JAEA
for Materials and Nanotechnology in Japan

Advanced Energy Materials Development by Synchrotron
Radiation and Informatics

Implementing Agency JAPAN ATOMIC ENERGY AGENCYProject Overview
The Ministry of Education, Culture, Sports, Science andTechnologỳs Advanced Research Infrastructure for Materialsand Nanotechnology in Japan (ARIM) project attempts topromote data-driven research and development throughout
Japan, which has been garnering signiﬁcant attention inmaterials development recently. The Ministry will develop an
infrastructure that enables strategic use of experimental data,
while developing state-of-the-art equipment and a system thatenables efﬁcient data collection.
This project comprises 25 universities and research institutes
nationwide, and is divided into seven key technical areas. The
Ministry will contribute to the research and development ofusers by forming a hub-spoke system comprising hub
institutions that provide advanced facilities with strengths ineach area and institutions with distinctive equipment andtechnologies.

JAEA Beamlines
In addition to the two dedicated JAEA beamlines listed below, we also have one provision equipment at BL14B1, which is owned by QST.

BL22XU: JAEA Actinoide Science I Beamline

BL23SU: JAEA Actinoide Science II Beamline

EXPERIMENTAL
BL14B1: QST Quantum Dynamics II Beamline
Energy-dispersive XAFS measuring system
・Conventional X-ray absorption spectroscopy (X AFS) measurements using a double cr ystal
spectrometer・Employs a 36-element semiconductor detector in the ﬂuorescence method
・Sample temperature is between 20 and 1073 K
・Atmosphere containing carbon monoxide and nitrogen monoxide can be controlled using a gas
control system, and gas component analysis can also be performed using a quadrupole massspectrometer*It also enables time-resolved XAFS measurement using a curved analyzing crystal[Examples of application] In-situ X AFS analysis of hydrazine hydrate oxidation catalyst,
elucidation of the reaction mechanism of secondar y bat teries using polyoxometalate
compounds as electrode materials, etc.

BL23SU: JAEA Actinoide Science II Beamline
Surface chemistry experiment apparatus
・Enables in-situ observation and real-time measurements of the dynamics of chemical reactions suchas adsorption/desorption, oxidation/reduction, etc., on metal and semiconductor surfaces
・Enables surface cleaning in the surface preparation chamber via Ar ion sputtering and heating up to1450 K
・LEED and AES equipment included for reconstructed surface and chemical composition observations
・Enables supply of gas molecules with different kinetic energies to the sample surface using a gas
dozer and supersonic molecular beam apparatus.
[Examples of application] Elucidation of graphene formation process, study of insulating ﬁlm
formation process on SiC surface, surface interface analysis for GaN-based power electronics
development, observation of chemical bonding state of hafnium silicide oxidation process, etc.

Soft X-ray photoelectron spectrometer・Photoelectron spectrometer that can also determine band structure via angle-resolved photoemission
spectroscopy (ARPES) measurements
・Enables detailed electronic structure measurement of rare earth and 3d transition metal compounds[Examples of application] Uranium compounds, rare earth compounds*Scanning Transmission X-ray microscope apparatus (STXM)

Newly registered device in 2023

・Element-selective chemical analysis tool with nanoscale spatial resolution
・Enables the two-dimensional mapping of the transmitted light (absorption) intensity by irradiating the sample with soft
X-rays focused to several tens of nanometers and scanning the sample
・A powerful method for analyzing ﬁne particle samples and samples with signiﬁcant heterogeneity
・Enables analysis of elemental distribution, and valence and chemical bonding states for a wide range of elements such as
lanthanides, actinides, 3d transition metal elements, and nitrogen and oxygen in organic compounds
・Light energy: 400‒1900 eV; best spatial resolution: 30 nm (when using 25nm FZP); sample temperature: 300 K

Role of Japan Atomic Energy Agency
The Japan Atomic Energy Agency (JAEA), a national researchand development agency, owns two dedicated beamlines at thelarge synchrotron radiation facility SPring-8 and is developing
synchrotron radiation utilization technology. Together with thehub institution, the University of Tokyo, and the spoke
institution, Hiroshima University, it forms a technical researchcalled “Materials that enable innovative energy conversion.” To
contribute to solving environmental problems such as carbon
neutrality, JAEA provides and supports microstructure analysis
and microfabrication technology, as well as an environment forutilizing data.

Using eight analyzers installed at the two dedicated beamlines
and a beamline owned by the National Institutes for Quantum
Science and Technology, JAEA contributes to the creation ofmaterials such as novel solar cells and power devices via
measurement methods such as the composition, electronic
state, crystal structure, interface structure, and local structureof materials. By employing high-intensity synchrotron radiation,
it can also obtain information of microsamples, uppermost
surfaces, interfaces, etc.

Technical consultation

Obtained data and results

Even if you have no experience with synchrotron radiation
experiments, please feel free to contact us for the possibility ofusing it. Consultation is free. For details, please visit JAEAʼs ARIM
in-charge desk or the dedicated website.

As a general rule, for theproposals supported bythis project, the obtained
experimental data will be
provided and also theresults will be published. If
you would like to keep
your results undisclosed,
JAEAʼs independent
project can support you
with that. For details,
please contact thein-charge desk.

