Contents

1. Introduction・ ・ ・・・・・・・・・・・・・・・・・・・・・・・・・・・・・ 1
2. Staff List ・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・ 2
3. Instrument List ・・・・・・・・・・・・・・・・・・・・・・・・・・・・・・ 3
4. Summary of Instruments ・・・・・・・・・・・・・・・・・・・・・・・・・・ 5
5. Subscription journals ・・・・・・・・・・・・・・・・・・・・・・・・・・・ 19
6. CAC Usage Rules ・・・・・・・・・・・・・・・・・・・・・・・・・・・・ 20
7. Overtime Utilization ・・・・・・・・・・・・・・・・・・・・・・・・・・・・21
8. CAC Web System ・・・・・・・・・・・・・・・・・・・・・・・・・・・・22
9. Reservation Procedures ・・・・・・・・・・・・・・・・・・・・・・・・・・23
10. Intramural and extramural cooperation・ ・ ・・・・・・・・・・・・・・・・・27
11. Please from CAC・ ・・ ・・・・・・・・・・・・・・・・・・・・・・・・・28
12. Floor room・ ・・ ・ ・ ・・・・・・・・・・・・・・・・・・・・・・・・・29

1.Introduction
Material Analysis Center (MAC), the predecessor of Comprehensive Analysis Center (CAC), had been establishedin 1977 as an affiliated facility of The Institute of Scientific and Industrial Research (ISIR). CAC, with thereorganization of MAC integrating the former Electron Microscope Room, was established in 2009 as a common
comprehensive facility to support a wide range of basic and applied research fields in ISIR. CAC staffs consist of 1
associate and 2 assistant professors (as full-time professors), 6 technical staffs, 1 part-time staffs, 3 associate
professors (concurrent post), 2 assistant professors (concurrent post) and 1 director (concurrent post).
Fortunately, immediately after the renewal, CAC could update many of decrepit instruments to globally advanced
instruments by obtaining a supplementary budget in 2010 to be equipped with observation instruments including
component and surface analyzers, spectrometers and electron microscopes, shown in this booklet, to comprehendvarious research fields in ISIR. The instruments are maintained and managed by CAC staffs to allow users to utilize
at any time. CAC staffs support analyses by utilizing instruments required expertise and each researcher can utilize
easily operable instruments all day. Lectures for instrument users, including instrumental analysis lectures for new
students, is vigorously held every year. Fully utilize the instruments in CAC if you read this booklet and/or CAC
users' guide.
CAC is an ISIR-affiliated common facility and primarily positioned as a research support facility in ISIR.
Additionally, CAC enhances cooperation with collaborative research facility networks centering on Center for
Scientific Instrument Renovation and Manufacturing Support, Osaka University. CAC users consisting of intramuraland extramural researchers and Incubation Building-located company workers are currently increasing. CAC was
highly evaluated by external evaluations held in 2012 as "an open facility which is a model case in Japan and Osaka
University should be proud of".
All CAC staffs make further efforts to effectively utilize the expenditure to allow all users to give excellent
research results. The CAC full-time professors conduct their original research related to organic, organometallic andanalytical chemistry by fully utilizing instruments in CAC. Additionally, CAC staffs vigorously participate inopening CAC to the public (Icho Festival), tours for high school students and introduction activity of advanced
instruments and research.
CAC staffs would appreciate the understanding and cooperation of all users' for maintenance and development.

12.Staff List
Position

Name

Affilationoiwa
suzuki-tzhou
asano
mnishinogotoyyamashita
jinnai
hsieh

N209
205-1

matuzakihaneokamurakamitakehara
t-yamanaka*2）eguchi-n
cac-secretary302

Director

Akira Oiwa

Department of Quantum System Electronics

8405

Takeyuki Suzuki

Comprehensive Analysis Center (CAC)8525

Assistant Prof.

Dayang Zhou

Comprehensive Analysis Center (CAC)8526

Assistant Prof.

Kaori Asano

Comprehensive Analysis Center (CAC)8527

Associate Prof.

Mitsuko Nishino

Department of Biomolecular Science and Regulation

Associate Prof.

