Development of a testing methodology to predict optical disk life expectancy values /
Podio, Fernando L.
National Institute of Standards and Technology (U.S.)
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O.,
1991.
Includes bibliographical references (p. 83-84).
Optical disks