ECSS-Q-ST-70-02C
15 November 2008

Space productassurance
Thermal vacuum outgassing test forthe screening of space materials

ECSS Secretariat
ESA-ESTEC
Requirements & Standards Division
Noordwijk, The Netherlands

ECSS‐Q‐ST‐70‐02C
15 November 2008

Foreword
This Standard is one of the series of ECSS Standards intended to be applied together for the
management, engineering and product assurance in space projects and applications. ECSS is acooperative effort of the European Space Agency, national space agencies and European industry
associations for the purpose of developing and maintaining common standards. Requirements in thisStandard are defined in terms of what shall be accomplished, rather than in terms of how to organizeand perform the necessary work. This allows existing organizational structures and methods to be
applied where they are effective, and for the structures and methods to evolve as necessary without
rewriting the standards.
This Standard has been prepared by the Working Group, reviewed by the ECSS Executive Secretariat
and approved by the ECSS Technical Authority.

Disclaimer
ECSS does not provide any warranty whatsoever, whether expressed, implied, or statutory, including,but not limited to, any warranty of merchantability or fitness for a particular purpose or any warranty
that the contents of the item are error‐free. In no respect shall ECSS incur any liability for any damages,
including, but not limited to, direct, indirect, special, or consequential damages arising out of, resulting
from, or in any way connected to the use of this Standard, whether or not based upon warranty,
business agreement, tort, or otherwise; whether or not injury was sustained by persons or property orotherwise; and whether or not loss was sustained from, or arose out of, the results of, the item, or any
services that may be provided by ECSS.

Published by:

Copyright:

ESA Requirements and Standards Division
ESTEC, P.O. Box 299,
2200 AG Noordwijk
The Netherlands
2008 © by the European Space Agency for the members of ECSS2

ECSS‐Q‐ST‐70‐02C
15 November 2008

Change log

ECSS‐Q‐70‐02AFirst issue

26 May 2000

Transforming ESA‐PSS‐01‐202 into an ECSS Standard

ECSS‐Q‐70‐02B

Never issued

ECSS‐Q‐ST‐70‐02C

Second issue
Update and cleaning of ECSS‐Q‐70‐02A according to ECSS drafting rules
and new template.
In particular:• The Introduction was completed to precise the context of applicationof this Standard and reinforced by the insertion of a new clause 5.1• Former notes related to clause 5.2.4.2 were promoted into
requirements from 5.2.4.2.d to 5.4.2.4.l.
• A DRD for Materials Identification was created in the normative
Annex A.
• A DRD for Micro‐VCM Worksheet was created in the normative
Annex B• A DRD for Micro‐VCM datasheet was created in the normative
Annex C• A DRD for test report was created in the normative Annex D• A DRD for certificate of conformity was created in the normative
Annex E

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Table of contents
Change log .................................................................................................................3
Introduction................................................................................................................6
1 Scope.......................................................................................................................7
2 Normative references .............................................................................................8
3 Terms, definitions and abbreviated terms............................................................9
3.1

Terms defined in other standards............................................................................... 9

3.2

Terms specific to the present standard ...................................................................... 9

3.3

Abbreviated terms .................................................................................................... 10

4 Test overview........................................................................................................12
4.1

Test process description .......................................................................................... 12

4.2

Acceptance limits ..................................................................................................... 15

5 Requirements........................................................................................................16
5.1

General requirements............................................................................................... 16

5.2

Preparatory conditions ............................................................................................. 16

5.3

5.2.1

Hazards, health and safety precautions ..................................................... 16

5.2.2

Material samples ........................................................................................ 17

5.2.3

Facilities...................................................................................................... 19

5.2.4

Equipment .................................................................................................. 19

Test procedure ......................................................................................................... 21
5.3.1

General requirements................................................................................. 21

5.3.2

Test process for general spacecraft application ......................................... 21

5.4

Reporting of test data ............................................................................................... 24

5.5

Acceptance limits ..................................................................................................... 25

5.6

5.5.1

General requirements................................................................................. 25

5.5.2

Acceptance limits for a retest of the material.............................................. 25

5.5.3

Acceptance limits for application of a material ........................................... 26

Quality assurance..................................................................................................... 28
5.6.1

Data ............................................................................................................ 28

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5.6.2
5.7

Calibration .................................................................................................. 28

Audit of the Micro-VCM test apparatus..................................................................... 28
5.7.1

General....................................................................................................... 28

5.7.2

Initial audit of the system (acceptance) ...................................................... 29

5.7.3

Annual regular review (maintenance) of the system .................................. 30

5.7.4

Special review ............................................................................................ 31

Annex A (normative) Materials identification card (MIC) - DRD .........................32
Annex B (normative) Micro-VCM worksheet - DRD .............................................35
Annex C (normative) Micro-VCM datasheet - DRD ..............................................38
Annex D (normative) Thermal vacuum outgassing test report - DRD................41
Annex E (normative) Certificate of conformity for Micro-VCM - DRD ................43
Bibliography.............................................................................................................45
FiguresFigure 4-1: Flow chart of preparation and initial measurements ............................................ 12
Figure 4-2: Flow chart of test process .................................................................................... 13
Figure 4-3: Parameters for sample......................................................................................... 14
Figure 4-4: Parameters for collector plate .............................................................................. 14
Figure 5-1: Micro-VCM equipment ......................................................................................... 21
Figure A-1 : Example of filled MIC.......................................................................................... 34
Figure B-1 : Example of filled in Micro-VCM worksheet ......................................................... 37
Figure C-1 : Example of filled in Micro-VCM datasheet ......................................................... 40
Figure E-1 : Example of a certificate of conformity for Micro-VCM ........................................ 44

TablesTable B-1 : Outgassing screening properties ......................................................................... 36

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Introduction
The kinetics of an outgassing process is influenced by vacuum and temperature
conditions.
The method described in this Standard gives reliable data for material screening
use exclusively. The nominal temperature for the screening test, as described inthis standard is 125 °C. Results from the nominal screening test can be used forthe screening of materials that have an operational temperature below 50 °C,
especially if they are exposed for an extended period of time (in the order ofweeks and above).

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1
Scope
This Standard describes a thermal vacuum test to determine the outgassing
screening properties of materials proposed for use in the fabrication of spacecraft
and associated equipment, for vacuum facilities used for flight hardware tests
and for certain launcher hardware.
This Standard covers the following:•

critical design parameters of the test system;•

critical test parameters such as temperature, time, pressure;•material sample preparation;•

conditioning parameters for samples and collector plates;•

presentation of the test data;•

acceptance criteria;•

certification of test systems and their operators by audits and round robintests.