Tomoyo Goto

Department of Advanced Hard Materials

8548
8436

Assistant Prof.

Yasunobu yamashita

Department of Complex Molecular Chemistry

8471

Assistant Prof.

Seihou Jinnai

Department of Soft Nanomaterials

8476

Ming-Chun Hsieh

Comprehensive Analysis Center (CAC)

4295

Staff

Tsuyoshi Matsuzaki

Technical Division

8527

Staff

Hitoshi Haneoka

Technical Division

8526

Staff

Yosuke Murakami

Technical Division

8531

Staff

Tsunayoshi Takehara

Technical Division

8528

Staff

Takuya Yamanaka

Technical Division

6510

Staff

Nao Eguchi

Center for Scientific Instrument Renovation

4782

Assistant Administrative Staff

Satoko Wada

Comprehensive Analysis Center (CAC)

8529

*1 ）

@sanken.osaka-u.ac.jp

A.OiwaT. Suzuki

M.Nishino

T. GotoH. Haneoka

Y. Murakami

Room No

E-mailAssociate Prof.

project researcher*1）

Extension

Annex of Research Buildings

206
206
F341
S605
F527
F506
S115

206
S105
206
S506
I405
201

*2）
@office.osaka-u.ac.jp

D. Zhou

K. Asano

S. WadaY.Yamashita

S.Jinnai

T. Matsuzaki

T. Takehara

T. Ymanaka

2

N. Eguchi

M-C. Hsieh

3.Instrument List
Measurement

For Self Measurement

Method*2)

Staff

Installation Room*1)

Details

Overtime Utilization

Reservation

Special GuidanceModel (Maker) Name

Self

RequestInstrument Name

Avance Ⅲ -700 (BRUKER)

○

105

5

Avance Ⅲ -600 (BRUKER)

○

104

5

Nuclear Magnetic 600 MHz

ECA-600 (JEOL)○ ○ Required

106

6

400 MHz

ECS-400(JEOL)○ Required

F428

6

Y.Yamashita

400 MHz

ECS-400(JEOL)○ Required

F507

6

S. Jinnai

JMS-700(JEOL)○ Required

Available

Available

303

7

AccuTOF-DART(JEOL)○ Required

Available

Available

303

7

Ultraflex Ⅲ (BRUKER)○ Required

Available

Available

304

8

Negot
iable

304

8

LTQ Orbitrap XL(THERMO) ○304

9700 MHz
600 MHzResonance

Mass Spectrometer

Secondary Ion Mass
Spectrometer
Infrared Spectrophotometer

micrOTOF Ⅱ (BRUKER)

D. Zhou

Available

Available○ Required

Available

Available

304

9

M6(IONTOF)○ Required

Available

Available

102

10

FT/IR4100(JASCO)○ Required

Available

Available

302

10

○

Available

Available

302

11

Negot
iable

Ultraviolet-visible
Spectrophotometer

V-770(JASCO)○ Required

Available

Available

302

11

Polarimeter

P-2300(JASCO)○ Required

Available

Available

302

12

Circular Dichroism spectrometer

J-1500(JASCO)○ Required

Available

Available

302

12

Inductively Coupled Plasma
Spectrometer

ICPS-8100(SHIMADZU)○ Required

Available

Available

301

13

302
302

13
14

2400(PERKIN-ELMER)
CHN Element Analyzer○○

JM10(J-SCIENCS)

Differential Thermal Balance

TG8120(RIGAKU)○ Required

Available

Available

302

14

Differential Scanning Calorimeter

DSC8270(RIGAKU)○ Required

Available

Available

302

14

3

K. Asano

T. Matsuzaki

ITQ1100(THERMO)

React-IR45 (METTLER)

H. Haneoka

N. Eguchi

T. Suzuki

H. Haneoka

N. Eguch
H. Haneoka
T. Matsuzaki

T. TakeharaMeasurement

For Self Measurement

MethodStaff

Installation Room

Details

Overtime Utilization*2)

JXA-8800R(JEOL)○ ○ Required

Available

Available

102

15

N. Eguch

Scanning Electron Microscope

JSM-F100 (JEOL)○ ○ Required

Available

Available

S107

15

Y. Murakami
N. Eguch

Transmission Electron
Microscope

JEM-ARM200F(JEOL)

