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é0.1 Å ÈãÌ¸xÅßéÉå«ÈÓ¡ªéBúËõ Jan. 2011 Vol.24 No.1  19(C) 2011 The Japanese Society for Synchrotron Radiation ResearchFig. 1(a) Schematic view of an organic eld­eect transistor. (b) Typical characteristic of the device. (c) Photographof the typical sample. The orange hexagon is the rubrene single crystal, and source and drain electrodes are under­
neath of the crystal. The size of the rubrene crystal was several mm~several mm~several mm.

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Fig. 4(a) Electron numbers of each phenyl group and tetracene backbone as a function of the depth. (b) Electron den­sity prole of the molecules belonging to the rst layer r1(z) (black) and third layer r3(z) (red). The blue curveshows [r3(z|0.25 Å){r3(z{0.25 Å)]/2, showing that the electron density with molecules having height distri­bution of }0.25 Å. (c) HOMO of the rubrene molecule. Yellow and blue shows the phase of the wave function.
(d) Depth dependence of the intra­tetracene peak distance.

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22  úËõ Jan. 2011 Vol.24 No.1

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Structure of molecules in the conduction layer ofrubrene organic transistor
Yusuke WAKABAYASHI

Graduate School of Engineering Science, Osaka University
1_3 Machikaneyama­cho, Toyonaka 560_8531

Abstract Crystal truncation rod (CTR) scattering measurement and holographic analysing method make itpossible to clarify the surface structure of highly complicated structured material, organic semiconductor.
Although the CTR scattering method has been utilized a couple of decades, its application has been limited tosimple_structured materials such as Si, Au, or metal oxides. The successful observation of the surface of theorganic material, rubrene single crystal, opens the door to the structural materials science study for the sur­faces of various systems.

úËõ Jan. 2011 Vol.24 No.1  23