The test described in this Standard is applicable for all unmanned spacecraft,launchers, payloads, experiments. The test is also valid for external hardware of
inhabited space systems and for hardware to be used in terrestrial vacuum test
facilities.
The outgassing and condensation acceptance criteria for a material depend upon
the application and location of the material and can be more severe than thestandard requirements as given in clause 5.5.3.1.
This standard may be tailored for the specific characteristics and constrains of aspace project in conformance with ECSS‐S‐ST‐00.

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Normative references
The following normative documents contain provisions which, through referencein this text, constitute provisions of this ECSS Standard. For dated references,subsequent amendments to, or revision of any of these publications do not apply,
However, parties to agreements based on this ECSS Standard are encouraged toinvestigate the possibility of applying the more recent editions of the normative
documents indicated below. For undated references, the latest edition of the
publication referred to applies.

ECSS‐S‐ST‐00‐01

ECSS system – Glossary of terms

ECSS‐Q‐ST‐10

Space product assurance – Product assurance
management

ECSS‐Q‐ST‐10‐09

Space product assurance – Nonconformance control
system8

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3
Terms, definitions and abbreviated terms
3.1

Terms defined in other standards
For the purpose of this Standard, the terms and definitions from ECSS‐S‐ST‐00‐01
and ECSS‐Q‐ST‐70 apply.

3.2

Terms specific to the present standard
3.2.1

bakeout

activity of increasing the temperature of hardware to accelerate its outgassing
rates with the intent of reducing the content of molecular contaminants within
the hardware
NOTE

3.2.2

Bakeout is usually performed in a vacuum
environment but may be done in a controlled
atmosphere.

cleanroom

room in which the concentration of airborne particles is controlled, and which isconstructed and used in a manner to minimize the introduction, generation, andretention of particles inside the room, and in which other relevant parameters,e.g. temperature, humidity, and pressure, are controlled as necessary[ISO 14644‐6]

3.2.3

collected volatile condensable material (CVCM)

quantity of outgassed matter from a test specimen that condenses on a collector
maintained at a specific temperature for a specific time
NOTE

3.2.4

CVCM is expressed as a percentage of the initial
specimen mass and is calculated from thecondensate mass determined from the difference inmass of the collector plate before and after the test.

outgassing

release of gaseous species from a specimen under high vacuum conditions

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3.2.5

quartz crystal microbalance (QCM)

device for measuring small quantities of mass deposited on a quartz crystal using
the properties of a crystal oscillator

3.2.6

recovered mass loss (RML)

total mass loss of the specimen itself without the absorbed water

3.2.7

NOTE 1

The following equation holds:
RML = TML ‐ WVR.

NOTE 2The RML is introduced because water is not always
seen as a critical contaminant in spacecraft materials.

sticking coefficient

probability that a molecule, colliding with a surface, stays on that surface before
thermal re‐evaporation of that molecule occurs

3.2.8

total mass loss (TML)

total mass loss of material outgassed from a specimen that is maintained at a
specific constant temperature and operating pressure for a specified time
NOTE

3.2.9

TML is calculated from the mass of the specimen as
measured before and after the test and is expressed
as a percentage of the initial specimen mass.

water vapour regained (WVR)

mass of the water vapour regained by the specimen after the optional
reconditioning step
NOTE

3.3

WVR is calculated from the differences in thespecimen mass determined after the test for TML
and CVCM and again after exposure to atmosphericconditions and 65 % relative humidity at room
temperature (22 ± 3) °C.

Abbreviated terms
For the purpose of this Standard, the abbreviated terms from ECSS‐S‐ST‐00‐01
and the following apply:

Abbreviation

Meaning

CVCM

collected volatile condensable materialEOL

end‐of‐lifeIRinfraredMIC

materials identification card

PTFE

polytetrafluorethylene

QCM

quartz crystal microbalance

RH

relative humidity

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RML

recovered mass lossRTroom temperature

TML

total mass loss

VCM

volatile condensable material

WVR

water vapour regained

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4
Test overview
4.1

Test process description
Figure 4‐1 and Figure 4‐2 are included as a guide to the test procedures. The
sequence for the test is given in the flow chart (Figure 4‐2).

Figure 4‐1: Flow chart of preparation and initial measurements

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Figure 4‐2: Flow chart of test process

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Wo

RML
Wr

TML

Mass sample

WVR
Wf
Conditioning(22 ± 3) °C at(55 ± 10) % RH
0Outgassing test
24 h at 125 °C
Vacuum ≤ 10‐3 Pa

Conditioning(22 ± 3) °C at(55 ± 10) % RH

24

48

72

Time (hours)

Figure 4‐3: Parameters for sample

Wg

CVCM

Mass collector

Wp

Bakeout
Temp > 125 °C
Time ≥ 16 h
Vacuum ≤ 10‐3 Pa‐16

Conditioning
RT in desiccator
0 % RHTime ≥ 24 hOutgassing test
24 h at 125 °C
Vacuum ≤ 10‐3 Pa
Collector 25 °C
24

0

48

Time (hours)

Figure 4‐4: Parameters for collector plate

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4.2

Acceptance limits
The validity of this screening test as a means for determining the suitability of amaterial for a specific application depends on the environmental conditions
during the lifetime of the material as well as the vicinity of critical or sensitive
surfaces.
Especially, in cases were the expected maximum temperature of a material
during the lifetime is exceeding 50 °C for an extended period of time, the use ofsuch material are evaluated further through a test programme, mutually agreed
between customer and supplier.
Such programme ensures that the characteristics of the material at the EOL are
still within the specified requirements.

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5
Requirements
5.1

5.2

General requirementsa.

For those materials that are subjected, during the mission, to temperature
above 125 °C for short period of time (in the order of hours) or above 50 °C
for an extended period of time (in the order of weeks or above), dedicatedtests shall be performed at conditions representative of the real application(i.e. higher temperature tests).

b.

Limits for elevated temperature testing shall be specified case by case.
NOTE 1For example, limits are specified by the requesting
project.

NOTE 2For accelerated tests (i.e. higher temperature testing
to take into account long exposures) there can be alimit, above which, the phenomenon is governed bydifferent mechanisms other than those that reallyinterest the material during its on‐orbit phase; insuch a case, a different kind of test, like a dynamic
characterization, can be more pertinent.

c.

