11沼津工業高等専門学校研究報告
第 57 号，2023 年 2 月

࣋ࢡࢺࣝࣅ࣮࣒ࢆ⏝࠸ࡓ」ᒅᢡィ⿦⨨ࡢᵓ⠏ⰱ⃝⛸ஓ 㸪኱ஂಖ㐍ஓ Construction of Birefringence Measurement System Using Vector Beam
ASHIZAWA Ryoya*1 and OHKUBO Shinya*2
Abstract: Generally, in birefringence measurement, it takes a long time to measure because
the polarizing element is mechanically rotated. In this study, a single-shot birefringencemeasurement system is constructed for purpose of shortening the birefringence measurement
time. As a result, it has become possible to measure birefringence quantitatively in real time orat high speed. This enables more efficient development of optical material products developed
using birefringence measurement.
Key Words:Polarization, Birefringence, Vector Beam                  䠍䠊䛿䛨䜑䛻଴ ൌ ൦ ଵ ൪            (1)ଶଷ」ᒅᢡィ ࡣ㸪ගᏛᮦᩱࡢගᏛ␗᪉ᛶࢆᐃ㔞ⓗ࡟ᚓࡿࡓࡵࡢ㔜せ࡞ᡭἲ࡛࠶ࡿ㸬ࡇࢀ࡟ࡼࡾ㸪ࢹ࢕ࢫࣉࣞ࢖⏝ࡢගᏛ࢞ࣛࢫࡸࣇ࢕࣒ࣝࡢホ౯ࢆ⾜࠺ࡇ࡜࡛〇ရࡢရ㉁ྥୖ࡟ࡘ࡞ࡀ

ࡇࡇ࡛㸪଴ ࡣගᙉᗘ㸪ଵ ࡣỈᖹᆶ┤┤⥺೫ගᡂศ㸪ଶ ࡣsᅇ㌿఩┦Ꮚἲࡀ⏝࠸ࡽࢀࡿࡀ㸪೫ග⣲ᏊࢆᶵᲔⓗ࡟ᅇ㌿ࡉࡏ45r┤⥺೫ගᡂศ㸪ଷ ࡣᕥྑ෇೫ගᡂศࢆࡑࢀࡒࢀ♧ࡍ㸬ࡿࡓࡵィ ࡟᫬㛫ࡀ᥃࠿ࡿ㸬ࡑࡇ࡛ᮏ◊✲࡛ࡣ㸪ᐇ᫬㛫࠶ࡿ㸰㸬㸰 」ᒅᢡ

ࡿ㸬ࡋ࠿ࡋ࡞ࡀࡽ㸪୍⯡ⓗ࡟」ᒅᢡィ ࡟ࡣᅇ㌿೫ගᏊἲࡸ

࠸ࡣ㧗㏿࡛」ᒅᢡࢆᐃ㔞ⓗ࡟ィ ࡍࡿࡓࡵࡢ㸪࣋ࢡࢺࣝࣅ࣮

Fig.1 ࡟」ᒅᢡ⌧㇟࡟ࡘ࠸࡚♧ࡍ㸬࣒ࢆ⏝࠸ࡓ」ᒅᢡィ ⿦⨨ࡢᵓ⠏ࢆ┠ⓗ࡜ࡍࡿ㸬䠎䠊೫ග䛸」ᒅᢡ
㸰㸬㸯 ೫ගගࡣ㟁☢Ἴࡢ୍✀࡛㸪㐍⾜᪉ྥ࡟ᑐࡋ࡚ᆶ┤࡞᪉ྥ࡟᣺ື
ࡍࡿᶓἼ࡛࠶ࡿ. ኴ㝧ࡸ㟁⌫࠿ࡽᨺฟࡉࢀࡿ⮬↛ගࡣ㸪㐍⾜᪉ྥ࡜ᆶ┤࡞㠃࡟ᑐࡋ࡚ 360r࠶ࡽࡺࡿ᪉ྥ࡟᣺ືࡋ࡚࠸ࡿ.