○

S104

16

JEM-2100(JEOL)○ ○ Required

Available

F192

16

M.Nishino
H. Yoshida
Y. Murakami

focused ion beam

FB-2100(JEOL)○

Available

S113－

Nanoscale Hybrid Microscope

VN-8010(Keyence)○ Required

Available

Available

S107－○ Required

Available

Available

101

17

H. Haneoka

Model (Maker) Name

X-ray Photoelectron Spectroscopy JPS-9010(JEOL)

Reservation

Special Guidance

Self

Request*1)

X-ray Microanalyzer

Instrument Name

Available

Y. Murakami*3 )X-ray Diffractometer

SmartLab(RIGAKU)○ ○ Required

Available

Available

101

17

T. Takehara

X-ray fluorescence

ZSX100e(RIGAKU)○ Required

Available

Available

101

18

T. GotoX-ray Diffractometer forSingle Crystals

XtaLAB PRO(RIGAKU)○ ○ Required

Available

Available

203

18

T. Takehara*1) “Overtime Utilization” means utilization of CAC expect 8:30-18:00 on weekdays.
(See p.21 for details)*2) See Floor Map (p.29)*3) We only accept particular maesurements.

44.Summary of Instruments

Nuclear Magnetic Resonance 700MHzNMRAVANCE III 700, NMR spectrometer of Bruker
BioSpin, is an advanced digital NMR device at thehigh level. Combination of cryoprobes enables
supersensitive NMR measurement. The spectrometer1
13
has supersensitive triple resonance probes for H, C
15
1
13
and N, which optimizes H and C nuclear
measurements, enables high sensitive and rapid 2Dand 3D measurements, and remarkably shortens
measurement time. The spectrometer has automatictuning/matching functions and enables fully
automatic measurement with rapid and highresolution by simultaneously using sample changers,which is applicable to the various fields including
pharmaceutics, biotechnology, chemistry, materialscience etc.

Nuclear Magnetic Resonance 600MHzNMR(solid)

AVANCE III 600WB, solid NMR spectrometerof Bruker BioSpin, has a wide bore magnet, whichenables measurement at -140 ～ +150°C.
Combination of 4mm CPMAS probes andsuperhigh speed rotary 1.3mm CPMAS probes
enables proton, multinuclear and 2D NMR
measurements difficult for conventional
spectrometers. The solid NMR spectrometer at thehigh level is applicable to the various fields
including material science, life science anddetermination of solid catalysts.

5

Nuclear Magnetic Resonance 600MHzNMR

JNM-ECA 600 (JEOL), is an FT-NMR
spectrometer using the advance digital technology
and high frequency. Automatic tuning andmatching enables gradient shim. The spectrometer
easily provides NMR spectra with highreproducibility and quality. The water signal
elimination and differential spectrum measurements
are also easily measurable. Low frequency probes
are also equipped. The spectrometer is applicable torhodium element and has an MICCS instrument
enabling reaction tracing measurement.

Nuclear Magnetic Resonance Spectrometer 400MHzNMR

Two high performance magnetic resonancespectrometers (JNM-ECS 400), have the spectrometer
originally equipped with auto-tuning probes whichenable to cleanly, quickly and easily measure various
NMR spectra. The spectrometers are equipped with dataprocessing software Delta which enables to easily andfreely process data. Users also can process NMR data
by using analytical software such as Delta, Net Aliceetc. through theirs PC in the ISIR.

6

Mass Spectrometer FAB-MS (JMS-700)

This JMS-700, developed by JEOL, is thereverse geometry (BE geometry) double-focusingmass spectrometer of the magnetic field preceding
type by which the ion optics system consists of amagnetic field and an electric field. That's the
successor model of forward geometry (EBgeometry) analyzer JMS-600H, and that can tune
parameters about condition automatically. Chemicalcomposition can be presumed because of its
good-sensitivity and high resolution.

