Electron Energy-Loss Spectroscopy in the Electron Microscope [electronic resource] /
Egerton, R.F.author.
Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.  In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data. Considered the "Bible of EELS" Presents the only in-depth, single-author text for the still-expanding field of TEM-EELS Responds to many requests for the first new edition of this classic work since 1996 Includes discussion of new spectrometer and detector designs, together with spectral-analysis techniques such as Bayesian deconvolution and multivariate statistical analysis Provides extended discussion of anisotropic materials, retardation effects, delocalization of inelastic scattering, and the simulation of energy-loss fine structure. Describes recent applications of EELS to fields such as nanotechnology, electronic devices and carbon-based materials. Offers extended coverage of radiation damage and delocalization as limits to spatial resolution. From reviews of the first and second edition: "The text....contains a wealth of practical detail and experimental insight....This book is an essential purchase for any microscopist who is using, or planning to use, electron spectroscopy or spectroscopic imaging." - JMSA "Provides the advanced student with an indispensable text and the experienced researcher with a valuable reference." -- American Scientist.
Description based upon print version of record.
Preface to the Third Edition; Contents; 1 An Introduction to EELS; 1.1 Interaction of Fast Electrons with a Solid; 1.2 The Electron Energy-Loss Spectrum; 1.3 The Development of Experimental Techniques; 1.4 Alternative Analytical Methods; 1.5 Comparison of EELS and EDX Spectroscopy; 1.6 Further Reading; 2 Energy-Loss Instrumentation; 2.1 Energy-Analyzing and Energy-Selecting Systems; 2.2 Optics of a Magnetic Prism Spectrometer; 2.3 The Use of Prespectrometer Lenses; 2.4 Recording the Energy-Loss Spectrum; 2.5 Parallel Recording of Energy-Loss Data; 2.6 Energy-Selected Imaging (ESI)
3 Physics of Electron Scattering3.1 Elastic Scattering; 3.2 Inelastic Scattering; 3.3 Excitation of Outer-Shell Electrons; 3.4 Single, Plural, and Multiple Scattering; 3.5 The Spectral Background to Inner-Shell Edges; 3.6 Atomic Theory of Inner-Shell Excitation; 3.7 The Form of Inner-Shell Edges; 3.8 Near-Edge Fine Structure (ELNES); 3.9 Extended Energy-Loss Fine Structure (EXELFS); 3.10 Core Excitation in Anisotropic Materials; 3.11 Delocalization of Inelastic Scattering; 4 Quantitative Analysis of Energy-Loss Data; 4.1 Deconvolution of Low-Loss Spectra; 4.2 KramersKronig Analysis
4.3 Deconvolution of Core-Loss Data4.4 Separation of Spectral Components; 4.5 Elemental Quantification; 4.6 Analysis of Extended Energy-Loss Fine Structure; 4.7 Simulation of Energy-Loss Near-Edge Structure (ELNES); 5 TEM Applications of EELS; 5.1 Measurement of Specimen Thickness; 5.2 Low-Loss Spectroscopy; 5.3 Energy-Filtered Images and Diffraction Patterns; 5.4 Elemental Analysis from Core-Loss Spectroscopy; 5.5 Spatial Resolution and Detection Limits; 5.6 Structural Information from EELS; 5.7 Application to Specific Materials
A Bethe Theory for High Incident Energies and Anisotropic MaterialsA.1 Anisotropic Specimens; B Computer Programs; B.1 First-Order Spectrometer Focusing; B.2 Cross Sections for Atomic Displacement and High-Angle Elastic Scattering; B.3 Lenz-Model Elastic and Inelastic Cross Sections; B.4 Simulation of a Plural-Scattering Distribution; B.5 Fourier-Log Deconvolution; B.6 Maximum-Likelihood Deconvolution; B.7 Drude Simulation of a Low-Loss Spectrum; B.8 KramersKronig Analysis; B.9 Krger Simulation of a Low-Loss Spectrum; B.10 Core-Loss Simulation; B.11 Fourier Ratio Deconvolution
B.12 Incident-Convergence CorrectionB.13 Hydrogenic K-Shell Cross Sections; B.14 Modified-Hydrogenic L-Shell Cross Sections; B.15 Parameterized K-, L-, M-, N-, and O-Shell Cross Sections; B.16 Measurement of Absolute Specimen Thickness; B.17 Total Inelastic and Plasmon Mean Free Paths; B.18 Constrained Power-Law Background Fitting; C Plasmon Energies and Inelastic Mean Free Paths; D Inner-Shell Energies and Edge Shapes; E Electron Wavelengths, Relativistic Factors, and Physical Constants; F Options for Energy-Loss Data Acquisition; References; Index
Includes bibliographical references and index.
Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.  In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data. Considered the "Bible of EELS" Presents the only in-depth, single-author text for the still-expanding field of TEM-EELS Responds to many requests for the first new edition of this classic work since 1996 Includes discussion of new spectrometer and detector designs, together with spectral-analysis techniques such as Bayesian deconvolution and multivariate statistical analysis Provides extended discussion of anisotropic materials, retardation effects, delocalization of inelastic scattering, and the simulation of energy-loss fine structure. Describes recent applications of EELS to fields such as nanotechnology, electronic devices and carbon-based materials. Offers extended coverage of radiation damage and delocalization as limits to spatial resolution. From reviews of the first and second edition: "The text....contains a wealth of practical detail and experimental insight....This book is an essential purchase for any microscopist who is using, or planning to use, electron spectroscopy or spectroscopic imaging." - JMSA "Provides the advanced student with an indispensable text and the experienced researcher with a valuable reference." -- American Scientist.
Materials science.
Spectroscopy.
Microscopy.
Solid state physics.
Nanotechnology.
Characterization and Evaluation of Materials.
Spectroscopy/Spectrometry.
Spectroscopy and Microscopy.
Solid State Physics.
Nanotechnology.