In-charge desk JAEA Innovation Hub Open Innovation Promotion Division
renkei.shisetsu@jaea.go.jp〈Entire JAEA facility use system〉
https://tenkai.jaea.go.jp/facility/〈JAEA equipment use〉
https://tenkai.jaea.go.jp/facility/3-facility/05-support/index-141.html〈JAEA ARIM〉
https://arim.jaea.go.jp*Registered device for the ﬁscal year 2023. The photo on the cover presents STXM introduced from the ﬁscal year 2023.
There may be additions in the future. Please check the website (https://arim.jaea.go.jp) for the latest registered device.

BL22XU: JAEA Actinide Science I Beamline
Hard X-ray photoelectron spectrometer

Newly registered device in 2022

・Enables acquisition of bulk information by reducing the effect of surface contamination
・Effective for the electronic structure analysis of samples for which surface cleaning treatment is
difﬁcult and for devices with internal nanoscale multi-layer structures
・Excitation light energy (6, 8, and 10 keV) can be selected, and it is possible to select the detection
depth according to a speciﬁc purpose[Example of application] Damage analysis of radiation-resistant spin-driven thermoelectric devices

XAFS measuring system
・Enables XAFS measurement using high luminance and high energy X-rays from an undulator
・Handles time-resolved quick measurements (Quick-XAFS)・Detectors are of various types such as ion chambers, NaI scintillation, and Ge semiconductors
・Preparation of cryostat for low-temperature measurements[Examples of application] Structural and electronic-state analyses for functional moleculardesign, structural analysis, and electronic-state analysis for Rh (III) inducer development

The apparatus for imaging and measureing material stress・Enables internal strain and stress distribution primarily in metallic materials and imaging
measurement
・Enables actual environment in-situ measurement using a high-temperature (maximum 900 ℃) andload (maximum 5 kN) device
・Enables time-resolved measurement at a maximum speed of 200 Hz for strain and stress and2000 Hz for imaging by utilizing multiple two-dimensional detectors simultaneously[E xamples of application] Evaluation of stress, strain, and dislocation densit y during
deformation in metallic materials, observation of melting solidiﬁcation phenomenon during laser
processing, etc.

κ-type X-ray diffractometer・κ-type diffractometer suitable for surface structure analysis
・In addition to the standard six axes, it has a rotation axis in the horizontal plane for the entire
system・Enables the simultaneous measurement of electrochemical properties using a potentiostat
・Sample temperature is up to 10 K using a He circulation-type refrigerator and up to 1000 K
utilizing an electric furnace[Examples of application] Synthesis and microstructure analysis of barium titanate nanocubes

Only an outline is introduced below.

Usage ﬂow For details, please visit our website or contact the below-mentioned ofﬁce.
1. Call for proposals
To use the equipment registered with ARIM, please submit a proposal
application form. Every year, periodic calls for proposals for usage
will be made around May for the second half of the relevant ﬁscalyear (B term), and around November for the ﬁrst half of the nextﬁscal year (A term). Kindly consult with the person in charge of theequipment beforehand before applying for the proposal. The person
in charge will be introduced to you at the inquiry desk. There are also
proposals based on competitive funding for priority use. Proposals
that have results published will be reviewed by the JAEA-QST joint
proposal review committee, and the acceptance or rejection andusage time will be decided.

2. Submission of report

External Users
Consultation for use (free consultation at any time)
Independent project(non-disclosure of results)

The Advanced Research Infrastructure for Materials
and Nanotechnology in Japan (*open project)
Regular call for proposals(call for proposals in May and November)

General proposals

Priority use proposals

Proposal Review Committee

Priority use

Usage support/Usage report/Questionnaire responses

After implementing the proposal, please submit a usage report withthe implementation content by the speciﬁed date.
The SPring-8 report for each term will be published on the UI site twoweeks after the 60th day following the end of that term.
*The usage report will be published in the next ﬁscal year.

3. Publication of results
Within 3 years after the end of the implementation term (March 31, 2027 forexperiments in the 2023B term), please specify the SPring-8 and ARIM proposal numbers, publish the results of any of the following, and register online in theresearch results database (refer to SPring-8 User Information on the website).
① Peer-reviewed papers (including peer-reviewed proceedings and doctoraldissertations)② SPring-8/SACLA Research Reports③ Published technical reports approved by SPring-8/SACLA Results Review
Committee
Please submit the “Contact Form for Publication of Results„ with a reprint ofthe results published in paper presentations, etc., within two years after theend of the implementation ﬁscal year (JAEA).

Usage fees and others

1.Handling fees (tax included): 13,300 yen per proposal
2.Usage fees (tax included, per 8 h-shift)
No data provided - Basic fees: 19,082 yen; priority fees: 52,265 yen
Data submitted - Basic fees: 13,357 yen; priority fees: 36,585 yen*Prices may be revised depending on future circumstances.
For the latest information, please visit the dedicated website.

https://arim.jaea.go.jp
Access to SPring-8
Access by JR line and bus
・ Approximately 40 min by bus from Aioi Station on the Sanyo
Shinkansen/Sanyo Main Line・ About 130 min by bus from Kobe Sannomiya Bus Terminal*For bus schedule,
please refer to the QR code on the right.
Access by car・ Approximately 5 min from Harima-Shingu IC on the Harima
ExpresswayOﬃce of JAEA for The Advanced Research Infrastructure ofMaterials and Nanotechnology in Japan
1-1-1 Koto, Sayo-cho, Sayo-gun, Hyogo Prefecture 679-5148
Phone: 070-1456-9348 Fax: 0791-58-2620
E-mail: harima-usersofﬁce＠jaea.go.jp

Panoramic view of SPring-8/SACLA
Courtesy of RIKEN