Mass Spectrometer DART-MS

This mass spectrometer has a dedicated DART(Direct Analysis in Real Time) ion source attached
to a high-resolution time-of-flight mass
spectrometer. The DART ion source is a novel ion
source and applicable to samples under atmosphericpressure and at ground potential, which enables
contactless and rapid analysis. The spectrometer isapplicable to gases, liquids and solids.
Instantaneous measurability of samples without any
pre-treatments of the surface of the samples ischaracteristic of the spectrometer. The spectrometeris effective for screening and high-throughput
analysis.

7

Mass Spectrometer MALDI-MS

Ultraflex III, developed by BRUKER, hassmartbeam as a laser beam to largely enhancesensitivity and resolution. The focal point size
(10μm~80μm) of the laser is controllable by PC.
Applying minimal laser focuses to samples
enables to scan sample regions with very highpixel resolution, very high sensitivity and very
high resolution by MARDI imaging experimental
instrument. The spectrometer exhibits a wide mass
range of 1 - 500,000 and high resolution of
25,000 by using PAN (Panoramic) technology.

Mass Spectrometer CSI-MS

This spectrometer has a cryogenic ion source(CryoSpray) with micrOTOF II (mass accuracy: 1-2
ppm, mass resolution: 16,500 and measurable mass
range: 50~20,000 m/z), which enables
CryoSpray-TOF-MS measurement andmeasurement under cooled ionization conditions.
The spectrometer is suitable for samples withunstable at room temperature: organometallic
complexes, supramolecular complexes and reactive
intermediates etc.

8

Mass Spectrometer FT-MS

This hybrid electric field Fourier-transform mass
spectrometer (FT-MS) has Orbitrap and high speed
and high sensitive LTQ XL equipped with linear
ion trap. The spectrometer has high performanceswith high resolution (100,000 of resolution) andaccuracy (3 ppm), which enables not only structural
analysis of low molecules but also identification ofcomplicated proteins by multistep MS/MS.
Accelerating scanning speed and shortening a cycle
time enable a very short measurement time of a
few to 5 minutes per sample. ESI, APCI and APPI
ionizations are selectable and a wide range ofsamples is measurable at the highest level.

Mass Spectrometer GC-MS

A member of the Thermo Fisher ScientificTM
ITQ Series of GC-ion trap mass spectrometers,TMn
the ITQ 1100 GC/MS (measurable mass range:n10-1100 m/z) enables MS (MS/MS, n< 5). The
ITQ 1100 has new advanced scan-function of"ACE (Automated Collision Energy) and PQD(Pulsed Q Dissociation Mode)". The advantages of
its functions are easier to optimize analysis anddata quality is improved. It acquires full scan andnMS data in a single acquisition simultaneously.
ITQ 1100 restores the performance without venting
by using the standard vacuum probe interlock.

9Time of flight secondary ion mass spectrometer TOF-SIMS

TOF-SIMS irradiates the sample surface with anaccelerated ion beam and detects the generated
secondary ions with a time-of-flight mass
spectrometer. Unlike dynamic SIMS, TOF-SIMS
can perform surface analysis using pulsed ions.
Since this device is equipped with a spatter gun, it
is possible to perform depth direction analysis
while spattering materials. It is possible to obtain
MS spectra and depth profiles for all elements andmolecules. In addition, since it has excellent spatial
resolution compared to other surface analysis, it ispossible to analyze minute areas and perform MS
imaging.

Fourier Transformation Infrared Spectrophotometer FT-IR

This compact infrared spectrophotometer
Fourier-transforms interference waves by PC,
which has high sensitivity, stability and easy
operability and is suitable for routine analysis. The
spectrophotometer has ATR (Attenuated Total
Reflection) measuring instrument, which isapplicable to film and powder samples. The
spectrophotometer enables middle, near and far
infrared measurements, which afford infraredabsorption spectra from a wide range of both
inorganic and organic samples. Furthermore, thespectrophotometer is applicable to rapid scanningand imaging measurements, which enables toutilize for research and material development.

10

Infrared Spectrometer React IR

This spectrometer enables continuous
measurement for the shortest time of every 5
seconds, which continuously monitor various
changes in a solution by showing infrared spectra.
The spectrometer is effective for analysis ofreaction mechanisms due to identifiability ofreaction intermediates existing only duringchemical reactions and observability of theextinction rate of starting materials and theformation rate of products from changes of peakintensities.

