VLSI Design and Test [electronic resource] : 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings /
Gaur, Manoj Singh.editor.
Zwolinski, Mark.editor.
Laxmi, Vijay.editor.
Boolchandani, D.editor.
Sing, Virendra.editor.
Singh, Adit.editor.
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Bibliographic Level Mode of Issuance: Monograph
VLSI design -- Testing and verification -- Embedded systems -- Emerging technology.
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Computers.
Computer input-output equipment.
Microprocessors.
Computer communication systems.
Computer Hardware.
Processor Architectures.
Computer Communication Networks.