Reliability of electron devices, failure physics and analysis : special issue /
Touboul, Andre.
Labat, N.(Nathalie)
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis(12th :2001 :Arcachon, France)
[Oxford] : Pergamon,
2001.
Papers from the 12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis held in Arcachon, France from October 1-5, 2001.