Fig. 1 Birefringenceࡘࡲࡾග㍈࿘ࡾࡢ࠶ࡽࡺࡿ᪉ྥ࡟᣺ື㠃ࢆᣢࡗ࡚࠸ࡿ㸬ࡇࢀ࡟ᑐࡋ㸪᣺ື㠃ࡀ୍ࡘࡔࡅ࡛࠶ࡿࡓࡵ≉ᐃࡢ୍᪉ྥ࡟ࡋ࠿᣺
ືࡋ࡞࠸ගࢆ೫ග࡜࠸࠺. ගࡢ೫ග≧ែ࡟ࡼࡗ࡚┤⥺೫ගࡸ෇೫ග࡜࿧ࡤࢀࡿ㸬⮬↛ගࢆ┤⥺೫ග࡟ኚ᥮ࡍࡿ⣲Ꮚࡢࡇ࡜ࢆ೫ගᏊ࡜࿧ࡧ㸪ࡉࡽ࡟┤⥺೫ග࡟ 1/4 Ἴ㛗ᯈࢆ㏱㐣ࡉࡏࡿࡇ࡜࡛㸪෇೫ග࡬ࡢኚ᥮ࢆྍ⬟࡟ࡍࡿ㸬ࡇࡢࡼ࠺࡞೫ග≧ែࢆ┤ឤⓗ࡟⾲⌧ࡍࡿ᪉ἲࡢ୍ࡘ࡟ࢫࢺ࣮ࢡࢫࣃ࣓࣮ࣛࢱࡀ࠶
ࡿ. ࡇࢀࡣ㸪ගᙉᗘ࠾ࡼࡧྛ೫ගᡂศࢆḟࡢࡼ࠺࡟ 4 ࡘ 1 ⤌೫ගࡀ┤஺᪉ྥ࡛ᒅᢡ⋡ࡢ␗࡞ࡿ፹㉁࡟ධᑕࡉࢀࡓ࡜ࡁ㸪┤஺᪉ྥࡢග࣋ࢡࢺࣝ࡟఩┦ᕪࡀ⏕ࡌࡿࡇ࡜࡛ฟᑕࡋࡓ೫ග
ࡢ≧ែࡀኚ໬ࡍࡿ㸬ࡇࡢࡼ࠺࡞፹㉁ࢆ」ᒅᢡᛶ፹㉁࡜࠸࠸㸪⤖ᬗࡸ㧗ศᏊ㸪㧗ᙎᛶ࢞ࣛࢫ࡞࡝ࡀࡇࢀ࡟┦ᙜࡍࡿ㸬ࡇࡢሙྜ࡟㉳ࡇࡿ఩┦ᕪࡢࡇ࡜ࢆ」ᒅᢡ఩┦ᕪ࡜࿧ࡪ㸬ࡲࡓ㸪ගࡀ᭱ࡶ㏿ࡃ㐍ࡴ᪉఩ࢆ㐍┦㍈࠶ࡿ࠸ࡣ୺㍈᪉఩࡜࠸࠸㸪᭱ࡶ㐜ࡃ㐍ࡴ㐜┦㍈࡜ࡣᖖ࡟┤஺㛵ಀ࡟࠶ࡿ㸬ᡃࠎࡣ㸪ࡇࡢࡼ࠺࡞」ᒅᢡࢆᐃ㔞ⓗ࡟ィ ࡍࡿࢩࢫࢸ࣒ࢆ◊✲㛤Ⓨࡋ࡚࠸ࡿ㸬࡛⾲♧ࡍࡿࡶࡢ࡛࠶ࡿ.
̿̿̿̿̿̿̿̿̿̿̿̿̿̿̿̿̿̿̿̿̿̿̿̿̿*1 ᑓᨷ⛉㸸Advanced Engineering Course䠏䠊」ᒅᢡィ ἲ*2 ไᚚ᝟ሗᕤᏛ⛉㸸Department of Control & ComputerEngineering㸱㸬㸯 ᚑ᮶ࡢ」ᒅᢡィ ἲ࡟࠾ࡅࡿၥ㢟Ⅼ」ᒅᢡィ ἲ࡟ࡣᅇ㌿೫ගᏊἲ㸪ᅇ㌿఩┦Ꮚἲ㸪ࢭࢼࣝࣔ

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沼津工業高等専門学校研究報告ࣥἲ࡞࡝ࡀ࠶ࡿ[1,2]㸬࠸ࡎࢀࡢ᪉ἲࡶගᏛ⣲ᏊࢆᶵᲔⓗ࠶ࡿ