The measurement of contamination potential shall be only used in acomparative way and is strictly valid only for collectors at 25 °C withsimilar sticking coefficients.

d.

The data obtained from this test shall not be used for contamination
predictions.

e.

Modelling of the outgassing phenomenon shall be based on dynamic test
results only and not on screening results obtained from this Standard.

Preparatory conditions
5.2.1
a.

Hazards, health and safety precautions

The supplier shall take the following health and safety precautions:1.

Control and minimize hazards to personnel, equipment andmaterials.

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Locate items and controls in such a way that personnel are notexposed to hazards such as burns, electric shock, cutting edges,
sharp points or toxic atmospheres.

3.

Provide warning and caution notes in operations, storage, transport,
testing, assembly, maintenance and repair instructions anddistinctive markings on hazardous items, equipment or facilities for
personal protection.

5.2.2

Material samples

5.2.2.1

Configuration

5.2.2.1.1

Preparationa.

If the material is made up of several items, the sample shall be preparedaccording to the process specification or manufacturer’s data.

b.

A minimum of 12 g of the material sample shall be prepared.
NOTE

c.

The material sample shall be made according to the same processparameters as the relevant material to be applied for spacecraft use.
NOTE

5.2.2.1.2
a.

The reason of this quantity is to provide
representative samples (10 g for the initial test and
2 g for subsequent retest if needed).

Typical process parameters are curing and baking.

Material cuttingsThree test specimens of each material shall be prepared as follows:
NOTE
1.

2.

For potting materials and bulky adhesives do the following:(a)Cast them on a PTFE sheet so that a sample of a few
millimetres thick (preferably 2 mm) can be separated from thePTFE after curing;(b)

Cut the sample into cubes (1,5 mm to 2 mm per side) before
testing.

For thin films, coatings, adhesives and adhesive tapes do thefollowing:
(a)
NOTE

3.

The material cuttings are in general made by the test
house concerned.

Apply them to a degreased, dried metal foil of known
thickness;
The metal foil can be aluminium and an aluminium
foil is typically 16 μm (4 × 10‐3 g/cm2) thick.

(b)

Cut them into strips 10 mm wide;(c)

Roll up them in such a way that the specimen cup is fit;

For non‐curing adhesives do the following:

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ECSS‐Q‐ST‐70‐02C
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Apply them between thin metal foils.

(b)Prepare them as specified in 5.2.2.1.2a.2.

(c)

If the substrate is non‐metallic, submit a sample of that
substrate for separate testing;4.

When materials are prepared on substrates, submit a substratesample with the material sample.

5.

When primers are applied, test the complete system.

6.

Cut materials such as wires, cables or sleeves, the smallest
dimension of which is less that 1,5 mm, into pieces 10 mm long.

7.

Test materials containing metal parts without the metal parts or, if
this is not possible, state the ratio of metal mass to total mass.
NOTE

8.

Place liquids and greases in a specimen cup and state the ratio of
filler mass to total mass if a filler is used.
NOTE

5.2.2.2

Typical materials with metal parts are electricalwires or connectors.

In some cases, it can be more practical to mix theliquid with a neutral filler powder such as silica
before placing it in a cup.

Cleaninga.

The cleaning and other treatment of the samples shall be the same as thatapplied to the flight hardware, which the sample is intended to represent,
prior to integration into the spacecraft.

b.

The supplier shall test the materials as received without any further
cleaning or treatment, unless otherwise specified by the customer.

5.2.2.3

Handling and storagea.

Samples shall only be handled with clean nylon or lint‐free gloves.

b.

Samples shall be stored in a controlled area, with an ambient temperatureof (22 ± 3) °C and relative humidity of (55 ± 10) %.

c.

Polyethylene or polypropylene bags or sheets shall be used.
NOTE

d.

The polyethylene or polypropylene‐wrapped workpieces shall be packed
in clean, dust‐ and lint‐free material.
NOTE

e.

This is to avoid physical damage.

Limited‐life materials shall be labelled with their shelf lives and dates ofmanufacture or date of delivery if date of manufacture is not known.

5.2.2.4a.

This is to shield coated surfaces from contact.

Identification of materials

The customer shall accompany materials submitted for testing by acompleted materials identification card in conformance with Annex A.

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5.2.3

Facilities

5.2.3.1

Cleanlinessa.

The supplier shall keep the work area clean from dust as achieved withnormal house‐keeping.
NOTE

b.

The supplier shall filter the air used for ventilation.
NOTE

5.2.3.2a.

A cleanroom environment is not necessary.

This is to prevent contamination of the sample.

Environmental conditions

During the conditioning of the prepared material samples, the suppliershall ensure an ambient temperature of (22 ± 3) °C with a relative humidityof (55 ± 10) %.

5.2.4

Equipment

5.2.4.1

Test equipmenta.

The supplier shall use measuring instruments which are capable ofmonitoring the following items:
1.

Temperature from 10 °C to 130 °C with ± 1 °C accuracy.

2.

Humidity from 40 % to 80 % RH with ± 1 % RH accuracy.

3.

Vacuum at 10‐4 Pa with ± 10 % accuracy.

b.

If requested, the supplier shall use an infrared spectrometer of such asensitivity that an infrared spectrum of the condensed contaminants in therange 2,5 μm to 16 μm is obtained.

c.

The supplier shall use a microbalance from 1 × 10‐6 g to 5 × 10‐6 g.

d.

The supplier shall use a vacuum oven able to guarantee a maximum
pressure of 1 Pa and a temperature of at least 150 °C.

5.2.4.2

Special apparatusa.

The apparatus shall consist of an insert located in a common‐type vacuum
system suitably dimensioned with respect to the insert, able toaccommodate the necessary feedthroughs.

b.

The insert should consist of a bar (or bars) accommodating a minimum of 6
regularly spaced specimen compartments 16 mm ± 0,1 mm in diameter and9,6 mm ± 0,8 mm deep.

c.

The distance between two adjacent specimen compartments shall be
50 mm ± 0,8 mm.

d.

The open ends of the specimen compartments shall face the collector plates
on the cooling plate(s).

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The dimensions of the open ends shall be as follows:1.

6,3 mm ± 0,1 mm in diameter,2.

12,7 mm ± 0,3 mm long.

f.

The cooling plate(s) shall be provided with attachments ensuring a goodthermal contact with the collector plates.

g.

The distance between the open ends of the specimen compartments andthe cooling plate(s) shall be 13,45 mm ± 0,1 mm.

h.

