Spectral reflectance [microform] /
Barnes, P. Yvonne.
Early, Edward A.
Parr, A. C.(Albert C.)
National Institute of Standards and Technology (U.S.)
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O.,
1998.
Shipping list no.: 98-0861-M.
"March 1998."
Includes bibliographical references (p. 47-48).
Microfiche.
Spectral reflectance
Spectrophotometer.