ADI CommercialSpace Products
ProgramApril 2022

ADI Commercial Space
Products Program

ADI has created two new product grades to address theemerging and wide-ranging needs:

The electronic content of satellites is expanding
exponentially in both traditional GEO satellite signal
processing applications and LEO small satellite
constellations. These new ambitious design solutions
require reduced size, weight, power, and cost. The
benefits of using plastic encapsulated microcircuits(PEMs) or commercial-off-the-shelf devices (COTS) inspace level applications include advanced
technologies, higher levels of integration, higher
performance, and better size, weight, and power
specifications.

CSL—Cost-constrained or high-volume
requirements: basic testing and screening suitablefor LEO constellations.

CSH—Highest screening and qualification level,
used where no hermetic-package option isavailable (equivalent to QML-V using SAE AS6294
as a guideline).

What Are Commercial
Space Products?
Commercial space bridges the gap between
commercial products and full space qualified hermetic
QML V product. Decades of knowledge building space
grade parts is being applied to make commercial parts
suitable for space use.

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Balancing reliability with cost to reach an acceptablelevel of risk is of utmost importance in the era of newspace. features such as wafer lot uniformity andtraceability, radiation monitors, and enhanced
testing/screening that are not supported with acommercial-grade product.
ADI’s commercial space device screening andqualification is based on internally defined equivalent
flows per NASA PEM-INST-001 and SAE AS6294.

1

ADI Commercial Space Products Program

CSH Data Reports

CSL Features:Wafer lot uniformity and traceability

Radiation monitors

Outgassing characterization

100% processing attributes data

High reliability lead finishes and no Cu wire bonds

Electrical test variable data, if applicableExtended temperatureRadiographic inspection report, if applicable

Failure analysis report, if applicableCertificate of Conformance

Data reports are included for CSH products, and include
the following:

CSH Features:Everything offered with CSL, plus …

High reliability screening

High reliability Quality Conformance Inspection

Manufacturing Locations
Space LevelScreening
Standard commercialspace product device
screening andqualification

Wafer Fab

ADI Wilmington, MA
ADI Limerick, Ireland
ADI Camas, WATSMC Taiwan
Various foundries

Assembly

ADI Penang, Malaysia
Various ADI
approved
subcontractors

Screening and Quality
Conformance Inspection
 ADI Cavite,
Philippines ADI Chelmsford, MA
 ADI Milpitas, CA

Commercial Space Screening Flows
Screen/Test
Wafer fabrication
Wafer lot acceptance test
Assembly
Outgas characterization
Operating temperature
range

Test Method/Requirements

CSLCSH

Single fab location
SEM analysis
Hi-Rel package finish (nickelpalladium gold preferred), ifavailable, and no Cu wire bonds
ASTM E-595

X
XX
XX

XX

Extend operating temperature
range from –55°C to +125°C
through qualification andperformance testing, subject todevice limitations

X

X

N/A

N/A
X

Pre-cap source inspection
Serialization
Gross bubble test
Fine/gross leak test
External visual inspection

2MIL-STD-883, TM 1014 Cond A & C
Per ADI0028 External Visual

N/A
N/A

X
N/A
X

Notes

No matte tin except
where noted
Performed once perreleased assembly BOM

Where package sizepermits, laser mark orregister options
Air cavity packages only
ADI0485 for hermetic

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ADI Commercial Space Products Program

Screen/Test

Test Method/Requirements

Thermal cycle

MIL-STD-883, TM 1010 Cond B,
20 cycles or equivalent
J-STD-020

X

MIL-STD-883, TM 2012 (top view)
and inspect for wire sweep
MIL-STD-883, TM 2001 Cond E,
Y1 axis only
MIL-STD-883, TM 2020 Cond A
100% of the devices per device
specification at room
temperature
100% of devices from each flight
lot and perform burn-in per MILSTD-883, TM 1015 (240 hours at125°C, or equivalent, with dcbias), for lots >500 pcs, asampling plan will be agreed upon
Perform 100% electrical test (atmin, room, and maxtemperatures) on all burn-in units
Per data sheet specs, performedon all burn-in units
5% max, repeat burn-in <10%,second pass <2%X

