AUTOMOTIVE CURRENT TRANSDUCER OPEN LOOP TECHNOLOGY
HAH1BVW S/03

Introduction

Principle of HAH1BVW family

The HAH1BVW family is for the electronic measurement of DC,
AC or pulsed currents in high power and low voltage automotive
applications with galvanic separation between the primarycircuit (high power) and the secondary circuit (electronic circuit).

The open loop transducers uses a Hall effect integrated circuit.
The magnetic flux density B, contributing to the rise of the Hall
voltage, is generated by the primary current IP to be measured.
The current to be measured IP is supplied by a current source
i.e. battery or generator (Figure 1).
Within the linear region of the hysteresis cycle, B is proportionalto:

The HAH1BVW family gives you the choice of having different
current measuring ranges in the same housing.

Features

UHall = (cHall / d) × IHall × a × IP

● Ratiometric transducer● Open Loop transducer using the Hall effect● Low voltage application● Unipolar +5 V DC power supply● Primary current measuring range ±300 A● Maximum RMS primary admissible current: defined bybusbar to have T < +150 °C● Operating temperature range: −40 °C < T < 125 °C● Output voltage: full ratio-metric (in sensitivity and offset).

Advantages● Excellent accuracy● Very good linearity● Very low thermal offset drift

B (IP) = a × IP

The Hall voltage is thus expressed by:

Except for IP, all terms of this equation are constant.
Therefore:UHall = b × IPaconstantb

constant

cHall

Hall coefficient

dthickness of the Hall plate

IHall

current across Hall plates

The measurement signal UHall is amplified to supply the user
output voltage or current.

● Very low thermal sensitivity drift● Galvanic separation● Non intrusive solution.

Automotive application+ UCIPUout- UC● Battery Management.

Primary Current IP0V

Insulated Output Voltage Uout

Fig. 1: Principle of the open loop transducer.

N° 97.K6.46.003.0
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LEM International SA
Route du Nant-d’Avril, 152
1217 Meyrinwww.lem.com

HAH1BVW S/03
UL 508: Ratings and assumptions of certification
File # E189713 Volume: 2 Section: 13Standards● CSA C22.2 NO. 14-10 INDUSTRIAL CONTROL EQUIPMENT - Edition 11● UL 508 STANDARD FOR INDUSTRIAL CONTROL EQUIPMENT - Edition 18Ratings
Parameter

SymbolPrimary involved potential

Unit

Value

V AC/DC300

Max surrounding air temperature

TA°C

105

Primary current

IPA

0 - 500

Transducer supply

UCV DC

5Output voltage

Uout

V DC

0 to 5

Conditions of acceptability
When installed in the end-use equipment, consideration shall be given to the following:
1 - These products must be mounted in a suitable end-use enclosure
2 - The secondary circuit pin terminals have not been evaluated for field wiring
3 - Low voltage control circuit shall be supplied by an isolating source of supply
4 - These products shall be used in a pollution degree 2 environments or better
5 - Primary feeder of the devices shall be connected after an overvoltage device or system which has been evaluated by theStandard for Transient Voltage Surge Suppressors, UL 1449 with a maximum clamping voltage of 4 kV.
Marking
Only those products bearing the UL or UR Mark should be considered to be Listed or Recognized and covered under UL’s
Follow-Up Service. Always look for the Mark on the product.

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LEM reserves the right to carry out modifications on its transducers,in order to improve them.

LEM International SA
Route du Nant-d’Avril, 152
1217 Meyrinwww.lem.com

HAH1BVW S/03

Dimensions (in mm)

IP

IP

Mechanical characteristics

Remark● Plastic casePBT GF30● Uout > UO when IP flows in the positive direction (see arrowon drawing).

● Magnetic core

FeSi wound core

● Mass57 g ±5 %● PinsBrass tin plated● IP level

System architecture (example)
LEM sensor

IP M

IPx2

UC+5 V● Mating connector type

TYCO connector P/N 1473672-1● Assembly torque2.2 N٠m ±5 %.

