# Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

A Niozu, Y Kumagai, T Nishiyama, H Fukuzawa, K Motomura, M Bucher, Y Ito, T Takanashi, K Asa, Y Sato, et al.

► To cite this version:

A Niozu, Y Kumagai, T Nishiyama, H Fukuzawa, K Motomura, et al.. Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays. Journal of Physics: Conference Series, 2020, 1412, pp.202028. 10.1088/1742-6596/1412/20/202028. cea-04459243

HAL Id: cea-04459243

https://cea.hal.science/cea-04459243

Submitted on 27 Feb 2024

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# Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

A Niozu, Y Kumagai, T Nishiyama, H Fukuzawa, K Motomura, M Bucher, Y Ito, T Takanashi, K Asa, Y Sato, et al.

► To cite this version:

A Niozu, Y Kumagai, T Nishiyama, H Fukuzawa, K Motomura, et al.. Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays. Journal of Physics: Conference Series, 2020, 1412, pp.202028. 10.1088/1742-6596/1412/20/202028. cea-04459243

HAL Id: cea-04459243

https://cea.hal.science/cea-04459243v1

Submitted on 27 Feb 2024

HAL is a multi-disciplinary open access
archive for the deposit and dissemination of sci-
entific research documents, whether they are pub-
lished or not. The documents may come from
teaching and research institutions in France or
abroad, or from public or private research centers.

L'archive ouverte pluridisciplinaire HAL, est
destinée au dépôt et à la diffusion de documents
scientifiques de niveau recherche, publiés ou non,
émanant des établissements d'enseignement et de
recherche français ou étrangers, des laboratoires
publics ou privés.

<figure><img src="image_1.png" /></figure>

Distributed under a Creative Commons Attribution 4.0 International License
# Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

A Niozu¹,²*, Y Kumagai³, T Nishiyama¹,², H Fukuzawa²,³, K Motomura³,
M Bucher⁴, Y Ito³, T Takanashi³, K Asa¹,², Y Sato¹,², D You³, Y Li³,
T Ono³, E Kukk⁵, C Miron⁶,⁷, L Neagu⁷,⁸, C Callegari⁹, M Di Fraia⁹, G Rossi¹⁰,
D E Galli¹⁰, T Pincelli¹⁰, A Colombo¹⁰, T Kameshima¹¹, Y Joti¹¹, T Hatsui²,
S Owada², T Katayama¹¹, T Togashi¹¹, K Tono¹¹, M Yabashi², K Matsuda¹,
C Bostedt⁴,¹²,¹³ K Nagaya¹,² and K Ueda²,³

¹Division of Physics and Astronomy, Kyoto University, Kyoto 606-8501, Japan

²RIKEN SPring-8 Center, Sayo, Hyogo 679-5148, Japan

³Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan

⁴Chemical Sciences and Engineering Division, Argonne National Laboratory,
9700 S. Cass Avenue, Argonne, IL 60439, USA

⁵Department of Physics and Astronomy, University of Turku 20014 Turku, Finland

⁶LIDYL, CEA, CNRS, Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette, France

⁷Extreme Light Infrastructure - Nuclear Physiscs (ELI-NP),
"Horia Hulubei" National Institute for Physics and Nuclear Engineering,
30 Reactorului Street, RO-077125 Măgurele, Jud. Ilfov, Romania

⁸National Institute for Laser, Plasma and Radiation Physics,
409 Atomistilor PO Box MG-36, 077125 Magurele, Jud. Ilfov, Romania

⁹Elettra - Sinchrotronne Trieste, 34149 Basovizza, Trieste, Italy

¹⁰Department of Physics, Università degli Studi di Milano, Via Celoria 16 - 20133 Milano, Italy

¹¹Japan Synchrotron Radiation Research Institute (JASRI), Sayo, Hyogo 679-5198, Japan

¹²Laboratory for Femtochemistry, Paul-Scherrer Institute, CH-5232 Villigen PSI, Switzerland

¹³Institute of Chemical Sciences and Engineering,
École Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland

**Synopsis** We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.

Characterizing crystalline defects in nanoparticles is of crucial importance for their applications in science and technology, since the defects potentially alter their desired properties. Single-shot X-ray diffraction with X-ray free electron lasers (XFELs) is a promising method to investigate the structure of nanoparticles, in which diffraction patterns of single nanoparticles are obtained with exposures to single XFEL pulses.

In this study, we carried out a wide-angle X-ray scattering experiment on Xe nanoparticles at an XFEL facility SACLA [1] in Japan. Single Xe nanoparticles (average radius r ~ 65 nm) were irradiated by 11.2-keV XFEL pulses, and the diffracted X-rays were recorded on a shot-by-shot basis with a multiport CCD sensor detector. The diffraction patterns contain Bragg spots corresponding to fcc{111}, {200}, {220} and hcp{101}

*E-mail: niozu.akinobu.85s@st.kyoto-u.ac.jp

reflections.