Cross contamination between different compartments shall be reduced bya separator plate(s) 0,75 mm ± 0,1 mm thick and perforated with
11,1 mm ± 0,1 mm diameter holes in front of each specimen compartment.

i.

The separator plate(s) shall be situated between the heater bar(s) and thecooling plate(s) at a distance of 9,65 mm ± 0,1 mm from the latter.

j.

Standard collectors shall be made of chromium‐plated aluminium plates
33,0 mm ± 0,1 mm in diameter and 0,65 mm ± 0,1 mm thick.

k.

Standards collectors shall
germanium collector plates.
NOTE

be

replaceablebysodium‐chloride

orInfrared analysis of the condensed materials can be
performed when sodium‐chloride or germanium
collectors are used instead of the standard ones.

l.

Alignment between the hot bar and the cooling plate(s) shall be verified(see Figure 5‐1)m.

A pressure of 10‐4 Pa shall be reached within one hour with an unloaded
system.

n.

The vacuum system shall be checked to be oil free during each test withthe aid of three blank collector plates placed at random.

o.

The capability to maintain the heater bars and the cooling plates attemperatures other than those mentioned further in this Standard shall bedemonstrated.
NOTE

It is advisable to make provision for a bakeout, at atemperature of 25 °C above the maximum test
temperature, of the vacuum system as a means ofcleaning it in the event of heavy contamination.

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Figure 5‐1: Micro‐VCM equipment

5.3

Test procedure
5.3.1
a.

General requirements

The supplier shall perform the screening test with the minimal andnominal temperature of 125 °C.
NOTEThis outgassing temperature can be raised to amutual agreed level between the customer and the
supplier.

5.3.2

Test process for general spacecraft
application

5.3.2.1

Cleaning of cups and collector platesa.

The supplier shall clean specimen cups and collector plates with acompatible solvent.
NOTE

Solvent compatibilities with different materials areprovided in ECSS‐Q‐ST‐70‐01.

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5.3.2.2

Conditioning of cups and collector platesa.

The supplier shall condition the specimen cups for at least 24 hours in anenvironment of (22 ±3) °C and (55 ± 10) % RH.

b.

The supplier shall perform a bakeout of the collector plates for at least
16 hours in a vacuum oven at a pressure lower than 1 Pa, and at aminimum temperature of 125 °C.

c.

After the bakeout the supplier shall condition them for a minimum
24 hours in a desiccator containing silica gel.

d.

During the test, the supplier shall expose three specimen cups for eachmaterial and three empty specimen cups.

e.

During the test, the supplier shall place collector plates in front of each
cup.

f.

The supplier shall use the three collector plates facing the empty cups as
blanks.
NOTEg.

This is to verify the cleanliness of the equipment.

The supplier shall incorporate corrections based on the blanks in the actual
mass loss calculations.

5.3.2.3

Conditioning of samplesa.

The supplier shall prepare material specimens in the manner laid down inclause 5.2.

b.

The supplier shall condition them for at least 24 hours at (22 ± 3) °C and(55 ± 10) % RH.

5.3.2.4a.

Weighing of samples

The supplier shall fill the pre‐weighed specimen cups with 100 mg to
300 mg of specimen (substrate not included).
NOTE

b.

The supplier shall perform weighing on a microbalance (see 5.2.4.1c.)
located in a room conditioned at (22 ± 3) °C and (55 ± 10) % RH just before
the loading of the test system.

5.3.2.5a.

For low density foams a sample mass of 100 mg canbe obtained by choosing a sample cup of bigger size,or compressing the foam into the sample cup.

Weighing of collector plates

The supplier shall weigh the collector plates just before the loading of thetest system.
NOTE

This is done by taking them from the desiccator one
by one.

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5.3.2.6a.

The supplier shall load the test system with:1.

the specimen cups,2.

the blank cups,3.

the blank collectors,

4.

the two chromium‐plated collectors, and5.

one infrared‐transparent
collectors per material.

5.3.2.7a.

b.

Loading of systemcollector

or

three

chromium‐plated

Pump-down and heating

The supplier shall carry out the pump down of the test system in thefollowing procedure:1.

at 10‐3 Pa bring the heater bar(s) to the specified temperature within
one hour;2.

control the cooling plate(s) at 25 °C;

3.

maintain these temperatures for a period of 24 hours following the
instant at which the heater bar(s) reach(es) the specified
temperature.

The supplier shall ensure that the specified temperature does not exceed
the maximum bakeout temperature.

5.3.2.8

End of testa.

After 24‐hour exposure, the supplier shall switch off the heatersb.

The supplier shall vent the system up to 1 × 104 Pa to 2 × 104 Pa with dry
nitrogen or rare gas.

c.

The supplier shall continue cooling until the end of the test.

5.3.2.9a.

Gas inlet

When the temperature of the heater bar(s) has fallen to 50 °C, the suppliershall admit dry nitrogen or rare gas up to atmospheric pressure.
NOTE

5.3.2.10

The cooling normally takes (90 ‐ 120) minutes.

Unloading of systema.

The supplier shall unload the system as soon as possible.

b.

The supplier shall keep the specimen cups in a desiccator for not more than
30 minutes.

c.

The supplier shall keep the collector plates in a desiccator for one hour.

d.

The supplier shall weigh the specimen cups and collector plates.
NOTE

This is done by taking them from the desiccator one
by one and returned immediately thereafter.

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5.3.2.11

Storage of collector platesa.

The supplier shall store the specimen cups with material samples in aroom, at an ambient temperature of (22 ± 3) °C and a relative humidity of(55 ± 10) %, for 24 hours.

b.

The supplier shall reweigh them afterwards.

5.3.2.12a.

Infrared analyses

The supplier shall examine the infrared‐transparent collector plates in thetransmission mode, with the aid of an infrared spectrometer of such asensitivity so that an IR spectrum of the condensed contaminants is
obtained.

5.3.2.13

NOTE 1

See also clause 5.3.2.14.

NOTE 2In special cases the standard metal collector plates
can be analysed by infrared reflection techniques,
however, no quantitative information can be
expected from this reflection method. The
contaminants can also be washed from the metalcollector plates and the washing liquid can be used
for further analyses.

Cleaning of systema.

After each test, the supplier shall clean the heater bar(s), condensor plate(s)and screen(s) of the equipment with a compatible volatile solvent.

b.

The supplier shall perform baking at 25 °C above the specified test
temperature if the blank collectors indicate a mass increase > 30 μg during
the previous test.
NOTE

5.3.2.14
a.

