Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
Bahukudumbi, Sudarshan.
Chakrabarty, Krishnendu.
Boston, Mass. ; London : Artech House,
c2010.
Includes bibliographical references and index.
Integrated circuits
Integrated circuits
Semiconductors