Applied Scanning Probe Methods XI [electronic resource] : Scanning Probe Microscopy Techniques /
Bhushan, Bharat.editor.
Fuchs, Harald.editor.
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various i
Description based upon print version of record.
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various i
Includes bibliographical references and index.
Oscillation Control in Dynamic SPM with Quartz Sensors -- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies -- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements -- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip -- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations -- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
Nanotechnology.
Spectroscopy.
Microscopy.
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Materials—Surfaces.
Polymers  .
Nanotechnology and Microengineering.
Spectroscopy and Microscopy.
Surface and Interface Science, Thin Films.
Nanotechnology.
Surfaces and Interfaces, Thin Films.
Polymer Sciences.


NanoScience and Technology