5.4

It is a good practice to bake the system once every
four months.

Improved sensitivity of the CVCM measurements

In cases where the CVCM outgassing requirements are more stringent than
the standard detection limits, a quartz crystal microbalance should beinstalled as a fourth collector plate.
NOTE 1

See clause 5.5.2.

NOTE 2The infrared transmission data (see 5.3.2.12) can also
be used for equivalent mass determination as theintensities of the infrared absorption bands are
related to the mass of the contaminants by the law ofLambert‐Beer.

Reporting of test dataa.

The supplier shall fill in all data obtained during an outgassing test in a
micro VCM worksheet form in conformance with Annex B.

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15 November 2008b.

The supplier shall report the results in a micro VCM datasheet form inconformance with Annex C.
NOTE

5.5

The outgassing data are given down to 0,01 % fornormal tests, and for tests with increased sensitivity
these figures can be one order of magnitude lower.

Acceptance limits
5.5.1

General requirementsa.

The validity of this screening test as a means for determining the suitabilityof a material for a specific application shall depend on the environmental
conditions during the lifetime of the material as well as the vicinity ofcritical or sensitive surfaces.

b.

When the expected maximum temperature of a material during the
lifetime is exceeding 125 °C for short period of time (in the order of hours)
or is exceeding 50 °C for an extended period of time (in the order of week
or above), the use of such material shall be evaluated further through a test
programme and mutually agreed between the customer and the supplier.

c.

The test programme shall ensure that the characteristics of the material at
the EOL are still within the specified limits.

5.5.2

Acceptance limits for a retest of the materiala.

The supplier shall test a material threefold.

b.

The average data of the three values shall be within the limits as given in
5.5.2d.

c.

In case these limits are exceeded, the supplier shall perform a retest of thematerial.
NOTE

d.

e.

The variation of the outgassing data can be causedby the material variance or by the variance of thetest parameters.

The maximum values for one standard deviation (σ) with respect to themean values derived from the three specimens of each material tested shallbe as follows:1.

σ < 1/10 of the mean values of TML and RML, with a minimum σvalue of 0,05 %;2.

σ < 1/5 of the mean value of CVCM, with a minimum σ value of
0,03 %.

The supplier should have a material sample of > 1 g in order to be able torepeat a test.
NOTE

For protection of samples, see clause 5.7.4.2.

25

ECSS‐Q‐ST‐70‐02C
15 November 2008

5.5.3

Acceptance limits for application of amaterial

5.5.3.1

Generala.

As a minimum, the outgassing screening parameters for a material
selection shall be as follows:
1.

RML < 1,0 %;2.

CVCM < 0,10 %.

5.5.3.2a.

NOTE 1

For materials used in the fabrication of opticaldevices, or in their vicinity, the acceptance limits canbe more stringent than those stated below.

NOTE 2

It is nowadays becoming standard practice to bakecritical hardware (such as structural parts, harness,
electronic boxes and thermal blankets) to the highest
permissible temperature for a few days in order toremoveresidualcontaminants,
process
contaminants and handling contaminants.

NOTE 3In this respect it is of interest to test materials after
such baking as is expected for the hardware. Also,
infrared inspection can be invoked if considerednecessary (see clause 5.3.2.12).

Corrective actions for high outgassing materials

In case the material outgassing is higher than the general requirements in
5.5.3.1, corrective actions shall be taken.
NOTE

Corrective actions can be relaxed for the following
conditions:• if very small mass is used;• if the location of the material is far away fromthe sensitive items;• if the high outgassing material is shielded;• if the outgassing species (e.g. water) are notseen as a critical containment.

5.5.3.3a.

Water absorption of materials

The customer should accept materials with TML > 1,0 % and RML < 1,0 %when the following conditions are met:
1.

when no equipment at a temperature below ‐100 °C is involved;2.

when the water desorption is fast (e.g. in the case of polyimide films
and polyurethane paints);

3.

when no high voltage equipment is involved;

4.

when dry gas purging controls the water reabsorption during
ground life up to launch.

26

ECSS‐Q‐ST‐70‐02C
15 November 2008

5.5.3.4a.

NOTE 1

In most cases the water absorption of materials is
not harmful with respect to contamination.

NOTE 2

Water absorption of materials is included in themeasured TML. The TML data for water absorbing
materials such as polyamides, polyimides andpolyurethanes, is often above 1,0 %. Water
absorption is in most cases reversible and can becontrolled by purging of critical hardware with drygases.

NOTE 3The measuring method as described in this Standard
takes water reabsorption into account, as both the
TML and the RML are measured.

NOTE 4The RML is basically the TML value that does notinclude reabsorbed water or RML = TML ‐ WVR).

More stringent outgassing requirements

The customer shall make the limits defined in clause 5.5.3.1 more stringent
if the materials concerned are used in critical areas.
NOTE

b.

The customer shall use subsequent functional, development andqualification test.
NOTE

c.

e.

This is done to ensure that the material’s
performance continues to be satisfactory.

In case water absorption (or desorption) of materials can result incontamination problems, the customer shall evaluate the outgassing
requirements for materials on a case by case basis.
NOTE

d.

The use of materials that are deemed acceptableaccording to the limits stated above does not ensurethat the spacecraft system or component remains
uncontaminated.

For example, in case of using cryogenic equipment.

For cases where the CVCM requirements are lower than 0,1 % the suppliershall calculate that the CVCM detection limit of the standard Micro‐VCM
test is around 0,02 %.
NOTE 1This is because of both material variances andmeasuring errors.

NOTE 2For example, cases like certain optics.

For cases where CVCM < 0,05 % is required, the supplier shall implement
other types of CVCM measurements.
NOTE

For Improved sensitivity of CVCM measurements,
see clause 5.3.2.14.

27

ECSS‐Q‐ST‐70‐02C
15 November 2008

5.6

Quality assurance
5.6.1

Data

a.

The supplier shall provide the test report in conformance with Annex D.

b.

The supplier shall provide the certificate of conformity in conformancewith Annex E.

c.

The supplier shall retain the quality records for at least ten years or inaccordance with project business agreement requirements.
NOTE

d.

The quality records shall be composed of the following:
1.

The MIC

2.

The Micro‐VCM worksheet

3.

The Micro‐VCM datasheet

4.

The test report

5.

The certificate of conformity.

5.6.2

Calibrationa.

The supplier shall calibrate any measuring equipment to traceablereference standards.

b.

