Defect recognition and image processing in semiconductors 1997 : proceedings of the Seventh International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September, 1997 /
International Conference on Defect Recognition and Image Processing in Semiconductors(7th :1997 :Templin, Germany)
Donecker, J.
Rechenberg, I.
Bristol : Institute of Physics Publishing,
c1998.
Includes index.
Semiconductors
Image processing