第 57 号Fig.4 ࡟ࡑࢀࡒࢀ♧ࡍ㸬࠸ࡣ㟁Ẽⓗ࡟೫ගኚㄪࡉࡏࡿࡇ࡜࡛ヨᩱࡢ」ᒅᢡ఩┦ᕪ࡜୺㍈᪉఩ࢆᐃ㔞ィ ࡛ࡁࡿ㸬ࡋ࠿ࡋ࡞ࡀࡽ㸪ィ ࡟᫬㛫ࡀ᥃࠿ࡿࡓࡵ㸪㧗㏿࡛ィ ࡍࡿᚲせࡀ࠶ࡿ࢞ࣛࢫࡸගᏛⷧ⭷ࡢရ㉁᳨ᰝ࡟ࡣྥ࠿࡞࠸㸬ࡑࡇ࡛ᮏ◊✲࡛ࡣ㸪ࡇࢀࢆゎᾘࡍࡿᡭἲ࡜ࡋ࡚㸪ᅇ㌿఩┦Ꮚἲࡢཎ⌮ࢆᇶ࡜ࡋࡓ」ᒅᢡ⿦⨨ࡢᵓ⠏ࢆ⾜࠺㸬㸱㸬㸰 ᅇ㌿఩┦Ꮚἲࡢཎ⌮ᮏ◊✲࡛ᥦ᱌ࡍࡿᡭἲࡢཎ⌮࡜࡞ࡿᅇ㌿఩┦Ꮚἲ࡜ࡣ㸪఩

Fig. 3 Retardation (Δ) result of BSC┦Ꮚ㸦Ἴ㛗ᯈ㸧ȟࢆᶵᲔⓗ࡟ᅇ㌿ࡉࡏ࡞ࡀࡽගᙉᗘኚ໬ࢆ᳨

ฟࡍࡿ᪉ἲ࡛࠶ࡿ㸬Fig.2 ࡟ᅇ㌿఩┦Ꮚἲࡢィ ⿦⨨ࢆ♧ࡍ㸬

Fig. 4 Azimuth angle (Ԅ) result of QWP

Fig. 2 Rotational retarder method
ග※ S ࠿ࡽࡢ┤⥺೫ගࡣ஘ ࢆ㏻㐣ࡋࡓᚋ࡟」ᒅᢡᛶヨᩱ οǡம ࢆ㏻㐣ᚋ㸪᪉఩ 45°ࡢ 1/4 Ἴ㛗ᯈସହ ࠾ࡼࡧ᪉఩ 90°ࡢ೫ගᏊଽ଴ ࢆ㏻㐣ᚋ㸪᳨ฟჾ PD ࡟ࡼࡾග㟁ኚ᥮ࡉࢀࡿ㸬஘ ࢆᅇࡇࡢ⤖ᯝ㸪఩┦ᕪࡣ 0㹼180r㸪୺㍈ࡣ-90㹼+90rࡢィࣞࣥࢪࡀ࠶ࡿࡇ࡜ࡀࢃ࠿ࡗࡓ㸬ࡋ࠿ࡋ࡞ࡀࡽ㸪ȟࢆࢫࢸࢵࣆࣥࢢ࣮ࣔࢱ࡟ࡼࡾᶵᲔⓗ࡟ᅇ㌿ࡍࡿࡓࡵ᫬㛫ࡀ᥃࠿ࡾ㸪ィ㌿ࡉࡏࡿࡇ࡜࡛ኚ໬ࡍࡿගᙉᗘ‫ܫ‬ሺߠሻࡣ㸪ྛගᏛ⣲Ꮚࡢ࣑࣮ࣗ࡟ࡣ㸯㹼㸰ศ⛬ᗘࡢ᫬㛫ࢆせࡋࡓ㸬ࡑࡢࡓࡵ㸪ィ ᫬㛫ࡢ▷࣮ࣛ⾜ิࢆ⏝࠸࡚ࢫࢺ࣮ࢡࢫࣃ࣓࣮ࣛࢱࢆ⟬ฟࡍࡿࡇ࡜࡟ࡼ⦰໬ࡀᮃࡲࢀࡿ㸬ࡑࡇ࡛ᮏ◊✲࡛ࡣ㸪ࡇࡢཎ⌮࡟ᇶ࡙ࡁ㸪ヨᩱ࡬ࡢධᑕග࡟