The supplier shall record any suspected or actual equipment failure as aproject nonconformance report in conformance with ECSS‐Q‐ST‐10‐09.
NOTE

5.7

Example of such quality records are logbooks.

This is to ensure that previous results are examined
to ascertain whether or not re‐inspection or retestingis necessary.

Audit of the Micro-VCM test apparatus
5.7.1
a.

GeneralThe standard audit shall be performed according to ECSS‐Q‐ST‐10, clause
5.2.3.
NOTE 1

The main purpose of this audit is to ensure thevalidity of test results by comparison of the test dataon identical materials by different test houses.

NOTE 2The material outgassing data from test houses forthe projects of the customer, obtained in the mannerlaid down in this Standard, are only accepted for the
projects of the customer if the test house is certified
to perform the Micro‐VCM test.

28

ECSS‐Q‐ST‐70‐02C
15 November 2008
NOTE 3

The auditing exercise can be part of a “Round
Robin” test on different apparatus of selected test
houses.

5.7.2

Initial audit of the system (acceptance)

5.7.2.1

General requirementa.

The system shall be audited after it has been built.
NOTE

5.7.2.2a.

b.

The audit is necessary before the system can be
accepted for running qualification or quality control
tests on materials for use in customer‐projects.

Inspection of apparatus and associated equipment

The customer shall inspect the following parts of the Micro‐VCM
apparatus:
1.

internal dimensions, view factor (sample compartment to collector
plates) and cross contamination protection;2.

pumping system and associated monitoring equipment;

3.

temperature regulation of sample and collector plates and associatedmonitoring equipment;

4.

thermal contact of the temperature sensors.

The customer shall inspect the following associated equipment:
1.

precision balance (reading to 1 μg);2.

temperature and relative humidity in the balance room is controlled
to obtain the required accuracy and reproducibility;

3.

room for sample pre‐ and post conditioning;

4.

vacuum oven for bakeout of collector plates;

5.

clean sample preparation room;

6.

infrared apparatus (optional).

5.7.2.3

Performing a blank testa.

The supplier shall perform the blank test with identical conditions andprocedures as the normal Micro‐VCM test as described in clause 5.3.2, butwith empty sample cups.
NOTE

b.

The purpose of this test is to ensure the apparatus isperforming correctly and no self‐contamination
occurs.

The supplier shall calculate the results for TML, RML and CVCM
(theoretically all zero) as for a normal VCM‐test.

29

ECSS‐Q‐ST‐70‐02C
15 November 2008c.

The results shall be within the tolerance as specified for a normal
Micro‐VCM test, i.e. a mass variation of less than 30 μg on the collector
plates.

5.7.2.4

Performing an actual testa.

Seven samples for this test shall be selected and supplied.

b.

The supplier shall perform the actual test with identical conditions andprocedure as the normal Micro‐VCM‐test as described in clause 5.3.2.

c.

The test shall be performed at the same time by all participants in case of“Round Robin”.

d.

The acceptance limits shall be within the following limits:
1.

for CVCM/TML/RML values > 0,2 % within 20 % of the averagevalue of all participants;

2.

for CVCM/TML/RML values < 0,2 % within ±0,05 % of the averagevalue of all participants.

5.7.2.5a.

Nonconformance

For nonconformances ECSS‐Q‐ST‐10‐09 shall apply.

5.7.2.6

Reporting of audit findingsa.

The customer shall deliver a written report of the initial audit including thecertificate of conformity, in conformance with Annex E within six weeks
after the end of the audit provided no nonconformance are detected.

b.

The supplier shall renew the certificate of conformity every three years
after a successful audit.

5.7.3

Annual regular review (maintenance) of thesystem

5.7.3.1

Inspection of apparatus and associated equipmenta.

Based on the initial test, as described in clause 5.7.2.2, the customer shallperform a review of any modifications made to the test facility orapparatus.

5.7.3.2

Mutual comparability evaluation (testing)a.

The customer shall select and supply the seven samples for the test.

b.

The supplier shall perform this test with identical conditions andprocedures as the normal Micro‐VCM test as described in clause 5.3.2.

c.

All suppliers involved in projects of the customer shall run the test.

5.7.3.3a.

Nonconformance

For nonconformances ECSS‐Q‐ST‐10‐09 shall apply.

30

ECSS‐Q‐ST‐70‐02C
15 November 2008

5.7.3.4a.

NOTE 1This can lead to perform a further test in accordancewith clause 5.7.2.4.

NOTE 2For example, a nonconformance with the applicable
audit specification of the customer or the acceptable
limits of the test results.

Reporting of audit findings

The customer shall deliver a written report of the result of the regularreview to all participants within six weeks after the end of the regularreview or evaluation testing.

5.7.4

Special review

5.7.4.1

Generala.

The supplier shall report all modifications of the apparatus or associatedequipment.

b.

The customer shall audit before using the modified system if deemednecessary.

c.

For major modifications, the supplier shall retest the apparatus asdescribed in clause 5.7.2.

5.7.4.2a.

Preservation of samples

The supplier shall preserve a quantity of untested material, sufficient for asecond Micro‐VCM test for a period of not less than one year.
NOTE

This is done so that material is available forsubmittal to the customer in case of request by thecustomer’s project product assurance representative
or department.

31

ECSS‐Q‐ST‐70‐02C
15 November 2008

Annex A(normative)
Materials identification card (MIC) - DRD
A.1

DRD identification
A.1.1

Requirement identification and source document

This DRD is called from ECSS‐Q‐ST‐70‐02, requirement 5.2.2.4a.

A.1.2

Purpose and objective

The purpose of this document is to uniquely identify and to provide theproperties of the material under testing.

A.2

Expected response
A.2.1
<1>
a.

Description and history of sample
The materials identification card shall contain the following information:
1.

Trade name and number

2.

Manufacturer

3.

Type of product4.

Chemical nature

5.

Processing details.

<2>a.

Scope and content

Sample batch
The materials identification card shall contain the following information:
1.

Batch number

2.

Sample quantity3.

Preparation date4.

Prepared by.

32

ECSS‐Q‐ST‐70‐02C
15 November 2008<3>a.

Material and substrate
The materials identification card shall contain the following information:
1.

Material density

2.

Substrate density

3.

Substrate material.

<4>a.

Outgassing screening data
The materials identification card shall contain the following outgassing
screening properties:
1.

TML

2.

RML

3.

CVCM.

<5>
a.

Test reference number
The materials identification card shall contain a test reference number.

A.2.2

Special remarks

An example of a materials identification card is shown in Figure A‐1.

