<figure><img src="image_1.png" /></figure>

HAL
open science

# The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices

Vincent Girones, Jérôme Boch, Frédéric Saigné, Tadec Maraine, Timothee Labau, Alain Carapelle, Arnaud Chapon, Rubén García

► To cite this version:

Vincent Girones, Jérôme Boch, Frédéric Saigné, Tadec Maraine, Timothee Labau, et al.. The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices. SERESSA 2022, Dec 2022, Geneve (Cern), Switzerland. hal-04580388

HAL Id: hal-04580388

https://hal.science/hal-04580388

Submitted on 19 May 2024

HAL is a multi-disciplinary open access
archive for the deposit and dissemination of sci-
entific research documents, whether they are pub-
lished or not. The documents may come from
teaching and research institutions in France or
abroad, or from public or private research centers.

L'archive ouverte pluridisciplinaire HAL, est
destinée au dépôt et à la diffusion de documents
scientifiques de niveau recherche, publiés ou non,
émanant des établissements d'enseignement et de
recherche français ou étrangers, des laboratoires
publics ou privés.

<figure><img src="image_2.png" /></figure>

Distributed under a Creative Commons Attribution 4.0 International License
# The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices

Vincent Girones¹, Jérôme Boch¹, Frédéric Saigné¹, Tadec Maraine¹, Timothee Labau¹, Alain Carapelle², Arnaud Chapon³, Rubén García Alía⁴.

1 Université de Montpellier, IES - UMR UM/CNRS 5214, France.

2 Centre Spatial de Liège (CSL), 4031 Angleur, Belgium.

3 ATRON METROLOGY, Cherbourg en Cotentin, France.

4 CERN, CH-1211 Genève 23 Switzerland.

Corresponding author : vincent.girones@umontpellier.fr

SERESSA

2022

## 1. Introduction

To perform TID testing, we study the use of a high-energy X-ray generator allowing to obtain photons up to 320keV. These conditions are far from optimal for component testing where the goal is to achieve a high penetration depth and an energy deposition that does not depend on the Z of the material. This is the reason why we have decided to cut the low energy photons. This cut is realized with a lead (Pb) filter.

Benefits of X-ray:

- Easier radiation safety issues.

- More economical (purchase and maintenance).

- Easy to collimate.

- Higher dose rate offering reduced testing time.

<figure><img src="image_1.png" /></figure>

## 2. X-ray

The TASMICs tool has been used to simulate our Spectrum. The lead filter reduces low energies below 100keV while only slightly altering high energies.

<figure><img src="image_2.png" /></figure>

## 3. Methods

<table><thead><tr><td>Type</td><td>Filter</td><td>Dose rate</td><td>Length Source-Target</td></tr></thead><tbody><tr><td>Cobalt-60</td><td>Nothing</td><td>5,57 Gy(Air)/h</td><td>33 (cm)</td></tr><tr><td>Cobalt-60</td><td>Nothing</td><td>0,62 Gy(Air)/h</td><td>1000 (cm)</td></tr><tr><td>Cobalt-60</td><td>Nothing</td><td>0,15 Gy(Air)/h</td><td>2000 (cm)</td></tr><tr><td>X-ray</td><td>2mm Al</td><td>15 Gy(Air)/h</td><td>40 (cm)</td></tr><tr><td>X-ray</td><td>2mm Al + 1mm Pb</td><td>15 Gy(Air)/h</td><td>40 (cm)</td></tr></tbody></table>

<figure><img src="image_3.png" /></figure>

no noticeable dose effect on the components tested

We performed tests at different dose rate over 60-Co to ensure no dose rate effect will affect the comparison when we use X-ray generator.

## 4. Results

We will use **60-Co source as a reference** as is it usually considered to perform TID tests on electronic devices and systems.

<figure><img src="image_4.png" /></figure>

Higher energy X-ray generators improve the result

<figure><img src="image_5.png" /></figure>

Use filter and cut low energies offer best results whatever the X-ray voltage from 320kV to 250kV

## 5. Conclusion

We have shown that the use of a filter (lead) allowing the cutting of low energy photons is essential to get closer to the dose response obtained with cobalt. This is the most important recommendation for using a high energy X-ray generator for dose testing of electronic components. A second recommendation is to use an X-ray generator with the highest possible voltage to obtain the highest proportion of high-energy photons.

<figure><img src="image_6.png" /></figure>
# The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices

Vincent Girones¹, Jérôme Boch¹, Frédéric Saigné¹, Tadec Maraine¹, Timothee Labau¹, Alain Carapelle², Arnaud Chapon³, Rubén García Alía⁴.

1 Université de Montpellier, IES - UMR UM/CNRS 5214, France.

2 Centre Spatial de Liège (CSL), 4031 Angleur, Belgium.

3 ATRON METROLOGY, Cherbourg en Cotentin, France.

4 CERN, CH-1211 Genève 23 Switzerland.

Corresponding author : vincent.girones@umontpellier.fr

SERESSA

2022

## 1. Introduction

To perform TID testing, we study the use of a high-energy X-ray generator allowing to obtain photons up to 320keV. These conditions are far from optimal for component testing where the goal is to achieve a high penetration depth and an energy deposition that does not depend on the Z of the material. This is the reason why we have decided to cut the low energy photons. This cut is realized with a lead (Pb) filter.

Benefits of X-ray:

- Easier radiation safety issues.

- More economical (purchase and maintenance).

- Easy to collimate.

- Higher dose rate offering reduced testing time.

<figure><img src="image_3.png" /></figure>

## 2. X-ray

The TASMICs tool has been used to simulate our Spectrum. The lead filter reduces low energies below 100keV while only slightly altering high energies.

<figure><img src="image_4.png" /></figure>

## 3. Methods

<table><thead><tr><td>Type</td><td>Filter</td><td>Dose rate</td><td>Length Source-Target</td></tr></thead><tbody><tr><td>Cobalt-60</td><td>Nothing</td><td>5,57 Gy(Air)/h</td><td>33 (cm)</td></tr><tr><td>Cobalt-60</td><td>Nothing</td><td>0,62 Gy(Air)/h</td><td>1000 (cm)</td></tr><tr><td>Cobalt-60</td><td>Nothing</td><td>0,15 Gy(Air)/h</td><td>2000 (cm)</td></tr><tr><td>X-ray</td><td>2mm Al</td><td>15 Gy(Air)/h</td><td>40 (cm)</td></tr><tr><td>X-ray</td><td>2mm Al + 1mm Pb</td><td>15 Gy(Air)/h</td><td>40 (cm)</td></tr></tbody></table>

<figure><img src="image_5.png" /></figure>

no noticeable dose effect on the components tested

We performed tests at different dose rate over 60-Co to ensure no dose rate effect will affect the comparison when we use X-ray generator.

## 4. Results

We will use **60-Co source as a reference** as is usually considered to perform TID tests on electronic devices and systems.

<figure><img src="image_6.png" /></figure>

Higher energy X-ray generators improve the result

<figure><img src="image_7.png" /></figure>

Use filter and cut low energies offer best results whatever the X-ray voltage from 320kV to 250kV

## 5. Conclusion

We have shown that the use of a filter (lead) allowing the cutting of low energy photons is essential to get closer to the dose response obtained with cobalt. This is the most important recommendation for using a high energy X-ray generator for dose testing of electronic components. A second recommendation is to use an X-ray generator with the highest possible voltage to obtain the highest proportion of high-energy photons.

<figure><img src="image_8.png" /></figure>