Standard reference materials [microform] : the certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements /
Ehrstein, James R.
Croarkin, M. C.(Mary Carroll),1934-
National Institute of Standards and Technology (U.S.)
[Gaithersburg, MD] : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology,
1997.
"August 1997."
Shipping list no.: 98-0569-M.
Includes bibliographical references.
Microfiche.
Silicon.
Silicon