AUTOMOTIVE CURRENT TRANSDUCER OPEN LOOP TECHNOLOGY
HAH1BVW S/11

Introduction

Principle of HAH1BVW Family

The HAH1BVW family is for the electronic measurement of DC,
AC or pulsed currents in high power and low voltage automotive
applications with galvanic separation between the primarycircuit (high power) and the secondary circuit (electronic circuit).

The open loop transducers uses a Hall effect integrated circuit.
The magnetic flux density B, contributing to the rise of the Hall
voltage, is generated by the primary current IP to be measured.

The HAH1BVW family gives you the choice of having different
current measuring ranges in the same housing.

The current to be measured IP is supplied by a current source
i.e. battery or generator (Figure 1).
Within the linear region of the hysteresis cycle, B is proportional
to:Features

B (IP) = a × IP
The Hall voltage is thus expressed by:
VH = (cH / d) × IH × a × IP●● Ratiometric transducer●● Open Loop transducer using the Hall effect●● Low voltage application●● Unipolar +5 V DC power supply●● Primary current measuring range ±1100 A●● Maximum RMS primary admissible current: defined bybusbar to have T < +150 °C●● Operating temperature range: −40 °C < T < 125 °C●● Output voltage: full ratio-metric (in sensitivity and offset).

Advantages

Except for IP, all terms of this equation are constant.
Therefore:
VH = b × IPaconstantb
constant
cH
Hall coefficientdthickness of the Hall plate
IH
current across the Hall plates
The measurement signal VH amplified to supply the user output
voltage or current.

●● Excellent accuracy●● Very good linearity●● Very low thermal offset drift●● Very low thermal sensitivity drift●● Galvanic separation●● Non intrusive solution.

Automotive application●● Battery Management.

Fig. 1: Principle of the open loop transducer.

N° 97.K6.61.011.0
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HAH1BVW S/11
Dimensions (in mm)

IP2D matrix bar code area

IP

Mechanical characteristics

Remark●● Plastic casePBT GF30●● Vout > Vo when IP flows in the positive direction (see arrowon drawing).

●● Magnetic core

FeSi wound core●● Mass57 g ±5 %●● Pins

Brass tin plated

System architecture (example)
LEM sensor

IP M

IPx2.

●● IP level

UC+5 V●● Mating connector type

TYCO connector P/N 1473672-1●● Assembly torque2.2 N.m ±5 %.

+5 V

C1

Primary
Current

Mounting recommendation

Typical application
Schematic interface

VoutC2CLRL

MagneticCore

Electronic schematic
CL< 100 nF EMC protection (optional)
RC Low pass filter (optional)

LEM sensor.
C+5VIP M

C1

Primary
current

Components list
Hall sensor ASIC

C1

Decoupling capacitor

100 nFC2

EMC protection capacitor

68 nF

A
Pin out

C2MagneticcoreAB

On board diagnostic

ICVoutBGND

CUC (5 V)D

not connected

RL > 10 kΩ. Resistor for signal line diagnostic (optional)
Vout

Open circuit
Short GND

Diagnostic
VIN ≤ 0.15 V
VIN ≤ 0.15 V

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Absolute ratings (not operating)Parameter

Specification

SymbolUnit

Maximum supply voltage

UC maxV

Maximum reverse supply voltage

UC maxV−14

Maximum output voltage

Vout max

V−1414

Maximum output current

Iout max

mA−10

10−40125Min

TypicalConditions

Max
14

Vout Reverse / Forward voltage

Ambient storage temperature

TS°C

Electrostatic discharge voltage (HBM)UESDkV

8

Maximum admissible vibration (random RMS)

γmax

m⋅s

96.6

10 to 2000 Hz, −40 °C to 125 °C

RMS voltage for AC insulation testUdkV2.550 Hz, 1 min

Creepage distance

dCpmm

4.85

Clearance

dCImm

4.85

Comparative traking index

CTI-2

PLC3

Operating characteristics in nominal range (IP N)
ParameterSpecification
Min TypicalMax
Electrical Data

SymbolUnit

Primary current, measuring range

IP M

A−11001100

Primary nominal RMS current

IP N

A−11001100

Supply voltage

UCV

4.5

Ambient operating temperature

TA°C

−40

Output voltage

VoutV

Vout = (UC/5) × (Vo + G × IP )Sensitivity

GmV/A

1.818

Offset voltage

VOV

2.5

mV

2.5

Output resolution
Output clamping high voltage

VS ZOutput clamping low voltage

VS Z55.5125@ TA = 25 °C@ UC = 5 V

4.74
0.26

Current consumption

ICmA

Load resistance

RLΚΩ

Output internal resistanceRoutΩConditions@ UC = 5 V@ TA = 25 °C, @ UC = 5 V

71010@ TA = 25 °C

110

Performance Data
Ratiometricity error

εr%Sensitivity error

εG%

±1

@ TA = 25 °C, @ UC = 5 V

Electrical offset voltage

VO E

mV±2.5@ TA = 25 °C, @ UC = 5 V

Magnetic offset voltage

VO M

mV±2Linearity error

εL%Average temperature coefficient of VO E

TCVO E AV

mV/°C±0.06

Average temperature coefficient of G

TCG AV%/°C±0.02

Step response time @ 90 %tr

msFrequency bandwidthBWHz

Peak-to-peak noise voltage

Vno ppmV

10Output RMS noise voltage

Vno

mV

1.6

Start-up timetstartms

1

Setting time after overloadtsms

10±0.2−1@ UC = 5 V, @ TA = 25 °C
1% of full scale@ UC = 5 V

1070@ −3 dB
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Overall accuracy XG

XG (mV)

Overall accuracy XG @ UC = 5 V (-40 °C ≤ TA ≤ 125 °C)

XG (A)
3360

2850

2340
1830
13208

10

30-1100

-550

0-2
1100

550

IP (A)IP (A)Overall accuracy XG specification
TA = 25 °C, UC = 5 V−40 °C ≤ TA ≤ 125 °C, UC = 5 V−110025 mV

13.75 A

1.25 %

55 mV

30.25 A

2.75 %

007 mV

3.85 A

0.35 %

10 mV

5.50 A

0.50 %

110025 mV

13.75 A

1.25 %55 mV

30.25 A

2.75 %

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HAH1BVW S/11
PERFORMANCES PARAMETERS DEFINITIONS

Response time (delay time) tr:

Primary current definition:

The time between the primary current signal (IP N) and theoutput signal reach at 90 % of its final value.