33

ECSS‐Q‐ST‐70‐02C
15 November 2008

Materials identification card
Description and history of sample
a. Trade name + number
b. Manufacturer
c. Type of productd. Chemical naturee. Processing details:e.g.

a. Aeroglaze Z306 + Pyrolac P123

b. Lord Corporation / Akzo

c. Paint, conductive, black,
Primer yellow

d. Polyurethane / Epoxy

e. Mix ratio
Primer P123:
Hardener = 100 : 25
Paint S125 : Z306 : MEK is 50 : 100 : 60

‐ joining method‐ heat treatment‐ cure and postcure‐ cleaning method‐ relevant spec. no

Cure: 24 hours at room temperature + 6 days at 65 °C
Cleaning with IPA

Batch number

1108447

Material density

Unknown

Sample quantity

A4 sheet

Substrate density

2,70 kg/m3 and 0,0432 g/cm2

Preparation date

26/03/99

Substrate material

Aluminium foil 16 μm

Prepared by

TOS‐QMCContractor/Experimenter

Contractor

Project/Cost code

XMM ‐ Project

ESTEC PA manager or originator nameand signature

PA nameQuality control sample or evaluation
sampleEvaluation

Sample code (refer to the DML item
number of the project)
Application

Coating optical equipment

Test specification number

ECSS‐Q‐ST‐70‐02

For materials and processes division use

Report number:

Date received: 12.10.1996 Test date: 05.11.1996

Results:

Responsible section: PXQ Test number: ESTEC 448

TML = 1,55 %RML = 0,47 %CVCM = 0,00 % Accept  Reject

Figure A‐1: Example of filled MIC

34

ECSS‐Q‐ST‐70‐02C
15 November 2008

Annex B (normative)
Micro-VCM worksheet - DRD
B.1

DRD identification
B.1.1

Requirement identification and source document

This DRD is called from ECSS‐Q‐ST‐70‐02, requirement 5.4a.

B.1.2

Purpose and objective

The purpose of this document is to gather all the measurements necessary to becollected or calculated during micro‐VCM testing.

B.2

Expected response
B.2.1

Scope and content<1>Unique sample identificationa.

The Micro‐VCM worksheet shall contain a unique sample identification.

<2>a.

Material identification
The Micro‐VCM worksheet shall contain the material identification.

<3>a.

Weights
The Micro‐VCM worksheet shall contain the following weights data:
1.

Mass of specimen cup: Wc

2.

Total specimen mass just after test: Wf

3.

Final mass of collector plates after test: Wg

4.

Mass of material before test: Wm
NOTE

5.

Wm = Wo – Wc – Ws

Total specimen mass before the test: Wo
NOTE

The total specimen mass (Wo) includes the mass ofthe material, the mass of the cup and the mass pf
the substrate.

35

ECSS‐Q‐ST‐70‐02C
15 November 2008
6.

Initial mass of collector plates before test: Wp

7.

Total specimen mass after test and after 24 hours and a final
conditioning at (22 ± 3) °C and (55 ± 10) % RH environment: Wr

8.

Mass of substrate, determined by weighing or by calculation fromdensity and surface area: Ws.

<4>a.

Outgassing screening data
The Micro‐VCM worksheet shall contain the following outgassing
screening properties:
1.

TML

2.

RML

3.

WCR

4.

CVCM.
NOTE

Table B‐1 lists the calculations needed to establish
these values.

Table B‐1: Outgassing screening properties
Term

Calculations

TML %W0 − W f
Wm

CVCM %

Wg − W p
Wm

× 100

W0 − W r
× 100
Wm

WVR %

Wr − W f<5>a.

Wr is measured on completion of postconditioning

× 100

Test reference number
The Micro‐VCM worksheet shall contain a test reference number.

<6>a.

W m = W0 − Wc − W s

× 100

RML %

Wm

Remarks

IR dateThe Micro‐VCM worksheet shall contain the IR date.

B.2.2

Special remarks

An example of a Micro‐VCM worksheet is shown in Figure B‐1.

36

ECSS‐Q‐ST‐70‐02C
15 November 2008
Item
no.

1

Commercial identification or
standard designation

Wc

Wo

cup

total
beforeWs

Wmsubstr. material
before

Wf

Wr

Wp

Wg

TML

RML

WCR

CVCM

total
after

total
cond.

collect
beforecollect
after

%

%

%

%

Test
referenceno.

IR date

E 448

None

Observations

Honeycomb
averagestandard

2

3

Aeroglaze Z306 +

17426350769089750

243677503938506522367771367783

1,54

0,48

1,06

0,00

Pyrolac P123

18139152282889231

252206519016521730157207157213

1,51

0,44

1,08

0,00

17977150091496667

224476497303499780191537

191569

1,61

0,51

1,10

0,01

average 1,55
standard 0,05

0,47
0,04

1,08
0,02

0,01
0,01

Black paint withyellow primer

Aeroglaze Z306 +Pyrolac P123
averagestandard

4

Eccosil 4952
averagestandard

5

Araldite AV100/HV100
averagestandard

6

Electrodag 501
averagestandard

7

Solitane 113
averagestandard

Figure B‐1: Example of filled in Micro‐VCM worksheet

37

ECSS‐Q‐ST‐70‐02C
15 November 2008

Annex C (normative)
Micro-VCM datasheet - DRD
C.1

DRD identification
C.1.1

Requirement identification and source document

This DRD is called form ECSS‐Q‐ST‐70‐02 requirement 5.4b.

C.1.2

Purpose and objective

The purpose of this document is to collect the results of the Micro‐VCM testwith reference to its unique material identification card

C.2

Expected response
C.2.1

Scope and content<1>Unique sample identification

a.

<2>

The Micro‐VCM datasheet shall contain an unique sample identification.

Material identificationa.

The Micro‐VCM datasheet shall include the material identification.

b.

The Micro‐VCM datasheet shall contain a reference to the relevantmaterials identification card.
NOTE

<3>
a.

<4>
a.

For the MIC, see Annex A.

Chemical nature
The Micro‐VCM datasheet shall identify the chemical nature of thematerial.

Product type
The Micro‐VCM datasheet shall contain the product type.

38

ECSS‐Q‐ST‐70‐02C
15 November 2008

<5>a.

Manufacturer
The Micro‐VCM datasheet shall identify the manufacturer’s name.

<6>a.

Summary process parameters
The Micro‐VCM datasheet shall include a summary of the processparameters.

<7>a.