ࡾḟࡢࡼ࠺࡟࡞ࡿ㸬‫ܫ‬ሺߠሻ ൌ࣋ࢡࢺࣝࣅ࣮࣒ࢆ⏝࠸ࡓ」ᒅᢡィ ⿦⨨ࢆ᪂ࡓ࡟ᵓ⠏ࡍࡿ㸬ͳሼͳ ൅  ߂ cosଶ ߠ  ʹ߶ሽͶെ  ߂  ʹߠ  ʹߠ  ߶ ൅  ߂  ʹߠ    (2)䠐䠊䝧䜽䝖䝹䝡䞊䝮䜢⏝䛔䛯」ᒅᢡィ ⿦⨨ࡇࡢගᙉᗘኚ໬ࢆࣇ࣮࢚ࣜኚ᥮ࡍࡿࡇ࡜࡛ᚓࡽࢀࡿࣇ࣮ࣜ
࢚ಀᩘࡣḟࡢࡼ࠺࡟࡞ࡿ㸬ͳܽସ ൌ  ߂  ʹ߶ͺܾଶ ൌͳ ߂Ͷ㸲㸬㸯 ㍈ᑐ⛠࡞࿘ᮇ೫ගศᕸࢆ⏝࠸ࡓィᮏ◊✲࡛ࡣ㸪ヨᩱ࡬ࡢධᑕග࡟࣋ࢡࢺࣝࣅ࣮࣒ࢆ⏝࠸ࡓ」ᒅᢡィ ⿦⨨ࢆᵓ⠏ࡍࡿ㸬Fig.5 ࡟⿦⨨ᵓᡂࢆ♧ࡍ㸬(3)ͳܾସ ൌ െ  ߂  ʹ߶ͺࡇࢀࡽࡼࡾ㸪୺㍈᪉఩߶࡜」ᒅᢡ఩┦ᕪ߂ࡣḟࡢࡼ࠺࡟⟬ฟࡉࢀࡿ㸬ͳܽସ߶ ൌ tanିଵ ൬െ ൰ܾସʹ߂ ൌ tanିଵ ൬െʹܾସ൰ܾଶ ‫ ڄ‬ሺʹ߶ሻ

(4)Fig. 5 Single-Shot Birefringence Measuring System(5)ᮏ◊✲࡛ᵓ⠏ࡍࡿ⿦⨨࡜ࡢẚ㍑ࡢࡓࡵ࡟㸪ࡇࡢᅇ㌿఩┦Ꮚἲࢆ⏝࠸㸪ᶆ‽ヨᩱ࡜ࡋ࡚௵ពࡢ」ᒅᢡࢆ୚࠼ࡿࡇ࡜ࡀ࡛ࡁ

ඛ࡯࡝ࡢᅇ㌿఩┦Ꮚࢆ㸪ࣅ࣮࣒ᚄෆ࡟ศᕸࡍࡿ㍈ᑐ⛠࡞࿘ᮇ೫ගศᕸࢆᣢࡘ࣋ࢡࢺࣝࣅ࣮࣒࡟⨨ࡁ᥮࠼㸪ࡑࡢศᕸࢆCMOS ࣓࡛࢝ࣛ᧜ീࡋࢥࣥࣆ࣮ࣗࢱゎᯒࡍࡿࡇ࡜࡛」ᒅᢡ
1/2 Ἴ㛗

ࡿࣂࣅࢿ-ࢯࣞ࢖ࣘ⿵ൾᏊ㸦BSC㸧ࡢ߂࡜㸪1/4 Ἴ㛗ᯈ㸦QWP㸧ィ ࢆ⾜࠺[3-6]㸬ᮏ◊✲࡛ࡣ㸪఩┦Ꮚࢆ㸰ᯛࡢගࡢ߶ࢆィ ࡋࡓ㸬߂ࡢィ ⤖ᯝࢆ Fig.3 ࡟㸪߶ࡢィ ⤖ᯝࢆᯈ㸦V-HWP㸧࡛ᣳࡳ㎸ࡴࡇ࡜࡛㸪Fig.6 ࡢࡼ࠺࡞࣋ࢡࢺࣝࣅ