+5 V

C1

Primary
Current

Mounting recommendation

Typical application
Schematic interface

Uout
C2

CLRL

Magnetic
Core

Electronic schematic
IPM

CL< 100 nF EMC protection (optional)
RC Low pass filter (optional)

Components list
IC

Hall sensor ASIC

C1

Decoupling capacitor

100 nF

EMC protectioncapacitor

On board diagnostic

C268 nF

RL > 10 kΩ. Resistor for signal line diagnostic (optional)
UoutDiagnostic

A

Uout

Open circuit

UIN ≤ 0.15 V

B

GND

Short GND

CUC (5 V)

UIN ≤ 0.15 VD

not connected

Pin outPage 3/7
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1217 Meyrinwww.lem.com

HAH1BVW S/03

Absolute ratings (not operating)Parameter

Specification

SymbolUnit

Maximum supply voltage

UC max

VMaximum supply voltage

UC maxV−14

Maximum output voltage

Uout max

V−1414Maximum output current

Iout max

mA−10

10Ambient storage temperature

TA st°C−40125

UESD HBMkV

8Maximum vibration (random RMS)

γmax

m٠s-2

96.6

10 to 2000 Hz, −40 °C to 125 °C

RMS voltage for AC insulation test

UdkV

2.5

50 Hz, 1 min

Creepage distance

dCpmm

4.85

Clearance

dCImm

4.85

Comparative tracking index

CTI

Electrostatic discharge voltage (HBM)Min

TypicalConditions

Max
14

Uout Reverse / Forward voltage

PLC3

Operating characteristics in nominal range (IP N)
Parameter

SymbolUnitMin

Specification
TypicalMax
300ConditionsElectrical Data
Primary current, measuring range

IP M

A−300

Primary nominal RMS current

IP NA−300

Supply voltage

UCV

4.5

Ambient operating temperature

TA°C

−40

Output voltage

UoutV

Uout = (UC/5) × (UO + S × IP )Sensitivity

SmV/A

6.667

Offset voltage

UOV

2.5

mV

2.5

Output resolution
Output clamping high voltage

US Z

Output clamping low voltage

US Z

300
55.5125@ TA = 25 °C@ UC = 5 V

4.74
0.26

Current consumption

ICmA

Load resistance

RLΚΩ

Output internal resistanceRoutΩ@ UC = 5 V@ TA = 25 °C, @ UC = 5 V

71010@ TA = 25 °C

110Performance Data
Ratiometricity error

εr%

±0.2

Sensitivity error

εS%

±1

@ TA = 25 °C, @ UC = 5 V

Electrical offset voltage

UO E

mV±2.5@ TA = 25 °C, @ UC = 5 V

Magnetic offset voltage

UO M

mV±2

@ UC = 5 V, @ TA = 25 °C

Linearity error

εL%

Average temperature coefficient of UO E

TCUO E AV

mV/°C−1±0.06

1Average temperature coefficient of S

TCS AV%/°C±0.02

Delay time to 90 % to the final output value for IP N step

tD 90

ms

Frequency bandwidthBWHz

Peak-to-peak noise voltage

Uno ppmV

10Output RMS noise voltage

UnomV

1.6

Start-up timetstartms

1

Settling time

tsms

10

% of full scale1070@ −3 dB
DC to 1 MHzPage 4/7
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HAH1BVW S/03

Total error εtot

Total error εtot @ UC = 5 V (-40 °C ≤ TA ≤ 125 °C)(mV) 50
454035302520151050-300

7(A)6543210-200-1000100200300

IP (A)IP (A)

Total Error εtot Specification
Typical values
Maximum values
TA = 25 °C, UC = 5 V−40 °C ≤ TA ≤ 125 °C, UC = 5 V

−300

25 mV

3.75 A

1.25 %

45 mV

6.75 A

2.25 %

007 mV

1.05 A

0.35 %

10 mV

1.50 A

0.50 %

30025 mV

3.75 A

1.25 %

45 mV

6.75 A

2.25 %

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LEM International SA
Route du Nant-d’Avril, 152
1217 Meyrinwww.lem.com

HAH1BVW S/03

PERFORMANCES PARAMETERS DEFINITIONSDelay time tD 90:

Primary current definition:

The time between the primary current signal (IP N) and theoutput signal reach at 90 % of its final value.
I [A]

Uout

Primary current nominal (IP N)
Primary current, measuring range (IP M)

IT90 %
Uout

IPtD 90

IPDefinition of typical, minimum and maximum values:
Minimum and maximum values for specified limiting and safety
conditions have to be understood as such as values shown in“typical” graphs. On the other hand, measured values are partof a statistical distribution that can be specified by an intervalwith upper and lower limits and a probability for measured
values to lie within this interval. Unless otherwise stated(e.g. “100 % tested”), the LEM definition for such intervals
designated with “min” and “max” is that the probability forvalues of samples to lie in this interval is 99.73 %. For a normal(Gaussian) distribution, this corresponds to an interval between−3 sigma and +3 sigma. If “typical” values are not obviouslymean or average values, those values are defined to delimit
intervals with a probability of 68.27 %, corresponding to aninterval between −sigma and +sigma for a normal distribution.
Typical, minimum and maximum values are determined during
the initial characterization of a product.