In order to extract further structural information from the single-shot diffraction patterns, we developed an analysis technique that focuses on angular correlations [2] between plural Bragg spots in single-shot diffraction patterns. The analysis has revealed clear angular correlations between the Bragg spots, which provide rich structural information on the nanoparticles. We carried out a simulation to quantitatively evaluate the angular correlations and obtained a solid evidence of twinning and stacking faults in the Xe nanoparticles.

This study was supported by MEXT, JSPS KAKENHI, and IMRAM project.

## References

[1] Ishikawa T et al 2012 *Nat. Photon.* **6** 540

[2] Mendez D et al 2016 *IUCrJ* **3** 420

<figure><img src="image_2.png" /></figure>
# Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

A Niozu¹,²*, Y Kumagai³, T Nishiyama¹,², H Fukuzawa²,³, K Motomura³, M Bucher⁴, Y Ito³, T Takanashi³, K Asa¹,², Y Sato¹,², D You³, Y Li³, T Ono³, E Kukk⁵, C Miron⁶,⁷, L Neagu⁷,⁸, C Callegari⁹, M Di Fraia⁹, G Rossi¹⁰, D E Galli¹⁰, T Pincelli¹⁰, A Colombo¹⁰, T Kameshima¹¹, Y Joti¹¹, T Hatsui², S Owada², T Katayama¹¹, T Togashi¹¹, K Tono¹¹, M Yabashi², K Matsuda¹, C Bostedt⁴,¹²,¹³ K Nagaya¹,² and K Ueda²,³

¹Division of Physics and Astronomy, Kyoto University, Kyoto 606-8501, Japan

²RIKEN SPring-8 Center, Sayo, Hyogo 679-5148, Japan

³Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan

⁴Chemical Sciences and Engineering Division, Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, IL 60439, USA

⁵Department of Physics and Astronomy, University of Turku 20014 Turku, Finland

⁶LIDYL, CEA, CNRS, Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette, France

⁷Extreme Light Infrastructure - Nuclear Physiscs (ELI-NP), "Horia Hulubei" National Institute for Physics and Nuclear Engineering, 30 Reactorului Street, RO-077125 Măgurele, Jud. Ilfov, Romania

⁸National Institute for Laser, Plasma and Radiation Physics, 409 Atomistilor PO Box MG-36, 077125 Magurele, Jud. Ilfov, Romania

⁹Elettra - Sinchrotronne Trieste, 34149 Basovizza, Trieste, Italy

¹⁰Department of Physics, Università degli Studi di Milano, Via Celoria 16 - 20133 Milano, Italy

¹¹Japan Synchrotron Radiation Research Institute (JASRI), Sayo, Hyogo 679-5198, Japan

¹²Laboratory for Femtochemistry, Paul-Scherrer Institute, CH-5232 Villigen PSI, Switzerland

¹³Institute of Chemical Sciences and Engineering, École Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland

**Synopsis** We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.

Characterizing crystalline defects in nanoparticles is of crucial importance for their applications in science and technology, since the defects potentially alter their desired properties. Single-shot X-ray diffraction with X-ray free electron lasers (XFELs) is a promising method to investigate the structure of nanoparticles, in which diffraction patterns of single nanoparticles are obtained with exposures to single XFEL pulses.

In this study, we carried out a wide-angle X-ray scattering experiment on Xe nanoparticles at an XFEL facility SACLAY [1] in Japan. Single Xe nanoparticles (average radius r ~ 65 nm) were irradiated by 11.2-keV XFEL pulses, and the diffracted X-rays were recorded on a shot-by-shot basis with a multiport CCD sensor detector. The diffraction patterns contain Bragg spots corresponding to fcc{111}, {200}, {220} and hcp{101}

*E-mail: niozu.akinobu.85s@st.kyoto-u.ac.jp

reflections.

In order to extract further structural information from the single-shot diffraction patterns, we developed an analysis technique that focuses on angular correlations [2] between plural Bragg spots in single-shot diffraction patterns. The analysis has revealed clear angular correlations between the Bragg spots, which provide rich structural information on the nanoparticles. We carried out a simulation to quantitatively evaluate the angular correlations and obtained a solid evidence of twinning and stacking faults in the Xe nanoparticles.

This study was supported by MEXT, JSPS KAKENHI, and IMRAM project.

## References

[1] Ishikawa T et al 2012 *Nat. Photon.* **6** 540

[2] Mendez D et al 2016 *IUCrJ* **3** 420

<figure><img src="image_2.png" /></figure>