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ベクトルビームを用いた複屈折計測装置の構築

r=250[pix.]ࡢ෇࿘ࡢගᙉᗘࢹ࣮ࢱࢆᢳฟࡋ㸪ࡇࢀࢆᶓ㍈࡟୰࣮࣒ࡢⓎ⏕ࢆヨࡳࡿ㸬ᚰゅȟ㸪⦪㍈࡟ගᙉᗘ‫ܫ‬ሺߠሻࡢࢢࣛࣇ࡜ࡋ࡚ᗙᶆኚ᥮ࡍࡿ࡜
Fig.9 ࡢࡼ࠺࡟࡞ࡿ㸬Fig.6 Vector beam౑⏝ࡍࡿ V-HWP ࡣ㸪఩┦ᕪࢆ 180r୚࠼ࡘࡘ㸪୺㍈᪉఩
ศᕸࡀ෇࿘᪉ྥ࡟୍ᐃ㛫㝸࡛ኚ໬ࡍࡿࡓࡵ㸪┤஺ࡍࡿ೫ගᏊࡢ㛫࡟ᣳࡴ࡜෇࿘᪉ྥ࡟ගᙉᗘࡀ࿘ᮇⓗ࡟ኚ໬ࡍࡿ㸬㸰ᯛࡢV-HWP ࡢ㛫࡟଴ ࢆᣳࡳ㸪ࡑࡇ࡟Ỉᖹ┤⥺೫ගࢆධᑕࡍࡿ࡜㸪ฟᑕࡍࡿගࡢ೫ග≧ែࡣࡇࡢࡼ࠺࡟෇࿘᪉ྥ࡟࿘ᮇⓗ࡟㸪┤⥺㸪ᴃ෇㸪෇ࢆ⧞ࡾ㏉ࡍ࣋ࢡࢺࣝࣅ࣮࣒࡜࡞ࡿ㸬ࡇࢀࡣᅇ㌿఩┦Ꮚἲ࡟࠾ࡅࡿ㸪఩┦ᏊࡢᶵᲔⓗ࡞ᅇ㌿࡛㉳ࡇࡿ೫ගኚ໬࡜඲ࡃྠࡌ≧ែ࡜࡞ࡿ㸬఩┦ᕪ࠾ࡼࡧ୺㍈ࢆኚ໬ࡉࡏࡓ࡜ࡁ

ࡢ㸪෇࿘᪉ྥࡢගᙉᗘศᕸ࠿ࡽ」ᒅᢡࡀ⟬ฟ࡛ࡁࡿ࠿࡝࠺࠿㸪Fig.9 Coordinate transformation of light intensity
distributionィ ཎ⌮࡜ࡋ࡚ࡣᅇ㌿఩┦Ꮚἲ࡜ྠࡌ࡞ࡢ࡛㸪ࢹ࣮ࢱࢆࣇ
࣮࢚ࣜኚ᥮ࡋ㸪ᚓࡽࢀࡓྛࣇ࣮࢚ࣜಀᩘ࠿ࡽ㸪ᘧ(4)㸪(5)ࢆ⏝࠸࡚ヨᩱࡢ߂࡜߶ࢆ⟬ฟࡍࡿ㸬ࡇࡢࡼ࠺࡞⏬ീྲྀᚓ࠿ࡽἼᙧࡢ
ゎᯒ㸪࠾ࡼࡧ」ᒅᢡࡢ⟬ฟ࡞࡝ࢆ୍ᣓ࡛⾜࠺ࡓࡵ㸪ィ ࠾ࡼࡧ⏬ീฎ⌮ࢯࣇࢺ࢙࢘࢔ࢆసᡂࡋࡓ㸬సᡂࡋࡓィ ࢯࣇࢺ࢙࢘࢔ࢆ Fig.10 ࡟♧ࡍ㸬ࢩ࣑࣮ࣗࣞࢩࣙࣥࡋࡓ⤖ᯝࢆ Fig.7 ࡟♧ࡍ㸬(a) Δ=0[deg.](b) Δ=90[deg.]Fig.7 Simulation of retardationࡇࡢ⤖ᯝ㸪ᚑ᮶ࡢᅇ㌿఩┦Ꮚἲ࡜ྠࡌ⤖ᯝ࡜࡞ࡗࡓ㸬௨ୖ㸪᪂ࡓ࡟ᵓ⠏ࡋࡓ」ᒅᢡィ ගᏛ⣔ࢆ Fig.8 ࡟♧ࡍ㸬Fig.10 Measurement software௨ୖ࡛ᵓ⠏ࡋࡓ⿦⨨࡟ࡼࡾ㸪ᐇ㝿࡟」ᒅᢡィ ࢆ⾜࠸㸪ᚑ᮶ࡢᅇ㌿఩┦Ꮚἲ࡟ࡼࡿィ ࡜ࡢẚ㍑ࢆ⾜ࡗࡓ㸬㸲㸬㸰 ᐇ㦂࠾ࡼࡧ⪃ᐹᅇ㌿఩┦Ꮚἲ࡜ྠᵝ࡟㸪BSC ࢆ⏝࠸ࡓ߂ࡢィ ⤖ᯝ࡜㸪
QWP ࢆ⏝࠸ࡓ߶ࡢィ ⤖ᯝࢆ Fig.11 ࡜ Fig.12 ࡟ࡑࢀࡒࢀ♧ࡍ㸬

