Applied Scanning Probe Methods IV [electronic resource] : Industrial Applications /
Bhushan, Bharat.editor.
Fuchs, Harald.editor.
Provides a comprehensive overview of SPM applications. The international perspective offered in these three volumes contributes to the evolution of SPM techniques. Volumes II, III and IV examine the physical and technical foundation for progress in applied near-field scanning probe techniques.
Description based upon print version of record.
Provides a comprehensive overview of SPM applications. The international perspective offered in these three volumes contributes to the evolution of SPM techniques. Volumes II, III and IV examine the physical and technical foundation for progress in applied near-field scanning probe techniques.
Includes bibliographical references and index.
Scanning Probe Lithography for Chemical, Biological and Engineering Applications -- Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM) -- Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography -- Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography -- Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM) -- Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection -- Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices -- Applications of Heated Atomic Force Microscope Cantilevers.
Nanotechnology.
Spectroscopy.
Microscopy.
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Materials-Surfaces.
Polymers  .
Nanotechnology and Microengineering.
Spectroscopy and Microscopy.
Surface and Interface Science, Thin Films.
Nanotechnology.
Surfaces and Interfaces, Thin Films.
Polymer Sciences.
NanoScience and Technology