Physical aspects of electron microscopy and microbeam analysis
Electron Microscopy Society of AmericaAnnual Meeting31st1973New Orleans.
Siegel, Benjamin Morton.
Beaman, Donald R.
Microbeam Analysis Society of AmericaNational Conference8th1973New Orleans
New York London Wiley
1975
Papers read at the Thirty-first Annual Meeting of the Electron Microscopy Society of America and the Eighth National Conference of the Microbeam Analysis Society of America, held jointly on August 14-17, 1973 in New Orleans
Includes index
Electron microscopy.
Microchemistry.
Probes (Electronic instruments)