Ultraviolet-visible Near Infrared Spectrophotometer UV･ Vis･NIR

This spectrophotometer enables continuous
measurements between ultraviolet and nearinfrared regions. The spectrophotometer has
automatically switchable detectors by measurement
wavelengths: a photomultiplier tube for theultraviolet and visible regions, and a PbS detector
for the near infrared region. Using an integrating
sphere enables diffuse reflection measurement ofsolid surfaces and diffuse transmission
measurement of suspension. Most of incident lightto the sample, reflected and/or transmitted in all
directions, is acquired by the integrating sphere,
which enables accurate measurement.

11

Polarimeter P-2300

This polarimeter has both sodium and mercury
lamps and a Glan-Taylor prism as a polarizer. The
measurement wavelength is selectable from 589,
578, 546, 436 and 365 nm. The polarimeter hasvarious types of cells, which enables to measuresamples of at least 100 μl. Highly accurate
measurement under temperature control by using
an air-cooling Peltier cell is also performable.

Circular Dichroism spectrometer J-1500 CD

CD (Circular Dichroism) spectrometer is suitable
not only in the ultraviolet and visible regions, butalso wide range of measurement wavelength fromvacuum ultraviolet to near infrared (163~1600nm)
which cover the chiral polymer, supramolecule,proteins and nucleic acids chemistry. Moreover, theCD measurement at the solid state is available withpowder CD measurement unit.

12Inductively Coupled Plasma Spectrometer ICPThis top-class ICP emission spectrometer has 2
sequential scanning spectrometers, which exhibits
both high resolution and high speed. Plasma energy
from the spectrometer excites component elements
in samples. The spectrometer measures emission
rays of the excited elements transiting to the lower
energy levels. The spectrometer enables a wide
range of highly accurate analyses including
ppb-level analysis of trace elements in a solution
and high concentration analysis such ascomposition analysis. Rapid simultaneousquantitative analysis of multiple elements is also
performable .

Organic Trace Element Analyzer CHN

Elemental analysis is a classical and important
quantitative analysis and purity test, which
determines a weight percentage of elementscomposing pure samples including organic
compounds by combustive and oxidative
decomposing the pure samples. The analysis ismainly applied to confirmation of synthetic
chemicals and determination of the structure ofnatural compounds. Stable and highly pure samples
afford highly accurately analytical values.
Measurable elements are carbon, hydrogen andnitrogen.

13

Element Analyzer EA

Elemental analysis is a classical and important
quantitative analysis and purity test, which
determines a weight percentage of elementscomposing pure samples including organic
compounds by combustive and oxidative
decomposing the pure samples. The analysis ismainly applied to confirmation of synthetic
chemicals. Measurable elements are carbon,hydrogen and nitrogen. Ash content is also
quantifiable.

Thermal Analyzer TG8120, DSC8270

Thermal analysis is variously applicable tocharacterization of substances, which easily affords
accurate analytical information from relatively small
amount of samples, which is essential for research
related to materials, polymers, petroleum products
andbiosubstances. Combination of the thermal analysis
with EPMA and PXD, installed in CAC, enables better
evaluation of solid materials. This differential thermalbalance TG8120/high temperature infrared heater
TG-DTA of Thermo plus EVO II/TG-DTA series,
developed by Rigaku, has a service temperature fromroom temperature to 1500°C and the maximum
temperature elevation rate of 1000°C /min. The
analyzer has a high temperature differential scanningcalorimeter DSC8270 and enables simultaneous
measurement of TG-DTA and DSC.

14

X-ray Microanalyzer EPMA

EPMA (Electron Probe Micro-Analyzer) finely
narrows generated electron beams from an W
electron gun to tens nanometers and accelerates thebeams to up to 40 kV to irradiate the surface ofsolid samples. Determination of elementscomposing the samples and quantitative analysis of
the samples are performable based on the
wavelength of characteristic X-rays generated fromthe samples. Mapping measurement indicating
element distribution states and line analysis are also
performable. The EPMA has measurability of B ～U, using 8 analyzing crystals and 4 detectors.
Measurability of cathode luminescence ischaracteristic of this EPMA.