Use and location
The Micro‐VCM datasheet shall describe the use and location of thematerials in the spacecraft.

<8>a.

User code
The Micro‐VCM datasheet shall contain the user code.

<9>a.

Outgassing screening data
The Micro‐VCM datasheet shall contain the following outgassing
screening properties:
1.

TML

2.

RML

3.

WCR

4.

CVCM.
NOTE

<10>
a.

Test reference number
The Micro‐VCM datasheet shall contain a test reference number.

<11>
a.

Table B‐1 lists the calculations needed to establish
these values.

IR data results
The Micro‐VCM datasheet shall contain the IR data results.

C.2.2

Special remarks

An example of a Micro‐VCM datasheet is shown in Figure C‐1.

39

ECSS‐Q‐ST‐70‐02C
15 November 2008
Item
no.

Commercial
identification or
standard
designation

ChemicalnatureProduct
type

Honeycomb

2

Aeroglaze Z306 +Pyrolac P123

Eccosil‐4952

5

Araldite AV100/
HV100

6

Electrodag 501

7

Solithane 113

User code

contractor
projecthoneycomb

Casa

Spec Ca‐423‐95A

PUR/EP

paint
black/
primeryellow

Lord/Akzo

opticalCure 24 at RT + 6 d at
equipmen XMM
65 °C
t

PUR/EP

paint
black/
primeryellow

Lord/Akzo

Cure 24 at RT + 6 d at battery
65 °C
PF3/a12SI

potting

Emerson & CumingCure 7 d at RT + 24h
at 45 °C

connector

Ciba Geigy

Cure 4 h at 60 °C

insertPyrolac P123

4

Use andlocation

EP/Al

Aeroglaze Z306 +3

Summary of processparameters

manufacturer/
supplier
procurement spec.

ISO‐1043
1

Procurement
information

structure

TML RML

WVR

CVCM

%

%

%

%

1,55

0,47

1,08

0,00

Test
referenceno.

IR‐dataresults

E 448

None

Meris‐C3

Mipas‐A5

EURECA‐
ColumbusEPadhesive

Fluoroas received

SOHO

Carbonpaint‐cond.
Achesonblack

PURpottingas received

Silex

Thiokol

Observations

ISO‐SS‐Fok

Figure C‐1: Example of filled in Micro‐VCM datasheet

40

ECSS‐Q‐ST‐70‐02C
15 November 2008

Annex D (normative)
Thermal vacuum outgassing test report DRD
D.1

DRD identification
D.1.1

Requirement identification and source document

This DRD is called from ECSS‐Q‐ST‐70‐02, requirement 5.6.1.a.

D.1.2

Purpose and objective

The purpose of this document is to describe the contents of the thermal vacuum
outgassing test report to document the thermal vacuum outgassing test forscreening of space materials.

D.2

Expected response
D.2.1
<1>
a.

<2>
a.

<3>
a.

Scope and content
Specific mass of the finished product

The report shall contain specific mass of the finished product:1.

per cm3 for bulk solid;2.

per cm2 for coatings and thin layers;3.

per cm for wires and threads.

Density of substrate
The report shall contain density of substrate in g/cm2 or ratio of material
mass to total mass of material plus substrate.

Identification of test specimen
The report shall contain identification of size, area and mass of test
specimen, together with an indication of whether the sample was of thesubstrate or sandwich type.

41

ECSS‐Q‐ST‐70‐02C
15 November 2008<4>a.

Nature of the collector plates
The report shall contain the nature of the collector plates.

<5>a.

Main wavelength peaks
The report shall contain the main wavelength peaks with theirwavelength value if an infrared spectrum is obtained of the condensed
material.

<6>a.

Noticeable incidents
The report shall contain any noticeable incident observed during the test.

<7>a.

Outgassing screening data
The report shall contain the following outgassing screening properties:
1.

TML

2.

RML

3.

WCR

4.

CVCM.
NOTE

<8>
a.

Failure mode
The report shall contain details of failure mode.

<9>a.

Table B‐1 lists the calculations needed to establish
these values.

Identification of material
The report shall contain the identification of the material, in conformancewith 5.2.2.4

D.2.2

Special remarks

None.

42

ECSS‐Q‐ST‐70‐02C
15 November 2008

Annex E (normative)
Certificate of conformity for Micro-VCM DRD
E.1

DRD identification
E.1.1

Requirement identification and source document

This DRD is called from ECSS‐Q‐ST‐70‐02B, requirement 5.6.1b.

E.1.2

Purpose and objective

The purpose of this document is to report the audit findings and to provide toprovide a declaration of the auditing authority stating that the supplier of micro
VCM test data complies with all the ECSS‐Q‐ST‐70‐02 requirements and theaudit requirements of ECSS‐Q‐ST‐20.

E.2

Expected response
E.2.1
a.

Scope and content

The certificate of conformity shall contain the following audit criteria
according to the relevant clauses of ECSS‐Q‐ST‐70‐02:
1.

Data recording ( in conformance with clause 5.6.1)

2.

Nonconformance3.

Calibration ( in conformance with clause 5.6.2)

4.

Traceability

5.

Inspection of apparatus andconformance with clause 5.7.2.2)

6.

Performing a blank test ( in conformance with clause 5.7.2.3)

7.

Performing an actual test ( in conformance with clause 5.7.2.4)

E.2.2

associatedequipment(inSpecial remarks

An example of a certificate of conformity is shown in Figure E‐1.

43

ECSS‐Q‐ST‐70‐02C
15 November 2008

Certificate of conformity
This certificate of conformity states that the customer declares that the supplier of Micro‐
VCM data complies with the requirements in ECSS‐Q‐ST‐70‐02 and the audit requirements
in ECSS‐Q‐ST‐20.
Customer (incl. Auditor[s])*Supplier (incl. Operator[s])*Audit criteria according relevant clauses of
ECSS‐Q‐ST‐70‐02*

1. Data recording*

2. Nonconformance*

3. Calibration*

4. Traceability*

5. Inspection of apparatus and associated equipment*

6. Performing a blank test*

7. Performing an actual test*

The audit took place on *__________and the certification is valid from *__________ to *__________
This certificate is granted by: **Name:

Signature:

Function:
*
**

Date:

fill infill in customer and date

Figure E‐1: Example of a certificate of conformity for Micro‐VCM

44

ECSS‐Q‐ST‐70‐02C
15 November 2008

Bibliography

ECSS‐S‐ST‐00

ECSS system – Description, implementation andgeneral requirements

45