Vout

I [A]

Primary current nominal (IP N)
Primary current, measuring range (IP M)

IT90 %VoutIPtrIPDefinition of typical, minimum and maximum values:
Minimum and maximum values for specified limiting and safety
conditions have to be understood as such as values shown in“typical” graphs. On the other hand, measured values are partof a statistical distribution that can be specified by an intervalwith upper and lower limits and a probability for measured
values to lie within this interval. Unless otherwise stated(e.g. “100 % tested”), the LEM definition for such intervals
designated with “min” and “max” is that the probability forvalues of samples to lie in this interval is 99.73 %. For a normal(Gaussian) distribution, this corresponds to an interval between−3 sigma and +3 sigma. If “typical” values are not obviouslymean or average values, those values are defined to delimit
intervals with a probability of 68.27 %, corresponding to aninterval between −sigma and +sigma for a normal distribution.
Typical, minimum and maximum values are determined during
the initial characterization of a product.

Output noise voltage:t [µs]

Sensitivity:
The transducer’s sensitivity G is the slope of the straight line
Vout = f (IP), it must establish the relation:
Vout (IP) = UC/5 (G × IP + VO)

Offset with temperature:
The error of the offset in the operating temperature is thevariation of the offset in the temperature considered with theinitial offset at 25 °C.
The offset variation IO T is a maximum variation the offset in thetemperature range:
IO T = IO E max − IO E min

The output voltage noise is the result of the noise floor of theHall elements and the linear amplifier.

The offset drift TCIO E AV is the IO T value divided by thetemperature range.

Magnetic offset:

Sensitivity with temperature:

The magnetic offset is the consequence of an any current on
the primary side. It’s defined after a stated excursion of primarycurrent.

Linearity:
The maximum positive or negative discrepancy with a reference
straight line Vout = f (IP).
Unit: linearity (%) expressed with full scale of IP N.
Vout

The error of the sensitivity in the operating temperature is therelative variation of sensitivity with the temperature consideredwith the initial offset at 25 °C.
The sensitivity variation GT is the maximum variation (inppm or %) of the sensitivity in the temperature range:
GT = (Sensitivity max − Sensitivity min) / Sensitivity at 25 °C.
The sensitivity drift TCG AV is the GT value divided by thetemperature range. Deeper and detailed info available is ourLEM technical sales offices (www.lem.com).

Non linearity example

Offset voltage @ IP = 0 A:
The offset voltage is the output voltage when the primary current

Referencestraight lineis zero. The ideal value of VO is UC/2. So, the difference ofMax linearity error

IPLinearity variation in IP N

VO − UC/2 is called the total offset voltage error. This offset error
can be attributed to the electrical offset (due to the resolution of
the ASIC quiescent voltage trimming), the magnetic offset, thethermal drift and the thermal hysteresis. Deeper and detailed
info available is our LEM technical sales offices (www.lem.
com).

Environmental test specifications:
Refer to LEM GROUP test plan laboratory CO.11.11.515.0 with
“Tracking_Test Plan_Auto” sheet.
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HAH1BVW S/11
Environmental test specifications:
Refer to LEM GROUP test plan laboratory CO.11.11.515.0 with “Tracking_Test Plan_Auto” sheet.
NameStandard
CHARACTERIZATION @ 25 °C

Sensitivity / Accuracy / Overall accuracy

LEM 98.20.00.574.0

Offset / Electrical Offset / Magnetic Offset

LEM 98.20.00.573.0

Linearity error

LEM 98.20.00.370.0

Current Consumption

LEM 98.20.00.579.0

CHARACTERIZATION WITH T °C (initial)
Sensitivity / Accuracy / Overall accuracy

LEM 98.20.00.574.0

T °C variation of ... / Temperature Coefficient of G

LEM 98.20.00.574.0

Offset / Electrical Offset / Magnetic Offset

LEM 98.20.00.573.0

T °C variation of ... /Temperature Coefficient of Offset

LEM 98.20.00.573.0

Linearity error

LEM 98.20.00.370.0

Current Consumption

LEM 98.20.00.579.0

ELECTRICAL TESTS @ 25 °C
Dielectric withstand Voltage test

2500 V AC / 1 min / 50 Hz

Insulation resistance test

500 V DC, time = 60 s
RINS ≥ 500 MΩ Minimum

ENVIRONMENTAL TESTS (CLIMATIC)
Thermal shock

IEC 60068-2-14 Na (01/2009)

Steady state T °C Humidity bias life test

JESD 22-A101 (03/2009)

MECHANICAL TESTS
Vibration random in T °C

IEC 60068-2-64 (02/2008)

ShocksIEC 60068-2-27 (02/2008)

Free Fall (Device not packaged)

IEC 60068-2-31§5.2: method 1 (05/2008)

FINAL CHARACTERIZATION
Characterization @ 25 °C
Characterization with temperature

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LEM reserves the right to carry out modifications on its transducers, in order to improve them, without prior noticewww.lem.com