Output noise voltage:t [µs]

Sensitivity:
The transducer’s sensitivity S is the slope of the straight line
Uout = f (IP), it must establish the relation:
Uout (IP) = UC/5 (S × IP + UO)

Offset with temperature:
The error of the offset in the operating temperature is thevariation of the offset in the temperature considered with theinitial offset at 25 °C.
The offset variation IO T is a maximum variation the offset in thetemperature range:
IO T = IO E max − IO E min

The output voltage noise is the result of the noise floor of theHall elements and the linear amplifier.

The offset drift TCIO E AV is the IO T value divided by thetemperature range.

Magnetic offset:

Sensitivity with temperature:

The magnetic offset is the consequence of an any current on
the primary side. It’s defined after a stated excursion of primarycurrent.

Linearity:
The maximum positive or negative discrepancy with a reference
straight line Uout = f (IP).
Unit: linearity (%) expressed with full scale of IP N.
Uout

The error of the sensitivity in the operating temperature is therelative variation of sensitivity with the temperature consideredwith the initial offset at 25 °C.
The sensitivity variation ST is the maximum variation (inppm or %) of the sensitivity in the temperature range:
ST = (Sensitivity max − Sensitivity min) / Sensitivity at 25 °C.
The sensitivity drift TCS AV is the ST value divided by thetemperature range. Deeper and detailed info available is ourLEM technical sales offices (www.lem.com).

Non linearity example

Offset voltage @ IP = 0 A:
The offset voltage is the output voltage when the primary current

Referencestraight lineis zero. The ideal value of UO is UC/2. So, the difference ofMax linearity errorIPLinearity variation in IP N

UO − UC/2 is called the total offset voltage error. This offset error
can be attributed to the electrical offset (due to the resolution of
the ASIC quiescent voltage trimming), the magnetic offset, thethermal drift and the thermal hysteresis. Deeper and detailed
info available is our LEM technical sales offices (www.lem.
com).

Environmental test specifications:
Refer to LEM GROUP test plan laboratory CO.11.11.515.0 with
“Tracking_Test Plan_Auto” sheet.
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LEM reserves the right to carry out modifications on its transducers,in order to improve them.

LEM International SA
Route du Nant-d’Avril, 152
1217 Meyrinwww.lem.com

HAH1BVW S/03

Environmental test specifications:
Refer to LEM GROUP test plan laboratory CO.11.11.515.0 with “Tracking_Test Plan_Auto” sheet.
NameStandard
CHARACTERIZATION @ 25 °C

Sensitivity / error / Total error

LEM 98.20.00.574.0

Offset / Electrical Offset / Magnetic Offset

LEM 98.20.00.573.0

Linearity error

LEM 98.20.00.370.0

Current Consumption

LEM 98.20.00.579.0

CHARACTERIZATION WITH T °C (initial)
Sensitivity / error / Total error

LEM 98.20.00.574.0

T °C variation of ... / Temperature Coefficient of S

LEM 98.20.00.574.0

Offset / Electrical Offset / Magnetic Offset

LEM 98.20.00.573.0

T °C variation of ... /Temperature Coefficient of Offset

LEM 98.20.00.573.0

Linearity error

LEM 98.20.00.370.0

Current Consumption

LEM 98.20.00.579.0

ELECTRICAL TESTS @ 25 °C
Dielectric withstand Voltage test

2500 V AC / 1 min / 50 Hz

Insulation resistance test

500 V DC, time = 60 s
RINS ≥ 500 MΩ Minimum

ENVIRONMENTAL TESTS (CLIMATIC)
Thermal shock

IEC 60068-2-14 Na (01/2009)

Steady state T °C Humidity bias life test

JESD 22-A101 (03/2009)

MECHANICAL TESTS
Vibration random in T °C

IEC 60068-2-64 (02/2008)

ShocksIEC 60068-2-27 (02/2008)

Free Fall (Device not packaged)

IEC 60068-2-31§5.2: method 1 (05/2008)

FINAL CHARACTERIZATION
Characterization @ 25 °C
Characterization with temperature

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4March2024/Version 4

LEM reserves the right to carry out modifications on its transducers,in order to improve them.

LEM International SA
Route du Nant-d’Avril, 152
1217 Meyrinwww.lem.com