55)- Invited -…………………………….………..………………….…..….

Laser desorption/ionization imaging mass spectrometry with ultra-high mass resolution
mass spectrometer.
T. SatohO2-5. (10:55-11:15)(JEOL)………………………………………………………… ……..………….….

Time-of-Flight Secondary Ion Mass Spectrometry using an ionic-liquid primary ion
beam generated by vacuum electrospray
Y. Fujiwara
O2-6. (11:15-11:35)(National Institute of Advanced Industrial Science and Technology (AIST))………………………………………………………… ……..………….….

In-situ GCIB Cross-section Imaging of Organic Materials-Toward the Determination of Accurate Depth DistributionsS. Iida
O2-7. (11:35-11:55)(ULVAC-PHI)………………………………………………………… ……..………….….

SIMS Depth Profiling by FIB Crater Wall Imaging of Organic and Inorganic Surfaces
D. Rading
Lunch (11:55-13:00)(ION-TOF)

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Inorganic (13:00-14:40)
O2-8. (13:00-13:30)- Invited -…………………………………………….…….…………….

Light Elements and Related Materials Properties Revealed by TOF-SIMS
L. Zhang
O2-9. (13:30-14:00)(Institute of Metal Research, Chinese Academy of Science (CAS))- Invited -………………………….………….………………………….

From crater to crater: application of high resolution SIMS to Geosciences
K. Yi
O2-10. (14:00-14:20)(Korea Basic Science Institute)…………………………..……………………………..…..……………….

Development of high-precision analysis of multilayer structure
T. Shiramizu(Mitsubishi Electric)

Break (14:20-14:40)
Biomedical / Imaging (14:40-16:10)
O2-11. (14:40-15:10)- Invited -………………………………….………..………………….

Visualizing accumulation of photosynthetic products in plant using isotopic labeling and
SIMS
M. Takeuchi
O2-12. (15:10-15:30)(The Univ. of Tokyo)…………………………..……………………………..…..……………….

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Localization of N-minodronate by Isotope Microscopy and Histochemical Assessment
for the Biological Effects of Minodronate to Bone Cells in MiceN. Amizuka

O2-13. (15:30-15:50)(Hokkaido Univ.)…………………………..……………………………..…..……………….

Molecular Analysis of Biological Tissues using Time-of-Flight Secondary Ion Mass
Spectrometry (TOF-SIMS) and Gas Cluster Ion Beam (GCIB) sputtering
I. Ishizaki
O2-14. (15:50-16:10)(ULVAC-PHI)…………………………..……………………………..…..……………….

High Resolution Imaging Mass with Focused Ar Cluster BeamJ. Matsuo

Closing remark (16:10)(Kyoto Univ.)