Scanning electron microscope FE-SEM

The scanning electron microscope (JSM-F100)
can set the acceleration voltage of the electron
beam from 10V to 30kV, and can handle samples
that are vulnerable to heat damage and samples of
insulation. It also has an option to observe at alowervacuumthanusual.

In

addition,theperformance of elemental analysis using EDS has
been greatly improved. Since this JSM-F100 canacquire data while switching between observation
and analysis with a simple operation, it is possible
to analyze the sample surface efficiently.

15

Transmission Electron Microscope FE-TEM

This microscope is a Schottky emission electron gun
equipped with a ZrO/W emitter as a cathode, which
has higher brightness and a smaller electron source
than a thermionic electron gun and affords higher
current stability and larger probe current than a normal
field emission electron gun. Negative sphericalaberration coefficients obtained by an attachedspherical aberration corrector (Cs corrector) counteract
positive spherical aberration coefficients obtained by acondenser lens having a symmetrical axis of amagnetic field, which enables to acquire smaller andhigher intensity probes and to analyze elements withhigher resolution. Detecting electrons transmitted
through film samples acquires STEM images affording
scattering/absorption, diffraction and phase contrasts.

Transmission Electron Microscope ３ D-TEM

LaB6 electron gun-equipped transmission electron
microscope (200 kV) (JEM-2100) enables highresolution and high contrast observation, which issuitable for observation of biological samples. CCD
camera enables to photography TEM images as digital
data. High-tilt holder enables to set the tilt angle ofsamples to up to ±80°. TEM tomography systemenables to automatically acquire continuously tilted
images. 3D reconstruction of samples and visualizationof 3D structures are performable by PC.

16

X-ray Photoelectron Spectroscopy XPS・UPS

X-ray photoelectron spectroscopy (XPS), one of
the surface analysis instruments, is utilized for the
analysis of wide materials such as metal, asemiconductor, organics and ceramics.This method
supplies the chemical states of a wide range ofelements.About 6nm depth from the surface and2several cm area of the sample can be analyzed.Ion
etching enables a depth direction analysis.Ultraviolet
photoelectric spectroscopy (UPS) is also applicable.

X-ray Diffractometer XRD

This multipurpose diffractometer measures
scattered and diffracted X-rays generated from solid
samples by irradiating strong X-rays (45kV, 200mA,Cu), which exhibits remarkable effect on film
samples. The diffractometer is applicable toin-plane, film thickness, orientation, particle andvoid size distribution, and rocking curvemeasurements. Following guidance function allows
users including beginners to easily obtain data.
Choosing an incident X-ray source from Ge double
crystals or Ge quadruple crystals enables highresolution measurement. The diffractometer has ascintillation detector, a one-dimensional detector
enabling fast measurement within several minutes,
and ICDD (Ver2. 1102) .

17

Fluorescent X-ray Diffractometer

XRF

A vacuum tube (Rh) of 4kW used as an X-ray sourcein the XRF diffracts fluorescent X-rays generated fromsamples with 6 analyzing crystals (LiF, PET, Ge, RX-25,
RX-75 and TAP). Two detectors (scintillation counterand gas flow proportional counter) in the WDX enablehighly sensitive qualitative and quantitative analyses ofvarious elements (from B to U). The XRF corresponds
to powder, bulk and liquid samples. Continuous
measurement (turret-type measurement) enables
simultaneous measurement of up to 12 samples. The
XRF has SQX program performing semi-quantification
by FP method without standard samples throughqualitative analysis results, and EZ scanning mode toperform SQX analysis.

X-ray Diffractometer for Single Crystals SC-XRD

This single crystal X-ray structure analyzer isequippedwithhigh-intensityarotating

X-raysourceanti-cathode
and

a

type

1-photondetection type hybrid pixel detector. The X-ray
source can be selected from two sources, Mo and
Cu. The detector with zero noise and a wide
dynamic range can detect weak and strong
reflections at the same time with a high S/N, andalso enables high-speed shutterless measurement.
Not only for metal complexes and low molecularweight compounds, but also for protein crystals areapplicable.