C-SAM
Radiographic
Constant acceleration
PIND
Pre-burn-in electrical tests
Burn-inFinal electrical tests
Deltas calculation
Percent defect allowable(PDA)
Gross bubble test
Fine/gross leak test
External visual inspectionDestructive physicalanalysis (DPA)
Data report
Diffusion lot traceability

MIL-STD-883, TM 1014 Cond A & C
Per ADI0028 External Visual
Based on NASA PEM-INST-001;
5 samples

CSL

CSH

X

X

Notes

N/A to air cavity
packagesX

Air cavity packages only

X
X

Air cavity packages only

X

Single pass burn-in
condition as determinedby ADI; conditions mayvary by device

X

When serialization notpossible, based on lotaverage

X
X
N/A
N/A
X

X
N/A
X
X

Air cavity packages onlyTests and lab
requirements
determined by QA, N/Afor hermetic packages

X
Listed on box label
Included in C of C

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X
X

Follow current ADI QA
major change PCN
guidelines

3

ADI Commercial Space Products Program

Commercial Space Quality Conformance Inspection
Screen/Test

Test Method/Requirements

CSL

CSH

Visual inspection
and serialization

Per ADI0028 or ADI0485 for hermetic intest method/conformanceX

Baseline C-SAM

J-STD-020

X

Preconditioning

Moisture soak per JESD22-A113

X

Solderability

MIL-STD-883, TM 2003 or J-STD-002

X

100% of the devices per device
specification at min, room, and max
temperatures
Group 1: 16 samples per CSH wafer diffusion lotX

Physicaldimensions
Steady state life
test

MIL-STD-883, TM 2016

X

MIL-STD-883, TM 1005, 1,000 hrs at+125°C
Additional 1000hrs

X

Electrical test

X

Post burn-in
electrical test
External visualinspection

100% of devices per device specification
at min, room, and max temperatures
Per ADI0028 External Visual, indentation
in metallization and/or copper basemetal may be exposed through plating
after processing and shall not begrounds for rejection if caused by
fixturing and no other visual acceptancecriteria are violatedGroup 1a: 16 samples per CSH package assembly lot

X

Thermal cycle

MIL-STD-883, TM 1010 Cond B, 500
cycles or equivalentX

Post burn-in
electrical test

100% of devices per device specification
at min, room, & max temperatures

XC-SAM

J-STD-020

X

X

Notes
Where package size
permits, laser mark or
register options

5 samples at additionalcost, based on package
type. Steam aging is not
required for plasticpackages

Condition based onproduct type
Information only
Tested at 1000hrs and2000hrs life test
ADI0485 for hermetic

External Visual
Per ADI0028
Inspection
Group 2: 16 samples per CSH package assembly lot

X

ADI0485 for hermetic

Unbiased HASTX

N/A to air cavity packages

4

JESD22-A118, 96 hrs, 130°C at 85% RH

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ADI Commercial Space Products Program

Electrical test
External visualinspection

100% of the devices per device
specification at min, room, and max
temperatures
Per ADI0028 External VisualX

N/A to air cavity packages

XADI0485 for hermetic

Commercial Space Radiation Inspection
Screen/Test

Test Method/Requirements

CSL

TID wafer lot specifictest

TID up to 30 Krads per data sheet
specification, using samples fromsame wafer lot used for
production build, as required byprocess
TID specified per data sheet,pass/fail to data sheet
specification (post rad limits), asrequired by process
SEL performed once at initialqualification, repeated for any
major process or mask change, asrequired by process

XTID radiation lot
acceptance test(RLAT)SEE benchmark

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CSHNotes
Generic radiation report

XX*X

Generic report*Optional at addition cost5