Fig.8 Optical setupࢩࣥࢢࣝࢩࣙࢵࢺ」ᒅᢡ⿦⨨ࡢὶࢀ࡜ࡋ࡚ࡣ㸪ࡲࡎヨᩱ࡟࣋ࢡࢺࣝࣅ࣮࣒ࢆ↷ᑕࡋ㸪㏱㐣ࡋࡓࣅ࣮࣒ࢫ࣏ࢵࢺ㠃ෆࡢᙉᗘศᕸࢆ㧗⢭⣽ CMOS ࣓࢝ࣛ࡟ࡼࡾ᧜ീࡍࡿ㸬ᚓࡽࢀࡓග
ᙉᗘศᕸࡢ⏬ീࢆಖᏑࡋࡓᚋ㸪ࡑࢀࢆᩘ್໬ࡍࡿࡇ࡜࡛ගᙉᗘศᕸࢆ㸰ḟඖ㓄ิ࡟᱁⣡ࡍࡿ㸬௒ᅇࡣ⏬⣲ᩘࡀ 2592[pix.]1944[pix.]࡞ࡢ࡛㸪୰ᚰᗙᶆ O㸦1296, 972㸧࠿ࡽ༙ᚄ

Fig. 11 Retardation (Δ) result of BSC

14

沼津工業高等専門学校研究報告

第 57 号

ㅰ㎡
 ᮏ◊✲ࡢ୍㒊ࡣ㸪⛉Ꮫ◊✲㈝⿵ຓ㔠㸦20K04508㸧ࡢຓᡂࢆཷࡅࡓࡶࡢ࡛࠶ࡿ㸬ཧ⪃ᩥ⊩[1] D. E. Aspnes, "Optimizing precision of rotatinganalyzer ellipsometer," J. Opt. Soc. Am., 64, pp.639646, 1974.
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Fig. 12 Azimuth angle (Ԅ) result of QWP ࡞࠾㸪ẚ㍑ࡢࡓࡵ࡟๓㏙ࡢᅇ㌿఩┦Ꮚἲࡢ⤖ᯝࢆྠࢢࣛࣇ࡟㔜ࡡ࡚グࡍ㸬ࡲࡓ㸪୧ᡭἲࢆẚ㍑ࡋࡸࡍ࠸ࡼ࠺࡟߂࠾ࡼࡧ߶

Fourier ellipsometers," Opt. Commun., 14, pp.431-437,
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[3] T. Wakayama, et. al., “Achromatic axially symmetricࡢィ 㛤ጞ఩⨨ࢆࢩࣇࢺࡉࡏࡿ࡞࡝ࡋ࡚⿵ṇࡋࡓ㸬

wave plate,” Opt. Express, vol. 20, No. 28, pp.29260- ィ ࡢ⤖ᯝ㸪߂㸪߶࠸ࡎࢀࡶᅇ㌿఩┦Ꮚἲࡢ⤖ᯝ࡜࡯ࡰྠᵝ29265, 2012.