18

5.Subscription Journals
CAC subscribes to the following journals. Data collections are also available. If you want to read them, pleasefeel free to ask CAC staffs.
Journals
1) Bunseki Kagaku 1952 ~2) Bunseki 1975 ~3) Advances in X-ray Chemical Analysis Japan 1974 ~2016

Videos for learning analysis [物 質 の科 学 ・有 機 構造 解 析 (Material Science and Organic Structural
Analysis), The Open University of Japan]

CAC Pamphlet, CAC Users' Guide

19

6.CAC Usage Rules
Please utilize the all instruments in CAC by following CAC usage rules.

・Opening Hours: 8:30 ~ 18:00 (except Saturdays, Sundays and national holidays)
・Utilization of CAC: Procedures under “CAC Web System” is required (p.22).
(Access to "CAC Web System" in a webpage of CAC.)
・Overtime Utilization: ISIR card is required for utilization of CAC after 17:30 on weekdays, andall days on Saturdays, Sundays and national holidays (p.21).
・No street shoes allowed (the entire building): Use dedicated slippers in footwear boxes in the entrance.
・No smoking: The entire building
・Reprinting: Published articles describing research results have to contain acknowledgements and thereprinted articles have to be submitted to CAC. →The articles are exhibited at the entrance of CAC.
(e.g.) We thank the members of the Comprehensive Analysis Center, ISIR, Osaka University, forspectral measurements, X-ray diffraction data, and microanalyses.

20

7.Overtime Utilization
ISIR card is required to utilize CAC during 18:00 to 8:30 on weekdays, and all days on Saturdays, Sundays
and national holidays.

1. ISIR-issued ISIR card (Figure 1) is required to enter andexit CAC and laboratories during overtime utilization. Be
sure to have the ISIR card.
2. Unlock/lock a door by holding the ISIR card (Figure 1)
over an electronic lock controller (Figure 2).
3. The electronic lock controller is contactless, which enables
to use the ISIR card even left in a wallet etc.
4. An electronic lock of a laboratory is automatically locked
after entering the laboratory. When leaving the laboratory,
unlock the electronic lock from the inside of the laboratory.

Figure 1

5. Left an opened door over 30 seconds sounds an alarm. The alarm is
stopped and the door is locked when the closed door is confirmed.
6. All electronic locks are unlocked when unexpected power failure
happens.
7. In emergency, uncover an emergency cover for the electronic lock of theinside of the entrance or open an emergency exit in every floor to exit.

Figure 221

8.CAC Web System
All instruments are required to access to "CAC Web System". Access to the system from the dedicated PC
near an instrument or a PC set in each laboratory. The procedure is as follows;
1) Click "CAC Web System" in a webpage (top page) of CAC. Choose the desired instrument shown in ascreen (Figure 3). Or you can enter directly from http://133.1.58.227/cacwebs/souti_list.php
2) Find your favorite instrument (Figure 4). The usage status is described in gray letters under the device name.
Unavailable operation is described using gray out. (Available now = available, Busy = used, Request Only =request analysis only, Maintenance = under maintenance)

U (blue icon): for starting or stopping the instruments
W (green icon): for waiting after finishing the measurements by others.
RS (red icon): for reserving your favorite time
RQ (yellow icon): for ordering the measurement by technical staff
3) Enter Email address and Password to login (Figure 5).

(Click "Create an account" if you use the system for the first time).
4) Choose your request from Use, Wait, Reserve or Request.
5) When finishing the input to the system, click Logout in the left side of the screen.
Note: The system is automatically disconnected by left no operation of the system over 30 minutes. Re-login tore-access to the system.

Figure 3

Figure 4

Figure 5229.Reservation Procedures
・ Self Measurement
1) After the login, click “U” button of the desired instrument (P.22, Figure 4, 5).
2) Choose the utilization time. Click "Start" button when starting measurement (Figure 6).
3) Click "Stop" button when you finish the measurement (Figure 7) Fund Code is used for choosing thepayment source for the measurements. Please confirm the code number to your supervisor. In thefollowing screen input the measurement information and comment if need (Figures 8, 9).
*If next user is waiting, please contact the next user by telephone.

Figure 6

Figure 7

Figure 8

Figure 923

If the instrument is in use
1) Click "W" button. After choosing a utilization time and again Click "Waiting" button (Figure 10).
※Don’t forget press the "start" button when you start measurement.

Figure 10
If you perform measurement on a specific date and time or long-time measurement at night.
1) Click "RS" button. After choosing a utilization time and again click "RESERVE" button (Figure 11).
※Performing "RESERVE" is available for a reservation after 3 hours or later from the present time.
※Perform "Waiting" for a reservation within 3 hours from the present time.

Figure 11

Notes on the reserve button and wait button
When the time comes for you to use the system, click the "U" button to start the system, and then clickthe "U" button again to stop the system when the time is up. If you want to cancel your reservation, clickon the "Reserve" button, and the "Cancel" button will appear in the field where you made yourreservation. If you leave the reservation without canceling it, you will be charged. If you have made areservation using the "Wait" button and have become the NextUser, please click the "U" button within 5
minutes to start. If you do not start within 5 minutes, your reservation will be voided and the next person
will become the NextUser.

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・ Request Measurement
Request measurement is available for special measurement methods and nuclides and/or users with noutilization experience.
1) After the login, click "RQ" of Request of the device used. (P.22, Figure 4, 5).
2) Enter information about a sample and click ”Request” (Figure 12).
3) A record with the information about the sample is created (Figure 13). Print out and submit the
1 record with a sample to a staff of the measurement.

Figure 12

切り取って試料容器に貼って下さい

NMR request

MS request
Figure 1325

切り取って試料容器に貼って下さい

Elemental Anal request

・ Other request Measurement
Utilization of transmission electron microscope is reservable from 10 am on every Thursdays in room 105 in
the 2nd Building.
*Utilizing JEM-ARM200F is not reservable by accessing to CAC Web System.
(a) Request Measurement
・ Please feel free to discuss measurement and preparation method for samples. Please come in Room 105(Sample Preparation Room) in the 2nd Building.
(b) Self Measurement
・ Fulfill the both following requirements; utilization experience of any electron microscopes and permission by
a CAC staff .
(c) Sample preparation
・ A lecture on the sample preparation is held if needed.

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10.Intramural and Extramural Cooperation
Collaborative Research Facility Network, former Effective Utilization Network for Chemistry Research Facility,
centering on Institute for Molecular Science, National Institutes of Natural Sciences in 2007, promotes
extramural cooperation. The network in the western Kinki region is positioned in Osaka University.
Assoc. Prof. Suzuki of CAC became the chairperson of the network of the western Kinki region since 2021.
See the following webpage for details.

Center for Scientific Instrument Renovation

http://www.reno.osaka-u.ac.jp/index.htm

A part of instruments in CAC is served for intramural and extramural cooperation by cooperating with Center
for Scientific Instrument Renovation. Center for Scientific Instrument Renovation, with the developmental
reorganization of Manufacturing Center, was established in the 1st of April, 2007. Fundamental instruments forresearch and education, with conventional supports of "manufacturing", research and education by
Manufacturing Center, are repaired, restored and reborn to promote "reuse promotion" with intramural
cooperation between staffs and students.

Collaborative Research Facility Network http://chem-eqnet.ims.ac.jp/index.html

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11.Pleas from CAC

Contributions to research in CAC have to be persuasively exhibited due to transforming Osaka University
into a national university corporation.
When articles describing research results acquired by using instruments in CAC are submitted, the articles haveto contain acknowledgements (See p.20 of CAC Users' Guide). Additionally, when the articles are printed andpublished, submit one reprint of each of the articles to CAC.
CAC annually publishes CAC Information with research results acquired by using the instruments in CAC. The
reprinted articles are exhibited at the entrance of the 1st floor of CAC. The articles have been favorably
received by not only CAC users but also CAC visitors including high school students.
CAC staffs wish furthermore developments of research of all users' by using the instruments in CAC

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12.Floor room29