࡟ቑຍ࣭ῶᑡࡋࡓ㸬ࡲࡓ㸪ࡇࢀࡲ࡛ࡢィ ᫬㛫ࡀ㸯㹼㸰ศࡔ[4] T. Wakayama, K. Komaki, I. J. Vaughn, J. S. Tyoc, Y.

ࡗࡓࡢ࡟ᑐࡋ㸪ࢩࣥࢢࣝࢩࣙࢵࢺィ ἲ࡛ࡣ⏬ീฎ⌮ࡢ᫬㛫Otani and T. Yoshizawa, “Evaluation of Mueller matrixࢆྵࡵ࡚ 5 ⛊⛬ᗘ࡜኱ᖜ࡟▷⦰ࡉࢀࡓ㸬ࡋ࠿ࡋ࡞ࡀࡽ㸪߂㸪߶

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SPIE vol. 8873, 88730P1-7, 2013.

ࡣ㸪ᗙᶆኚ᥮࡟࠾ࡅࡿ୰ᚰ఩⨨ࡢࡎࢀ࡟ࡼࡿࡶࡢ࡜⪃࠼ࡽࢀ[5] T. Wakayama, O. G. Rodríguez-Herrera, J. S. Tyo, Y.

ࡿ㸬ࡇࢀࢆᨵၿࡍࡿ᪉ἲ࡜ࡋ࡚㸪ࣅ࣮࣒ࣉࣟࣇ࢓࢖ࣛ࡞࡝࡛

Otani, M. Yonemura and T. Yoshizawa, “Generation of࠶ࡽ࠿ࡌࡵගᙉᗘศᕸࢆ᧜ീࡋ㸪ࢻ࣮ࢼࢶ≧ࡢගᙉᗘศᕸࡢ

achromatic, uniform-phase, radially polarized beams,”୰ኸ㒊ศࢆṇ☜࡟☜ㄆࡋ࡚࠾ࡃ࡞࡝ࡢᑐᛂࡀ⪃࠼ࡽࢀࡿ㸬ࡲ

Opt. Express, vol. 22, No. 3, pp. 3306-3315, 2014.

ࡓ,CMOS ࣓࡛࢝ࣛᚓࡽࢀࡓ⏬ീࢆከࡃྲྀᚓࡋ࡚࠾ࡁ㸪ࡑࢀ

[6] S. C. McEldowney, D. M. Shemo and R. A. Chipman,ࡽࡢࣃࢱ࣮ࣥ࡟ࡘ࠸࡚ᶵᲔᏛ⩦࡞࡝ࢆ⏝࠸࡚୰ᚰ఩⨨ࡢุู“Vortex retarders produced from photo-aligned liquidࢆࡍࡿ࡞࡝ࡢᑐᛂࡶ⪃࠼ࡽࢀࡿ㸬

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䠑䠊䛚䜟䜚䛻 ᮏ◊✲࡛ࡣ㸪㧗㏿࡛」ᒅᢡࢆィ ࡍࡿࡓࡵࡢ㸪࣋ࢡࢺࣝࣅ
࣮࣒ࢆ⏝࠸ࡓ」ᒅᢡィ ⿦⨨ࡢᵓ⠏ࢆ⾜ࡗࡓ㸬⌧᫬Ⅼ࡛ࡣㄗᕪࡀ⏕ࡌࡿࡶࡢࡢ㸪ᚑ᮶ἲࡼࡾࡶ㧗㏿࡟ィ ࡍࡿࡇ࡜ࡀྍ⬟࡟࡞ࡗࡓ㸬 ௒ᚋࡣࣅ࣮࣒ࢫ࣏ࢵࢺࡢ୰ᚰ఩⨨Ỵࡵࡢ☜❧࡟ࡼࡾㄗᕪࡢᨵၿࢆ┠ᣦࡋ㸪ࡉࡽ࡟ィ ᫬㛫ࡢ▷⦰໬ࢆヨࡳࡿ㸬ࡲࡓ㸪ከἼ㛗࡟ࡼࡿࢩࣥࢢࣝࢩࣙࢵࢺ」ᒅᢡィ ࢆヨࡳࡿ㸬